WO2012100493A1 - Equipment, method and single board device for testing physical parameters of lines - Google Patents

Equipment, method and single board device for testing physical parameters of lines Download PDF

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Publication number
WO2012100493A1
WO2012100493A1 PCT/CN2011/075960 CN2011075960W WO2012100493A1 WO 2012100493 A1 WO2012100493 A1 WO 2012100493A1 CN 2011075960 W CN2011075960 W CN 2011075960W WO 2012100493 A1 WO2012100493 A1 WO 2012100493A1
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WO
WIPO (PCT)
Prior art keywords
signal
line
data processing
controller
tested
Prior art date
Application number
PCT/CN2011/075960
Other languages
French (fr)
Chinese (zh)
Inventor
强铨一
唐荣道
张敏华
Original Assignee
中兴通讯股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 中兴通讯股份有限公司 filed Critical 中兴通讯股份有限公司
Publication of WO2012100493A1 publication Critical patent/WO2012100493A1/en

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Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M3/00—Automatic or semi-automatic exchanges
    • H04M3/22—Arrangements for supervision, monitoring or testing
    • H04M3/26—Arrangements for supervision, monitoring or testing with means for applying test signals or for measuring
    • H04M3/28—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor
    • H04M3/30—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop
    • H04M3/305—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop testing of physical copper line parameters, e.g. capacitance or resistance
    • H04M3/306—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop testing of physical copper line parameters, e.g. capacitance or resistance for frequencies above the voice frequency, e.g. xDSL line qualification

Definitions

  • the present invention relates to the field of communications, and in particular to a test apparatus, method, and single board device for physical parameters of a line.
  • xDSL Digital Subscriber Line
  • CO central office
  • CPE client
  • subscriber line may be affected by various factors such as aging, dampness, and human damage, causing the xDSL signal to be attenuated or even interrupted.
  • the user line parameter test mainly includes TIP line (also called positive line), RING line (also called negative line), TIP line to ground, DC voltage of RING line to ground, AC voltage, insulation resistance, capacitance and so on.
  • TIP line also called positive line
  • RING line also called negative line
  • TIP line to ground DC voltage of RING line to ground
  • AC voltage AC voltage
  • insulation resistance capacitance
  • capacitance AC voltage
  • a primary object of the present invention is to provide a device, a method, and a single board device for testing physical parameters of a line, so as to at least solve the problem that the above 112 test stations cannot automatically switch different lines for testing.
  • a test apparatus for line physical parameters comprising: a data processing and controller, configured to control a signal generator, a signal receiver and a switch, and receive a digital output of the analog to digital converter a signal, determining a digital signal participating in the calculation according to the physical parameter of the tested circuit, and calculating a physical parameter of the tested circuit according to the determined digital signal participating in the calculation;
  • the switch is set to be tested according to the data processing and the control selection of the controller a line, the line to be tested is connected to the signal generator and the signal receiver;
  • the signal generator is arranged to generate an excitation signal according to the control of the data processing and the controller, send the excitation signal to the line under test, and process the data And the controller feedback excitation signal;
  • the signal receiver is set to be tested according to the data processing and the control set of the controller a signal on the line, and feedback the signal to the data processing and the controller;
  • a plurality of analog-to-digital converters configured to perform analog-to-digital
  • the data processing and controller comprises: a control module, configured to send an excitation signal generation instruction to the signal generator, send a collection instruction to the signal receiver, and send a line selection instruction to the switch; and the signal receiving module is configured to receive the plurality of a digital signal output by the analog-to-digital converter; a parameter calculation module configured to select a digital signal participating in the calculation from the digital signal received from the signal receiving module according to the physical parameter of the tested circuit, and calculate the digital signal according to the selected participating calculation The physical parameters of the line.
  • the device further comprises: a first operational amplifier disposed between the line under test and the signal generator, configured to amplify the excitation signal generated by the signal generator.
  • the device further comprises: a second operational amplifier disposed between the line under test and the signal receiver, configured to amplify the signal on the line under test.
  • the device further includes: a voltage dividing circuit module composed of two resistors disposed between the tested line and the signal receiver, configured to share the voltage between the tested line and the data processing and the controller.
  • the device further comprises: a plurality of designated resistors disposed between the line under test and the signal generator, and configured to supply a voltage of the specified resistance to the data processing and the controller.
  • the data processing and the controller generate a DC voltage, an AC voltage, or a step signal according to the physical parameter control signal generator to be acquired.
  • the above line is a twisted pair or a coaxial cable.
  • a single board device comprising a CPU and the above device, the data processing and controller in the device being connected to the CPU.
  • the signal generator generates an excitation signal according to the data processing and the control of the controller, including: the data processing and the controller generate a control instruction according to the physical parameter to be acquired; and the signal generator generates a DC voltage, an AC voltage or a step signal according to the control instruction.
  • the data processing and the controller control switch automatically select the test circuit, the manual test circuit is not required to be switched, the operation is simplified, and the problem that the 112 test bench cannot automatically switch different lines for testing is solved, and the operation efficiency is improved;
  • the device is relatively small, and is easy to integrate on a broadband access board (for example, a single board device), and is convenient to use.
  • FIG. 1 is a schematic structural diagram of a device for testing physical parameters of a line according to Embodiment 1 of the present invention
  • FIG. 2 is a block diagram showing a specific structure of a data processing and controller according to Embodiment 1 of the present invention
  • FIG. 4 is a schematic structural diagram of a device for testing physical parameters of a line according to Embodiment 2 of the present invention
  • FIG. 5 is another schematic diagram of a device for testing physical parameters of a line according to Embodiment 2 of the present invention
  • FIG. 6 is a schematic structural diagram of a single board device according to Embodiment 2 of the present invention
  • FIG. 7 is a flowchart of a test method for line physical parameters according to Embodiment 3 of the present invention
  • FIG. 8 is a flowchart according to the present invention.
  • FIG. 9 is a schematic diagram of a test line voltage according to Embodiment 3 of the present invention.
  • FIG. 10 is a schematic diagram of a test line RC according to Embodiment 3 of the present invention
  • Figure 11 is a schematic illustration of a test line nonlinear device in accordance with Embodiment 3 of the present invention.
  • BEST MODE FOR CARRYING OUT THE INVENTION Hereinafter, the present invention will be described in detail with reference to the accompanying drawings. It should be noted that the embodiments in the present application and the features in the embodiments may be combined with each other without conflict.
  • the embodiment of the invention automatically selects the tested line by using the data processing and the controller control switch, thereby realizing the purpose of automatically switching different lines for testing. Based on this, an embodiment of the present invention provides a device, a method, and a single board device for testing physical parameters of a line.
  • the tested line in the embodiment of the present invention may be a twisted pair (also referred to as a subscriber line) or a coaxial cable.
  • the twisted pair here refers to a line composed of a TIP line and a RING line.
  • FIG. 1 is a block diagram showing a configuration of a device for testing physical parameters of a line according to an embodiment of the present invention.
  • the device includes: a data processing and controller 12, a signal generator 14, a signal receiver 16, a switch 18, and a plurality of An analog-to-digital converter, wherein a plurality of analog-to-digital converters refer to more than one, respectively corresponding to each line to be tested, and are disposed in the signal generator 14 and the data processing and controller 12, the signal receiver 16 and the data processing and control Between the devices 12, this embodiment takes two analog-to-digital converters as an example, which are an analog-to-digital converter 20a and an analog-to-digital converter 20b, respectively; wherein, the data processing and controller 12 and the signal generator 14, the signal receiving The device 16 and the switch 18 are respectively connected; the functions of the respective devices are as follows: a data processing and controller 12, which is provided as a control signal generator 14, a signal receiver 16 and a switch 18, and receives digital signals output from the analog-to-digital converters 20a and 20b.
  • the analog-to-digital converter 20a is arranged to perform analog-to-digital conversion on the excitation signal fed back by the signal generator 14, and output the converted digital signal to the data processing and controller 12;
  • the analog-to-digital converter 20b is set to the signal receiver 16
  • the feedback set signal is subjected to analog-to-digital conversion, and the converted digital signal is output to the data processing and controller 12.
  • the switch 18 in this embodiment refers to a port connected to the line to be tested, that is, an analog switch.
  • the data processing and controller 12 triggers the currently tested line and signal generator by transmitting digital signals 0 and 1 to these ports.
  • the data processing and controller 12 can generate a "1000" command to be sequentially sent to the line to be tested. For each port, a port that receives "1" will connect to the line to be tested as the currently tested line.
  • the specific processing of the data processing and the processing of the feedback signal by the controller 12 is related to the physical parameters to be measured. Those skilled in the art can design a specific algorithm according to physical common sense to implement the measured physical parameters. For example: If the physical parameter to be tested is the voltage of the line, the signal fed back by the signal converter 16 converted by the analog-to-digital converter can be directly read and calculated accordingly.
  • the data processing and controller 12 includes: a control module 122 configured to send an excitation signal generation instruction to the signal generator 14 to transmit to the signal receiver 16. And transmitting a line selection instruction to the switch 18; wherein the collection instruction of the embodiment includes an instruction to trigger the signal receiver 16 to be turned on and off, so that the signal receiver 16 enters an active state and a non-operation state; the signal receiving module 124, configured to receive a digital signal obtained by converting a plurality of analog-to-digital converters (ie, analog-to-digital converter 20a and analog-to-digital converter 20b); and a parameter calculation module 126 connected to the signal receiving module 124 and configured as a pair of signal receiving modules 124 The received digital signal is calculated to obtain the physical parameters of the line being tested.
  • a control module 122 configured to send an excitation signal generation instruction to the signal generator 14 to transmit to the signal receiver 16. And transmitting a line selection instruction to the switch 18; wherein the collection instruction of the embodiment includes an instruction to trigger the signal receiver 16 to be turned on
  • the above apparatus further comprises: a plurality of operational amplifiers disposed between the line under test and the signal generator 14, arranged to amplify the excitation signal generated by the signal generator 14, and set in the tested Between the line and the signal receiver 16, it is arranged to amplify the signal fed back by the line under test.
  • the device may further include: a voltage dividing circuit module composed of two resistors, disposed between the tested line and the signal receiver 16, configured to share the tested line and data processing and control The voltage between the devices 12.
  • the above apparatus may further include: a plurality of designated resistors disposed between the line under test and the signal generator 14, configured to supply a voltage of the specified resistance to the data processing and controller 12, so that The data processing and controller 12 calculates the current of the line under test based on the voltage and the resistance of the specified resistance.
  • the data processing and controller 12 in this embodiment controls the signal generator 14 to generate a DC voltage, an AC voltage, or a step signal according to the physical parameter to be acquired. For example, the physical parameters to be acquired are sent with different control commands to generate different The motivation signal.
  • the above device of the embodiment can be separately formed into a device, and the device can be connected to the external CPU and complete the test task under the control of the CPU.
  • the device can also be disposed on a single-board device.
  • the device uses the device shown in FIG. 1 as an example, and further includes a CPU 22 and an EPLD 24.
  • the data processing and controller 12 of the device can be connected to the CPU 22 on the single board device, wherein the data processing and controller 12 is a device for specifically controlling the line test, and the external SPI (Service Provider Interface) Provider interface) Mode communication; If the CPU has an SPI port, it can directly interface with the controller 12 by using the SPI of the CPU and data processing to realize direct control of the CPU, that is, the way shown by the dotted line in the figure.
  • SPI Service Provider Interface
  • the CPU can also be converted by EPLD (Erasable Programmable Logic Device), convert the HOST (host) bus mode to SPI mode, and then connect with the data processing and controller 12.
  • EPLD Erasable Programmable Logic Device
  • the CPU indirectly accesses and controls the data processing and controller 12 through the EPLD; only one of the two methods can be selected; the current single-board device has a CPU and an EPLD, and since the HOST to SPI is convenient, the present An embodiment is to control data processing and controller 12 by EPLD. If the way shown by the dotted line is to use the SPI interface on the CPU, the connection will be less and the implementation will be simpler.
  • the above devices in this embodiment can be implemented by using existing devices, and the above devices can also be designed according to the tested lines.
  • a test device for a physical line of a subscriber line is provided by taking a line to be tested as a subscriber line (twisted pair).
  • the device mainly includes a signal generator, a signal receiver, a switch, and Resistor, ADC (analog-to-digital converter), AMP (Operational Amplifier), and data processing and controller, the connection relationship between each device can be adjusted as needed.
  • ADC analog-to-digital converter
  • AMP Orthogonal Amplifier
  • data processing and controller the connection relationship between each device can be adjusted as needed.
  • TIP0 and RING0 are a pair of subscriber lines, corresponding to ST0 and SR0 of the receiving part; and then class 4 dances, TIP7 and RING7 are another pair of subscriber lines, corresponding to ST7 and SR7 of the receiving part. of.
  • the functions of each device are as follows:
  • 2 signal generator - can generate specific excitation signals, including DC voltage signals with adjustable amplitude, AC voltage signals with adjustable amplitude and frequency, and step signals with adjustable slope and amplitude;
  • resistors R M and R G form a voltage dividing circuit to prevent damage to the device when the external voltage is high; by measuring the voltage value across R c , the current output from the signal generator to the TIP and RING lines can be calculated; When OFF is connected to the line to be tested, the capacitors on the TIP and RING lines can be discharged to the ground. This operation can increase the test accuracy before measurement. For example, when measuring voltage, first connect the switch to the line to be tested, which needs to be controlled by the controller. In addition, the signal after the signal generator is sent back to the data processing and controller is mainly used for data processing and signal sent by the controller.
  • the amplitude and current magnitude (current is obtained by dividing the voltage across the resistor by the magnitude of the resistor); if only the voltage is measured, the signal fed back from the signal generator can be used without using the signal fed back by the signal generator.
  • the data obtained is multiplied by 1+Rm/Rg (the voltage is divided by Rm and Rg;). 5
  • ADC - Convert the obtained analog signal into a digital signal, so that the data processing and the controller can be processed.
  • the device can be set in the data processing and controller, or can be set outside the data processing and controller.
  • Figure 4 shows the settings outside of the data processing and controller.
  • the device is an optional device.
  • Switch S ON or S OFF The function of S ON is to connect or disconnect the line to be tested.
  • the function of S OFF is to ground the selected line; it can be an analog switch.
  • FIG. 5 another implementation manner of the switch in this embodiment, in which S ON is connected to the corresponding line when testing is required, and S ON is connected to the ground when not testing.
  • the device shown in FIG. 4 and FIG. 5 can also be disposed on a single board device. At this time, the CPU on the single board device is connected to the data processing on the device and the controller can be connected in two ways. That is, the two modes in the embodiment 1 are only described by taking the device shown in FIG. 4 as an example. Referring to the structural block diagram of the single-board device shown in FIG.
  • FIG. 7 is a flow chart showing a test method for a physical parameter of a line according to an embodiment of the present invention.
  • the test device in the method uses the test device in the above embodiment 1 or 2, and includes the following steps: S702, the switch selects the tested circuit according to the data processing and the control of the controller, so that the tested circuit is connected to the signal generator and the signal receiver; and in step S704, the signal generator generates an excitation signal according to the data processing and the control of the controller, Sending the excitation signal to the tested line, and feeding back the excitation signal to the data processing and controller; Step S706, the signal receiver collects the signal on the tested line according to the data processing and the control of the controller, and processes the data And collecting feedback signals from the controller; Step S708, the analog-to-digital converter performs analog-to-digital conversion on the excitation signal fed back by the signal generator and the collected signal fed back by the signal receiver to obtain and output the digital signal; Step S710, the data processing and the controller receive the analog-to-digital converter output.
  • the digital signal determines the digital signal participating in the calculation according to the physical parameters of the tested line, and calculates the physical parameters of the tested line according to the determined digital signal participating in the calculation.
  • the signal generator generates an excitation signal according to the data processing and the control of the controller, including: the data processing and the controller generate a control instruction according to the physical parameter to be acquired; and the signal generator generates a DC voltage, an AC voltage or a step signal according to the control instruction.
  • C TG is a capacitance between a TIP line and a ground
  • C RG is a capacitance between a RING line and a ground
  • CTR is a TIP line and a RING Capacitance
  • R TG is the resistance between TIP line and ground
  • R RG is the resistance between RING line and ground
  • R TR is the resistance between TIP line and RING
  • U TG — DC is TIP line and ground
  • U TG — DC is TIP line and ground
  • U TG — DC is TIP line and ground
  • U TG — DC is TIP line and ground
  • U TG — AC is the AC voltage coupled between the TIP line and ground through the equivalent impedance ZBAT_TIP
  • U RG — DC is the equivalent impedance Z BAT between the RING line and the ground — RING coupled DC voltage
  • U RG — AC is the AC voltage coupled between the RING line and ground through the equivalent impedance Z BAT — RING
  • U TR — DC is the
  • FIG. 9 is a schematic diagram of the test line voltage.
  • the specific test process is as follows: The signal receiver directly samples the TIP and RING lines. The voltage value is transmitted to the data processing and controller. The data processing and controller calculate the DC voltage on the TIP, RING line, the AC voltage, and the frequency of the AC signal based on this voltage value and based on known conditions. Since the input voltage of the signal receiver is limited, it is necessary to perform processing after dividing the input voltage. For example: When measuring DC voltage, the signal receiver transmits the collected voltage value to the data processing and controller, and the data processing and controller calculate TIP and RING according to the value and the known fixed resistor divider ratio.
  • the signal receiver when measuring the AC voltage, the signal receiver receives the received data at a fixed frequency, and then passes the data to the data processing and controller in turn, and the data processing and controller are based on the data and the known
  • the resistor divider ratio is used to calculate the frequency and peak-to-peak value of the AC signal. Since the frequency of the data received by the signal receiver is fixed, there is also a limit to the frequency of the AC signal on the line, and the data of the signal receiver is sampled. The higher the frequency, the higher the frequency of the ac signal on the measurable line, and the frequency of the data of the signal receiver can be set as needed.
  • this embodiment uses the test apparatus provided in Embodiment 2 to test the resistance of the line, and FIG.
  • the capacitors on the TIP and RING lines can be discharged first, and then the signal generator generates a known DC voltage, sine wave signal or on the TIP, RING line in the order in which the signals are generated. a step signal, and feeding the signal to the data processing and the controller; wherein, the sequence of generating the signal may be first generating a DC voltage, or first generating an AC signal, and the signal may be repeatedly generated in a certain order according to requirements; the signal receiver The feedback signals of various excitations generated on the line are measured, and the data is transmitted to the data processing and controller.
  • the data processing and controller calculate C TG , C RG , C TR according to the received signal according to a specific algorithm. , R TG , R RG , R TR and other line physical parameters.
  • the first step is to add a known DC voltage VI to the TIP line, and the signal output of the RING line is grounded, and the data measured by the TIP and RING lines is collected by the signal receiver and transmitted to the data processing and controller;
  • the known DC voltage V2 is added to the RING line, the signal output of the TIP line is grounded, and the data measured on the TIP and RING lines are respectively transmitted to the data processing and controller through the signal receiver; the data processing and the controller are received according to the data.
  • the data obtained is calculated by the set algorithm, and R TG , R RG and
  • the measurement error for R TG, R RG and R TM induced minimize possible to measure R TG, RTR and the value of R RG.
  • the AC voltage V3 of the known frequency is added to the TIP line, and the signal output of the RING line is opened, and the data measured by the TIP and RING lines (including the phase of the signal) is collected by the signal receiver and transmitted to the data processing and controller;
  • Add the AC voltage V4 of the known frequency on the RING line, and the signal output of the TIP line is open, and the data (including phase) measured on the TIP and RING lines is transmitted to the data processing and controller through the signal receiver;
  • Data processing and controller Based on the received data and the measured values of R TG , R RG and R TR , C TO , C RG and C TR are calculated by the set algorithm.
  • FIG. 11 is a schematic diagram of the non-linear device of the test circuit according to the embodiment.
  • the specific testing process is as follows: When measuring the line resistance, A positive voltage is applied between the TIP line and the RING line. Since the diode (Diode) is in the reverse cut-off state, R LOAD (indicated by "R L " in Figure 11) does not affect the measured R TR , and the measured value is measured.
  • R TR — p OS When a negative charge is applied between the TIP line and the RING line, the diode (Diode) is turned on, and the measured R TR NEG is the parallel value of RLOAD and RTR. If RTR POS If there is a big difference between R TR and NEG , it can be judged that there is a nonlinear device between the TIP and the RING line, and the polarity of the nonlinear device can be known. If the values of R TR — POS and R TR — NEG are not much different, You can see that there are no nonlinear devices between TIP and RING. When testing nonlinear devices, R TR needs to select more than Ri) AD devices to ensure measurement accuracy.
  • test device in Embodiment 1 or 2 can automatically acquire the physical parameters of the line, and obtain the test result through the data processing in the test device and the processing algorithm of the controller, thereby solving the problem that the 112 test bench cannot realize the automatic switching test circuit. The problem, which in turn improves the efficiency of the test.
  • the test apparatus in the embodiment of the present invention automatically selects the test line by using the data processing and the controller control switch, and does not need to manually switch the test line, which simplifies the operation and improves the operation efficiency.
  • the above modules or steps of the present invention can be implemented by a general-purpose computing device, which can be concentrated on a single computing device or distributed over a network composed of multiple computing devices. Alternatively, they may be implemented by program code executable by the computing device, such that they may be stored in the storage device by the computing device and, in some cases, may be different from the order herein.

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Abstract

An equipment, a method and a single board for testing physical parameters of lines are provided by the present invention. The equipment comprises: a data processing and controlling device, which is set to control a signal generator, signal receiver and switch, and to calculate, according to digital signals outputted by analog-to-digital converters, the physical parameters of a line to be tested; the switch, which is set to select the line to be tested and connect the line to be tested with the signal generator and the signal receiver; the signal generator, which is set to generate stimulus signals and transmit the stimulus signals to the line to be tested; the signal receiver, which is set to collect and feed back the signals on the line to be tested; multiple analog-to-digital converters, which are set to perform the analog-to-digital conversion on the stimulus signals fed back by the signal generator and the collection signals fed back by the signal receiver and output the converted data signals to the data processing and controlling device. The present invention resolves the problem that the 112 test platform can not automatically switch different lines for test, and improves the operation efficiency.

Description

线 i ^理 的测试装置、 方法和单板设备 技术领域 本发明涉及通信领域， 具体而言， 涉及一种线路物理参数的测试装置、 方 法和单板设备。 背景技术 由于通讯技术的不断成熟和发展， xDSL ( Digital Subscriber Line, 数字用 户线）的用户快速增长， xDSL信号通过用户线在局端（ CO )和用户端（ CPE ) 之间传输。但是用户线会受到老化、受潮、人为破坏等多种因素影响，导致 xDSL 信号被衰减， 甚至中断。 为了保障 xDSL业务的正常运行， 提高电信服务质量， 需要对用户线路参 数进行快速及时的测量。 用户线路参数测试主要包括 TIP 线 （也称正极线）、 RING线（也称负极线）之间、 TIP线对地、 RING线对地的直流电压、 交流电 压、 绝缘电阻、 电容等。 目前， 用户线参数的测试主要通过 112测试台来完成， 但这种设备体积较 大， 价格比较昂贵， 其测试不同线路时无法实现自动切换， 必须依靠人工完成 切换。 发明内容 本发明的主要目的在于提供一种线路物理参数的测试装置、 方法和单板设 备， 以至少解决上述 112测试台无法自动切换不同线路进行测试的问题。 根据本发明的一个方面， 提供了一种线路物理参数的测试装置， 该装置包 括： 数据处理与控制器， 设置为控制信号发生器、 信号接收器和开关， 并接收 模数转换器输出的数字信号， 根据被测试的线路的物理参数确定参与计算的数 字信号，根据确定的参与计算的数字信号计算被测试的线路的物理参数； 开关， 设置为根据数据处理与控制器的控制选择被测试的线路， 使被测试的线路与信 号发生器和信号接收器连通； 信号发生器， 设置为根据数据处理与控制器的控 制产生激励信号， 将该激励信号发送到被测试的线路， 并向数据处理与控制器 反馈激励信号； 信号接收器， 设置为根据数据处理与控制器的控制釆集被测试 的线路上的信号， 并向数据处理与控制器反馈釆集信号； 多个模数转换器， 设 置为对信号发生器反馈的激励信号进行模数转换， 对信号接收器反馈的釆集信 号进行模数转换， 将转换后的数字信号输出给数据处理与控制器。 其中， 数据处理与控制器包括： 控制模块， 设置为向信号发生器发送激励 信号产生指令， 向信号接收器发送釆集指令， 以及向开关发送线路选择指令； 信号接收模块， 设置为接收多个模数转换器输出的数字信号； 参数计算模块， 设置为根据被测试的线路的物理参数从信号接收模块接收的数字信号中选择 参与计算的数字信号， 根据选择的参与计算的数字信号计算被测试的线路的物 理参数。 其中， 该装置还包括： 第一运算放大器， 设置在被测试的线路与信号发生 器之间， 设置为对信号发生器产生的激励信号进行放大。 其中， 该装置还包括： 第二运算放大器， 设置在被测试的线路与信号接收 器之间， 设置为对被测试的线路上的信号进行放大。 其中， 该装置还包括： 由两个电阻构成的分压电路模块， 设置在被测试的 线路与信号接收器之间， 设置为分担被测试的线路与数据处理与控制器间的电 压。 其中， 该装置还包括： 多个指定电阻， 设置在被测试的线路与信号发生器 之间， 设置为向数据处理与控制器提供指定电阻的电压。 其中， 数据处理与控制器根据欲获取的物理参数控制信号发生器产生直流 电压、 交流电压或阶跃信号。 其中， 上述线路为双绞线或同轴电缆。 根据本发明的另一方面， 提供了一种单板设备， 包括 CPU 和上述装置， 该装置中的数据处理与控制器与 CPU相连。 根据本发明的又一方面， 提供了一种线路物理参数的测试方法， 该方法使 用上述测试装置， 包括以下步骤： 开关根据数据处理与控制器的控制选择被测 试的线路， 使被测试的线路与信号发生器和信号接收器连通； 信号发生器根据 数据处理与控制器的控制产生激励信号， 将激励信号发送到被测试的线路， 并 向数据处理与控制器反馈激励信号； 信号接收器根据数据处理与控制器的控制 釆集被测试的线路上的信号， 向数据处理与控制器反馈釆集信号； 模数转换器 对信号发生器反馈的激励信号和信号接收器反馈的釆集信号进行模数转换， 得 到数字信号， 输出该数字信号； 数据处理与控制器接收模数转换器输出的数字 信号， 根据被测试的线路的物理参数确定参与计算的数字信号， 根据确定的所 述参与计算的数字信号计算所述被测试的线路的物理参数。 其中， 信号发生器根据数据处理与控制器的控制产生激励信号包括： 数据 处理与控制器根据欲获取的物理参数产生控制指令； 信号发生器根据控制指令 产生直流电压、 交流电压或阶跃信号。 通过本发明， 釆用数据处理与控制器控制开关自动选择测试线路， 不需要 手动切换测试线路， 简化了操作， 解决了 112测试台无法自动切换不同线路进 行测试的问题， 提高了操作效率； 同时， 该装置比较小， 便于集成在宽带接入 板（例如， 单板设备） 上， 使用方便。 附图说明 此处所说明的附图用来提供对本发明的进一步理解， 构成本申请的一部 分， 本发明的示意性实施例及其说明用于解释本发明， 并不构成对本发明的不 当限定。 在附图中： 图 1是根据本发明实施例 1的线路物理参数的测试装置的结构示意图； 图 2是 居本发明实施例 1的数据处理与控制器的具体结构框图； 图 3是根据本发明实施例 1的单板设备的结构示意图； 图 4是根据本发明实施例 2的线路物理参数的测试装置的结构示意图； 图 5是根据本发明实施例 2的线路物理参数的测试装置的另一种结构示意 图； 图 6是根据本发明实施例 2的单板设备的结构示意图； 图 7是才艮据本发明实施例 3的线路物理参数的测试方法流程图； 图 8是根据本发明实施例 3的测试线路的模型示意图； 图 9是才艮据本发明实施例 3的测试线路电压的示意图； 图 10是才艮据本发明实施例 3的测试线路阻容的示意图； 图 11是根据本发明实施例 3的测试线路非线性器件的示意图。 具体实施方式 下文中将参考附图并结合实施例来详细说明本发明。 需要说明的是， 在不 冲突的情况下， 本申请中的实施例及实施例中的特征可以相互组合。 本发明实施例通过釆用数据处理与控制器控制开关自动选择被测试的线 路， 实现了自动切换不同线路进行测试的目的。 基于此， 本发明实施例提供了 一种线路物理参数的测试装置、 方法和单板设备。 其中， 本发明实施例中的被 测试线路可以为双绞线 （也称为用户线）， 也可以为同轴电缆， 这里的双绞线 指由 TIP线和 RING线组成的线路。 实施例 1 图 1示出了根据本发明实施例的线路物理参数的测试装置的结构示意图， 该装置包括： 数据处理与控制器 12、 信号发生器 14、 信号接收器 16、 开关 18 和多个模数转换器， 其中， 多个模数转换器指 1个以上， 分别对应每条待测试 的线路， 设置在信号发生器 14与数据处理与控制器 12、 信号接收器 16与数据 处理与控制器 12 之间， 本实施例以两个模数转换器为例进行说明， 分别为模 数转换器 20a和模数转换器 20b; 其中， 数据处理与控制器 12与信号发生器 14、 信号接收器 16和开关 18分别相连； 各个器件的功能如下： 数据处理与控制器 12 , 设置为控制信号发生器 14、 信号接收器 16和开关 18 , 并接收模数转换器 20a和 20b输出的数字信号， 根据被测试的线路的物理 参数确定参与计算的数字信号， 根据确定的参与计算的数字信号计算被测试的 线路的物理参数； 开关 18, 设置为根据数据处理与控制器 12的控制选择被测试的线路， 使 被测试的线路与信号发生器 14和信号接收器 16连通； 信号发生器 14, 设置为根据数据处理与控制器 12的控制产生激励信号， 将激励信号发送到被测试的线路， 并向数据处理与控制器 12反馈激励信号； 信号接收器 16, 设置为根据数据处理与控制器 12的控制釆集被测试的线 路上的信号， 并向数据处理与控制器 12反馈釆集信号； 模数转换器 20a, 设置为对信号发生器 14反馈的激励信号进行模数转换， 将转换后的数字信号输出给数据处理与控制器 12; 模数转换器 20b , 设置为对信号接收器 16反馈的釆集信号进行模数转换， 将转换后的数字信号输出给数据处理与控制器 12。 本实施例中的开关 18 指与待测试线路相连的端口， 即模拟开关， 实际实 现时， 数据处理与控制器 12通过向这些端口发送数字信号 0和 1触发当前被 测试的线路与信号发生器 14和信号接收器 16连通， 例如： 待测试的线路有 4 个， 且当前被测试的线路为第一个时， 数据处理与控制器 12 可以产生" 1000" 指令依次发送给与待测试线路相连的各个端口，接收到 "1"的端口将接通待测试 的线路， 作为当前被测试的线路。 本实施例中数据处理与控制器 12 对反馈信号的处理的具体方式与所要测 得的物理参数相关， 本领域技术人员可以依据物理常识设计具体的算法， 实现 所测的物理参数。 例如： 如果当前欲测试的物理参数为线路的电压时， 可以直 接读取模数转换器转换后的信号接收器 16反馈的信号进行相应计算得到。 本 实施例通过釆用数据处理与控制器控制开关自动选择被测试的线路， 解决了 112 测试台无法自动切换不同线路进行测试的问题， 同时， 本实施例的装置体 积也比较小， 与 112测试台相比， 成本较低， 操作简单， 各端口之间的切换由 软件负责， 不用人工切换。 通过测量出的线路的物理参数 （性能参数）， 可以 判断线路是否存在缺陷， 例如线路断路， 短路等， 进而完成后续故障恢复处理。 参见图 2 , 为上述数据处理与控制器 12的具体结构框图， 该数据处理与控 制器 12包括： 控制模块 122 , 设置为向信号发生器 14发送激励信号产生指令， 向信号接 收器 16发送釆集指令， 以及向开关 18发送线路选择指令； 其中， 本实施例的釆集指令包括触发信号接收器 16 开启和关闭的指令， 以使信号接收器 16进入工作状态和非工作状态； 信号接收模块 124, 设置为接收多个模数转换器 （即模数转换器 20a和模 数转换器 20b ) 转换后得到的数字信号； 参数计算模块 126 ,与信号接收模块 124相连，设置为对信号接收模块 124 接收的数字信号进行计算， 得到被测试的线路的物理参数。 为了提高测试的精度， 上述装置还包括： 多个运算放大器， 设置在被测试 的线路与信号发生器 14之间， 设置为对信号发生器 14产生的激励信号进行放 大， 以及设置在被测试的线路与信号接收器 16 之间， 设置为对被测试的线路 反馈的信号进行放大。 根据测试的物理参数， 上述装置中还可以包括： 由两个电阻构成的分压电 路模块， 设置在被测试的线路与信号接收器 16 之间， 设置为分担被测试的线 路与数据处理与控制器 12间的电压。 为了得到被测试线路的电流， 上述装置还可以包括： 多个指定电阻， 设置 在被测试的线路与信号发生器 14之间， 设置为向数据处理与控制器 12提供指 定电阻的电压， 以使数据处理与控制器 12根据该电压和指定电阻的阻值计算 出被测试的线路的电流。 本实施例中的数据处理与控制器 12 根据欲获取的物理参数控制信号发生 器 14 产生直流电压、 交流电压或阶跃信号， 例如， 居欲获取的物理参数发 送不同的控制指令， 以产生不同的激励信号。 本实施例的上述装置可以单独故成一个设备， 该设备可以与外界的 CPU 相连， 在 CPU 的控制下完成测试任务。 该装置也可以设置在单板设备上， 参 见图 3所示的单板设备的结构示意图， 该设备以釆用图 1所示装置为例， 还包 括 CPU 22和 EPLD 24。 该装置的数据处理与控制器 12可以与单板设备上的 CPU 22连接， 其中， 数据处理与控制器 12是专门控制线路测试的器件， 其与 外部釆用 SPI ( Service Provider Interface, 月艮务提供者接口） 方式通讯； 如果 CPU有 SPI口，可以直接用 CPU的 SPI与数据处理与控制器 12对接， 实现 CPU对它的直接控制， 即图中虚线所示方式。 如果 CPU上没有 SPI口， 也可以通过 EPLD ( Erasable Programmable Logic Device, 可擦除可编程逻辑器件） 转换一下， 将 HOST (主机） 总线方式转换 成 SPI方式， 然后再与数据处理与控制器 12连接， 这样 CPU通过 EPLD间接 的去访问和控制数据处理与控制器 12; 这两种方式只要选其中一种就行； 目前 的单板设备上都有 CPU和 EPLD, 由于 HOST转 SPI比较方便， 所以本实施例 是通过 EPLD来控制数据处理与控制器 12的。 若虚线所示方式， 即釆用 CPU 上的 SPI接口， 连线将比较少， 实现也比较简单。 本实施例中的上述器件可以釆用现有的器件实现， 也可以根据测试的线路 设计上述器件。 本实施例的装置能够实现自动测试多条线路， 操作简单方便， 并且其体积小， 使用方便， 集成在单板设备上便于携带， 同时成本较低， 具有 较强的市场应用前景。 实施例 2 本实施例以待测线路为用户线路（双绞线） 为例， 提供一种用户线路物理 参数的测试装置， 参见图 4, 该装置主要包括信号发生器、 信号接收器、 开关、 电阻、 ADC (模数转换器）、 AMP (运算放大器） 及数据处理与控制器， 各个 器件间的连接关系可以根据需要调整， 本实施例仅以图 4为例进行说明， 但不 限于图 4所示结构， 其中， TIP0、 RING0为一对用户线， 与接收部分的 ST0、 SR0相对应的； 依次类 4舞， TIP7、 RING7为另一对用户线， 与接收部分的 ST7、 SR7相对应的。 各个器件的功能如下： TECHNICAL FIELD The present invention relates to the field of communications, and in particular to a test apparatus, method, and single board device for physical parameters of a line. BACKGROUND OF THE INVENTION Due to the continuous maturity and development of communication technologies, users of xDSL (Digital Subscriber Line) rapidly grow, and xDSL signals are transmitted between the central office (CO) and the client (CPE) through subscriber lines. However, the subscriber line may be affected by various factors such as aging, dampness, and human damage, causing the xDSL signal to be attenuated or even interrupted. In order to ensure the normal operation of the xDSL service and improve the quality of the telecommunication service, it is necessary to quickly and timely measure the subscriber line parameters. The user line parameter test mainly includes TIP line (also called positive line), RING line (also called negative line), TIP line to ground, DC voltage of RING line to ground, AC voltage, insulation resistance, capacitance and so on. At present, the test of the subscriber line parameters is mainly completed by the 112 test bench, but the device is large in size and relatively expensive, and cannot automatically switch when testing different lines, and must be manually switched. SUMMARY OF THE INVENTION A primary object of the present invention is to provide a device, a method, and a single board device for testing physical parameters of a line, so as to at least solve the problem that the above 112 test stations cannot automatically switch different lines for testing. According to an aspect of the present invention, a test apparatus for line physical parameters is provided, the apparatus comprising: a data processing and controller, configured to control a signal generator, a signal receiver and a switch, and receive a digital output of the analog to digital converter a signal, determining a digital signal participating in the calculation according to the physical parameter of the tested circuit, and calculating a physical parameter of the tested circuit according to the determined digital signal participating in the calculation; the switch is set to be tested according to the data processing and the control selection of the controller a line, the line to be tested is connected to the signal generator and the signal receiver; the signal generator is arranged to generate an excitation signal according to the control of the data processing and the controller, send the excitation signal to the line under test, and process the data And the controller feedback excitation signal; the signal receiver is set to be tested according to the data processing and the control set of the controller a signal on the line, and feedback the signal to the data processing and the controller; a plurality of analog-to-digital converters, configured to perform analog-to-digital conversion on the excitation signal fed back by the signal generator, and to perform the signal-received feedback signal The analog to digital conversion outputs the converted digital signal to the data processing and controller. The data processing and controller comprises: a control module, configured to send an excitation signal generation instruction to the signal generator, send a collection instruction to the signal receiver, and send a line selection instruction to the switch; and the signal receiving module is configured to receive the plurality of a digital signal output by the analog-to-digital converter; a parameter calculation module configured to select a digital signal participating in the calculation from the digital signal received from the signal receiving module according to the physical parameter of the tested circuit, and calculate the digital signal according to the selected participating calculation The physical parameters of the line. Wherein, the device further comprises: a first operational amplifier disposed between the line under test and the signal generator, configured to amplify the excitation signal generated by the signal generator. Wherein, the device further comprises: a second operational amplifier disposed between the line under test and the signal receiver, configured to amplify the signal on the line under test. The device further includes: a voltage dividing circuit module composed of two resistors disposed between the tested line and the signal receiver, configured to share the voltage between the tested line and the data processing and the controller. Wherein, the device further comprises: a plurality of designated resistors disposed between the line under test and the signal generator, and configured to supply a voltage of the specified resistance to the data processing and the controller. The data processing and the controller generate a DC voltage, an AC voltage, or a step signal according to the physical parameter control signal generator to be acquired. Wherein, the above line is a twisted pair or a coaxial cable. According to another aspect of the present invention, there is provided a single board device comprising a CPU and the above device, the data processing and controller in the device being connected to the CPU. According to still another aspect of the present invention, there is provided a method for testing physical parameters of a line, the method using the above test apparatus, comprising the steps of: the switch selects the line to be tested according to the control of the data processing and the controller, so that the line to be tested Connected to the signal generator and the signal receiver; the signal generator generates an excitation signal according to the control of the data processing and the controller, sends the excitation signal to the line to be tested, and feeds the excitation signal to the data processing and the controller; the signal receiver is based on The data processing and the control of the controller collect the signals on the tested line, and feed back the collected signals to the data processing and controller; analog to digital converter Performing analog-to-digital conversion on the excitation signal fed back by the signal generator and the collected signal fed back by the signal receiver to obtain a digital signal, and outputting the digital signal; the data processing and the controller receiving the digital signal output by the analog-to-digital converter, according to the tested The physical parameters of the line determine the digital signals participating in the calculation, and the physical parameters of the tested line are calculated based on the determined digital signals participating in the calculation. The signal generator generates an excitation signal according to the data processing and the control of the controller, including: the data processing and the controller generate a control instruction according to the physical parameter to be acquired; and the signal generator generates a DC voltage, an AC voltage or a step signal according to the control instruction. Through the invention, the data processing and the controller control switch automatically select the test circuit, the manual test circuit is not required to be switched, the operation is simplified, and the problem that the 112 test bench cannot automatically switch different lines for testing is solved, and the operation efficiency is improved; The device is relatively small, and is easy to integrate on a broadband access board (for example, a single board device), and is convenient to use. BRIEF DESCRIPTION OF THE DRAWINGS The accompanying drawings, which are set to illustrate,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,, BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a schematic structural diagram of a device for testing physical parameters of a line according to Embodiment 1 of the present invention; FIG. 2 is a block diagram showing a specific structure of a data processing and controller according to Embodiment 1 of the present invention; FIG. 4 is a schematic structural diagram of a device for testing physical parameters of a line according to Embodiment 2 of the present invention; FIG. 5 is another schematic diagram of a device for testing physical parameters of a line according to Embodiment 2 of the present invention; FIG. 6 is a schematic structural diagram of a single board device according to Embodiment 2 of the present invention; FIG. 7 is a flowchart of a test method for line physical parameters according to Embodiment 3 of the present invention; FIG. 8 is a flowchart according to the present invention. FIG. 9 is a schematic diagram of a test line voltage according to Embodiment 3 of the present invention; FIG. 10 is a schematic diagram of a test line RC according to Embodiment 3 of the present invention; Figure 11 is a schematic illustration of a test line nonlinear device in accordance with Embodiment 3 of the present invention. BEST MODE FOR CARRYING OUT THE INVENTION Hereinafter, the present invention will be described in detail with reference to the accompanying drawings. It should be noted that the embodiments in the present application and the features in the embodiments may be combined with each other without conflict. The embodiment of the invention automatically selects the tested line by using the data processing and the controller control switch, thereby realizing the purpose of automatically switching different lines for testing. Based on this, an embodiment of the present invention provides a device, a method, and a single board device for testing physical parameters of a line. The tested line in the embodiment of the present invention may be a twisted pair (also referred to as a subscriber line) or a coaxial cable. The twisted pair here refers to a line composed of a TIP line and a RING line. Embodiment 1 FIG. 1 is a block diagram showing a configuration of a device for testing physical parameters of a line according to an embodiment of the present invention. The device includes: a data processing and controller 12, a signal generator 14, a signal receiver 16, a switch 18, and a plurality of An analog-to-digital converter, wherein a plurality of analog-to-digital converters refer to more than one, respectively corresponding to each line to be tested, and are disposed in the signal generator 14 and the data processing and controller 12, the signal receiver 16 and the data processing and control Between the devices 12, this embodiment takes two analog-to-digital converters as an example, which are an analog-to-digital converter 20a and an analog-to-digital converter 20b, respectively; wherein, the data processing and controller 12 and the signal generator 14, the signal receiving The device 16 and the switch 18 are respectively connected; the functions of the respective devices are as follows: a data processing and controller 12, which is provided as a control signal generator 14, a signal receiver 16 and a switch 18, and receives digital signals output from the analog-to-digital converters 20a and 20b. Determining the digital signal participating in the calculation according to the physical parameters of the tested line, and calculating the physical parameter of the tested line according to the determined digital signal participating in the calculation; 18, arranged to select the tested line according to the data processing and the control of the controller 12, so that the line under test is connected to the signal generator 14 and the signal receiver 16; the signal generator 14 is set according to the data processing and controller 12 The control generates an excitation signal, sends the excitation signal to the line under test, and feeds the excitation signal to the data processing and controller 12; the signal receiver 16 is arranged to collect the tested line according to the data processing and the control of the controller 12. The signal on, and feedback the signal to the data processing and controller 12; The analog-to-digital converter 20a is arranged to perform analog-to-digital conversion on the excitation signal fed back by the signal generator 14, and output the converted digital signal to the data processing and controller 12; the analog-to-digital converter 20b is set to the signal receiver 16 The feedback set signal is subjected to analog-to-digital conversion, and the converted digital signal is output to the data processing and controller 12. The switch 18 in this embodiment refers to a port connected to the line to be tested, that is, an analog switch. In actual implementation, the data processing and controller 12 triggers the currently tested line and signal generator by transmitting digital signals 0 and 1 to these ports. 14 is connected to the signal receiver 16, for example: when there are 4 lines to be tested, and the currently tested line is the first one, the data processing and controller 12 can generate a "1000" command to be sequentially sent to the line to be tested. For each port, a port that receives "1" will connect to the line to be tested as the currently tested line. In this embodiment, the specific processing of the data processing and the processing of the feedback signal by the controller 12 is related to the physical parameters to be measured. Those skilled in the art can design a specific algorithm according to physical common sense to implement the measured physical parameters. For example: If the physical parameter to be tested is the voltage of the line, the signal fed back by the signal converter 16 converted by the analog-to-digital converter can be directly read and calculated accordingly. In this embodiment, by automatically selecting the tested circuit by using the data processing and the controller control switch, the problem that the 112 test bench cannot automatically switch different lines for testing is solved, and at the same time, the device of the embodiment is relatively small, and the test is 112. Compared with Taiwan, the cost is lower, the operation is simple, and the switching between ports is handled by the software, without manual switching. Through the measured physical parameters (performance parameters) of the line, it can be judged whether there is a defect in the line, such as line break, short circuit, etc., thereby completing the subsequent fault recovery processing. Referring to FIG. 2, which is a specific structural block diagram of the data processing and controller 12, the data processing and controller 12 includes: a control module 122 configured to send an excitation signal generation instruction to the signal generator 14 to transmit to the signal receiver 16. And transmitting a line selection instruction to the switch 18; wherein the collection instruction of the embodiment includes an instruction to trigger the signal receiver 16 to be turned on and off, so that the signal receiver 16 enters an active state and a non-operation state; the signal receiving module 124, configured to receive a digital signal obtained by converting a plurality of analog-to-digital converters (ie, analog-to-digital converter 20a and analog-to-digital converter 20b); and a parameter calculation module 126 connected to the signal receiving module 124 and configured as a pair of signal receiving modules 124 The received digital signal is calculated to obtain the physical parameters of the line being tested. In order to improve the accuracy of the test, the above apparatus further comprises: a plurality of operational amplifiers disposed between the line under test and the signal generator 14, arranged to amplify the excitation signal generated by the signal generator 14, and set in the tested Between the line and the signal receiver 16, it is arranged to amplify the signal fed back by the line under test. According to the physical parameters of the test, the device may further include: a voltage dividing circuit module composed of two resistors, disposed between the tested line and the signal receiver 16, configured to share the tested line and data processing and control The voltage between the devices 12. In order to obtain the current of the circuit under test, the above apparatus may further include: a plurality of designated resistors disposed between the line under test and the signal generator 14, configured to supply a voltage of the specified resistance to the data processing and controller 12, so that The data processing and controller 12 calculates the current of the line under test based on the voltage and the resistance of the specified resistance. The data processing and controller 12 in this embodiment controls the signal generator 14 to generate a DC voltage, an AC voltage, or a step signal according to the physical parameter to be acquired. For example, the physical parameters to be acquired are sent with different control commands to generate different The motivation signal. The above device of the embodiment can be separately formed into a device, and the device can be connected to the external CPU and complete the test task under the control of the CPU. The device can also be disposed on a single-board device. Referring to the structural diagram of the single-board device shown in FIG. 3, the device uses the device shown in FIG. 1 as an example, and further includes a CPU 22 and an EPLD 24. The data processing and controller 12 of the device can be connected to the CPU 22 on the single board device, wherein the data processing and controller 12 is a device for specifically controlling the line test, and the external SPI (Service Provider Interface) Provider interface) Mode communication; If the CPU has an SPI port, it can directly interface with the controller 12 by using the SPI of the CPU and data processing to realize direct control of the CPU, that is, the way shown by the dotted line in the figure. If there is no SPI port on the CPU, it can also be converted by EPLD (Erasable Programmable Logic Device), convert the HOST (host) bus mode to SPI mode, and then connect with the data processing and controller 12. In this way, the CPU indirectly accesses and controls the data processing and controller 12 through the EPLD; only one of the two methods can be selected; the current single-board device has a CPU and an EPLD, and since the HOST to SPI is convenient, the present An embodiment is to control data processing and controller 12 by EPLD. If the way shown by the dotted line is to use the SPI interface on the CPU, the connection will be less and the implementation will be simpler. The above devices in this embodiment can be implemented by using existing devices, and the above devices can also be designed according to the tested lines. The device of the embodiment can automatically test multiple lines, is simple and convenient to operate, and has the advantages of small size, convenient use, and convenient integration on a single board device, and has low cost and strong market application prospect. Embodiment 2 In this embodiment, a test device for a physical line of a subscriber line is provided by taking a line to be tested as a subscriber line (twisted pair). Referring to FIG. 4, the device mainly includes a signal generator, a signal receiver, a switch, and Resistor, ADC (analog-to-digital converter), AMP (Operational Amplifier), and data processing and controller, the connection relationship between each device can be adjusted as needed. This embodiment is only illustrated by using FIG. 4 as an example, but is not limited to FIG. In the structure shown, where TIP0 and RING0 are a pair of subscriber lines, corresponding to ST0 and SR0 of the receiving part; and then class 4 dances, TIP7 and RING7 are another pair of subscriber lines, corresponding to ST7 and SR7 of the receiving part. of. The functions of each device are as follows:
①数据处理与控制器——可以根据需要选择测试的线路， 将开关 SON (图 4 中用 "Si"表示） 或者开关 SOFF (图 4 中用 "S2"表示） 连接到待测线路上， 同时对信号发生器发送的激励信号的反馈与信号接收器收到的信号进行处理 计算， 最终得到需要测量的线路参数； 1 data processing and controller - you can select the test line according to your needs, connect the switch S ON (indicated by "Si" in Figure 4) or the switch S OFF (indicated by "S 2 " in Figure 4) to the line to be tested. At the same time, the feedback of the excitation signal sent by the signal generator and the signal received by the signal receiver are processed and calculated, and finally the line parameters to be measured are obtained;
②信号发生器——可以产生特定的激励信号， 包括幅度可调的直流电压信 号， 幅度与频率可调的交流电压信号， 斜率与幅度可调的阶跃信号； 2 signal generator - can generate specific excitation signals, including DC voltage signals with adjustable amplitude, AC voltage signals with adjustable amplitude and frequency, and step signals with adjustable slope and amplitude;
③信号接收器——釆样线路上的响应信号， 并将其传输给数据处理与控制 器。 3 Signal Receiver - The response signal on the sample line is transmitted to the data processing and controller.
④电阻 RM与 RG构成分压电路， 以防止外部电压较高时损坏器件； 通 过测量 Rc两端的电压值， 可以计算出信号发生器输出到 TIP和 RING线上的 电流； 当开关 SOFF连接到待测线路上时， 可以让 TIP和 RING线上的电容对地 放电， 在测量前做这个操作能增加测试精度。 例如， 测电压时首先要将开关连 接到待测线路， 此时需要控制器控制的； 另外信号发生器出来后的信号反馈给 数据处理与控制器的主要目的是数据处理与控制器发送的信号的幅值及电流 大小 （电流是通过那个电阻两端的电压值除以电阻大小得到的）； 如果只测电 压的话，可以不使用信号发生器反馈的信号，直接使用信号接收器反馈的信号， 读到的数据乘上 1+Rm/Rg (电压被 Rm和 Rg分压；)。 ⑤ ADC——将得到的模拟信号转化成数字信号，使得数据处理与控制器能 够进行处理， 该器件可以设置在数据处理与控制器内， 也可以设置在数据处理 与控制器外， 本实施例图 4为设置在数据处理与控制器外。 4 resistors R M and R G form a voltage dividing circuit to prevent damage to the device when the external voltage is high; by measuring the voltage value across R c , the current output from the signal generator to the TIP and RING lines can be calculated; When OFF is connected to the line to be tested, the capacitors on the TIP and RING lines can be discharged to the ground. This operation can increase the test accuracy before measurement. For example, when measuring voltage, first connect the switch to the line to be tested, which needs to be controlled by the controller. In addition, the signal after the signal generator is sent back to the data processing and controller is mainly used for data processing and signal sent by the controller. The amplitude and current magnitude (current is obtained by dividing the voltage across the resistor by the magnitude of the resistor); if only the voltage is measured, the signal fed back from the signal generator can be used without using the signal fed back by the signal generator. The data obtained is multiplied by 1+Rm/Rg (the voltage is divided by Rm and Rg;). 5 ADC - Convert the obtained analog signal into a digital signal, so that the data processing and the controller can be processed. The device can be set in the data processing and controller, or can be set outside the data processing and controller. Figure 4 shows the settings outside of the data processing and controller.
⑥ AMP——放大输出的信号和放大接收的信号， 提高测量精度， 该器件为 可选器件。 6 AMP - Amplifies the output signal and amplifies the received signal to improve measurement accuracy. The device is an optional device.
⑦开关 SON或者 SOFF—— SON的作用是连通或断开待测线路， SOFF的作用 是将选定的线路接地； 其可以为模拟开关。 参见图 5 , 为本实施例中的开关的另一种实现方式， 其中， 需要测试时， 将 SON连接到相应的线路上， 不测试时将 SON连接到地上。 同样， 图 4和图 5所示的装置也可以设置在单板设备上， 此时， 单板设备 上的 CPU 与该装置上的数据处理与控制器相连， 其连接方式仍可以有两种， 即实施例 1中的两种方式， 这里仅以图 4所示装置为例进行说明， 参见图 6所 示的单板设备的结构框图， 单板设备通过其上的 CPU控制数据处理与控制器， 完成线路的测试。 本实施例的信号发生器向待测用户线路发送已知信号， 随后信号接收器接 收用户线上的反馈信号， 由数据处理与控制器进行处理， 确定用户线的物理特 性， 整个测试过程不需要手动切换测试线路， 直接由数据处理与控制器发送控 制指令即可实现， 操作简单， 且装置的成本比较低。 实施例 3 图 7示出了才艮据本发明实施例的线路物理参数的测试方法流程图， 该方法 中的测试装置使用上述实施例 1或 2中的测试装置， 包括以下步 4聚： 步骤 S702, 开关根据数据处理与控制器的控制选择被测试的线路， 使被测 试的线路与信号发生器和信号接收器连通； 步骤 S704, 信号发生器根据数据处理与控制器的控制产生激励信号， 将该 激励信号发送到被测试的线路， 并向数据处理与控制器反馈该激励信号； 步骤 S706,信号接收器根据数据处理与控制器的控制釆集被测试的线路上 的信号， 向数据处理与控制器反馈釆集信号； 步骤 S708 ,模数转换器对信号发生器反馈的激励信号和信号接收器反馈的 釆集信号进行模数转换， 得到并输出该数字信号； 步骤 S710 , 数据处理与控制器接收模数转换器输出的数字信号，根据被测 试的线路的物理参数确定参与计算的数字信号， 根据确定的参与计算的数字信 号计算被测试的线路的物理参数。 其中， 信号发生器根据数据处理与控制器的控制产生激励信号包括： 数据 处理与控制器根据欲获取的物理参数产生控制指令； 信号发生器根据控制指令 产生直流电压、 交流电压或阶跃信号。 图 8示出了本发明实施例的测试线路的模型结构框图， 其中， CTG为 TIP 线与地之间的电容， CRG为 RING线与地之间的电容， CTR为 TIP线与 RING之 间的电容， RTG为 TIP线与地之间的电阻， RRG为 RING线与地之间的电阻， RTR为 TIP 线与 RING之间的电阻， UTG— DC为 TIP 线与地之间通过等效阻抗 ZBAT_TIP 合的直流电压， UTG— AC为 TIP线与地之间通过等效阻抗 ZBAT_TIP耦合 的交流电压， URG— DC为 RING线与地之间通过等效阻抗 ZBAT— RING耦合的直流电 压， URG— AC为 RING线与地之间通过等效阻抗 ZBAT— RING耦合的交流电压， UTR— DC 为 TIP线与 RING线之间通过等效阻抗 ZBAT— TIPRING耦合的直流电压， UTR— AC 为 TIP线与 RING线之间通过等效阻抗 ZBAT— TIPRING耦合的交流电压。 基于图 8所示的测试线路， 本实施例釆用实施例 2提供的测试装置测试线 路电压， 图 9为测试线路电压示意图， 具体测试过程如下： 信号接收器直接釆样 TIP、 RING 线上的电压值， 传输给数据处理和控制 器， 数据处理和控制器根据这个电压值， 并根据已知条件， 计算出 TIP、 RING 线上的直流电压、 交流电压， 以及交流信号的频率。 由于信号接收器的输入电 压有限制， 因此需要在对输入的电压进行分压后在进行处理。 例如： 当测量直流电压时， 信号接收器将釆集到的电压值传给数据处理与控制 器， 数据处理与控制器才艮据该值和已知固定的电阻分压比计算出 TIP和 RING 线上的直流电压； 当测量交流电压时， 信号接收器按固定频率釆样接收到的数据， 然后将这 些数据依次传递给数据处理与控制器， 数据处理与控制器根据这些数据和已知 的电阻分压比， 计算出交流信号的频率与峰峰值。 由于信号接收器釆样数据的 频率固定， 因此对于线路上的交流信号的频率也有限制， 信号接收器釆样数据 的频率越高， 则可测线路上交流信号的频率也越高， 可以根据需要设定信号接 收器的釆样数据频率。 基于图 8所示的测试线路， 本实施例釆用实施例 2提供的测试装置测试线 路的阻容， 图 10 示出了测试线路阻容示意图。 为了防止电容上有电压影响测 量精度， 可以先对 TIP、 RING 线上的电容进行放电， 然后信号发生器分别按 产生信号的顺序在 TIP、 RING 线上产生已知的直流电压、 正弦波信号或阶跃 信号， 并将该信号反馈给数据处理与控制器； 其中， 产生信号的顺序可以为先 产生直流电压， 也可以为先产生交流信号， 信号可以根据需要按一定次序反复 产生； 信号接收器对线路上产生的各种激励的反馈信号进行测量， 并把数据传 递给数据处理与控制器， 数据处理与控制器根据接收到的信号， 按特定的算法 计算出 CTG、 CRG、 CTR、 RTG、 RRG、 RTR等线路物理参数。 测量电阻时， 第一步， 在 TIP线上加已知直流电压 VI , RING线的信号输 出接地， 通过信号接收器釆集 TIP、 RING 线上测量的数据， 传给数据处理与 控制器； 第二步， 在 RING线上加已知直流电压 V2, TIP线的信号输出接地， 通过信号接收器将 TIP、 RING 线上测量的数据分别传给数据处理与控制器； 数据处理与控制器根据接收到的数据通过设定的算法， 计算得到 RTG, RRG与 7 Switch S ON or S OFF —— The function of S ON is to connect or disconnect the line to be tested. The function of S OFF is to ground the selected line; it can be an analog switch. Referring to FIG. 5, another implementation manner of the switch in this embodiment, in which S ON is connected to the corresponding line when testing is required, and S ON is connected to the ground when not testing. Similarly, the device shown in FIG. 4 and FIG. 5 can also be disposed on a single board device. At this time, the CPU on the single board device is connected to the data processing on the device and the controller can be connected in two ways. That is, the two modes in the embodiment 1 are only described by taking the device shown in FIG. 4 as an example. Referring to the structural block diagram of the single-board device shown in FIG. 6, the single-board device controls the data processing and the controller through the CPU thereon. , complete the test of the line. The signal generator of the embodiment sends a known signal to the user line to be tested, and then the signal receiver receives the feedback signal on the subscriber line, and the data processing and the controller process to determine the physical characteristics of the subscriber line, and the entire test process does not need to be performed. Manually switching the test line can be realized directly by the data processing and the controller sending the control command, the operation is simple, and the cost of the device is relatively low. Embodiment 3 FIG. 7 is a flow chart showing a test method for a physical parameter of a line according to an embodiment of the present invention. The test device in the method uses the test device in the above embodiment 1 or 2, and includes the following steps: S702, the switch selects the tested circuit according to the data processing and the control of the controller, so that the tested circuit is connected to the signal generator and the signal receiver; and in step S704, the signal generator generates an excitation signal according to the data processing and the control of the controller, Sending the excitation signal to the tested line, and feeding back the excitation signal to the data processing and controller; Step S706, the signal receiver collects the signal on the tested line according to the data processing and the control of the controller, and processes the data And collecting feedback signals from the controller; Step S708, the analog-to-digital converter performs analog-to-digital conversion on the excitation signal fed back by the signal generator and the collected signal fed back by the signal receiver to obtain and output the digital signal; Step S710, the data processing and the controller receive the analog-to-digital converter output. The digital signal determines the digital signal participating in the calculation according to the physical parameters of the tested line, and calculates the physical parameters of the tested line according to the determined digital signal participating in the calculation. The signal generator generates an excitation signal according to the data processing and the control of the controller, including: the data processing and the controller generate a control instruction according to the physical parameter to be acquired; and the signal generator generates a DC voltage, an AC voltage or a step signal according to the control instruction. FIG. 8 is a block diagram showing a model structure of a test circuit according to an embodiment of the present invention, wherein C TG is a capacitance between a TIP line and a ground, C RG is a capacitance between a RING line and a ground, and CTR is a TIP line and a RING Capacitance, R TG is the resistance between TIP line and ground, R RG is the resistance between RING line and ground, R TR is the resistance between TIP line and RING, U TG — DC is TIP line and ground The DC voltage through the equivalent impedance ZBAT_TIP, U TG — AC is the AC voltage coupled between the TIP line and ground through the equivalent impedance ZBAT_TIP, U RG — DC is the equivalent impedance Z BAT between the RING line and the ground — RING coupled DC voltage, U RG — AC is the AC voltage coupled between the RING line and ground through the equivalent impedance Z BAT — RING , U TR — DC is the equivalent impedance between the TIP line and the RING line Z BAT — TIPRING The coupled DC voltage, U TR — AC is the AC voltage coupled between the TIP line and the RING line by the equivalent impedance Z BAT — TIPRING . Based on the test circuit shown in FIG. 8, this embodiment uses the test device provided in Embodiment 2 to test the line voltage, and FIG. 9 is a schematic diagram of the test line voltage. The specific test process is as follows: The signal receiver directly samples the TIP and RING lines. The voltage value is transmitted to the data processing and controller. The data processing and controller calculate the DC voltage on the TIP, RING line, the AC voltage, and the frequency of the AC signal based on this voltage value and based on known conditions. Since the input voltage of the signal receiver is limited, it is necessary to perform processing after dividing the input voltage. For example: When measuring DC voltage, the signal receiver transmits the collected voltage value to the data processing and controller, and the data processing and controller calculate TIP and RING according to the value and the known fixed resistor divider ratio. DC voltage on the line; when measuring the AC voltage, the signal receiver receives the received data at a fixed frequency, and then passes the data to the data processing and controller in turn, and the data processing and controller are based on the data and the known The resistor divider ratio is used to calculate the frequency and peak-to-peak value of the AC signal. Since the frequency of the data received by the signal receiver is fixed, there is also a limit to the frequency of the AC signal on the line, and the data of the signal receiver is sampled. The higher the frequency, the higher the frequency of the ac signal on the measurable line, and the frequency of the data of the signal receiver can be set as needed. Based on the test circuit shown in FIG. 8, this embodiment uses the test apparatus provided in Embodiment 2 to test the resistance of the line, and FIG. 10 shows the resistance line of the test line. In order to prevent the voltage on the capacitor from affecting the measurement accuracy, the capacitors on the TIP and RING lines can be discharged first, and then the signal generator generates a known DC voltage, sine wave signal or on the TIP, RING line in the order in which the signals are generated. a step signal, and feeding the signal to the data processing and the controller; wherein, the sequence of generating the signal may be first generating a DC voltage, or first generating an AC signal, and the signal may be repeatedly generated in a certain order according to requirements; the signal receiver The feedback signals of various excitations generated on the line are measured, and the data is transmitted to the data processing and controller. The data processing and controller calculate C TG , C RG , C TR according to the received signal according to a specific algorithm. , R TG , R RG , R TR and other line physical parameters. When measuring the resistance, the first step is to add a known DC voltage VI to the TIP line, and the signal output of the RING line is grounded, and the data measured by the TIP and RING lines is collected by the signal receiver and transmitted to the data processing and controller; In the second step, the known DC voltage V2 is added to the RING line, the signal output of the TIP line is grounded, and the data measured on the TIP and RING lines are respectively transmitted to the data processing and controller through the signal receiver; the data processing and the controller are received according to the data. The data obtained is calculated by the set algorithm, and R TG , R RG and
测量电容时， 为了将 RTG, RRG与 R™引起的测量误差尽可能减到最小， 先测量出 RTG, RRG与 RTR的值。 然后在 TIP线上加已知频率的交流电压 V3 , RING线的信号输出开路，通过信号接收器釆集 TIP、 RING线上测量的数据（包 括信号的相位）， 传给数据处理与控制器； 在 RING 线上加已知频率的交流电 压 V4, TIP线的信号输出开路， 通过信号接收器将 TIP、 RING线上测量的数 据 （包括相位）传给数据处理与控制器； 数据处理与控制器根据接收到的数据 和测量得到的 RTG, RRG与 RTR的值， 通过设定的算法， 计算得到 CTO, CRG与 CTR。 另外， 本发明实施例提供的测试装置还可以用于测试线路上是否有非线性 器件， 图 11为本实施例测试线路非线性器件的示意图， 具体测试过程如下： 在测量线路电阻时， 通过在 TIP线与 RING线之间加正电压， 由于二极管 ( Diode ) 处在反向截止状态， RLOAD (图 11 中用 "RL "表示） 不会影响测量 的 RTR, 此时测量得到的值为 RTR— pOS; 当 TIP线与 RING线之间加负电时， 二 极管（ Diode )导通， 此时测得的 RTR NEG为 RLOAD与 RTR的并联值。 若 RTR POS 与 RTR— NEG相差很大， 则可以判断出 TIP与 RING线之间有非线性器件， 并能 知道非线性器件的极性， 若 RTR— POS与 RTR— NEG两值相差不大， 则可以知道 TIP 与 RING之间没有非线性器件。在测试非线性器件时， RTR需要选择大于 Ri )AD 器件， 以保证测量的准确性。 可选地， 本实施例仅给出上述几种测试方式， 根据实际测试要求， 可以在 数据处理与控制器中设置不同的数据处理算法， 改变上述测量线路物理参数的 具体步骤与方法。 本实施例釆用实施例 1或 2中的测试装置可以自动获取线路的物理参数， 通过测试装置中的数据处理与控制器的处理算法得到测试结果， 解决了 112测 试台不能实现自动切换测试线路的问题， 进而提高了测试的效率。 从以上的描述中可以看出， 本发明实施例中的测试装置釆用数据处理与控 制器控制开关自动选择测试线路， 不需要手动切换测试线路， 简化了操作， 提 高了操作效率。 显然， 本领域的技术人员应该明白， 上述的本发明的各模块或各步骤可以 用通用的计算装置来实现， 它们可以集中在单个的计算装置上， 或者分布在多 个计算装置所组成的网络上， 可选地， 它们可以用计算装置可执行的程序代码 来实现， 从而， 可以将它们存储在存储装置中由计算装置来执行， 并且在某些 情况下， 可以以不同于此处的顺序执行所示出或描述的步骤， 或者将它们分别 制作成各个集成电路模块， 或者将它们中的多个模块或步骤制作成单个集成电 路模块来实现。 这样， 本发明不限制于任何特定的硬件和软件结合。 以上所述仅为本发明的优选实施例而已， 并不用于限制本发明， 对于本领 域的技术人员来说， 本发明可以有各种更改和变化。 凡在本发明的 ^"神和原则 之内， 所作的任何修改、 等同替换、 改进等， 均应包含在本发明的保护范围之 内。 For capacitance measurements, the measurement error for R TG, R RG and R ™ induced minimize possible to measure R TG, RTR and the value of R RG. Then, the AC voltage V3 of the known frequency is added to the TIP line, and the signal output of the RING line is opened, and the data measured by the TIP and RING lines (including the phase of the signal) is collected by the signal receiver and transmitted to the data processing and controller; Add the AC voltage V4 of the known frequency on the RING line, and the signal output of the TIP line is open, and the data (including phase) measured on the TIP and RING lines is transmitted to the data processing and controller through the signal receiver; Data processing and controller Based on the received data and the measured values of R TG , R RG and R TR , C TO , C RG and C TR are calculated by the set algorithm. In addition, the testing device provided by the embodiment of the present invention can also be used to test whether there is a non-linear device on the line. FIG. 11 is a schematic diagram of the non-linear device of the test circuit according to the embodiment. The specific testing process is as follows: When measuring the line resistance, A positive voltage is applied between the TIP line and the RING line. Since the diode (Diode) is in the reverse cut-off state, R LOAD (indicated by "R L " in Figure 11) does not affect the measured R TR , and the measured value is measured. R TR — p OS ; When a negative charge is applied between the TIP line and the RING line, the diode (Diode) is turned on, and the measured R TR NEG is the parallel value of RLOAD and RTR. If RTR POS If there is a big difference between R TR and NEG , it can be judged that there is a nonlinear device between the TIP and the RING line, and the polarity of the nonlinear device can be known. If the values of R TR — POS and R TR — NEG are not much different, You can see that there are no nonlinear devices between TIP and RING. When testing nonlinear devices, R TR needs to select more than Ri) AD devices to ensure measurement accuracy. Optionally, in this embodiment, only the foregoing test modes are given. According to the actual test requirements, different data processing algorithms may be set in the data processing and the controller, and the specific steps and methods of the physical parameters of the measurement line are changed. In this embodiment, the test device in Embodiment 1 or 2 can automatically acquire the physical parameters of the line, and obtain the test result through the data processing in the test device and the processing algorithm of the controller, thereby solving the problem that the 112 test bench cannot realize the automatic switching test circuit. The problem, which in turn improves the efficiency of the test. As can be seen from the above description, the test apparatus in the embodiment of the present invention automatically selects the test line by using the data processing and the controller control switch, and does not need to manually switch the test line, which simplifies the operation and improves the operation efficiency. Obviously, those skilled in the art should understand that the above modules or steps of the present invention can be implemented by a general-purpose computing device, which can be concentrated on a single computing device or distributed over a network composed of multiple computing devices. Alternatively, they may be implemented by program code executable by the computing device, such that they may be stored in the storage device by the computing device and, in some cases, may be different from the order herein. The steps shown or described are performed, or they are separately fabricated into individual integrated circuit modules, or a plurality of modules or steps are fabricated as a single integrated circuit module. Thus, the invention is not limited to any specific combination of hardware and software. The above is only the preferred embodiment of the present invention, and is not intended to limit the present invention, and various modifications and changes can be made to the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the scope of the present invention are intended to be included within the scope of the present invention.

Claims

权 利 要 求 书 Claim
1. 一种线路物理参数的测试装置， 包括： 1. A test device for physical parameters of a line, comprising:
数据处理与控制器， 设置为控制信号发生器、 信号接收器和开关， 并接收模数转换器输出的数字信号， 根据被测试的线路的物理参数确定 参与计算的数字信号， 根据确定的所述参与计算的数字信号计算所述被 测试的线路的物理参数；  a data processing and controller, configured to control the signal generator, the signal receiver and the switch, and receive the digital signal output by the analog-to-digital converter, and determine a digital signal participating in the calculation according to the physical parameter of the tested circuit, according to the determined Calculating the physical parameters of the tested line by participating in the calculated digital signal;
所述开关， 设置为根据所述数据处理与控制器的控制选择被测试的 线路， 使所述被测试的线路与所述信号发生器和所述信号接收器连通； 所述信号发生器， 设置为根据所述数据处理与控制器的控制产生激 励信号， 将所述激励信号发送到所述被测试的线路， 并向所述数据处理 与控制器反馈所述激励信号；  The switch is configured to select a line to be tested according to the data processing and control of the controller, to connect the line under test to the signal generator and the signal receiver; the signal generator, setting Generating an excitation signal according to the control of the data processing and the controller, transmitting the excitation signal to the circuit under test, and feeding back the excitation signal to the data processing and controller;
所述信号接收器， 设置为根据所述数据处理与控制器的控制釆集所 述被测试的线路上的信号， 并向所述数据处理与控制器反馈釆集信号； 多个所述模数转换器， 设置为对所述信号发生器反馈的所述激励信 号进行模数转换，对所述信号接收器反馈的所述釆集信号进行模数转换， 并将转换后的数字信号输出给所述数据处理与控制器。  The signal receiver is configured to collect signals on the tested line according to the data processing and control of the controller, and feed back the collected signal to the data processing and controller; a converter, configured to perform analog-to-digital conversion on the excitation signal fed back by the signal generator, perform analog-to-digital conversion on the collected signal fed back by the signal receiver, and output the converted digital signal to the Data processing and controller.
2. 根据权利要求 1所述的装置， 其中， 所述数据处理与控制器包括： 2. The apparatus according to claim 1, wherein the data processing and controller comprises:
控制模块， 设置为向所述信号发生器发送激励信号产生指令， 向所 述信号接收器发送釆集指令， 以及向所述开关发送线路选择指令；  And a control module configured to send an excitation signal generation instruction to the signal generator, send a collection instruction to the signal receiver, and send a line selection instruction to the switch;
信号接收模块， 设置为接收所述多个模数转换器输出的数字信号； 参数计算模块， 设置为根据被测试的线路的物理参数从所述信号接 收模块接收的数字信号中选择参与计算的数字信号， 根据选择的所述参 与计算的数字信号计算所述被测试的线路的物理参数。  a signal receiving module, configured to receive a digital signal output by the plurality of analog-to-digital converters; a parameter calculation module configured to select a number to participate in the calculation from the digital signals received by the signal receiving module according to physical parameters of the tested circuit And calculating a physical parameter of the tested line according to the selected digital signal participating in the calculation.
3. 根据权利要求 1所述的装置， 其中， 所述装置还包括： 3. The device according to claim 1, wherein the device further comprises:
第一运算放大器，设置在所述被测试的线路与所述信号发生器之间， 设置为对所述信号发生器产生的激励信号进行放大。  A first operational amplifier, disposed between the line under test and the signal generator, is configured to amplify an excitation signal generated by the signal generator.
4. 根据权利要求 1所述的装置， 其中， 所述装置还包括： 第二运算放大器，设置在所述被测试的线路与所述信号接收器之间， 设置为对所述被测试的线路上的信号进行放大。 4. The device according to claim 1, wherein the device further comprises: A second operational amplifier, disposed between the line under test and the signal receiver, is arranged to amplify a signal on the line under test.
5. 根据权利要求 1所述的装置， 其中， 所述装置还包括： The device according to claim 1, wherein the device further comprises:
由两个电阻构成的分压电路模块， 设置在所述被测试的线路与所述 信号接收器之间， 设置为分担所述被测试的线路与所述数据处理与控制 器间的电压。  A voltage dividing circuit module composed of two resistors is disposed between the circuit under test and the signal receiver, and is arranged to share a voltage between the circuit under test and the data processing and controller.
6. 根据权利要求 1所述的装置， 其中， 所述装置还包括： 6. The device according to claim 1, wherein the device further comprises:
多个指定电阻， 设置在所述被测试的线路与所述信号发生器之间， 设置为向所述数据处理与控制器提供所述指定电阻的电压。  A plurality of designated resistors disposed between the line under test and the signal generator are configured to provide a voltage of the specified resistance to the data processing and controller.
7. 根据权利要求 1所述的装置， 其中， 所述数据处理与控制器根据欲获取 的物理参数控制所述信号发生器产生直流电压、 交流电压或阶跃信号。 7. The apparatus according to claim 1, wherein the data processing and controller controls the signal generator to generate a DC voltage, an AC voltage, or a step signal according to physical parameters to be acquired.
8. 才艮据权利要求 1-7任一项所述的装置， 其中， 所述线路为双绞线或同轴 电缆。 8. The device of any of claims 1-7, wherein the line is a twisted pair or coaxial cable.
9. 一种单板设备， 包括 CPU, 还包括权利要求 1-7任一项所述的装置， 所 述装置的数据处理与控制器与所述 CPU相连。 A single board device, comprising a CPU, further comprising the apparatus of any one of claims 1-7, the data processing and controller of the apparatus being coupled to the CPU.
10. —种线路物理参数的测试方法， 所述方法使用权利要求 1-7任一项所述 的装置， 包括： 10. A method of testing a physical parameter of a line, the method using the apparatus of any of claims 1-7, comprising:
开关根据数据处理与控制器的控制选择被测试的线路， 使所述被测 试的线路与信号发生器和信号接收器连通；  The switch selects the line to be tested according to the data processing and the control of the controller, so that the line to be tested is connected to the signal generator and the signal receiver;
所述信号发生器根据所述数据处理与控制器的控制产生激励信号， 将所述激励信号发送到所述被测试的线路， 并向所述数据处理与控制器 反馈所述激励信号；  The signal generator generates an excitation signal according to the control of the data processing and the controller, transmits the excitation signal to the circuit under test, and feeds back the excitation signal to the data processing and controller;
所述信号接收器根据所述数据处理与控制器的控制釆集所述被测试 的线路上的信号， 向所述数据处理与控制器反馈釆集信号；  The signal receiver collects signals on the tested line according to the data processing and control of the controller, and feeds back the collected signals to the data processing and controller;
模数转换器对所述信号发生器反馈的激励信号和所述信号接收器反 馈的所述釆集信号进行模数转换， 得到数字信号， 输出所述数字信号； 所述数据处理与控制器接收所述模数转换器输出的数字信号， 根据 被测试的线路的物理参数确定参与计算的数字信号， 根据确定的所述参 与计算的数字信号计算所述被测试的线路的物理参数。 The analog-to-digital converter performs analog-to-digital conversion on the excitation signal fed back by the signal generator and the collected signal fed back by the signal receiver to obtain a digital signal, and outputs the digital signal; the data processing and the controller receive The digital signal output by the analog-to-digital converter determines a digital signal participating in the calculation according to the physical parameter of the tested circuit, and calculates a physical parameter of the tested line according to the determined digital signal participating in the calculation.
1. 根据权利要求 10所述的方法， 其中， 所述信号发生器根据所述数据处理 与控制器的控制产生激励信号包括： 1. The method according to claim 10, wherein the generating, by the signal generator, the excitation signal according to the control of the data processing and the controller comprises:
所述数据处理与控制器根据欲获取的物理参数产生控制指令； 所述信号发生器根据所述控制指令产生直流电压、 交流电压或阶跃 信号。  The data processing and controller generate a control command according to the physical parameter to be acquired; the signal generator generates a DC voltage, an AC voltage or a step signal according to the control command.
PCT/CN2011/075960 2011-01-28 2011-06-20 Equipment, method and single board device for testing physical parameters of lines WO2012100493A1 (en)

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