WO2012091344A3 - Visual inspection apparatus - Google Patents
Visual inspection apparatus Download PDFInfo
- Publication number
- WO2012091344A3 WO2012091344A3 PCT/KR2011/009851 KR2011009851W WO2012091344A3 WO 2012091344 A3 WO2012091344 A3 WO 2012091344A3 KR 2011009851 W KR2011009851 W KR 2011009851W WO 2012091344 A3 WO2012091344 A3 WO 2012091344A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- camera
- image
- inspection apparatus
- visual inspection
- lateral
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2504—Calibration devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/08—Monitoring manufacture of assemblages
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/08—Monitoring manufacture of assemblages
- H05K13/081—Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
- H05K13/0815—Controlling of component placement on the substrate during or after manufacturing
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Operations Research (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Health & Medical Sciences (AREA)
- Pathology (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Immunology (AREA)
- Theoretical Computer Science (AREA)
- Quality & Reliability (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Image Processing (AREA)
- Image Input (AREA)
Abstract
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2013547309A JP2014503824A (en) | 2010-12-30 | 2011-12-20 | Visual inspection device |
CN2011800631766A CN103430013A (en) | 2010-12-30 | 2011-12-20 | Visual inspection apparatus |
US13/997,441 US20130301904A1 (en) | 2010-12-30 | 2011-12-20 | Visual inspection apparatus |
EP11852270.5A EP2660586A2 (en) | 2010-12-30 | 2011-12-20 | Visual inspection apparatus |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020100138460A KR101240947B1 (en) | 2010-12-30 | 2010-12-30 | Vision inspection apparatus |
KR10-2010-0138460 | 2010-12-30 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2012091344A2 WO2012091344A2 (en) | 2012-07-05 |
WO2012091344A3 true WO2012091344A3 (en) | 2012-09-07 |
Family
ID=46383639
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/KR2011/009851 WO2012091344A2 (en) | 2010-12-30 | 2011-12-20 | Visual inspection apparatus |
Country Status (6)
Country | Link |
---|---|
US (1) | US20130301904A1 (en) |
EP (1) | EP2660586A2 (en) |
JP (1) | JP2014503824A (en) |
KR (1) | KR101240947B1 (en) |
CN (1) | CN103430013A (en) |
WO (1) | WO2012091344A2 (en) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
HUE056308T2 (en) * | 2013-03-19 | 2022-02-28 | Hennecke Systems Gmbh | Inspection system |
CN112837266A (en) | 2014-11-24 | 2021-05-25 | 基托夫***有限公司 | Automatic inspection |
ITUB20159510A1 (en) * | 2015-12-22 | 2017-06-22 | Sacmi | OPTICAL OBJECT INSPECTION SYSTEM |
US10600174B2 (en) * | 2015-12-29 | 2020-03-24 | Test Research, Inc. | Optical inspection apparatus |
CN106595516B (en) * | 2016-11-29 | 2019-11-05 | 江苏瑞伯特视觉科技股份有限公司 | A kind of big depth of field structural light measurement method based on tight shot |
EP3667192B1 (en) * | 2017-08-28 | 2022-03-16 | Daikin Industries, Ltd. | Air-conditioning device |
EP3951277B1 (en) * | 2017-08-28 | 2023-06-28 | Daikin Industries, Ltd. | Air processing device |
KR102091014B1 (en) * | 2017-12-27 | 2020-04-28 | 선문대학교 산학협력단 | Machine vision inspection device and product inspection method using machine vision |
CN108107614A (en) * | 2017-12-28 | 2018-06-01 | 深圳市华星光电半导体显示技术有限公司 | Show inspection method and display check device |
US20200160089A1 (en) * | 2018-11-15 | 2020-05-21 | International Business Machines Corporation | Visual pattern recognition with selective illumination for assisted inspection |
JPWO2023012966A1 (en) * | 2021-08-05 | 2023-02-09 | ||
KR102520888B1 (en) | 2022-07-12 | 2023-04-14 | 배종옥 | Artificial Intelligence Three-Dimensional Vision Inspection System |
KR20240059078A (en) | 2022-10-27 | 2024-05-07 | 주식회사 코드기어 | AI-based automation system for identifying and classifying defective products |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20020078214A (en) * | 2001-04-06 | 2002-10-18 | (주) 인텍플러스 | Real time 3D surface shape measurement method and device using color information |
KR100378490B1 (en) * | 2001-04-06 | 2003-03-29 | 삼성테크윈 주식회사 | Illumination device of CCD camera |
JP2003130801A (en) * | 2001-10-22 | 2003-05-08 | Ushio Inc | Method and device for phosphor inspection |
JP2007333591A (en) * | 2006-06-15 | 2007-12-27 | Daiichi Jitsugyo Viswill Co Ltd | Inspection lighting system |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH085573A (en) * | 1994-06-16 | 1996-01-12 | Sumitomo Kinzoku Ceramics:Kk | Method and apparatus for inspecting work surface |
JPH10232114A (en) | 1996-12-20 | 1998-09-02 | Komatsu Ltd | Terminal inspection device for semiconductor package |
US6160906A (en) * | 1998-06-01 | 2000-12-12 | Motorola, Inc. | Method and apparatus for visually inspecting an object |
EP1014438A3 (en) * | 1998-12-23 | 2003-08-27 | MV Research Limited | A measurement system |
JP2000193432A (en) | 1998-12-25 | 2000-07-14 | Tani Denki Kogyo Kk | Measuring method with image recognition and device |
JP2004109106A (en) * | 2002-07-22 | 2004-04-08 | Fujitsu Ltd | Method and apparatus for inspecting surface defect |
KR100541449B1 (en) * | 2003-07-23 | 2006-01-11 | 삼성전자주식회사 | Panel inspection apparatus |
JP2009526272A (en) * | 2006-02-10 | 2009-07-16 | モノジェン インコーポレイテッド | Method and apparatus and computer program product for collecting digital image data from a microscope media based specimen |
JP2007327896A (en) * | 2006-06-09 | 2007-12-20 | Canon Inc | Inspection device |
JP5252184B2 (en) * | 2008-03-13 | 2013-07-31 | アイシン精機株式会社 | Uneven surface inspection device |
JP5641386B2 (en) * | 2009-10-16 | 2014-12-17 | 株式会社ニコン | Surface inspection device |
-
2010
- 2010-12-30 KR KR1020100138460A patent/KR101240947B1/en active IP Right Grant
-
2011
- 2011-12-20 JP JP2013547309A patent/JP2014503824A/en active Pending
- 2011-12-20 WO PCT/KR2011/009851 patent/WO2012091344A2/en active Application Filing
- 2011-12-20 EP EP11852270.5A patent/EP2660586A2/en not_active Withdrawn
- 2011-12-20 CN CN2011800631766A patent/CN103430013A/en active Pending
- 2011-12-20 US US13/997,441 patent/US20130301904A1/en not_active Abandoned
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20020078214A (en) * | 2001-04-06 | 2002-10-18 | (주) 인텍플러스 | Real time 3D surface shape measurement method and device using color information |
KR100378490B1 (en) * | 2001-04-06 | 2003-03-29 | 삼성테크윈 주식회사 | Illumination device of CCD camera |
JP2003130801A (en) * | 2001-10-22 | 2003-05-08 | Ushio Inc | Method and device for phosphor inspection |
JP2007333591A (en) * | 2006-06-15 | 2007-12-27 | Daiichi Jitsugyo Viswill Co Ltd | Inspection lighting system |
Also Published As
Publication number | Publication date |
---|---|
KR101240947B1 (en) | 2013-03-18 |
US20130301904A1 (en) | 2013-11-14 |
WO2012091344A2 (en) | 2012-07-05 |
KR20120076761A (en) | 2012-07-10 |
CN103430013A (en) | 2013-12-04 |
JP2014503824A (en) | 2014-02-13 |
EP2660586A2 (en) | 2013-11-06 |
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