WO2009041393A1 - 検査装置 - Google Patents

検査装置 Download PDF

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Publication number
WO2009041393A1
WO2009041393A1 PCT/JP2008/067110 JP2008067110W WO2009041393A1 WO 2009041393 A1 WO2009041393 A1 WO 2009041393A1 JP 2008067110 W JP2008067110 W JP 2008067110W WO 2009041393 A1 WO2009041393 A1 WO 2009041393A1
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WIPO (PCT)
Prior art keywords
ray
unit
weight
multibag
article
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Application number
PCT/JP2008/067110
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English (en)
French (fr)
Inventor
Takashi Kabumoto
Osamu Hirose
Original Assignee
Ishida Co., Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ishida Co., Ltd. filed Critical Ishida Co., Ltd.
Priority to CN2008801076848A priority Critical patent/CN101802595B/zh
Priority to JP2009534321A priority patent/JP5789083B2/ja
Priority to EP08834624.2A priority patent/EP2194374B1/en
Priority to US12/676,344 priority patent/US8483475B2/en
Publication of WO2009041393A1 publication Critical patent/WO2009041393A1/ja

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/645—Specific applications or type of materials quality control

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Toxicology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

　Ｘ線検査装置（１０）は、Ｘ線照射器（１３）と、Ｘ線ラインセンサ（１４）と、画像生成部（２１ａ）と、領域特定部（２１ｂ）と、重量推定部（２１ｃ）と、重量診断部（２１ｄ）とを備え、複数の袋（Ｎ１，Ｎ２，・・・，Ｎ６）が連なった連包品（Ｍ）を検査する。Ｘ線照射器（１３）は、連包品（Ｍ）にＸ線を照射する。Ｘ線ラインセンサ（１４）は、Ｘ線照射器（１３）からのＸ線を受光する。画像生成部（２１ａ）は、Ｘ線ラインセンサ（１４）が受光したＸ線に基づいてＸ線画像（Ｐ）を生成する。領域特定部（２１ｂ）は、Ｘ線画像（Ｐ）から個包装領域（Ｃ１，Ｃ２，・・・，Ｃ６）を特定する。重量推定部（２１ｃ）は、個包装領域（Ｃ１，Ｃ２，・・・，Ｃ６）に対して重量値を推定する。重量診断部（２１ｄ）は、重量値のいずれかが所定範囲外となる場合、連包品（Ｍ）を重量異常と診断する。
PCT/JP2008/067110 2007-09-26 2008-09-22 検査装置 WO2009041393A1 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
CN2008801076848A CN101802595B (zh) 2007-09-26 2008-09-22 检查装置
JP2009534321A JP5789083B2 (ja) 2007-09-26 2008-09-22 検査装置
EP08834624.2A EP2194374B1 (en) 2007-09-26 2008-09-22 Examination apparatus
US12/676,344 US8483475B2 (en) 2007-09-26 2008-09-22 Inspection apparatus

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2007-249899 2007-09-26
JP2007-249905 2007-09-26
JP2007249899 2007-09-26
JP2007249905 2007-09-26

Publications (1)

Publication Number Publication Date
WO2009041393A1 true WO2009041393A1 (ja) 2009-04-02

Family

ID=40511278

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/067110 WO2009041393A1 (ja) 2007-09-26 2008-09-22 検査装置

Country Status (5)

Country Link
US (1) US8483475B2 (ja)
EP (1) EP2194374B1 (ja)
JP (1) JP5789083B2 (ja)
CN (1) CN101802595B (ja)
WO (1) WO2009041393A1 (ja)

Cited By (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009085876A (ja) * 2007-10-02 2009-04-23 Anritsu Sanki System Co Ltd Ｘ線質量測定装置
JP2011017694A (ja) * 2009-06-08 2011-01-27 Ishida Co Ltd Ｘ線検査装置
JP2011196809A (ja) * 2010-03-19 2011-10-06 Ishida Co Ltd Ｘ線検査装置
JP2012052981A (ja) * 2010-09-03 2012-03-15 Anritsu Sanki System Co Ltd 計量装置
JP2013019688A (ja) * 2011-07-07 2013-01-31 Anritsu Sanki System Co Ltd Ｘ線質量測定装置
JP2013152127A (ja) * 2012-01-25 2013-08-08 Ishida Co Ltd 密度算出装置
WO2014087862A1 (ja) * 2012-12-07 2014-06-12 株式会社イシダ Ｘ線検査装置
JP2014157122A (ja) * 2013-02-18 2014-08-28 Ishida Co Ltd Ｘ線検査装置
JP2015083967A (ja) * 2013-09-20 2015-04-30 株式会社イシダ 検査装置
JP2015087371A (ja) * 2013-09-26 2015-05-07 株式会社イシダ Ｘ線検査装置
WO2015083505A1 (ja) * 2013-12-03 2015-06-11 株式会社イシダ 近赤外線検査装置
JP2015137858A (ja) * 2014-01-20 2015-07-30 株式会社イシダ 検査装置
JP2016175162A (ja) * 2015-03-20 2016-10-06 セイコーエプソン株式会社 ロボット、制御装置、及び制御方法
KR20170008253A (ko) * 2014-05-08 2017-01-23 비포텍 비게- 운트 포지티오니어시스템 게엠베하 하나의 제조 영역 안에 있는 제품의 순 중량을 결정하기 위한 방법
JP2018020247A (ja) * 2012-10-03 2018-02-08 株式会社湯山製作所 薬剤鑑査システム、巻取装置、操出装置、及びホルダー
JP2018059845A (ja) * 2016-10-06 2018-04-12 アンリツインフィビス株式会社 Ｘ線検査装置及びｘ線検査方法
JP2021152489A (ja) * 2020-03-24 2021-09-30 株式会社 システムスクエア 教師データ生成装置、検査装置及びプログラム
WO2022271025A1 (en) * 2021-06-22 2022-12-29 Vmi Holland B.V. Method and packaging device for packaging discrete medicaments in pouches
JP7412794B2 (ja) 2022-04-13 2024-01-15 公立大学法人大阪 蛍光ｘ線分析装置

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DE102013211526A1 (de) * 2013-06-19 2014-12-24 Robert Bosch Gmbh Vorrichtung und Verfahren zur Gewichtsbestimmung insbesondere eines mit Produkt befüllten Behältnisses
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JP6225002B2 (ja) * 2013-11-27 2017-11-01 株式会社イシダ 検査装置
JP6318037B2 (ja) * 2014-07-23 2018-04-25 シブヤパッケージングシステム株式会社 包装袋の検査方法および包装袋の検査装置
JP6397690B2 (ja) * 2014-08-11 2018-09-26 株式会社日立ハイテクノロジーズ Ｘ線透過検査装置及び異物検出方法
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JP6717784B2 (ja) * 2017-06-30 2020-07-08 アンリツインフィビス株式会社 物品検査装置およびその校正方法
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CN109031450B (zh) * 2018-08-13 2020-09-01 青岛鼎喜冷食有限公司 一种食品加工检测***
CN109990744B (zh) * 2019-04-08 2020-09-11 同方威视技术股份有限公司 体积测量方法、装置、***和计算机可读存储介质
JP6763064B1 (ja) * 2019-06-11 2020-09-30 Ckd株式会社 検査装置及び包装体製造装置
JP6752941B1 (ja) * 2019-06-17 2020-09-09 Ckd株式会社 検査装置、包装体製造装置及び包装体製造方法
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Cited By (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009085876A (ja) * 2007-10-02 2009-04-23 Anritsu Sanki System Co Ltd Ｘ線質量測定装置
JP2011017694A (ja) * 2009-06-08 2011-01-27 Ishida Co Ltd Ｘ線検査装置
JP2011196809A (ja) * 2010-03-19 2011-10-06 Ishida Co Ltd Ｘ線検査装置
JP2012052981A (ja) * 2010-09-03 2012-03-15 Anritsu Sanki System Co Ltd 計量装置
JP2013019688A (ja) * 2011-07-07 2013-01-31 Anritsu Sanki System Co Ltd Ｘ線質量測定装置
JP2013152127A (ja) * 2012-01-25 2013-08-08 Ishida Co Ltd 密度算出装置
JP2018020247A (ja) * 2012-10-03 2018-02-08 株式会社湯山製作所 薬剤鑑査システム、巻取装置、操出装置、及びホルダー
WO2014087862A1 (ja) * 2012-12-07 2014-06-12 株式会社イシダ Ｘ線検査装置
JP2014115138A (ja) * 2012-12-07 2014-06-26 Ishida Co Ltd Ｘ線検査装置
JP2014157122A (ja) * 2013-02-18 2014-08-28 Ishida Co Ltd Ｘ線検査装置
JP2015083967A (ja) * 2013-09-20 2015-04-30 株式会社イシダ 検査装置
JP2015087371A (ja) * 2013-09-26 2015-05-07 株式会社イシダ Ｘ線検査装置
WO2015083505A1 (ja) * 2013-12-03 2015-06-11 株式会社イシダ 近赤外線検査装置
JPWO2015083505A1 (ja) * 2013-12-03 2017-03-16 株式会社イシダ 近赤外線検査装置
JP2015137858A (ja) * 2014-01-20 2015-07-30 株式会社イシダ 検査装置
KR20170008253A (ko) * 2014-05-08 2017-01-23 비포텍 비게- 운트 포지티오니어시스템 게엠베하 하나의 제조 영역 안에 있는 제품의 순 중량을 결정하기 위한 방법
JP2017519198A (ja) * 2014-05-08 2017-07-13 ヴィポテック ヴィーゲ−ウント ポジティオニエルシステーメ ゲーエムベーハーＷｉｐｏｔｅｃ Ｗｉｅｇｅ−Ｕｎｄ Ｐｏｓｉｔｉｏｎｉｅｒ−Ｓｙｓｔｅｍｅ Ｇｍｂｈ 個々の製品領域の中の製品の正味重量を測定する方法
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US10365148B2 (en) 2014-05-08 2019-07-30 Wipotec-Wiege- und Positioniersysteme GmbH Method for ascertaining the net weight of a product in a single product range
JP2016175162A (ja) * 2015-03-20 2016-10-06 セイコーエプソン株式会社 ロボット、制御装置、及び制御方法
JP2018059845A (ja) * 2016-10-06 2018-04-12 アンリツインフィビス株式会社 Ｘ線検査装置及びｘ線検査方法
JP2021152489A (ja) * 2020-03-24 2021-09-30 株式会社 システムスクエア 教師データ生成装置、検査装置及びプログラム
WO2022271025A1 (en) * 2021-06-22 2022-12-29 Vmi Holland B.V. Method and packaging device for packaging discrete medicaments in pouches
JP7412794B2 (ja) 2022-04-13 2024-01-15 公立大学法人大阪 蛍光ｘ線分析装置

Also Published As

Publication number Publication date
EP2194374B1 (en) 2016-01-13
CN101802595B (zh) 2013-09-04
EP2194374A4 (en) 2012-03-21
EP2194374A1 (en) 2010-06-09
CN101802595A (zh) 2010-08-11
US20100202694A1 (en) 2010-08-12
JP5789083B2 (ja) 2015-10-07
US8483475B2 (en) 2013-07-09
JPWO2009041393A1 (ja) 2011-01-27

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