WO2015034469A2 - A process for cleaning carbon nanotubes and other nanostructured films - Google Patents

A process for cleaning carbon nanotubes and other nanostructured films Download PDF

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Publication number
WO2015034469A2
WO2015034469A2 PCT/US2013/057872 US2013057872W WO2015034469A2 WO 2015034469 A2 WO2015034469 A2 WO 2015034469A2 US 2013057872 W US2013057872 W US 2013057872W WO 2015034469 A2 WO2015034469 A2 WO 2015034469A2
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WO
WIPO (PCT)
Prior art keywords
carbon
acetic acid
carbon nanostructure
surfactants
surfactant
Prior art date
Application number
PCT/US2013/057872
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French (fr)
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WO2015034469A3 (en
Inventor
Huaping Li
Original Assignee
Aneeve Nanotechnologies, Llc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Aneeve Nanotechnologies, Llc filed Critical Aneeve Nanotechnologies, Llc
Priority to PCT/US2013/057872 priority Critical patent/WO2015034469A2/en
Publication of WO2015034469A2 publication Critical patent/WO2015034469A2/en
Publication of WO2015034469A3 publication Critical patent/WO2015034469A3/en

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    • CCHEMISTRY; METALLURGY
    • C01INORGANIC CHEMISTRY
    • C01BNON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
    • C01B32/00Carbon; Compounds thereof
    • C01B32/15Nano-sized carbon materials
    • C01B32/158Carbon nanotubes
    • C01B32/168After-treatment
    • C01B32/17Purification

Definitions

  • the field of the present invention is the cleaning of carbon nanostructure films used within devices such as transistors and transparent conductive films.
  • SWCNTs Pristine single-walled carbon nanotubes
  • SWCNTs Pristine single-walled carbon nanotubes
  • the common method is to use de-ionic water to clean up these dispersing agents from SWCNT surfaces on substrates either immobilized with amino groups or not.
  • Other methods can be used to clean dispersing agents from SWCNTs, including oxidization reaction and thermal burning.
  • these cleaning methods produce inconsistent results and don't remove all the dispersing agents from the SWCNT surfaces. Consequently, the end result of using the above cleaning methods often shows up as uncontrollable SWCNTs density and rough carbon nanotube surface that are indicative of chemical wrapping.
  • Density gradient ultracentrifuge (DGU) separated semi-conducting and metallic SWCNTs are wrapped with sodium cholate helices and dispersed with SDS, which exhibiting excellent water solubility. These separated semiconducting and metallic SWCNTs aqueous solutions are facilely ink-inject printed on silicon wafer and plastic substrates to form nice white films. Directly washing these films using de-ionic water, no single SWNTs can be imaged with scanning electron microscope (SEM). With aminopropyltris (ethoxy) silane (APTES) modified silicon-wafer and plastic surfaces, SWCNT films are obtained by inserting these substrates in SWCNT solutions for a long period (over 10 hours). Their atom force microscopy images show rough SWCNT surfaces, indicating the incomplete removal of chemicals.
  • SEM scanning electron microscope
  • the present invention is directed to a cleaning process for removal of surfactant chemicals from carbon nanostructures.
  • the process includes washing with a carboxylic acid selected from the group consisting of acetic acid, propanoic acid and butanoic acid. Glacial acetic acid has been found of specific utility.
  • the cleaning process may also be considered in carbon nanostructure film preparation with deposition of carbon nanostructures in solution with surfactant chemicals before washing.
  • surfactants include sodium cholate (SC) and sodium dodecyl sulfate (SDS).
  • Carbon nanostructure material deposition on a substrate may be by ink-jet printing, gravure roll-to-roll printing, screen and mask printing or various other printing methods. Accordingly, it is an object of the present invention to provide an improved wash process for carbon nanostructures. Other and further objects and advantages will appear hereafter.
  • FIG. 1 AFM image (scale: 2 ⁇ ⁇ 2 ⁇ ) illustrates printed
  • FIG. 2 AFM image (scale: 2 ⁇ ⁇ 2 ⁇ ) illustrates printed SWCNTs on a silicon wafer after being washed with glacial acetic acid showing clean SWCNT surfaces.
  • CNT and other similar carbon materials and structures are here collectively referred to as carbon nanostructures.
  • Embodiments of a cleaning process for films of such carbon nanostructures such as various CNT and other similar materials and structures such as nanoparticles, nanowires and monolayer materials from_solutions with surfactants are here disclosed that:
  • This cleaning process removes surfactant chemicals from carbon naonostructures.
  • the process includes washing the carbon nanostructures with a carboxylic acid selected from the group consisting of acetic acid, propanoic acid and butanoic acid. This process is applicable to any kind of carbon nanostructure.
  • the embodiments described employ glacial acetic acid but the group is contemplated for use.
  • glacial acetic acid neutralizes surfactants (i.e. sodium cholate and SDS) to form corresponding acids that are immediately immiscible with acetic acid leading then to a breakdown of the neutralizes surfactants (i.e. sodium cholate helices and SDS micelles).
  • surfactants i.e. sodium cholate and SDS
  • the carbon components then form networks under the influence of gravitational forces and van de Waals interactions.
  • This kinetic process may also be distinguished from a simple carbon nanostructure film wash using de-ionic water where surfactants slowly diffuse into the aqueous solution determined by their thermodynamic equilibrium. In such a slow thermodynamic process, there is a high probability that carbon components also diffuse with the surfactants into the aqueous solution resulting in reduced carbon component density.
  • the acetic acid wash has the advantageous results of increasing carbon nanostructure based transistor performance and increasing carbon nanostructure film optical transmissivity.
  • One embodiment of the process for fabricating a carbon nanostructure film ready for incorporation into electronic, optical and mechanical devices includes:
  • PEI polyethylamine
  • LiCIO 4 lithium perchlorate
  • a carbon nanostructure film typically employs chemical functionalization or surfactant dispersion of carbon nanostructure components.
  • Surfactants are used such as sodium dodecylsulfonate (SDS) and sodium cholate (SC).
  • SDS sodium dodecylsulfonate
  • SC sodium cholate
  • the surfactant dispersion is handled as ink and the film is deposited using printing techniques.
  • Application is to a substrate such as a silicon wafer.
  • a semiconducting SWCNT solution inkjet printed on a silicon wafer was conventionally washed.
  • the apparent diameters 10 of the CNT in Figure 1 are seen to be large and non-uniform, reflecting the presence of surfactant on the CNT.
  • the printed semiconducting SWCNT film illustrated in Figure 2 was washed in glacial acetic acid. This image is bright and clear with smaller diameters 12 in comparison to those in Figure 1 , indicating an absence of surfactant on the CNT.
  • Figure 2 also shows smooth SWCNT surfaces, sharply contrasting with the periodic bamboo structures observed in Figure 1. These images reflect that glacial acetic acid removes surfactants around the surface of SWCNTs compared to a conventional wash treatment.
  • TFT Thin film transistors
  • SWCNTs Thin film transistors
  • Silver nanoparticles were printed to form transistor electrodes and the cleaned SWNCTs made up the transistor's semiconducting channel.
  • the TFT backgated electric characteristics show mobility of 1.16 and an on/off ratio of 1000.
  • Top gating these devices with polyethylamine (PEI)/lithium perchlorate (LiCIO 4 ) ionic gel further enhanced the TFT device performance attributes.
  • PEI polyethylamine
  • LiCIO 4 lithium perchlorate

Abstract

A process for the cleaning of carbon nanostructure and similar materials and structures for removal of surfactant chemicals. The process includes washing the carbon nanostructures with concentrated acetic acid which may be glacial acetic acid. The cleaning process is also considered in carbon nanostructure film preparation with deposition of carbon nanostructures in solution with surfactant chemicals before the washing. Possible surfactants include sodium cholate (SC) and sodium dodecyl sulfate (SDS). Carbon nanostructure deposition on a substrate may be by various printing methods.

Description

S P E C I F I C A T I O N
TITLE
A PROCESS FOR CLEANING CARBON NANOTUBES AND OTHER NANOSTRUCTURED FILMS BACKGROUND OF THE INVENTION
The field of the present invention is the cleaning of carbon nanostructure films used within devices such as transistors and transparent conductive films.
Pristine single-walled carbon nanotubes (SWCNTs) cannot be dispersed in solvent because of their macro size and strong hydrophobic interactions among them. To manipulate the SWCNTs requires chemical functionalization or surfactant dispersion that will affect the electric and surface properties of SWCNTs. Furthermore, these separated semi-conducting and metallic SWCNTs are extensively covered with sodium cholate and/or sodium dodecyl sulfate (SDS).
The common method is to use de-ionic water to clean up these dispersing agents from SWCNT surfaces on substrates either immobilized with amino groups or not. Other methods can be used to clean dispersing agents from SWCNTs, including oxidization reaction and thermal burning. However, these cleaning methods produce inconsistent results and don't remove all the dispersing agents from the SWCNT surfaces. Consequently, the end result of using the above cleaning methods often shows up as uncontrollable SWCNTs density and rough carbon nanotube surface that are indicative of chemical wrapping. These adverse effects directly influence practical applications of SWCNTs in electronics and sensors.
Density gradient ultracentrifuge (DGU) separated semi-conducting and metallic SWCNTs are wrapped with sodium cholate helices and dispersed with SDS, which exhibiting excellent water solubility. These separated semiconducting and metallic SWCNTs aqueous solutions are facilely ink-inject printed on silicon wafer and plastic substrates to form nice white films. Directly washing these films using de-ionic water, no single SWNTs can be imaged with scanning electron microscope (SEM). With aminopropyltris (ethoxy) silane (APTES) modified silicon-wafer and plastic surfaces, SWCNT films are obtained by inserting these substrates in SWCNT solutions for a long period (over 10 hours). Their atom force microscopy images show rough SWCNT surfaces, indicating the incomplete removal of chemicals.
SUMMARY OF THE INVENTION
The present invention is directed to a cleaning process for removal of surfactant chemicals from carbon nanostructures. The process includes washing with a carboxylic acid selected from the group consisting of acetic acid, propanoic acid and butanoic acid. Glacial acetic acid has been found of specific utility.
The cleaning process may also be considered in carbon nanostructure film preparation with deposition of carbon nanostructures in solution with surfactant chemicals before washing. Possible surfactants include sodium cholate (SC) and sodium dodecyl sulfate (SDS). Carbon nanostructure material deposition on a substrate may be by ink-jet printing, gravure roll-to-roll printing, screen and mask printing or various other printing methods. Accordingly, it is an object of the present invention to provide an improved wash process for carbon nanostructures. Other and further objects and advantages will appear hereafter.
BRIEF DESCRIPTION OF THE DRAWINGS
Figure 1 : AFM image (scale: 2 μητιχ 2 μιτι) illustrates printed
SWCNTs without acetic acid washing, showing surfactants helically wrapped around SWCNT surfaces.
Figure 2: AFM image (scale: 2 μηιχ 2 μιη) illustrates printed SWCNTs on a silicon wafer after being washed with glacial acetic acid showing clean SWCNT surfaces.
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS
CNT and other similar carbon materials and structures are here collectively referred to as carbon nanostructures. Embodiments of a cleaning process for films of such carbon nanostructures such as various CNT and other similar materials and structures such as nanoparticles, nanowires and monolayer materials from_solutions with surfactants are here disclosed that:
Are able to effectively-remove chemicals which disperse SWCNTs such as surfactants from the material surface;
Leave the CNTs much cleaner with negligible movement in the film;
Have higher device yield;
Are easily integrated in a printable or semiconductor manufacturing process; and
Have increased CNT/device reproducibility. This cleaning process removes surfactant chemicals from carbon naonostructures. The process includes washing the carbon nanostructures with a carboxylic acid selected from the group consisting of acetic acid, propanoic acid and butanoic acid. This process is applicable to any kind of carbon nanostructure. The embodiments described employ glacial acetic acid but the group is contemplated for use.
The removal of surfactants from carbon nanostructure surfaces by glacial acetic acid is believed to be a kinetic process where glacial acetic acid neutralizes surfactants (i.e. sodium cholate and SDS) to form corresponding acids that are immediately immiscible with acetic acid leading then to a breakdown of the neutralizes surfactants (i.e. sodium cholate helices and SDS micelles). The carbon components then form networks under the influence of gravitational forces and van de Waals interactions.
This kinetic process may also be distinguished from a simple carbon nanostructure film wash using de-ionic water where surfactants slowly diffuse into the aqueous solution determined by their thermodynamic equilibrium. In such a slow thermodynamic process, there is a high probability that carbon components also diffuse with the surfactants into the aqueous solution resulting in reduced carbon component density.
Compared with known techniques, the acetic acid wash has the advantageous results of increasing carbon nanostructure based transistor performance and increasing carbon nanostructure film optical transmissivity. One embodiment of the process for fabricating a carbon nanostructure film ready for incorporation into electronic, optical and mechanical devices includes:
Creating a carbon nanostructure film on a substrate by printing semiconducting carbon nanostructures in solution using inkjet printing; Washing the films with acetic acid (> 30 minutes);
Making thin film transistors by printing silver nanoparticles on top of the printed SWNT films;
Printing polyethylamine (PEI)/lithium perchlorate (LiCIO4) ionic gel solution as top-gated materials on the silver nanoparticles.
Creation of a carbon nanostructure film typically employs chemical functionalization or surfactant dispersion of carbon nanostructure components. Surfactants are used such as sodium dodecylsulfonate (SDS) and sodium cholate (SC). In this embodiment, the surfactant dispersion is handled as ink and the film is deposited using printing techniques. Application is to a substrate such as a silicon wafer.
As an example, a semiconducting SWCNT solution inkjet printed on a silicon wafer was conventionally washed. The apparent diameters 10 of the CNT in Figure 1 are seen to be large and non-uniform, reflecting the presence of surfactant on the CNT. The printed semiconducting SWCNT film illustrated in Figure 2 was washed in glacial acetic acid. This image is bright and clear with smaller diameters 12 in comparison to those in Figure 1 , indicating an absence of surfactant on the CNT. Figure 2 also shows smooth SWCNT surfaces, sharply contrasting with the periodic bamboo structures observed in Figure 1. These images reflect that glacial acetic acid removes surfactants around the surface of SWCNTs compared to a conventional wash treatment.
Thin film transistors (TFT) have also been fabricated using SWCNTs and cleaned with acetic acid. Silver nanoparticles were printed to form transistor electrodes and the cleaned SWNCTs made up the transistor's semiconducting channel. The TFT backgated electric characteristics show mobility of 1.16 and an on/off ratio of 1000. Top gating these devices with polyethylamine (PEI)/lithium perchlorate (LiCIO4) ionic gel further enhanced the TFT device performance attributes.
Thus, the cleaning of carbon nanostructure based films and their incorporation into devices such as thin film transistors has been disclosed. While embodiments and applications of this invention have been shown and described, it would be apparent to those skilled in the art that many more modifications are possible without departing from the inventive concepts herein. The invention, therefore, is not to be restricted except in the spirit of the appended claims.

Claims

Claims:
1. A process for removing surfactants from carbon nanostructures, comprising washing the carbon nanostructure with a saturated carboxylic acid selected from the group consisting of acetic acid, propanoic acid and butanoic acid to remove the surfactants.
2. The process of claim 1 , wherein the saturated carboxylic acid is glacial acetic acid.
3. The process of claim 1 , wherein the surfactant is sodium cholate (SC).
4. The process of claim 1 , wherein the surfactant is sodium dodecyl sulfate (SDS).
5. The process of claim 1 , wherein the carbon nanostructure is any one or more of single-walled carbon nanotubes, multi-walled carbon nanotubes, monolayer material, nanowires, and nanoparticles.
6. The process of any of claims 1 further comprising
depositing the solution of the carbon nanostructure with surfactants on a substrate.
7. The process of claim 1 , wherein depositing the solution includes deposition by inkjet printing.
PCT/US2013/057872 2013-09-03 2013-09-03 A process for cleaning carbon nanotubes and other nanostructured films WO2015034469A2 (en)

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RU2743559C1 (en) * 2019-12-31 2021-02-19 федеральное государственное бюджетное образовательное учреждение высшего образования "Московский государственный технический университет имени Н.Э. Баумана (национальный исследовательский университет)" (МГТУ им. Н.Э. Баумана) Method for removing residual solvent from layers based on carbon nanotubes

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