WO2000031799A1 - Microcircuit integre, circuit integre, carte a circuits imprimes et dispositif electronique - Google Patents
Microcircuit integre, circuit integre, carte a circuits imprimes et dispositif electronique Download PDFInfo
- Publication number
- WO2000031799A1 WO2000031799A1 PCT/JP1999/006480 JP9906480W WO0031799A1 WO 2000031799 A1 WO2000031799 A1 WO 2000031799A1 JP 9906480 W JP9906480 W JP 9906480W WO 0031799 A1 WO0031799 A1 WO 0031799A1
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- WIPO (PCT)
- Prior art keywords
- integrated circuit
- input
- chip
- substrate
- terminals
- Prior art date
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- 239000000758 substrate Substances 0.000 claims abstract description 46
- 239000000523 sample Substances 0.000 claims description 23
- 238000007689 inspection Methods 0.000 claims description 9
- 230000010354 integration Effects 0.000 claims description 3
- 238000007789 sealing Methods 0.000 claims description 2
- 238000012360 testing method Methods 0.000 abstract description 33
- 210000003739 neck Anatomy 0.000 abstract description 2
- 230000008878 coupling Effects 0.000 abstract 1
- 238000010168 coupling process Methods 0.000 abstract 1
- 238000005859 coupling reaction Methods 0.000 abstract 1
- 230000000052 comparative effect Effects 0.000 description 14
- 238000013461 design Methods 0.000 description 10
- 239000004065 semiconductor Substances 0.000 description 8
- 238000004519 manufacturing process Methods 0.000 description 7
- 238000012545 processing Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 230000002093 peripheral effect Effects 0.000 description 3
- 230000001681 protective effect Effects 0.000 description 3
- 239000011347 resin Substances 0.000 description 3
- 229920005989 resin Polymers 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 238000004806 packaging method and process Methods 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005755 formation reaction Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 239000012260 resinous material Substances 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
- 230000002195 synergetic effect Effects 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
- H01L22/32—Additional lead-in metallisation on a device or substrate, e.g. additional pads or pad portions, lines in the scribe line, sacrificed conductors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/0203—Particular design considerations for integrated circuits
- H01L27/0207—Geometrical layout of the components, e.g. computer aided design; custom LSI, semi-custom LSI, standard cell technique
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
- H01L2224/491—Disposition
- H01L2224/4912—Layout
- H01L2224/49171—Fan-out arrangements
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/14—Integrated circuits
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/30—Technical effects
- H01L2924/301—Electrical effects
- H01L2924/3025—Electromagnetic shielding
Definitions
- the present invention relates to an integrated circuit chip in which a plurality of circuit modules are integrated, an integrated circuit element in which the integrated circuit chip is packaged, and an integrated circuit chip.
- the present invention relates to an electronic device equipped with the integrated circuit element.
- the number of (I / o terminals) is ever increasing.
- the Izo terminals are arranged such that the chips are arranged in a line along the edge. For example, if the chip shape is a rectangle, it is arranged so as not to be between the four sides.
- the IZ ⁇ terminal usually has a bonding pad and a buffer circuit.
- the buffer circuit is a circuit for protecting the circuit module inside the chip from external noises and the like, and has a relatively large capacity. It is composed of the evenings and the like.
- the bonding pad inside the IZ terminal of the chip is connected to the external draw-out terminal arranged on the hook and the wire-bonding terminal. The connection is made by the ding, and the connection is sealed in the package.
- the integrated circuit chip and the printed circuit board are connected. It is said that the package and the circuit modules on the chip are protected by the package, which can improve reliability. There are advantages.
- Another method is the so-called direct bonding method, in which a chip is directly bonded to a printed circuit board.
- the direct bonding does not enclose the chip in the package, but directly connects the so-called bare chip (bare P) to the printed circuit board.
- bare P bare chip
- the pitch of the IZ0 pin has not been much smaller than before. This is because adjacent wires are not connected during wire bonding. In order to avoid electrical shorts between the doors and the electrical shorts between the door and the adjacent leads, the wiring between the doors and the wires should be avoided. This is because it is not possible to reduce the distance between the layer and the adjacent lead to a certain level or less.
- FIG. 2 is a cross-sectional view showing the structure of the integrated circuit device 20 packaged in the integrated circuit chip 10 of FIG.
- FIG. 8 is a cross-sectional view of the electronic device 100 of FIG. 7 of the present invention taken along line C--C.
- FIG. 1 an integrated circuit chip 10 and an integrated circuit element 20 in which the chip 10 is packaged are shown in FIG.
- the integrated circuit chip 10 described with reference to FIGS. 2 and 3 (a) and (b) has a horizontal length ax vertical length b as shown in FIGS. 1 and 3 (a).
- the semiconductor device has a rectangular semiconductor substrate 1 and 34 I / ⁇ terminals 2 arranged on the four sides thereof in a row with a pitch c without gaps. Circuit modules 6, 7, and 8 and six IZ0 terminals 4 are arranged in the internal area surrounded by the I / O terminal 2.
- the IZO terminal 4 allows the circuit modules 6, 7, and 8 to operate normally during the manufacture of the chip 10 and during inspection before shipment. IZO terminals for testing to input and output signals to check for color, film deposition and etching during fabrication of integrated circuit chip 10 IZO terminal, reverser, or ⁇ IST (Built-in Self Test) / BISR (Bui 1 t) used to check the -in I / O terminals for in-self-repair (ir).
- the 1 / ' ⁇ terminal 4 is also referred to as a test I / O terminal.
- the I / O pin 2 is used for wire bonding ⁇ for wire bonding. And a notch circuit (not shown) for connecting the bonding node 3 and the circuit modules 6, 7, 8 to each other.
- FIG. 1 the The surface is covered with a protective film 9 made of resin (FIG. 3 (a)).
- the protective film 3 has through holes formed in the bonding pad 3 and the probe pad 5. The upper surfaces of pad 3 and probe pad 5 are exposed.
- the integrated circuit element 20 is composed of a chip 10, an island 11 on which the chip 10 is mounted, a lead 12, and a resinous material for sealing these. It has packages 13 and 13. Each lead 12 is connected to a bonding pad 3 of the IZO terminal 2 of the chip 10 by a lead 14.
- Pad 5 of I Z ⁇ terminal 4 is not connected to lead 12. This is because it is necessary to connect to the wiring of the printed circuit board because the IZ ⁇ terminal 4 is an operation test terminal etc. as already described. It is.
- the IZO terminal required for the chip 10 is connected to the user's IZO terminal 2 that needs to be connected to the mounted printed circuit board, and the test etc. Select the test IZ ⁇ terminal 4 which is used for the test and does not need to be connected to the printed circuit board. And for the user
- the IZ ⁇ terminals 2 are laid out so as to be arranged in a line without any gap around the substrate 1 as shown in FIG. 1, and the circuit modules 6, 7, 8 Design the IZ ⁇ terminal 4 for test to be placed in the internal area surrounded by the IZO terminal 2 for user.
- the size of the substrate 1 is the minimum size a Xb required in this arrangement.
- a semiconductor wafer is used as the substrate 1, and the circuit modules 67, 8 and I / O are formed by using semiconductor technologies such as film formation, diffusion, and photolithography. o
- the terminals 2 and 4 are formed on the substrate 1. After that, the protective film 9 is formed. Further, the semiconductor wafer is diced, a substrate 1 having a size of aXb is cut out, and a chip 10 is completed.
- the outlet 40 has an opening 43 in the center, and probes 41 and 42 are planted around the opening 43.
- the number of the probes 41 and 42 is slightly smaller for the sake of illustration, and in fact, the number of the probes 41 is It has the same number as the Izo terminal 2 for the user of chip 10.
- the number of the probes 42 is the same as the number of the test I / O terminals 4 of the chip 10.
- the tips of the probes 41 and 42 are gathered toward the area where the chip 10 is located at the center of the opening 43.
- the tip of the probe 41 is arranged at a fixed interval so as to contact each of the bonding pads 3 of the IZ terminal 2 around the tip 10. It has been.
- chip 10 is packaged.
- the chip 10 is die-bonded (Die Bonding) on the airframe's airland 11, the user's IZ ⁇ terminal A bonding connection is made between the bonding node 3 of No. 2 and the lead 12 of the lead frame by the wire 14 (FIG. 2). No bonding is performed on the pad 5 of the test IZO pin 4.
- the connection portion of the chip 10 and the lead 12 is sealed in the resin package 13, and the lead 12 and the ground are sealed.
- the lead 1 is separated from the lead frame card, and the U-lead 12 is bent to complete the integrated circuit element 20.
- the chip 10 of the present embodiment selects the I / O 0 terminal into a user IZO terminal 2 and a test IZO terminal 4, and In this configuration, only the IZO terminal 2 is arranged around the tip 10. For this reason, it is possible to reduce the chip size compared to a conventional chip in which all the IZO pins are arranged around the chip. It becomes. Also, on chip 10 Since the number of IZO pins required for bonding is small, bonding can be performed in a short time, and manufacturing efficiency is improved. . On the other hand, in the case where the chip 10 has the same size as the conventional chip, the number of IZ0 terminals to be arranged around the chip 10 is small.
- the IZO terminal 2 for the user can be arranged with a margin by a small amount, the spacing between the bonding members 14 and the bonding members It is possible to secure a sufficient distance between the adjacent F 1 and F 1 2, thereby reducing the incidence of defects.
- chip 1 Since the size of the chip 10 can be made smaller than before, the size of the integrated circuit element 20 after the package is reduced by that amount. As a result, the area occupied on the printed circuit board is reduced, and the mounting efficiency is improved. Also, chip 1
- the number of terminals IZ ⁇ terminals 2 to be arranged around the chip 10 is smaller than before. Therefore, the interval between leads 12 becomes wider than before. Therefore, when mounting the integrated circuit element 20 on the printed circuit board and attaching it to the solder, the adjacent leads 12 and 12 are connected to each other by the Haneda. This has the effect of reducing the rate of occurrence of defects such as shots.
- Chip 90 of the comparative example has a total of 40 terminals, 34 IZO terminals 2 for user and 4 IZO terminals 4 for test. They are arranged in a line along the edge of the substrate 1.
- the I / ⁇ terminal 2 has a bonding node 3 as shown in FIG. 10, and the I / O terminal 4 has a pad 5 (not shown).
- the pitch C of the IZO terminals 2 and 4 in FIG. 9 is the same as the pitch C of the IZ terminal 2 in FIG. 1 of the above-described embodiment, but is arranged around the circumference. Since the number of IZO terminals is larger by the number of I / ⁇ terminals 4 for test than in FIG. 1, the lengths d and e of one side of substrate 1 are the same as those of substrate 1 in FIG. Each is longer than the length a.
- the circuit modules 96, 97, and 98 of the chip 90 of the comparative example have the same circuit configuration as the circuit modules 6, 7, and 8 of the above-described embodiment. However, it is designed with coarser design rules than circuit modules 6, 7, and 8. For this reason, the area occupied on the substrate 1 of the circuit modules 96, 97, and 98 is large. Therefore, the area surrounded by the IZ0 terminals 2 and 4 in the chip 90 is almost occupied by the circuit modules 96, 97 and 98. Have been
- the design rules of the circuit modules 96, 97, and 98 of the chip 90 of the comparative example are miniaturized in the same manner as in the present embodiment.
- the design module was changed to another, and a chip 91 of another comparative example was obtained (FIG. 9 (b)).
- the pitch of the IZO terminals 2 and 4 maintained the spacing between the bonding wires at a certain level or more. For this reason, it cannot be smaller than pitch c. Therefore, the length of one side of the substrate 1 can be made smaller than the lengths d and e, even though the substrate 1 has an empty area inside. Absent . For this reason, the chip 91 is not smaller than the chip 90 of the comparative example, even though the design rule is miniaturized, and IZo is smaller than that of the comparative example.
- the number of terminals 2 and 4 determines the size of the board 1, and is a so-called pad-chip.
- the IZ terminal 2 A configuration is conceivable in which the two are arranged in two rows around the substrate 1.
- the area inside the board 1 can be used, and the size of the board 1 is the same.
- the number of IZo terminals 2 can be increased up to about 1.5 times.
- the configuration in which the Izo terminals 2 are arranged differently from each other requires the outer peripheral side for the purpose of preventing the banding member's connection. And a bonding wire connected to the I / o terminal 2 of the It is necessary to secure a certain distance or more from the bonding wire connected to the I / ⁇ terminal 2 on the inner peripheral side. For this reason, as shown in Fig. 10 (b), widen the interval between the outer Izo terminals 2 and position the inner I / O terminal 2 between them. Must be deployed. Also, if the position of pad 3 of the I / o terminal 2 on the inner peripheral side is too far from the edge of the board 1, the bonding in the current bonding apparatus is not performed.
- the pad 3 of the inner I-terminal 2 must be located in the immediate vicinity of the outer IZ 0 terminal 2 to prevent the If you don't have it, you will have severe restrictions. Therefore, the design for optimizing the arrangement of the I / O terminal 2 becomes considerably complicated.
- the chip 10 of the present embodiment described above has the IZ ⁇ terminal connected to the user I / o terminal. 2 and a test IZO terminal 4, and the test Izo terminal 4 may be arranged in an empty area inside the substrate.
- the test I / ⁇ terminal 4 does not bond, it is a place where the measurement using the probe force 40 described above can be performed. If this is the case, it can be placed anywhere in a vacant area, such as a position distant from the edge of the substrate 1, and the degree of freedom is extremely large.
- the design of the chip 10 can be easily performed, and the chip size can also be reduced by eliminating the node network. You can do it.
- the bonding can be performed easily. Thus, a direct cost down can be realized.
- the chip 10 according to the present embodiment is not only required to reduce the number of test I / O chips 4, but also has an internal area of the substrate 1. If there is room in the space, it is possible to increase the number of IZO terminals 4 for test. Therefore, it is possible to obtain a chip 10 having a sufficient test IZ ⁇ terminal 4 necessary for confirming the operation of the circuit modules 6, 7, and 8 and determining conditions. As a result, the detection rate of defective products can be increased, and the conditions at the time of production can be easily determined. Therefore, the high-quality chip 10 can be manufactured with a high yield.
- test IZO terminals 4 are arranged in the internal area of the substrate 1. However, if the size of the substrate 1 permits, some of the test IZO terminals 4 may be used. It is also possible to arrange the I-no terminal 4 for the user together with the IZ-terminal 2 for the user around the substrate 1. Also, even if the test IZ terminal 4 is also used as the user IZO terminal 2 or after being mounted on a printed circuit board, A test IZO terminal 4 for inputting / outputting a test signal via a circuit board is arranged around the circuit board 1 for bonding.
- the IZO terminal 2 for the user and the IZ terminal 4 for the test are limited to the number and shape shown in FIG. 1 of the present embodiment.
- the shape of the substrate 1 can be changed as necessary, and the shape of the substrate 1 is not limited to the square shown in FIG.
- FIGS. 5 to 8 a printed circuit board mounted with the integrated circuit element 20 of the first embodiment is described. A brief description of 50, and an electronic device 100 equipped with the printed circuit board will be given.
- the printed circuit board 50 is provided with the integration circuit of the first embodiment.
- the circuit element 20 and the circuit elements 51, 52, 53 are mounted by soldering.
- the circuit dedicated to image processing is an integrated circuit element.
- An input / output control circuit is formed as a circuit module 52, and a memory circuit is formed as an integrated circuit in the integrated circuit 53, respectively.
- a circuit element 54 On the printed circuit board 50, other than these, the circuit element 54, the connectors 55, 56, 57, 58, and the wiring (not shown) are also provided.
- the wiring On board
- the printed circuit board 50 is mounted on the housing 110 of the electronic device 100 as shown in FIG.
- the electronic device 100 is an entertainment device, and as shown in FIG. 6 and FIG.
- the main processor of the integrated circuit element 20 is used to store the image stored in the DVD set in the tray 101 of the disk device 103. Performs the operation of displaying on the display device or the operation of reading a program recorded in advance on a DVD or CD. Then, according to the program, the image generation circuit instructs the image processing circuit of the integrated circuit element 51 to generate an image, and generates the image. An operation of displaying an image on an image display device is performed.
- the main processor of the integrated circuit element 20 receives the operation performed by the user on the switch 210 of the operation device 200. Then, an instruction is given to the image processing circuit of the integrated circuit element 51 so as to change the image according to the above-mentioned program. As a result, the image on the image display device changes, and the user can enjoy games and the like.
- the main opening sensor of the integrated circuit device 20 stores the progress of the game mounted on the slot unit 106 in the memory device. You
- a power supply unit ⁇ and a switch / inlet unit 116 are provided inside the housing 110. Inside the housing 110, in addition to the printed circuit board 50, a power supply unit ⁇ and a switch / inlet unit 116 are provided. Are located. In addition, a pipe-type heat sink 114 is disposed on the upper part of the printed circuit board 50 to release heat of the integrated circuit 20 and the like. The heat sink 114 is connected to the heat radiating fin 112. An exhaust fan 115 for exhausting heat from the heat-dissipating fins 112 and the like is attached to the housing 110. The printed circuit board 50 is also provided with a shield 113 for protecting the integrated circuit element 20 and the like from external electromagnetic waves.
- the integrated circuit element 20 mounted on such a printed circuit board 50 has the configuration described in the first embodiment, it has a small size. Since it is a device, its mounting efficiency is high. Therefore, a small printed circuit board 50 can be realized. Along with this, the size of the entire electronic device 100 can be reduced. It works. Further, since the integrated circuit element 20 can be manufactured at a low cost, the cost of the printed circuit board 50 and the electronic device 100 can be reduced.
- the printed circuit board 50 is formed in the form of an integrated circuit element 20 in which the chip 10 is packaged.
- the nap 10 can also be configured to be directly bonded to the printed circuit board 50 by direct bonding.
- the substrate 50 and the electronic device can be realized.
- the pad 3 of the user IO terminal 2 which can provide the circuit board 50 and the electronic device 100, is a bond in the present embodiment.
- the integrated circuit element 20 of the electronic device 100 described above performs a complicated operation of a plurality of devices such as a disk 103, an operation device 200, a memory device, and an image display device. It requires a number of IZ ⁇ terminals to be used for control. Therefore, as a chip 10 of an integrated circuit element 20 of a device such as an electronic device 100, the configuration step of the first embodiment is described. The use is particularly effective in terms of conversion and low cost. As described above, according to the present invention, padding is avoided, and the chip size is optimized for the circuit size. It is possible to provide a stacking circuit chip that can do this.
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- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Semiconductor Integrated Circuits (AREA)
- Tests Of Electronic Circuits (AREA)
- Lead Frames For Integrated Circuits (AREA)
Description
Claims
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CA002351417A CA2351417A1 (en) | 1998-11-20 | 1999-11-19 | Integrated circuit chip, integrated circuit, printed-circuit board and electronic device |
AU11844/00A AU1184400A (en) | 1998-11-20 | 1999-11-19 | Integrated circuit chip, integrated circuit, printed-circuit board and electronic device |
KR1020017006338A KR20010080509A (ko) | 1998-11-20 | 1999-11-19 | 집적회로 칩, 집적회로 소자, 인쇄 회로 기판 및 전자 기기 |
EP99972788A EP1150355A4 (en) | 1998-11-20 | 1999-11-19 | INTEGRATED CIRCUIT CHIP, INTEGRATED CIRCUIT, PCB AND ELECTRONIC ELEMENT |
BR9915509-5A BR9915509A (pt) | 1998-11-20 | 1999-11-19 | Chip de circuito integrado, elemento de circuitointegrado, placa de circuito impresso e dispositivoeletrÈnico |
HK02101860.3A HK1041102A1 (zh) | 1998-11-20 | 2002-03-11 | 集成電路片、集成電路、印刷電路版及電子儀器 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10/331384 | 1998-11-20 | ||
JP33138498 | 1998-11-20 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2000031799A1 true WO2000031799A1 (fr) | 2000-06-02 |
Family
ID=18243096
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP1999/006480 WO2000031799A1 (fr) | 1998-11-20 | 1999-11-19 | Microcircuit integre, circuit integre, carte a circuits imprimes et dispositif electronique |
Country Status (10)
Country | Link |
---|---|
US (2) | US6469396B1 (ja) |
EP (1) | EP1150355A4 (ja) |
KR (1) | KR20010080509A (ja) |
CN (1) | CN1155089C (ja) |
AU (1) | AU1184400A (ja) |
BR (1) | BR9915509A (ja) |
CA (1) | CA2351417A1 (ja) |
HK (1) | HK1041102A1 (ja) |
TW (1) | TW442945B (ja) |
WO (1) | WO2000031799A1 (ja) |
Cited By (2)
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WO2009084100A1 (ja) * | 2007-12-28 | 2009-07-09 | Fujitsu Microelectronics Limited | 半導体装置及びその製造方法 |
JP2010117962A (ja) * | 2008-11-14 | 2010-05-27 | Fujitsu Microelectronics Ltd | レイアウト設計方法および半導体集積回路 |
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DE10123758B4 (de) * | 2001-05-16 | 2008-04-03 | Texas Instruments Deutschland Gmbh | Multi-Chip-Modul mit mehreren integrierten Halbleiterschaltungen |
JP2003098221A (ja) * | 2001-09-25 | 2003-04-03 | Mitsubishi Electric Corp | 半導体装置、半導体装置の試験方法及び半導体装置の試験装置 |
JP4034120B2 (ja) * | 2002-05-28 | 2008-01-16 | Necエレクトロニクス株式会社 | 半導体装置 |
US6781218B1 (en) * | 2003-03-04 | 2004-08-24 | Nptest, Inc. | Method and apparatus for accessing internal nodes of an integrated circuit using IC package substrate |
EP1666904A4 (en) * | 2003-05-21 | 2010-09-08 | Advantest Corp | TEST APPARATUS AND TEST MODULE |
US7214886B2 (en) * | 2003-11-25 | 2007-05-08 | International Business Machines Corporation | High performance chip carrier substrate |
US20050248028A1 (en) * | 2004-05-05 | 2005-11-10 | Cheng-Yen Huang | Chip-packaging with bonding options connected to a package substrate |
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- 1999-11-18 US US09/442,700 patent/US6469396B1/en not_active Expired - Lifetime
- 1999-11-19 KR KR1020017006338A patent/KR20010080509A/ko not_active Application Discontinuation
- 1999-11-19 BR BR9915509-5A patent/BR9915509A/pt not_active Application Discontinuation
- 1999-11-19 EP EP99972788A patent/EP1150355A4/en not_active Withdrawn
- 1999-11-19 CN CNB998135275A patent/CN1155089C/zh not_active Expired - Lifetime
- 1999-11-19 AU AU11844/00A patent/AU1184400A/en not_active Abandoned
- 1999-11-19 CA CA002351417A patent/CA2351417A1/en not_active Abandoned
- 1999-11-19 WO PCT/JP1999/006480 patent/WO2000031799A1/ja not_active Application Discontinuation
-
2002
- 2002-03-11 HK HK02101860.3A patent/HK1041102A1/zh unknown
- 2002-06-24 US US10/178,110 patent/US6548910B2/en not_active Expired - Lifetime
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WO2009084100A1 (ja) * | 2007-12-28 | 2009-07-09 | Fujitsu Microelectronics Limited | 半導体装置及びその製造方法 |
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Also Published As
Publication number | Publication date |
---|---|
AU1184400A (en) | 2000-06-13 |
TW442945B (en) | 2001-06-23 |
US6469396B1 (en) | 2002-10-22 |
EP1150355A4 (en) | 2003-09-10 |
CA2351417A1 (en) | 2000-06-02 |
US6548910B2 (en) | 2003-04-15 |
US20020153538A1 (en) | 2002-10-24 |
CN1155089C (zh) | 2004-06-23 |
HK1041102A1 (zh) | 2002-06-28 |
BR9915509A (pt) | 2001-11-13 |
CN1326592A (zh) | 2001-12-12 |
KR20010080509A (ko) | 2001-08-22 |
EP1150355A1 (en) | 2001-10-31 |
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