WO1999028730A2 - Werkwijze en inrichtung voor het vervaardigen van een bandvormig materiaal onder mermijding van repeterende oppervlaktedefecten - Google Patents

Werkwijze en inrichtung voor het vervaardigen van een bandvormig materiaal onder mermijding van repeterende oppervlaktedefecten Download PDF

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Publication number
WO1999028730A2
WO1999028730A2 PCT/NL1998/000674 NL9800674W WO9928730A2 WO 1999028730 A2 WO1999028730 A2 WO 1999028730A2 NL 9800674 W NL9800674 W NL 9800674W WO 9928730 A2 WO9928730 A2 WO 9928730A2
Authority
WO
WIPO (PCT)
Prior art keywords
surface defects
strip
pictures
correlating
working
Prior art date
Application number
PCT/NL1998/000674
Other languages
English (en)
French (fr)
Other versions
WO1999028730A3 (nl
Inventor
Onno Wouter Van Wijk
Original Assignee
Hoogovens Staal B.V.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hoogovens Staal B.V. filed Critical Hoogovens Staal B.V.
Priority to AU13538/99A priority Critical patent/AU1353899A/en
Publication of WO1999028730A2 publication Critical patent/WO1999028730A2/nl
Publication of WO1999028730A3 publication Critical patent/WO1999028730A3/nl

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/8922Periodic flaws

Definitions

  • the invention relates to a process for producing a strip-like material avoiding repeated surface defects, in which a feed material is worked using a working means which has at least one periodicity during working, this material being monitored, during the production of the strip-like material, for the occurrence of repeated surface defects, in order to be able to interrupt the working in the event of such surface defects being observed.
  • All kinds of surface defects may arise when producing a strip-like material. These defects may be caused by any kind of contamination which is present on the surface of the strip-like material or other external influences. They may also stem from the composition of the strip-like material itself. Most of these surface defects are not due to the influence of the working means used for the production of the striplike material. However, in other cases a surface defect may be caused by the working means used. If such a working means comprises a moving component, the movement of such a component of the working means will often present some form of periodicity. If a surface defect is caused by such a periodically moving component, there is a considerable risk that this will lead to repeated surface defects, in other words surface defects which are repeated at intervals of a fixed strip length.
  • the object of the invention is therefore to carry out the process disclosed in the preamble in such a manner that repeated surface defects can be observed with a minimum production of the strip-like material with such repeated surface defects.
  • the pictures can be formed in various ways. For example, it is possible for photographic pictures to be visually compared with one another. It is also conceivable for transparent pictures to be superimposed optically onto one another, in which case repeated defects will clearly emerge. However, it is preferable for the pictures to be formed electronically as digital pictures which can then be electronically correlated. In this case, it is also easier to attenuate the representation of non- correlating defects and to intensify that of correlating defects by electronic means. In this way, it is therefore also possible to electronically signal repeated defects.
  • strip-like materials may have a wide variety of shapes and chemical compositions
  • the novel process has proven to be particularly useful for use on strip-like material which comprises an optionally coated metal strip.
  • the working may comprise a rolling operation in which the working means is a rolling mill stand for reducing the thickness of the metal strip.
  • the working may also comprise the application of a coating to a metal strip with the aid of an applicator roll. Each revolution of a roller or of an applicator roll then introduces a periodicity into the working, and damage, for example, to such a roll may cause a repeated surface defect.
  • the circumference of such a roll can be used to establish the strip length between any repeated surface defects which arise.
  • the invention relates not only to the process described but also to a device for use in the novel process, comprising a working means for producing a strip-like material, characterized in that this device furthermore comprises recording equipment for taking successive pictures of any surface defects on the strip-like material, as well as means for correlating successive pictures, it being possible to attenuate the depiction of non-correlating surface defects and to intensify that of correlating surface defects.

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Metal Rolling (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
PCT/NL1998/000674 1997-11-27 1998-11-27 Werkwijze en inrichtung voor het vervaardigen van een bandvormig materiaal onder mermijding van repeterende oppervlaktedefecten WO1999028730A2 (nl)

Priority Applications (1)

Application Number Priority Date Filing Date Title
AU13538/99A AU1353899A (en) 1997-11-27 1998-11-27 Process and device for producing a strip-like material avoiding repeated surfacedefects

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
NL1007626 1997-11-27
NL1007626 1997-11-27

Publications (2)

Publication Number Publication Date
WO1999028730A2 true WO1999028730A2 (nl) 1999-06-10
WO1999028730A3 WO1999028730A3 (nl) 1999-10-07

Family

ID=19766067

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/NL1998/000674 WO1999028730A2 (nl) 1997-11-27 1998-11-27 Werkwijze en inrichtung voor het vervaardigen van een bandvormig materiaal onder mermijding van repeterende oppervlaktedefecten

Country Status (2)

Country Link
AU (1) AU1353899A (nl)
WO (1) WO1999028730A2 (nl)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1258722A1 (en) * 2001-05-11 2002-11-20 Metso Paper Automation OY Method for controlling quality and condition of an object on the basis of thermal imaging
WO2003046529A1 (en) * 2001-11-29 2003-06-05 Metso Automation Oy. Quality and condition monitoring based on spectrum separating measurement

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4134684A (en) * 1977-01-18 1979-01-16 Intex Corp. Repeat defect detector system
US4507564A (en) * 1980-09-27 1985-03-26 Tokyo Shibaura Denki Kabushiki Kaisha Surface defect detecting apparatus
EP0316961A2 (en) * 1987-11-20 1989-05-24 Kabushiki Kaisha Toshiba Roll mark inspection apparatus
EP0358236A2 (en) * 1988-09-09 1990-03-14 Fuji Photo Film Co., Ltd. Method of measuring period of surface defect

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4134684A (en) * 1977-01-18 1979-01-16 Intex Corp. Repeat defect detector system
US4507564A (en) * 1980-09-27 1985-03-26 Tokyo Shibaura Denki Kabushiki Kaisha Surface defect detecting apparatus
EP0316961A2 (en) * 1987-11-20 1989-05-24 Kabushiki Kaisha Toshiba Roll mark inspection apparatus
EP0358236A2 (en) * 1988-09-09 1990-03-14 Fuji Photo Film Co., Ltd. Method of measuring period of surface defect

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1258722A1 (en) * 2001-05-11 2002-11-20 Metso Paper Automation OY Method for controlling quality and condition of an object on the basis of thermal imaging
US6849851B2 (en) * 2001-05-11 2005-02-01 Metso Paper Automation Oy Method for controlling quality and condition on the basis of thermal imaging
WO2003046529A1 (en) * 2001-11-29 2003-06-05 Metso Automation Oy. Quality and condition monitoring based on spectrum separating measurement
US7155356B2 (en) 2001-11-29 2006-12-26 Metso Automation Oy Quality and condition monitoring based on spectrum separating measurement

Also Published As

Publication number Publication date
AU1353899A (en) 1999-06-16
WO1999028730A3 (nl) 1999-10-07

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