WO2008120547A1 - コンタクタ及びコンタクタの製造方法 - Google Patents
コンタクタ及びコンタクタの製造方法 Download PDFInfo
- Publication number
- WO2008120547A1 WO2008120547A1 PCT/JP2008/054526 JP2008054526W WO2008120547A1 WO 2008120547 A1 WO2008120547 A1 WO 2008120547A1 JP 2008054526 W JP2008054526 W JP 2008054526W WO 2008120547 A1 WO2008120547 A1 WO 2008120547A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- contactor
- layer
- manufacturing
- base part
- sio2
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06755—Material aspects
- G01R1/06761—Material aspects related to layers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
- G01R1/06727—Cantilever beams
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49204—Contact or terminal manufacturing
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US12/532,928 US8441271B2 (en) | 2007-04-03 | 2008-03-12 | Contactor and method of production of contactor |
JP2009507444A JPWO2008120547A1 (ja) | 2007-04-03 | 2008-03-12 | コンタクタ及びコンタクタの製造方法 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007097396 | 2007-04-03 | ||
JP2007-097396 | 2007-04-03 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2008120547A1 true WO2008120547A1 (ja) | 2008-10-09 |
Family
ID=39808131
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2008/054526 WO2008120547A1 (ja) | 2007-04-03 | 2008-03-12 | コンタクタ及びコンタクタの製造方法 |
Country Status (6)
Country | Link |
---|---|
US (1) | US8441271B2 (ja) |
JP (1) | JPWO2008120547A1 (ja) |
KR (1) | KR101092389B1 (ja) |
CN (1) | CN101652665A (ja) |
TW (1) | TW200902987A (ja) |
WO (1) | WO2008120547A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11385258B2 (en) | 2017-05-26 | 2022-07-12 | Tektronix, Inc. | Encapsulated component attachment technique using a UV-cure conductive adhesive |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4812512B2 (ja) * | 2006-05-19 | 2011-11-09 | オンセミコンダクター・トレーディング・リミテッド | 半導体装置の製造方法 |
DE102008052244A1 (de) * | 2008-10-18 | 2010-04-22 | Carl Freudenberg Kg | Flexible Leiterplatte |
KR101022873B1 (ko) * | 2009-09-14 | 2011-03-16 | 삼성전기주식회사 | 인쇄회로기판의 제조방법 |
US8525168B2 (en) * | 2011-07-11 | 2013-09-03 | International Business Machines Corporation | Integrated circuit (IC) test probe |
JP2014011373A (ja) * | 2012-07-02 | 2014-01-20 | Tokyo Electron Ltd | 半導体検査システム及びインターフェース部の結露防止方法 |
CN102879618A (zh) * | 2012-09-29 | 2013-01-16 | 郑礼朋 | 测试机构及其制作方法 |
US9041198B2 (en) * | 2013-10-22 | 2015-05-26 | Applied Materials, Inc. | Maskless hybrid laser scribing and plasma etching wafer dicing process |
JP6308910B2 (ja) * | 2013-11-13 | 2018-04-11 | 東京エレクトロン株式会社 | 基板洗浄方法、基板洗浄システムおよび記憶媒体 |
CN106526941A (zh) * | 2016-12-30 | 2017-03-22 | 惠科股份有限公司 | 显示面板加工工艺的改善方法、显示面板加工设备 |
US10739381B2 (en) * | 2017-05-26 | 2020-08-11 | Tektronix, Inc. | Component attachment technique using a UV-cure conductive adhesive |
CN110662972B (zh) * | 2017-07-21 | 2021-12-14 | 吉佳蓝科技股份有限公司 | 探针卡用薄膜电阻器 |
CN110824207B (zh) * | 2018-08-08 | 2022-03-22 | 台湾中华精测科技股份有限公司 | 射频探针卡装置及其间距转换板 |
CN113109603A (zh) * | 2020-01-13 | 2021-07-13 | 科磊股份有限公司 | 具有多个金属涂层的悬臂式探针 |
US11882659B2 (en) * | 2020-10-22 | 2024-01-23 | Raytheon Company | Chip substrate for reducing thermal load on a chip assembly mounted thereon |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07321169A (ja) * | 1994-03-31 | 1995-12-08 | Nitto Denko Corp | プローブ構造 |
JP2000180471A (ja) * | 1998-12-11 | 2000-06-30 | Hitachi Cable Ltd | ベアチップ検査用プローブ基板 |
JP2001091539A (ja) * | 1999-08-03 | 2001-04-06 | Advantest Corp | マイクロファブリケーションで形成するコンタクトストラクチャ |
JP2003222638A (ja) * | 2002-01-30 | 2003-08-08 | Mitsubishi Materials Corp | コンタクトプローブおよびその製造方法 |
JP2004205511A (ja) * | 2002-12-20 | 2004-07-22 | Rosemount Aerospace Inc | プローブフィンガ構造体及びその製造方法 |
WO2007000799A1 (ja) * | 2005-06-27 | 2007-01-04 | Advantest Corporation | コンタクタ、該コンタクタを備えたコンタクトストラクチャ、プローブカード、試験装置、コンタクトストラクチャ製造方法、及び、コンタクトストラクチャ製造装置 |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR970707444A (ko) | 1994-10-28 | 1997-12-01 | 야마모토 히데키 | 프로브 구조(probe structure) |
EP1351060B1 (en) * | 1997-07-24 | 2005-10-26 | Mitsubishi Denki Kabushiki Kaisha | Method of manufacturing a test probe for semiconductor devices |
JP3420706B2 (ja) * | 1998-09-22 | 2003-06-30 | 株式会社東芝 | 半導体装置、半導体装置の製造方法、回路基板、回路基板の製造方法 |
US6420884B1 (en) * | 1999-01-29 | 2002-07-16 | Advantest Corp. | Contact structure formed by photolithography process |
US6436802B1 (en) | 1998-11-30 | 2002-08-20 | Adoamtest Corp. | Method of producing contact structure |
US6535003B2 (en) | 1999-01-29 | 2003-03-18 | Advantest, Corp. | Contact structure having silicon finger contactor |
US6232669B1 (en) | 1999-10-12 | 2001-05-15 | Advantest Corp. | Contact structure having silicon finger contactors and total stack-up structure using same |
TW508440B (en) * | 1999-12-27 | 2002-11-01 | Hoya Co Ltd | Probe structure and manufacturing method thereof |
JP4881316B2 (ja) | 2005-11-09 | 2012-02-22 | 株式会社アドバンテスト | 電子部品試験装置、及び、電子部品試験装置のコンタクトアームの最適押付条件設定方法 |
DE112006000019T5 (de) | 2006-02-13 | 2008-07-24 | Advantest Corp. | Kontaktstößel, Kontaktarm und Prüfgerät für elektronische Bauelemente |
US20100126289A1 (en) | 2007-04-03 | 2010-05-27 | Advantest Corporation | Method of mounting contactor |
WO2009013809A1 (ja) | 2007-07-24 | 2009-01-29 | Advantest Corporation | コンタクタ、プローブカード及びコンタクタの実装方法。 |
-
2008
- 2008-03-12 KR KR1020097022300A patent/KR101092389B1/ko not_active IP Right Cessation
- 2008-03-12 WO PCT/JP2008/054526 patent/WO2008120547A1/ja active Application Filing
- 2008-03-12 US US12/532,928 patent/US8441271B2/en not_active Expired - Fee Related
- 2008-03-12 CN CN200880010281A patent/CN101652665A/zh active Pending
- 2008-03-12 JP JP2009507444A patent/JPWO2008120547A1/ja active Pending
- 2008-03-18 TW TW097109445A patent/TW200902987A/zh unknown
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07321169A (ja) * | 1994-03-31 | 1995-12-08 | Nitto Denko Corp | プローブ構造 |
JP2000180471A (ja) * | 1998-12-11 | 2000-06-30 | Hitachi Cable Ltd | ベアチップ検査用プローブ基板 |
JP2001091539A (ja) * | 1999-08-03 | 2001-04-06 | Advantest Corp | マイクロファブリケーションで形成するコンタクトストラクチャ |
JP2003222638A (ja) * | 2002-01-30 | 2003-08-08 | Mitsubishi Materials Corp | コンタクトプローブおよびその製造方法 |
JP2004205511A (ja) * | 2002-12-20 | 2004-07-22 | Rosemount Aerospace Inc | プローブフィンガ構造体及びその製造方法 |
WO2007000799A1 (ja) * | 2005-06-27 | 2007-01-04 | Advantest Corporation | コンタクタ、該コンタクタを備えたコンタクトストラクチャ、プローブカード、試験装置、コンタクトストラクチャ製造方法、及び、コンタクトストラクチャ製造装置 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11385258B2 (en) | 2017-05-26 | 2022-07-12 | Tektronix, Inc. | Encapsulated component attachment technique using a UV-cure conductive adhesive |
Also Published As
Publication number | Publication date |
---|---|
JPWO2008120547A1 (ja) | 2010-07-15 |
US8441271B2 (en) | 2013-05-14 |
TW200902987A (en) | 2009-01-16 |
US20100102838A1 (en) | 2010-04-29 |
KR101092389B1 (ko) | 2011-12-09 |
KR20090130237A (ko) | 2009-12-21 |
CN101652665A (zh) | 2010-02-17 |
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