WO2006071861A3 - Multi-pixel electron microbeam irradiator systems and methods for selectively irradiating predetermined locations - Google Patents

Multi-pixel electron microbeam irradiator systems and methods for selectively irradiating predetermined locations Download PDF

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Publication number
WO2006071861A3
WO2006071861A3 PCT/US2005/047066 US2005047066W WO2006071861A3 WO 2006071861 A3 WO2006071861 A3 WO 2006071861A3 US 2005047066 W US2005047066 W US 2005047066W WO 2006071861 A3 WO2006071861 A3 WO 2006071861A3
Authority
WO
WIPO (PCT)
Prior art keywords
electron
microbeam
irradiator
pixel
selectively irradiating
Prior art date
Application number
PCT/US2005/047066
Other languages
French (fr)
Other versions
WO2006071861A2 (en
Inventor
Sha X Chang
Otto Z Zhou
Original Assignee
Univ North Carolina
Sha X Chang
Otto Z Zhou
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Univ North Carolina, Sha X Chang, Otto Z Zhou filed Critical Univ North Carolina
Publication of WO2006071861A2 publication Critical patent/WO2006071861A2/en
Publication of WO2006071861A3 publication Critical patent/WO2006071861A3/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material

Abstract

Multi-pixel electron microbeam irradiator systems and methods are provided with particular applicability for selectively irradiating predetermined cells or cell locations. A multi-pixel electron microbeam irradiator system can include a plurality of individually addressable electron field emitters sealed in a vacuum. The multi-pixel electron microbeam irradiator system can include an anode comprising one or more electron permeable portions corresponding to the plurality of electron field emitters. Further, the multi-pixel electron microbeam irradiator system can include a controller operable to individually control electron extraction from each of the electron field emitters for selectively irradiating predetermined locations such as cells or cell locations.
PCT/US2005/047066 2004-12-29 2005-12-28 Multi-pixel electron microbeam irradiator systems and methods for selectively irradiating predetermined locations WO2006071861A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US63995804P 2004-12-29 2004-12-29
US60/639,958 2004-12-29

Publications (2)

Publication Number Publication Date
WO2006071861A2 WO2006071861A2 (en) 2006-07-06
WO2006071861A3 true WO2006071861A3 (en) 2006-12-21

Family

ID=36615476

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2005/047066 WO2006071861A2 (en) 2004-12-29 2005-12-28 Multi-pixel electron microbeam irradiator systems and methods for selectively irradiating predetermined locations

Country Status (1)

Country Link
WO (1) WO2006071861A2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102007010463B4 (en) * 2007-03-01 2010-08-26 Sellmair, Josef, Dr. Device for field emission of particles
DE102007010297A1 (en) * 2007-03-02 2008-09-04 Gesellschaft für Schwerionenforschung mbH Field emission source i.e. field emission cathode, for use in electron beam system, has nanowires provided on substrate, and field emission structure automatically transferring emission during failure of field emission structure

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6535396B1 (en) * 2000-04-28 2003-03-18 Delphi Technologies, Inc. Combination circuit board and segmented conductive bus substrate

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6535396B1 (en) * 2000-04-28 2003-03-18 Delphi Technologies, Inc. Combination circuit board and segmented conductive bus substrate

Also Published As

Publication number Publication date
WO2006071861A2 (en) 2006-07-06

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