WO2004033997A1 - Measurement device and measurement result display method - Google Patents
Measurement device and measurement result display method Download PDFInfo
- Publication number
- WO2004033997A1 WO2004033997A1 PCT/JP2003/013059 JP0313059W WO2004033997A1 WO 2004033997 A1 WO2004033997 A1 WO 2004033997A1 JP 0313059 W JP0313059 W JP 0313059W WO 2004033997 A1 WO2004033997 A1 WO 2004033997A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- measurement
- range
- display
- screen
- display range
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
- G01D3/02—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups with provision for altering or correcting the law of variation
- G01D3/024—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups with provision for altering or correcting the law of variation for range change; Arrangements for substituting one sensing member by another
Definitions
- the present invention relates to a measurement device and a method of displaying a measurement result.
- an optical spectrum analyzer as a measuring device for measuring a wavelength component contained in an optical signal and a level (light intensity) of the wavelength component.
- An optical spectrum analyzer separates an optical signal into fine wavelength components using a spectroscope, converts each light intensity into an electrical signal by individually receiving each wavelength component, and based on these electrical signals. It generates a measurement screen that shows the relationship between wavelength and light intensity on the horizontal axis (wavelength axis) and the vertical axis (light intensity axis) and displays it on an image.
- Some of such optical spectrum analyzers display an optical frequency instead of a wavelength on the horizontal axis.
- the operator sets the measurement scale (measurement range) of the optical spectrum analyzer by operating and inputting the wavelength range to be measured. Then, by operating and inputting a measurement start instruction, the light intensity over the measurement scale is measured by the optical spectrum analyzer. When the measurement of the light intensity over the measurement scale is completed, the optical spectrum analyzer generates a measurement screen based on the measurement results stored in the internal memory and displays the image.
- the optical spectrum analyzer is described in a known document such as, for example, Japanese Patent No. 287709.
- the above-mentioned conventional optical spectrum analyzer has a function of changing the display range of the obtained measurement result by changing the measurement scale after executing the measurement.
- the optical spectrum analyzer reduces and displays the wavelength range of the measurement result.
- the measurement screen displays the wavelength range displayed on the wavelength axis. Since it is set to a range wider than the measurement scale at the time of measurement execution, the wavelength range of the measurement result is in a compressed state.
- the optical spectrum analyzer will zoom in on a part of the measurement result specified as this display range. I do.
- the wavelength range displayed on the wavelength axis is set to a range narrower than the measurement scale at the time of measurement execution, so that the wavelength range of the measurement result is enlarged. It will be.
- the present invention has been made in view of the above-described problems, and has as its object to improve the usability of a measuring device by changing a display range of a measurement result without changing a measurement scale.
- a predetermined physical quantity included in the measurement signal is specified based on a measurement signal acquired from a measurement target object, to specify the physical quantity.
- a measurement device that measures over a predetermined measurement range related to an attribute and displays the measurement result as an image on a measurement screen.
- the measurement range setting means (M) for setting the measurement range;
- the display range setting means (V) for setting the display range and the measurement results set over the measurement range set by the measurement range setting means (M) are set by the display range setting means (V).
- Measurement screen generating means (6) for generating a measurement screen using the measurement result of the displayed display range, and display means (7) for displaying the measurement screen generated by the measurement screen generation means (6).
- the electric signal level is set to a predetermined frequency range related to a frequency which is a specific attribute of the electric signal.
- the configuration is an electric spectrum analyzer that measures over a wide range.
- the light intensity is converted into a predetermined frequency range or wavelength related to a frequency or wavelength which is a specific attribute of the light intensity.
- An optical spectrum analyzer that measures over a range is adopted.
- the display range setting means (V) takes in the measurement range set by the measurement range setting means (M) as a display range. Is adopted.
- the display range is variable even in the state where the measurement is repeatedly executed without changing the measurement range in any of the first to fourth means.
- the configuration that there is is adopted.
- the display range is a frequency range or a wavelength range to be analyzed when performing an analysis process on the measurement result.
- a seventh means relating to the measuring device a configuration in which the display range is changed in accordance with the frequency value or the wavelength value or the level which is the result of the analysis processing on the measurement result in any one of the first to fourth means. adopt.
- the display range setting means (V) changes the measurement range when the measurement range is changed by the measurement range setting means (M).
- a configuration is adopted in which the measured measurement range is captured as a display range.
- the display range setting means (V) includes a pointing device, and a start point and an end point designated on the measurement screen by the pointing device.
- a configuration is adopted in which the area defined by is set as the display range.
- any of the first to seventh means when the display range is set in the display range setting means (V) as a part of the measurement range, the measurement screen is displayed.
- the generation means (6) employs a configuration in which a measurement screen is generated using the measurement result of the display range, and a measurement screen as a sub-screen is generated using the measurement result of the measurement range.
- the eleventh means relating to the measuring apparatus the configuration in which the display position, the display size, or the display transmittance of the small screen is variable in the tenth means is adopted.
- a twelfth means relating to the measuring apparatus in the above-mentioned tenth means, a configuration is adopted in which a region indicating a display range is displayed by a frame line on a sub-screen.
- the display range is variably set by moving the position of the frame line in the sub-screen using the display range setting means (V). Adopt configuration.
- a predetermined physical quantity included in the measurement signal is applied based on the measurement signal obtained from the measurement object.
- a configuration is adopted in which the display range of the measurement result is individually set for the measurement range, and the measurement result is displayed as an image based on such a display range.
- the electric signal level is determined with respect to a frequency which is a specific attribute of the electric signal.
- a configuration that measures over the frequency range of is adopted.
- the light intensity is changed to a frequency which is a specific attribute of the light intensity or a predetermined frequency related to a wavelength.
- a configuration is adopted in which measurement is performed over a range or wavelength range.
- the display range is variable even when the measurement is repeatedly performed without changing the measurement range in any of the first to third methods.
- Adopt configuration As a fourth means relating to the method of displaying the measurement result, the display range is variable even when the measurement is repeatedly performed without changing the measurement range in any of the first to third methods. Adopt configuration.
- the display range is a frequency range or a wavelength range to be analyzed when performing analysis processing on the measurement result. Is adopted.
- the display range is changed in accordance with the frequency value or the wavelength value or the level which is the result of the analysis processing on the measurement result in any of the first to third means. Is adopted.
- an area defined by a start point and an end point specified in a measurement screen by a pointing device is set as a display range. Is adopted.
- the measurement screen corresponding to the display range is displayed.
- a configuration is adopted in which a measurement screen corresponding to the measurement range is displayed as a child screen.
- the above-mentioned eighth means adopts a configuration in which a region indicating a display range is displayed by a frame line on a sub-screen.
- the above-mentioned tenth means adopts a configuration in which a display range is variably set by moving a position of a frame line in a child screen.
- FIG. 1 is a block diagram showing a functional configuration of an optical spectrum analyzer according to one embodiment of the present invention.
- FIG. 2 is a first flowchart showing the operation of the optical spectrum analyzer according to one embodiment of the present invention.
- FIG. 3 is a second flowchart showing the operation of the optical spectrum analyzer according to one embodiment of the present invention.
- FIG. 4 is a schematic diagram of a display screen displayed on the display unit in the table according to one embodiment of the present invention.
- 5A and 5B are second schematic diagrams of a display screen displayed on the display unit in one embodiment of the present invention.
- 6A to 6C are first schematic diagrams illustrating setting of a display scale according to an embodiment of the present invention.
- FIG. 7A and 7B are second schematic diagrams showing the setting of the display scale in one embodiment of the present invention.
- the present invention is applied to an optical spectrum analyzer.
- FIG. 1 is a block diagram showing a functional configuration of the present optical spectrum analyzer.
- 1 is the measurement scale input section
- 2 is the measurement scale holding section
- 3 is the measurement section
- 4 is the display scale input section
- 5 is the display scale holding section
- 6 is the display calculation section (measurement screen) Generating means
- 7 is a display unit.
- the measuring scale input unit 1 and the measuring scale holding unit 2 constitute the measuring scale setting unit M
- the display scale input unit 4 and the display scale holding unit 5 constitute the display scale setting unit V. It is composed.
- the measurement scale input unit 1 is used by a measurer to operate and input a measurement wavelength range as a measurement scale, and is, for example, a hard keypad such as a numeric keypad or a pointing device such as a mouse.
- the measurement scale holding unit 2 holds the measurement scale input by the measurer at the measurement scale input unit 1, and is, for example, a storage device such as a semiconductor memory.
- the measuring unit 3 applies an optical spectrum characteristic indicating a relationship between the light intensity and the wavelength of an optical signal (measuring light) input as a measuring signal from the object to be measured over the measuring scale held in the measuring scale holding unit 2. It measures, for example, a spectroscope that splits the measurement light into each wavelength component and a photodetector that detects the light intensity of each wavelength component as an electric signal (detection signal).
- the display scale input unit 4 is used by a measurer to operate and input a display wavelength range as a display scale, and is, for example, a hard keypad such as a numeric keypad or a pointing device such as a mouse.
- the display scale holding unit 5 holds the display scale input by the measurer at the display scale input unit 4, and is, for example, a storage device such as a semiconductor memory.
- the display scale setting means V composed of the display scale input section 4 and the display scale holding section 5 has the above-described measurement scale input section 1, measurement scale holding section 2, It is provided separately from the measurement scale setting means M composed of Note that the configuration in which the display scale setting means V is provided separately from the measurement scale setting means M means that the two are functionally separated, and a single piece of hardware is used as the display scale setting means V and the measurement scale setting means V. It may be realized by switching the mode to the scale setting means M.
- the display calculation unit 6 is configured to output the waveform corresponding to the display scale held in the display scale holding unit 5 from the measurement results of the optical spectrum characteristics measured by the measurement unit 3.
- the measurement screen is generated using the measurement results in the long range.
- Such a display operation unit 6 is composed of, for example, a central processing unit (CPU) that operates according to a dedicated measurement screen generation program.
- the display unit 7 displays an image of the measurement screen input from the display calculation unit 6, and is displayed on a liquid crystal display or a CRT device, for example.
- FIG. 2 is a flowchart showing an operation example of the present optical spectrum analyzer.
- the operator inputs the measurement wavelength range as the measurement scale to the optical spectrum analyzer using the measurement scale input unit 1. I do.
- the optical spectrum analyzer causes the measurement scale holding unit 2 to hold the measurement wavelength range.
- the measurement unit 3 performs the measurement over the measurement wavelength range held in the measurement scale holding unit 2. Measure the light intensity of the wavelength (step S3).
- the display calculation unit 6 sequentially takes in the light intensity of each wavelength input from the measurement unit 3 and stores it in the internal memory as light intensity data corresponding to each wavelength, and further displays the display held in the display scale holding unit 5
- the light intensity data in the wavelength range corresponding to the scale is read from the internal memory to generate measurement screen data (Step S4).
- the display calculation unit 6 updates the measurement screen by outputting the measurement screen data thus generated to the display unit 7 (Step S5).
- This measurement screen shows the relationship of the light intensity at each wavelength, with the horizontal axis representing the wavelength axis representing each wavelength and the vertical axis representing the light intensity axis representing the light intensity at each wavelength.
- the measurer wants to expand or contract the wavelength axis on the measurement screen
- he or she operates the operation unit to input a display scale change instruction to the optical spectrum analyzer.
- the display calculation section 6 receives the instruction to change the display scale from the operation section (step S6), and further operates the display scale input section 4 to newly display the display scale holding section 5.
- Step S7 a new measurement screen data is generated using the light intensity data corresponding to the new display wavelength range (step S4), and the new measurement screen data is displayed on the display unit 7.
- the measurement screen is updated by outputting (step S5).
- the measurement scale is held in the measurement scale holding unit 2, while the display scale is held in the display scale holding unit 5. That is, since the measurement scale and the display scale are individually set, the measurement scale is not changed even if the display scale is changed. Therefore, it is possible to independently change only the display scale without changing the setting of the measurement scale, that is, to freely expand the wavelength axis.
- the optical spectrum analyzer is configured so that the display range can be variably set even during measurement by operating the display scale input unit 4. That is, even while the measurement of the measurement light is being repeatedly performed on the predetermined measurement scale, the display scale can be changed to an arbitrary wavelength range and the measurement result can be displayed on the display unit 7.
- FIG. 3 is a flowchart showing another operation example of the optical spectrum analyzer.
- the display scale is undefined. In other words, when the measurement is executed after setting the measurement scale, the measurement screen data is generated even if the display scale is not set. However, at this time, the display scale is not set, so it is undefined.
- the measurement screen is displayed on the display unit 7 while avoiding such an unstable state of the display scale. That is, when a measurement start command is input from the operation unit (step S10) and a measurement start instruction is input from the operation unit (step Sll), the display calculation unit 6 receives a new input after that. It is determined whether the measurement scale (new measurement scale) is different from the measurement scale immediately before the input (old measurement scale) (step S12). Here, if the new measurement scale is different from the old measurement scale, the display scale is reset by setting the measurement scale to the display scale (step S13). On the other hand, if the new measurement scale is the same as the old measurement scale, the next processing is executed without resetting the display scale. Yes (step S14). The processing after step S14 is the same as in the case of FIG. 2 described above.
- the display scale is reset by the measurement scale because the old measurement scale is indeterminate and different from the new measurement scale. You. For this reason, the display scale when the measurement scale is set first and the measurement is executed is not undefined. Also, when the measurement scale is changed and the measurement is executed, the display scale is automatically reset by the measurement scale. Even if the display scale is not changed after the measurement is executed, the measurement wavelength range is not changed after the measurement is executed. The total light intensity data is automatically displayed on the measurement screen.
- FIG. 4 is a schematic diagram of a partial display area of the display screen of the display unit 7, that is, the waveform display unit 8.
- the measurement screen generated by the display operation unit 6 has an optical spectrum in which the horizontal axis represents the wavelength (Wavelength) (nm) and the vertical axis represents the light intensity (LeveD (dBm)) for each wavelength. Displayed as a characteristic.
- the upper diagram shows a measurement screen when the measurement is performed with the measurement scale set from 1540 nm to 1560 nm. Since the display scale is reset by the measurement scale when the measurement is performed, the display scale has the same wavelength of 1540 nm to 1560 nm as the measurement scale. On this measurement screen, eight signal components with different wavelengths included in the wavelength range from 1540 nm to 1560 nm are displayed. On the other hand, the lower figure is an enlarged view of one of the above signal components, and the measurement screen shown in the upper figure is displayed on the display unit 7 without changing the measurement scale. This is a measurement screen when only the display scale is reset from the wavelength of 1548 nm to the wavelength of 1550 nm and displayed.
- the display scale is set narrower than the measurement scale.
- measuring instruments such as optical spectrum analyzers have a function to analyze the measurement results such as the peak value of the light intensity and the spectrum width.
- FIGS. 5A and 5B are schematic diagrams showing other examples of the display screen.
- Figure 5A shows the measurement displayed on the waveform display section 8 when the display scale is set from 1548 nm to 1550 nm after the measurement is performed with the measurement scale set from 1540 nm to 1560 nm. Screen. On this measurement screen, the waveform of the display scale from 1548 nm to 1550 nm is displayed, while the entire measured wavelength range, that is, the entire light intensity data from 1540 nm to 1560 nm is displayed as the entire waveform display section 9. The child screen is displayed.
- a part of the measured light intensity data is enlarged and displayed on the waveform display section 8 and the entire light intensity data is displayed on the entire waveform display section 9 so that the two can be compared.
- Observation of the measurement result can be performed while performing.
- Whether or not to display the entire waveform display section 9 on the display section 7 can be arbitrarily set by a measurer by an operation input from the operation section.
- the display transmittance, the display position, and the display size when displaying the entire waveform display section 9 can be arbitrarily set by the measurer through operation input from the operation section.
- FIG. 5B is an enlarged view of the entire waveform display section 9 as a sub-screen.
- the entire range display section 9 shows the range enlarged and displayed on the waveform display section 8 as a display range display section 10.
- the display range display section 10 is displayed in the entire waveform display section 9 as, for example, a dotted rectangular frame line.
- FIGS. 6A to 6C are schematic diagrams showing a method of setting a display scale in the present optical spectrum analyzer.
- FIG. 6A is a measurement screen displayed on the waveform display section 8 when the measurement is performed with the measurement scale set from the wavelength of 1540 mn to the wavelength of 1560 mn.
- the operator sets the display scale by using the mouse of the display scale input section 4 to specify the start point and the end point of the display scale range.
- the measurer wants to position the mouse cursor 11 at the start point of the range to be set as the display scale as shown in the figure, and to set the display scale while dragging the mouse button as shown in Figure 6B.
- Mouse force to the start of the range move sol 1 1 and release the mouse button.
- the area 12 defined by the start point and the end point of the mouse cursor 11 is enlarged and displayed on the waveform display section 8, and the entire waveform display section 9 is displayed on the sub-screen. Is displayed.
- a mouse as the display scale input unit 4 as described above, not only the enlarged display in the wavelength axis direction but also the enlarged display in the level axis direction can be easily performed.
- the entire waveform display section 9 displays a display range display section 10 corresponding to the area 12 defined by the start point and end point specified by the mouse.
- the designation of the starting point and the ending point may be performed by numerically specifying the vertical axis and / or the horizontal axis by using a numeric keypad for the display scale input unit 4. For example, it is possible to set the starting wavelength and the end wavelength on the horizontal axis (that is, the wavelength range) numerically, or to set the lower limit light intensity and the upper limit light intensity on the vertical axis (that is, light intensity range) numerically. good.
- FIG. 7A and 7B are diagrams showing another method of setting the display scale in the present optical spectrum analyzer.
- FIG. 7A is an enlarged view of the entire waveform display section 9.
- the entire waveform display section 9 displays the display range display section 10 indicating the display range of the measurement result.
- the operator sets the mouse cursor 11 inside the display range display section 10 as shown in the figure, and drags the mouse button. .
- the waveform display range section 10 moves while keeping the vertical and horizontal sizes in accordance with the movement of the mouse cursor 11.
- the present invention is applied to an optical spectrum analyzer.
- the present invention is applied not only to such an optical spectrum analyzer but also to, for example, an electric spectrum analyzer for measuring the frequency characteristics of an electric signal. It is possible. Industrial potential
- a predetermined physical quantity included in the measurement signal is measured over a predetermined measurement range related to a specific attribute of the physical quantity.
- a measurement device for displaying an image of the measurement result as a measurement screen, a measurement range setting means for setting a measurement range, a display range setting means for setting a display range of the measurement result separately from the measurement range,
- a measurement screen generating means for generating a measurement screen using a measurement result of the display range set by the display range setting means among measurement results measured over the measurement range set by the range setting means; Display means for displaying the measurement screen generated by the surface generation means, so that the display range of the measurement results can be changed without changing the measurement scale.
- the usability of the measuring device can be improved.
Landscapes
- Engineering & Computer Science (AREA)
- Technology Law (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectrometry And Color Measurement (AREA)
- Controls And Circuits For Display Device (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Description
Claims
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10393448T DE10393448T5 (en) | 2002-10-10 | 2003-10-10 | Measuring device and method for displaying a measurement result |
US11/101,307 US7456626B2 (en) | 2002-10-10 | 2005-04-07 | Measurement device and method for displaying measurement result |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002-297153 | 2002-10-10 | ||
JP2002297153A JP4254193B2 (en) | 2002-10-10 | 2002-10-10 | Measuring apparatus and display method of measurement result |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US11/101,307 Continuation US7456626B2 (en) | 2002-10-10 | 2005-04-07 | Measurement device and method for displaying measurement result |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2004033997A1 true WO2004033997A1 (en) | 2004-04-22 |
Family
ID=32089257
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2003/013059 WO2004033997A1 (en) | 2002-10-10 | 2003-10-10 | Measurement device and measurement result display method |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP4254193B2 (en) |
DE (1) | DE10393448T5 (en) |
WO (1) | WO2004033997A1 (en) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4813774B2 (en) * | 2004-05-18 | 2011-11-09 | テクトロニクス・インターナショナル・セールス・ゲーエムベーハー | Display method of frequency analyzer |
JP4670289B2 (en) * | 2004-09-14 | 2011-04-13 | セイコーエプソン株式会社 | Display control device |
JP5265102B2 (en) * | 2006-10-18 | 2013-08-14 | 株式会社日立ハイテクノロジーズ | Display control apparatus, display control method, and display control program |
JP2010071742A (en) * | 2008-09-17 | 2010-04-02 | Hitachi Software Eng Co Ltd | Measurement data display device |
JP2011075440A (en) * | 2009-09-30 | 2011-04-14 | Toshiba Corp | Image display device |
JP5456581B2 (en) * | 2010-06-01 | 2014-04-02 | 日置電機株式会社 | Measuring apparatus and elapsed time display method |
US9207269B2 (en) * | 2012-05-22 | 2015-12-08 | Tektronix, Inc. | Automatically detecting in-band but out-of-span power in a frequency-domain test and measurement instrument |
JP6242630B2 (en) * | 2013-08-26 | 2017-12-06 | 横河電機株式会社 | Light measuring device |
JP7074501B2 (en) * | 2018-02-27 | 2022-05-24 | 日置電機株式会社 | Waveform display device and waveform display method |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03273113A (en) * | 1990-03-23 | 1991-12-04 | Toshiba Corp | Trend graph power varying device |
JPH0968438A (en) * | 1995-08-31 | 1997-03-11 | Hioki Ee Corp | Electric measuring apparatus |
JPH1184015A (en) * | 1997-09-01 | 1999-03-26 | Rigaku Corp | Displaying method of peak location of measurement profile in x-ray diffracting device |
JP2002014118A (en) * | 2000-06-29 | 2002-01-18 | Anritsu Corp | Measuring instrument |
-
2002
- 2002-10-10 JP JP2002297153A patent/JP4254193B2/en not_active Expired - Lifetime
-
2003
- 2003-10-10 DE DE10393448T patent/DE10393448T5/en not_active Ceased
- 2003-10-10 WO PCT/JP2003/013059 patent/WO2004033997A1/en active Application Filing
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03273113A (en) * | 1990-03-23 | 1991-12-04 | Toshiba Corp | Trend graph power varying device |
JPH0968438A (en) * | 1995-08-31 | 1997-03-11 | Hioki Ee Corp | Electric measuring apparatus |
JPH1184015A (en) * | 1997-09-01 | 1999-03-26 | Rigaku Corp | Displaying method of peak location of measurement profile in x-ray diffracting device |
JP2002014118A (en) * | 2000-06-29 | 2002-01-18 | Anritsu Corp | Measuring instrument |
Also Published As
Publication number | Publication date |
---|---|
DE10393448T5 (en) | 2005-09-29 |
JP2004132815A (en) | 2004-04-30 |
JP4254193B2 (en) | 2009-04-15 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US7443396B2 (en) | Instrument having a virtual magnifying glass for displaying magnified portions of a signal waveform | |
JP2002005965A (en) | Oscilloscope operation method | |
WO2004033997A1 (en) | Measurement device and measurement result display method | |
JP2007052011A (en) | Trigger function setting method | |
JP5386061B2 (en) | Frequency component measuring device | |
JP2018009844A (en) | Mass spectrometry data analysis method | |
JP2009085942A (en) | System and method for providing signal analysis data | |
JP7476904B2 (en) | Flicker measuring device and measuring method | |
JP4675300B2 (en) | Signal analyzer and frequency domain data generation method | |
JP5338191B2 (en) | Waveform display device | |
JP2010032277A (en) | Instrumental analysis data processing device | |
US7456626B2 (en) | Measurement device and method for displaying measurement result | |
JP5855610B2 (en) | Signal processing apparatus and signal processing method | |
JP2000039454A (en) | Electronic measuring instrument and method for controlling the same | |
JP2011027583A (en) | Display data generator and device and method of displaying measurement result | |
JP2009092497A (en) | Frequency characteristic measuring device | |
JP7247844B2 (en) | Optical analysis device and method | |
JP5115794B2 (en) | measuring device | |
JP3407667B2 (en) | Data display method and measuring device using the same | |
JP2005189065A (en) | Waveform determination device | |
WO2023017558A1 (en) | Mass spectrometry assistance method, mass spectrometry assistance device, and mass spectrometry system | |
JP3180617B2 (en) | Sweep generator | |
JPH03199921A (en) | Signal testing apparatus | |
JP2023103188A (en) | Test and measurement instrument, and method of operating test and measurement instrument | |
JPH10282060A (en) | Mass spectrometer |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
AK | Designated states |
Kind code of ref document: A1 Designated state(s): DE US |
|
WWE | Wipo information: entry into national phase |
Ref document number: 11101307 Country of ref document: US |
|
RET | De translation (de og part 6b) |
Ref document number: 10393448 Country of ref document: DE Date of ref document: 20050929 Kind code of ref document: P |
|
WWE | Wipo information: entry into national phase |
Ref document number: 10393448 Country of ref document: DE |
|
REG | Reference to national code |
Ref country code: DE Ref legal event code: 8607 |