WO2010092615A1 - 放射線撮像装置 - Google Patents
放射線撮像装置 Download PDFInfo
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- WO2010092615A1 WO2010092615A1 PCT/JP2009/000535 JP2009000535W WO2010092615A1 WO 2010092615 A1 WO2010092615 A1 WO 2010092615A1 JP 2009000535 W JP2009000535 W JP 2009000535W WO 2010092615 A1 WO2010092615 A1 WO 2010092615A1
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- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
- G21K1/025—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using multiple collimators, e.g. Bucky screens; other devices for eliminating undesired or dispersed radiation
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- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
- A61B6/42—Arrangements for detecting radiation specially adapted for radiation diagnosis
- A61B6/4291—Arrangements for detecting radiation specially adapted for radiation diagnosis the detector being combined with a grid or grating
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/30—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from X-rays
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N5/00—Details of television systems
- H04N5/30—Transforming light or analogous information into electric information
- H04N5/32—Transforming X-rays
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Definitions
- the present invention relates to a radiation imaging apparatus used in an X-ray fluoroscopic apparatus, an X-ray CT apparatus, and the like, and more particularly to a technique for removing scattered radiation.
- scattered X-rays from a subject (hereinafter abbreviated as “scattered rays”) are prevented from entering an X-ray detector.
- a grid scattering radiation removing means for removing scattered radiation is used.
- a false image due to scattered rays that pass through the grid and a false image due to the absorbing foil that forms the grid are generated.
- the applicant has also proposed a radiation imaging apparatus having a function of processing a false image and acquiring an image of only a direct line.
- direct ray transmission which is a transmittance before and after transmission of a direct line through a grid
- the rate and the rate of change regarding the transmitted scattered ray intensity which is the scattered ray intensity after passing through the grid, are obtained in advance. Then, by using a false image processing algorithm using them, it is possible to acquire an image of only a direct line without a false image due to the grid.
- JP 2002-257939 A JP 2002-257939 A
- diagnosis is usually performed using a C-arm (that is, X-ray imaging).
- the C-type arm is literally curved with a “C” shape, and one end of the C-type arm is configured to support radiation irradiation means such as an X-ray tube, and the other end is configured to support an FPD.
- the C-arm is rotated along the bending direction of the C-arm, the X-ray tube and the FPD are rotated along with the rotation, and the X-ray is irradiated from the X-ray tube, and the X-ray is irradiated with the FPD.
- Detects X-ray imaging Even when the X-ray focus of the X-ray tube, the grid, and the FPD are supposed to have a constant positional relationship during X-ray imaging of the subject, the X-ray focus, grid, and FPD Deviation occurs in the positional relationship. Due to the deviation, the parameter value is changed from a value acquired in advance, and if a false image process is performed as it is using the changed parameter value, a large false image is generated. For this reason, for example, it is difficult to implement a part of the apparatus using a C-arm.
- the present invention has been made in view of such circumstances, and an object thereof is to provide a radiation imaging apparatus that can reduce positional deviation.
- the radiation imaging apparatus of the present invention is a radiation imaging apparatus that obtains a radiation image, and includes a radiation irradiation unit that irradiates radiation, a scattered radiation removal unit that removes scattered radiation, and a plurality of detection elements that detect radiation.
- Radiation detection means configured in a matrix, wherein an arrangement direction of the absorption layer that absorbs the scattered radiation is parallel to at least one of the row direction and the column direction of the detection element, and each of the above-mentioned
- the scattered radiation removing means is configured by arranging an absorbing layer in parallel with the detection surface of the radiation detecting means, and the apparatus moves the scattered radiation removing means in parallel with the arrangement direction of the absorbing layer.
- a physical quantity calculating means for obtaining a physical quantity related to radiation intensity based on the fact that the radiation detected by the scattered radiation removing means is detected by the radiation detecting means;
- the physical quantity when the radiation irradiating means is moved by a predetermined distance in the direction opposite to the moving direction by the moving means is the physical quantity when the scattered radiation removing means is moved by the predetermined distance by the moving means.
- correcting means for correcting the physical quantity obtained by the physical quantity calculating means by irradiating radiation from the irradiating means.
- the radiation irradiating means and the radiation detecting means are moved as in the prior art, positional deviation occurs as described above.
- the radiation irradiating means is heavy, and if the radiation irradiating means having such a weight is moved in parallel with the arrangement direction of the absorbing layer (of the scattered radiation removing means), even if the moving distance is set finely, the actual movement The distance is different from the set movement distance. Therefore, the radiation irradiation means and the radiation detection means are moved to perform radiation imaging, or the idea of using the data obtained by moving the radiation irradiation means and the radiation detection means for radiation imaging is changed to change the radiation irradiation means and the radiation detection. The idea was to move the scattered radiation removal means, which is lighter than the means.
- the arrangement direction of the absorption layer that absorbs scattered radiation is parallel to at least one of the row direction and the column direction of the detection element, and each absorption layer is irradiated with radiation.
- the scattered radiation removing means is configured by being arranged parallel to the detection surface of the detecting means.
- the moving means moves the scattered radiation removing means parallel to the arrangement direction of the absorption layer. Therefore, when the moving means moves the scattered radiation removing means by a predetermined distance and emits radiation from the radiation irradiating means, the moving means emits radiation from the radiation irradiating means in a state where the scattered radiation removing means has moved by the predetermined distance described above.
- the physical quantity obtained by the physical quantity calculating means is obtained by irradiation.
- the physical quantity that should be obtained in the virtual is the moving radiation means by the scattered radiation removing means by the predetermined distance described above. It can be considered that it is the same as the physical quantity obtained by the physical quantity calculating means by irradiating the radiation from the radiation irradiating means in the moved state. Therefore, the correction means is obtained by the physical quantity calculation means by irradiating the physical quantity that should be obtained virtually by the radiation irradiation means with the movement means moving the scattered radiation removal means by the predetermined distance described above.
- the moving means when it is assumed that the radiation irradiating means is moved by the above-mentioned integer number of pixels in the direction opposite to the moving direction by the moving means is the state in which the scattered radiation removing means is moved by the integer number of pixels by the moving means.
- the correcting means corrects the physical quantity obtained by the physical quantity calculating means by irradiating the radiation from the radiation irradiating means.
- the predetermined distance moved by the moving means is set to an integral multiple of the pixel interval in this way, the interval between the position where the radiation irradiating means moves virtually and the position where the scattered radiation removing means actually moves is an integer. Because of the pixel relationship, the physical quantity can be accurately corrected without shifting between pixels.
- an example of the physical quantity is a direct line transmittance that is a transmittance before and after transmission of direct radiation by the scattered radiation removing means obtained by actual measurement in a state where there is no subject.
- the physical quantity calculation means obtains the direct line transmittance.
- the direct ray transmittance when it is assumed that the radiation irradiating means is moved by a predetermined distance in the direction opposite to the moving direction by the moving means is the radiation in the state where the scattered radiation removing means has moved by the predetermined distance by the moving means.
- the correction unit corrects the direct ray transmittance obtained by the physical quantity calculation unit by irradiating the irradiation unit with radiation.
- the physical quantity calculation means obtains the rate of change.
- the rate of change when it is assumed that the radiation irradiating means has been moved by a predetermined distance in the direction opposite to the moving direction by the moving means is the radiation irradiating means in a state where the scattered radiation removing means has been moved by the predetermined distance by the moving means.
- the correction means corrects the rate of change obtained by the physical quantity calculation means by irradiating with radiation.
- still another example of the physical quantity is the above-described direct ray transmittance and change rate of transmitted scattered ray intensity.
- the physical quantity calculation means obtains the direct ray transmittance and the rate of change in transmitted scattered ray intensity. Then, when the radiation irradiating means is moved by a predetermined distance in the direction opposite to the moving direction by the moving means, the direct radiation transmittance and the rate of change of the transmitted scattered radiation intensity are determined by the moving means by the scattered radiation removing means.
- the correction means corrects the direct ray transmittance and the change rate of the transmitted scattered ray intensity obtained by the physical quantity calculating means by irradiating the radiation from the radiation irradiating means in a state where it has moved by the distance.
- the corrected direct ray transmittance and change rate of transmitted scattered ray intensity for radiation imaging, false image processing is performed using the direct ray transmittance and change rate of transmitted scattered ray intensity with no positional deviation. The false image due to the positional deviation can be removed.
- still another example of the physical quantity is a pixel value assigned to each pixel constituting the radiation image and corresponding to the radiation intensity detected by the radiation detection means.
- the physical quantity calculation means obtains a pixel value. Then, assuming that the radiation irradiation means is moved by the pixel corresponding to the predetermined distance in the direction opposite to the moving direction by the moving means, the pixel value when the scattered radiation removing means is equivalent to the pixel corresponding to the predetermined distance by the moving means.
- the correction means corrects the pixel value obtained by the physical quantity calculation means by irradiating the radiation from the radiation irradiating means in a state where it has moved only.
- the arrangement direction of the absorption layer that absorbs scattered radiation is parallel to at least one of the row direction and the column direction of the detection element, and each absorption layer is detected by radiation.
- the scattered radiation removing unit is arranged in parallel to the detection surface of the unit, and the moving unit moves the scattered radiation removing unit in parallel to the arrangement direction of the absorption layer.
- the physical quantity when the radiation irradiation means is moved by a predetermined distance in the direction opposite to the moving direction by the movement means is assumed to be a physical quantity when the scattered radiation removal means is moved by the predetermined distance by the movement means.
- the correction means corrects the physical quantity obtained by the irradiation and the physical quantity calculated by the physical quantity calculation means, so that only the scattered radiation removal means can be moved without moving the radiation irradiation means. Therefore, a physical quantity equivalent to the physical quantity that should be obtained when the radiation irradiating means is moved can be obtained by moving the scattered radiation removing means, and the positional deviation can be reduced.
- FIG. 1 is a block diagram of an X-ray imaging apparatus according to an embodiment. It is a schematic diagram of the detection surface of a flat panel X-ray detector (FPD). It is the schematic of a general grid.
- A) is a perspective view showing an overall outline of a grid, an FPD and a marker absorber together with an X-ray tube,
- B) is an enlarged view of the marker absorber and its periphery, and
- (c) is (b). It is arrow sectional drawing from A of.
- FIG. 1 is a block diagram of an X-ray imaging apparatus according to an embodiment
- FIG. 2 is a schematic diagram of a detection surface of a flat panel X-ray detector (FPD)
- FIG. 4 is a schematic view of a grid provided with an absorber for a marker
- FIG. 4A is an overall outline of the grid with an X-ray tube, an FPD, and an absorber for the marker
- 4 (b) is an enlarged view of the marker absorber and its surroundings
- FIG. 4 (c) is a cross-sectional view taken from A in FIG. 4 (b).
- FIG. 5 is a schematic plan view of the FPD for explaining the effective visual field area of the FPD
- FIG. 6 is a schematic diagram schematically showing a plurality of pixels centered on the shaded pixels
- 7 is a perspective view showing an overall outline of a moving mechanism for moving the grid in each direction.
- an explanation will be given by taking X-ray as an example of radiation.
- the X-ray imaging apparatus includes a top plate 1 on which a subject M is placed, an X-ray tube 2 that irradiates the subject M with X-rays, and an X-ray tube.
- 2 is a flat panel X-ray detector (hereinafter abbreviated as “FPD”) 3 that detects X-rays irradiated from 2 and transmitted through the subject M, and performs image processing based on the X-rays detected by the FPD 3.
- An image processing unit 4 and a display unit 5 for displaying X-ray images subjected to various types of image processing by the image processing unit 4 are provided.
- the display unit 5 includes display means such as a monitor and a television.
- a grid 6 is disposed on the detection surface side of the FPD 3.
- a moving mechanism 60 (see FIG. 7) that moves the grid 6 in each direction is disposed on each surface of an outer frame 61 (see FIG. 7) that surrounds the grid 6.
- the X-ray tube 2 corresponds to the radiation irradiation means in this invention
- the flat panel X-ray detector (FPD) 3 corresponds to the radiation detection means and the shadow pixel detection means in this invention
- the grid 6 corresponds to this invention.
- the moving mechanism 60 corresponds to the moving means in the present invention.
- the image processing unit 4 includes a central processing unit (CPU).
- CPU central processing unit
- a program for performing various image processing is written and stored in a storage medium represented by ROM (Read-only Memory) and the like, and the CPU of the image processing unit 4 executes the program from the storage medium.
- image processing corresponding to the program is performed.
- a first intensity estimation unit 41, a shadow position calculation unit 42, a focus position calculation unit 43, a correction unit 44, a parameter calibration unit 45, a pixel specifying unit 51, a transmittance calculation unit 52, and a transmittance described later of the image processing unit 4 are described.
- the interpolation unit 53, the second intensity estimation unit 54, the intensity interpolation unit 55, the change rate calculation unit 56, and the change rate interpolation unit 57 calculate the shadow position, the focus position, and parameters (direct line transmittance / transmitted scattered line intensity). ), Correction / calibration, identification of predetermined pixels, calculation of direct line transmittance, interpolation, intensity estimation, interpolation, and calculation of change rate, and calculation of shadow position according to the program And focal position calculation, parameter correction / calibration, specific pixel identification, direct line transmittance calculation / interpolation, intensity estimation / interpolation, and change rate calculation.
- the image processing unit 4 obtains a shadow position, and a first intensity estimation unit 41 that estimates the intensity of the subject M in a certain state when it is assumed that the shadow is not applied to at least a part of the pixels that are shaded.
- an intensity interpolating unit 55 that interpolates the intensity
- a change rate calculating unit 56 that obtains the change rate
- a change rate interpolating unit 57 that interpol
- the correcting unit 44 corresponds to the correcting unit in the present invention
- the transmittance calculating unit 52, the transmittance interpolating unit 53, the change rate calculating unit 56, and the change rate interpolating unit 57 correspond to the physical quantity calculating unit in the present invention.
- the FPD 3 is configured by arranging a plurality of detection elements d sensitive to X-rays on a detection surface in a two-dimensional matrix form.
- the detection element d detects the X-rays by converting the X-rays that have passed through the subject M into electrical signals, temporarily storing them, and reading the stored electrical signals.
- An electrical signal detected by each detection element d is converted into a pixel value corresponding to the electrical signal, and an X-ray image is output by assigning the pixel value to each pixel corresponding to the position of the detection element d.
- the X-ray image is transmitted to the first intensity estimating unit 41, the shadow position calculating unit 42, the pixel specifying unit 51, the transmittance calculating unit 52, and the second intensity estimating unit 54 (see FIGS. 1 and 8) of the image processing unit 4.
- the FPD 3 includes a plurality of detection elements d that detect X-rays in a matrix (two-dimensional matrix).
- the detection element d corresponds to the detection element in this invention.
- the general grid 6 is configured by alternately arranging absorption foils 6 a that absorb scattered rays (scattered X-rays) and intermediate layers 6 c that transmit scattered rays.
- the grid cover 6d that covers the absorbing foil 6a and the intermediate layer 6c sandwiches the absorbing foil 6a and the intermediate layer 6c from the X-ray incident surface and the opposite surface.
- the grid cover 6d is shown by a two-dot chain line, and the illustration of other configurations of the grid 6 (such as a mechanism for supporting the absorbent foil 6a) is omitted.
- the absorbent foil 6a corresponds to the absorbent layer in this invention.
- the absorbent foil 6a and the intermediate layer 6c along the X direction in FIG. 3 are alternately arranged in the Y direction in FIG.
- the X direction in FIG. 3 is parallel to the column direction of the detection element d (see FIG. 2) of the FPD 3
- the Y direction in FIG. 3 is the detection element d (see FIG. 2) of the FPD 3.
- Parallel to the row direction. Therefore, the arrangement direction of the absorption foil 6a is parallel to the row direction of the detection elements d.
- the arrangement direction of the absorbent foil 6a is the Y direction
- the longitudinal direction of the absorbent foil 6a is the X direction.
- the arrangement direction (Y direction) of the absorbent foil 6a is parallel to the row direction of the detection element d in the row direction and the column direction. Further, as shown in FIG. 3, each absorbing foil 6 a is arranged in parallel to the detection surface of the FPD 3 to constitute a grid 6.
- the absorbing foil 6a When the absorbing foil 6a absorbs X-rays, a shadow 32 (see FIGS. 4 and 6) is generated in the FPD 3 of the absorbing foil 6a.
- the interval between the absorbent foils 6a is adjusted so that the shadow 32 is periodically projected for each of a plurality of pixels (four pixels in this embodiment).
- the grid 6 When the pixel interval (pixel pitch) is Wd, the grid 6 is configured such that the interval between the absorbing foils 6a is larger than the pixel interval Wd.
- the intermediate layer 6c is a void. Therefore, the grid 6 is also an air grid.
- the absorbing foil 6a is not particularly limited as long as it is a substance that absorbs radiation represented by X-rays such as lead.
- the intermediate layer 6c is not particularly limited as long as it is an intermediate material that transmits radiation typified by X-rays, such as aluminum or an organic material, in addition to the above-described voids.
- the marker is separately provided so that the shadow width in the arrangement direction (Y direction) of the absorbent foil 6a is at least one pixel width or more.
- the absorber 7 is provided.
- the grid 6 is configured such that the width in the arrangement direction of some of the absorbent foils 6 a including the absorber 7 is larger than the interval between the pixels.
- the marker absorber 7 is provided at the end in the effective visual field region 3A of the FPD 3 (see FIG. 4A and FIG. 5). Further, as shown in FIG. 4A, a marker absorber 7 is provided in a region including a perpendicular line PL from the focal point F of the X-ray tube 2 to the FPD 3. Therefore, in order to provide the marker absorber 7 in the end portion in the effective visual field region 3A of the FPD 3 and in the region including the vertical line PL, the place where the vertical line PL and the FPD 3 intersect is the end in the effective visual field region 3A.
- the X-ray irradiation field from the X-ray tube 2 is controlled so that the positions of the X-ray tube 2, the FPD 3, and the grid 6 are set.
- the marker absorber 7 is provided on the upper left absorber 71 attached to the upper left side of the absorbent foil 6a and on the lower right lower portion of the absorbent foil 6a.
- the lower right absorbent body 72 is provided.
- Reference numeral 31 is assigned to each pixel constituting the X-ray image
- reference numeral 32 is assigned to the shadow of the absorption foil 6a
- the upper left absorber 71, the lower right absorber 72, and the absorbers 71 and 72 are provided.
- the shading of the absorbent foil 6a (hereinafter abbreviated as “shading of the marker absorber 7”) is denoted by reference numeral 33.
- the area for the marker 33 so that the area where the width of the shadow 33 is at least one pixel or more is formed over at least two pixels along the length of the shadows 32 and 33 in the longitudinal direction (X direction).
- An absorber 7 is provided.
- the length in the longitudinal direction of the marker absorber 7 (the upper left absorber 71 and the lower right absorber 72) is Lg.
- the distance (SID: “Source” Image “Distance) of the X-ray tube 2 in the perpendicular PL direction to the FPD 3 is L.
- the width (thickness) of the absorbent foil 6a is t
- the height of the absorbent foil 6a is h
- the distance between the absorbent foil 6a and the FPD 3 is 3
- the pixel pitch is Wd
- the width of the shadow 33 is Wg
- the height of the upper left absorber 71 and the lower right absorber 72 is H
- the reference SID (L) is set to 1000 mm
- the width of the shadow 32 that is periodically repeated instead of the shadow 33 of the marker absorber 7 is set to 0.6 mm
- the pixel pitch Wd is set to 0.15 mm. . Therefore, when the shadow center of the absorption foil 6a is adjusted to the pixel center, the shadow 32 of the absorption foil 6a is applied every four pixels.
- the width W of the upper left absorber 71 and the lower right absorber 72 is set to 0.1 mm
- the height H of the upper left absorber 71 and the lower right absorber 72 is set to 1 mm
- the marker absorber 7 is provided so as to be formed. As shown in FIG. 6, if the number of pixels in the longitudinal direction (X direction) on which the shadow 33 of the marker absorber 7 is applied is 13, and the average intensity of 13 pixels along the longitudinal direction is obtained, statistical error is obtained. Etc. can be reduced.
- a plurality of pixels centered on the pixel row on which the shadow 33 of the marker absorber 7 is applied are horizontally (Y direction, that is, the arrangement direction of the absorbent foil 6a) 7 pixels ⁇ vertically (X direction, that is, the longitudinal direction).
- the FPD 3 has a function of detecting the X-ray intensity of the shadow pixels 34 (refer to the thick frame in FIG. 6) of these 7 horizontal pixels ⁇ 13 vertical pixels (that is, the shadow pixel detection function). Yes.
- the FPD 3 since the FPD 3 also functions as a shadow pixel detection function, it is not necessary to provide a separate detector for detecting the shadow position of the marker absorber 7.
- the pixel columns that are the target of shadow pixel detection are a, b, c, d, e, f, and g in order from the left.
- the shadow 32 of the absorbing foil 6a is applied every four pixels, as is clear from FIG. 6, the pixel column adjacent to the left side of the pixel column a at the left end in the shadow pixel 34 is absorbed.
- the shadow 32 of the foil 6a is applied, and conversely, the shadow 32 of the absorbing foil 6a is applied to the pixel row adjacent to the right side of the pixel row g at the right end in the shadow pixel 34. Therefore, the shadow pixel 34 may be selected so as to be a pixel that includes the shadow 33 of the marker absorber 7 and does not include the next shadow 32.
- the intermediate layer 6c is formed of an intermediate substance instead of a void
- the intermediate layer 6c is formed in a recessed portion only at a portion constituting the marker absorber 7, and the marker portion is formed in the recessed portion.
- the absorber 7 (for example, the upper left absorber 71 and the lower right absorber 72) may be disposed so as to be fitted.
- only the intermediate layer 6c provided with the marker absorber 7 may be formed of a gap, and the other intermediate layer 6c may be formed of an intermediate substance.
- a moving mechanism 60 that moves the grid 6 in each direction is provided around the grid 6.
- a moving mechanism 60 is provided on each surface of the outer frame 61 surrounding the grid 6.
- the grid cover 6d that covers the absorbent foil 6a and the intermediate layer 6c (see FIG. 3) is configured to be finely adjusted with respect to the outer frame 61, and is moved by a moving mechanism 60 provided on each surface of the outer frame 61. It is provided to move in each direction while being supported.
- the moving mechanism 60 includes an X-direction adjusting screw 60x that finely adjusts and moves the grid 6 in parallel with the longitudinal direction (X direction) of the absorbent foil 6a, together with the absorbent foil 6a and the grid cover 6d, and the absorbent foil 6a.
- the grid 6 together with the grid cover 6d is finely adjusted in parallel to the arrangement direction (Y direction) of the absorbent foil 6a (Y direction), and the Y direction adjusting screw 60y is moved in the vertical direction (Z direction) together with the absorbent foil 6a and the grid cover 6d.
- a Z-direction adjusting screw 60z that moves up and down by fine adjustment in parallel.
- the entire grid 6 moves together with the absorbing foil 6a and the grid cover 6d by moving the absorbing foil 6a and the grid cover 6d supported at the tip of the screw according to the direction of turning the screw.
- the grid 6 moves in the back direction along the X direction
- the Y direction adjusting screw 60z is turned in the right screw direction
- the grid 6 is moved along the Y direction.
- the grid 6 moves downward along the Z direction.
- the grid cover 6d is illustrated as extending only inside the outer frame 61.
- the grid cover 6d is actually a screw of the Z-direction adjusting screw 60z. Note that it extends to the tip. Further, the moving distance of the grid 6 is determined according to the turning angle of the screw. Therefore, in order to move the grid 6 by a predetermined distance, the screw is turned by an angle corresponding to the predetermined distance.
- the Y-direction adjusting screw 60y is turned left and right so as to move parallel to the (Y-direction).
- FIG. 8 is a block diagram showing a specific configuration of the image processing unit and the flow of data
- FIG. 9 is a flowchart showing a flow of a series of X-ray imaging
- FIG. 10 is a series of X-ray intensities.
- 11 is a flowchart showing the flow of actual measurement of the relationship between the reference position and the reference position
- FIG. 11 is a diagram schematically showing X-ray imaging in the absence of the subject
- FIG. 12 is a diagram showing the SID and direct X-ray transmittance.
- FIG. 13 schematically shows X-ray imaging in a certain state of the subject when an acrylic flat plate phantom is used as the subject.
- FIG. 14 is a graph of the relationship between the X-ray intensity and the shadow position
- FIG. 15 is a graph of the shadow pixel used for estimating the intensity assuming that no shadow is applied and the measurement result of each intensity.
- Figure 16 shows the focal position
- FIG. 17 is a side view schematically showing the relationship between the shadow positions and the focal positions used for obtaining the image
- FIG. 17 is a diagram schematically showing the positional relationship between the discrete focal positions for each discrete SID.
- FIG. 18 is a side view schematically showing the positional relationship between the grid absorption foil and the shadow position.
- the FPD 3 detects the X-ray intensities of a plurality of pixels centered on the pixel on which the shadow 33 of the marker absorber 7 is applied.
- the X-ray intensity of the shadow pixel 34 of 7 pixels wide ⁇ 13 pixels long shown in FIG. 6 is detected.
- the first intensity estimating unit 41 obtains a plurality of pixels (here, FIG. 6) around the pixel to which the shadow 33 is applied, which is obtained by actual measurement of the FPD 3 with the subject M used for X-ray imaging.
- the pixel rows that are not shaded 33 are a, b, f, and g, and the average intensities of X-ray intensities along the longitudinal direction of the pixel rows are Ia 0 , Ib 0 , If 0 , and Ig 0, respectively.
- the first intensity estimating unit 41 Based on the X-ray intensities (here, average intensities) Ia 0 , Ib 0 , If 0 , Ig 0 of the pixel columns a, b, f, g around the pixel to which 33 is applied, the shadow 33 is at least partly
- the pixel array c, d, and e, that is, the X-ray intensity (here, the average intensity) Ic, Id, and Ie are assumed to have no shade 33 on the pixel columns c, d, and e. presume.
- the estimated intensities are sent to the shadow position calculation unit 42 as Ic 0 ′, Id 0 ′, and Ie 0 ′, respectively.
- the shadow position calculation unit 42 obtains a shadow position in a state where the subject M is present based on (A), (B), and (C) described below. That is, (A) is the X-ray intensity of a pixel on which at least part of the shadow is obtained by actual measurement of the FPD 3 in a state where the subject M is present. (B) is the X-ray intensities Ic 0 ′, Id 0 ′, and Ie 0 ′ estimated by the first intensity estimator 41.
- FIG. 14C shows the X-ray intensity of a pixel column (here, c, d, e) in FIG. It is the relationship of the attached shadow position. The relationship between the X-ray intensity and the shadow position in FIG. 14 will be described later.
- the shadow position (denoted by “xg” in FIG. 8) in the state where the subject M is found, which is obtained by the shadow position calculation unit 42, is sent to the focus position calculation unit 43.
- the focal position calculation unit 43 obtains the focal position of the FPD 3 with respect to the X-ray tube 2 in the state where the subject M is present, based on (a), (b) and (c) described below. That is, (a) is the shadow position xg in a state where the subject M is obtained by the shadow position calculation unit 42. (B) is the distance d between the absorbent foils 6a and FPD3. (C) is a shadow position xg with respect to the reference position where the perpendicular PL is lowered from the focal point F of the X-ray tube 2 to the FPD 3 in the absence of the subject.
- the focal position of the FPD 3 with respect to the X-ray tube 2 in the state where the subject M exists is the focal position.
- the calculation unit 43 obtains and sends it to the parameter calibration unit 45.
- the correcting unit 44 corrects the direct ray transmittance and the change rate relating to the transmitted scattered ray intensity as follows as the physical quantity (parameter) relating to the intensity. That is, the focal point of the X-ray tube 2 in the opposite direction (also in the Y direction) to the moving direction (here, the Y direction, which is the arrangement direction of the absorbing foil 6a) by the Y direction adjusting screw 60y (see FIG. 7) of the moving mechanism 60.
- the correction unit 44 corrects the direct line transmittance and the change rate when it is assumed that the position has moved.
- X-rays are irradiated from the X-ray tube 2 while the grid 6 is moved by a predetermined distance by the Y-direction adjusting screw 60y of the moving mechanism 60, and the transmittance calculating unit 52 and the transmittance interpolating unit 53 obtain it.
- Obtained or interpolated direct ray transmittance (indicated by “Cp” in FIG. 8), and transmitted scattered ray intensity obtained or interpolated by the change rate calculation unit 56 and change rate interpolation unit 57 (in FIG. 8).
- the correction unit 44 corrects the change rate (indicated as “Rcs” in FIG. 8) related to “Sc”.
- the direct ray transmittance and the change rate corrected by the correction unit 44 are determined based on the physical quantity obtained in advance before X-ray imaging shown in FIG. 17 to be described later and the focal position of the X-ray tube 2 with respect to the FPD 3 associated therewith. (The positional relationship of the discrete focal positions for each discrete SID).
- the parameter calibration unit 45 calibrates the direct ray transmittance and the change rate relating to the transmitted scattered ray intensity as physical quantities (parameters) relating to the X-ray intensity during X-ray imaging based on ( ⁇ ) and ( ⁇ ) described below. . That is, ( ⁇ ) is a physical quantity obtained in advance before X-ray imaging (here, the rate of change with respect to direct ray transmittance and transmitted scattered ray intensity) and the focal position of the X-ray tube 2 relative to the FPD 3 associated therewith. It is a relationship. ( ⁇ ) is the focal position Xf obtained by the focal position calculation unit 43. The rate of change (“Rcs” in FIG. 8) related to the direct ray transmittance (indicated by “Cp” in FIG. 8) and the transmitted scattered radiation intensity (indicated by “Sc” in FIG. 8) calibrated by the parameter calibration unit 45. Is sent to the second intensity estimating unit 54.
- ( ⁇ ) is a physical quantity obtained in advance before X-ray imaging (
- the pixel specifying unit 51 specifies a predetermined pixel among the respective pixels constituting the X-ray image.
- the pixel specifying unit 51 has a predetermined combination that is a combination of the simultaneous equations. Instead of selecting a pixel, another predetermined pixel is selected and specified as a combination. Since the simultaneous equations are obtained from the second intensity estimating unit 54 as will be apparent from the description to be described later, data relating to the denominator (denoted as “denominator” in FIG. 8) obtained from the second intensity estimating unit 54 is used as the pixel specifying unit 51. To send.
- the direct ray transmittance Cp which is the transmittance before and after transmission of the direct line (direct X-ray) by the grid 6 obtained by actual measurement in a state where there is no subject, is a transmittance calculation unit for the discrete SID. 52 asks.
- the transmittance calculation unit 52 obtains the direct line transmittance Cp and sends it to the parameter calibration unit 45, the transmittance interpolation unit 53, and the second intensity estimation unit 54.
- the transmittance interpolating unit 53 interpolates the direct line transmittance Cp obtained by the transmittance calculating unit 52 with respect to the SIDs before and after the above-described discrete SIDs. Then, the interpolated direct line transmittance Cp is also sent to the parameter calibration unit 45 and the second intensity estimation unit 54.
- the second intensity estimation unit 54 estimates the intensity of scattered radiation (scattered X-ray intensity) at a predetermined pixel specified by the pixel specifying unit 51 and the intensity of direct ray intensity (direct X-ray intensity) at a predetermined pixel.
- the direct ray transmittance Cp obtained by the transmittance calculating unit 52 or the direct ray transmittance Cp interpolated by the transmittance interpolating unit 53 and the subject M (here, phantom) (phantom)) on the basis of the actually measured intensity (indicated as “G” in FIG.
- the second intensity estimation unit 54 estimates an estimated direct line intensity (indicated by “P” in FIG. 8) that is a direct line intensity before transmission, and the intensity interpolation unit 55, the change rate calculation unit 56, the display unit 5, and the like. To send.
- the line intensity P is estimated.
- the second intensity estimating unit 54 estimates the transmitted scattered ray intensity Sc and the estimated direct line intensity P by solving the simultaneous equations, so that the data denominator relating to the denominator included in the solution of the simultaneous equations is also obtained. Data denominator regarding the denominator is sent to the pixel specifying unit 51.
- the intensity interpolation unit 55 interpolates the scattered ray intensity (scattered X-ray intensity) at the predetermined pixel estimated by the second intensity estimating unit 54 and the intensity of the direct line intensity (direct X-ray intensity) at the predetermined pixel.
- the intensity interpolating unit 55 interpolates the transmitted scattered ray intensity Sc or the estimated direct line intensity P estimated by the second intensity estimating unit 54 and sends it to the change rate calculating unit 56, the display unit 5, and the like.
- the reference intensity for all pixels related to the intensity is obtained by an average value or smoothing / interpolation calculation.
- the pixel value is obtained, and the change rate calculation unit 56 obtains the change rate of each pixel with respect to the value.
- the change rate Rcs obtained by the change rate calculation unit 56 or the change rate Rcs interpolated by the change rate interpolation unit 57 is reflected in the X-ray imaging of another subject M.
- the transmission scattered ray intensity Sc estimated by the second intensity estimating unit 54 and the transmitted scattered ray intensity Sc interpolated by the intensity interpolating unit 55 are used to obtain the rate of change Rcs during X-ray imaging. This is sent again to the 2-strength estimation unit 54.
- actual X-ray imaging has a flow as shown in FIG.
- Step S1 Actual measurement in the absence of the subject X-ray imaging is performed in the absence of the subject.
- X-ray imaging is performed in a state, and actual measurement is performed without a subject. That is, the X-ray tube 2 irradiates X-rays in the absence of the subject and enters the FPD 3 through the grid 6 to obtain measured data in the absence of the subject.
- the detection element d (see FIG. 3) of the FPD 3 converts the X-ray in the absence of the subject into an electrical signal, reads it, and converts it into a pixel value corresponding to the electrical signal.
- Step S2 Calculation / Interpolation of Direct Line Transmittance
- the pixel value is equivalent to the intensity after passing through the grid 6 obtained by actual measurement in the absence of the subject.
- the direct line transmittance Cp which is the transmittance before passing through the grid 6 (before transmission) and after passing through the grid 6 (after transmission), is given by 6 is represented by the ratio between the intensity before passing through 6 and the intensity after passing through the grid 6 (that is, the pixel value detected by the FPD 3).
- the transmittance calculating part 52 by transmitting the intensity after passing through the grid 6 equivalent to the pixel value from the FPD 3 and the intensity before passing through the known grid 6 to the transmittance calculating part 52, the transmittance calculating part 52 The direct line transmittance Cp represented by the ratio between the intensity before transmission by the grid 6 and the intensity after transmission is obtained.
- the transmittance calculation unit 52 obtains the direct ray transmittance Cp for the discrete SID.
- the SID changes as shown in FIG. 11 in actual X-ray imaging. Therefore, X-ray imaging is performed in the same manner in the absence of the subject, and as shown by the black circles in FIG. 12, the transmittance calculating unit 52 performs the direct line for each discrete distance L s + 1 , L s + 2 , L s + 3 ,.
- the transmittance Cp is obtained.
- Direct line transmittances Cp for the discrete distances L s + 1 , L s + 2 , L s + 3 ,... Are sent to the parameter calibration unit 45, the transmittance interpolation unit 53, and the second intensity estimation unit 54.
- the transmittance calculation unit 52 calculates the direct line transmittance Cp and sends it to the parameter calibration unit 45, the transmittance interpolation unit 53, and the second intensity estimation unit 54.
- the transmittance interpolating unit 53 interpolates the direct line transmittance Cp obtained by the transmittance calculating unit 52 with respect to the distances before and after the discrete distances L s + 1 , L s + 2 , L s + 3 ,.
- the interpolation result is as shown by a solid line in FIG. 12, for example.
- the interpolation method the value obtained by the arithmetic average (additional average) or the geometric average of the two direct line transmittances Cp with respect to the discrete distances (for example, L s + 1 , L s + 2 ) adjacent to each other is used.
- the direct line transmittance Cp for a distance between discrete distances may be obtained, Lagrange interpolation may be used, or the approximate expression of the solid line in FIG. There is no particular limitation as long as it is an interpolation that is normally used, such as obtaining a value corresponding to the distance while riding in the solid line as the direct line transmittance Cp.
- the direct line transmittance Cp interpolated by the transmittance calculation unit 52 is sent to the parameter calibration unit 45 and the second intensity estimation unit 54.
- Step S3 Actual measurement with phantom
- X-ray imaging is performed with the subject M present.
- a water column may be used as the phantom Ph.
- an acrylic flat plate phantom Ph is interposed between the X-ray tube 2 and the grid 6, and X-rays are irradiated from the X-ray tube 2 toward the grid 6 and the FPD 3.
- X-ray imaging is performed in the state where the phantom Ph is present, and the state where the phantom Ph is present is actually measured. That is, the X-ray tube 2 is irradiated with X-rays in a state where the phantom Ph is present and is incident on the FPD 3 via the grid 6 so as to pass through the grid 6 actually measured in the state where the phantom Ph is present.
- the actually measured intensity G which is the intensity, is obtained.
- the detection element d (see FIG. 3) of the FPD 3 converts the X-ray in a state where the phantom Ph is present into an electric signal, reads it, and converts it into a pixel value corresponding to the electric signal.
- Step S4 Intensity Estimation / Interpolation
- the pixel value is equivalent to the actually measured intensity G, which is the intensity after passing through the grid 6 in the actual measurement with the phantom Ph.
- the pixel specifying unit 51 specifies three adjacent pixels (n ⁇ 1), n, and (n + 1) as a combination of three pixels as described above.
- the pixel The second intensity estimating unit 54 estimates the transmission scattered ray intensity Sc and the estimated direct line intensity P at the adjacent three pixels (n ⁇ 1), n, (n + 1) specified by the specifying unit 51.
- the measured strength G is obtained by actual measurement in step S3 and is known.
- the direct line transmittance Cp is obtained by actual measurement in step S1, and is calculated and interpolated in step S2, and is known.
- the transmitted scattered ray intensity Sc and the estimated direct ray intensity P are values to be estimated by the second intensity estimating unit 54, and are unknown at this point. Therefore, the second intensity estimating unit 54 estimates the transmitted scattered ray intensity Sc and the estimated direct line intensity P by solving simultaneous equations for each of the three adjacent pixels (n ⁇ 1), n, and (n + 1).
- the measured intensity G is set to G n ⁇ 1 , G n , G n + 1 and the direct line transmittance Cp is set to Cp n ⁇ 1 , Cp n , and Cp n + 1, the transmission scattered ray intensities Sc and Sc n-1, Sc n, and Sc n + 1, the estimated direct ray intensities P P n-1, P n , and P n + 1.
- the transmitted scattered ray intensity Sc of each pixel changes between three adjacent pixels due to non-uniformity of the grid 6 (scattered radiation removing means), etc., but considering this, the transmitted scattered ray intensity Sc of the adjacent pixel is changed. It shall be obtained by interpolation calculation. In the present embodiment, it is assumed that the change in transmitted scattered ray intensity Sc in the adjacent three pixels (n ⁇ 1), n, (n + 1) can be linearly approximated as in the following equation (1).
- the interpolation method of the transmitted scattered ray intensity Sc is the same as that described in the interpolation of the direct ray transmittance Cp.
- Lagrangian interpolation may be used. It is not limited to.
- the measured intensity G is assumed to be equal to the sum of the product of the estimated direct ray intensity P and the direct ray transmittance Cp and the transmitted scattered ray intensity Sc, and is set for each of three adjacent pixels (n ⁇ 1), n, (n + 1). It is expressed by equations (2) to (4).
- G n + 1 P n + 1 ⁇ Cp n + 1 + Sc n + 1 (2)
- G n P n ⁇ Cp n + Sc n ...
- G n-1 P n-1 ⁇ Cp n-1 + Sc n-1 (4)
- the estimated direct line intensity P is assumed to be equal between three adjacent pixels (5) It is represented by
- the pixel specifying unit 51 determines the number of predetermined pixels to be specified according to the known number of known direct line transmittances Cp and the known number of known measured intensities G. Then, the second intensity estimation unit 54 is solved by solving simultaneous equations regarding the determined measured intensity G, direct ray transmittance Cp, transmitted scattered ray intensity Sc to be estimated, and estimated direct ray intensity P for each predetermined pixel. Will estimate the transmitted scattered radiation intensity Sc and the estimated direct line intensity P.
- the transmitted scattered radiation intensity Sc of each pixel is an expression obtained by an interpolation calculation of the transmitted scattered radiation intensity Sc of the adjacent pixel, so that the unknown number can be reduced by one.
- the above equation (5) is an equation in which the estimated direct line intensity P is equal between three adjacent pixels, so that the unknown number can be reduced to one. Therefore, in the simultaneous equations other than the above equations (1) and (5), it is only necessary to establish simultaneous equations for the number of specified pixels. In this case, if the pixel specifying unit 51 specifies an arbitrary number, Simultaneous equations can be solved. In this embodiment, the number is three, and simultaneous equations which are the above-described equations (2) to (4) are established.
- the estimated direct line intensity P n should be the same value in all the combinations of the three pixels. However, in actuality, it differs depending on the influence of the change in the transmittance of scattered radiation at the periphery of the grid 6 or varies depending on the statistical fluctuation error. In order to reduce the influence of the installation state of the grid 6 and the statistical fluctuation error, an average value of the estimated direct line intensity P n in the center portion with a small experimental error is obtained.
- the combination of the three pixels (n ⁇ 1), n, and (n + 1) in the central portion of the grid 6 using the above equation (6) is slightly different as described above.
- a plurality of sets of estimated direct line intensities P n are respectively obtained at, to obtain an average value P ⁇ .
- the average value P ⁇ is reassigned to the above equations (2) to (4) (that is, substituted into the following equations (10) to (12) obtained by modifying the above equations (7) to (9)), and again Then, all transmitted scattered ray intensities Sc n ⁇ 1 , Sc n , and Sc n + 1 of each set are obtained.
- the second intensity estimating unit 54 estimates the transmission scattered ray intensities Sc n ⁇ 1 , Sc n , and Sc n + 1 by the above equations (10) to (12).
- the transmitted scattered radiation intensities Sc n ⁇ 1 , Sc n , Sc n + 1 estimated by the second intensity estimating unit 54 are sent to the intensity interpolating unit 55, the change rate calculating unit 56, the display unit 5, and the like.
- pixels for example, n, (n + 1), (n + 2) pixels, or (n ⁇ 2), (n -1), n pixels, etc.
- pixels for example, n, (n + 1), (n + 2) pixels, or (n ⁇ 2), (n -1), n pixels, etc.
- the simultaneous equations of the above expressions (1) to (5) of the other three specified pixels (n′ ⁇ 1), n ′, and (n ′ + 1) are solved.
- the estimated direct line intensity P obtained from the above is subjected to smoothing / interpolation calculation, or the average value of the estimated direct line intensity P is obtained to obtain the estimated direct line intensity P (average value P ⁇ in this embodiment).
- the change in the estimated direct line intensity P is smooth, and averaging or smoothing also has the effect of reducing variations due to statistical fluctuation errors, and the estimated direct line intensity P is a value close to the true value.
- the transmitted scattered line intensity Sc is directly obtained, and the transmitted scattered intensity Sc is averaged or Since smoothing / interpolation calculation is not performed, there is a great advantage that the image of the transmitted scattered radiation intensity Sc has no degradation in resolution. In addition, the resolution of the transmitted scattered radiation intensity Sc is maintained, and a minute change in the transmitted scattered radiation intensity Sc due to deformation of the grid foil or the like can be accurately obtained.
- the transmitted scattered line intensities Sc n ⁇ 1 , Sc n , Sc n + 1 when the denominator “Cp n + 1 + Cp n ⁇ 1 ⁇ 2Cp n ” is not “0” are preceded by the estimated direct line intensity P.
- the transmission scattered ray intensities Sc n ⁇ 1 , Sc n , Sc n + 1 are obtained again, and the transmission thus obtained is obtained again.
- the rate of change Rcs may be obtained in step S5 described later.
- Step S5 Calculation / Interpolation of Change Rate Using the transmitted scattered ray intensity Sc (Sc n ⁇ 1 , Sc n , Sc n + 1 ) estimated by the second intensity estimating unit 54, the change rate calculating unit 56 calculates the change rate Rcs.
- the change rate calculating unit 56 calculates the change rate Rcs.
- 1) Use the average value by simply approximating the scattered radiation intensity distribution to be two-dimensionally constant. 2) Strictly consider changes in scattered radiation intensity due to the installation conditions such as the shape of the phantom and the periphery of the grid, There is a method using a value obtained by two-dimensionally smoothing / interpolating the estimated scattered radiation intensity of each pixel, and the average value of 1) can be said to be the simplest method of smoothing / interpolation calculation.
- the change in the transmitted scattered radiation intensities Sc the installation state is considered a grid 6 that occurs due to the deformation of the absorbing foil 6a by taking the ratio of the reference value is represented by the rate of change Rcs n .
- the change rate calculation unit 56 obtains the change rate Rcs n for all pixels.
- the change rates Rcs n ⁇ 1 , Rcs n , and Rcs n + 1 obtained by the change rate calculation unit 56 are interpolated by the change rate interpolation unit 57 as necessary, and then sent to the second intensity estimation unit 54 again. Further, the change rate obtained by the change rate calculation unit 56 and the change rates Rcs n ⁇ 1 , Rcs n , Rcs n + 1 interpolated by the change rate interpolation unit 57 are also sent to the parameter calibration unit 45.
- the change rate Rcs also changes at discrete distances L s + 1 , L s + 2 , L s + 3 ,...
- the rate-of-change interpolation unit 57 interpolates the rate-of-change Rcs obtained by the rate-of-change calculating unit 56 with respect to distances around the discrete distances L s + 1 , L s + 2 , L s + 3 ,.
- the interpolation result is, for example, as shown by the dotted line in FIG.
- the values obtained by the arithmetic mean (additional average) or the geometric mean of the two change rates Rcs with respect to the discrete distances adjacent to each other are used as the above-described adjacent discrete values. May be obtained as a rate of change Rcs with respect to a certain distance between distances, Lagrange interpolation may be used, and the approximate value of the dotted line in FIG. In addition, there is no particular limitation as long as it is an interpolation that is normally used, such as obtaining a change rate Rcs as a value corresponding to the distance.
- the interpolation is performed in consideration of the discrete distances L s + 1 , L s + 2 , L s + 3 ,... In both the case of the direct line transmittance Cp and the change rate Rcs.
- the first intensity estimation unit 41 estimates the intensity assuming that no shadow is applied as in step S7 described later, and the shadow position calculation unit 42 obtains the shadow position as in step S8, as in step S9.
- the focal position calculation unit 43 obtains the focal position.
- the interpolation that also considers the arrangement direction of the absorbent foil 6a is defined as “calibration”, and the following will be described in distinction from the interpolation that considers only the distance SID.
- step S8 In order to obtain the shadow position in the state where the actual subject M is present instead of the phantom Ph in step S8, actual measurement in the state where the actual subject is present (that is, actual X-ray imaging) as in step S6 described later.
- the relationship between the X-ray intensity and the reference position is measured as in the flow of FIG.
- the flow of FIG. 10 is before step S6, for example, it may be performed before step S1 of FIG. 9, may be performed after step S5 of FIG. 9, or may be performed after step S1 of FIG. It may be performed in parallel with ⁇ S5.
- the relationship (graph) between the shadow position and the X-ray intensity shown in FIG. 14 is acquired.
- the X-ray intensity of the pixel (in this case, the pixel column c, d, e) where the shadow 33 is applied to at least a part is the part where the shadow 33 is applied at each shadow position.
- the shadow 33 is proportional to the ratio of the total area of pixels covered at least in part.
- the ratio of the area of the shadow 33 portion to the total area of the pixel among the pixels to which the shadow 33 is applied can be obtained without actual measurement. Therefore, if the ratio is obtained each time the shadow position is virtually moved, the relationship between the shadow position and the ratio associated with the shadow position can be obtained without performing actual measurement. Further, it can be considered that the X-ray intensity is proportional to the ratio.
- the ratio is small, the pixel 33 has many shadows 33 and the X-ray intensity is small. Conversely, if the ratio is large, the pixel has few shadows and the X-ray intensity is high.
- the X-ray intensity is proportional to the ratio, the X-ray intensity of the pixel at least partially covered by the shadow 33 in the state where there is no subject without actual measurement, and the X-ray intensity. It is possible to obtain the relationship between the associated shadow positions. In the present embodiment, in order to create the relationship as shown in FIG. 14, the following will be described for the case of performing the flow (actual measurement) in FIG.
- Step T1 Grid Movement
- the entire grid 6 is moved in order to sequentially move the marker absorber 7 along the arrangement direction (Y direction) of the absorption foil 6a in the absence of the subject.
- the entire grid 6 is moved in the B direction in FIG. 4C parallel to the Y direction.
- the X-ray tube 2 and the FPD 3 remain fixed. Focusing on the pixel column c, starting from the position before the shadow 33 is applied to the pixel column c, the entire grid 6 is moved in the B direction, the shadow 33 is applied to the pixel column c, and all the shadows 33 are applied to the pixel column c.
- the entire grid 6 is moved in the B direction to such a position (that is, covered).
- the marker absorber 7 passes through the reference position where the perpendicular PL is lowered from the focal point F of the X-ray tube 2 to the FPD 3.
- the grid 6 is moved along the Y direction, when it is moved by a minute distance, it may be moved by the Y direction adjusting screw 60y of the moving mechanism 60 shown in FIG. 7 described above, or the Y direction adjusting screw 60y. If the moving distance is longer than the moving distance (minute distance), the moving mechanism 60 may be moved using another moving means.
- Step T2 Actual measurement in the absence of the subject
- the grid 6 is moved every predetermined pitch (here, 0.0125 mm), and X-ray imaging is performed at the movement position without the subject.
- the X-ray tube 2 irradiates X-rays in the absence of the subject and enters the FPD 3 through the grid 6 to obtain actually measured data in the absence of the subject.
- the detection element d (see FIG. 3) of the FPD 3 converts the X-ray in the absence of the subject into an electrical signal, reads it, and converts it into a pixel value corresponding to the electrical signal.
- the pixel value is equivalent to the intensity I after passing through the grid 6 obtained by actual measurement in the absence of the subject.
- the FPD 3 detects the X-ray intensities of the pixel columns b, c, d, and the average X-ray intensity intensities Ib, Ic, Id along the longitudinal direction of the pixel columns b, c, d are actually measured. Ask. The shadow position at that time and the average intensities Ib, Ic, Id are plotted in correspondence with each other.
- Step T3 All the shadows have moved to such a position?
- the entire grid 6 is moved to the position where all the shadows 33 are applied to the pixel column c in step T1
- the entire grid 6 has not moved to the position where all the shadows 33 are applied to the pixel row c in step T1
- it is determined that the relationship (graph) as shown in FIG. 14 is not completed and the process returns to step T1. Steps T1 to T3 are repeated.
- the shadow positions and the average intensities Ib, Ic, Id associated therewith are plotted, and the relationship shown in FIG. 14 is created.
- the X-ray intensity here, the average intensity
- Ic the X-ray intensity
- the X-ray intensity Ic gradually decreases, and when all the shadow 33 is applied to the pixel column c, the X-ray intensity Ic becomes “0”. 6 shows that the shadow 33 is partially applied to the pixel column c when the reference position is reached.
- the X-ray intensity Ic is smaller than Ic 0 and “0”. It is larger than "".
- Step S6 Actual measurement in a state of an actual subject
- X-ray imaging is performed in a state of a subject M different from the subject M (here, phantom Ph) used in steps S3 to S5.
- a subject M used for actual X-ray imaging is used.
- An actual subject M is interposed between the X-ray tube 2 and the grid 6, and X-rays are irradiated from the X-ray tube 2 toward the grid 6 and the FPD 3, so that the actual subject M is present.
- X-ray imaging is performed to actually measure a certain state of the subject M.
- the X-ray tube 2 irradiates X-rays in a state where there is an actual subject M (subject M used for actual X-ray imaging) and enters the FPD 3 through the grid 6, thereby
- the measured intensity G which is the intensity after passing through the grid 6 in the actual measurement with the sample M, is obtained in the same manner as in step S3.
- the detection element d (see FIG. 3) of the FPD 3 converts the X-ray in a certain state of the subject M into an electrical signal, reads it, and converts it into a pixel value corresponding to the electrical signal.
- the X-ray intensity of the shadow pixel 34 shown in FIG. 6 is also detected, and the actually measured intensity of the shadow pixel 34 is also obtained.
- the average intensities of the X-ray intensities along the longitudinal direction of the pixel rows a, b, f, and g where the shadow 33 is not applied are Ia 0 , Ib 0 , If 0 , and Ig 0 , respectively.
- the average intensities of the X-ray intensities along the longitudinal direction of the pixel columns c, d, and e that are applied to the part are Ic, Id, and Ie, respectively.
- Step S7 Intensity estimation assuming no shadow is applied X-ray intensities (here, average intensities) Ia 0 , Ib 0 , If 0 , Ig 0 of the pixel rows a, b, f, g obtained in step S6 Based on this, the first intensity is obtained by interpolating the X-ray intensities (here, average intensity) Ic, Id, Ie of the pixel columns c, d, e where the shadow 33 obtained in step S6 is at least partially applied.
- the estimation unit 41 estimates X-ray intensities Ic 0 ′, Id 0 ′, and Ie 0 ′.
- the X-ray intensities Ic 0 ′, Id 0 ′, and Ie 0 ′ in a state where the subject M is present when it is assumed that the shadow 33 is not applied to the pixel columns c, d, and e are estimated.
- intensities Ia 0 Although a slight shift occurs with respect to the shadow position due to the movement of the focus position in the state where the subject M is present, in the pixel columns c, d, and e where the shadow 33 is applied, intensities Ia 0 , It shows that the intensities Ic, Id, and Ie are lower than those of Ib 0 , If 0 , and Ig 0 .
- the X-ray intensities Ic 0 ′, Id 0 ′, Ie are obtained by the smoothing / interpolation calculation of the X-ray intensities Ia 0 , Ib 0 , If 0 , Ig 0 as in the case of the direct ray transmittance Cp and the change rate Rcs.
- Estimate 0 ' The intensities Ic 0 ′, Id 0 ′, and Ie 0 ′ estimated by the first intensity estimating unit 41 are sent to the shadow position calculating unit 42.
- Step S8 Calculation of shadow position X-ray intensity Ic (that is, actually measured intensity Ic) of pixel row c obtained in step S6, intensity Ic 0 ′, Id 0 ′, Ie 0 estimated by the first intensity estimating unit 41 ′, The relationship between the X-ray intensity and the shadow position of the pixel rows c, d, e where the shadow 33 in the absence of the subject obtained in steps T1 to T3 is at least partially applied (see FIG. 14). Based on this, the shadow position calculation unit 42 obtains the shadow position when the subject M is present.
- Ic / Ic 0 ′ which is a ratio between the X-ray intensity Ic (that is, actually measured intensity Ic) of the pixel column c obtained in step S 6 and the intensity Ic 0 ′ estimated by the first intensity estimating unit 41, is obtained.
- the actually measured intensity Ic of the pixel column c where the shadow 33 is at least partially covered is the X-ray intensity Ic of the pixel column c where the shadow 33 at each shadow position is at least partially applied to the pixel pixel concerned.
- the ratio c is proportional to the ratio Ic / Ic 0 with respect to the X-ray intensity Ic 0 when no shadow 33 is applied to the column c
- the marker absorber 7 is sequentially applied along the arrangement direction of the absorbent foil 6a.
- the relationship between the X-ray intensity of the pixel column c in which the shadow 33 in the state where there is no subject is applied at least partially and the shadow position associated therewith can be obtained by the actual measurement performed.
- the shadow position xg has been described from the intensity Ic of the pixel column c.
- the shadow 33 is applied to other than the pixel column c.
- the shadow position xg can be obtained from the intensities Id and Ie of the pixel columns d and e.
- the shadow position calculation unit 42 obtains the shadow position xg when the subject M is present.
- the shadow position xg in a state where the subject M is obtained by the shadow position calculation unit 42 is sent to the focus position calculation unit 43.
- Step S9 Calculation of the focal position
- the shadow position xg (x 0 L ′, x 0 R ′, which will be described later) in the state where the subject M is obtained by the shadow position calculation unit 42, between the absorption foils 6a and FPD3 And a shadow position xg with respect to a reference position obtained by dropping a perpendicular PL from the focal point F of the X-ray tube 2 to the FPD 3 in the absence of the subject (here, x 0 L , x 0 R described later)
- the focal position calculation unit 43 obtains the focal position Xf of the FPD 3 with respect to the X-ray tube 2 when the sample M is present.
- the distance from the center of the grid 6 to the left end of the upper left absorber 71 is Wg L
- the distance from the center of the grid 6 to the right end of the lower right absorber 72 is Wg R.
- the shadow position by the upper left absorber 71 is set to x 0 L
- the shadow position by the lower right absorber 72 from the reference position X 0 is set to x 0 R.
- the SID in the state where there is a subject M is L
- the shadow position by the lower absorber 72 is assumed to be x 0 R ′.
- the focal distance Xf is the distance moved between the irradiation axis connecting L 0 and X 0 on the perpendicular line PL in the absence of the object to the irradiation axis in the state where the subject M is present. Focusing on the shadow 33 due to the left end of the upper left absorbent body 71, the following expressions (14) and (15) are expressed by simple geometric calculation.
- the shadow position x 0 L is obtained, and there is the shadow position x 0 L ′ by the upper left absorber 71 in the state where there is no obtained subject, and the subject M obtained by the shadow position calculation unit 42 in step S8.
- the focal position Xf of the FPD 3 with respect to the X-ray tube 2 in the state where the subject M is present is obtained.
- step S8 since the shadow position xg (x 0 L ′, x 0 R ′) in the state where the subject M exists is obtained in step S8, the obtained shadow position xg and the known distances Wg L and Wg R are obtained. Or by substituting the distance d between the absorbing foil 6a and the FPD 3 and the height h of the absorbing foil 6a into the above equation (18), the SID (L) in the state where the subject M is present is obtained.
- the focal position Xf can be obtained by substituting the obtained SID (L) into the above equations (14), (15) or the above equations (16), (17).
- the shadow position xg (x 0 L ′, x 0 R ′) in the state where the subject M is obtained by the shadow position calculation unit 42 (b) the distance between the absorption foils 6a and FPD3. d and (c) the subject based on the shadow position xg (x 0 L , x 0 R ) with respect to the reference position X 0 where the perpendicular PL is lowered from the focal point F of the X-ray tube 2 to the FPD 3 in the absence of the subject
- the focal position calculation unit 43 obtains the focal position Xf of the FPD 3 with respect to the X-ray tube 2 in a state where M is present.
- the focus position Xf in a state where the subject M is found by the focus position calculation unit 43 is sent to the parameter calibration unit 45.
- Step S10 Parameter Calibration Direct ray transmittance Cp and change rate Rcs (related to transmitted scattered ray intensity Sc), which are physical quantities obtained in advance before X-ray imaging, and FPD 3 corresponding to FPD 3 associated therewith
- the direct line transmittance Cp and the change rate Rcs are calibrated based on the relationship between the focal position Xf and the focal position Xf obtained by the focal position calculation unit 43 in a state where the subject M is present.
- the discrete distances L s + 1 , L s + 2 , L s + 3 ,... are taken into consideration by the transmittance interpolation unit 53 and the change rate interpolation unit 57 in both the case of the direct line transmittance Cp and the change rate Rcs.
- the arrangement direction of the absorbent foil 6a is not considered. Therefore, in order to perform interpolation (calibration) considering the arrangement direction of the absorbing foil 6a, the parameters (direct line transmittance Cp and change rate Rcs) are calibrated in step S10.
- the transmittance interpolation unit 53 and the change rate interpolation unit It is not always necessary to perform interpolation in consideration of discrete distances in 57, and only the direct ray transmittance Cp obtained by the transmittance calculation unit 52 and the change rate Rcs obtained by the change rate calculation unit 56 are used as the parameter calibration unit 45. You may send it to.
- discrete SIDs L 1 , L 2 ,..., L m , L m + 1 , etc.
- discrete directions for the arrangement direction (Y direction) of the absorbent foil 6a X-rays of direct transmittance Cp and change rate Rcs for each focal position (Xf ⁇ n , Xf ⁇ n + 1 , Xf ⁇ n + 2 ,..., Xf 0 ,..., Xf n ⁇ 2 , Xf n ⁇ 1 , Xf n ) Obtained in advance before imaging.
- the phantom Ph or the same subject M used for actual X-ray imaging is used, and the X-ray tube 2 is originally discrete as shown in FIG. It may be obtained in advance by performing steps S1 to S9 while moving to step S2. In this manner, the relationship between the parameters (direct ray transmittance Cp and change rate Rcs) and the focal position Xf of the X-ray tube 2 with respect to the FPD 3 associated therewith is obtained in advance before X-ray imaging.
- the radiation irradiation means represented by the X-ray tube 2 is weight as described above, and the X-ray tube 2 having such weight is absorbed (by the grid 6).
- the arrangement direction (Y direction) of the foil 6a there is a problem that even if the moving distance is set finely, the actual moving distance is different from the set moving distance. This problem applies not only to the X-ray tube 2 but also to radiation detection means represented by the FPD 3 that is linked to the movement of the X-ray tube 2.
- the radiation irradiation means represented by the X-ray tube 2 and the radiation detection means represented by the FPD 3 are moved to perform radiation imaging (X-ray imaging in this embodiment), or radiation irradiation means (X in this embodiment).
- the radiation irradiation means (in this embodiment) It has been conceived to move the scattered radiation removing means (grid 6 in this embodiment) that is lighter than the X-ray tube 2) and the radiation detection means (FPD 3 in this embodiment).
- the Y-direction adjusting screw 60y (see FIG. 7) of the moving mechanism 60 moves the grid 6 in parallel with the arrangement direction (Y direction) of the absorption layer 6a.
- the X-ray tube 2 of B in the Y direction as shown in FIG. 18 (b) from the state shown in FIG. 18 (a) - and want to move in the direction.
- the reference position X 0 (see FIG. 4 and FIG. 6) where the shadow 32 (see also FIGS. 4 and 6) drops the perpendicular PL from the focal point F of the X-ray tube 2 to the FPD 3.
- the pixel extends from a pixel to a pixel centered on the kth pixel.
- a shadow 32 by the g-th absorption foil 6a of interest is applied to three pixels (k ⁇ 1), k, and (k + 1).
- the width of the absorbent foil 6 a is shown thicker for the sake of convenience of illustrating the shadow 32 greatly, but it should be noted that the actual width of the absorbent foil 6 a is thin.
- the parameters (direct ray transmittance Cp and change rate Rcs) at the three pixels (k ⁇ 1), k, and (k + 1) when the X-ray tube 2 is virtually moved only have to be finally obtained.
- the parameters when the X-ray tube 2 is moved by Wd ⁇ m are obtained.
- the g-th absorption foil 6a is also moved by Wd ⁇ m.
- the absorption foil 6a after the movement and g m-th.
- shadows 32 by absorbing foil 6a in the g m-th three pixels (k-1), k, (k + 1) pixels moved respectively by Wd ⁇ m fraction from (k -M-1), (km), (km-1).
- the X-ray tube 2 irradiates X-rays while moving by Wd ⁇ m, and the three calculated by the transmittance calculation unit 52, the transmittance interpolation unit 53, the change rate calculation unit 56, and the change rate interpolation unit 57 are obtained.
- This can be replaced by the calculation with the direct line transmittance Cp and the change rate Rcs at the pixels (km-1), (km), and (km + 1). That is, the correction unit 44 uses the Y-direction adjusting screw 60y of the moving mechanism 60 to calculate the direct line transmittance Cp and the change rate Rcs at the three pixels (k ⁇ 1), k, and (k + 1) that should be obtained virtually.
- the direct ray transmittance Cp and the change rate Rcs can be corrected.
- the positional relationship between the absorbent foil 6a of the grid 6 and the shadow position is the same, and B in the direction opposite to the B + direction, which is the moving direction by the Y-direction adjusting screw 60y.
- the values of direct line transmittance Cp and change rate Rcs in each pixel obtained by virtually moving the X-ray tube 2 by Wd ⁇ m in the ⁇ direction are determined by moving the grid 6 in the B + direction with the Y direction adjusting screw 60y.
- the shadow 32 of the absorbing foil 6a has been described as an example for actually moving the grid 6, the direct line transmittance at the pixels related to the shadow 33 of the marker absorber 7 used in this embodiment is described. You may correct
- the shadow 33 of the marker absorber 7 extends over three pixels as shown in FIG. 6, and therefore can be applied to the shadow 33 of the marker absorber 7.
- the direct line transmittance Cp is obtained (including the case of interpolation)
- the direct line transmittance Cp can be obtained without the subject, but when the change rate Rcs is obtained (in some cases, interpolation is also performed).
- the rate of change Rcs is acquired in a state where the phantom Ph is present as shown in FIG. Therefore, when the rate of change Rcs is obtained by actually moving the grid 6 as shown in FIG. 18C, the phantom Ph is also preferably moved by the same distance in the same direction as the moving direction of the grid 6. In the case of a phantom Ph with an acrylic flat plate having a uniform thickness, it is not always necessary to move the phantom Ph along with the movement of the grid 6, and the phantom Ph may be fixed.
- FIG. 17 it is applied to which position in FIG. 17 the focus position Xf obtained with the subject M obtained by the focus position calculation unit 43 in step S9 corresponds, and the direct line transmittance Cp and the change rate Rcs at that position are determined.
- the direct ray transmittance Cp and the change rate Rcs are acquired as values obtained after calibration.
- the focal position Xf obtained by the focal position calculation unit 43 is between the discrete values in FIG. 17, the focal position Xf is obtained by smoothing / interpolation calculation.
- the interpolation calculation is a two-dimensional interpolation that interpolates both the SID and the focal position (in the arrangement direction of the absorption foil 6a), and the simplest interpolation method is a linear approximation interpolation method. Since parameters obtained by actual measurement are interpolated in this way, the error of each parameter can be evaluated in advance, and the necessary accuracy can be obtained by reducing the pitch (interval) of discrete positions. It is done.
- Step S11 Intensity Estimation / Interpolation
- the pixel value obtained in step S6 is the actually measured intensity that is the intensity after passing through the grid 6 when the subject M is actually measured. Equivalent to G.
- the pixel specifying unit 51 specifies three adjacent pixels (n ⁇ 1), n, (n + 1) as a combination of three pixels. Then, the change rate Rcs obtained by the change rate calculation unit 56, the change rate Rcs interpolated by the change rate interpolation unit 57, or the change rate Rcs calibrated by the parameter calibration unit 45, and the transmittance calculation unit 52.
- the adjacent 3 specified by the pixel specifying unit 51 is used.
- the second intensity estimating unit 54 again estimates the transmitted scattered ray intensity Sc and the estimated direct line intensity P at the two pixels (n ⁇ 1), n, and (n + 1).
- step S4 the transmission scattered radiation intensity Sc and the estimated direct line intensity P are estimated by solving simultaneous equations.
- the difference from step S4 is that the parameter of the rate of change Rcs is considered, and the transmission scattering
- the expression relating to the line intensity Sc and the expression relating to the estimated direct line intensity P are different from each other. Note that a description of portions common to step S4 is omitted.
- the transmitted scattered radiation intensity Sc is set to the transmitted scattered radiation intensity when the installation state is ideal without the foil non-uniformity such as deformation of the absorbing foil of the grid 6. Except for the rate of change that occurs due to the non-uniformity of the grid 6 in the transmitted scattered radiation intensity Sc, if the subject is a water column (for example, a water cylinder) or a human body, and the radiation is X-rays or ⁇ -rays, the change Is smooth, it is expressed by the following equation (1) ′′ that is equal between three adjacent pixels.
- the measured intensity G is assumed to be equal to the sum of the product of the estimated direct ray intensity P and the direct ray transmittance Cp and the product of the transmitted scattered ray intensity Sc and the change rate Rcs, and adjacent three pixels (n ⁇ 1), n, It is expressed by simultaneous equations (2) ′′ to (4) ′′ for each (n + 1).
- the estimated direct line intensity P of each pixel varies depending on the shape, material, etc. of the subject M, and the change is an interpolation of the estimated direct line intensity P of adjacent pixels. It can be expressed by calculation. In this embodiment, it is assumed that the change of the estimated direct line intensity P in the adjacent three pixels (n ⁇ 1), n, (n + 1) can be linearly approximated as in the following equation (5) ′′.
- the interpolation method of the estimated direct line intensity P is the same as described in the interpolation of the direct line transmittance Cp and the transmission scattered ray intensity Sc in step S4.
- Lagrangian interpolation may be used, which is normally used.
- the interpolation is not particularly limited to the above equation (5) ′′.
- the method 1) is a method for obtaining the transmission scattered ray intensity Sc first. Since the transmission scattering ray intensity Sc when the installation state of the grid 6 is ideal without deformation is used, first, a plurality of transmission scattering ray intensities Sc n obtained when the denominator is not “0” are used. , Including the pixels that have not yet been obtained because the denominator is “0”, the transmission scattered ray intensities Sc n ⁇ for all the pixels are obtained by appropriate smoothing / interpolation calculation. As described in the above formula (1) ′′, when the subject is a water column (for example, a water column) or a human body and the radiation is X-ray or ⁇ -ray, the change is smooth and the smoothing is statistical.
- a water column for example, a water column
- the radiation is X-ray or ⁇ -ray
- the method 2) uses the estimated direct line intensities P n ⁇ 1 , P n , and P n + 1 already obtained by the above formulas (7) ′′ to (9) ′′, and has not yet been obtained.
- the intensities P n ⁇ 1 , P n , and P n + 1 are interpolated in the same manner as the above equation (5) ′′. That is, the intensity interpolation unit 55 interpolates the estimated direct line intensities P n ⁇ 1 , P n , and P n + 1 estimated by the second intensity estimation unit 54.
- the interpolation at this time is not particularly limited to the expression (5) ′′ as long as it is an interpolation that is normally used.
- the estimated direct line intensities P n ⁇ 1 , P n , and P n + 1 interpolated by the intensity interpolating unit 55 are sent to the display unit 5 and the like.
- the transmission scattered ray intensity Sc n may be obtained first, or the estimated direct ray intensity P n may be obtained first.
- the estimated direct line intensity Pn obtained in step S11 is used as the pixel value, so that an X-ray image in which the scattered image and the false image due to the grid 6 are reduced is appropriately obtained. It is done.
- Such an X-ray image may be displayed and output on the display unit 5 described above, or may be written and stored in a storage medium typified by a RAM (Random-Access Memory) or the like, and read as necessary. However, it may be printed out by a printing means represented by a printer or the like.
- the arrangement direction (Y direction) of the absorbing foil 6a that absorbs scattered rays (scattered X-rays) is in the row direction of the detection elements d and the row direction out of the column direction.
- the grid 6 is configured by being parallel to each other and arranging the respective absorbing foils 6a in parallel to the FPD3 detection surface.
- the Y direction adjusting screw 60y of the moving mechanism 60 moves the grid 6 in parallel to the arrangement direction (Y direction) of the absorbent foil 6a.
- the Y-direction adjusting screw 60y moves the grid 6 by a predetermined distance and irradiates X-rays from the X-ray tube 2
- the Y-direction adjusting screw 60y moves the grid 6 by the predetermined distance as described above.
- Physical quantities obtained by irradiating X-rays from the tube 2 with physical quantity calculation means in this embodiment, transmittance calculation unit 52, transmittance interpolation unit 53, change rate calculation unit 56, change rate interpolation unit 57), that is, parameters (In this embodiment, the direct line transmittance Cp and the change rate Rcs) are obtained.
- the X-ray tube 2 in the direction opposite to the moving direction (for example, the B + direction) by the Y-direction adjusting screw 60y (when the moving direction by the Y-direction adjusting screw 60y is the B + direction, the reverse direction is the B - direction).
- the parameter that should be obtained in the virtual is to irradiate X-rays from the X-ray tube 2 while the grid 6 has been moved by the predetermined distance with the Y-direction adjusting screw 60y.
- the parameters can be regarded as the same as the parameters obtained by the physical quantity calculating means (the transmittance calculating unit 52, the transmittance interpolating unit 53, the change rate calculating unit 56, and the change rate interpolating unit 57). Therefore, the correction unit 44 irradiates the X-ray from the X-ray tube 2 with the Y-direction adjusting screw 60y and moves the grid 6 by the predetermined distance as described above, and the correction unit 44 calculates the physical quantity. Only the grid 6 is moved without moving the X-ray tube 2 by correcting the parameters obtained by the transmittance calculating unit 52, the transmittance interpolating unit 53, the change rate calculating unit 56, and the change rate interpolating unit 57. Can be moved. Therefore, a parameter equivalent to a parameter that should be obtained when the X-ray tube 2 is moved can be obtained by moving the grid 6, and positional deviation can be reduced.
- the moving mechanism 60 is provided with the grid 6 as the absorbing foil 6a by an integral multiple of the interval between the pixels constituting the X-ray image (that is, the pixel pitch Wd) (Wd ⁇ m when the integer is m). It is possible to move in parallel with the arrangement direction (Y direction). Movement direction by the Y-direction adjusting screws 60y moving mechanism 60 (for example, B + direction) (when the moving direction by the Y-direction adjusting screw 60y of B + direction, the reverse direction B - direction) reverse to the X-ray It is assumed that the parameters (see FIG.
- m pixels when the tube 2 is moved by the above-described integer pixels (here, m pixels) are set to the number of pixels in which the grid 6 is an integer (see FIG. 18B) (see FIG. 18B).
- the correction unit 44 corrects the parameters obtained by irradiating X-rays from the X-ray tube 2 in a state of moving by (m pixels).
- the predetermined distance moved by the Y-direction adjusting screw 60y is set to an integral multiple (Wd ⁇ m) of the pixel interval, the position where the X-ray tube 2 moves virtually and the position where the grid 6 actually moves Is an integer pixel relationship, the parameters can be accurately corrected without shifting between pixels.
- the physical quantity (parameter) is a direct ray transmittance Cp, which is a transmittance before and after transmission of a direct line (direct X-ray) by the grid 6 obtained by actual measurement in a state where there is no subject.
- the change rate Rcs related to the transmitted scattered ray intensity Sc which is the scattered ray (scattered X-ray) intensity after passing through the grid 6 obtained by actual measurement in a certain state of the subject.
- the transmittance calculating unit 52 and the transmittance interpolating unit 53 obtain the direct ray transmittance Cp and calculate the change rate.
- the unit 56 and the change rate interpolation unit 57 obtain the change rate Rcs. Then, the moving direction by the Y-direction adjusting screws 60y (e.g. B + direction) (when the moving direction by the Y-direction adjusting screw 60y of B + direction is the reverse direction B - direction) reverse to the X-ray tube 2 Is assumed to have been moved by a predetermined distance (Wd ⁇ m in the present embodiment), the direct line transmittance Cp and the change rate Rcs when the grid 6 is moved by a predetermined distance (Wd ⁇ m) by the Y-direction adjusting screw 60y.
- B + direction when the moving direction by the Y-direction adjusting screw 60y of B + direction is the reverse direction B - direction
- the correction unit 44 corrects the direct ray transmittance Cp and the change rate Rcs obtained by irradiating X-rays from the X-ray tube 2 in the moved state.
- the direct ray transmittance Cp and the change rate Rcs corrected in this way are used for X-ray imaging (the positional relationship in FIG. 17 in the case of the present embodiment), so that the direct ray transmittance Cp and the change rate without positional deviation are obtained.
- a false image process can be performed using Rcs, and a false image due to a positional shift can be removed.
- the present invention is not limited to the above embodiment, and can be modified as follows.
- the X-ray is taken as an example of radiation, but it may be applied to radiation other than X-ray (for example, ⁇ -ray).
- the radiation imaging apparatus has a structure in which imaging is performed by placing the subject on the top plate 1 as shown in FIG. 1 used for medical purposes, but is not limited thereto.
- it may have a structure in which a subject (in this case, the subject to be examined is a subject) is transported on a belt and photographed, as in a non-destructive inspection apparatus used for industrial use, etc.
- It may be a structure such as an X-ray CT apparatus used in the present invention.
- the air grid is adopted as the scattered radiation removing means represented by the grid, but the invention is not limited to this.
- a grid made of an intermediate material that transmits radiation represented by X-rays such as aluminum or an organic material may be used.
- a cross grid may be used.
- the absorbent foil 6a and the intermediate layer 6c along the X direction in FIG. 3 are alternately arranged in the Y direction in FIG. 3, and the absorbent foil 6b and the intermediate layer along the Y direction in FIG.
- the absorbent foil 6a and the absorbent foil 6b are crossed with each other.
- the arrangement direction of the absorption foils 6a and 6b is parallel to both the row direction and the column direction of the detection element d.
- the marker absorber 7 is provided, but it is not always necessary.
- the physical quantity (parameter) that is the target of the correction unit 44 is the direct ray transmittance and the change rate of the transmitted scattered ray intensity, but only the direct ray transmittance or the transmitted scattered ray intensity. Only the rate of change may be used.
- the physical quantity (parameter) that is the target of the correction unit 44 is the direct ray transmittance and the change rate of the transmitted scattered ray intensity, but is not limited thereto.
- the physical quantity is related to the radiation intensity, for example, the radiation intensity (X-ray in the embodiment) assigned to each pixel constituting the radiation image (X-ray image in the embodiment) and detected by the radiation detection means (FPD in the embodiment). It may be a pixel value (intensity) according to (image).
- the physical quantity calculation means obtains the pixel value.
- the radiation irradiating means (X-ray tube 2 in the embodiment) is moved by a pixel corresponding to a predetermined distance in the direction opposite to the moving direction by the moving means (Y-direction adjusting screw 60y of the moving mechanism 60 in the embodiment).
- the pixel value at the time of hypothesis is the radiation irradiating means (X-ray tube 2) in a state in which the scattered radiation removing means (grid 6 in the embodiment) is moved by the pixel corresponding to the predetermined distance by the moving means (Y direction adjusting screw 60y).
- the correction means (correction unit 44 in the embodiment) corrects the pixel value obtained by the physical quantity calculation means.
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Abstract
Description
すなわち、この発明の放射線撮像装置は、放射線画像を得る放射線撮像装置であって、放射線を照射する放射線照射手段と、散乱放射線を除去する散乱放射線除去手段と、放射線を検出する複数の検出素子が行列状に構成された放射線検出手段とを備え、前記散乱放射線を吸収する吸収層の配置方向が前記検出素子の行方向、列方向の少なくとも1つの方向に対して平行であり、かつ各々の前記吸収層を前記放射線検出手段の検出面に対して平行に配置して前記散乱放射線除去手段を構成し、前記装置は、前記散乱放射線除去手段を前記吸収層の配置方向に平行に移動させる移動手段と、前記散乱放射線除去手段による透過後の放射線を前記放射線検出手段で検出したことに基づいて放射線強度に関する物理量を求める物理量算出手段と、前記移動手段による移動方向とは逆方向に前記放射線照射手段を所定距離分だけ移動させたと仮想したときにおける物理量を、前記移動手段で前記散乱放射線除去手段が前記所定距離分だけ移動した状態で前記放射線照射手段から放射線を照射して前記物理量算出手段で求められた前記物理量として補正する補正手段とを備えることを特徴とするものである。
すなわち、この発明の放射線撮像装置によれば、散乱放射線を吸収する吸収層の配置方向が検出素子の行方向、列方向の少なくとも1つの方向に対して平行であり、かつ各々の吸収層を放射線検出手段の検出面に対して平行に配置して散乱放射線除去手段を構成する。移動手段は、散乱放射線除去手段を吸収層の配置方向に平行に移動させる。したがって、移動手段が散乱放射線除去手段を所定距離分だけ移動させて放射線照射手段から放射線を照射すると、移動手段で散乱放射線除去手段が上述した所定距離分だけ移動した状態で放射線照射手段から放射線を照射して物理量算出手段で求められた物理量が得られる。一方、移動手段による移動方向とは逆方向に放射線照射手段を所定距離分だけ移動させたと仮想すると、その仮想で得られるはずの物理量は、移動手段で散乱放射線除去手段が上述した所定距離分だけ移動した状態で放射線照射手段から放射線を照射して物理量算出手段で求められた物理量と同じと見なすことができる。したがって、補正手段は、その仮想で得られるはずの物理量を、移動手段で散乱放射線除去手段が上述した所定距離分だけ移動した状態で放射線照射手段から放射線を照射して物理量算出手段で求められた物理量として補正することで、放射線照射手段を移動させることなく、散乱放射線除去手段のみを移動させることができる。したがって、放射線照射手段を移動させたときに得られるはずの物理量と同等の物理量が、散乱放射線除去手段を移動させることで得られ、位置ズレを低減させることができる。
3 … フラットパネル型X線検出器(FPD)
d … 検出素子
6 … グリッド
6a … 吸収箔
44 … 補正部
52 … 透過率算出部
53 … 透過率補間部
56 … 変化率算出部
57 … 変化率補間部
60 … 移動機構
60y … Y方向調整ネジ
Wd … 画素ピッチ
Cp … 直接線透過率
Rcs … 変化率
M … 被検体
被検体のない状態でX線撮像を行う。図11に示すように、X線管2とグリッド6との間に被検体を介在させずに、X線管2からX線をグリッド6およびFPD3に向けて照射することで、被検体のない状態でX線撮像を行って被検体のない状態での実測を行う。すなわち、X線管2は、被検体のない状態でX線を照射して、グリッド6を介してFPD3に入射させることで、被検体のない状態での実測データが得られる。具体的には、被検体のない状態でのX線をFPD3の検出素子d(図3を参照)は電気信号に変換して読み出して、電気信号に応じた画素値に変換する。
その画素値は、被検体のない状態での実測により求められたグリッド6を透過した後の強度と同等である。一方、グリッド6を透過する前の強度は既知であるので、グリッド6を透過する前(透過前)およびグリッド6を透過した後(透過後)の透過率である直接線透過率Cpは、グリッド6を透過する前の強度とグリッド6を透過した後の強度(すなわちFPD3で検出された画素値)との比率で表される。
次に、被検体Mのある状態でX線撮像を行う。図13に示すように、直接線の透過厚さが一定、すなわち各画素での推定直接線強度Pが全て同じ値とみなせるアクリル平板のファントムPhを被検体Mとして用いる。なお、水円柱をファントムPhとして用いてもよい。
その画素値は、ファントムPhのある状態での実測でのグリッド6を透過した後の強度である実測強度Gと同等である。一方、画素特定部51は、上述したように隣接する3つの画素(n-1),n,(n+1)を3つの画素の組み合わせとして特定する。そして、透過率算出部52で求められた直接線透過率Cp,透過率補間部53で補間された直接線透過率Cpと、FPD3から画素値と同等である実測強度Gとに基づいて、画素特定部51で特定された隣接する3つの画素(n-1),n,(n+1)での透過散乱線強度Scや推定直接線強度Pを第2強度推定部54は推定する。
透過散乱線強度Scの補間方法については、直接線透過率Cpの補間でも述べたのと同様で、例えばラグランジェ補間を用いてもよく、通常において用いられる補間であれば特に上記(1)式に限定されない。
Gn=Pn・Cpn+Scn …(3)
Gn-1=Pn-1・Cpn-1+Scn-1 …(4)
Scn+1=Gn+1-Pn+1・Cpn+1 …(7)
Scn=Gn-Pn・Cpn …(8)
Scn-1=Gn-1-Pn-1・Cpn-1 …(9)
上記(6)~(9)式では、先ず上記(6)式で既知である実測強度Gn-1,Gn,Gn+1と既知である直接線透過率Cpn-1,Cpn,Cpn+1と用いて推定直接線強度Pを求めて、推定直接線強度Pを既知とした後に、その既知となった推定直接線強度Pn(=Pn+1=Pn-1)も用いて上記(7)~(9)式で透過散乱線強度Scn-1,Scn,Scn+1をそれぞれ求めている。
Scn=Gn-P^・Cpn …(11)
Scn-1=Gn-1-P^・Cpn-1 …(12)
このように上記(10)~(12)式で透過散乱線強度Scn-1,Scn,Scn+1をそれぞれ求めることで第2強度推定部54は推定する。第2強度推定部54で推定された透過散乱線強度Scn-1,Scn,Scn+1を強度補間部55や変化率算出部56や表示部5などに送り込む。
第2強度推定部54で推定された透過散乱線強度Sc(Scn-1,Scn,Scn+1)を用いて変化率算出部56は変化率Rcsを求める。具体的には、透過散乱線強度Scの基準強度として、全ての画素についてのその値に対する各画素の変化率Rcsを求めるために平均値Sc^またはスムージング・補間計算により求められる各画素の値Sc~を求める。各画素の透過散乱線強度Scnと平均値Sc^または各画素の値Sc~との比率を変化率Rcsとして、各画素の変化率RcsをRcsnとすると、下記(13)式で表される。
または Rcsn=Scn/Sc~ …(13)
透過散乱線の変化率を求める時に、分母に置く基準推定散乱強度については、散乱線強度は箔に歪などがなく、設置条件に拠らない理想的なグリッドの場合の散乱線強度に相当する。
1)簡便に散乱線強度分布を二次元的に一定と近似して平均値を用いる
2)用いたファントムの形状やグリッドの周辺部など設置条件などによる散乱線強度変化を厳密に考慮して、各画素の推定された散乱線強度を二次元的にスムージング・補間して得られる値を用いる方法があり、1)の平均値はスムージング・補間計算の最も簡略な方法とも言える。
被検体がない状態でマーカ用の吸収体7を吸収箔6aの配置方向(Y方向)に沿って逐次に移動させるために、グリッド6全体を移動させる。ここではY方向に平行な図4(c)中のB方向にグリッド6全体を移動させる。なお、X線管2およびFPD3については固定したままである。画素列cに着目すると、画素列cに陰影33がかかる前の位置を起点として、グリッド6全体をB方向に移動させて、陰影33が画素列cにかかり、画素列cに陰影33が全てかかる(すなわち覆う)位置にまでグリッド6全体をB方向に移動させる。このグリッド6の移動中に、X線管2の焦点FからFPD3へ垂線PLを下ろした基準位置をマーカ用の吸収体7が通過することになる。図13では、基準位置を“0”とした場合に、基準位置から-74μmの位置から、基準位置から+150μmの位置まで0.0125mm(=12.5μm)毎にグリッド6を移動させる。グリッド6をY方向に沿って移動させる際において、微小距離分だけ移動させる場合には上述した図7に示す移動機構60のY方向調整ネジ60yによって移動させればよいし、Y方向調整ネジ60yによる移動距離(微小距離)よりも長い場合には移動機構60とは別の移動手段を用いて移動させればよい。
ステップT1でグリッド6を所定ピッチ(ここでは0.0125mm)毎に移動させて、その移動位置で被検体のない状態でX線撮像を行う。ステップS1と同様に、X線管2は、被検体のない状態でX線を照射して、グリッド6を介してFPD3に入射させることで、被検体のない状態での実測データが得られる。具体的には、被検体のない状態でのX線をFPD3の検出素子d(図3を参照)は電気信号に変換して読み出して、電気信号に応じた画素値に変換する。
ステップT1で画素列cに陰影33が全てかかる位置にまでグリッド6全体が移動したら、図14に示すような関係(グラフ)が完成したとして、図10の一連のフローを終了する。一方、ステップT1で画素列cに陰影33が全てかかる位置にまでグリッド6全体が移動していない場合には、図14に示すような関係(グラフ)が完成していないとして、ステップT1に戻って、ステップT1~T3を繰り返す。
次に、ステップS3~S5で用いられた被検体M(ここではファントムPh)とは別の被検体Mのある状態でX線撮像を行う。図1に示すように、実際のX線撮像に用いられる被検体Mを用いる。X線管2とグリッド6との間に実際の被検体Mを介在させて、X線管2からX線をグリッド6およびFPD3に向けて照射することで、実際の被検体Mのある状態でX線撮像を行って実際の被検体Mのある状態の実測を行う。すなわち、X線管2は、実際の被検体M(実際のX線撮像に用いられる被検体M)のある状態でX線を照射して、グリッド6を介してFPD3に入射させることで、被検体Mのある状態での実測でのグリッド6を透過した後の強度である実測強度Gが、ステップS3と同様に得られる。具体的には、被検体Mのある状態でのX線をFPD3の検出素子d(図3を参照)は電気信号に変換して読み出して、電気信号に応じた画素値に変換する。
ステップS6で求められた画素列a,b,f,gのX線強度(ここでは平均強度)Ia0,Ib0,If0,Ig0に基づいて、同じくステップS6で求められた陰影33が少なくとも一部にかかっている画素列c,d,eのX線強度(ここでは平均強度)Ic,Id,Ieを補間することで第1強度推定部41はX線強度Ic0´,Id0´,Ie0´を推定する。すなわち、画素列c,d,eに陰影33がかからないと仮定した場合での被検体Mのある状態でのX線強度Ic0´,Id0´,Ie0´を推定する。
ステップS6で求められた画素列cのX線強度Ic(すなわち実測強度Ic)、第1強度推定部41で推定された強度Ic0´,Id0´,Ie0´、ステップT1~T3で求められた被検体がない状態での陰影33が少なくとも一部にかかっている画素列c,d,eのX線強度および陰影位置の関係(図14を参照)に基づいて、被検体Mがある状態での陰影位置を陰影位置算出部42は求める。
陰影位置算出部42で求められた被検体Mがある状態での陰影位置xg(ここでは後述するx0 L´,x0 R´)、吸収箔6a・FPD3間の距離d、被検体がない状態でのX線管2の焦点FからFPD3へ垂線PLを下ろした基準位置に対する陰影位置xg(ここでは後述するx0 L,x0 R)に基づいて、被検体Mがある状態でのX線管2に対するFPD3の焦点位置Xfを焦点位置算出部43は求める。
Xf=(x0 L´-x0 L)・(L-d-h)/(d+h) …(15)
グリッド6中心から左上部吸収体71の左端までの距離WgL,吸収箔6a・FPD3間の距離d,吸収箔6aの高さhが既知である。X線撮像時である被検体Mがある状態でのSID(L)も装置のハード情報などから既知の場合には、上記(14)式から被検体がない状態での左上部吸収体71による陰影位置x0 Lを求め、その求められた被検体がない状態での左上部吸収体71による陰影位置x0 L´と、ステップS8で陰影位置算出部42で求められた被検体Mがある状態での左上部吸収体71による陰影位置x0 L´とを上記(15)式に代入して、被検体Mがある状態でのX線管2に対するFPD3の焦点位置Xfを求める。
Xf=(x0 R´-x0 R)・(L-d-h)/(d+h) …(17)
上記(14)~(17)式から、x0 L,x0 Rを消去して、下記(18)式が得られる。
{(x0 L´-WgL)・d-(x0 R´-WgR)・(d+h)} …(18)
グリッド6中心から右下部吸収体72の右端までの距離WgRは既知であり、その既知である距離距離WgRを上記(18)式に代入するとともに、ステップS8で陰影位置算出部42で求められた被検体Mがある状態での右下部吸収体72による陰影位置x0 R´を代入して、被検体Mがある状態でのSID(L)を求める。すなわち、ステップS8で被検体Mがある状態での陰影位置xg(x0 L´,x0 R´)が求められているので、求められた陰影位置xgと既知である距離WgL,WgRや吸収箔6a・FPD3間の距離d,吸収箔6aの高さhを上記(18)式に代入することで、被検体Mがある状態でのSID(L)を求める。求められたSID(L)を上記(14)、(15)式あるいは上記(16)、(17)式に代入して、焦点位置Xfを求めることができる。
X線撮像の前に予め求められた物理量である直接線透過率Cpおよび(透過散乱線強度Scに関する)変化率Rcsおよびそれに対応づけられたFPD3に対するX線管2の焦点位置Xfの関係、および焦点位置算出部43で求められた被検体Mがある状態での焦点位置Xfに基づいて、直接線透過率Cpおよび変化率Rcsを校正する。
ステップS4でも述べたように、ステップS6で得られた画素値は、被検体Mのある状態での実測でのグリッド6を透過した後の強度である実測強度Gと同等である。同様に、画素特定部51は、隣接する3つの画素(n-1),n,(n+1)を3つの画素の組み合わせとして特定する。そして、変化率算出部56で求められた変化率Rcs、変化率補間部57で補間された変化率Rcsまたはパラメータ校正部45で校正された変化率Rcsと、透過率算出部52で求められた直接線透過率Cp、透過率補間部43で補間された直接線透過率Cpまたはパラメータ校正部45で校正された直接線透過率Cpとに基づいて、画素特定部51で特定された隣接する3つの画素(n-1),n,(n+1)での透過散乱線強度Scや推定直接線強度Pを第2強度推定部54は再度に推定する。
Gn=Pn・Cpn+Scn・Rcsn …(3)´´
Gn-1=Pn-1・Cpn-1+Scn-1・Rcsn-1 …(4)´´
推定直接線強度Pの補間方法については、直接線透過率Cpの補間やステップS4の透過散乱線強度Scの補間でも述べたのと同様で、例えばラグランジェ補間を用いてもよく、通常において用いられる補間であれば特に上記(5)´´式に限定されない。
・Gn+1+2Cpn-1・Rcsn+1・Gn-Cpn・Rcsn+1・
Gn-1}/(Cpn+1・Cpn・Rcsn+1・Rcsn-1-2Cpn+1
・Cpn-1・Rcsn+1・Rcsn+Cpn・Cpn-1
・Rcsn+1 2) …(6)´´
Pn-1={(Cpn・Rcsn-1-2Cpn-1・Rcsn)・Gn+1+2Cpn-1
・Rcsn+1・Gn-Cpn・Rcsn+1・Gn-1}/(Cpn+1・
Cpn・Rcsn-1-2Cpn+1・Cpn-1・Rcsn+Cpn・
Cpn-1・Rcsn+1) …(7)´´
Pn=Gn/Cpn-Rcsn・[Gn+1/Rcsn+1-{(Cpn・Rcsn-1-
2Cpn-1・Rcsn)・Gn+1+2Cpn-1・Rcsn+1・Gn-Cpn・
Rcsn+1・Gn-1}/(Cpn+1・Cpn・Rcsn+1・Rcsn-1-
2Cpn+1・Cpn-1・Rcsn+1・Rcsn+Cpn・Cpn-1・
Rcsn+1 2)] …(8)´´
Pn+1=Gn+1/Cpn+1-Rcsn-1・[{(Cpn・Rcsn-1-
2Cpn-1・Rcsn)・Gn+1+2Cpn-1・Rcsn+1・Gn-Cpn・
Rcsn+1・Gn-1}/(Cpn+1・Cpn・Rcsn+1・Rcsn-1-
2Cpn+1・Cpn-1・Rcsn+1・Rcsn+Cpn・Cpn-1・
Rcsn+1 2)] …(9)´´
上記(6)´´~(9)´´式を用いて求められた推定直接線強度Pn-1,Pn,Pn+1、透過散乱線強度Scn(=Scn+1=Scn-1)は、上記(1)´´~(5)´´式の連立方程式の解に含まれる分母が“0”でないときに求められる値である。
Claims (6)
- 放射線画像を得る放射線撮像装置であって、放射線を照射する放射線照射手段と、散乱放射線を除去する散乱放射線除去手段と、放射線を検出する複数の検出素子が行列状に構成された放射線検出手段とを備え、前記散乱放射線を吸収する吸収層の配置方向が前記検出素子の行方向、列方向の少なくとも1つの方向に対して平行であり、かつ各々の前記吸収層を前記放射線検出手段の検出面に対して平行に配置して前記散乱放射線除去手段を構成し、前記装置は、前記散乱放射線除去手段を前記吸収層の配置方向に平行に移動させる移動手段と、前記散乱放射線除去手段による透過後の放射線を前記放射線検出手段で検出したことに基づいて放射線強度に関する物理量を求める物理量算出手段と、前記移動手段による移動方向とは逆方向に前記放射線照射手段を所定距離分だけ移動させたと仮想したときにおける物理量を、前記移動手段で前記散乱放射線除去手段が前記所定距離分だけ移動した状態で前記放射線照射手段から放射線を照射して前記物理量算出手段で求められた前記物理量として補正する補正手段とを備えることを特徴とする放射線撮像装置。
- 請求項1に記載の放射線撮像装置において、前記移動手段は、前記放射線画像を構成する各々の画素の間隔の整数倍分だけ、前記散乱放射線除去手段を前記吸収層の配置方向に平行に移動可能に構成され、前記移動手段による移動方向とは逆方向に前記放射線照射手段を前記整数の画素分だけ移動させたと仮想したときにおける物理量を、前記移動手段で前記散乱放射線除去手段が前記整数の画素分だけ移動した状態で前記放射線照射手段から放射線を照射して前記物理量算出手段で求められた前記物理量として前記補正手段は補正することを特徴とする放射線撮像装置。
- 請求項1または請求項2に記載の放射線撮像装置において、前記物理量は、被検体のない状態での実測により求められた前記散乱放射線除去手段による直接放射線の透過前および透過後の透過率である直接線透過率であり、前記物理量算出手段は前記直接線透過率を求め、前記移動手段による移動方向とは逆方向に前記放射線照射手段を前記所定距離分だけ移動させたと仮想したときにおける直接線透過率を、前記移動手段で前記散乱放射線除去手段が前記所定距離分だけ移動した状態で前記放射線照射手段から放射線を照射して前記物理量算出手段で求められた前記直接線透過率として前記補正手段は補正することを特徴とする放射線撮像装置。
- 請求項1または請求項2に記載の放射線撮像装置において、前記物理量は、前記散乱放射線除去手段を透過した後の散乱放射線強度である透過散乱線強度に関する変化率であり、前記物理量算出手段は前記変化率を求め、前記移動手段による移動方向とは逆方向に前記放射線照射手段を前記所定距離分だけ移動させたと仮想したときにおける変化率を、前記移動手段で前記散乱放射線除去手段が前記所定距離分だけ移動した状態で前記放射線照射手段から放射線を照射して前記物理量算出手段で求められた前記変化率として前記補正手段は補正することを特徴とする放射線撮像装置。
- 請求項1または請求項2に記載の放射線撮像装置において、前記物理量は、被検体のない状態での実測により求められた前記散乱放射線除去手段による直接放射線の透過前および透過後の透過率である直接線透過率、および被検体のある状態での実測により求められた前記散乱放射線除去手段を透過した後の散乱放射線強度である透過散乱線強度に関する変化率であり、前記物理量算出手段は前記直接線透過率および前記変化率を求め、前記移動手段による移動方向とは逆方向に前記放射線照射手段を前記所定距離分だけ移動させたと仮想したときにおける直接線透過率および変化率を、前記移動手段で前記散乱放射線除去手段が前記所定距離分だけ移動した状態で前記放射線照射手段から放射線を照射して前記物理量算出手段で求められた前記直接線透過率および前記変化率として前記補正手段は補正することを特徴とする放射線撮像装置。
- 請求項1または請求項2に記載の放射線撮像装置において、前記物理量は、前記放射線画像を構成する各々の画素に割り当てられ、前記放射線検出手段で検出された放射線強度に応じた画素値であり、前記物理量算出手段は前記画素値を求め、前記移動手段による移動方向とは逆方向に前記放射線照射手段を前記所定距離に相当する画素分だけ移動させたと仮想したときにおける画素値を、前記移動手段で前記散乱放射線除去手段が所定距離に相当する画素分だけ移動した状態で前記放射線照射手段から放射線を照射して前記物理量算出手段で求められた前記画素値として前記補正手段は補正することを特徴とする放射線撮像装置。
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CN200980152222.2A CN102264301B (zh) | 2009-02-10 | 2009-02-10 | 放射线摄像装置 |
US13/144,374 US8848876B2 (en) | 2009-02-10 | 2009-02-10 | Radiographic apparatus |
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JP2013192777A (ja) * | 2012-03-21 | 2013-09-30 | Shimadzu Corp | 放射線撮影装置 |
WO2016103427A1 (ja) * | 2014-12-25 | 2016-06-30 | 株式会社島津製作所 | 放射線撮影装置 |
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US8848876B2 (en) | 2014-09-30 |
CN102264301B (zh) | 2013-06-26 |
JP5152346B2 (ja) | 2013-02-27 |
US20110274252A1 (en) | 2011-11-10 |
CN102264301A (zh) | 2011-11-30 |
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