WO2014132506A1 - Procédé permettant de détecter des défauts d'un panneau d'affichage et dispositif permettant de détecter des défauts d'un panneau d'affichage - Google Patents

Procédé permettant de détecter des défauts d'un panneau d'affichage et dispositif permettant de détecter des défauts d'un panneau d'affichage Download PDF

Info

Publication number
WO2014132506A1
WO2014132506A1 PCT/JP2013/081769 JP2013081769W WO2014132506A1 WO 2014132506 A1 WO2014132506 A1 WO 2014132506A1 JP 2013081769 W JP2013081769 W JP 2013081769W WO 2014132506 A1 WO2014132506 A1 WO 2014132506A1
Authority
WO
WIPO (PCT)
Prior art keywords
defect
pixel
display panel
blue
picture element
Prior art date
Application number
PCT/JP2013/081769
Other languages
English (en)
Japanese (ja)
Inventor
裕史 狩田
孝好 永安
Original Assignee
シャープ株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by シャープ株式会社 filed Critical シャープ株式会社
Publication of WO2014132506A1 publication Critical patent/WO2014132506A1/fr

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306Details
    • G02F1/1309Repairing; Testing
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9513Liquid crystal panels

Definitions

  • the present invention relates to a defect detection method and a defect detection apparatus for each display pixel in a display panel, and more particularly to improvement of defect detection sensitivity.
  • the liquid crystal display panel is inspected for defects in each display pixel of the liquid crystal display panel in the latter half of the manufacturing process.
  • the defect handled in this specification is, for example, a bright spot defect caused by the occurrence of foreign matter in the liquid crystal layer in the liquid crystal display panel. For this reason, a bright spot defect mainly caused by a defect due to, for example, a short circuit or disconnection of wiring in a TFT (Thin Film Transistor) thin film transistor is not included.
  • TFT Thin Film Transistor
  • Inspecting whether or not each display pixel of the liquid crystal display panel is defective is a visual inspection in which the lit liquid crystal display panel is visually inspected by an operator, and the liquid crystal display panel is a line sensor or an area sensor. There is an automatic inspection performed by a defect detection apparatus that processes a signal obtained by imaging with a simple sensor camera.
  • Patent Document 1 a defect detection method using the defect detection apparatus disclosed in Patent Document 1 is known as the automatic inspection.
  • a defect part candidate includes, for example, a plurality of types of color picture elements in a large defect part including a red picture element and a green picture element adjacent thereto. In this case, it is determined that a single color does not include a plurality of types of color picture elements, and it is possible to prevent the occurrence of erroneous detection of a defect by determining the quality of a defective part candidate based on the determined determination criterion for the single color. It has been proposed to do so.
  • a defect detection method of a defect detection apparatus disclosed in Patent Document 1 includes a step of capturing a pixel composed of a plurality of picture elements and acquiring it as image data, and a luminance of the pixel of the image data. Extracting a pixel having an absolute value of a contrast value, which is a difference between a signal amount and a luminance signal amount of the pixel when the pixel has no defect, as a defective part candidate, and a picture of the defective part candidate A step of specifying a prime color and a step of calculating a defect degree by multiplying the contrast value by a correction coefficient that varies depending on the color of the picture element and determining a defect when the defect degree is larger than a determination value are executed. To do.
  • the contrast value for each color of the picture element is multiplied by a correction coefficient that differs depending on the color of the picture element, and the total is calculated as a defect degree. Including a step of calculating.
  • Japanese Patent Publication Japanese Patent Laid-Open No. 2011-196685 (published on October 6, 2011)”
  • the defect detection device In the automatic inspection performed by the defect detection device and the visual inspection performed by the operator's visual observation of the lit liquid crystal display panel, for example, in the case of a minute defect having a size of one picture element or less, The difference from the detection sensitivity of the defect detection device is large, and the defect detection device detects even a minute defect exceeding the visual limit level.
  • the defect detection method using the conventional defect detection apparatus has a problem in that defects are detected more excessively than visual detection, and the process yield is reduced.
  • the present invention has been made in view of the above-described conventional problems, and its purpose is to reduce the number of defects that are detected excessively more than visual detection, and thus to suppress a reduction in process yield.
  • a defect detection method and a display panel defect detection apparatus are provided.
  • a defect detection method for a display panel includes at least a blue (B) pixel among red (R), green (G), and blue (B) picture elements in a display panel. And a pixel lighting process for lighting the blue (B) picture element by applying an applied voltage to the picture element, and image data obtained by picking up pixels comprising a plurality of picture elements of the display panel and obtaining them as image data
  • the absolute value of the contrast value which is the difference between the acquisition step and the imaging pixel luminance signal amount of the pixel of the image data and the non-defective pixel luminance signal amount of the non-defective pixel of the image data in the non-defective pixel in which the pixel is not defective, is obtained.
  • a display panel defect detection device includes at least a blue (B) pixel among red (R), green (G), and blue (B) picture elements in a display panel.
  • the pixel lighting means for lighting the blue (B) picture element by applying an applied voltage to the picture element of (), and the pixel composed of a plurality of picture elements of the display panel are picked up by an imaging camera as image data
  • a contrast value that is a difference between a captured pixel luminance signal amount of a pixel of the image data and a non-defective pixel luminance signal amount of the non-defective pixel of the image data in a non-defective pixel in which the pixel is not defective
  • a defective part candidate extracting unit that extracts a pixel having an absolute value equal to or greater than a threshold value as a defective part candidate, a defective part pixel specifying unit that specifies a color of a pixel of the defective part candidate, and a color of the pixel Different correction The number was
  • a display panel defect detection method and a display panel defect detection apparatus capable of reducing the number of defects that are detected excessively more than visual detection, and thereby suppressing a decrease in process yield. The effect of doing.
  • FIG. 1 It is a flowchart which shows the defect detection method of the display panel by the defect detection apparatus of the display panel in Embodiment 1 of this invention. It is a block diagram which shows the structure of the defect detection apparatus for performing the defect detection method of the said display panel.
  • A is a top view which shows the whole structure of a liquid crystal display panel
  • (b) is a liquid crystal in a state where only a backlight is lit and red (R), green (G) and blue (B) picture elements are not lit.
  • (c) turns on a backlight, and is a blue (B) picture among red (R), green (G), and a blue (B) picture element.
  • the display panel defect detection method it is a diagram illustrating an example of a correction coefficient when a bright spot defect occurs in each of red (R), green (G), and blue (B) picture elements.
  • (A) is a principal part top view which shows the brightness
  • FIG. 2 shows the defect detection method of the display panel in Embodiment 2 of this invention.
  • A shows the defect detection method of the said display panel, Comprising: When there exists a defect over both a red (R) picture element and a green (G) picture element, when only a backlight is lighted It is a principal part top view which shows the brightness
  • (b) is a background picture element and defect when lighting a backlight and lighting all the picture elements of red (R), green (G), and blue (B) picture elements It is a principal part top view which shows the brightness
  • FIG. 2 is a block diagram showing a configuration of the defect detection apparatus 10 of the present embodiment and the liquid crystal display panel 1 that is a defect detection target.
  • the defect detection apparatus 10 includes a display panel operation unit 2 for applying a display input signal to a liquid crystal display panel 1 as a display panel, an imaging camera 11, and a defect site detection. Unit 12, color identification unit 13, defect determination unit 14, and result output unit 15. In addition, after detecting the defective part of the pixel in the defect detection apparatus 10 of the present embodiment, the defective part is repaired.
  • the liquid crystal display panel 1 is composed of a plurality of pixels composed of picture elements of three colors of red (R: Red), green (G: Green), and blue (B: Blue) arranged in a matrix. .
  • the liquid crystal display panel 1 includes a panel body composed of a TFT (thin film transistor) (not shown) substrate, a color filter substrate, and a liquid crystal layer interposed therebetween, and a back disposed on the back surface of the panel body. With lights. Therefore, the liquid crystal display panel 1 can apply a voltage for each picture element by the display panel operation unit 2.
  • the liquid crystal display panel 1 is used as a display panel.
  • the present invention is not limited to the liquid crystal display panel and may be another display panel.
  • the display panel operation unit 2 can turn on / off the backlight and apply a driving signal for lighting to each of the red (R), green (G), and blue (B) picture elements. It has become.
  • the imaging camera 11 captures the liquid crystal display panel 1 and acquires it as image data, and includes a sensor camera such as a line sensor or an area sensor. Therefore, the imaging camera 11 captures a column or row of pixels along a line, or captures a region of a certain size, that is, a certain matrix region, and acquires it as image data.
  • the sensor camera is a monochrome camera.
  • the defective part detection unit 12 calculates the absolute value of the contrast value, which is the difference between the imaging pixel luminance signal amount of the pixel of the image data and the non-defective pixel luminance signal amount of the non-defective pixel in the non-defective pixel in which the pixel is not defective.
  • a pixel having a value equal to or greater than a threshold value is extracted as a candidate defect part.
  • the color specifying unit 13 specifies the color of the defective part candidate pixel.
  • the defect determination unit 14 calculates a defect degree by multiplying the contrast value by a correction coefficient that varies depending on the color of the pixel, and if the defect degree is larger than the determination value, the pixel of the color is defective. It comes to judge. Further, the result output unit 15 displays which picture element in the image data of the liquid crystal display panel 1 is defective.
  • FIG. 1 is a flowchart showing a defect detection method of the liquid crystal display panel 1 in the present embodiment.
  • FIG. 3A is a plan view showing the overall configuration of the liquid crystal display panel 1.
  • FIG. 3B is a main part plan view showing the configuration of the liquid crystal display panel 1 in a state where only the backlight is lit and the red (R), green (G), and blue (B) picture elements are not lit.
  • FIG. 3C shows a liquid crystal display panel 1 in a state in which the backlight is turned on and only the blue (B) picture element among the red (R), green (G), and blue (B) picture elements is lit. It is a principal part top view which shows the structure of this.
  • the defect to be handled is a bright spot defect that is caused by the occurrence of foreign matter in the liquid crystal layer in the liquid crystal display panel. For this reason, a bright spot defect mainly caused by a defect due to, for example, a short circuit or disconnection of wiring in a TFT (Thin Film Transistor) thin film transistor is not included.
  • TFT Thin Film Transistor
  • the defect detection apparatus 10 of the present embodiment detects a defect generated in a picture element, first, as shown in FIG. 1, the backlight in the liquid crystal display panel 1 is turned on (S1). Subsequently, in the picture element lighting step, at least the blue (B) picture element is lit among the red (R), green (G), and blue (B) picture elements (S2).
  • the display pattern of the above-mentioned lighting state is displayed on the liquid crystal display panel 1, in the image data acquisition step, the display pattern is imaged by the imaging camera 11 and acquired as image data (S3).
  • the magnitude of the signal output by the light receiving element according to the intensity of light received by the light receiving element of the imaging camera 11 is referred to as “luminance signal amount”. Therefore, the value of each pixel of the image data is a luminance signal amount.
  • the defective part detection unit 12 calculates a contrast value for the image data and creates a contrast image (S4).
  • the contrast value refers to the luminance signal amount of the picture element of the image data and the display pattern displayed on the liquid crystal display panel 1 normally, that is, the picture element is defective. This is the difference from the luminance signal amount when there is no signal.
  • a value obtained in advance may be used, but each time it may be a non-defective pixel luminance signal amount predicted from the obtained image data.
  • FIG. 4 is a plan view showing a picture element array 1a of red (R), green (G), and blue (B) picture elements of the liquid crystal display panel 1.
  • red (R), green (G), and blue (B) picture elements are arranged in the horizontal direction to form one unit, and this one unit is in the vertical and horizontal directions.
  • Each is arranged in multiple numbers.
  • the red picture element constituting the unit of the m-th row and the n-th column is indicated by Rmn
  • the green picture element is indicated by Gmn
  • the blue picture element is indicated by Bmn.
  • the pattern has a spatial period of one unit in the horizontal direction.
  • R21 there is no defective picture element R21 with respect to the defective picture element R22.
  • R23 is a pixel of the same phase that is one cycle apart horizontally. If the phase is the same even if the period is different, the luminance signal amounts should be similar, and the average of the luminance signal amount of the picture element R21 and the luminance signal quantity of the picture element R23 indicates that the pattern is displayed normally. In this case, that is, the luminance signal amount of the pixel R22 when there is no defect should be approximated.
  • defective part candidates are extracted from the contrast image of the image data (S5). That is, since the contrast value of a normal pixel without a defect should be about 0 by the above-described calculation of the contrast value, the liquid crystal display panel 1 corresponding to a pixel having a value greatly different from 0 in the contrast image. The site is likely a defect. Therefore, a picture element having an absolute value of the contrast value larger than a certain threshold value may be extracted as a defective part candidate.
  • the color specifying unit 13 specifies the color of the picture element that is the object for each pixel included in the defective part candidate (S6).
  • the color is specified based on the luminance signal amount in the image data.
  • a display pattern for alignment is displayed on the liquid crystal display panel 1, the display pattern is captured by the imaging camera 11 as image data, and the display pattern and the display pattern in the image data are collated to establish a correspondence relationship.
  • the registration information to be specified is created, the picture element corresponding to the pixel is specified based on the pixel position and the registration information, and further, based on the design information of the liquid crystal display panel 1, the picture element corresponding to the pixel is selected from the specified picture element. You may specify by specifying the color of a picture element.
  • the defect determination unit 14 calculates the defect degree based on the specified color (S7).
  • the correction coefficient which is the ratio between the absolute value of the contrast value and the defect level, differs depending on the display pattern and the color of the picture element. Three examples are shown below.
  • a picture element that is controlled to be displayed in black based on the display pattern is displayed in black when normal. If the picture element to be displayed in black is displayed in red (R), green (G), or blue (B) (contrast value is positive), it is considered a bright spot defect.
  • the eye sensitivity is high for green (G) and low for blue (B).
  • the picture element to be displayed in black is green by multiplying by a small correction coefficient.
  • a large correction coefficient is multiplied. Since the imaging camera 11 is a monochrome camera, it is unknown which color the bright spot defect is displayed. However, since the probability that a bright spot defect is displayed in a color different from the original color of the picture element is extremely rare, it is estimated that the color is specified by the color specifying unit 13 and is multiplied by the correction coefficient.
  • picture elements that are controlled to be brightly displayed based on the display pattern are displayed in the colors of the red (R), green (G), and blue (B) picture elements when normal.
  • a small correction coefficient is obtained after multiplying the contrast value by -1 to make the sign positive.
  • the sign is positive by multiplying the contrast value by ⁇ 1, and then multiplied by a large correction coefficient.
  • the degree of defect is set to a value close to the sensitivity of the human eye.
  • picture elements that are controlled to be brightly displayed based on the display pattern are displayed in the colors of the red (R), green (G), and blue (B) picture elements when normal.
  • a large correction coefficient is multiplied when the picture element to be displayed in blue (B) is displayed in white.
  • a small correction coefficient is multiplied.
  • the degree of defect is set to a value close to the sensitivity of the human eye.
  • the white defect occurs when ink is not placed on the color filter and all light is transmitted.
  • FIG. 5 is a diagram illustrating an example of the correction coefficient in the case where a bright spot defect has occurred in each of the red (R), green (G), and blue (B) picture elements.
  • the visual sensitivity / luminance signal amount is used as a correction coefficient.
  • the luminance signal amounts of image data in red (R), green (G), and blue (B) colors displayed on the liquid crystal display panel 1 are 0.4, 0.3, and 0.3.
  • the human visual sensitivity is 0.3, 0.6, and 0.1.
  • the visual sensitivity of each color of red (R), green (G), and blue (B) can be specified by measuring each color displayed on the liquid crystal display panel 1 with a color luminance meter.
  • an appropriate correction coefficient is selected based on the display pattern, the sign of the contrast value, and the color specified by the color specifying unit 13, and multiplied by the contrast value.
  • the correction coefficient is a value to be set depending on the color of the picture element and the sensitivity of the light receiving element with respect to the color of the picture element, and may be a correction coefficient other than the above.
  • the defect degrees of the plurality of picture elements may be summed to obtain the defect degree of the entire defect part candidate. That is, when one defect includes picture elements of a plurality of types of colors, the degree of defect is calculated by multiplying the contrast value for each color by a correction coefficient that differs depending on the color and summing up the defects.
  • the defect is determined in the defect determination step (S8). Specifically, for each defective part candidate extracted in S5, the defect degree is compared with the determination value, and if the defect degree is larger than the determination value, it is determined as a defect.
  • the result output unit 15 outputs information on the part determined to be defective (S9).
  • the information regarding the part determined to be a defect includes a defect sitting value, a color, and a defect type in the display panel.
  • the defect sitting value in the liquid crystal display panel 1 is obtained by converting the coordinate value of the defect in the contrast image into the sitting face in the liquid crystal display panel 1 based on information for specifying a picture element corresponding to each pixel of the pixel data.
  • the types of defects include black spot defects, bright spot defects, white spot defects, and the like.
  • the defect degree is corrected in accordance with the ratio of the included colors, so that it is possible to make a determination based on an appropriate standard, and erroneous detection Can be detected and defects can be accurately detected.
  • FIG. 6A is a main part plan view showing a luminance difference between the background picture element and the defect when only the backlight is turned on when the blue (B) picture element has a defect.
  • FIG. 6B shows the background picture element when the backlight is turned on and only the blue (B) picture element among the red (R), green (G), and blue (B) picture elements is lit. It is a principal part top view which shows the luminance difference with a defect.
  • FIG. 6A for example, it is assumed that a defect F exists in the blue picture element Bp.
  • the picture elements are controlled to be displayed in black achromatic colors. Therefore, when it is normal, that is, when there is no defect, it is displayed in a dark black achromatic color. Therefore, as shown in FIG. 6A, a part of the contrast picture is brightly displayed with the blue picture element Bp, so that it is considered to be a defect F. That is, when one or more of the red picture element Rp, the green picture element Gp, and the blue picture element Bp are displayed brightly, it becomes a defect F because it becomes a certain luminance difference or more.
  • the display panel operation unit 2 applies a voltage to blue (B).
  • the visual sensitivity ratio is approximately when normalized so that the sum of red (R), green (G), and blue (B) is 1.
  • Red (R): Green (G): Blue (B) 0.3: 0.6: 0.1 It becomes.
  • the input signal to be applied is the voltage [V] and not the luminance value, the input signal is adjusted so as to obtain a desired background luminance value.
  • the defect F existing in the blue picture element Bp is not the defect F as shown in FIG. 6B.
  • the defect detection method of the liquid crystal display panel 1 in the defect detection apparatus 10 of the present embodiment at least one of the red (R), green (G), and blue (B) picture elements in the liquid crystal display panel 1.
  • a pixel lighting process for lighting the blue (B) picture element by applying an applied voltage to the blue (B) picture element, and imaging a pixel composed of a plurality of picture elements of the liquid crystal display panel 1 by the imaging camera 11 The difference between the image data acquisition step of acquiring the image data as image data, and the amount of imaging pixel luminance signal of the pixel of the image data and the amount of non-defective pixel luminance signal of the non-defective pixel of the image data in the non-defective pixel where the pixel is not defective
  • the image data acquisition process and the defective part candidate are performed without applying a voltage to each pixel constituting the pixel of the liquid crystal display panel 1.
  • the extraction process, the defective part picture element identification process, and the defect determination process are performed in this order to detect the defect.
  • the human visual detection sensitivity and the defect The difference from the detection sensitivity of the detection device is large, and the defect detection device will detect even a microdefect exceeding the visual limit level. For example, as shown in FIG. 6A, when the defect F exists in the blue picture element Bp, the difference in brightness between the background brightness of the blue picture element Bp and the brightness of the defect F is large. Immediately, it is determined that the defect F exists in the blue picture element Bp.
  • the defect detection method using the conventional defect detection apparatus has a problem that the defect is over-detected rather than the visual detection and the process yield decreases.
  • a defect determination step of calculating a defect degree by multiplying the contrast value by a correction coefficient that differs depending on the color of the picture element, and determining that the pixel of the color is a defect when the defect degree is larger than a determination value A method of changing the correction coefficient in is also conceivable.
  • accurate defect detection is difficult with the method of changing the correction coefficient.
  • defect detection apparatus 10 of the present embodiment when performing the conventional image data acquisition process, defective part candidate extraction process, defective part pixel identification process, and defect determination process, first, in the pixel lighting process. Then, an applied voltage is applied to at least the blue (B) picture element among the red (R), green (G), and blue (B) picture elements in the liquid crystal display panel 1, and the blue (B) picture element is obtained. Light.
  • the blue (B) picture element is turned on in human visual observation when only the backlight is turned on, and in addition to the backlight, red (R), green (G), blue ( This is because the brightness difference from when each of the B) picture elements is lit is the largest in the case of the blue (B) picture element. That is, when only the backlight is turned on, the blue (B) picture element has a luminance of the blue (B) picture element among the red (R), green (G), and blue (B) picture elements. Smallest. For this reason, when the defect exists in the blue (B) picture element, the brightness of the defect is high. Therefore, the defect detection method using the conventional defect detection apparatus can easily extract the defect of the blue (B) picture element. Tend.
  • the blue (B) picture element is often lit when viewing the liquid crystal display panel 1, the human visual observation does not recognize a defect existing in the blue (B) picture element. There are many cases. For this reason, even if such a defect detection method is adopted, there is substantially no problem.
  • the blue (B) picture element whose defect is frequently detected more frequently than the visual detection is turned on to detect the defect. Do. Accordingly, it is possible to provide a defect detection method for the liquid crystal display panel 1 that can efficiently reduce the overdetection of defects rather than the visual detection and thereby suppress a decrease in process yield.
  • the applied voltage is applied only to the blue (B) picture element among the green (G) and blue (B) picture elements.
  • the blue (B) picture element was turned on.
  • each of the red (R), green (G), and blue (B) pictures in the liquid crystal display panel 1 in the picture element lighting step is that blue (B) and red (R) picture elements are lit so that the applied voltage applied to each picture element is blue (B)> red (R). .
  • the luminance difference between when only the backlight is lit and when each of the red (R), green (G), and blue (B) picture elements is lit in addition to the backlight is
  • the red (R) picture element is the second largest after the blue (B) picture element.
  • the red (R) picture element is lit so that the applied voltage applied to each picture element is blue (B)> red (R).
  • the difference in luminance between the background luminance of the blue (B) and red (R) picture elements and the luminance of the defect is reduced. As a result, it becomes difficult to be extracted as a defect.
  • the blue (B) and red (R) picture elements whose defects are more frequently detected than the visual detection are turned on. Then, defect detection is performed. Accordingly, it is possible to provide a defect detection method for the liquid crystal display panel 1 that can more efficiently reduce the number of defects that are detected excessively than the visual detection, and that can suppress a decrease in the process yield.
  • FIG. 7 is a flowchart showing a defect detection method of the liquid crystal display panel 1 in the present embodiment.
  • FIG. 8A shows a defect detection method of the liquid crystal display panel 1, where only the backlight is present when there is a defect extending over both the red (R) picture element and the green (G) picture element. It is a principal part top view which shows the brightness
  • the backlight is turned on, and among the red (R), green (G), and blue (B) picture elements, the blue (B) picture element and the red (R) picture element are displayed. It is a principal part top view which shows the brightness
  • the defect detection apparatus 10 of the present embodiment detects a defect occurring in a picture element, first, as shown in FIG. 7, the backlight in the liquid crystal display panel 1 is turned on (S1). Subsequently, in the picture element lighting step, the blue (B) and red (R) picture elements among the red (R), green (G), and blue (B) picture elements in the liquid crystal display panel 1 Lights up so that the applied voltage applied to the picture element is blue (B)> red (R) (S11).
  • FIG. 8A for example, it is assumed that there is a defect F straddling the red picture element Rp and the green picture element Gp.
  • the backlight is turned on, and when the red (R), green (G), and blue (B) picture elements are not turned on, the picture elements are controlled to be displayed in black achromatic colors. Therefore, when it is normal, that is, when there is no defect, it is displayed in a dark black achromatic color. Therefore, as shown in FIG. 8A, a part of each red picture element Rp and green picture element Gp is brightly displayed on the contrast screen, so that it is considered to be a defect F. That is, when one or more of the red picture element Rp, the green picture element Gp, and the blue picture element Bp are displayed brightly, it becomes a defect F because it becomes a certain luminance difference or more.
  • the display panel operation unit 2 applies voltages to red (R) and blue (B).
  • the visual sensitivity ratio is approximately when normalized so that the sum of red (R), green (G), and blue (B) is 1.
  • Red (R): Green (G): Blue (B) 0.3: 0.6: 0.1 It becomes.
  • the input signal to be applied is the voltage [V] and not the luminance value, the input signal is adjusted so as to obtain a desired background luminance value.
  • the defect F existing across the red picture element Rp and the green picture element Gp is converted into a red picture as shown in FIG.
  • the element Rp is no longer a defect F.
  • the luminance value refers to the magnitude of a signal output from the imaging camera 11 according to the intensity of light received by the imaging camera 11.
  • the contrast volume is the absolute value of the difference between the luminance value of the imaging camera 11 for a certain picture element and the predicted value of the luminance value when the picture element is normally displayed on the screen of the liquid crystal display panel 1. The value added in the area.
  • Embodiment 3 The following will describe still another embodiment of the present invention with reference to FIGS.
  • the configurations other than those described in the present embodiment are the same as those in the first embodiment and the second embodiment.
  • members having the same functions as those shown in the drawings of Embodiment 1 and Embodiment 2 are given the same reference numerals, and explanation thereof is omitted.
  • the applied voltage is applied only to the blue (B) picture element among the green (G) and blue (B) picture elements.
  • the blue (B) picture element was turned on.
  • each of the red (R), green (G), and blue (B) pictures in the liquid crystal display panel 1 in the picture element lighting step is lit so that the applied voltage is blue (B)> red (R) ⁇ green (G).
  • the luminance difference between when only the backlight is lit and when each of the red (R), green (G), and blue (B) picture elements is lit in addition to the backlight is , Blue (B) picture element, red (R) picture element, and green (G) picture element.
  • red (R) and green (G) picture elements are applied to each picture element with a blue (B)> red (R) ⁇ green (G ) To light up.
  • the luminance difference between the background luminance of the blue (B), red (R), and green (G) picture elements and the luminance of the defect becomes small, so that it is difficult to be extracted as a defect.
  • FIG. 9 is a flowchart showing a defect detection method of the liquid crystal display panel 1 in the present embodiment.
  • FIG. 10A shows a defect detection method for the liquid crystal display panel 1, and the background pixel and defect when only the backlight is turned on when the green (G) pixel is defective. It is a principal part top view which shows a luminance difference.
  • FIG. 10B shows the luminance difference between the background picture element and the defect when the backlight is turned on and all of the red (R), green (G), and blue (B) picture elements are lit. It is a principal part top view which shows.
  • the defect detection apparatus 10 of the present embodiment detects a defect occurring in a picture element
  • the backlight in the liquid crystal display panel 1 is turned on as shown in FIG. 9 (S1).
  • the applied voltage for applying the red (R), green (G), and blue (B) picture elements in the liquid crystal display panel 1 to the picture elements is blue (B)> Lights up so that red (R) ⁇ green (G) (S21).
  • FIG. 10A for example, it is assumed that a defect F exists in the green picture element Gp.
  • the picture elements are controlled to be displayed in black achromatic colors. Therefore, when it is normal, that is, when there is no defect, it is displayed in a dark black achromatic color. Therefore, as shown in FIG. 10A, when a part of the green picture element Gp is displayed brightly on the contrast screen, it is considered to be a defect F. That is, when one or more of the red picture element Rp, the green picture element Gp, and the blue picture element Bp are displayed brightly, it becomes a defect F because it becomes a certain luminance difference or more.
  • the display panel operation unit 2 applies voltages to red (R) and blue (B).
  • the visual sensitivity ratio is approximately when normalized so that the sum of red (R), green (G), and blue (B) is 1.
  • Red (R): Green (G): Blue (B) 0.3: 0.6: 0.1 It becomes.
  • a voltage is applied to green (G) and blue (B).
  • the input signal to be applied is the voltage [V] and not the luminance value, the input signal is adjusted so as to obtain a desired background luminance value.
  • the defect F existing in the green picture element Gp becomes the defect F after the picture element is turned on as shown in FIG. Disappear.
  • the defect detection is employed in the lighting defect detection procedure in which the image data acquisition process, the defective part candidate extraction process, the defective part pixel identification process, and the defect determination process are performed in this order.
  • the defect detection apparatus 10 cannot grasp how many defects F actually exist.
  • both the lighting defect detection procedure and the non-lighting defect detection procedure in which no pixel is lit are performed. Therefore, the defect F which exists actually can be grasped.
  • FIG. 11 is a flowchart showing a defect detection method of the liquid crystal display panel 1 in the present embodiment.
  • the backlight in the liquid crystal display panel 1 is turned on as shown in FIG. S1).
  • the picture element lighting step at least each blue (B) picture element among the red (R), green (G), and blue (B) picture elements in the liquid crystal display panel 1 is lit (S31).
  • the pixel lighting process of S31 is the same as the pixel lighting process of any of the first to third embodiments (S2 shown in FIG. 1, S11 shown in FIG. 7, and FIG. 9). S21).
  • steps S3 to S9 are performed. Since steps S3 to S9 are the same as those described in the flowchart shown in FIG. 1 in the first embodiment, the description thereof is omitted.
  • the lighting defect detection procedure shown in S31 to S9 is performed. Therefore, a defect detection result at the visual inspection level is obtained.
  • the defect detection method of the liquid crystal display panel 1 of the present embodiment the defect at the time of non-lighting in which the defect is detected without lighting the red (R), green (G), and blue (B) picture elements. Run the detection procedure.
  • the red (R), green (G), and blue (B) picture elements are turned off (S32), and then the steps S3 to S9 are similarly executed. .
  • the processing time has a margin.
  • the defect detection procedure at the time of non-lighting is performed.
  • the present invention is not necessarily limited to this. It is also possible to perform a lighting defect detection procedure after performing the above. That is, either the lighting defect detection procedure or the non-lighting defect detection procedure may be performed first. This is because, regardless of which is performed first, it is possible to grasp the true level defect and the visual observation level defect.
  • the defect detection method for the display panel (liquid crystal display panel 1) is at least one of red (R), green (G), and blue (B) picture elements in the display panel (liquid crystal display panel 1). Applying an applied voltage to the blue (B) picture element to light the blue (B) picture element, a plurality of picture element lighting steps (S2, S11, S21), and a plurality of display panels (liquid crystal display panel 1)
  • An image data acquisition step (S3) in which pixels consisting of picture elements are captured and acquired as image data, and the non-defective pixels of the image data in the non-defective pixels in which the pixels are not defective and the imaging pixel luminance signal amount of the pixels of the image data
  • a defective part candidate extraction step (S4, S5) for extracting a pixel whose absolute value of the contrast value, which is the difference from the non-defective pixel luminance signal amount, is greater than or equal to a threshold value as a defective part candidate, and the picture of the defective part candidate
  • the defect detection apparatus 10 for the display panel (liquid crystal display panel 1) is a red (R), green (G), or blue (B) picture element in the display panel (liquid crystal display panel 1).
  • a plurality of picture element lighting means (display panel operation unit 2) for applying an applied voltage to at least a blue (B) picture element to light up the blue (B) picture element, and the display panel (liquid crystal display panel 1).
  • Image data acquisition means (imaging camera 11) that captures a pixel consisting of a picture element and acquires it as image data; and the amount of imaging pixel luminance signal of the pixel of the image data and the image data of a non-defective pixel in which the pixel is not defective
  • a defective part candidate extracting means (defective part detecting unit 12) for extracting, as a defective part candidate, a pixel whose absolute value of a contrast value, which is a difference between the non-defective pixel and the non-defective pixel luminance signal amount, is a threshold value or more;
  • Lack of Defect part pixel specifying means (color specifying part 13) for specifying the color of the part candidate picture element and the correction coefficient that differs depending on the color of the picture element are multiplied by the contrast value to calculate the defect degree.
  • Defect determining means (defect determining unit 14) that determines that the picture element of the color is defective when larger than the determination value is characterized.
  • a defective part candidate extraction process when performing a conventional image data acquisition process, a defective part candidate extraction process, a defective part pixel identification process, and a defect determination process, first, in the pixel lighting process, in the display panel An applied voltage is applied to at least the blue (B) picture element among the red (R), green (G), and blue (B) picture elements to light the blue (B) picture element.
  • the blue (B) picture element is turned on in human visual observation when only the backlight is turned on, and in addition to the backlight, red (R), green (G), blue ( This is because the brightness difference from when each of the B) picture elements is lit is the largest in the case of the blue (B) picture element. That is, when only the backlight is turned on, the blue (B) picture element has a luminance of the blue (B) picture element among the red (R), green (G), and blue (B) picture elements. Smallest. For this reason, when the defect exists in the blue (B) picture element, the brightness of the defect is high. Therefore, the defect detection method using the conventional defect detection apparatus can easily extract the defect of the blue (B) picture element. Tend. On the other hand, if the defect detection is performed by turning on the blue (B) picture element as in the present invention, the brightness difference between the background brightness of the blue (B) picture element and the brightness of the defect becomes small. It becomes difficult to extract.
  • the blue (B) picture element whose defect is frequently detected more frequently than the visual detection is turned on to detect the defect.
  • a display panel defect detection method and a display panel defect detection apparatus that can efficiently reduce overdetection of defects rather than visual detection, and thus can suppress a decrease in process yield. it can.
  • the defect detection method for the display panel (liquid crystal display panel 1) according to aspect 2 of the present invention is the same as the defect detection method for the display panel (liquid crystal display panel 1) according to aspect 1, in the picture element lighting step (S11).
  • Application that applies at least blue (B) and red (R) picture elements to each of the red (R), green (G), and blue (B) picture elements in (liquid crystal display panel 1) It is preferable to light up so that the voltage is blue (B)> red (R).
  • the luminance difference between when only the backlight is lit and when each of the red (R), green (G), and blue (B) picture elements is lit in addition to the backlight is
  • the red (R) picture element is the second largest after the blue (B) picture element.
  • the red (R) picture element is lit so that the applied voltage applied to each picture element is blue (B)> red (R).
  • the difference in luminance between the background luminance of the blue (B) and red (R) picture elements and the luminance of the defect becomes small, so that it is difficult to be extracted as a defect.
  • the blue (B) and red (R) picture elements whose defects are more frequently detected than the visual detection are turned on. Then, defect detection is performed. Accordingly, it is possible to provide a display panel defect detection method that can more efficiently reduce the number of defects that are detected excessively than visual detection, and that can suppress a decrease in process yield.
  • the defect detection method for the display panel (liquid crystal display panel 1) according to aspect 3 of the present invention is the display panel defect detection method according to aspect 2, in the pixel lighting step (S21), the red (R) in the display panel, It is preferable that the green (G) and blue (B) picture elements are lit so that the applied voltage applied to each picture element is blue (B)> red (R) ⁇ green (G).
  • the luminance difference between when only the backlight is lit and when each of the red (R), green (G), and blue (B) picture elements is lit in addition to the backlight is , Blue (B), red (R), green (G) picture elements in order.
  • red (R) and green (G) picture elements are applied to each picture element with a blue (B)> red (R) ⁇ green (G ) To light up.
  • the luminance difference between the background luminance of the blue (B), red (R), and green (G) picture elements and the luminance of the defect becomes small, so that it is difficult to be extracted as a defect.
  • the defect detection method for the display panel (liquid crystal display panel 1) in aspect 4 of the present invention is the defect detection method for the display panel (liquid crystal display panel 1) in aspect 1, 2, or 3, wherein the pixel lighting step is performed.
  • the non-lighting defect detection procedure (S32 to S9) in which the image data acquisition process, the defective part candidate extraction process, the defective part pixel identification process, and the defect determination process are performed in this order and the pixel lighting process are performed. Thereafter, it is preferable to perform both of the above-described image data acquisition step, defect portion candidate extraction step, defect portion pixel element identification step, and defect determination step in the lighting defect detection procedure (S31 to S9) in this order.
  • the defect detection is performed only by the lighting defect detection procedure that performs picture element lighting, as described above, it is possible to reliably reduce the overdetection of defects rather than the visual detection, thereby reducing the process yield. It is possible to provide a display panel defect detection method capable of suppressing the above.
  • both the lighting defect detection procedure and the non-lighting defect detection procedure are performed. Therefore, the true defect which exists actually can be grasped
  • either the lighting defect detection procedure or the non-lighting defect detection procedure may be performed first. This is because, regardless of which is performed first, it is possible to grasp the true level defect and the visual observation level defect.
  • the present invention can be used for detecting or repairing defects in display panels such as a liquid crystal display panel, an organic EL display panel, a plasma display, an LCD display panel and the like composed of multicolor picture elements.

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Nonlinear Science (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Liquid Crystal (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Liquid Crystal Display Device Control (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)

Abstract

La présente invention se rapporte à un procédé permettant de détecter des défauts d'un panneau d'affichage, qui comprend : une étape d'éclairage d'éléments d'image (S2) qui consiste à éclairer au moins les éléments d'image bleus (B) d'un panneau d'affichage ; une étape d'acquisition de données d'image (S3) qui consiste à imager une pluralité d'éléments d'image et à acquérir leurs données d'image ; des étapes d'extraction de région défectueuse candidate (S4, S5) qui consistent à extraire un pixel des données d'image, qui fait office de région défectueuse candidate, pour lequel la valeur absolue d'une valeur de contraste représentant la différence entre le niveau de signal de luminance de pixel imagé du pixel et le niveau de signal de luminance de pixel non défectueux d'un pixel non défectueux est égale ou supérieure à une valeur seuil ; une étape d'identification d'élément d'image à région défectueuse (S6) ; et des étapes de détermination de défauts (S7, S8) qui consistent à calculer un degré de défectuosité obtenu grâce à la multiplication d'un coefficient de correction, qui est différent pour chaque couleur d'élément d'image, par la valeur de contraste, et à déterminer qu'un élément d'image d'une certaine couleur est défectueux si le degré de défectuosité est supérieur à une valeur de détermination.
PCT/JP2013/081769 2013-02-27 2013-11-26 Procédé permettant de détecter des défauts d'un panneau d'affichage et dispositif permettant de détecter des défauts d'un panneau d'affichage WO2014132506A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2013036974A JP2014164221A (ja) 2013-02-27 2013-02-27 表示パネルの欠陥検出方法及び表示パネルの欠陥検出装置
JP2013-036974 2013-02-27

Publications (1)

Publication Number Publication Date
WO2014132506A1 true WO2014132506A1 (fr) 2014-09-04

Family

ID=51427795

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2013/081769 WO2014132506A1 (fr) 2013-02-27 2013-11-26 Procédé permettant de détecter des défauts d'un panneau d'affichage et dispositif permettant de détecter des défauts d'un panneau d'affichage

Country Status (2)

Country Link
JP (1) JP2014164221A (fr)
WO (1) WO2014132506A1 (fr)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104977154A (zh) * 2015-06-26 2015-10-14 清华大学 具有子像素结构的空间光调制器缺陷分类方法
WO2017177492A1 (fr) * 2016-04-13 2017-10-19 深圳市华星光电技术有限公司 Dispositif de test pour panneau d'affichage
CN110782782A (zh) * 2019-11-28 2020-02-11 合肥维信诺科技有限公司 阵列基板的修补方法、修补***
CN111883033A (zh) * 2020-07-28 2020-11-03 云谷(固安)科技有限公司 显示面板的检测方法、***及显示面板
CN112198685A (zh) * 2020-10-30 2021-01-08 成都中电熊猫显示科技有限公司 Coa基板检测方法及装置
CN112304969A (zh) * 2019-07-15 2021-02-02 西安诺瓦星云科技股份有限公司 显示模块检测设备、方法、装置及***和存储介质
CN112666178A (zh) * 2020-12-14 2021-04-16 杭州当虹科技股份有限公司 一种户外led大屏坏点在线监控方法

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113034464B (zh) * 2021-03-23 2022-07-26 昆明理工大学 一种多背景下的液晶显示器缺陷视觉实时检测方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008241561A (ja) * 2007-03-28 2008-10-09 Casio Comput Co Ltd マトリクス表示装置の検査方法
WO2010146745A1 (fr) * 2009-06-15 2010-12-23 シャープ株式会社 Procédé d'inspection de panneau d'affichage et procédé de production du dispositif d'affichage
WO2011086634A1 (fr) * 2010-01-14 2011-07-21 シャープ株式会社 Procédé d'inspection d'un écran à cristaux liquides et dispositif

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008241561A (ja) * 2007-03-28 2008-10-09 Casio Comput Co Ltd マトリクス表示装置の検査方法
WO2010146745A1 (fr) * 2009-06-15 2010-12-23 シャープ株式会社 Procédé d'inspection de panneau d'affichage et procédé de production du dispositif d'affichage
WO2011086634A1 (fr) * 2010-01-14 2011-07-21 シャープ株式会社 Procédé d'inspection d'un écran à cristaux liquides et dispositif

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104977154A (zh) * 2015-06-26 2015-10-14 清华大学 具有子像素结构的空间光调制器缺陷分类方法
WO2017177492A1 (fr) * 2016-04-13 2017-10-19 深圳市华星光电技术有限公司 Dispositif de test pour panneau d'affichage
CN112304969A (zh) * 2019-07-15 2021-02-02 西安诺瓦星云科技股份有限公司 显示模块检测设备、方法、装置及***和存储介质
CN110782782A (zh) * 2019-11-28 2020-02-11 合肥维信诺科技有限公司 阵列基板的修补方法、修补***
CN110782782B (zh) * 2019-11-28 2022-03-29 合肥维信诺科技有限公司 阵列基板的修补方法、修补***
CN111883033A (zh) * 2020-07-28 2020-11-03 云谷(固安)科技有限公司 显示面板的检测方法、***及显示面板
CN112198685A (zh) * 2020-10-30 2021-01-08 成都中电熊猫显示科技有限公司 Coa基板检测方法及装置
CN112198685B (zh) * 2020-10-30 2023-10-03 成都京东方显示科技有限公司 Coa基板检测方法及装置
CN112666178A (zh) * 2020-12-14 2021-04-16 杭州当虹科技股份有限公司 一种户外led大屏坏点在线监控方法

Also Published As

Publication number Publication date
JP2014164221A (ja) 2014-09-08

Similar Documents

Publication Publication Date Title
WO2014132506A1 (fr) Procédé permettant de détecter des défauts d'un panneau d'affichage et dispositif permettant de détecter des défauts d'un panneau d'affichage
CN108682365B (zh) 一种oled色斑检测与修复一体化***、方法
WO2010146733A1 (fr) Procédé d'inspection de défauts et dispositif d'inspection de défauts pour écran d'affichage
WO2010146732A1 (fr) Procede d'inspection de defauts et dispositif d'inspection de defauts pour ecran d'affichage
JP2011196685A (ja) 欠陥検出装置、欠陥修復装置、表示パネル、表示装置、欠陥検出方法、プログラム
JP6000356B2 (ja) 液晶表示パネルの検査方法、および液晶表示パネルの検査装置
JP4534825B2 (ja) 欠陥検査方法および欠陥検査装置
JPWO2013175703A1 (ja) 表示装置の検査方法、および表示装置の検査装置
US11321811B2 (en) Imaging apparatus and driving method of the same
JP2009229197A (ja) 線状欠陥検出方法および線状欠陥検出装置
KR102209953B1 (ko) 무라 검출 장치
WO2013118306A1 (fr) Dispositif de détection de défauts, procédé de détection de défauts, support d'enregistrement lisible par ordinateur pour enregistrer un programme de détection de défauts
JP2008020369A (ja) 画像解析方法、画像解析装置、検査装置、画像解析プログラムおよびコンピュータ読み取り可能な記録媒体
KR101409568B1 (ko) 표시패널 검사장치 및 그 검사방법
US20120129419A1 (en) Display-panel inspection method, and method for fabricating display device
JP4664417B2 (ja) 表示パネル点灯検査装置、及び表示パネル点灯検査方法。
JP2009281759A (ja) カラーフィルタ欠陥検査方法、及び検査装置、これを用いたカラーフィルタ製造方法
KR20090074388A (ko) 표시패널의 검사 장치 및 그 방법
JPH06236162A (ja) カラー液晶パネル欠陥検査方法および装置
JP2005148670A (ja) 液晶パネルの検査画像作成方法及び装置並びに外観検査方法及び装置
KR100643248B1 (ko) 표시패널의 검사방법과 표시패널의 검사장치
JP2011027907A (ja) 輝度ムラ修正用補正データの作成方法及びその作成装置
JP2001083474A (ja) 液晶表示パネルの検査方法
JP2004294290A (ja) 表示パネルの表示欠陥検査装置
JP2004170109A (ja) 色むら検査装置および検査方法

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 13876403

Country of ref document: EP

Kind code of ref document: A1

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 13876403

Country of ref document: EP

Kind code of ref document: A1