WO2004100237A1 - ステージ装置及び露光装置、並びにデバイス製造方法 - Google Patents
ステージ装置及び露光装置、並びにデバイス製造方法 Download PDFInfo
- Publication number
- WO2004100237A1 WO2004100237A1 PCT/JP2004/006594 JP2004006594W WO2004100237A1 WO 2004100237 A1 WO2004100237 A1 WO 2004100237A1 JP 2004006594 W JP2004006594 W JP 2004006594W WO 2004100237 A1 WO2004100237 A1 WO 2004100237A1
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- WO
- WIPO (PCT)
- Prior art keywords
- stage
- reticle
- surface plate
- pressurized gas
- stage device
- Prior art date
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Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70808—Construction details, e.g. housing, load-lock, seals or windows for passing light in or out of apparatus
- G03F7/70816—Bearings
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
- F16C—SHAFTS; FLEXIBLE SHAFTS; ELEMENTS OR CRANKSHAFT MECHANISMS; ROTARY BODIES OTHER THAN GEARING ELEMENTS; BEARINGS
- F16C29/00—Bearings for parts moving only linearly
- F16C29/02—Sliding-contact bearings
- F16C29/025—Hydrostatic or aerostatic
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
- F16C—SHAFTS; FLEXIBLE SHAFTS; ELEMENTS OR CRANKSHAFT MECHANISMS; ROTARY BODIES OTHER THAN GEARING ELEMENTS; BEARINGS
- F16C32/00—Bearings not otherwise provided for
- F16C32/06—Bearings not otherwise provided for with moving member supported by a fluid cushion formed, at least to a large extent, otherwise than by movement of the shaft, e.g. hydrostatic air-cushion bearings
- F16C32/0603—Bearings not otherwise provided for with moving member supported by a fluid cushion formed, at least to a large extent, otherwise than by movement of the shaft, e.g. hydrostatic air-cushion bearings supported by a gas cushion, e.g. an air cushion
- F16C32/0614—Bearings not otherwise provided for with moving member supported by a fluid cushion formed, at least to a large extent, otherwise than by movement of the shaft, e.g. hydrostatic air-cushion bearings supported by a gas cushion, e.g. an air cushion the gas being supplied under pressure, e.g. aerostatic bearings
Definitions
- the present invention relates to a stage apparatus, an exposure apparatus, and a device manufacturing method, and more particularly, to a stage apparatus including a stage that is driven along a surface plate in a long stroke at least in a predetermined uniaxial direction, and includes the stage apparatus.
- the present invention relates to an exposure apparatus to be used, and a device manufacturing method using the exposure apparatus. Background art
- reticle a mask or a reticle (hereinafter, collectively referred to as “reticle”) and a photosensitive object such as a wafer or a glass plate (hereinafter, referred to as “wafer”). ) And a reticle pattern are transferred onto a wafer via a projection optical system while synchronously moving along a predetermined scanning direction (scanning direction).
- scanning step scanning
- This scanning type exposure apparatus can expose a large field with a smaller projection optical system than a static exposure type apparatus such as a stepper.
- a scanning exposure apparatus requires a driving device for driving the reticle on the reticle side in addition to the wafer side.
- a driving device on the reticle side the lithographic apparatus is supported by floating on an air bearing or the like on a reticle surface plate.
- a reticle stage device having a coarse / fine movement structure having a reticle fine movement stage which is finely driven by a Pois coil motor or the like in a scanning direction, a non-scanning direction, and a jogging direction has been used.
- reticle stage device having such a configuration, wiring or piping used for a linear motor, a pois coil motor, or an air bearing is externally connected to the reticle coarse movement stage / reticle fine movement stage which is a moving body. Therefore, when these stages are driven, these wirings, pipes, and the like are dragged, and this causes a decrease in the reticle position controllability.
- a type in which gas is supplied from the surface plate to the stage (a surface plate supply type static pressure gas bearing) is known (for example, Japanese Patent Application Laid-Open No. 2001-20951 (hereinafter referred to as “publicly known document 1J”).
- the stage becomes inevitably heavy. This is likely to cause a decrease in the position controllability of the stage. Therefore, it is desirable that the stage be lightweight.
- the pressure between the surface plate and the bottom surface of the moving body is increased by the pressure of the supply air (gas) supplied through an air supply hole formed in the surface plate. After the supplied air passes through the internal piping in the bottom of the moving body and blows out from the gas recovery groove formed in the bottom of the bottom of the moving body into the minute gap The air is exhausted through an exhaust hole formed in the surface plate.
- the moving body (1) is very small in the fixed body (2) whose longitudinal direction is a predetermined uniaxial direction.
- the mobile unit is in a state of being engaged with a
- the fixed body (2) is a kind of fixed beam at both ends. As in the case where the concentrated load moves on the fixed beam at both ends, the fixed body (2) depends on the position of the moving body (1).
- the deflection of (2) changes greatly. That is, when the moving body (1) is located at the center of the stroke (the center in the longitudinal direction of the fixed body (2)), the bending of the fixed body (2) is large, and the moving body (1) is located near both ends of the stroke. When positioned, the flexure of the fixed body (2) is small. This means that the bent shape (shape of the bending curve) of the fixed body (2) changes according to the position of the moving body (1).
- the moving body (1) is guided by air pads to both the surface plate (3) and the fixed body (2). Therefore, the motion trajectory of the moving body (1) has an average shape of the guide surfaces of the surface plate (3) and the fixed body (2). This means that the bent shape of the fixed body (2) affects the trajectory of the moving body (1) with a contribution rate of 50%. In other words, it is difficult to give the mobile unit (1) high guidance accuracy with the configuration of the above-mentioned known document 1.
- the fixed body (2) may be processed into a curved surface in advance.
- the moving body (1) has an air supply hole throughout its stroke. Since it is covered, curved surface processing is required over the entire stroke, and it is technically difficult to realize.
- the radius of the fixed body (2) for guiding the moving body (1) changes according to the position of the moving body, which means that the moving body (1) moves. It means that it vibrates up and down. Therefore, when the hydrostatic gas bearing described in the above-mentioned known document 1 is used, for example, for supporting a wafer stage (moving body) of an exposure apparatus, vibration generated on the wafer stage causes a surface of the wafer on the wafer stage to be exposed. However, an oscillating displacement phenomenon with respect to the image plane of the projection optical system of the exposure apparatus occurs.
- the hydrostatic gas bearing disclosed in the above-mentioned known document 1 has problems such as guide accuracy, rigidity, space, and cost. It is difficult to apply.
- an air supply duct and a surface throttle communicating with the air supply duct are provided on the bottom of the stage.
- a re-groove is formed, a pressurized gas ejected from the surface plate is once received by the air supply duct, and is injected between the stage bottom surface and the surface plate from the re-squeeze groove.
- the stage and the platen are used when gas is supplied from the platen to the air supply duct. It is indispensable to apply a vacuum preload or a magnetic preload to cancel the positive pressure generated in the gap between the magnetic field and the pressure. For example, when applying a magnetic preload force, it is necessary to attach a magnet to the stage using a metal platen as the surface plate, or attach a magnet to the surface plate using the metal platen stage. Even so, the stage becomes heavier than necessary.
- the present invention has been made under such circumstances, and a first object of the present invention is to provide a stage device that enables the use of a small and lightweight stage and improves the position controllability of the stage. is there.
- a second object of the present invention is to provide an exposure apparatus capable of realizing highly accurate exposure. Disclosure of the invention
- a first and second jet ports for jetting a pressurized gas supplied from the outside upward and downward in the direction of gravity, respectively.
- a first receiver formed on one surface of the surface plate facing the first jet port along a predetermined uniaxial direction and receiving the pressurized gas jetted from the first jet port;
- a first air passage that guides the pressurized gas received by the first receiving portion to a position on the one side surface different from the first receiving portion; and a first air passage provided on the one side surface.
- a bearing portion for ejecting the pressurized gas guided by the first ventilation path toward the surface plate; and a second portion for receiving the pressurized gas ejected from the second ejection port of the surface plate.
- a driving device for driving the stage in at least the one axial direction.
- pressurized gas supplied from the outside is jetted upward and downward in the gravitational direction from the first jet port and the second jet port provided on the surface plate, respectively.
- Gas is received at a first receiving portion and a second receiving portion of a stage driven at least in the uniaxial direction by a driving device.
- the pressurized gas received by the first receiving portion on the surface on one side of the stage (the lower surface in the direction of gravity, that is, the bottom surface) facing the first ejection port of the surface plate is subjected to the first ventilation.
- the road it is guided to a position different from the first receiving part on the bottom of the stage, and is ejected from the bearing toward the surface plate.
- the stage is floated above the surface plate by the static pressure of the pressurized gas ejected from the bearing.
- the stage will be lifted upward by the pressure of the pressurized gas jetted from the first jet port of the surface plate to the first receiving portion on the bottom surface of the stage.
- the pressure of the pressurized gas ejected from the second ejection port of the surface plate acts downward, so that the stage is positioned above the surface plate due to the balance between the two. It is possible to support the levitation without contact while maintaining the clearance.
- the stage can be levitated and supported on the surface plate in a non-contact manner without connecting the pipe to the moving stage, and the stage position control accuracy (positioning accuracy) caused by the stage dragging the pipe ) Can be prevented.
- the stage position control accuracy of the stage can be improved also in this regard.
- the pressure of the pressurized gas ejected from the first ejection port of the surface plate to the first receiving portion of the stage is changed from the second ejection port of the surface plate to the second receiving portion of the stage.
- No stage is required, because the pressure can be offset by the pressure of the jet gas It is possible to prevent the floating from rising, and to ensure good pneumatic hammer stability. As a result, the rigidity of the bearing can be increased.
- the first ejection port and the second ejection port may be provided at positions corresponding to each other.
- the pressure of the pressurized gas ejected from the first ejection port and the pressure of the pressurized gas ejected from the second ejection port become a couple. The risk of acting on the stage.
- At least a part of the first ventilation path may be formed in the stage.
- the bearing portion may be formed by processing a part of the stage, or the bearing portion may be formed by embedding the stage embedded in the bottom surface of the stage.
- an atmosphere opening portion may be formed between the bearing portion and the first receiving portion.
- direct gas movement between both the first receiving portion and the bearing portion is prevented, so that a decrease in rigidity of the bearing portion can be prevented.
- a supply path for commonly supplying a pressurized gas supplied from the outside to the first and second ejection ports is formed inside the surface plate.
- two supply paths are formed inside the surface plate to separately supply pressurized gas supplied from the outside to the first and second ejection ports. It can be said that.
- the stage may further include a second ventilation path that guides the pressurized gas received by the second receiving section to at least one of the first ventilation path and the bearing section. it can.
- an exhaust path for forcibly exhausting gas around the bearing portion to the outside may be formed inside the surface plate.
- the stage has a mounting portion on which the object is mounted, and a suction hole for sucking the object is formed in the mounting portion, and the suction hole is provided around the bearing portion.
- the communication state can be established.
- a plurality of the first ejection ports are formed on an upper surface of the surface plate, and the stage receives the pressurized gas ejected from the plurality of first ejection ports.
- the first receiving portion may be provided in such a shape or arrangement that the first receiving portion can be formed.
- the surface plate may be either a ceramic surface plate or a stone surface plate having a surface sprayed with ceramic.
- the driving device includes a plurality of motors, and all of the motors can be either a moving magnet type linear motor or a voice coil motor.
- an exposure apparatus for synchronously moving a mask and a photosensitive object to transfer a pattern formed on the mask to the photosensitive object, wherein at least one of the mask and the photosensitive object is provided.
- An exposure apparatus comprising the stage device of the present invention as one of the driving devices.
- the stage device of the present invention is provided as a driving device for at least one of the mask and the photosensitive object. It is possible to improve the synchronization accuracy with the photosensitive object, and as a result, the position (or superposition) of the pattern formed on the mask and the photosensitive object can be transferred with high precision to the photosensitive object. Become. Further, in the lithographic process, by performing exposure using the exposure apparatus of the present invention, it is possible to form a pattern on a photosensitive object with high accuracy. It can be manufactured well. Therefore, from another viewpoint, the present invention can be said to be a device manufacturing method using the exposure apparatus of the present invention. BRIEF DESCRIPTION OF THE FIGURES
- FIG. 1 is a view schematically showing a configuration of an exposure apparatus according to one embodiment of the present invention.
- FIG. 2 is a perspective view showing the reticle stage device of FIG.
- FIG. 3 is an exploded perspective view of the reticle stage device of FIG.
- FIG. 4A is a perspective view of the reticle stage
- FIG. 4B is a cross-sectional view of the reticle stage.
- FIG. 5 is a YZ sectional view of the reticle stage device.
- FIG. 6 is a cross-sectional view showing a configuration near a guide portion of the reticle surface plate and an angle member on the reticle stage main body side.
- FIG. 7 is a sectional view taken along line AA of FIG.
- FIG. 8 is an XZ sectional view of the reticle stage device.
- FIG. 9 is a diagram for explaining the lower surface side of the frame-shaped member.
- FIG. 10 is a diagram showing a modification. BEST MODE FOR CARRYING OUT THE INVENTION
- FIG. 1 shows a schematic configuration of an exposure apparatus 10 according to one embodiment.
- the exposure apparatus 10 is a step-and-scan type scanning exposure apparatus, that is, a so-called scanning stepper (also called a scanner).
- a scanning stepper also called a scanner.
- the projection optical system unit PL since the projection optical system unit PL is provided, Hereinafter, the optical axis A of the projection optical system constituting the projection optical system unit PL will be described.
- the X direction is the z-axis direction.
- the reticle R as the mask (and the object) and the wafer W as the photosensitive object are scanned relative to each other.
- the direction orthogonal to the Z axis and the Y axis is described as the X axis direction.
- the exposure apparatus 10 is a stage that drives the illumination unit IOP and the reticle R with a predetermined stroke in the Y-axis direction and minutely drives the X-axis direction, the Y-axis direction, and the 0-z direction (the rotation direction around the Z-axis).
- a reticle stage device 12 as a device, a projection optical system unit P, a wafer stage WST for driving a wafer W in an XY two-dimensional direction in an XY plane, and a control system thereof are provided.
- the illumination unit I includes a light source and an illumination optical system, and an energy beam is applied to a rectangular or arc-shaped illumination area defined by a field stop (also referred to as a mask king blade or a reticle blind) disposed therein.
- the reticle R on which the circuit pattern is formed is illuminated with uniform illumination.
- An illumination system similar to the illumination unit I is disclosed, for example, in Japanese Patent Application Laid-Open No. Hei 6-349701 and corresponding US Pat. Nos. 5,534,970 and the like. To the extent permitted by the national laws of the designated State or selected elected States in this International Application, the disclosures in the above-mentioned publications and corresponding US patents are incorporated herein by reference.
- the illumination light I teeth and it shall be used A r F excimer laser beam (wavelength 1 9 3 nm) or F 2 laser beam (wavelength 1 5 7 nm) vacuum ultraviolet light such as is. It is also possible to use far ultraviolet light such as KrF excimer laser light (wavelength: 248 nm) or ultraviolet bright lines (g-line, i-line, etc.) from an ultra-high pressure mercury lamp as the illumination light I. It is possible.
- the specific gas having a characteristic of absorbing less light in the vacuum ultraviolet region than air oxygen
- the specific gas having a characteristic of absorbing less light in the vacuum ultraviolet region than air oxygen
- the specific gas having a characteristic of absorbing less light in the vacuum ultraviolet region than air oxygen
- the space on the optical path of the illumination light I inside the illumination unit IOP contains nitrogen and rare gases such as helium, argon, neon, and krypton, or a mixed gas thereof (hereinafter referred to as “low-absorbing gas” as appropriate).
- the space on the optical path in the lighting unit IOP has a concentration of absorptive gas of several ppm or less.
- the reticle stage device 12 includes an illumination system side plate (cap plate) having an annular mounting portion 101 connected to a periphery of a lower end portion of the illumination unit IOP via a sealing member 99 such as an O-ring. It is located below 14 in Figure 1.
- the illumination system side plate 14 is supported substantially horizontally by a support member (not shown), and a substantially central portion thereof is formed with a rectangular opening 14a serving as an optical path (passage) for the illumination light I.
- the reticle stage device 12 is a surface plate disposed substantially parallel to the illumination system side plate 14 at a predetermined interval below the illumination system side plate 14.
- Reticle stage base plate hereinafter referred to as “reticle base plate”
- reticle stage RST as a stage arranged between reticle base plate 16 and illumination system side plate 14
- Reticle stage RS A frame-like member 18 placed between reticle surface plate 16 and illumination system side plate 14 in a state surrounding ⁇ ⁇ ⁇ ⁇ , reticle stage drive system as a drive device for driving reticle stage RST, etc. It has.
- the reticle surface plate 16 is supported substantially horizontally by a support member (not shown).
- the reticle surface plate 16 is made of ceramics. It is also possible to use, as reticle surface plate 16, a stone surface plate whose surface is sprayed with ceramics.
- FIG. 3 which is an exploded perspective view of FIG. It is composed of a substantially plate-like member, and a convex portion 16a is formed at the approximate center thereof.
- a rectangular opening 16b having the X-axis direction as a longitudinal direction is provided at the top and bottom of the reticle plate 16 in a plan view (as viewed from above) for passing the illumination light IL.
- the rectangular opening 16b is provided on one side and the other side in the X-axis direction of the rectangular opening 16b with a guide section 16c 16d having an inverted L-shape in the XZ section with the longitudinal direction in the Y-axis direction. Each is set up.
- These guide portions 16c and 16d are provided with their upper ends projecting outward, and the upper end surfaces are parallel to the upper surfaces of the convex portions 16a.
- a projection optical system is provided via a sealing member 98 such as a V-ring or a telescopic bellows, while surrounding the rectangular opening 16 b.
- a sealing member 98 such as a V-ring or a telescopic bellows
- the upper end of the lens barrel of the system unit PL is connected.
- the reticle stage RST includes a reticle stage main body 22 having a special shape as shown in FIG. 4A and various magnetic pole units (which will be described later) fixed to the reticle stage main body 22. .
- the reticle stage main body 22 has a substantially rectangular plate-like portion 24 A in plan view (as viewed from above), a mirror portion 24 B provided at one X end of the plate-like portion 24 A, and a plate.
- a pair of extending portions 24 C i, 24 C 2 , 24 D i, each protruding in the Y-axis direction from one end and the other end of the 2 4 D and 2 are provided.
- the four extended portions 24 C i, 24 C 2 , 24 D i, 24 D 2 have a substantially plate-like shape, and Is provided with a reinforcing part with a triangular cross section to improve strength.
- the reticle stage body 22 is made of a lightweight and high-rigidity material such as MMC (metal-based composite material: a composite of metal and ceramics (aluminum alloy or metallic silicon is used as a matrix material, and various ceramic reinforced materials are combined therewith). Material)).
- MMC metal-based composite material: a composite of metal and ceramics (aluminum alloy or metallic silicon is used as a matrix material, and various ceramic reinforced materials are combined therewith). Material)).
- MMC metal-based composite material: a composite of metal and ceramics (aluminum alloy or metallic silicon is used as a matrix material, and various ceramic reinforced materials are combined therewith). Material).
- MMC metal-based composite material: a composite of metal and ceramics (aluminum alloy or metallic silicon is used as a matrix material, and various ceramic reinforced materials are combined therewith). Material)
- a stepped opening 22a is formed in the center (inner bottom surface) of the plate at the center (inner bottom surface). 2
- the reticle R is supported by the plurality of support members 34 in a state where the pattern surface (lower surface) of the reticle R substantially matches the neutral surface CT of the reticle stage main body 22 (reticle stage RST). It has become. In other words, the mounting surface of reticle R almost matches the neutral plane C T of reticle stage R ST (see FIG. 4B).
- a plurality of (for example, three) reticle fixing mechanisms 37 are provided in a portion of the plate portion 24A near the reticle support member 34, corresponding to each of the reticle support members 34.
- Each reticle fixing mechanism 37 has an L-shaped XZ cross section, and the reticle fixing mechanism 37 is rotatably attached to a plate-like portion 24 A around an axis parallel to the Y-axis direction provided at a corner of the L-shape.
- Each has an attached fixing member.
- the reticle R is mechanically fixed by holding the reticle R between the reticle R and the reticle support member 34.
- a configuration may be adopted in which the fixing member is constantly urged in a direction of pressing the reticle R toward the support member 34 by an urging means (not shown).
- the mirror portion 24B has a substantially prismatic shape with the Y-axis direction as a longitudinal direction, and a hollow portion having a circular cross section at the center thereof for reducing weight. CH is formed.
- the one X-side end surface of the mirror portion 24B is a reflection surface that has been mirror-finished.
- each of the concave portions 24 gl and 24 g 2 is provided with a retroreflector 3 2 ⁇ and 3 2 2 , respectively.
- the bottom surface (the surface on the one Z side) of the reticle stage body 22 extends from the + Y end of the extension 24 C i to the one Y end of the extension 24 D i, as shown in FIG. 4B.
- An angle plate-shaped member (hereinafter, referred to as an “angle member j”) 27 A having an L-shaped cross section and a longitudinal direction in the Y-axis direction is fixed.
- the reticle stage main body 22 is fixed to the reticle stage main body 22 at a plurality of positions by screws 55.
- the angle member It is fixed to the bottom of reticle stage main body 22 in the same manner as 27 A.
- the angle members 27 A and 27 B have a guide portion 1 of the reticle surface plate 16, as can be seen from FIG. 5 which shows a cross section of the reticle stage device 12 near the center in a plane parallel to the XZ plane.
- the reticle stage body 22 is fixed to the bottom surface of the reticle stage body 22 at a position and an orientation to be engaged with the upper protruding portions of each of 6c and 16d from the side and below via predetermined clearances, respectively. That is, the upper protruding portions of the guide portions 16c and 16d are arranged to be held by the angle members 27A and 27B and the reticle stage body 22 from both sides in the X-axis direction.
- a first receiving portion formed of a concave groove having a predetermined depth is provided at a position facing the upper surface of the guide portion 16 c.
- a concave portion 56a and a second DA portion 56b having a depth substantially equal to that of the first concave portion 56a are formed at a predetermined distance from the first concave portion 56a on the + X side. .
- These first concave portion 56a and second concave portion 56b have Y both as shown in FIG. 7, which is a sectional view of the reticle stage body 22 taken along line A--A in FIG. It is a rectangular groove having a long axial direction.
- the length of the first concave portion 56a and the second concave portion 56b in the Y-axis direction are almost the same, but the length (width) in the X-axis direction is the first concave portion 56a.
- the second recess 56 b is larger than the second recess 56 b. That is, the second recess 56 b has a larger area than the first recess 56 a.
- the reticle stage main body 22 has a vertical direction (the Z-axis direction) extending from the inner bottom surface (upper surface) of the first recess 56 a to the inner bottom surface of the stepped opening 22 a described above. )
- the pores 5 8a are formed.
- a plurality of the pores 58a are formed at predetermined intervals in the Y-axis direction (see FIG. 7).
- each gas static pressure bearing 57 has a bearing surface (bottom surface) that is substantially flush with the bottom surface of the reticle stage main body 22, and the bearing surface has a surface as shown in FIG.
- a groove 57 a with a depth of approximately j ′′ m is formed in the shape of a cross, which is formed by crossing different I (or H) at right angles at the center.
- Groove 57 a of each gas hydrostatic bearing 57 A through-hole 57b is formed at the center of.
- the reticle stage main body 22 has a vertical section from the inner bottom surface of the stepped opening 22a to the surface opposite to the bearing surface of each gas static pressure bearing 57.
- the direction pores 58b are formed. Each pore 58b communicates with a through hole 57b of each gas static pressure bearing 57.
- connectors 59A are attached to the positions where the respective holes 58a are formed on the inner bottom surface of the stepped opening 22a of the reticle stage main body 22 as shown in Fig. 6. ing. Similarly, a connector 59B is provided at the position where each pore 58b is formed on the inner bottom surface of the stepped opening 22 of the reticle stage body 22. Installed.
- the connectors 59 A and 59 B arranged side by side in the X-axis direction are connected to each other by the tube 161. That is, in the present embodiment, as described above, the first air passage from the first concave portion 56a to the gas static pressure bearing 57 is formed by the fine holes 58a, the internal space of the tube 161, and the fine particles L58b.
- the ventilation path is configured as follows. A plurality (three in FIG. 7) of ventilation paths are provided at predetermined intervals along the Y-axis direction, corresponding to each of the pores 58a and the gas static pressure bearing 57 shown in FIG.
- the guide portion 16 c of the reticle surface plate 16 is formed of a separate member from the convex portion 16 a and the rest of the reticle surface plate 16, and the convex portion 16 It is fixed to the upper surface of a.
- two circular holes 6 OA and 61 A having different depths are formed on the upper surface of the convex portion 16 a of the reticle surface plate 16, respectively. ing.
- the shallower hole 6OA communicates with the + X side end of a through hole 60B formed in the + X direction from the one X side end of the projection 16a.
- the deeper hole 61A is connected to the + X side end of a through hole 61B formed in the + X direction from the one X side end face of the projection 16a. I have.
- circular holes 60C and 61C having substantially circular cross-sections having substantially the same depth are formed, respectively.
- the hole 60C has the same diameter as the hole 6OA described above, and the two are concentrically communicated with each other.
- the hole 60A and the hole 60C allow the inside of the convex portion 16a to be near the upper end surface of the guide portion 16c One round hole is formed.
- the hole 61C has the same diameter as the above-mentioned hole 61A, and both are concentrically communicated with each other.
- the hole 61A and the hole 61C allow the guide portion 1a to extend from the inside of the convex portion 16a.
- One round hole is formed near the upper end face of 6c.
- the + X side end of the through hole 60D formed through the + X direction from the one X side end face of the guide portion 16c communicates with the hole 60C.
- the through hole 60 D The open end on the 1X side of is closed with a plug 19.
- a fine hole 66a as a first ejection port extending from the upper end surface to the through hole 60D is formed to face the above-mentioned fine hole 58a. .
- a minute hole 66b as a second ejection port is formed at a position facing the through hole 60D of the through hole 60D of the guide portion 16c.
- a third concave portion 56c as a second receiving portion formed of an H groove having a predetermined depth extending in the Y-axis direction is formed in the above-described angle member 27A so as to face the small hole 66b. ing.
- the third recess 56c has substantially the same width and the same depth as the first recess 56a described above.
- a fine hole 66c communicating between the inside of the hole 61C and the outside of the upper surface of the guide 16c is formed above the hole 61C of the guide 16c.
- One end of the air supply pipe 65A is connected via a connector 63A to one end on the X side of the aforementioned through hole 60B formed in the projection 16a of the reticle surface plate 16.
- the other end of the air supply pipe 65A is connected to a gas supply device 67 shown in FIG.
- a series of gas supply paths for introducing a low-absorbing gas such as helium gas to the pores 66a and 66b are formed.
- this gas supply path is referred to as a gas supply path 60.
- the pressurized gas guided to the pores 66 a and 66 b by the gas supply path 60 is applied to the first concave portion 56 on the RST side of the reticle stage RST facing the pores 66 a and 66 b respectively. a, is ejected toward the third recess 56c.
- the pressurized gas ejected from the pores 66a is once received by the first recess 56a, and the pressurized gas is continuously ejected from the pores 66a, so that the pressurized gas is released from the first recess 5a.
- the pressurized gas is supplied to a plurality of pores 58 a provided in the first recess 56 a. Is done.
- the supplied pressurized gas is supplied to the bearing 5 through the tube 16 1 and the pores 58 b. It is ejected from 7 toward the upper surface of the guide 16 c of the surface plate 16.
- the static pressure (pressure in the gap) of the pressurized gas ejected between the bottom surface of the reticle stage main body 2 2 and the upper surface of the guide portion 16 c reaches a certain pressure, the reticle stage RST is moved to the reticle stage. It will be levitated and supported on the surface plate 16.
- the reticle stage RST when the reticle stage RST is levitated and supported by the static pressure of the pressurized gas ejected from the bearing portion 57, and thereafter, the reticle stage side from the pores 66b Since the pressurized gas continues to be ejected to the third concave portion 56c, the pressure of the pressurized gas continues to press the reticle stage downward. Therefore, the pressure (upward force) of the pressurized gas ejected into the first concave portion 56a and the force of the pore 66a are almost offset by the downward pressure, and the reticle stage RST rises more than necessary. None.
- the self-weight of the reticle stage RST is supported by the above-mentioned pressure in the gap of the pressurized gas ejected from the bearing portion 57, and a predetermined clearance is provided between the reticle stage main body 22 and the upper surface of the guide portion 16c.
- the reticle stage RST is supported in a non-contact and high rigidity while being maintained.
- the reticle is formed from each of the pores 66a and 66b.
- the pressure of the pressurized gas ejected toward the tage RST acts on the reticle stage RST as a couple, and in this respect, unnecessary bending moment is prevented from acting on the reticle stage RST. .
- one end of the exhaust pipe 65B is connected via a connector 63B to one end on the X side of the through hole 61B formed in the projection 16a of the reticle surface plate 16.
- the other end of the exhaust pipe 65B is connected to a vacuum pump 76 shown in FIG.
- the vacuum pump 76 is connected to a gas recovery device (not shown).
- the pores 66c, the holes 61C, 61A, and the through holes 61B define a space outside the upper surface of the guide portion 16c, that is, the guide portion 16c and the reticle.
- Stay An exhaust path that guides gas in the gap between the main body 22 and the exhaust pipe 65B is formed.
- the pressurized gas ejected from the bearing portion 57 toward the guide portion 16c generates the internal space of the second concave portion 56b around the bearing portion 57.
- the above-described exhaust path pore 66c, hole 61C, 61A, and The gas is forcibly exhausted to the outside through the through hole 61B) and the exhaust pipe. Therefore, in the present embodiment, there is almost no possibility that the pressurized gas ejected from the bearing portion 57 leaks to the surroundings, and pressurized air or the like can be used as the pressurized gas.
- the exhaust path pore 66c, hole 61C, 61A, and through-hole 61B
- the reticle stage RST has A slight vacuum preload is also provided.
- the guide portion 16 c of the reticle surface plate 16 and the respective constituent members near the angle member 27 A of the reticle stage RST are provided on the X side of the reticle stage RST.
- the first support device is configured to support the reticle plate 16 with high rigidity in non-contact with the reticle surface plate 16.
- a second supporting device for supporting the + X side portion of the reticle stage RST with high rigidity in a non-contact manner with respect to the reticle surface plate 16 is configured.
- the components of the second support device are symmetrical to the components of the first support device.
- the reticle stage RST is maintained in a state where the reticle stage main body 22 is kept at a distance of, for example, about several meters from the guide portions 16c and 16d by the first and second support devices described above. Are buoyantly supported without contact with the reticle surface plate 16.
- a substantially annular concave groove 83, 85 is formed on the upper surface of the frame-shaped member 18. It is formed heavily.
- the inner annular groove 83 has a plurality of air supply ports (not shown) formed therein, and the outer annular groove 85 has a plurality of exhaust ports (not shown) formed therein.
- air supply groove 83 air supply groove 83
- exhaust groove 85J exhaust groove 85J
- An air supply port formed inside the air supply groove 83 is connected to a gas supply device (not shown) that supplies a low-absorbing gas such as nitrogen or a rare gas through a gas supply line and a gas supply tube (not shown). It is connected.
- a gas supply device not shown
- an exhaust port formed inside the exhaust groove 85 is connected to a vacuum pump (not shown) via an exhaust pipe and an exhaust pipe (not shown).
- FIG. 9 which is a top view of the frame-shaped member 18 turned upside down, a substantially annular concave groove 82, 84 is doubled. It is formed.
- the inner annular groove 82 has a plurality of air inlets (not shown) formed therein, and the outer annular groove 84 has a plurality of exhaust ports (not shown) formed therein.
- the inner annular groove 82 will be referred to as “air supply groove 82” and the outer annular groove 84 will be referred to as “exhaust groove 84”.
- An air supply port formed inside the air supply groove 82 is connected to a gas supply device (not shown) that supplies a low-absorbent gas such as nitrogen or a rare gas via an air supply pipe and an air supply pipe.
- a gas supply device not shown
- an exhaust port formed inside the exhaust groove 84 is connected to a vacuum pump (not shown) via an exhaust pipe and an exhaust pipe.
- the air supply groove 82 formed on the bottom surface of the frame member 18 and the upper surface of the reticle platen 16 (the convex portion 16a A pressurized gas (low-absorbent gas) is sprayed onto the lower part (upper surface), and the static weight of the sprayed pressurized gas supports the weight of the frame-shaped member 18. It is levitated above the upper surface of the reticle plate 16 with a clearance of about several jum. Also in this case, the gas in the clearance is exhausted to the outside by the suction force of the vacuum pump through the exhaust groove 84. In this case, a gas flow is generated from the supply groove 82 to the exhaust groove 84.
- the entire bottom surface of the frame member 18 substantially constitutes a differential exhaust gas static pressure bearing that floats and supports the frame member 18 above the upper surface of the reticle surface plate 16. ing.
- the pressurized gas flows from the air supply groove 83 formed on the upper surface of the frame member 18 to the lower surface of the illumination system side plate 14. Gas) is sprayed, and the gas in the clearance between the illumination system side plate 14 and the frame member 18 is exhausted to the outside by the suction force of the vacuum pump through the exhaust groove 85.
- a gas flow is generated from the supply groove 83 to the exhaust groove 85. Therefore, the outside air is effectively prevented from entering the inside of the frame member 18 through the clearance.
- a clearance is maintained between the frame member 18 and the illumination system side plate 14 by the balance between the static pressure of the injected pressurized gas and the vacuum suction force. That is, the entire upper surface of the frame member 18 substantially constitutes a differential exhaust gas static pressure bearing that maintains the clearance between the frame member 18 and the illumination system side plate 14. I have.
- the above-mentioned clearance (that is, the bearing gap) between the frame member 18 and the reticle surface plate 16 is the same as that of the frame member 18 at the top and bottom of the differential exhaust type aerostatic bearing. Actually, it is determined by the overall balance of the force exerted on the frame member 18 by the force and the weight of the entire frame member 18.
- the clearance between the frame member 18 and the illumination system side plate 14 and the clearance between the reticle surface plate 16 and the frame member 18 are hermetically sealed by the gas flow described above. Further, as described above, since the upper end of the projection optical system unit PL and the reticle surface plate 16 are connected by the aforementioned sealing member 98 (see FIGS. 7 and 8), The space surrounded by the members 18 is a very airtight space. Hereinafter, the space surrounded by the frame-shaped member 18 will be referred to as “air” for convenience. It shall be called “dense space”.
- the light path from the illumination unit ⁇ OP to the projection optical system unit PL is set to avoid the absorption of the exposure light by the absorbing gas such as oxygen. In other words, it is necessary to replace the (light path) in the hermetic space with nitrogen or a rare gas.
- an air supply pipe and an exhaust pipe are respectively connected to the side wall of the frame-shaped member 18, a low-absorbent gas is supplied to the above-mentioned hermetic space via the air supply pipe, and the internal gas is exhausted to the outside via the exhaust pipe. It may be exhausted.
- helium gas When helium gas is used as the gas supplied to the hermetic space, it is desirable to recover the helium gas through a gas exhaust mechanism, remove impurities, and then reuse the gas.
- the reticle stage drive system is configured to include a pair of stator units 36 and 38 laid in the Y-axis direction inside a frame member 18, respectively.
- the first drive mechanism that drives the stage RST in the Y-axis direction and minutely drives it in the 0 z direction (the rotation direction around the Z axis), and one X side of one of the stator units 38 inside the frame member 18
- a second drive mechanism that minutely drives the reticle stage RST in the X-axis direction.
- the stator unit 36 has a Y-axis linear guide (Y-axis stator) composed of a pair of armature units whose longitudinal direction is in the Y-axis direction. , 1 and 3 6 2, these Y-axis linear guide 1 3 6 iota, 1 3 6 2 of a pair of fixing members 1 5 2 for holding at one end and the other end in the longitudinal direction (Y-axis direction) Have.
- the Y-axis linear guide 1 3 61, 1 36 2 is Z-axis direction (vertical direction) respectively held parallel to the or One XY plane opposite one another at predetermined intervals.
- Each of the pair of fixing members 152 is fixed to the inner wall surface of the frame member 18 described above.
- each of the Y-axis linear guides 136 ⁇ and 1362 has a frame made of a nonmagnetic material having a rectangular cross section (rectangle), and has a predetermined interval in the Y-axis direction inside thereof. , A plurality of armature coils are provided.
- the stator unit 38 has the same configuration as the stator unit 36. That is, the stator unit 38 includes a pair of upper and lower armature units having a longitudinal direction in the Y-axis direction, a Y-axis linear guide (Y-axis stator) 1 38 ⁇ 1 382, and these Y-axis linear guides 1 38Iota, and a 1 38 2 a pair of fixing members 1 54 for securing at both ends of the respective longitudinally Z-axis direction in state shape with maintaining a predetermined interval. Each of the pair of fixing members 152 is fixed to the inner wall surface of the frame member 18 described above.
- the Y-axis linear guide 1 38, 1 38 2, the aforementioned Y-axis linear guides 1 36Iota, is configured similarly to the 1 36 2 (see FIG. 5).
- the upper surface of the reticle stage RS T, on the lower surface a pair of magnetic pole units 26Iota, 26 2 are embedded respectively
- Y-axis linear guides 1 381, 1 38 2 opposite the upper surface of the reticle stage RS T, on the lower surface, a pair of magnetic poles Interview knit 28 ⁇ , 28 2 are embedded respectively.
- the pole Yuni' Bok 26Iota 'respective 26 2 as shown in FIG. 4 beta, one X side of the stepped opening 22 a of the plate portion 24 Alpha of the aforementioned reticle stage main body 22, Les chicle stage body 22 It is arranged in the concave portions 24 ei and 24 e 2 formed on the upper and lower surfaces symmetrically with respect to the neutral plane CT.
- the Y-axis linear guides 136 ⁇ and 1362 are located at substantially symmetric positions with respect to the neutral plane CT.
- It said pair of magnetic poles Yunitto 26 ⁇ , 26 2 includes a magnetic member, and a plurality of field magnets arranged in along connexion predetermined distance in the Y-axis direction on the front surface of the magnetic member comprises respectively.
- the plurality of field magnets have opposite polarities between adjacent field magnets. Accordingly, the space above the magnetic pole Yunitto 26i are formed alternating magnetic field along the Y-axis direction, in the space below the magnetic pole Yuni' Bok 26 2 are alternating magnetic field along the Y-axis direction formed.
- each of the pair of magnetic pole units 2 282 has a reticle stage on the + X side of the stepped opening 22 a of the plate-shaped portion 24 A of the reticle stage main body 22 described above. They are arranged symmetrically with respect to the neutral plane CT of the main body 22 in the concave portions 24 fi and 24 f 2 formed on the upper and lower surfaces, respectively.
- a pair of magnetic pole units 28i, 28 2 is the Z-axis passing through the center position in the X-axis direction of the stepped opening 22 a (substantially coincides with the X-axis direction position of the center of gravity of the reticle stage RS T), the magnetic pole unit 26 , and they are arranged in substantially symmetrical and 26 2.
- the Y axis linear guides 1 38 ⁇ 1 38 2 is disposed substantially symmetrical positions relative to the neutral plane CT.
- the pair of magnetic pole units 28 ⁇ , 28 2 includes a magnetic member, and a plurality of field magnets arranged at predetermined intervals along the Y-axis direction on the front surface of the magnetic member comprises respectively.
- the plurality of field magnets have opposite polarities between adjacent field magnets. Accordingly, the space above the magnetic pole Yunitto 28i are formed alternating magnetic field along the Y-axis direction, in the space below the magnetic pole Yunitto 28 2 are alternating magnetic field along the Y-axis direction formed.
- stator unit 36 described above, 38 (two pairs of Y axis Riniaga id 1 36 ⁇ , 1 36 2, 1 381, 1 38 includes a 2) and two pairs of magnetic poles Yunitto 26 26 2, 28 ⁇ 28 2 These form a first drive mechanism.
- This first drive Flows According to mechanism, when a current to the armature coils of the Y-axis Riniagai de 1 36 1 36 within 2 is supplied, the magnetic pole unit 26Iota, the magnetic field and armature Interview knit 1 36i, 1 36 2 that occur 26 2 electromagnetic force in the Y-axis direction (the Lorentz force) is generated by the electromagnetic interaction between the current and the driving reaction force pole unit 26i of the Lorentz force, 26 2 (reticle stage RS T) in the Y-axis direction drive Help.
- the Lorentz force the electromagnetic force in the Y-axis direction
- Y of the reference neutral plane CT of the reticle stage RS T, magnetic pole Yuni' Bok 26 ⁇ and 26 2, pole Yunitto 28 and 28 2 are arranged symmetrically respectively, corresponding to these magnetic pole units axis Riniagai de 1 36Iota and 1 36 2, Y-axis Riniagai de 1 38 ⁇ 1 38 2 are also arranged symmetrically relative to the neutral plane CT.
- Y-axis Riniagai de 1 36Iota by supplying 1 36 2, 1 381, 1 382 the same current to the armature each coil, the magnetic pole Yunitto 26 26 2> 28 ⁇ , 28 2 identical to each Driving force is applied, and the driving force in the Y-axis direction (the resultant of the driving force of the magnetic pole unit 26 26 2 and the magnetic pole unit) 281 and 282 driving force), thereby preventing the pitch and momentum from acting on the reticle stage RST as much as possible.
- the magnetic pole Yunitto 26 ⁇ and 26 2, and pole Yuni' Bok 28 ⁇ and 28 2 with respect to the X-axis direction, because it is disposed almost symmetrically with respect to the center of gravity position near the reticle stage RS T, the reticle stage RS Since the above-described driving force in the Y-axis direction is applied to two points equidistant from the center of gravity of T, the same force is generated at the two points to drive the driving force in the Y-axis direction near the position of the center of gravity of reticle stage RST. Resultant force Can be operated. Therefore, the bowing moment does not act on the reticle stage RST as much as possible.
- the pole unit 26 26 2 the linear guide 1 36] L, 1 36 2 and a pair of Y-axis linear motor that drives the reticle stage RS T in the Y-axis direction by the corresponding is is configured, the pole Yuni' Bok 28, 28 2, the corresponding Y-axis linear guides 1 38 ⁇ , 1 382 and Manzanillo pair of ⁇ over Bing magnet type for driving the re reticle stage RS T in the Y-axis direction Y-axis linear motors Is configured.
- the stator unit 40 includes a pair of armature units 14 Oi and 140 2 having the Y-axis direction as a longitudinal direction, and these armature units 14 Oi and 140 2 is provided with a pair of fixing members 156 for holding the two at one end and the other end in the longitudinal direction (Y-axis direction).
- the armature unit 1 4 OL 1 40 2 is, Z-axis direction (vertical direction) in parallel to respectively held and XY plane opposite one another at predetermined intervals Have been.
- Each of the pair of fixing members 156 is fixed to the inner wall surface of the frame member 18 described above.
- Armature units 1 40 2 as can be seen from Fig. 5, comprises a frame made of a nonmagnetic material in the XZ cross-section rectangle (rectangle), the inside, armature co I le is located.
- an end of reticle stage RST in the X-axis direction is provided between armature units 1402 through a predetermined clearance, as shown in FIG.
- a plate-shaped permanent magnet 30 having a rectangular cross section (rectangle) fixed to is disposed.
- a magnetic pole unit composed of a magnetic member and a pair of flat plate-shaped permanent magnets fixed to the upper and lower surfaces thereof may be used.
- the permanent magnet 3 0 and the armature unit 1 4 0 ⁇ 1 4 0 2 has a substantially symmetric shape and arranged relative to the neutral plane CT (Fig. 4 B and 5 see).
- the same current is supplied to the armature coils constituting the armature units 14 C and 140 2 , respectively, so that the reticle stage RST is positioned on the neutral plane CT (see FIG. 4B).
- a driving force in the X-axis direction can be applied, so that the rolling moment acts on the reticle stage RST as little as possible.
- the armature units 14 C and 140 2 and the permanent magnets 30 constitute a moving magnet type voice coil motor capable of minutely driving the reticle stage RST in the X-axis direction.
- this voice coil motor is also referred to as a voice coil motor 30 using the same reference numerals as those of the mover constituting the voice coil motor, that is, the permanent magnets.
- the voice coil motor 30 constitutes a second drive mechanism.
- the movable element 2 consisting of magnetic pole units 6 O i, 2 6 0 2, 2 6 0 3 is provided.
- the reticle surface plate 1 6 correspond to those of the mover 2 6 O i, 2 6 0 2, 2 6 0 3, through the support stand 2 6 4 2 6 4 2 2 6 4 3, the armature New
- the stator 26 2 26 consisting of knit 2 2, 2 6 2 3 is provided.
- the mover 2 6 260 2 is provided with a permanent magnet therein, to form a magnetic field in the Z-axis Direction.
- the stator 26 2i, 2 6 2 2 has an armature Koi Le therein, current through the magnetic field of the Z-axis direction are summer to flow in the Y-axis direction. Accordingly, the stator 2 6 2Iota, by the current of the Y-axis direction is supplied to the armature coils 2 6 2 2, the movable element 2 60Iota, driving force of the 260 2 to the X-axis direction (Lauren Tsu force Will act).
- the mover 2 6 Oi and stator 2 6 Zi and Niyori trim motor for the X-axis Direction drive consisting of a voice coil motor of the moving magnetic Tsu Bok type is configured, the mover 2 60 2 and the stator 2 by 6 2 2, tri Mumota for X-axis direction drive consisting of a voice coil motor of the moving magnetic Tsu Bok type is configured.
- the mover 2 60 the inside provided with permanent magnets, a magnetic field in the Z axis direction.
- the stator 26 2 3 has an armature coil therein, a current through the magnetic field of the Z-axis direction are summer to flow in the X-axis direction. Therefore, when a current of Y-axis direction is supplied to the armature coil of the stator 2 6 2 3, the movable element 2 6 0 3 driving force in the X-axis direction (reaction force of the Lorentz force) acting It will be. That is, the mover 260 3 and the stator 2 6 2 3 Manzanillo Bok Rimumota for Y-axis direction drive consisting of a voice coil motor of re moving mug net type is configured.
- a concave portion 18a is formed substantially at the center of the side wall on the 1X side of the frame-shaped member 18.
- a rectangular opening 18b that connects the inside and the outside of the frame-shaped member 18 is formed in the recess 18a, and a window glass gl is fitted into the rectangular opening 18b.
- the frame-shaped member 18 has a frame-shaped member 18 on one Y-side wall. Internal and rectangular opening 1 8 c communicating with the outside is formed, the opening 1 8 c, the window glass g 2 is fitted.
- the X-axis is provided on the outside (—X side) of the window glass gi so as to face the reflecting surface of the mirror portion 24 B of the reticle stage RST.
- a laser interferometer 69 X is provided. The measurement beam from the X-axis laser interferometer 69 X is projected through the window glass gl onto the reflecting surface of the mirror section 24 B, and the reflected light is transmitted through the window glass gi to the X-axis laser. Return to the interferometer 6 9 X. In this case, the position of the optical path of the measurement beam in the Z-axis direction coincides with the position of the neutral plane CT.
- a fixed mirror Mrx is provided via a mounting member 92 near the upper end of the lens barrel of the projection optical system unit PL.
- X-axis laser interferometer 6 9 The reference beam from X is projected through a through-hole (optical path) 7 1 formed in reticle surface plate 16 onto fixed mirror Mrx , and the reflected light is reflected by X-axis laser. Return to the interferometer 6 9 X.
- the reflected light of the measurement beam and the reflected light of the reference beam are combined coaxially and in the same polarization direction by the internal optical system, and the interference light of both reflected lights is Light is received by the detector.
- the X-axis laser interferometer 69 X determines the position of the reticle stage main body 22 in the X-axis direction with a fixed mirror M rx , And is always detected with a resolution of, for example, about 0.5 to 1 nm.
- the reticle stage device 1 2 As can be seen from FIG. 8 is a YZ sectional view of the vicinity, the retroreflector previously described were found provided on the reticle stage main body 2 2 3 2 Y-axis laser interference facing the L 3 2 2 reflective surface A total of 69 Y is provided. In this case, a pair of ⁇ -axis laser interferometers 69 ⁇ is provided corresponding to the retroreflectors 32, 32 2 , respectively.
- Measurement beams from the respective Upsilon-axis laser interferometer 6 9 Upsilon are respectively projected to the reflecting surface of the retroreflector 3 2.3 2 2 via the window glass g 2, each of the reflected light to the window glass g 2 Return to each Y-axis laser interferometer 69 Y via In this case, the position of the measurement beam irradiation point in the Z-axis direction almost coincides with the position of the neutral plane CT.
- a fixed mirror Mry is provided via a mounting member 93 near the upper end of the lens barrel of the projection optical system unit PL.
- the reference beam from each Y-axis laser interferometer 6 9 Y is projected through the through-hole (optical path) 72 formed in the reticle surface plate 16 onto the fixed mirror M ry , and each reflected light is Return to the inside of each Y-axis laser interferometer 6 9 Y.
- Each of the Y-axis laser interferometers 69Y based on the interference light between the reflected light of the measurement beam and the reflected light of the reference beam, as in the case of the X-axis laser interferometer 69X, described above.
- the projection position (retro reflecting motor 3 2 L 3 2 2 the reflective surface position) position of the Y-axis direction of the reticle stage main body 2 2 of the long beam eg a fixed mirror M ry based respectively from 0.5 to 1
- the pair of Y-axis laser interferometers 69Y can detect the amount of rotation of the reticle stage RST around the Z-axis.
- the mirror unit 2 4 B is arranged outside the Y-axis Riniamo over motor 1 3 6] L, 1 3 6 2. Therefore, since the measurement axis of X-axis laser interferometer 6 9 X is not you to pass over the Y axis linear motor 1 3 6 ⁇ 1 3 6 2 stator, Y-axis linear motor 1 3 6 Even if air fluctuations occur near the Y-axis linear motor 1 3 1 3 6 2 due to heat generated by the current flowing through the stator of ⁇ , 1 3 6 2, the X-axis laser interferometer 6 9 X measurement due to the air fluctuations Since there is no effect on the value, it is possible to detect the position of the reticle stage RST, and thus the reticle R in the X-axis direction, with high accuracy.
- the position in the Z-axis direction of the optical path of the measuring beam of the X-ray interferometer 69 X matches the position of the neutral plane CT, and the mounting surface of the reticle R also matches the neutral plane CT. It is possible to accurately measure the axial position of the reticle stage RS (and thus the reticle R) (so-called Abbe error) without any so-called Abbe error. Thus, the position of the reticle stage RST, and thus the reticle R in the Y-axis direction can be accurately measured without so-called Abbe error.
- the X-axis laser interferometer 69 X and the pair of Y-axis laser interferometers 69 Y are arranged outside the frame member 18, optical members such as prisms constituting each interferometer are provided. Even if a small amount of absorbent gas is generated from detectors and the like, this will not adversely affect exposure.
- three mirrors ie, a mirror section 24 B and a retroreflector 3 2 ⁇ 3 2 2 , are provided as moving mirrors.
- X and a pair of Y-axis laser interferometers 69 Y are typically shown in FIG. 1 as a reticle moving mirror M m and a reticle interferometer system 69.
- the fixed mirrors fixed mirror Mrx and fixed mirror Mry ) are not shown.
- the position information (or speed information) of the reticle stage RST from the reticle interferometer system 69 is sent to the stage control system 90 in FIG. 1 and the main controller 70 via the stage control system 90, and the stage control system 90.
- the drive of reticle stage RST is controlled based on the position information (or speed information) of reticle stage RST.
- the projection optical system unit PL includes a lens barrel and a projection optical system (refractive optical system) including a plurality of lens elements having a common optical axis in the Z-axis direction and held by the lens barrel. It is composed of As a projection optical system, for example, a two-sided telecentric reduction system is used.
- This projection optical system unit PL Actually, the projection optical system unit PL is held by a holding member (not shown) via a flange portion FLG provided in a lens barrel of the projection optical unit PL.
- the projection magnification of the projection optical system constituting this projection optical system unit PL is, for example, 1/4 or 1/5.
- the image is reduced and projected onto the illuminated area (exposure area), and a reduced image (elevated image, etc.) of the circuit pattern is transferred and formed.
- One end of an air supply pipe 50 and one end of an exhaust pipe 51 are connected to the lens barrel of the projection optical system unit PL.
- the other end of the air supply conduit 50 is connected to a low-absorbency gas supply device (not shown), for example, a helium gas supply device.
- the other end of the exhaust pipe 51 is connected to an external gas recovery device. Then, high-purity helium gas is flown from the helium gas supply device into the lens barrel of the projection optical system unit PL via the air supply line 50. In this case, the gas is recovered by the gas recovery device.
- helium gas is used as the low-absorbing gas
- the fluorite with a large thermal expansion coefficient is used as the lens material of the projection optical system unit PL in addition to the same reason as described above. This is because it is desirable to use a low-absorbing gas with a large cooling effect in consideration of the fact that the temperature rise caused by absorbing the illumination light IL degrades the imaging characteristics of the lens.
- the wafer stage WST is arranged in a wafer chamber 80.
- the wafer chamber 80 is formed of a box-shaped (hollow rectangular parallelepiped) partition wall 71 having a circular opening 71a formed substantially at the center of the ceiling.
- the partition wall 71 is made of a material with low degassing such as stainless steel (SUS).
- SUS stainless steel
- the lower end of the lens barrel of the projection optical unit PL is inserted into an opening 71a of the ceiling of the partition 71.
- the periphery of the opening wall 1a of the ceiling wall of the bulkhead 7 1 and the flange FLG of the projection optical unit PL Are connected by a flexible bellows 97 without any gap. In this way, the gas inside the wafer chamber 80 is isolated from the outside.
- a stage base BS is supported substantially horizontally via a plurality of vibration isolating units 86.
- These vibration isolation units 86 insulate the micro vibration (dark vibration) transmitted from the floor F to the stage base BS at, for example, a micro G level.
- a so-called active vibration isolator that actively damps the stage base BS based on the output of a vibration sensor such as a semiconductor accelerometer attached to a part of the stage base BS is used as the vibration isolation unit 86. It is also possible.
- the wafer stage WST holds the wafer W by vacuum suction or the like via a wafer holder 25, and moves along the upper surface of the base BS two-dimensionally along a top surface of the base BS by a wafer drive system (not shown) including, for example, a linear motor. It can be driven freely in any direction.
- a wafer drive system including, for example, a linear motor. It can be driven freely in any direction.
- the optical path from the projection optical system unit PL to the wafer W is also required to avoid absorption of the exposure light by an absorbing gas such as oxygen. Or a rare gas.
- one end of an air supply pipe 41 and one end of an exhaust pipe 43 are connected to the partition wall 71 of the wafer chamber 80, respectively.
- the other end of the air supply pipe 41 is connected to a low-absorbency gas supply device (not shown), for example, a helium gas supply device.
- the other end of the exhaust pipe 43 is connected to an external gas recovery device. Helium gas is constantly flowing into the wafer chamber 80 in the same manner as described above.
- Similar c and this light transmission window 8 5 is provided on one Y side wall of the partition wall 71 of the wafer chamber 8 0, although it is omitted in the drawings, the partition walls 71 on the + X side (FIG. 1 A light transmission window is also provided on the side wall (on the front side of the drawing).
- These light-transmitting windows are formed by a light-transmitting member that closes a window (opening) formed in the partition wall 71. It is configured by attaching general optical glass.
- a metal seal such as indium or copper, or a fluororesin is used for the mounting part to prevent gas leakage from the part where the light transmitting member constituting the light transmitting window 85 is attached. (Sealing) is applied. It is preferable to use a fluororesin which has been heated at 80 ° C. for 2 hours and degassed.
- a Y moving mirror 255 Y composed of a plane mirror is extended in the X-axis direction.
- a length measuring beam from a Y-axis laser interferometer 255 Y arranged almost perpendicular to the Y moving mirror 250 Y outside the wafer chamber 80 is projected through a light transmission window 85 and reflected by the beam.
- Light is received by the Y-axis laser interferometer 2 57 through the light transmission window 85 by the detector inside the Y-axis, and the Y-axis laser interferometer 2 57 7 Y-moving mirror 2 5 based on the position of the reference mirror inside Y 6
- the Y position that is, the Y position of the wafer W is detected.
- an X moving mirror composed of a plane mirror is extended in the Y-axis direction. Then, the position of the X movable mirror, that is, the X position of the wafer W is detected by the X axis laser interferometer through the X movable mirror in the same manner as described above.
- the detection values (measured values) of the above two laser interferometers are supplied to the stage control system 90 and the main controller 70 via the stage control system 90. Based on this, the position of the wafer stage WST is controlled via a wafer drive system while monitoring the detection values of the two laser interferometers.
- the laser interferometer that is, the optical member such as the laser light source and the prism and the detector are arranged outside the wafer chamber 80, a small amount of light is absorbed from the detector and the like. Even if a volatile gas is generated, this does not adversely affect exposure.
- the other end of the air supply line 50 and the other end of the exhaust line 51 connected to the lens barrel of the projection optical unit PL are connected to a helium gas supply device (not shown). Subsequently, high-purity helium gas is constantly supplied from the helium gas supply device via the air supply line 50 into the lens barrel of the projection optical system unit PL, and the gas inside the lens barrel is discharged via the exhaust line 51. Then, the helium gas supply device may be returned to the helium gas supply device, and the helium gas may be circulated and used in this manner. In this case, it is desirable to incorporate a gas purification device in the helium gas supply device.
- the operation of the projection optical system unit can be performed even if the helium gas is circulated for a long time by the circulation path including the helium gas supply device and the inside of the projection optical system unit PL due to the action of the gas purification device.
- the concentration of absorbent gas (oxygen, water vapor, organic matter, etc.) other than helium gas in PL can be maintained at a concentration of several ppm or less.
- a sensor such as a pressure sensor or an absorptive gas concentration sensor is provided in the projection optical system unit PL, and is built in the helium gas supply device via a control device (not shown) based on the measured value of the sensor. It is also possible to appropriately control the operation and stop of the pump that has been performed.
- a helium gas circulation path similar to the above may be employed in the wafer chamber 80.
- the reticle alignment system and the reference on the wafer stage WST are controlled under the control of the main controller 70.
- Reticle alignment, baseline measurement (measurement of the distance from the detection center of the alignment detection system to the optical axis of the projection optical system unit PL) using a mark plate, ofaxis detection system (all not shown), etc. Is performed according to a predetermined procedure.
- the main controller 70 executes wafer alignment measurement such as EGA (enhanced global alignment) using an alignment detection system (not shown). After the completion of the wafer alignment measurement, an exposure operation of a step-and-scan method is performed. Since this exposure operation is the same as that of a normal scanning stepper (scanner), detailed description is omitted, but the wafer control is performed by the stage control system 90 based on the instruction of the main controller 70 during scanning exposure.
- the follow control of reticle stage RST is performed on WST, the reaction force caused by the movement of reticle stage RS # is canceled by the movement of frame member 18.
- this point will be described.
- the mover of the voice coil motor 30 is driven in the X-axis direction integrally with the reticle stage RS ⁇ .
- the reaction force of the driving force is the stator (armature Yuni' 1 40 1; 1 0 2) of the voice coil motor 30 and thus acting on and the frame member 1 8 to the stator is fixed.
- the frame member 18 is kept out of contact with the reticle surface plate 16 and the illumination system side plate 14 via a predetermined clearance. 18 moves in the direction according to the reaction force by the distance according to the law of conservation of momentum. The reaction force is absorbed by the movement of the frame member 18.
- the above-mentioned jogging moment due to the reaction force of the driving force in the X-axis direction may act on frame member 18.
- the frame-shaped member 18 makes a free motion with a 0z rotation so as to absorb the reaction force in accordance with the law of conservation of momentum by the action of the jowing moment and the reaction force in the X-axis direction.
- each of the movers of the Y-axis linear motors 1 136 1 362, 1 328 and 138 2 There is driven in the Y-axis direction integrally with the reticle stage RS T, the resultant force is the Y-axis linear motor 1 36 1 36 2 of the reaction force of the driving forces of the mover, 1 38 ⁇ , 1 38 2 of the stator and these Acts on the fixed frame member 18.
- the frame-shaped member 18 moves in a direction corresponding to the resultant force of the reaction force by a distance for absorbing the resultant force of the reaction force according to the law of conservation of momentum.
- Y-axis linear motor 1 36 ⁇ , and 1 362, Y-axis linear motor 1 38 ⁇ , 1 38 2 and the driving force for generating a different allowed by the reticle stage RS T a (thrust) 0 Twisted rotation the bowing moment may act on the frame member 18 at that time, but even in such a case, the frame member 18 is also subjected to the joking moment and the reaction force in the Y-axis direction. By the action of, it makes free motion with 0 z rotation to absorb the reaction force according to the law of conservation of momentum.
- the main control device 70 is connected to the stage control system 90 via the stage control system 90 at an appropriate time so as not to affect exposure, for example, so as not to cause a situation such as mixing in the airtight space inside the member 18).
- the frame member 18 is returned to a predetermined reference position by using the three trim motors.
- the pressurized gas supplied from the gas supply device 67 in FIG. Upward in the direction of gravity from the pores 66a, 66b formed in the reticle platen 16 via the aforementioned supply paths 60 (60B, 6OA, 60C, 60D) in 6. , Which are jetted downward in the direction of gravity, and these pressurized gases are supplied to the first recess 56 a of the reticle stage RST driven by the reticle stage drive system. They are received in the third concave portions 56c respectively.
- the pressurized gas received in the first concave portion 56 a on the bottom surface of the reticle stage RST facing the pores 66 a of the reticle platen 16 is formed by the pores 58 a, the tube 16 1, and the pores
- the reticle stage RST is guided to a position different from the first concave portion 56 a on the bottom surface of the reticle stage RST sequentially through 58 b, and is ejected from the bearing portion 57 toward the reticle surface plate 16.
- the reticle stage RST is levitated above the reticle surface plate 16 by the static pressure of the pressurized gas ejected from the bearing portion 57.
- a small reticle stage RST made of a lightweight and high-rigidity material is used.
- the small reticle stage 16 is formed from the pores 66 a of the reticle surface plate 16 through the bottom of the reticle stage RST.
- the RST of the reticle stage RST is not lifted up by the pressure (upward force) of the pressurized gas jetted to the recess 56a. This is because the pressure of the pressurized gas ejected from the fine holes 66 b of the platen is applied to the third concave portions 56 c formed in the angle members 27 A and 27 B fixed to the reticle stage RST.
- the reticle stage RST is levitated and supported in a non-contact manner while maintaining the clearance above the reticle surface plate 16 by the static pressure of the pressurized gas ejected from the bearing portion 57 to the reticle surface plate 16. It is possible.
- the reticle stage RST can be levitated and supported on the reticle surface plate 16 in a non-contact manner without connecting a pipe to the reticle stage RST which is a moving body. Due to dragging In addition, it is possible to prevent a decrease in the position control accuracy (including the positioning accuracy) of the reticle stage RST. In this case, since a small and light reticle stage RST can be used, the position controllability of reticle stage RST can be improved also in this regard.
- an air release portion 39 is provided between the first concave portion 56a and the second concave portion 56b formed on the bottom surface of the reticle stage RST.
- the reticle stage RST since the reticle stage RST does not move while dragging the pipe, and during the exposure in which the reticle stage RST performs a constant velocity movement, almost no thrust is required to maintain the constant velocity movement, It also has the advantage that it is not affected by thrust ripples and other factors of the linear motor.
- the position controllability of the reticle stage RST can be extremely excellent, and as a result, the reticle stage RST at the time of scanning exposure (at the time of synchronous movement) can be obtained. Synchronization accuracy with the wafer stage WST can be improved, and as a result, the pattern formed on the reticle R can be superimposed on each shot area on the wafer W. Accurate transfer becomes possible.
- the communication between the first recess 56a and the second recess 56b is performed.
- the air passage a configuration in which a ventilation pipe formed in the reticle stage main body 22 and a tube 16 1 provided outside the reticle stage main body 22 are combined is adopted.
- the present invention is not limited to this, and all of the ventilation paths may be formed as ventilation pipes formed inside the reticle stage main body 22.
- the tube may communicate with the concave portions 56b.
- the configuration is not limited as long as the first recess 56a and the second recess 56b communicate with each other.
- the bearing portion 57 is formed of a separate member and embedded in the reticle stage bottom surface in the second concave portion 56 b has been described, but the present invention is not limited to this.
- the bearing portion 57 may be formed integrally with the bottom surface of the reticle stage main body 22.
- the pressurized gas supplied to the third concave portion 56c may be used for floating the reticle stage main body 22. That is, for example, as shown in FIG. 10, a ventilation conduit 158 for guiding the pressurized gas supplied to the third concave portion 56 c to the bearing portion 57 is formed.
- the pressurized gas blown out to the portion 56c can be blown out from the bearing portion 57.
- the pressurized gas can be wasted and used, and the pressurized gas does not leak to the vicinity of the reticle, so that the efficiency is high.
- the angle members 27A and 27B and the third recess 56c need not be provided. Is also good.
- the guide portions 16c and 16d may have a plurality of fine holes 66a as the first ejection ports formed along the Y-axis direction.
- a plurality of pores 66b as the outlet of the nozzle may be formed along the Y-axis direction. In this case, it is necessary to determine the position of the pores and the length of the recesses in the Y-axis direction such that the pores 6 6 a and 66 b always face the first recess 56 a and the third recess 56 c. But is there.
- the pressurized gas is supplied to the first concave portion 56a and the third concave portion 56c from one supply path.
- pressurized gas may be supplied to each recess separately (two systems).
- the vacuum suction force of the vacuum pump can be used for holding the reticle. That is, as shown in FIG. 10, a recess 34 a formed on the upper surface of a reticle holder 34 provided at the step of the stepped opening 22 a of the reticle stage main body 22, (2) A through-path (160) communicating with the recess (56b) is formed, and the vacuum suction force of the vacuum pump is applied to the upper surface of the reticle holder (34) to assist the reticle holding force. be able to. As a result, the fixing force of the reticle fixing mechanism 37 can be set low, so that the deformation of the reticle caused by pinching between the reticle fixing mechanism 37 and the reticle holder 34 can be reduced. Can be suppressed.
- the reticle stage R ST is formed by integral molding, but the present invention is not limited to this, and each part may be formed separately. Also, the shape of the reticle stage is not limited to the shape of the reticle stage of the above embodiment, and various shapes can be adopted.
- the stage device according to the present invention is a mask stage device of a proxy-type aligner that transfers a mask pattern onto a substrate by bringing a mask into close contact with a substrate without using a projection optical system, and a batch transfer for liquid crystal.
- the present invention can be suitably applied to a mask stage device or a plate stage device, such as a scanning type exposure apparatus.
- stage apparatus can be applied to an electron beam exposure apparatus of the EBPS system and an exposure apparatus such as a so-called EUVL which uses light in a soft X-ray region having a wavelength of about 5 to 30 nm as exposure light.
- any device that can drive a moving body on which an object (sample) is mounted in a predetermined first axis direction and requires minute driving in a second axis direction and a rotation direction orthogonal to the first axis direction.
- the stage apparatus according to the present invention can be suitably applied to not only the exposure apparatus but also other precision machines.
- the illumination light IL A r F excimer laser beam (wavelength 1 9 3 nm) or F 2 laser beam (wavelength 1 5 7 nm) vacuum ultraviolet light such as, K r F excimer laser far ultraviolet light such as light (wavelength 2 4 8 nm), emission lines in the ultraviolet region from an ultra high pressure mercury lamp (g-rays, I line, etc.) have been based on using, not limited thereto, a r 2 laser beam
- Other vacuum ultraviolet light such as (wavelength 126 nm) may be used.
- vacuum ultraviolet light is not limited to the above laser light
- a single-wavelength laser light in the infrared or visible range oscillated from a DFB semiconductor laser or a fiber laser may be, for example, erbium (Er) (or erbium).
- ytterbium both Y b
- a harmonic converted to a wavelength of ultraviolet light using a nonlinear optical crystal may be used.
- the illumination light IL not only ultraviolet light but also X-rays (including EUV light) or charged particle beams such as electron beams and ion beams may be used.
- the projection optical system may be either a unity magnification system or an enlargement system.
- the projection optical system for example, an Ar 2 laser
- vacuum ultraviolet light for example, as disclosed in Japanese Patent Application Laid-Open No. 3-28257 / 1995 and the corresponding US Pat. No. 5,220,454 / etc.
- a so-called catadioptric system (catadioptric system) combining a refractive optical element and a reflective optical element (concave mirror, beam splitter, etc.), or a reflective optical system composed of only a reflective optical element is mainly used.
- the present invention is not limited to this, and a device pattern used for manufacturing a display including a liquid crystal display element or the like may be square.
- Exposure equipment that transfers onto a glass plate Exposure equipment that transfers device patterns used in the manufacture of thin-film magnetic heads onto a ceramic wafer, and imaging devices (such as CCD), micromachines, organic EL, DNA chips, etc.
- the present invention can be widely applied to an exposure apparatus and the like used for manufacturing.
- micro devices such as semiconductor devices, glass substrates or silicon wafers are used to manufacture reticles or masks used in light exposure equipment, EUV exposure equipment, X-ray exposure equipment, electron beam exposure equipment, etc.
- the present invention can also be applied to an exposure apparatus that transfers a circuit pattern onto a device such as c.
- a transmissive reticle is generally used in an exposure apparatus that uses DUV (far ultraviolet) light or VUV (vacuum ultraviolet) light, and the reticle substrate is quartz glass, fluorine-doped quartz glass, or fluorescent glass. Stone, magnesium fluoride, or quartz is used.
- a transmission type mask stencil mask, membrane mask
- a silicon wafer is used as a mask substrate.
- the present invention may be applied to an immersion exposure apparatus disclosed in, for example, International Publication WO99 / 49504, in which a liquid is filled between a projection optical system unit PL and a wafer.
- the immersion type exposure apparatus may be a scanning exposure type using a catadioptric projection optical system, or a static exposure type using a projection optical system with a projection magnification of 1Z8.
- a large pattern is formed on the substrate Therefore, it is preferable to adopt a step-and-switch method.
- the present invention may be applied to an exposure apparatus having two independently movable wafer stages, as disclosed in U.S. Patent Nos. 6,262,796.
- the illumination optical system and projection optical system composed of multiple lenses are incorporated into the exposure apparatus main body to perform optical adjustment, and a reticle stage consisting of many mechanical parts and a wafer stage are attached to the exposure apparatus main body for wiring and wiring.
- the exposure apparatus of the above embodiment can be manufactured by connecting pipes and performing overall adjustment (electrical adjustment, operation check, etc.). It is desirable to manufacture the exposure equipment in a clean room where the temperature and cleanliness are controlled.
- a step of performing a function design of a device a step of manufacturing a reticle based on the design step, a step of manufacturing a wafer from a silicon material, and a method of using the exposure apparatus of the above-described embodiment are performed. It is manufactured through the steps of transferring the reticle pattern onto the wafer, device assembling steps (including dicing, bonding, and packaging), and inspection steps.
- the stage device of the present invention is suitable for driving a stage in a predetermined direction.
- the exposure apparatus of the present invention is suitable for transferring a pattern formed on a mask onto a photosensitive object via a projection optical system.
- the device manufacturing method of the present invention is suitable for manufacturing micro devices.
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- Environmental & Geological Engineering (AREA)
- Epidemiology (AREA)
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Abstract
Description
Claims
Priority Applications (1)
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JP2005506056A JPWO2004100237A1 (ja) | 2003-05-12 | 2004-05-11 | ステージ装置及び露光装置、並びにデバイス製造方法 |
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JP2003-132454 | 2003-05-12 | ||
JP2003132454 | 2003-05-12 |
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PCT/JP2004/006594 WO2004100237A1 (ja) | 2003-05-12 | 2004-05-11 | ステージ装置及び露光装置、並びにデバイス製造方法 |
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JP (1) | JPWO2004100237A1 (ja) |
TW (1) | TWI338912B (ja) |
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Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2010147245A2 (en) | 2009-06-19 | 2010-12-23 | Nikon Corporation | Exposure apparatus and device manufacturing method |
WO2010147244A2 (en) | 2009-06-19 | 2010-12-23 | Nikon Corporation | Exposure apparatus and device manufacturing method |
WO2010147241A2 (en) | 2009-06-19 | 2010-12-23 | Nikon Corporation | Exposure apparatus and device manufacturing method |
WO2010147243A2 (en) | 2009-06-19 | 2010-12-23 | Nikon Corporation | Exposure apparatus, exposure method and device manufacturing method |
US8355114B2 (en) | 2009-06-19 | 2013-01-15 | Nikon Corporation | Exposure apparatus and device manufacturing method |
US8472008B2 (en) | 2009-06-19 | 2013-06-25 | Nikon Corporation | Movable body apparatus, exposure apparatus and device manufacturing method |
JP2015179295A (ja) * | 2009-08-07 | 2015-10-08 | 株式会社ニコン | 露光装置及びデバイス製造方法 |
CN108730341A (zh) * | 2018-07-26 | 2018-11-02 | 中国工程物理研究院机械制造工艺研究所 | 一种基于气压控制的联锁结构及联锁方法 |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
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DE102007063383B4 (de) * | 2007-12-18 | 2020-07-02 | HAP Handhabungs-, Automatisierungs- und Präzisionstechnik GmbH | Vorrichtung und Verfahren zur Entfernung von Pelliclen von Masken |
TWI464434B (zh) * | 2013-05-15 | 2014-12-11 | Upi Semiconductor Corp | 自動測試裝置及其自動測試方法 |
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- 2004-05-11 JP JP2005506056A patent/JPWO2004100237A1/ja not_active Withdrawn
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Cited By (13)
Publication number | Priority date | Publication date | Assignee | Title |
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US8355114B2 (en) | 2009-06-19 | 2013-01-15 | Nikon Corporation | Exposure apparatus and device manufacturing method |
WO2010147244A2 (en) | 2009-06-19 | 2010-12-23 | Nikon Corporation | Exposure apparatus and device manufacturing method |
WO2010147241A2 (en) | 2009-06-19 | 2010-12-23 | Nikon Corporation | Exposure apparatus and device manufacturing method |
WO2010147243A2 (en) | 2009-06-19 | 2010-12-23 | Nikon Corporation | Exposure apparatus, exposure method and device manufacturing method |
US8294878B2 (en) | 2009-06-19 | 2012-10-23 | Nikon Corporation | Exposure apparatus and device manufacturing method |
US8355116B2 (en) | 2009-06-19 | 2013-01-15 | Nikon Corporation | Exposure apparatus and device manufacturing method |
WO2010147245A2 (en) | 2009-06-19 | 2010-12-23 | Nikon Corporation | Exposure apparatus and device manufacturing method |
US8446569B2 (en) | 2009-06-19 | 2013-05-21 | Nikon Corporation | Exposure apparatus, exposure method and device manufacturing method |
US8472008B2 (en) | 2009-06-19 | 2013-06-25 | Nikon Corporation | Movable body apparatus, exposure apparatus and device manufacturing method |
EP3657258A1 (en) | 2009-06-19 | 2020-05-27 | Nikon Corporation | Stage device |
EP3686675A1 (en) | 2009-06-19 | 2020-07-29 | Nikon Corporation | Exposure apparatus and device manufacturing method |
JP2015179295A (ja) * | 2009-08-07 | 2015-10-08 | 株式会社ニコン | 露光装置及びデバイス製造方法 |
CN108730341A (zh) * | 2018-07-26 | 2018-11-02 | 中国工程物理研究院机械制造工艺研究所 | 一种基于气压控制的联锁结构及联锁方法 |
Also Published As
Publication number | Publication date |
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TW200501227A (en) | 2005-01-01 |
JPWO2004100237A1 (ja) | 2006-07-13 |
TWI338912B (en) | 2011-03-11 |
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