WO2005104102A1 - 光学的情報記録用媒体の製造方法及び初期化装置 - Google Patents
光学的情報記録用媒体の製造方法及び初期化装置Info
- Publication number
- WO2005104102A1 WO2005104102A1 PCT/JP2005/007650 JP2005007650W WO2005104102A1 WO 2005104102 A1 WO2005104102 A1 WO 2005104102A1 JP 2005007650 W JP2005007650 W JP 2005007650W WO 2005104102 A1 WO2005104102 A1 WO 2005104102A1
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- Prior art keywords
- zone
- recording medium
- recording
- focused light
- initialization
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
- G11B7/24—Record carriers characterised by shape, structure or physical properties, or by the selection of the material
- G11B7/26—Apparatus or processes specially adapted for the manufacture of record carriers
- G11B7/268—Post-production operations, e.g. initialising phase-change recording layers, checking for defects
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/21—Circular sheet or circular blank
Definitions
- the present invention relates to a method for manufacturing a highly productive optical information recording medium and an initialization apparatus capable of high-speed initialization.
- a planar annular optical information recording medium having a rewritable phase-change type recording layer for example, a CD-RW or a rewritable DVD, and in this specification, an optical information recording medium is referred to as an optical information recording medium).
- an optical information recording medium Sometimes referred to simply as an optical disk, a disk, a phase-change disk, etc.).
- Such an optical information recording medium rewrites information by reversibly changing the phase of a recording layer between a crystalline state and an amorphous state.
- a method of recording information by setting the crystalline state of a recording layer to an unrecorded or erased state and forming an amorphous recording mark on the recording layer is generally used.
- the amorphous recording mark is erased by completely recrystallizing the amorphous mark.
- the upper limit of the erasable linear velocity, and furthermore, the upper limit of the rewritable recording linear velocity are determined by the length of time required for the amorphous recording mark to completely recrystallize. .
- a recording medium obtained by forming a recording layer in the present invention, a state in which the recording layer is formed on a substrate.
- This medium is referred to as a recording medium, and a medium that has undergone the initialization process described below is referred to as an optical information recording medium. It is usually necessary to perform the process. Specifically, since the recording layer after film formation is usually in an amorphous state, it is necessary to bring the recording layer into a crystalline state in the initialization step (this initialization is called initial crystallization). May be).
- the initial crystallization in order to surely crystallize the recording medium, the initial crystallization is performed so that the linear velocity at all radial positions of the recording medium is constant (Patent Document 1, 2). Specifically, a laser beam for initial crystallization is applied to the recording medium in a state where the recording medium is rotated (Constant Linear Velocity; CLV method) so that the linear velocity is constant at all radial positions. Then, the optical spot formed on the recording medium by the laser light is relatively moved in the radial direction of the recording medium, and the recording layer is crystallized.
- CLV method Constant Linear Velocity
- Patent Document 1 Japanese Patent Application Laid-Open No. 2001-236695
- Patent Document 2 Japanese Patent Application Laid-Open No. 2003-272172
- the above-mentioned conventional initialization crystallization method needs to rotate the innermost to outermost circumferences of the recording layer of the planar annular recording medium at a constant linear velocity (CLV method). For this reason, the linear velocity determined by the maximum number of revolutions at the innermost circumference of the initialization area was the maximum linear velocity under the initialization conditions of the device.
- the initial velocity at a higher linear velocity specifically, about 25 mZs or more
- the above-mentioned initial crystallization condition means that the optical information recording medium may be initialized at a linear velocity higher than the erasable linear velocity. If an attempt is made to obtain good recording characteristics using such initial crystallization conditions, an enormous burden may be imposed on the initialization apparatus. Because, in such a case, if an attempt is made to improve the linear velocity by using the conventional CLV method, the mechanical durability of the disk becomes insufficient, the size of the initialization device becomes large, and the cost of the initialization device is increased. This is because a problem such as rising occurs.
- a recording device eg, a drive for a CD-RW or DVD
- a recording device eg, a drive for a CD-RW or DVD
- P-CAV Partial Angular Velocity
- ZCLV Zerod CLV
- the outer periphery is rewritten at a higher linear velocity.
- the adoption of such a technique means a change in the recording (erasing) linear velocity at the radial position of the optical information recording medium.
- the optical information recording medium may be designed so that optimal recording characteristics can be obtained for different recording (erasing) linear velocities in the radial direction.
- the present inventors have proposed an initialization method in which the relative linear velocity between the initialization laser beam spot and the recording medium becomes higher toward the outer periphery, which cannot be achieved by the conventional initialization method with a constant linear velocity.
- the present inventors use the CAV method (Constant Angular Velocity) or the P-CAV method (Partial CAV method) in which the rotation speed is constant over the entire recording area, and use the CAV method (Partial CAV method) as the outer periphery of the recording medium.
- An initialization method for increasing the linear velocity was found.
- the present inventors have proposed a ZCLV method that divides a recording medium into a plurality of zones and keeps the rotation speed constant in the innermost peripheral portion of each zone, but keeps the linear velocity constant in each zone.
- ZCLV method we found an initialization method in which the linear velocity increases toward the outer periphery of the recording medium. Then, they found that by using these initialization methods, a load on the initialization device and complicated control became unnecessary.
- the gist of the present invention is a method for manufacturing an optical information recording medium having a phase-change type recording layer on a disk-shaped substrate, wherein a recording medium having the recording layer formed thereon is obtained.
- An initial crystallization step of initial crystallization of the recording layer by scanning a light spot formed by irradiating the recording layer with focused light in a circumferential direction of the recording medium.
- the scanning linear velocity at the time of scanning the light spot in the circumferential direction is increased toward the outer periphery of the recording medium, and the intensity of the focused light is increased as the scanning linear velocity increases.
- the present invention resides in a method for manufacturing an optical information recording medium characterized by initial crystallization of the entire crystallization region.
- Another aspect of the present invention is an initialization apparatus for initial crystallization of the recording layer of a recording medium having a phase-change recording layer on a disk-shaped substrate,
- a control unit that scans a light spot formed by irradiating a focused light onto the recording medium in a circumferential direction, wherein the control unit controls a linear velocity when the light spot is scanned in the circumferential direction on an outer peripheral portion of the recording medium.
- An initializing apparatus configured to increase the intensity of the focused light as the scanning linear velocity increases, thereby performing initial crystallization on the entire surface of the initial crystallization region.
- the present invention particularly relates to an optical information recording medium having a phase-change recording material for high-speed recording (for example, a CD-RW recording at a linear velocity of 24 times or more, a linear velocity of 6 to 8 times or more,
- a phase-change recording material for high-speed recording for example, a CD-RW recording at a linear velocity of 24 times or more, a linear velocity of 6 to 8 times or more
- an optical information recording medium having a good initial crystallization state can be obtained by an initial crystallization method different from the conventional one. That is, initial crystallization can be performed at a high linear velocity (for example, a linear velocity higher than the erasable linear velocity of the optical information recording medium, such as about 25 mZs or more). As a result, good recording characteristics can be obtained, and the medium performance can be improved. Furthermore, the initial The crystallization time can be greatly reduced, and the productivity of the optical information recording medium can be improved.
- FIG. 1 is a schematic diagram for explaining a light spot of laser light (converged light) used in an initialization process of a method for manufacturing an optical information recording medium according to an embodiment of the present invention. .
- FIGS. 2 (a) to 2 (e) show the scanning linear velocity of laser light (converged light) and the recording medium speed in an initialization step of a method for manufacturing an optical information recording medium according to an embodiment of the present invention. It is a schematic diagram which shows the relationship with a radial position.
- FIG. 3 (a) to (d) show initializing power and scanning linear velocity of laser light (focused light) in an initializing step of a method for manufacturing an optical information recording medium according to an embodiment of the present invention.
- FIG. 4 is a schematic diagram showing a relationship between a scanning linear velocity of laser light (focused light) and a radial position of a recording medium in an initialization step of a method for manufacturing an optical information recording medium according to an embodiment of the present invention. is there.
- FIG. 5 is a schematic diagram showing a recording medium that is initially crystallized in an initialization step of a method for manufacturing an optical information recording medium according to an embodiment of the present invention, wherein (a) is a perspective view thereof, FIG. 2B is a cross-sectional view of FIG.
- FIG. 6 is a conceptual diagram showing a relationship with a rotation speed R0 ⁇ J2ZJ10 in an initialization step of a method for manufacturing an optical information recording medium according to an embodiment of the present invention.
- FIGS. 7 (a) and 7 (b) are schematic diagrams showing examples of setting initialization laser intensity of each zone in an initialization step of a method for manufacturing an optical information recording medium according to an embodiment of the present invention. It is.
- FIG. 8 is an illustration of an initialization process for a method of manufacturing an optical information recording medium according to an embodiment of the present invention.
- FIGS. 1A and 1B are schematic diagrams showing a recording medium that is initially crystallized in the process, in which FIG. 1A is a perspective view thereof, and FIG. 1B is a cross-sectional view of FIG.
- FIG. 9 is a schematic cross-sectional view showing a recording medium that is initially crystallized in an initialization step of a method for manufacturing an optical information recording medium according to an embodiment of the present invention.
- FIG. 10 is a schematic cross-sectional view showing a recording medium that is initially crystallized in an initialization step of a method for manufacturing an optical information recording medium according to an embodiment of the present invention.
- FIG. 11 (a) and (b) are concepts for explaining a method for setting an initialization laser intensity in an initialization step of a method for manufacturing an optical information recording medium according to an embodiment of the present invention.
- FIG. 11 (a) and (b) are concepts for explaining a method for setting an initialization laser intensity in an initialization step of a method for manufacturing an optical information recording medium according to an embodiment of the present invention.
- FIGS. 12 (a) and (b) illustrate a relationship between a scanning linear velocity and a radial position of a recording medium in an initialization step of a method for manufacturing an optical information recording medium according to an embodiment of the present invention.
- FIG. 12 (a) and (b) illustrate a relationship between a scanning linear velocity and a radial position of a recording medium in an initialization step of a method for manufacturing an optical information recording medium according to an embodiment of the present invention.
- FIG. 13 is a schematic cross-sectional view showing a recording medium that is initially crystallized in an initialization step of a method for manufacturing an optical information recording medium according to an embodiment of the present invention.
- FIG. 14 is a conceptual diagram for explaining a method of setting an initialization laser intensity in an initialization step of a method for manufacturing an optical information recording medium according to an embodiment of the present invention.
- FIG. 15 is a conceptual diagram for describing a method of setting an initialization laser intensity in an initialization step of a method for manufacturing an optical information recording medium according to an embodiment of the present invention.
- FIG. 2 is a schematic diagram illustrating a configuration of an initialization device according to an embodiment.
- Fig. 17 is a diagram for describing an example of setting of the initialization laser intensity which is effective in one embodiment of the present invention.
- FIG. 18 is a diagram for explaining an example of setting the initialization laser intensity which is effective in one embodiment of the present invention.
- FIG. 19 is a diagram for explaining an example of setting the initialization laser intensity which is useful in one embodiment of the present invention.
- [20] A diagram for explaining an example of setting of an initialization laser intensity which is useful in one embodiment of the present invention. It is.
- FIG. 21 is a diagram for explaining an example of setting an initialization laser intensity which is effective in one embodiment of the present invention.
- FIG. 22 is a view for explaining an example of setting an initialization laser intensity which is effective in one embodiment of the present invention.
- FIG. 23 is a view for explaining an example of setting an initialization laser intensity which is effective in one embodiment of the present invention.
- FIG. 24 is a view for explaining an example of setting an initialization laser intensity which is effective in one embodiment of the present invention.
- FIG. 25 is a diagram for explaining an example of setting an initialization laser intensity which is effective in one embodiment of the present invention.
- FIG. 26 is a diagram showing the relationship between the initialization speed of the recording medium and the radial position of the recording medium, which is exerted by one embodiment of the present invention.
- FIG. 27 is a diagram showing optical recording characteristics at a radial position of an optical information recording medium according to an embodiment of the present invention.
- a first protective layer lower protective layer
- a recording layer phase-change recording layer
- a second protective layer upper protective layer
- a recording medium that records and reproduces signals by irradiating a laser beam through the substrate (after initialization, optical information recording of the substrate surface incident type) Used as an application medium).
- the optical information recording medium having a phase-change type recording layer a reflective layer, a second protective layer (lower protective layer), a recording layer ( A recording medium that has a layer structure having a phase change recording layer), a first protective layer (upper protective layer), and a protective coat layer in this order, and irradiates a laser beam through the upper protective layer to record and reproduce signals.
- a recording medium that has a layer structure having a phase change recording layer a first protective layer (upper protective layer), and a protective coat layer in this order, and irradiates a laser beam through the upper protective layer to record and reproduce signals.
- the film-surface incident type optical information recording medium After initialization, it is used as a film-surface incident type optical information recording medium.
- signal recording and reproduction are performed by irradiating a laser beam from the upper protective layer side without passing through the substrate. Therefore, the distance between the recording layer and the optical head can be reduced to several hundred microns or less.
- an objective lens having a numerical aperture of 0.7 or more the
- the layer configurations of the substrate surface incident type optical information recording medium and the film surface incident type optical information recording medium are merely examples. For example, even if the substrate-side incident type optical information recording medium and the film-side incident type optical information recording medium are shifted, an interface layer is provided between the protective layer and the reflective layer. be able to. In the film-surface incident type optical information recording medium, a base layer may be provided between the substrate and the reflective layer.
- a recording medium using a recording material for the recording layer and a crystallization speed V that enables a high data transfer rate.
- a resin such as polycarbonate, acrylic, or polyolefin, or glass can be used.
- polycarbonate resin smells CD-ROM, etc. It is the most preferred because it has the most widely used track record and is inexpensive.
- the thickness of the substrate is usually at least 0.1 mm, preferably at least 0.3 mm, while it is usually at most 20 mm, preferably at most 15 mm. Generally 0.6mn! ⁇ 1.2mm.
- Substrate Surface In the case of an incident type optical information recording medium, in some cases, the substrate needs to be transparent to laser light because it needs to transmit laser light. On the other hand, in the case of a film-surface incident type optical information recording medium, the substrate is not necessarily required to be transparent.
- the shape of the substrate is a disk shape.
- the “disk shape” refers to a rotatable shape, usually a flat disk shape, but is not limited to a flat disk shape.
- a flat elliptical shape or a flat rectangular shape may be used.
- the recording layer for example, a series of compounds such as GeSbTe, InSbTe, AgSbTe, and AglnSbTe is selected as a material that can be repeatedly recorded.
- Sb Te a series of compounds such as GeSbTe, InSbTe, AgSbTe, and AglnSbTe is selected as a material that can be repeatedly recorded.
- Sb Te a series of compounds such as GeSbTe, InSbTe, AgSbTe, and AglnSbTe
- Composition mainly composed of a pseudo binary alloy of 23 and GeTe, more specifically, ⁇ (Sb Te) (GeTe) ⁇
- the initialization method used in the present invention uses a material having a high crystallization rate as the recording layer. It is preferable to apply to the used recording medium. In order to increase the crystallization speed, it is more preferable to use a composition containing Sb as a main component for the recording layer. In the present invention, “having Sb as a main component” means that the content of Sb is 50 atomic% or more in the entire recording layer.
- the reason for using Sb as a main component is that the amorphous mark of Sb can be crystallized at a very high speed, so that the amorphous mark can be crystallized in a short time. For this reason, it is easy to erase the recording marks in the amorphous state.
- the content of Sb is preferably at least 60 atomic%, more preferably at least 70 atomic%.
- the content of the above-mentioned additional element is usually at least 1 at%, preferably at least 5 at%, more preferably at least 10 at%, and usually at most 30 at%.
- the above-mentioned additional element that promotes the formation of an amorphous phase and improves the stability over time of the amorphous state also has the effect of increasing the crystallization temperature.
- additional elements include Ge, Te, In, Ga, Sn, Pb, Si ⁇ Ag, Cu, Au, rare earth elements, Ta, Nb, V, Hf, Zr, W, Mo, Cu, Cr, Co, nitrogen, oxygen, Se and the like can be used.
- Ge, Te, In, Ga, and Sn are preferable from the viewpoints of promoting the formation of an amorphous phase, improving the stability over time of the amorphous state, and increasing the crystallization temperature.
- At least one selected from the group. Particularly preferred is the use of Ge and Z or Te, or the use of at least one of In, Ga, and Sn.
- the material of the recording layer is used for high-speed crystallization, formation of an amorphous state, and improvement in the stability over time of the amorphous state. It is particularly preferable to use Sb, Ge and Z or Te in combination.
- Sb silicon dioxide
- Ge and Z or Te in combination.
- the content of Ge or Te in the recording layer be 1 atomic% or more and 30 atomic% or less. That is, it is preferable that Ge and Te are each independently contained in an amount of 1 atomic% to 30 atomic%.
- the main component of the recording layer is Sb, the content of Sb is 50 atomic% or more. Therefore, when Ge and Te are included in the recording layer together with Sb, the total amount of Ge and Te is less than 50 atomic%. Is less.
- the content of each of Ge and Te in the recording layer is more preferably 3 atomic% or more, and further preferably 5 atomic% or more. Within this range, the effect of stabilizing the amorphous mark will be sufficiently exhibited. On the other hand, the content of each of Ge and Te in the recording layer is more preferably 20 atomic% or less, and further preferably 15 atomic% or less. Within this range, it is possible to suppress the tendency that the amorphous phase becomes too stable and the crystallization is delayed. Further, when the above range is set, noise due to light scattering at the crystal grain boundaries can be suppressed.
- the composition containing Sb as a main component can be classified into two types according to the amount of Te contained in the recording layer.
- One is a composition containing 10 atomic% or more of Te, and the other is A composition containing less than 10 atomic% of Te (including the case where Te is not contained).
- the recording layer material contains Sb Te eutectic while containing approximately 10 atomic% or more of Te.
- the main component is an alloy containing Sb in excess of the composition.
- This recording layer material is hereinafter referred to as SbTe eutectic.
- SbZTe is preferably 3 or more, and more preferably 4 or more.
- composition containing Sb as a main component which can be classified according to the amount of Te contained in the recording layer, includes the following.
- the composition of the recording layer is such that Te is less than 10 atomic% while Ge is an essential component while Sb is the main component.
- Specific examples of the composition of the recording layer include a composition near Sb Ge
- This alloy is called the SbGe eutectic. ) Can be preferably mentioned.
- a composition in which the amount of Te-added kneading is less than 10 atomic% has properties as an SbGe eutectic system instead of an SbTe eutectic system. Even if the SbGe eutectic alloy has a high Ge content of about 10 atomic%, the crystal grain size in the polycrystalline state after the initial crystallization is relatively fine, so that the crystalline state becomes a single phase. The noise is low immediately. In SbGe eutectic alloys, Te is only added additionally and is not an essential element.
- the crystallization rate can be increased by relatively increasing the SbZGe ratio, and the amorphous mark can be recrystallized by recrystallization.
- the recording layer is made of a composition containing Sb as a main component
- the crystalline state is set to an unrecorded / erased state, and an amorphous mark is formed for recording, it is very important to improve the cooling efficiency. This is due to the following reason.
- the recording layer containing Sb as a main component such as the SbTe eutectic system or the SbGe eutectic system, is higher than the SbTe eutectic point or the vicinity of the SbGe eutectic point in order to support high-speed recording.
- the crystallization rate is increased by adding excessive Sb to increase the crystal growth rate instead of the crystal nucleation rate. Therefore, in these recording layers, it is preferable to increase the cooling rate of the recording layer to suppress the change of the amorphous mark due to recrystallization (the amorphous mark becomes smaller than a desired size). . Therefore, it is important to rapidly cool the recording layer in order to surely form an amorphous mark after melting the recording layer, and the cooling effect of the recording layer is important. Improving the rate is very important. Therefore, in the above recording layer composition, it is particularly preferable to use Ag or an Ag alloy having high heat dissipation for the reflective layer.
- the use of the initialization method of the present invention is significant for a recording medium having a recording layer in which it is necessary to increase the cooling efficiency during recording.
- composition containing Sb as a main component will be further described.
- M is Ge, Ag, In, Ga, Zn, Sn, Si ⁇ Cu, Au, Pd, Pt, Pb, Cr, Co, 0, S, Se, V, Nb, and Ta Preferred examples thereof include a composition of an SbTe eutectic containing at least one selected from alloys) as a main component.
- the composition is represented by the atomic ratio.
- x 0.6 means 60 atomic%.
- M is Ge, Ga, Ag or In alone or l 1
- X is usually 0.6 or more, preferably 0.7 or more, and l 1
- y is usually 0 or more, preferably 0.01 or more, more preferably 0.03 or more, while y is usually 0.3 or less, preferably 0.2 or less, more preferably 0.1 or less. It is. When x and y are within the above ranges, a recording layer capable of high-speed recording can be obtained.
- the This composition is based on the eutectic point composition of Sb Te.
- Ge amount is Ge (Sb Te
- the SbTe eutectic composition having a high Sb content if the Ge content is too large, GeTe or GeS Since the bTe-based intermetallic compound precipitates and the SbGe alloy can also precipitate, it is presumed that crystal grains having different optical constants coexist in the recording layer. The presence of the crystal grains may increase the noise of the recording layer and increase the jitter. Also, even if Ge is added too much, the effect of the stability over time of the amorphous mark saturates. For this reason, the content of Ge is usually 0.06 or less, preferably 0.05 or less, as the value of y in Ge (SbTe).
- the above GeSbTe eutectic composition further contains In, Ga, and Sn. That is, Ml Ge (Sb Te) (0.01 ⁇ z ⁇ 0.4, 0.01 ⁇ y ⁇ 0.0.06 z y x 1- ⁇ 1-y-z
- Ml represents at least one element selected from the group consisting of In, Ga, and Sn. It is particularly preferable to use the composition represented by the formula (1).
- Ml as at least one of a group of elements represented by In, Ga and Sn, the characteristics are further improved.
- the elements In, Ga, and Sn can increase the optical contrast between the crystalline state and the amorphous state, and also have the effect of reducing jitter.
- Z indicating the content of Ml is usually 0.01 or more, preferably 0.02 or more, more preferably 0.05 or more, and usually 0.15 or less, preferably 0.1 or less. Within this range, the effect of improving the characteristics described above will be exhibited well.
- Ge (InSn) TeSb another preferable composition range is Ge (InSn) TeSb.
- Sb content is Ge content, In w 1 w y z ⁇ - y-y-z
- X, y, z, and w which represent an atomic ratio that is higher than any of the content of Sn, the content of Sn, and the content of Te, satisfy the following (i) to (vi).
- overwriting can be performed favorably at a linear velocity of 20 mZs or more.
- the relationship between the content of each element and the characteristics in the above recording layer composition will be described in detail. Will be described.
- the Sb content is greater than any of the Ge content, In content, Sn content, or Te content. That is, the recording material of the present invention is mainly composed of Sb. Specifically, the Sb content is 35 atomic% or more, which is higher than any of the other contained elements. In order to sufficiently obtain the effects of the present invention, the Sb content is preferably at least 40 atomic%, more preferably at least 45 atomic%.
- the recording layer composition contains one of Sn and In.
- the reflectance and signal amplitude of the crystal can be increased by increasing the sum of the Sn content and the In content within a certain range than the Te content.
- Te content increases, the reflectivity of the crystal and the signal amplitude decrease. Therefore, it is important to control the relationship between the Sn and / or In content and the Te content in order to obtain the desired crystal state reflectance and signal amplitude.
- the value of (y ⁇ z) in the above general formula is set to 0.07 or more, preferably 0.1 or more.
- the value of (1 ⁇ w) Xy in the above general formula is set to 0.35 or less, and preferably 0.3 or less. Therefore, when a large amount of Te is contained, it is necessary to increase the sum of the In content and the Sn content from the viewpoint of controlling the signal amplitude.
- Sn since the amount of Sn cannot be increased so much in consideration of the jitter characteristics, when the content of Te is increased, it is preferable that Sn also contains Kamudium In. Specifically, if the content of Te is so high that the decrease in crystal reflectivity and the signal amplitude due to Te cannot be suppressed unless Sn is contained in excess of 35 atomic%, In should be included. Just fine.
- the value of wXy—z in the above general formula is preferably 0.1 or less.
- the value is more preferably 0.05 or less, and further preferably 0 or less.
- wXy—z 0 means that the In content and the Te content are the same. Therefore, in the present invention, it is more preferable that the In content is equal to the Te content or that the In content is less than the Te content.
- the recording layer composition contains Sn in addition to In. Specifically, if w X y z ⁇ 0.07, it is not possible to satisfy 0.07 ⁇ y-z unless Sn is contained in addition to In. It is also preferable to contain both In and Sn from the point that if the content of In and Te is increased without containing Sn, it becomes difficult to obtain a crystallization rate suitable for high-speed recording. That is, it is preferable that 0 ⁇ w ⁇ l.
- the In content that is, the value of wXy, is preferably 0.35 or less.
- Te is contained in the recording layer composition. Te can improve the durability of repeated recording. Therefore, it is preferable to increase the Te content to some extent. However, as described above, it is necessary to control the relationship between In and Z or Sn and Te, and the relationship between In and Te within a predetermined range.
- z indicating the content of Te in the above general formula is set to 0 ⁇ z, but is preferably 0.01 ⁇ z, more preferably 0.05 ⁇ z, and further preferably 0.08 ⁇ z Especially preferably, 0.1 l ⁇ z, and most preferably, 0.1 ⁇ .
- the z representing the Te content is usually a force that is less than 0.29. This is a value that is necessarily determined by the other relational expressions defined in the above general formula. As described above, it is preferable to increase the content of In and Te to some extent, but in particular, Te has a function of reducing the crystallization rate. Therefore, in order to obtain a crystallization speed suitable for high-speed recording, z representing the Te content is preferably 0.25 or less, more preferably 0.20 or less.
- Ge can be used to adjust the crystallization rate. That is, Ge is not significantly related to characteristics such as reflectance, signal amplitude (reflectance difference between crystal and amorphous), and decrease in reflectance due to long-term storage of the medium. For this reason, Ge can be used to obtain a crystallization rate suitable for the recording conditions to be used. Since the crystallization speed decreases as the Ge content increases, for example, in an optical information recording medium for high-speed recording, the Ge content can be reduced and the crystallization speed can be adjusted. However, the crystallization rate is also related to the content of other elements, and the crystallization rate increases as Sn increases, and decreases as In and Te increase.
- X in the above general formula is set to 0.3 or less, preferably 0.25 or less, and more preferably 0.2 or less. The effect of the content on the crystallization rate is particularly large for Ge and Te.
- the amorphous mark tends to crystallize more than immediately after recording before storage. If this phenomenon becomes remarkable, the optical information recording medium on which the When writing, the signal quality of the overwritten recording signal becomes insufficient. That is
- Te and In have the effect of slowing down the crystallization speed. Therefore, in order to obtain the same crystallization speed when the crystallization speed is slowed down, it is preferable that the contents of Te and In be larger. Ge content can be reduced.
- the Te content that is, the value of z is preferably 0.05 or more, more preferably 0.08 or more, and most preferably 0.1 or more.
- the In content ie, the value of wXy, is preferably 0.05 or more, more preferably 0.08 or more.
- the content of Te is large as described above, it is preferable to include both In and Sn. That is, the most preferable composition contains Ge, In, Sb, Sn, and Te.
- the value of X in the above general formula is preferably 0 or more.
- the force is preferably larger than 0, more preferably 0.01 or more, further preferably 0.02 or more.
- the elements that can be contained in addition to In, Ga, and Sn include nitrogen, oxygen, and sulfur. These elements have the effect of preventing bias in repeated overwriting and fine-tuning the optical properties. More preferably, the content of nitrogen, oxygen and sulfur is 5 atomic% or less based on the total amount of Sb, Te and Ge.
- the above GeSbTe eutectic composition contains Cu, Zr, Hf, V, Nb, Ta, Cr, or Co. It can also be done. These elements increase the crystallization temperature without lowering the crystal growth rate by using a very small amount of added syrup, and are effective in further improving the temporal stability. However, if the amount of these elements is too large, the segregation of a specific substance over time becomes likely to occur due to repeated overwriting, so the addition amount is preferably 5 atomic% or less, particularly preferably 3 atomic% or less. . When such a bias occurs, the stability of the amorphous layer initially possessed by the recording layer, the recrystallization rate, and the like change, and the overwrite characteristics may be degraded.
- the SbGe eutectic composition which is a composition containing Sb as a main component, includes a TeGeSb-based composition in which Te is added to the SbGe eutectic, and In, Ga, or SbGe eutectic.
- the composition include an InGeSb-based, GaGeSb-based, or SnGeSb-based ternary alloy to which Sn is added.
- a preferable composition of such an SbGe eutectic alloy is Te M2 (Ge Sb) (
- ⁇ indicating the content of In and Z or Ga is usually 0 or more, preferably 0.01 or more, and more preferably 0.05 or more.
- ⁇ is usually 0.3 or less, preferably 0.2 or less.
- ⁇ indicating the Sn content is usually 0 or more, preferably 0.01 or more, and more preferably 0.05 or more.
- the amount of Sn is too large, the amorphous force immediately after recording is low. May change to another amorphous phase.
- ⁇ is usually 0.3 or less, preferably 0.2 or less.
- the total content of these elements is usually at least 1 at%, preferably at least 5 at%, usually at most 40 at%, preferably at most 30 at%, more preferably at least 25 at%. The following is assumed.
- ⁇ indicating the content of Te is usually 0 or more, preferably 0.01 or more, particularly preferably 0.05 or more.
- ⁇ is usually set to be smaller than 0.1.
- ⁇ + ⁇ indicating the content of Te and the element M2 is usually set to a force larger than 0, preferably 0.01 or more, more preferably 0.05 or more.
- ⁇ + ⁇ is usually set to 0.4 or less, preferably 0.35 or less, more preferably 0.3 or less in order to exhibit the effect of using the GeSb-based eutectic alloy as a main component. .
- ⁇ ⁇ ⁇ ⁇ representing the atomic ratio of the element ⁇ 2 to Te be 2 or more. Since the optical contrast tends to decrease when Te is included, it is preferable to slightly increase the content of the element M2 (slightly increase ⁇ ) when Te is included.
- TeM2GeSb-based composition Elements that can be added to the above TeM2GeSb-based composition include Au, Ag, Pd, Pt, Si, Pb, Bi, Ta, Nb, V, Mo, rare earth elements, N, O, and the like. It is used for fine adjustment of optical characteristics and crystallization rate, etc., but its addition amount is about 10 atomic% at maximum.
- One of the most preferable compositions in the above is In Sn Te Ge Sb (0 ⁇ p ⁇ 0.
- the thickness of the recording layer is preferably 5 nm or more in order to obtain a sufficient optical contrast, increase the crystallization speed, and achieve recording / erasing in a short time. In order to sufficiently increase the reflectance, it is more preferably set to lOnm or more.
- the thickness of the recording layer is 100 nm or less, and more preferably 50 nm or less. This is to reduce the heat capacity and increase the recording sensitivity. Further, when the content is in the above range, the volume change accompanying the phase change can be reduced. Therefore, the influence of repeated volume changes due to repeated overwriting on the upper and lower protective layers can be reduced. Consequently, accumulation of irreversible microscopic deformation is suppressed, noise is reduced, and durability of repeated overwriting is improved.
- the thickness of the recording layer is more preferably 30 nm or less.
- the recording layer can be usually obtained by subjecting a predetermined alloy target to DC or RF sputtering in an inert gas, particularly an Ar gas.
- the density of the recording layer is usually at least 80%, preferably at least 90%, of the Balta density.
- the approximate value of the Balta density P is generally used according to the following equation (1), but it can also be measured by preparing a mass of alloy composition constituting the recording layer.
- a sputtering gas generally, a rare gas such as Ar.
- Ar a rare gas such as Ar.
- the case of r will be described as an example.
- High-energy Ar is usually caused by the fact that Ar ions, which are normally irradiated on the target for sputtering, partially bounce off and reach the substrate side, and Ar ions in the plasma are accelerated by the sheath voltage on the entire surface of the substrate.
- the irradiation effect of the rare gas of such high energy is called the atomic peening effect.
- Ar is mixed into the sputtered film due to the atomic peening effect.
- the atomic peening effect can be estimated from the amount of Ar in the film. In other words, if the amount of Ar is small, it means that the high-energy Ar irradiation effect is small, and a film having a low density is easily formed.
- a protective layer is usually formed on one or both sides, preferably both sides, of the recording layer.
- the material of the protective layer is determined in consideration of the refractive index, thermal conductivity, chemical stability, mechanical strength, adhesion, and the like.
- dielectric materials such as oxides, sulfides, nitrides, carbides, and fluorides such as Ca, Mg, and Li of metals and semiconductors having high transparency and high melting point can be used.
- these oxides, sulfides, nitrides, carbides, and fluorides are not necessarily required to have a stoichiometric composition. It is also effective to use it.
- a mixture of dielectrics is preferred. More specifically, a mixture of a chalcogenide compound such as ZnS or a rare earth compound and a heat-resistant compound such as an oxide compound, a nitride, a carbide, or a fluoride may be used.
- a mixture of materials is preferred and is an example of a protective layer composition.
- Examples of the material of the protective layer include a dielectric material.
- Examples of the dielectric material include acids such as Sc, Y, Ce, La, Ti, Zr, Hf, V, Nb, Ta, Zn, Al, Cr, In, SiGe, Sn, Sb, and Te. Tiger, Ti, Zr, Hf, V, Nb, Ta, Cr, Mo, W, Zn, B, Al, Ga, In, Si, Ge, Sn, Sb, Pb, etc., Ti, Zr , Hf, V, Nb, Ta, Cr, Mo, W, Zn, B, Al, Ga, In, Si and the like, or a mixture thereof.
- dielectric material examples include sulfides such as Zn, Y, Cd, Ga, In, Si, Ge, Sn, Pb, Sb, and Bi, and selenium. Or fluorides such as Mg, Ca, Li, or mixtures thereof.
- dielectric material examples include ZnS-SiO, SiN, SiO, TiO, CrN, and TaS.
- ZnS-SiO is
- rare earth sulfides such as La, Ce, Nd, and Y, composite dielectrics containing 50 mol% to 90 mol% of sulfated nitrides, and 70 mol% to 90 mol% of ZnS and TaS are contained. % Or less contained
- the film density of the protective layer be 80% or more of the Balta state from the viewpoint of mechanical strength.
- the theoretical density of the above general formula (1) is used as the bulk density.
- the thickness of the protective layer is generally generally generally lnm or more and 500nm or less.
- the thickness is lnm or more, the effect of preventing deformation of the substrate and the recording layer can be sufficiently ensured, and the layer can sufficiently serve as a protective layer.
- the thickness is 500 nm or less, while sufficiently functioning as a protective layer, the internal stress of the protective layer itself and the difference in elastic characteristics between the substrate and the substrate become remarkable, thereby preventing the occurrence of cracks. be able to.
- the thickness of the first protective layer is usually lnm or more because it is necessary to suppress substrate deformation due to heat. It is preferably at least 5 nm, more preferably at least lOnm, even more preferably at least 20 nm, particularly preferably at least 40 nm. By doing so, the accumulation of microscopic substrate deformation during repeated recording is suppressed, and the increase in noise due to scattering of the reproduction light is eliminated.
- the thickness of the first protective layer is usually 400 nm or less, preferably 300 nm or less, more preferably 200 nm or less, still more preferably 150 nm or less, and particularly preferably 100 nm or less, in view of the time required for film formation. .
- the groove shape of the substrate viewed from the recording layer plane does not change.
- the depth and width of the groove are The phenomenon of falling smaller than the shape occurs.
- the thickness of the second protective layer is usually 1 nm or more in order to suppress deformation of the recording layer. It is preferably at least 5 nm, more preferably at least 10 nm, even more preferably at least 15 nm.
- the thickness of the second protective layer is preferably 2 OO nm or less, more preferably 150 nm or less, more preferably 100 nm or less, further preferably 60 nm or less, particularly preferably 50 nm or less, and most preferably 30 nm or less.
- the thicknesses of the recording layer and the protective layer are determined by considering the interference effect associated with the multilayer structure in addition to the limitation of the mechanical strength and the reliability, and the recording signal having a high laser light absorption efficiency. Is selected so as to increase the amplitude (ie, to increase the contrast between the recorded state and the unrecorded state).
- the protective layer is usually formed by a sputtering method, but it is preferable that the total amount of impurities including the amount of impurities in the target itself and the amounts of moisture and oxygen mixed during film formation be less than 2 atomic%. For this reason, when forming the protective layer by sputtering, it is desirable that the ultimate vacuum of the process chamber is less than 1 ⁇ 10 ⁇ 3 Pa.
- a reflective layer can be further provided.
- the position where the reflective layer is provided usually depends on the incident direction of the reproduction light, and is provided on the opposite side of the recording layer with respect to the incident side. That is, when reproducing light is incident from the substrate side, it is usual to provide a reflective layer on the opposite side of the recording layer with respect to the substrate, and when reproducing light is incident from the recording layer side, the recording layer and the substrate are separated. It is usual to provide a reflective layer between them.
- the material used for the reflective layer is preferably a metal such as Au, Ag, or A1, from which a substance having a high reflectivity is preferable, and in particular, a heat radiation effect can be expected.
- the heat dissipation is determined by the film thickness and the thermal conductivity.
- the thermal conductivity of these metals is almost proportional to the volume resistivity, so the heat dissipation performance can be expressed by the area resistivity.
- the sheet resistivity is usually at least 0.05 ⁇ opening, preferably at least 0.1 ⁇ opening, and usually at most 0.6 ⁇ opening, preferably at most 0.5 ⁇ opening.
- a small amount of Ta, Ti, Cr, Mo, Mg, V, Nb, Zr, Si, etc. may be added to the above-mentioned metals in order to improve the thermal conductivity control and the corrosiveness of the reflective layer itself.
- the addition amount is usually 0.01 atomic% or more and 20 atomic% or less.
- the material of the reflective layer suitable for the present invention is as follows:
- A1 is a group consisting of Ta, Ti, Co, Cr, Si, Sc, Hf, Pd, Pt, Mg, Zr, Mo and Mn.
- the content of the above elements is usually at least 0.1 at%, preferably at least 0.2 at%, while it is usually at most 2 at%, preferably at most 1 at%.
- the A1 alloy if the amount of added impurities is too small, the hillock resistance depending on the film formation conditions is often insufficient. Also, if the amount of added impurities is too large, it is difficult to obtain a sufficient heat radiation effect! ,.
- an aluminum alloy As a specific example of an aluminum alloy, an aluminum alloy containing at least one of Ta and Ti at 15 atomic% or less has excellent corrosion resistance. For this reason, this A1 alloy is a particularly preferred reflective layer material for improving the reliability of the optical information recording medium.
- Preferred examples of the reflective layer material include pure Ag or Ti, V, Ta, Nb, W, Co, Cr, Si, Ge, Sn, Sc, Hf, Pd, Rh, Au, Pt, Mg, Zr,
- An Ag alloy containing at least one element selected from the group consisting of Mo, Cu—Zn, Mn, and rare earth elements can be given.
- Ti, Mg or Pd is preferred as an additive component.
- the content of the above elements is usually 0.01 atomic% or more, preferably 0.2 atomic% or more, while usually 10 atomic% or less, preferably 5 atomic% or less.
- Ag contains Mg, Ti, Au, Cu, Pd, Pt, Zn, Cr, Si, Ge, or a rare earth element!
- Ag alloys containing one or more of 0.01 atomic% or more and 10 atomic% or less are preferable because of their high reflectance and thermal conductivity and excellent heat resistance.
- the added element is 2 atomic% or less in order to increase the thermal conductivity of the reflective layer.
- a particularly preferable material for the reflective layer is one containing Ag as a main component, and the most preferable one is pure Ag.
- the reason why it is preferable to use Ag as the main component is as follows. is there. That is, when a recording mark that has been stored for a long time is recorded again, a phenomenon may occur in which the recrystallization speed of the phase change recording layer is increased only in the first recording immediately after storage. It is unclear why such a phenomenon occurs. Due to the increase in the recrystallization rate of the recording layer immediately after storage, the size of the amorphous mark formed in the first recording immediately after storage is a desired mark. It is speculated that it may be smaller than the size of.
- the recording layer is cooled at the first recording time immediately after storage by increasing the cooling rate of the recording layer by using Ag, which has extremely high heat dissipation, for the reflective layer.
- the size of the amorphous mark can be maintained at a desired size by suppressing recrystallization of the layer.
- the thickness of the reflective layer is usually 10 nm or more, but preferably 20 nm or more, more preferably 40 nm or more, in order to completely reflect incident light without transmitted light. More preferably, the thickness is 50 nm or more. If the thickness is too large, the heat radiation effect is not changed and the productivity is unnecessarily deteriorated, and cracks are easily generated.Therefore, the thickness of the reflective layer is usually 500 nm or less, but 400 nm or less.
- the force is preferably S, and more preferably 300 nm or less, more preferably 200 nm or less.
- the reflection layer is usually formed by a sputtering method ⁇ a vacuum evaporation method. It is preferable that the total amount of impurities in the reflective layer, including the amount of impurities in the target and the vapor deposition material itself and the amount of moisture and oxygen mixed during film formation, be less than 2 atomic%. For this reason, when forming the reflective layer by sputtering, it is desirable that the ultimate vacuum of the process chamber is less than 1 ⁇ 10 3 Pa.
- a film is formed at a degree of vacuum lower than 10 4 Pa, it is desirable to set the film formation rate to InmZ seconds or more, preferably lOnmZ seconds or more to prevent impurities from being taken in.
- the intentional additive element is contained in more than 1 atomic%, it is desirable to set the film formation rate to lOnmZ seconds or more to minimize the addition of additional impurities.
- At least one layer is preferably made of the above material having a thickness of 50% or more of the total reflection layer thickness.
- This layer substantially controls the heat radiation effect, and the other layers are configured so as to contribute to the improvement of corrosion resistance, adhesion to the protective layer, and hillock resistance.
- an interface layer containing no sulfur is usually provided in order to prevent corrosion due to the reaction of Ag with sulfur.
- the interface layer is preferably a metal that functions as a reflective layer. Examples of the material of the interface layer include Ta and Nb.
- each layer is formed by an in-line apparatus in which a target for a recording layer, a target for a protective layer, and a target for a material for a reflective layer, if necessary, are installed in the same vacuum chamber. It is desirable to prevent dungeon contamination. Also, productivity is excellent. (Protective coat layer)
- a protective coating layer made of UV-curable resin / thermosetting resin is provided to prevent direct contact with air and to prevent damage due to contact with foreign matter.
- the protective coating layer is usually 1 ⁇ m force and several hundreds / zm thick. Further, a dielectric protection layer having high hardness may be further provided, and a resin layer may be further provided thereon.
- the force described in the example of a single-layer structure such as CD-RW is not limited to this.
- Other structures for example, a double-layer structure or a multilayer structure having more layers
- the present invention can also be applied to a two-layer structure having a single-sided incidence type or a double-sided incidence type.
- a recording medium has a recording area in which data is actually recorded / reproduced, and the recording area is provided with irregularities for guiding a recording / reproducing light beam.
- the unevenness functions as a track.
- the force recording area extends from an inner radius of about 23 mm to an outer radius of about 58 mm.
- a thin film having the above-mentioned layer structure is formed on the entire recording area and an area slightly protruding outside the recording area (this may be referred to as a film formation area).
- the initialization is usually performed on the entire surface of the film formation region or the entire surface excluding the end thereof.
- initial crystallization area an initial crystallization area
- film formation area ⁇ initial crystallization area ⁇ recording area there is usually a relationship of film formation area ⁇ initial crystallization area ⁇ recording area.
- the recording layer is usually formed by a physical vapor deposition method in a vacuum such as a sputtering method. In the state immediately after film formation (as-deposited state), the recording layer is usually amorphous. For this reason, it is necessary to crystallize the recording layer to make it into an unrecorded and erased state. This step is referred to as an initialization step (or an initial crystallization step, an initial crystallization operation).
- a recording energy layer (particularly light energy) is locally irradiated for a very short time at a crystallization temperature (normally 150 to 300 ° C.) or more, and the recording layer is physically This is achieved by raising the temperature for a very short time so that it is not destroyed (hereinafter, this initialization method is sometimes referred to as “bulk erase”).
- melt initialization in which the temperature is increased to a temperature equal to or higher than the melting point of the recording layer in a short time is used in the initial crystallization operation.
- melt initialization in which the temperature is increased to a temperature equal to or higher than the melting point of the recording layer in a short time is used in the initial crystallization operation.
- the crystallization in the solid phase has a long time and the production efficiency is poor, and the temperature rise for a long time causes thermal damage to the film formation region. That is the reason, sometimes.
- the melt initialization if the crystallization speed is too slow, another crystal phase may be formed because there is enough time to achieve thermal equilibrium. Therefore, it is preferable to increase the cooling rate to some extent. Also, if the recording layer is kept in a molten state for a long time, the recording layer may flow, the thin film such as the protective layer may be peeled off by stress, or the resin substrate or the like may be deformed. What,
- the time for maintaining the temperature at or above the melting point is usually 10 s or less, and preferably 1 ⁇ s or less.
- a laser beam is preferable because a short pulse irradiation operation and a high energy density can be simultaneously obtained.
- Various laser light sources such as a semiconductor laser and a gas laser can be used.
- the power of the laser beam is usually from 100 mW to 10 W @ degree. It should be noted that if an equivalent power density and a focused light shape can be obtained, the use of another focusing light source will not work. Specific examples include Xe lamp light.
- the shape of the focused light condensed on the recording layer surface on the focusing surface is referred to as a spot, a light spot, a spot shape, or a light spot shape.
- the light spot shape of the converged light is particularly preferably an elliptical shape having a short axis substantially parallel to the scanning direction.
- a focused light that forms an elliptical light spot may be simply referred to as an elliptical beam.
- the length of the major axis is usually 10 to: LOOO m
- the length of the minor axis is usually 0.1 to 5 / ⁇ .
- the lengths of the major axis and the minor axis of the beam are defined as the half-width force when the light energy intensity distribution in the beam is measured.
- this beam shape should have a short-axis length of 5 m or less, more preferably 2 m or less, and more preferably 1.5 m or less.
- the short axis length is preferably at least 0.5, and more preferably at least 0.5 m in order to maintain a certain depth of focus.
- the short-axis direction of the elliptical beam is made substantially coincident with the circumferential direction, and the disk is rotated to rotate the short-axis.
- a polycrystalline structure oriented in a specific direction can be realized with respect to the light spot of the focused light for recording / reproduction scanned along the track in the circumferential direction.
- the movement in the radial direction may be performed continuously during one rotation.
- the movement in the radial direction may be performed once or at a constant scanning distance in the circumferential direction.
- Semiconductor lasers are usually of an end-surface emission type, and emit laser light in a super-elliptical shape.
- the light intensity distribution in the condensed light spot has a generally Gaussian distribution in the short axis direction and a trapezoidal distribution in the long axis direction.
- the laser light intensity of the light spot in the major axis direction usually has an unavoidable intensity distribution due to the properties of the semiconductor laser.
- the relationship between IPmax and IPmin is preferably (IPmax-IPimn) Z (IPmax + IPmin) ⁇ 0.2.
- (IPmax-IPimn) Z (IPmax + IPmin) is ideally zero.
- the moving distance of the light spot in the radial direction per rotation is preferably shorter than the long axis of the light spot and overlapped so that the same radius is irradiated with the laser light beam a plurality of times.
- the optical axis of the elliptical beam may be inclined by about 0 to 45 degrees with respect to the radial direction.
- the length projected on the recording medium in the radial direction of the major axis is defined as the length of the major axis (radial direction).
- the spot trajectory overlaps with the previous and next rounds.
- uninitialization due to gaps can be prevented, and reliable initialization can be performed.
- non-uniformity in the initialized state due to the energy distribution in the major axis direction typically 10 to 20%
- the movement amount of the light spot in the radial direction per rotation is too small, the same spot is repeatedly irradiated by the light spot several tens of times. In this case, the other undesirable crystal phase may be easily formed by force.
- the amount of movement of the light spot in the radial direction for each round is usually about 1Z2 of the long axis of the light spot or 1Z2 or more of the long axis of the light spot.
- the relative scanning linear velocity of the light spot to the recording medium refers to the linear velocity in the circumferential direction. Is different depending on the radial position of the recording area of the optical information recording medium.
- the scanning linear velocity when scanning the light spot in the circumferential direction is increased toward the outer periphery of the recording medium, and in the initial crystallization step, as the scanning linear velocity increases, the focused light Increase strength. Then, the entire surface of the initial crystallization region is initialized. In other words, as the light spot moves in the radial direction, the relative scanning linear velocity of the light spot in the circumferential direction with respect to the recording medium is increased toward the outer periphery of the recording medium.
- the phrase “increase in the outer periphery” means that a certain section may be substantially constant, but at least the innermost periphery of the area on the recording layer where the initial crystallization is performed and the area on the recording layer where the initial crystallization is performed. And the outermost Then, it means that the scanning linear velocity at the outer peripheral portion is increasing.
- the scanning linear velocity at the outermost periphery is preferably 20 m / s or more, more preferably 25 mZs or more.
- the scanning linear velocity is preferably 15 mZs or more, more preferably 20 mZs or more, more preferably 25 mZs or more over the entire area of the disk initialization area. In particular, at the outermost periphery, the scanning linear velocity is more preferably 25 mZs or more, preferably 20 mZs or more.
- the linear velocity was determined from the limit of the disk rotation speed (about 1 OOOOrpm).
- the line at the innermost circumference of the initial crystallization area was used.
- the speed is determined by the limit of the number of revolutions of the disk, the linear velocity at the outermost periphery of the initial crystallization region can be made higher.
- the upper limit of the linear velocity at the outermost periphery of the initial crystallization region is determined by the design of the recording medium (particularly, the composition of the recording layer).
- FIG. 2 shows a specific example showing the relationship between the radial position of the recording medium and the scanning linear velocity.
- Figure 2 (a) shows the CAV method
- Figures 2 (b) and (c) show the P-CAV method
- Figure 2 (d) shows the Z CLV method
- Figure 2 (e) shows the P- CAV method ZZCLV method Is shown.
- FIG. 2A shows a specific example of the CAV method, in which the rotational speed per unit time of the disc-shaped recording medium is constant at RO over the entire initialization area.
- FIG. 2 (b) shows a specific example of the P-CAV system.
- the scanning linear velocity increases in proportion to the radial position
- the rate of increase is This is different from the case where the number is constant.
- Such a P-CAV system is realized by, for example, a method as shown in an enlarged view of FIG. That is, the recording medium is divided into a plurality of areas in the radial direction. Then, in one area, the number of revolutions (scanning linear velocity) is reduced when moving to the next area located in the outer circumferential direction while keeping the number of revolutions substantially constant (see FIG. 2 (b) enlargement 1).
- Such a P-CAV system is realized, for example, by a method as shown in an enlarged view of FIG. That is, the recording medium is divided into a plurality of areas in the radial direction. Then, in one area, the scanning linear velocity is slightly lowered toward the outer periphery, and the scanning linear velocity is increased when moving to the next area located in the outer peripheral direction (see FIG. 2 (b) enlarged 2). .
- the P-CAV method in (b) Enlargement 2 in the same figure can be considered as a Z-CLV method.
- FIG. 2 (c) shows another specific example of the P-CAV method, in which the rotational speed is constant in the inner peripheral region.
- the CAV method is used, and the CLV method is constant at a certain scanning linear velocity in the outer peripheral area.
- FIG. 2D shows a specific example of the Z-CLV method.
- the Z-CLV method is realized by repeating the following operations. That is, the recording medium is divided into a plurality of areas in the radial direction, and the scanning linear velocity is made substantially constant in one area. Then, when moving to the next area located in the outer peripheral direction, the operation of increasing the scanning linear velocity and making the scanning linear velocity a constant value is repeated.
- FIG. 2 (e) is a special example, but is an example for more specifically explaining the effect that the scanning linear velocity becomes higher at the outer periphery. That is, it is permissible to slightly reduce the scanning linear velocity (for example, 2-3 mZs) within a predetermined range (for example, within a range of several mm) in the radial direction of the recording medium, as long as it does not contradict the spirit of the present invention. .
- the movement of the light spot in the radial direction of the recording medium is caused by moving the inner peripheral force of the region on the recording layer where the initial crystallization is performed toward the outer periphery in one direction, or on the recording layer where the initial crystallization is performed. It is preferable to move the region in one direction with a force from the outer periphery to the inner periphery in order to simplify mechanical control. However, slight backward movement of the movement of the light spot is naturally allowed. For example, in the case of FIG. 2 (c), the following method can be performed. In other words, after moving the CAV area in the inner periphery in one direction from the inner periphery to the outer periphery, return to the inner periphery again and perform the same operation.
- the outer CLV area is operated twice from the inner circumference to the outer circumference. Such a double (or multiple) operation is performed to make the crystal state after initialization more uniform. If such a light spot and a method of moving the light spot in the radial direction are determined, the initialization condition is determined by the circumferential scanning speed of the light spot and the power of the focused light.
- the intensity of the focused light is increased.
- the optimum intensity of the focused light (the intensity of the focused light is sometimes referred to as initialization power in this specification) Po is determined for the recording medium to be initialized.
- Po lower limit Pomin is the power required to raise the temperature of the recording layer to at least the crystallization temperature in order to crystallize the recording layer or to exceed the melting point in melt initialization.
- the upper limit Pomax of Po is a power that does not cause excessive heat damage to the recording medium!
- the PomaxZPomin is usually 1 or more and 1.5 or less, and preferably 1.2 or less.
- the optimum initialization power Po determined in this way is considered to be almost proportional to the scanning linear velocity.
- Po is specifically determined in the range of Pomin to Pomax in consideration of the recording characteristics of the optical recording medium after the initial crystallization.
- the recording characteristics of the optical information recording medium considered when determining Po include, for example, the following (1) to (3).
- Po is set so that the difference between the reflectance of the unrecorded state of the optical information recording medium after the initial crystallization and the reflectance of the erased portion after rewriting and recording several times is as small as possible. It is determined.
- the reflectivity is measured by the intensity of light that is reflected when the focused light for reproduction is irradiated onto the optical information recording medium and returns to the reproduction optical system. In actuality, the reflectivity is almost proportional to the magnitude of the voltage output of the photodetector. Also, it is preferable to determine Po so that the reflectance does not fluctuate locally due to uninitialization.
- Po is controlled so that the jitter value in the second recording (the second recording is an overwrite for the optical information recording medium on which recording was performed once) is within a predetermined range. It is determined.
- the jitter value is the temporal fluctuation of the detection timing of the mark position in the so-called mark position recording or the mark end position in the mark length (modulation) recording.
- the jitter value is usually represented by the standard deviation ⁇ of the temporal variation around the average value of the detection timing.
- the jitter value corresponds to the general concept described in the reference book “Optical Disc Technology” (Radio Engineering, Chapter 1, Section 1.7 Jitter). The measurement of the jitter value is performed according to the standard definition and method disclosed in the Orange Book, which is the CD, CD-R, and CD-RW standards, and the DVD, DVD-R, and DVD-RW standards.
- the scanning linear velocity and the intensity of the focused light be changed substantially continuously.
- AViZVia is preferably set to 0.1 or less.
- the uninitialized portion remains on the recording medium!
- the movement amount of the light spot in the radial direction is set to be less than the length of the major axis in the radial direction of the light spot.
- the trajectories of the light spots overlap on the order of several tens / zm to several hundred / zm. If the initialization condition changes greatly in such a small area of several tens to several hundreds of meters, the initialization state may differ greatly in the middle of the recording track, and the recording quality may differ in the middle of the track. Becomes larger.
- FIG. 3 conceptually shows the relationship between the scanning linear velocity and the initialization power.
- the route 2 ((b) in the figure) it is possible to keep Pi constant with respect to the change ⁇ Vi of Vi, and to use the route 3 ((c) in the diagram).
- Pi may be changed by ⁇ Pi according to AVi.
- Such a route falls within the band of ⁇ Pi
- the setting method (relationship) of the position of the light spot, the scanning linear velocity, and the initialization power in accordance with the movement of the light spot in the radial direction of the recording medium is determined.
- the scanning linear velocity at the radial position of the recording medium is determined by the P-CAV method as shown in Fig. 2 (c) [see Fig. 4 (a)], and as shown in Fig. 3 (b),
- the initialization power at the radial position of the recording medium is as shown in FIG. 4 (c).
- RO is not particularly limited as long as the number of rotations is such that the recording characteristics of the optical information recording medium obtained through the initialization step have predetermined performance.
- RO is preferably a maximum rotation speed Rmax set to satisfy the following conditions.
- (i) Prepare a plurality of recording media. Initialization is performed on one of the recording media by rotating the recording medium at an arbitrary number of revolutions at the innermost circumference of the recording area of the recording medium. In other words, a plurality of recording media are prepared, and one of the recording media is rotated at an arbitrary rotation speed to initially crystallize the recording layer formed on at least the innermost track of the recording area.
- the jitter value is evaluated on the innermost track of the recording area for the following reason. That is, usually, in the initialization of the CAV method, the scanning linear velocity at the innermost circumference of the recording area becomes the smallest, and it becomes difficult to perform good initial crystallization. For this reason, if the recording quality after initialization is sufficient in the innermost track, recording in a recording area located at an outer circumference (an area where initialization is performed at a higher scanning linear velocity) is performed. The quality is good.
- a specific example of the innermost track is the innermost track of the recording area in the area where the initial crystallization is performed, as shown in the section AA 'in Fig. 5 (a). it can.
- the section taken along the line AA ′ in FIG. 5B only the section of the substrate is shown to make the innermost track position easier to grasp.
- the reason for using the ratio CF2ZJ10) of the jitter area 2 after the second recording in the innermost track and the jitter bit 10 after the tenth recording as an evaluation index is as follows. That is, in a normal optical information recording medium, a phenomenon in which the jitter value increases after the second recording is observed. Then, the jitter value gradually decreases as the number of times of recording (overwriting) is further increased, and after recording is repeated about 10 times, a phenomenon is observed in which the jitter value drops to a constant value and stabilizes.
- the jitter value which increases after the second recording, is set to a predetermined range (specifically, the jitter value is not excessively increased with respect to the value when the jitter value decreases and becomes stable). If it can be controlled within such a range, it can be determined that good initialization has been performed.
- the rotational speed RO where J2ZJ10 usually satisfies 1.6 or less, preferably 1.3 or less, it is used for the initial crystallization step.
- the optimum rotational speed Rmax is selected. J2ZJ10 is ideally preferably 1.
- FIG. 6 shows a conceptual diagram of a change in J2ZJ10 obtained by changing the rotation speed RO.
- the range force of the RO where J2ZJ10 is 1.6 or less can also take Rmax arbitrarily.
- Rmax is such that RO at which J2ZJ10 is the minimum value.
- the recording medium is initialized by the ZCAV method
- a region from the innermost periphery of the initial crystallization region of the recording medium to the outermost periphery of the initial crystallization region [see FIG. 7 (b)] is recorded.
- the medium is divided into a plurality of zones along the radial direction of the medium, and the intensity of the focused light irradiated to each of the zones is constant.
- there is a method in which the intensity of the focused light is gradually increased toward the outermost zone (the intensity of the focused light is increased in the zone on the outer peripheral side of the recording medium). That is, since the scanning linear velocity gradually increases toward the outermost periphery, it is preferable to increase the intensity of the focused light to be irradiated to surely perform the initial crystallization of the recording layer.
- initialization is performed by changing the initialization laser intensity in each of the divided zones. Then, the relationship between the intensity of the initialization laser beam and the recording quality can be confirmed by measuring the jitter value and the reflectance value after the initialization. As a result, the optimum initialization laser intensity of each zone and the upper and lower limit values of the initialization laser intensity (allowable width for controlling the recording characteristics within a predetermined range) are obtained. Then, the initialization laser intensity in each zone is set from the optimum initialization laser intensity in each zone and the upper and lower limit values.
- FIG. 7A shows an example of setting the initialization laser intensity of each zone.
- the jitter value in each zone after the initial crystallization satisfies the following condition. U, which prefers to set the intensity of the focused light.
- J2inzcav, J2outzcav, J2midzcav and JlOmidzcav measured in (i) and (ii) above are J2inzcav / J1 Omidzcav ⁇ 1.D
- zones 1 to n shown in FIGS. 8A and 8B can be mentioned. Then, for example, predetermined recording is performed on one track near the outermost periphery, one track near the center, and one track near the innermost periphery of zone k, and the jitter value is measured (see FIG. 9).
- the following method can be cited as an example of how to determine the intensity of the focused light in the zone k. That is, a plurality of recording media are prepared, and the initial crystallization of each recording medium is performed by changing the focused light intensity under the rotation speed of Rmax. J2inzcav, J2outzcav, J2midzcav, and J2inzcav in zone k of the obtained plurality of optical information recording media
- jitter characteristics The values for which the above three formulas are also calculated may be referred to as jitter characteristics.
- the initial crystallization process for zone k is performed within the range of the intensity of the focused light as follows.
- the focused light in each zone is adjusted so that the reflectance value in each zone satisfies the following condition after the initial crystallization. It is also preferable to set the intensity.
- ReflOmidzcav and the reflectance value ReflOoutzcav of one track near the outermost circumference are measured.
- the reflectance value after one recording has a relatively close value in the whole of one zone, and the reflectance value after the one recording and the reflectance value after the ten recording are different. If the value becomes relatively close and takes a value throughout the zone! / ⁇ , it is understood that uniform initialization has been performed within that zone. If the above four equations are satisfied in each zone existing in the recording area, it is clear that uniform initialization is performed over the entire area of the recording area.
- An example of how to determine a zone includes zones 1 to n shown in FIGS. 8 (a) and 8 (b). For example, predetermined recording is performed on one track near the outermost circumference, one track near the center, and one track near the innermost circumference of the zone k, and the reflectance value is measured (see FIG. 9).
- the following method can be cited as an example of how to determine the intensity of the focused light in the zone k. That is, a plurality of recording media are prepared, and the initial crystallization of each recording medium is performed by changing the focused light intensity under the rotation speed of Rmax.
- zone k of the obtained plurality of optical information recording media Reflinzcav, Reflmidzcav, Refloutzcav, Refl Oinzcav, Refl Omidzcav, and ReflOoutzcav were measured, respectively.
- reflectance characteristics The values for which the above four formula forces are also calculated may be referred to as reflectance characteristics.
- reflectance characteristics From the measurements of 0 or more, the relationship between the intensity of the focused light (initialization power) and the reflectance characteristics in zone k is calculated. You can get a relationship. from this result,
- the initial crystallization process for zone k is performed within the range of the intensity of the focused light as follows.
- the initialization laser intensity it is preferable to increase the initialization laser intensity as it moves toward the outer zone.
- the increase in the laser intensity may be caused by the light spot being continuously changed in the outer peripheral direction with a directional force (for example, see FIG. 3 (a)).
- the increase in the laser intensity may take a constant value for each zone and gradually increase toward the outer zone (for example, FIG. 3 (b)).
- a method of continuously increasing the laser intensity in each zone while increasing the initial laser intensity by a predetermined amount between the zones may be used (for example, FIG. 3 (c)).
- the zone located on the inner peripheral side is defined as zone A
- the zone located on the outer peripheral side is defined as zone B.
- the initializing laser intensity in zone A be Pin
- the initializing laser intensity in zone B be Pout.
- the above-mentioned Pin and Pout and the minimum initial laser intensity PJmin and the maximum initial laser intensity PJmax measured by the following method are calculated.
- PJmin and PJmax are preferably set by the following method! /.
- J2zoneAout is the jitter value when recording is performed twice on one track near the outermost circumference in zone A on the optical information recording medium.
- the jitter value when recording 10 times on one track near the center in zone A is JlOzoneAmid, and twice on the track near the innermost circumference in zone B on the optical information recording medium.
- the jitter value at the time of recording is J2zoneBin,
- the minimum value of the laser intensity that satisfies the condition is PJmin, and the maximum value of the laser intensity is PJmax.
- FIG. 10 is a specific example of zones A, B, a track near the outermost circumference of zone A, a track near the center of zone A, and a track near the innermost circumference of zone B.
- the following methods can be given as specific methods for setting the above PJmin and PJmax.
- a plurality of recording media having the same layer configuration are prepared, and zones A and B in one of the recording media are initialized with the same initialization laser intensity, and the optical information recording media ⁇ J2zoneAout / jl0zoneAmid '', Find “J2zoneBin / jl0zoneAmid” respectively.
- the zones A and B are initialized at an initialization laser intensity different from that of the recording medium described above, and the optical information recording medium “J2zoneAoutZ” is initialized.
- the minimum value of the initializing laser intensity that makes both J2zoneAout / jl0zoneAmid and J2zoneBin / jl0zoneAmid 1.6 or less is PJmin
- the maximum value is PJmax
- Pin and Pout are Pin While maintaining the relationship of ⁇ Pout, it may be changed within the range of PJmin ⁇ : PJmax (see Fig. 11 (a)).
- zone A the zone located on the inner peripheral side
- zone B the zone located on the outer peripheral side
- the intensity of the initialized laser is Pin
- the intensity of the initialized laser in zone B is Pout.
- the above-mentioned Pin and the above-mentioned Pout and the minimum initializing laser intensity PRmin and the maximum initializing laser intensity PRmax measured by the following method are obtained.
- PRmin and PRmax are set so as to satisfy the following conditions.
- Ref Zone Aout is the reflectivity value when recording is performed once on one track near the outermost periphery of the zone A in the optical information recording medium, near the center of the zone A in the optical information recording medium. Reflectivity when recording once on one track of
- RefzoneAmid and the reflectance value when performing recording once on one track near the innermost circumference of the zone B in the optical information recording medium, as RefzoneBin,
- the minimum value of the laser intensity that satisfies the condition is PRmin, and the maximum value of the laser intensity is PRmax.
- the reflectance value after one recording becomes relatively close and takes a value in the boundary region between the two zones! /, So that the reflectance value between the two zones is almost the same. It can be determined that the same initialization has been performed.
- Figure 10 can be shown as specific examples of Zone A, Zone B, the track near the outermost circumference of Zone A, the track near the center of Zone A, and the track near the innermost circumference of Zone B.
- the following method can be given as a specific method of setting PRmin and PRmax. For example, a plurality of recording media having the same layer configuration are prepared, and zones A and B in one of the recording media are initialized with the same initializing laser intensity, and “I RefzoneAout— RefzoneBin
- zones A and B are initialized on another recording medium with an initialization laser intensity different from that of the previous recording medium, and “I RefzoneAout—RefzoneBin
- the initialization laser is usually elliptical, and the major axis is set to be parallel to the radial direction, and the major axis length covers a plurality of tracks. .
- the moving distance in the radial direction for each rotation of the laser is shorter than the length of the major axis of the laser so that the same portion of the recording medium is irradiated with the initialization laser more than once. I have.
- the track position of the recording medium and the position control of the initialization laser may not always be synchronized.
- the area near the boundary with Zone A in the outer zone B is initialized with the laser intensity of Zone A, or conversely, Zone B in the inner zone A.
- the area near the boundary with is initialized by the initial laser intensity in zone B.
- the boundary area between zones A and B may be initialized with the initialized laser intensity in both zones (see Fig. 10).
- a region from the innermost periphery of the initial crystallization region to the outermost periphery of the initial crystallization region on the recording medium [see FIG. 12 (b)] is divided into a plurality of zones. It is preferable to make the number of rotations at the innermost position in each zone constant.
- this initialization method for example, as shown in FIG. 12 (a), a plurality of zones are provided in the radial direction of the recording medium [in FIG. 12 (a), zone 1 to zone n].
- the rotational speed is set to be constant at zero.
- initial crystallization is performed so that the linear velocity is constant from the innermost circumference to the outermost circumference in each zone [see FIG. 12 (a)].
- an optical information recording medium that has been initially crystallized is used. It is preferable to set the laser beam intensity in each zone so that the jitter value in each zone meets the following conditions.
- initialization is performed at a constant linear velocity in each zone, so that there is an advantage that uniformity of initialization in the zones can be easily ensured. For this reason, in a track near the center of each zone, if the jitter value after two recordings is within the specified range with respect to the jitter value after ten recordings, it is within that zone! It can be considered that uniform initialization is performed. If the above expression is satisfied in each zone in the recording area, it is clear that uniform initialization is performed over the entire surface of the recording area.
- the intensity of laser light in each zone so that the reflectance value in each zone after the initial crystallization satisfies the following condition.
- the initialization laser intensity it is preferable to increase the initialization laser intensity as it moves toward the outer zone.
- the increase in the laser intensity may be caused by the light spot being continuously changed in the outer peripheral direction with a directional force (for example, see FIG. 3 (a)).
- the increase in the laser intensity may take a constant value for each zone and gradually increase toward the outer zone (for example, FIG. 3 (b)).
- a method of continuously increasing the laser intensity in each zone while increasing the initial laser intensity by a predetermined amount between the zones may be used (for example, FIG. 3 (c)).
- the laser intensity changes between the zones for example, in the case of FIG. 3B
- zone A the zone located on the inner peripheral side
- zone B the zone located on the outer peripheral side
- the initializing laser intensity in zone A be Pin
- the initializing laser intensity in zone B be Pout.
- the Pin and the Pout satisfy the following conditions. (Pin, Pout conditions to be satisfied)
- zone A is initially crystallized with an initialization laser intensity Pin
- zone B is initially crystallized with an initialization laser intensity Pout. Then, a jitter value J10zoneAPin after recording one track near the center of the zone A ten times and a jitter value JlOzoneBPout after recording one track near the center of the zone B ten times are measured.
- the zone A is initially crystallized with the initialization laser intensity Pout
- the zone B is initially crystallized with the initialization laser intensity Pin. Then, a jitter value J2zoneAPout after recording one track near the center of zone A twice and a jitter value J2zoneBPin after recording one track near the center of zone B twice are measured.
- JlOzoneBPout and J2zoneBPin measured in (ii) and (iii) above are examples of JlOzoneBPout and J2zoneBPin measured in (ii) and (iii) above.
- the region near the boundary with zone A in the outer zone B is initialized with the initialized laser intensity in zone A, or conversely, In some cases, the area near the boundary with Zone B in Zone A may be initialized with the initialization laser intensity in Zone B. Furthermore, depending on the timing at which the laser intensity is switched from Pin to Pout, the boundary region between zones A and B may be initialized with the initialized laser intensity of both zones.
- the jitter value after the second recording of Zone A and Zone B near the boundary between Zone A and Zone B (which tends to increase with respect to the first recording after initialization) is
- zone A is initialized only with the Pin
- the jitter value after recording twice in zone A (jitter value after recording twice in desired zone A) near the boundary between zone A and zone B
- P The value becomes larger than the jitter value after recording twice in zone B near the boundary between zone A and zone B when initialized only with out (the desired jitter value after recording twice in zone B).
- the jitter value after the tenth recording near the center of the zone A (the jitter value has decreased and is stable) is compared with the Pout.
- the zone B was initialized with the Pin for the jitter value after the tenth recording near the center of the zone B when the zone B was initialized with the Pout (the jitter value decreased and was stable).
- the jitter value after two recordings near the center of zone B should be within the specified range. In this way, it can be determined that substantially the same state has been initialized in both zones A and B.
- FIG. 13 is a specific example of a zone A, a zone B, a track near the center of zone A, and a track near the center of zone B.
- the following methods can be given as specific methods of setting the Pin and Pout.
- the range of the initializing laser intensity to be satisfied in each zone is obtained from the above “[E] Initial crystallization method in ZCLV system, method of determining initializing laser intensity in zone”. For this reason, desired initialization laser intensities Pin and Pout exist for zones A and B, respectively.
- the tentative (temporary) Pin for initializing zone A is Pin
- the tentative (temporary) Pout for initializing zone B is Pout '.
- a plurality of recording media having the same layer configuration as the above recording media are prepared. Then, after initializing zones A and B in each recording medium with the same initializing laser intensity (setting the initializing laser intensity in each recording medium to be different), the center of zones A and B is initialized. Measure the jitter value after recording twice (jitter value after recording twice) near the part. Then, plot the values of "jitter value Zjl0zoneAPin after two recordings” and “jitter value Zjl0zoneBPout after two recordings” against the initialized laser intensity (see Fig. 14). Figure 14 shows the initialization laser intensity, the “jitter value Zjl0zoneAPin after two recordings” and the “jitter value Z after two recordings.
- the zone located on the inner peripheral side is defined as zone ⁇
- the zone located on the outer peripheral side is defined as zone ⁇ .
- the zones A and B are initially crystallized at an initial laser intensity Pin. Then, the reflectance ReflzoneAPin after recording one track near the center of the zone A once and the reflectance ReflzoneBPin after recording one track near the center of the zone B once are measured.
- the zone A is initially crystallized with the initialization laser intensity Pout. Then, the reflectivity Refl zoneAPout after recording one track near the center of the zone A once is measured.
- the region near the boundary with zone A in the outer zone B is initialized with the initialized laser intensity of zone A, or conversely, the inner zone is initialized.
- the area near the boundary with Zone B in Zone A may be initialized with the initialization laser intensity.
- the boundary region between zones A and B may be initialized with the initialized laser intensity of both zones.
- the reflectivity of zone A and zone B near the boundary between zone A and zone B is the zone near the boundary between zone A and zone B when zone A is initialized only with Pin.
- the reflectivity of A may be larger or smaller than the reflectivity of Zone B near the boundary between Zone A and Zone B when Zone B is initialized only with Pout. .
- the reflectance when zone A is initialized with Pout and the reflectance when zone B is initialized with Pin are a predetermined value with respect to the reflectance when zone A is initialized with Pin. If it is within the range, even if the reflectivity of Zone A and Zone B fluctuates due to the change in the intensity of the initialization laser near the boundary between Zone A and Zone B, both Zones A and B It can be determined that substantially the same state has been initialized.
- FIG. 13 is a specific example of zones A, B, tracks near the center of zone A, and tracks near the center of zone B.
- the following methods can be given as specific methods of setting the Pin and Pout.
- FIG. 15 shows the initialization laser intensity and “I (reflectance after one recording in Zone A) — (Zone B).
- FIG. 6 is a conceptual diagram showing a relationship with “reflectance after one recording” of IZReflzoneAPin. Pout needs to be set within the range of ⁇ in the figure (a indicates the range that Pout should satisfy for the provisional Pin, Pin ').
- the initialization laser is usually set to have an elliptical shape, and the major axis is parallel to the radial direction.
- the length of the major axis covers a plurality of tracks.
- the moving distance in the radial direction for each rotation of the laser is shorter than the length of the major axis of the laser so that the same portion of the recording medium is irradiated with the initialization laser a plurality of times.
- the track position of the recording medium and the position control of the initialization laser may not always be synchronized.
- the area near the boundary with zone A in the outer zone B is initialized with the initialized laser intensity of zone A, or conversely, the zone in the inner zone A.
- the area near the boundary with B may be initialized with the initialization laser intensity in Zone B.
- the boundary region between zones A and B may be initialized with the initialized laser intensity of both zones (see FIG. 10). This is similar to the initialization of the ZCAV system.
- Zone A the zone located on the inner side
- Zone B the zone located on the outer side
- Pout the intensity of the focused light (initialized laser) in Zone B
- the minimum possible value of Pin is Pinmin
- the maximum value is Pinmax
- the minimum possible value of Pout is Poutmin
- the maximum value is Poutmax.
- the pin is gradually increased in the range from the above Pinmin to the above Pinmax as the initialization laser moves toward the outer periphery in the zone A in the initialization step.
- the value of the Pin at the outermost periphery of zone A be PinzoneAout.
- Pout is gradually increased in the range from Poutmin to Poutmax as the initialization laser moves toward the outer periphery in the zone B.
- the value of Pout at the innermost circumference of zone B be PoutzoneBin
- This control method has the advantage that the initialization near the boundary region of each zone can be easily performed uniformly since the initialization laser intensity does not change between the zones.
- PoutzoneBin PinzoneAout
- the difference between dPoutzoneBin and Kamimiki PinzoneAout is preferably / J ⁇ .
- the initialization method of the present invention may be a P-CAV method (see FIGS. 2 (b), (c), and FIG. 4).
- the innermost peripheral position of the initial crystallization region in the recording layer of the recording medium is also rotated in the outer peripheral direction until it reaches a predetermined radial position on the recording medium.
- An initialization method in which the scanning linear velocity is constant from the predetermined radial position to the position of the outermost periphery of the initial crystallization region of the recording layer, which is constant at a number R0 See Figure 4).
- the linear velocity VI of the light spot on the optical information recording medium at the predetermined radial position be a maximum linear velocity Vmax defined so as to satisfy the following condition.
- the maximum linear velocity Vmax is such that the J2ZJ10 obtained from the jitter areas 2 and J10 obtained at the respective linear velocities does not exceed 1.6.
- the method of setting Vmax can be set according to the method of setting the maximum rotation speed Rmax.
- Vmax is preferably set to a value that minimizes J2ZJ10 in the range of J2ZJ10 ⁇ 1.6.
- the maximum rotation speed of the initialization device is set at the innermost circumference, and this rotation speed is kept constant in a certain region, so that the linear velocity is increased toward the outer circumference.
- the linear velocity that minimizes J2ZJ10 is reached within the radius of the disk, the minimum value of J2ZJ10 is maintained as CLV after that radial position.
- the maximum linear velocity used for initial crystallization of the recording layer is determined by the optical It is preferable that the speed be equal to or higher than the maximum linear velocity at which the recording marks in the amorphous state formed on the information recording medium can be erased. That is, it is preferable that the maximum linear velocity at which the recording medium is initially crystallized is equal to or higher than the maximum linear velocity at which the amorphous marks on the medium can be erased.
- the maximum linear velocity LVmax at which the amorphous mark of the optical information recording medium after initialization can be erased is set at the initial crystallization.
- the scanning line speed at that time was set to a value equal to or slightly lower than LVmax.
- LVmax means that when an amorphous mark is recorded on an optical information recording medium and then a recording focused light beam set at an erasing power by changing the linear velocity is applied in a DC manner, The maximum linear velocity at which the erasure ratio exceeds 20 dB. If overwriting is performed at a recording linear velocity higher than LVmax, unerased recording will occur and the recording quality will be significantly reduced. The Therefore, it can be said that LVmax is the maximum linear velocity at which overwriting is possible.
- the term "unerased portion” refers to a phenomenon that an amorphous mark remains without being completely recrystallized, and also because the recording layer is melted due to erasing, the amorphous region is not completely recrystallized and the amorphous region is not completely recrystallized.
- the phenomenon of re-formation. In particular, the latter phenomenon is called re-amorphization. This is a phenomenon in which the irradiation of the recording focused beam with the erasing power for the purpose of erasing by recrystallization results in the formation of an amorphous rather than a recrystallization.
- the scanning linear velocity at the time of initial crystallization over the entire surface of the disk has usually been set to LVmax or less. As long as this condition was satisfied, re-amorphization did not occur even in the melt initialization, and all were recrystallized to obtain a good initial crystalline state. On the other hand, if the scanning linear velocity at the time of initial crystallization was higher than LVmax, re-amorphization tended to occur.
- the scanning linear velocity at the time of initial crystallization is set to not less than LVmax. Even so, it was proved that re-amorphous film did not occur and a better initial crystalline state was obtained.
- the optical information recording medium whose LVmax is approximately 20 mZs there can be mentioned an example in which the composition of the recording layer is Ge (In Sn) Te Sb as described above.
- the Sb content represents an atomic ratio that is higher than any of the Ge content, In content, Sn content, and Te content.x, y, z, and w are as follows: (i) to (vi) should be satisfied.
- the zone is set as follows. That is, the number of zones is usually 2 or more, preferably 3 or more. On the other hand, the number of zones is usually 50 or less, preferably 30 or less, and more preferably 10 or less. Within the above range, it is possible to perform initialization without performing complicated control.
- the width of one zone is usually at least lmm, preferably at least 2mm, depending on the size of the recording medium, while the width of one zone is usually at most 20mm, preferably at most 10mm. I do. Within the above range, initialization can be performed without performing complicated control.
- the zone is set as follows.
- the number of zones is usually 2 or more, preferably 3 or more.
- the number of zones is usually 50 or less, preferably 30 or less, and more preferably 10 or less. Within the above range, it is possible to perform initialization without performing complicated control.
- the width of one zone is usually 1 mm or more, preferably 2 mm or more, depending on the size of the recording medium. On the other hand, the width of one zone is usually 35 mm or less. Within the above range, initialization can be performed without performing complicated control.
- the present initialization apparatus 1 is an apparatus for initial crystallization of a recording layer of a recording medium 2 having a phase-change type recording layer on a disk-shaped substrate.
- a spindle motor 3 for rotating the medium 2; a motor driver 4 for driving the spindle motor 3; an initialization head (laser head) 5; an initialization head driver 6 for driving the initialization head 5;
- the initialization head 5 is configured to include, for example, a laser diode, an actuator used for performing focus and tracking, and the like.
- the initialization head driver 6 is configured to include a laser driver (laser diode driver) that drives a laser diode and a driver that drives an actuator.
- control unit 7 controls the speed of the scanning linear velocity in the above-described initial crystallization step. Control, intensity control of the focused light (laser light), rotation speed control of the spindle motor, etc. are executed.
- control unit 7 controls the spindle motor 3 and the initialization head 5 to irradiate the recording layer with laser light (converged light) to form a light spot formed around the recording medium. It is made to scan in the direction.
- the control unit 7 increases the scanning linear velocity when scanning the light spot in the circumferential direction toward the outer periphery of the recording medium 2.
- the control unit 7 is configured to increase the intensity of the focused light as the scanning linear velocity increases. Then, the entire surface of the initial crystallization region is initialized.
- control unit 7 is configured to make the number of rotations RO of the recording medium per unit time constant.
- the conditions to be satisfied by RO are as described above.
- control unit 7 be configured to rotate the recording medium based on a rotation speed RO set to satisfy the following condition.
- a plurality of recording media are prepared, and one of the recording media is rotated at an arbitrary number of rotations to initialize at least the recording layer formed on the innermost track of the recording area of the recording medium. Crystallizes.
- the initial crystallization region is divided into a plurality of zones along the radial direction of the recording medium, and the control unit 7 makes the intensity of the focused light irradiated in each zone constant, and sets the zone on the outer peripheral side of the recording medium. It is preferable that the intensity of the focused light be increased as the intensity of the focused light increases. And record When performing the initial crystallization of the layer, it is also preferable to control the intensity of the focused light in each zone based on the intensity of the focused light in each zone set so as to satisfy the following condition.
- J2inzcav, J2outzcav, J2midzcav and JlOmidzcav measured in the above (i) and (ii) should satisfy the following conditions.
- the initial crystallization region is divided into a plurality of zones along the radial direction of the recording medium, and the controller 7 controls the control unit 7 so that the intensity of the focused light irradiated in each zone is constant, and the zone on the outer peripheral side of the recording medium is controlled. It is preferable to increase the intensity of the focused light.
- Zone A the zone located on the inner side
- Zone B the zone located on the outer side
- the initial light intensity of the focused light in zone A is Pin
- the initial light intensity of the focused light in zone B is Pout.
- the above-mentioned Pin and Pout and the minimum initializing laser intensity PJmin and the maximum initializing laser intensity PJmax measured by the following method are:
- the intensity of the focused light is set so as to satisfy the following. It is also preferable to configure the control unit 7 so as to control the intensity of the focused light based on the above settings.
- the jitter value when recording twice on one track near the outermost periphery in the zone A on the optical information recording medium is calculated.
- J2zoneBin When the jitter value when recording twice on one track near the innermost circumference is J2zoneBin,
- the minimum value of the laser intensity that satisfies the condition is PJmin, and the maximum value of the laser intensity is PJmax.
- Zone A the zone located on the inner side
- Zone B the zone located on the outer side
- the initial light intensity of the focused light in zone A be Pin
- the initial light intensity of the focused light in zone B be Pout.
- the above-mentioned Pin and Pout, the minimum initialization laser intensity PRmin and the maximum initialization laser intensity PRmax measured by the following method
- the intensity of the focused light is set so as to satisfy the following. It is also preferable to configure the control unit 7 so as to control the intensity of the focused light based on the above settings.
- Ref Zone Aout is the reflectivity value when recording is performed once on one track near the outermost periphery of the zone A in the optical information recording medium, near the center of the zone A in the optical information recording medium. Reflectivity when recording once on one track of
- RefzoneAmid and the reflectance value when performing recording once on one track near the innermost circumference of the zone B in the optical information recording medium, as RefzoneBin,
- the minimum value of the laser intensity that satisfies the condition is PRmin, and the maximum value of the laser intensity is PRmax.
- the initial crystallization region is divided into a plurality of zones along the radial direction of the recording medium, and the number of rotations at the innermost position in each zone is constant, and the innermost region in each zone is fixed. It is preferable that the control unit 7 be configured to keep the scanning linear velocity constant from the outermost position to the outermost periphery. Then, when performing the initial crystallization of the recording layer, the control unit 7 controls the intensity of the focused light of each zone based on the intensity of the focused light of each zone set so as to satisfy the following condition. U, which also like to configure.
- the initial crystallization region is divided into a plurality of zones along the radial direction of the recording medium, and the control unit 7 keeps the number of rotations at the innermost position in each zone constant.
- the scanning linear velocity it is preferable that the scanning linear velocity be constant from the innermost circumference to the outermost circumference.
- a zone located on the inner periphery side of two adjacent zones among the plurality of zones is referred to as a zone ⁇
- a zone located on the outer periphery side is referred to as a zone ⁇ .
- Pin be the initial focused light intensity of zone ⁇
- Pout be the initialized focused light intensity of zone B.
- zone A is initially crystallized with the initial focused light intensity Pin
- zone B is initially crystallized with the initial focused light intensity Pout to obtain an optical information recording medium.
- 10 times of recording are performed on one track near the center of zone A of the optical information recording medium, the jitter value JlOzoneAPin after 10 times of recording is measured, and one track near the center of zone B is measured.
- zone A On the other recording medium, the zone A is initially crystallized with the initialized focused light intensity Pout, and the zone B is initially crystallized with the initialized focused light intensity Pin to obtain an optical information recording medium. Then, recording is performed twice on one track near the center of zone A of the optical information recording medium, and the jitter value J2zoneAPout after the twice recording is measured. Perform recording twice on one track near the center, and measure the jitter value J2zoneBPin after recording twice.
- JlOzoneBPout and J2zoneBPin measured in (i) and (ii) above are examples of JlOzoneBPout and J2zoneBPin measured in (i) and (ii) above.
- zone A the zone located on the inner side
- zone B the zone located on the outer side
- Pin the initialized focused light intensity of Zone A
- Pout the initialized focused light intensity of Zone B. It is also preferable to configure the control unit 7 so as to control the intensity of the focused light based on the intensity of the focused light set so as to satisfy the following condition.
- zones A and B are initially crystallized with the initialization focused light intensity Pin to obtain an optical information recording medium. Then, once recording is performed on one track near the center of zone A of the optical information recording medium, the reflectance ReflzoneAPin after one recording is measured, and one track near the center of zone B is measured. Perform one recording !, and measure the reflectance ReflzoneBPin after one recording.
- zone A is initially crystallized with the initialized focused light intensity Pout to obtain an optical information recording medium. Then, recording is performed once on one track near the center of zone A of the optical information recording medium, and the reflectance ReflzoneAPout after the recording is measured.
- ReflzoneAPin, ReflzoneBPin and ReflzoneAPout measured in (i) and (ii) above are equal to I ReflzoneAPout— ReflzoneBPin
- the control unit 7 is configured as follows. That is, let the minimum value of the focused light intensity Pin of zone A be Pinmin and the maximum value be Pinmax, and let the minimum value of the focused light intensity Pout of zone B be Poutmin and Poutmax be the maximum value.
- Zone A The focused light intensity Pin is gradually increased in the range from Pinmin to Pinmax as the force moves toward the outer peripheral side.
- the value of the focused light intensity Pin at the outermost periphery of zone A is defined as PinzoneAout.
- the focused light intensity Pout is gradually increased in the range from Poutmin to Poutmax in the zone B as the outer peripheral side is directed.
- the value of the focused light intensity Pout at the innermost periphery of zone B is defined as PoutzoneBin.
- the relationship between PoutzoneBin and PinzoneAout is
- control unit 7 is configured as follows. That is, let the minimum value of the focused light intensity Pin of zone A be Pinmin and the maximum value be Pinmax, and let the minimum value of the focused light intensity Pout of zone B be Poutmin and Poutmax be the maximum value.
- the focused light intensity Pin is gradually increased in the range from Pinmin to Pinmax as the outer peripheral side is moved in zone A.
- the value of the focused light intensity Pin at the outermost periphery of zone A is defined as PinzoneAout.
- the focused light intensity Pout is gradually increased in the range from Poutmin to Poutmax in the zone B as the outer peripheral side is directed.
- the value of the focused light intensity Pout at the innermost periphery of zone B is defined as PoutzoneBin.
- the relationship between PoutzoneBin and PinzoneAout is
- the control unit 7 may be configured to control the intensity of the focused light based on the set intensity of the focused light.
- control unit 7 controls the rotation speed R0 per unit time to be constant until a predetermined radial position is reached from the innermost peripheral position of the initial crystallization region toward the outer peripheral side of the recording medium. It is also preferable that the scanning line speed be constant from a predetermined radial position to the outermost position of the initial crystallization region of the recording layer.
- the conditions to be satisfied by R0 are as described above. [O]
- the maximum linear velocity Vmax at the predetermined radial position is set so as to satisfy the following condition.
- the maximum linear velocity Vmax is such that the J2ZJ10 obtained from the jitter areas 2 and J10 obtained at the respective linear velocities does not exceed 1.6.
- the maximum linear velocity used for initial crystallization of the recording layer is equal to or higher than the maximum linear velocity at which the amorphous mark of the optical information recording medium can be erased.
- the focused light is a laser beam.
- the setting of the rotation speeds of [C] to [M] and [O], the setting of the intensity of the focused light, and the setting of the linear velocity at a predetermined radial position are performed in advance before the initial crystallization step.
- These are stored in the memory of the control unit 7, and in the initial crystallization step, these are read from the memory to control the rotation speed of the spindle motor, the intensity control of the focused light (preferably laser light), the scanning line, and the like.
- Speed control may be performed.
- the setting of the number of rotations of [C] to [M], [0], and [P], the setting of the intensity of the focused light, and the setting of the linear velocity at a predetermined radial position are performed, for example.
- the control unit 7 may control the rotation speed of the spindle motor, control the intensity of the focused light (laser light), and control the speed of the scanning line.
- the following method can also be mentioned.
- the rotation speed and focusing of [C] to [M] and [O] set by other devices such as the evaluation device
- the configuration is such that the light intensity and the linear velocity at a predetermined radial position are sent to the initialization device. Then, based on this, the control unit 7 can control the rotation speed of the spindle motor, the intensity control of the focused light (laser light), and the speed control of the scanning line.
- the initial crystallization step is automatically performed by linking the initialization device with another device such as an evaluation device.
- a disc-shaped polycarbonate substrate having the following shape was used as the substrate.
- Thickness 0.6mm
- OS layer 2nm Ta interface layer, 200nm Ag reflective layer, about 4m UV curable resin layer
- the Ta layer is an interface layer for preventing the diffusion of S into the Ag reflection layer.
- Each layer was formed on the substrate by sputtering in the order in which the vacuum was not released. However, the UV-curable resin layer was applied by spin coating. Thereafter, a similar 0.6 mm thick substrate that had not been formed was bonded via an adhesive so that the recording layer surface was on the inside, thereby forming a 1.2 mm thick disk (recording medium).
- composition and layer of this recording medium should be such that, when a rewritable DVD is used after the initial crystallization step, it can be overwritten up to about 8 to L0x speed, which is 3.49 mZs (1x speed) of DVD.
- the configuration has been chosen. In other words, the upper limit of the linear velocity at which the erasing ratio is 20 dB or more when the erasing power is applied in a DC manner is 8 to L0 times.
- a plurality of such recording media were prepared and initialized under various initialization conditions, and the performance of the obtained optical information recording medium was evaluated.
- An elliptical laser beam with a wavelength of 810 nm, a major axis of about 75 ⁇ m, and a minor axis of about 1 ⁇ m was used as the focused light.
- the laser light intensity at the time of the initial process was changed within the range of 1000 to 4000 mW.
- the maximum number of revolutions of the used initialization device was 8200 rpm.
- the rotation speed is constant (RO) from the inner circumference to the outer circumference, and the feed amount of the laser head per disk rotation for each zone is 50 ⁇ m.
- Initialization was performed by changing the laser intensity between 1200 and 3600 mW.
- the innermost rotation speed in each zone is made constant at RO.
- the linear velocity in each zone was kept constant.
- Initialization was performed by changing the laser intensity between 1200 and 3600 mW, with the laser head feeding volume per disk rotation of 50 ⁇ m for each zone.
- the scanning linear velocity V (m / s) at the time of initialization is represented by RO (rpm) for the disk rotation speed and r (mm) for the radial position to be initialized.
- V (m / s) (R0 / 60) X 2 X 3.14 X (r / 1000)
- the clock jitter is a value obtained as follows.
- the reproduced signal is passed through an equalizer and an LPF, and then converted into a binary signal by a slicer. Then, the standard deviation (jitter) of the leading edge and trailing edge of the binary signal with respect to the PLL clock is calculated. Further, a value obtained by standardizing the standard deviation with a clock cycle: T is defined as a clock jitter.
- the reflectance value was determined as follows. That is, the recording waveform recorded by the above method is output to an oscilloscope. Then, at the reference linear velocity, the average value of the maximum value of the 14T signal amplitude was read directly from the oscilloscope to obtain the reflectance value.
- the rotation speed could not be made faster than 8200 rpm, but if the CAV initialization was performed under the rotation speed faster than 8200 rpm, the value of J2ZJ10 could be further increased.
- the force S may be reduced (the recording characteristics of the optical information recording medium may be improved).
- J2ZJ10 is 1.6 or less. Therefore, in the present invention, the maximum rotation speed Rmax (RO) is set to 8200 rpm.
- a zone having a radius of 40 to 50 mm in the obtained nine optical information recording media was defined as one zone. And within this zone,
- FIG. 17 shows the relationship between the calculation result thus obtained and the initialization laser intensity.
- the experimental result indicated by “inner” indicates a change in “J2inzcavZjl0midzcav” with respect to the initialized laser intensity.
- the experimental result indicated by “middle” in the figure shows the change of “J2midzcavZjl0midzca V ” with respect to the initialization laser intensity.
- the experimental result indicated by “outer” in the same figure shows the change of “J2outzcavZjl0midzcav” with respect to the initialization laser intensity.
- the initialization laser power is set to 1800-2400mW.
- FIG. 18 shows the relationship between the calculation result thus obtained and the initialization laser intensity.
- the initialization laser power is set to 1800-2400mW.
- FIG. 19 shows the relationship between the calculation results thus obtained and the initializing laser intensity.
- the experimental result indicated by “inner” indicates a change of “I ReflOinzcav—Reflinzcav
- the experimental result indicated by “middle” indicates that “I Refl Omidzcav— Reflmidzcav
- the experimental result indicated by “outer” in the same figure shows the change of “I ReflOoutzcav—Refloutzcavl ZReflOoutzcav” with respect to the initialization laser intensity.
- the jitter value J2zoneBin when recording twice on one track near the innermost circumference in zone B, was measured.
- FIG. 20 shows the relationship between the calculation result thus obtained and the initializing laser intensity.
- the experimental result indicated by “z-aout” indicates a change in "J2zoneAoutZjl0zoneAmid” with respect to the initialization laser intensity.
- the experimental result indicated by “z-bin” in the figure shows a change in “J2zoneBinZjl0zoneAmid” with respect to the initializing laser intensity.
- PJmin that reliably satisfies is 1500 mW.
- the PJmax that satisfies the above condition is 3600 mW.
- the PJmin that reliably satisfies is 1800 mW.
- the PJmax that satisfies the above condition is 2700 mW.
- zone A was located at a radius of 40 to 50 mm on the recording medium. Then, the zone with a radius of 50 to 58 mm was defined as zone B, and the initialized laser intensity Pin in zone A and the initialized laser intensity Pout in zone B were varied between 1200 and 3600 mW for each recording medium. .
- the reflectance value RefzoneBin when recording once on one track near the innermost circumference in zone B, was measured.
- FIG. 25 shows the relationship between the calculation result thus obtained and the initialization laser intensity.
- the experimental result indicated by ⁇ Pin ku Pout 3.6 '' indicates that the initial laser intensity of Zone B is 3600 mW and the initial pin laser intensity is lower than that of Zone This indicates the change of “
- the PRmin that reliably satisfies is more than 2100mW.
- PRmin which satisfies the above, is more than 3000mW.
- PRmax is considered to exist at 3600 mW or more from the results in FIG. However, here, PRmax is assumed to be 3600 mW.
- the radius A of the recording medium was designated as zone A, and the radius B was designated as zone B, and the radius B was designated as zone B.
- the scanning linear velocity for initializing Zone A was 30 m, and the scanning linear velocity for initializing Zone B was 37 m / s.
- the rotation speed at the innermost circumference of zone A is 8200 rpm and the rotation speed at the innermost circumference of zone B is also 8200 rpm, and the rotation speed at the innermost circumference position of each zone is constant. It becomes.
- FIGS. 21 and 22 show the relationship between the calculation results thus obtained and the initializing laser intensity.
- zone A is in the range of 1200 to 3300 mW, and that in zone B it is in the range of 1500 to 3600 mW.
- the initialized laser intensity in the zone A is in the range of 1200 to 2100 mW, and that in zone B is in the range of 1500 to 2400 mW.
- the initialization laser intensity that reliably satisfies is in the range of 1500 to 3600 mW in zone A and 1800 to 3600 mW in zone B. Furthermore,
- the initialization laser intensity that reliably satisfies is in the range of 1500 to 3000 mW in zone A, and in the range of 2100 to 3600 mW in zone B.
- the optimum initialization laser intensity in Zone A (a value that can reduce the jitter ratio and the reflectance ratio) can be estimated to be 1500 mW.
- the optimal initializing laser intensity in Zone B (a value that can reduce the reflectance ratio while reducing the jitter ratio) can be estimated to be 2100 mW.
- J2zoneA J2zoneA ZjlOzoneAPin
- J2zoneB J2zoneB ZjlOzoneBPout
- JlOzoneAPin used the jitter value after 10 recordings when zone A was initialized with an initialization laser intensity of 1500 mW (1500 mW is assumed to be a temporary pin).
- JlOzoneBPout the jitter value after 10 recordings when zone B was initialized with an initialization laser intensity of 2100 mW (2100 mW is a temporary Pout, Pout ′) was used.
- Fig. 23 shows the relationship between the calculated result and the initialized laser intensity. Show.
- zoneA indicates the value of “J2zoneA / jl0zoneAPin”
- zoneB indicates “J2zoneB ZjlOzoneBPout”.
- the initialization laser intensity that reliably satisfies is in the range of 1500 to 2400 mW.
- the initialization laser intensity that reliably satisfies is in the range of 1500 to 1800 mW.
- Pout '(2100mW) is a value larger than 1800mW. Therefore, it can be considered that it is easy to balance the characteristics after initialization of zones A and B with Pout set to 1800 mW.
- each optical information recording medium when the laser intensity is changed, the reflectivity value (referred to herein as ReflzoneA) near the center of zone A after one recording and the laser intensity are changed.
- the reflectance value after the first recording near the center of zone B here, referred to as ReflzoneB
- / Refl zoneAPin was calculated.
- FIG. 24 shows the relationship between the calculation result thus obtained and the initialization laser intensity.
- “Pinl500” indicates
- 00 indicates
- ZReflzoneAPin when ReflzoneAPin at Pin, 1800 mW is used.
- indicates
- the initialization laser intensity that surely satisfies is in the range of 1200 to 1500 mW.
- zone B should be initialized within the range of 1200-1500 mW!
- the initialization laser intensity that reliably satisfies is in the range of 1500 to 2400 mW.
- the laser intensity in zone A is 1800 mW
- zone B should be initialized in the range of 1500 to 2400 mW.
- the initialization laser intensity that reliably satisfies is 1200 mW.
- the laser intensity of zone A is 1500 mW, it is clear that zone B should be initialized at 1200 mW.
- the initialization laser intensity that satisfies the condition is in the range of 1500 to 2100 mW.
- zone B should be initialized in the range of 1500 to 210 OmW!
- zone A when the laser intensity in zone A is 1500 mW, zone A> zone B. For this reason, it is presumed that it is preferable to set the laser intensity in zone A to 1800 mW and set the laser intensity in zone B to 1800 to 2100 mW.
- a disc-shaped polycarbonate substrate having the following shape was used as the substrate.
- Thickness 0.6mm
- OS layer 2nm Ta interface layer, 200nm Ag reflective layer, about 4m UV curable resin layer
- the Ta layer is an interface layer for preventing the diffusion of S into the Ag reflection layer.
- Each layer was formed on the substrate by sputtering in the order in which the vacuum was not released. However, the UV-curable resin layer was applied by spin coating. Thereafter, a similar 0.6 mm thick substrate that had not been formed was bonded via an adhesive so that the recording layer surface was on the inside, thereby forming a 1.2 mm thick disk (recording medium).
- composition and layer of this recording medium should be such that, when a rewritable DVD is used after the initial crystallization step, it can be overwritten up to about 8 to L0x speed, which is 3.49 mZs (1x speed) of DVD.
- the configuration has been chosen. In other words, the upper limit of the linear velocity at which the erasing ratio is 20 dB or more when the erasing power is applied in a DC manner is 8 to L0 times.
- An elliptical laser beam with a wavelength of 810 nm, a major axis of about 75 ⁇ m, and a minor axis of about 1 ⁇ m was used as the focused light.
- the laser light intensity at the time of the initial process was changed within the range of 1000 to 4000 mW.
- the maximum number of revolutions of the used initialization device was 8200 rpm.
- V (m / s) (R0 / 60) X 2 X 3.14 X (r / 1000)
- CLV indicates the linear velocity at each radial position
- CAV indicates the number of rotations per unit time at each radial position.
- the reference linear velocity is set to 3.49 mZs, which is the reference linear velocity of DVD
- the EFM + modulated signal is recorded at 6x and 8x linear velocity
- the clock jitter was measured at the reference linear velocity.
- the clock jitter is a value obtained as follows. That is, the reproduced signal is passed through an equalizer and an LPF, and then converted into a binary signal by a slicer. And the Calculate the standard deviation (jitter) of the leading edge and trailing edge of the binary signal with respect to the PLL clock. Further, a value obtained by standardizing the standard deviation with a clock cycle: T is defined as a clock jitter.
- the reflectance value was determined as follows. That is, the recording waveform recorded by the above method is output to an oscilloscope. Then, at the reference linear velocity, the average value of the maximum value of the 14T signal amplitude was read directly from an oscilloscope to obtain the reflectance.
- the initializing power was changed so that the 1300 mW power was almost proportional to the initial linear velocity between 1900 mW.
- the jitter values of two recordings and ten recordings were measured at 8 ⁇ speed at each of the radial positions 23 mm to 58 mm at the radial positions. Then, J2ZJ10 was determined.
- FIG. 27 shows the relationship with the radial position ⁇ [2ZJ10. From the results shown in the figure, J2ZJ10 ⁇ 1.3 is satisfied under the P-CAV initialization conditions in this setting when recording at 8x speed in all radial regions and at 6x speed recording at 23, 30, and 35mm. You can see that it is.
- an optical information recording medium having a good initial crystallization state can be obtained by an initial crystallization method different from the conventional one. Furthermore, the initial crystallization time can be greatly reduced, and the production of optical information recording media can be reduced. It is possible to improve the performance.
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Abstract
Description
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US11/584,506 US20070036934A1 (en) | 2004-04-23 | 2006-10-23 | Process for producing optical information recording medium and intialization device |
HK07110226.8A HK1105043A1 (en) | 2004-04-23 | 2007-09-20 | Production method and initialization device of optical information recording medium |
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JPH03171427A (ja) * | 1989-11-30 | 1991-07-24 | Toshiba Corp | 相変化型情報記録媒体の初期結晶化方法 |
JPH10106045A (ja) * | 1996-09-26 | 1998-04-24 | Toray Ind Inc | 光記録媒体とその製造方法および製造装置 |
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DE19612823C2 (de) * | 1995-03-31 | 2001-03-01 | Mitsubishi Chem Corp | Optisches Aufzeichnungsverfahren |
MY117767A (en) * | 1996-07-10 | 2004-08-30 | Sony Corp | Apparatus and method for reproducing data recorded at a predetermined linear velocity on a disc-like recording medium. |
JPH1055609A (ja) * | 1996-08-14 | 1998-02-24 | Sony Corp | ディスク駆動装置およびディスク駆動方法 |
US6143468A (en) * | 1996-10-04 | 2000-11-07 | Mitsubishi Chemical Corporation | Optical information recording medium and optical recording method |
US6806030B2 (en) * | 2000-03-30 | 2004-10-19 | Hitachi, Ltd. | Information recording medium and method for manufacturing information recording medium |
WO2003069602A1 (en) * | 2002-02-13 | 2003-08-21 | Mitsubishi Chemical Corporation | Rewritable optical recording medium and optical recording method |
-
2005
- 2005-04-21 WO PCT/JP2005/007650 patent/WO2005104102A1/ja active Application Filing
- 2005-04-22 TW TW094112929A patent/TW200606932A/zh not_active IP Right Cessation
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2006
- 2006-10-23 US US11/584,506 patent/US20070036934A1/en not_active Abandoned
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Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03171427A (ja) * | 1989-11-30 | 1991-07-24 | Toshiba Corp | 相変化型情報記録媒体の初期結晶化方法 |
JPH10106045A (ja) * | 1996-09-26 | 1998-04-24 | Toray Ind Inc | 光記録媒体とその製造方法および製造装置 |
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US20070036934A1 (en) | 2007-02-15 |
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