WO2012099548A1 - Device for high-frequency gas plasma excitation - Google Patents
Device for high-frequency gas plasma excitation Download PDFInfo
- Publication number
- WO2012099548A1 WO2012099548A1 PCT/SI2012/000002 SI2012000002W WO2012099548A1 WO 2012099548 A1 WO2012099548 A1 WO 2012099548A1 SI 2012000002 W SI2012000002 W SI 2012000002W WO 2012099548 A1 WO2012099548 A1 WO 2012099548A1
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- WO
- WIPO (PCT)
- Prior art keywords
- coil
- plasma
- coils
- excitation
- loops
- Prior art date
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/321—Radio frequency generated discharge the radio frequency energy being inductively coupled to the plasma
- H01J37/3211—Antennas, e.g. particular shapes of coils
Definitions
- the subject of the present invention is a device for excitation of high-frequency gas plasma i.e. optimisation of transfer of electromagnetic power from a radio-frequency generator into the gas plasma.
- the transfer of power is optimized by using two or more parallel overlapping and offset excitation coils that are serially connected into the assembly comprising a generator, high-frequency cable, matching network and coil.
- Such manner of connecting coils has several advantages over assemblies, described so far, among which are: power efficiency of the generator is increased, plasma in the discharge vessel is more homogenous, the voltage on the generator needed for generating plasma is lower, and, at the same time, side effects caused by capacitive coupling in the plasma system are reduced.
- Plasma has become the basis of numerous modern technologies in the last decades. Thermally and thermodynamically unbalanced plasmas are known. Thermal plasma, in which the particles of gas are in thermodynamic balance, is used for plasma cutting and welding, for synthesis of ceramics, for decomposition of dangerous chemical waste, for plasma spraying of thick protective coatings on tools and machines, etc. Demands for ecologically clean technologies have led to a development of new processes for treating materials, in which thermodynamically unbalanced plasmas are used. Some examples of use are: vacuum processes of applying thin layers, lighting industry, laser production, microelectronics, macroelectronics, e.g. plasma displays, micro-treatment of silicon, e.g. production of silicon pressure sensors, production of memory elements, etc. Numerous other examples of use can be found in automobile, optical and military industries as well as in biomedicine.
- thermodynamically unbalanced plasmas are used for plasma treating of surfaces of materials and they can be excited with different types of discharge in gases. Transition of gas into plasma or discharge can be achieved by exposing the gas to an electric field. The gas through which the electrical current flows is partly ionised, which means that free electrons and ions are present besides neutral particles. Free electrons are accelerated in the electric field and through collisions with atoms or molecules of gas they cause the atom or molecule to change from the basic thermodinamically balanced state into different excitated states.
- Types of discharges are categorised according to the frequencies of electrical field with which plasma is excited: direct current discharge, corona 50-450 kHz, radiofrequency discharge 5- 100 Mhz, microwave isotropic discharge without a magnet 2.45 GHz and ECR discharge with a magnet 2.45 GHz.
- RF plasma With radiofrequency (hereinafter: RF) plasma, mainly two industry prescribed frequencies of 13.56 MHz and 27.12 MHz are used. RF plasmas are divided into capacitively and inductively coupled plasmas according to the method used to create the electric field. Electrodes or a capacitor is used for capacitive coupling for the generation of the electric field and an excitation coil is used for inductive coupling.
- RF radiofrequency
- E-type Low emission of light, low density of electrons and a relatively high temperature of electrons are characteristic for the discharge in the inductively coupled plasma when using lower excitation powers. Since the capacititive component of RF power tranfer into plasma predominates here, this type is called E-type. When the critical value is achieved by increasing RF excitation power, the luminosity of plasma and the density of electrons are instantaneously increased and the temperature of electrons is somewhat decreased. In this type of operation the inductive method of RF power transfer into plasma predominates, therefore it is called H-type.
- Matching networks consist of passive elements, connected serially or parallely: capacitors and coils. These can be found in several patents, e.g. for capacitively coupled RF plasma reactors: EP1812949A2, US5815047A, and for inductively coupled reactors: US2002130110A1 , US5689215 A, etc.
- the form of excitation coil is important for the inductively coupled RP plasma for the transfer of power to plasma and even more for the homogeneity of the plasma.
- the patents US5578165A and US2002096999A1 e.g. present planar excitation coils and methods for achieving more uniform plasma density on the planar axis.
- LILAC excitation coil disclosed in patent US6184488B1 is a planar coil for generating big surfaces of plasma.
- the coil has a low inductivity, which reduces the problems with matching impedance and maximum transfer of power.
- the capacitive component of transferring RP power into the plasma is also often a problem with the inductively coupled plasma.
- the plasma is generated in the electric field generated with the coil, also a capacititive component of coupling appears besides the inductive component, yet is mostly undesired.
- the floating coil mentioned in patent US5683539A reduces the capacitive component of coupling, because it is separated from the high-frequency generator and matching network by a transformer and is therefore on floating potential.
- the subject of the invention is a device for the optimisation of transfer of electromagnetic power form a radio-frequency generator into a gas plasma.
- the method is based on a specially designed excitation coil. It consists of two or more serially connected coils. The coils are offset so that the loops of individual coils do not overlap.
- Fig. 1 Vacuum diagram of the plasma system
- Fig. 4 Measurements of voltage on the ordinary exciatation coil and the double excitation coil, to which this invention relates, as a function of the power of generator
- Fig. 5 Measurements of the intensity of radiated light in the centre of the ordinary excitation coil and the double excitation coil, to which this invention relates, as a function of the voltage on the excitation coil at a pressure of 10 Pa
- Fig. 6 Measurements of the intensity of radiated light in the centre of the ordinary excitation coil and the double excitation coil, to which this invention relates, as a function of the voltage on the excitation coil at a pressure of 40 Pa.
- the diagram of the vacuum part of the plasma system used in our embodiment is displayed in Figure 1.
- the vacuum system consists of a vacuum pump 1, a valve 2, an air intake valve 3, a discharge quartz tube 4, an absolute pressure gauge 5, an accurate dosing valve 6 and a gas bottle 7.
- the vacuum pump 1 and the gas supply system with the valve 6 and the gas bottle 7 ensure a pressure in the discharge tube 4 between 1 Pa and 10 4 Pa, preferably between 10 Pa and 1000 Pa.
- the discharge tube 4 is significantly larger than conventional laboratory plasma systems. Its diameter in the embodiment is 200 mm and its length is 2000 mm.
- the tube is made of quatz, therefore it can withstand higher temperatures caused by recombinations of atoms and neutralisations of charged particles on the walls of the reactor.
- the electric or excitation part of the device consists of a radio-frequency generator 8, a co-axial cable 9, a matching network 10 and an excitation coil 1 1, 12.
- the radio- frequency generator 8 can operate in the frequency range between 100 kHz and 310 MHz. In the embodiment a 8 kW radio-frequency generator 8 is used and operates at a frequency 27.12 MHz.
- the matching network 10 is connected via co-axial cable 9 to the radio-frequency generator 8.
- the matching network 10 consists of two high-frequency, high- voltage, variable vacuum capacitors, the capacity of which is changed by means of servos, controlled by the radio-frequency generator 8. The connection of capacitors can be changed by moving the connection plate.
- the double excitation coil 1 1 and 12 i.e. a central part of the invention, is connected to the matching network 10.
- the double excitation coil 1 1 and 12 consists of two parallely connected overlapping excitation coils 1 1 and 12. According to the invention at least two excitation coils 1 1 and 12 are used, but more can be used as well.
- the excitation coils 11 and 12 have all the same diameter and overlap so that they have the same axis and they are in contact only at the beginning and the end, where they are connected to the matching network.
- the excitation coils 11 and 12 have to be offset along the common axis by 1/N the distance between two consecutive loops, where N equals the number of excitation coils 11, 12.
- the loops of the second excitation coil 12 are coiled in the middle between the loops of the first excitation coil 11 , i. e. the second excitation coil 12 is offset along the common axis by a 1 ⁇ 2 of the distance between two consecutive loops. If three excitation coils 11, 12 are used, they are offset along the common axis by 1/3 of the distance between two consecutive loops etc.
- the excitation coils 1 1, 12 must be offset by at least the width of the band of each individual excitation coils 1 1, 12.
- the excitation coils 11, 12 are all coiled in the same direction, so that the loops of each excitation coil 11, 12 run parallell to the loops of every other excitation coil 11, 12.
- the number of loops in individual coil 11, 12 shall be between 2 and 100.
- the number of loops on every excitation coil 1 1, 12 can be equal, but other or additional excitation coils 12 can also have one loop less than the first excitation coil 1 1. Even in this case it still holds that the loops of the excitation coils 1 1, 12 do not overlap.
- the only reason for having one loop less on other or additional excitation coils 12 is that the total length of the double excitation coil 11, 12 does not increase with the number N of excitation coils 11, 12, i. e. the length of the double excitation coil 1 1 and 12 remains the same as the length of the first excitation coil 11 , irrespective of number N.
- the double excitation coil 11 and 12 is made of a band with the resistance of maximum 100 ⁇ for direct current, wherein the width of the band, from which each individual excitation coil 11 , 12 is made, is the same and the width of the band of each individual excitation coil 11, 12 is between 1 mm and 10 cm.
- the band is coiled around the discharge quartz tube 4 so that it touches the tube with the largest surface possible.
- the length of the loops of each individual coil 11, 12 can be different from the multiple of a quarter of electromagnetic wavelength originating from the radio-frequency generator 8 by not more than 20 %.
- two parallel overlapping excitation coils 11, 12 are used that are made from 25 mm wide 0.4 mm thick copper strip.
- the copper strip is coiled around the discharge quartz tube 4 so that it touches the tube with the largest surface possible.
- the first excitation coil 11 has 5 loops and the second overlapping excitation coil 12 has 4 loops.
- the copper strip loops of the second excitation coil 12 do not overlap and do not touch the loops of the first excitation coil 11.
- the distance between the edges of copper strips of the first ecitation coil 1 1 and the second excitation coil 12 is approximately 60 mm in the embodiment.
- the total length of the double excitation coil 11 and 12 of the embodiment is 800 mm.
- Figure 4 shows the measurements of voltage on the connections of the ordinary excitation coil 11 and the double excitation coil 1 1 and 12 that is the subject of this invention in dependence of the power of the radio-frequency generator.
- the voltage on the double excitation coil 11 and 12 was measured with a high-voltage probe 13 and read by means of an oscilloscope 14.
- the graphs show that a higher voltage is required for the transfer of the same power when only the ordinary excitation coil 11 is used.
- the voltage is reduced in comparison to the classic coil 11, which is very favourable from the technological viewpoint.
- the intensity of radiated light in the middle of the excitation coil 11, 12 in comparison to the voltage on the excitation coil 11 , 12 i. e. the power of the radio-frequency generator tells us that the plasma generated in the double excitation coil 1 1 and 12, which is the subject of the invention, is much more intense than the plasma generated in the regular excitation coil 1 1.
- Figure 5 presents the results of the measurements of the intensity of oxygen emission lines of 777 nm and 845 nm plasma at a pressure of 10 Pa.
- the integration time of optical spectrometer was 200 ms. It can be noted that the intensity of the radiated light of plasma generated in the regular excitation coil 11 , is approximately three times lower than the intensity of the radiated light of the plasma generated in the double excitation coil 11 and 12 consisting of two parallel overlapping coils 11, 12.
- Figure 6 shows the same results at a pressure of 40 Pa and the integration time of spectrometer of 100 ms. The difference is even more obvious than at a pressure of 10 Pa.
- the intensity of the light in the double excitation coil 1 1 and 12 consisting of two parallel overlapping coils 1 1, 12, can be up to 4-times higher than the intensity of light in the regular excitation coil 11 at the same voltage.
- the device according to the invention for exciting high-frequency gas plasma i. e. device for transferring electromagnetic power from the radio-frequency generator into the gas plasma with a high-frequency generator 8 connected into the system, consists of a discharge vessel 4, around which a plasma coil 11, 12 is wound, a vacuum pump 1, an accurate dosing valve 6, a gas bottle 7, where high-frequency generator 8, a matching network 10 and a plasma coil 1 1, 12 are serially connected.
- the plasma coil 1 1, 12 consists of two or more coils connected serially, so that the individual loops of each coil do not overlap and are wound around a common axis, so that the loops of the second coil are arranged between the loops of the first coil.
- All coils 1 1, 12 are made of a band with the resistance of maximum 100 ⁇ for direct current, where the width of the band, from which each individual coil 1 1, 12 is made, is the same and the width of the band of each individual coil 1 1 , 12 is between 1 mm and 10 cm.
- the coils 1 1, 12 are offset toward one another along the common axis by 1/N of the distance between two consecutive loops, where N equals the number of individual coils and at least by the width of the strip of each individual coils 1 1, 12.
- Each individual coil 1 1, 12 consists of at least 2 and at most 100 loops.
- the number of loops on all excitation coils 1 1 , 12 is either equal or other or additional excitation coils 12 have one loop less than the first excitation coil 11.
- the length of the loops of each individual coil 1 1, 12 is different from the multiple of a quarter of electromagnetic wavelength originating from the high-frequency generator 8 by not more than 20 %.
- the high-frequency generator 8 operates in the frequency range between 100 kHz and 310 MHz.
- Thevacuum pump 1 and the gas supply system with the valve 6 and the gas bottle 7 ensure a pressure in the discharge vessel between 1 Pa in 10 4 Pa, preferably between 10 Pa and 1000 Pa.
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- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Plasma Technology (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE112012000015.3T DE112012000015B4 (de) | 2011-01-20 | 2012-01-19 | Vorrichtung für die Anregung eines Hochfrequenz-Gasplasmas |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SIP-201100025 | 2011-01-20 | ||
SI201100025A SI23611A (sl) | 2011-01-20 | 2011-01-20 | Metoda in naprava za vzbujanje visokofrekvenčne plinske plazme |
Publications (1)
Publication Number | Publication Date |
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WO2012099548A1 true WO2012099548A1 (en) | 2012-07-26 |
Family
ID=45922789
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/SI2012/000002 WO2012099548A1 (en) | 2011-01-20 | 2012-01-19 | Device for high-frequency gas plasma excitation |
Country Status (3)
Country | Link |
---|---|
DE (1) | DE112012000015B4 (de) |
SI (1) | SI23611A (de) |
WO (1) | WO2012099548A1 (de) |
Citations (20)
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US5578165A (en) | 1993-03-08 | 1996-11-26 | Lsi Logic Corporation | Coil configurations for improved uniformity in inductively coupled plasma systems |
US5683539A (en) | 1995-06-07 | 1997-11-04 | Applied Materials, Inc. | Inductively coupled RF plasma reactor with floating coil antenna for reduced capacitive coupling |
US5689215A (en) | 1996-05-23 | 1997-11-18 | Lam Research Corporation | Method of and apparatus for controlling reactive impedances of a matching network connected between an RF source and an RF plasma processor |
US5815047A (en) | 1993-10-29 | 1998-09-29 | Applied Materials, Inc. | Fast transition RF impedance matching network for plasma reactor ignition |
US6030667A (en) * | 1996-02-27 | 2000-02-29 | Matsushita Electric Industrial Co., Ltd. | Apparatus and method for applying RF power apparatus and method for generating plasma and apparatus and method for processing with plasma |
WO2000049638A1 (en) | 1999-02-19 | 2000-08-24 | Tokyo Electron Limited | Apparatus and method for electrostatically shielding an inductively coupled rf plasma source and facilitating ignition of a plasma |
US6184488B1 (en) | 1995-06-30 | 2001-02-06 | Lam Research Corporation | Low inductance large area coil for an inductively coupled plasma source |
US20020001301A1 (en) | 1998-10-06 | 2002-01-03 | Frederick Sarkissian | Systems and methods for multiple mode voice and data communications using intelligently bridged tdm and packet buses and methods for performing telephony and data functions using the same |
US20020023899A1 (en) | 2000-08-25 | 2002-02-28 | Khater Marwan H. | Transmission line based inductively coupled plasma source with stable impedance |
US20020096999A1 (en) | 1999-08-04 | 2002-07-25 | Youji Taguchi | Inductively coupled RF plasma source |
US6694915B1 (en) * | 2000-07-06 | 2004-02-24 | Applied Materials, Inc | Plasma reactor having a symmetrical parallel conductor coil antenna |
WO2004098259A2 (de) | 2003-05-08 | 2004-11-18 | Kolektor Group D.O.O. | Plasmabehandlung zur reinigung von kupfer oder nickel |
US6855225B1 (en) * | 2002-06-25 | 2005-02-15 | Novellus Systems, Inc. | Single-tube interlaced inductively coupling plasma source |
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US20100024845A1 (en) | 2006-10-25 | 2010-02-04 | Primoz Eiselt | Process and apparatus for degreasing objects or materials by means of oxidative free radicals |
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US6373022B2 (en) * | 1997-06-30 | 2002-04-16 | Applied Materials, Inc. | Plasma reactor with antenna of coil conductors of concentric helices offset along the axis of symmetry |
KR100444189B1 (ko) * | 2001-03-19 | 2004-08-18 | 주성엔지니어링(주) | 유도결합 플라즈마 소스의 임피던스 정합 회로 |
US20040182319A1 (en) * | 2003-03-18 | 2004-09-23 | Harqkyun Kim | Inductively coupled plasma generation system with a parallel antenna array having evenly distributed power input and ground nodes |
-
2011
- 2011-01-20 SI SI201100025A patent/SI23611A/sl not_active IP Right Cessation
-
2012
- 2012-01-19 DE DE112012000015.3T patent/DE112012000015B4/de not_active Expired - Fee Related
- 2012-01-19 WO PCT/SI2012/000002 patent/WO2012099548A1/en active Application Filing
Patent Citations (22)
Publication number | Priority date | Publication date | Assignee | Title |
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US5578165A (en) | 1993-03-08 | 1996-11-26 | Lsi Logic Corporation | Coil configurations for improved uniformity in inductively coupled plasma systems |
US5815047A (en) | 1993-10-29 | 1998-09-29 | Applied Materials, Inc. | Fast transition RF impedance matching network for plasma reactor ignition |
US5683539A (en) | 1995-06-07 | 1997-11-04 | Applied Materials, Inc. | Inductively coupled RF plasma reactor with floating coil antenna for reduced capacitive coupling |
US6184488B1 (en) | 1995-06-30 | 2001-02-06 | Lam Research Corporation | Low inductance large area coil for an inductively coupled plasma source |
US6030667A (en) * | 1996-02-27 | 2000-02-29 | Matsushita Electric Industrial Co., Ltd. | Apparatus and method for applying RF power apparatus and method for generating plasma and apparatus and method for processing with plasma |
US5689215A (en) | 1996-05-23 | 1997-11-18 | Lam Research Corporation | Method of and apparatus for controlling reactive impedances of a matching network connected between an RF source and an RF plasma processor |
US20020001301A1 (en) | 1998-10-06 | 2002-01-03 | Frederick Sarkissian | Systems and methods for multiple mode voice and data communications using intelligently bridged tdm and packet buses and methods for performing telephony and data functions using the same |
WO2000049638A1 (en) | 1999-02-19 | 2000-08-24 | Tokyo Electron Limited | Apparatus and method for electrostatically shielding an inductively coupled rf plasma source and facilitating ignition of a plasma |
US20020096999A1 (en) | 1999-08-04 | 2002-07-25 | Youji Taguchi | Inductively coupled RF plasma source |
US6694915B1 (en) * | 2000-07-06 | 2004-02-24 | Applied Materials, Inc | Plasma reactor having a symmetrical parallel conductor coil antenna |
US20020023899A1 (en) | 2000-08-25 | 2002-02-28 | Khater Marwan H. | Transmission line based inductively coupled plasma source with stable impedance |
US6855225B1 (en) * | 2002-06-25 | 2005-02-15 | Novellus Systems, Inc. | Single-tube interlaced inductively coupling plasma source |
WO2004098259A2 (de) | 2003-05-08 | 2004-11-18 | Kolektor Group D.O.O. | Plasmabehandlung zur reinigung von kupfer oder nickel |
EP1620581A2 (de) * | 2003-05-08 | 2006-02-01 | Kolektor Group D.O.O. | Plasmabehandlung zur reinigung von kupfer oder nickel |
SI21903A (sl) * | 2004-09-06 | 2006-04-30 | Uros Cvelbar | Naprava za generiranje nevtralnih atomov |
WO2006029642A1 (en) * | 2004-09-16 | 2006-03-23 | Kolektor Group D.O.O. | Method for improving the electrical connection properties of the surface of a product made from a polymer-matrix composite |
EP1828434A1 (de) | 2004-09-16 | 2007-09-05 | Kolektor Group D.O.O. | Verfahren zur verbesserung der elektrischen verbindungseigenschaften der oberfläche eines produkts aus einem polymer-matrix-verbundwerkstoff |
SI1828434T1 (sl) | 2004-09-16 | 2008-06-30 | Kolektor Group D.O.O. | Postopek za izboljšanje električnih povezovalnih lastnosti površine na izdelku iz kompozitne snovi s polimerno matriko |
EP1812949A2 (de) | 2004-11-12 | 2007-08-01 | OC Oerlikon Balzers AG | Impedanzanpassung eines kapazitiv gekoppelten hf-plasmareaktors mit eignung für grossflächige substrate |
WO2007011121A1 (en) * | 2005-07-19 | 2007-01-25 | Dms Co., Ltd. | Plasma reactor having multiple antenna structure |
US20100024845A1 (en) | 2006-10-25 | 2010-02-04 | Primoz Eiselt | Process and apparatus for degreasing objects or materials by means of oxidative free radicals |
US20090014621A1 (en) | 2007-07-11 | 2009-01-15 | General Electric Company | Three axis adjustable mounting system |
Also Published As
Publication number | Publication date |
---|---|
DE112012000015B4 (de) | 2016-04-21 |
SI23611A (sl) | 2012-07-31 |
DE112012000015T5 (de) | 2013-05-08 |
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