WO1993010652A1 - Procede d'adhesion ameliore entre un oxyde metallique et une surface polymere - Google Patents
Procede d'adhesion ameliore entre un oxyde metallique et une surface polymere Download PDFInfo
- Publication number
- WO1993010652A1 WO1993010652A1 PCT/US1991/008777 US9108777W WO9310652A1 WO 1993010652 A1 WO1993010652 A1 WO 1993010652A1 US 9108777 W US9108777 W US 9108777W WO 9310652 A1 WO9310652 A1 WO 9310652A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- copper
- acidic solution
- oxide
- layer
- oxide coating
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/38—Improvement of the adhesion between the insulating substrate and the metal
- H05K3/382—Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal
- H05K3/385—Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal by conversion of the surface of the metal, e.g. by oxidation, whether or not followed by reaction or removal of the converted layer
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/03—Metal processing
- H05K2203/0315—Oxidising metal
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/11—Treatments characterised by their effect, e.g. heating, cooling, roughening
- H05K2203/1157—Using means for chemical reduction
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/46—Manufacturing multilayer circuits
- H05K3/4611—Manufacturing multilayer circuits by laminating two or more circuit boards
Definitions
- the present invention is directed to an improved method for bonding a layer of copper or a copper alloy, via its oxide coating, to a polymeric material.
- the present invention is useful because it provides an improved method that has applicability in the manufacture of multi-layer electronic circuit boards.
- U.S. Patent No. 4,642,161 teaches a method of bonding a layer of copper to a layer of polymer wherein the surface of the layer of copper is first oxidized to cupric oxide, then reduced to metallic copper prior to bonding. It recognizes that the disclosure of the alkaline reduction post-oxide treatment in Japanese Patent Laid-Open No. 153797/1981 (the "797" patent) , teaches the reduction of cupric oxide to cuprous oxide.
- U.S. Patent No. 5,006,200 which is incorporated by reference herein, also suggests that bond strength is greater between cuprous oxide and the polymeric material than between cupric oxide and the polymeric material.
- the '200 patent teaches the reduction of cupric oxide to cuprous oxide without metallization by using an alkaline reducing solution of between pH 7 and 12 in a temperature range of between 20° and 35° C, in a carefully controlled, continuously circulating reaction, to reduce pink- ring problems.
- the purpose of this alkaline reduction is to form a network of adhesion, between the copper atoms of the copper layer and the carbon atoms of the polymer layer via the oxygen atoms of the cuprous oxide, to act as a bridge between the copper and the carbon.
- cupric oxide to either cuprous oxide or metallic copper
- the chemically reduced cuprous oxide or copper metal tends to reoxidize to cupric oxide after only a few days of contact with atmospheric oxygen, or as a result of baking to dry the reduced layer prior to bonding to a polymer.
- reduced copper oxide is best laminated immediately after formation.
- oxidizing acid such as chromic
- a highly acidic pH i.e., 2.5.
- step (c) bonding the layer of copper or copper alloy from step (p) to a polymeric material.
- This invention is directed to a process for bonding a layer of copper or a copper alloy to a layer of polymeric material, the process comprising the steps of:
- step (c) bonding the layer of copper or copper alloy from step (b) to a polymeric material.
- Citric/Phosphate 6.5 g/L citric acid; 18.7 g/L trisodium phosphate; pH adjust with Sulfuric acid.
- Example 7 is the preferred acid treatment for the thick black oxide of Example 6.
- EXAMPLE 1 The surface of a copper layer was oxidized to a black oxide by dipping it for six minutes in a solution at 165° F and comprising 72 g/L sodium chlorite, 25 g/L NaOH, and 12.5 g/L trisodium phosphate dodecahydrate. After the dip, the copper layer was removed and subjected to a running water rinse for two minutes. A black oxide coating of about 0.4 mg/cm 2 resulted.
- Copper clad laminate was coated with an oxide according to Example 1.
- the copper clad laminate with the oxide coating was immersed in a solution of
- EXAMPLE 3 Copper clad laminate was coated with oxide according to Example 1. The copper clad laminate with the oxide treatment were immersed in a solution of 6.5 g/L citric acid and 18.7 g/L trisodium phosphate, pH adjusted to 5.0 using sulfuric acid, for 3 minutes, at 120°F.
- Copper clad laminate was coated with oxide according to Example 1.
- the copper clad laminate with the oxide treatment were immersed in a solution of 0.5M acetic acid and 0.5M sodium acetate, pH 4.3, for 4 minutes, at 120°F.
- EXAMPLE 7 Copper clad laminate was coated with an oxide according to Example 6. The copper clad laminate with the oxide treatment was immersed in a solution of 20 g/L citric acid and 7.5 g/L trisodium phosphate dodecahydrate at pH 3.0, for 8 minutes at 120°F.
Abstract
L'invention concerne un procédé de liaison d'une couche de cuivre ou d'un alliage de cuivre sur une couche de matière polymère. Ce procédé consiste à: (a) oxyder la surface d'une couche de cuivre ou d'alliages de cuivre avec une solution d'oxydation afin de former un revêtement d'oxyde sur la surface; (b) à soumettre le revêtement d'oxyde sur la couche de cuivre ou d'alliage de cuivre à une solution acide afin d'enlever une quantité de revêtement d'oxyde efficace pour renforcer la liaison avec la matière polymère, la solution acide étant caractérisée par un niveau de pH compris entre 3,0 et 5,5, de préférence entre 3,0 et 4,0; et (c) à procéder à la liaison de la couche de cuivre ou d'alliage de cuivre avec une matière polymère à partir de l'étape (b).
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/US1991/008777 WO1993010652A1 (fr) | 1991-11-22 | 1991-11-22 | Procede d'adhesion ameliore entre un oxyde metallique et une surface polymere |
TW081100211A TW197985B (fr) | 1991-11-22 | 1992-01-14 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/US1991/008777 WO1993010652A1 (fr) | 1991-11-22 | 1991-11-22 | Procede d'adhesion ameliore entre un oxyde metallique et une surface polymere |
Publications (1)
Publication Number | Publication Date |
---|---|
WO1993010652A1 true WO1993010652A1 (fr) | 1993-05-27 |
Family
ID=22225987
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US1991/008777 WO1993010652A1 (fr) | 1991-11-22 | 1991-11-22 | Procede d'adhesion ameliore entre un oxyde metallique et une surface polymere |
Country Status (2)
Country | Link |
---|---|
TW (1) | TW197985B (fr) |
WO (1) | WO1993010652A1 (fr) |
Cited By (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1995027808A1 (fr) * | 1994-04-11 | 1995-10-19 | Electrochemicals, Inc. | Procede de traitement d'une feuille de cuivre oxydee |
US6482740B2 (en) | 2000-05-15 | 2002-11-19 | Asm Microchemistry Oy | Method of growing electrical conductors by reducing metal oxide film with organic compound containing -OH, -CHO, or -COOH |
US6679951B2 (en) | 2000-05-15 | 2004-01-20 | Asm Intenational N.V. | Metal anneal with oxidation prevention |
US6878628B2 (en) | 2000-05-15 | 2005-04-12 | Asm International Nv | In situ reduction of copper oxide prior to silicon carbide deposition |
US7067407B2 (en) | 2003-08-04 | 2006-06-27 | Asm International, N.V. | Method of growing electrical conductors |
US7491634B2 (en) | 2006-04-28 | 2009-02-17 | Asm International N.V. | Methods for forming roughened surfaces and applications thereof |
US7494927B2 (en) | 2000-05-15 | 2009-02-24 | Asm International N.V. | Method of growing electrical conductors |
US7498242B2 (en) | 2005-02-22 | 2009-03-03 | Asm America, Inc. | Plasma pre-treating surfaces for atomic layer deposition |
US7541284B2 (en) | 2006-02-15 | 2009-06-02 | Asm Genitech Korea Ltd. | Method of depositing Ru films having high density |
US7799680B2 (en) | 2003-08-04 | 2010-09-21 | Asm America, Inc. | Surface preparation prior to deposition on germanium |
US7927942B2 (en) | 2008-12-19 | 2011-04-19 | Asm International N.V. | Selective silicide process |
US8545936B2 (en) | 2008-03-28 | 2013-10-01 | Asm International N.V. | Methods for forming carbon nanotubes |
US8927403B2 (en) | 2005-03-15 | 2015-01-06 | Asm International N.V. | Selective deposition of noble metal thin films |
US9129897B2 (en) | 2008-12-19 | 2015-09-08 | Asm International N.V. | Metal silicide, metal germanide, methods for making the same |
US9139906B2 (en) | 2001-03-06 | 2015-09-22 | Asm America, Inc. | Doping with ALD technology |
US9379011B2 (en) | 2008-12-19 | 2016-06-28 | Asm International N.V. | Methods for depositing nickel films and for making nickel silicide and nickel germanide |
US9587307B2 (en) | 2005-03-15 | 2017-03-07 | Asm International N.V. | Enhanced deposition of noble metals |
US9607842B1 (en) | 2015-10-02 | 2017-03-28 | Asm Ip Holding B.V. | Methods of forming metal silicides |
CN117690869A (zh) * | 2024-01-30 | 2024-03-12 | 安徽大学 | 一种在空气环境中的铜-铜低温直接键合方法 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5106454A (en) * | 1990-11-01 | 1992-04-21 | Shipley Company Inc. | Process for multilayer printed circuit board manufacture |
-
1991
- 1991-11-22 WO PCT/US1991/008777 patent/WO1993010652A1/fr active Application Filing
-
1992
- 1992-01-14 TW TW081100211A patent/TW197985B/zh not_active IP Right Cessation
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5106454A (en) * | 1990-11-01 | 1992-04-21 | Shipley Company Inc. | Process for multilayer printed circuit board manufacture |
Non-Patent Citations (1)
Title |
---|
PATENT ABSTRACTS OF JAPAN vol. 14, no. 563 (M-1058)14 December 1990 * |
Cited By (31)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1995027808A1 (fr) * | 1994-04-11 | 1995-10-19 | Electrochemicals, Inc. | Procede de traitement d'une feuille de cuivre oxydee |
US6482740B2 (en) | 2000-05-15 | 2002-11-19 | Asm Microchemistry Oy | Method of growing electrical conductors by reducing metal oxide film with organic compound containing -OH, -CHO, or -COOH |
US6679951B2 (en) | 2000-05-15 | 2004-01-20 | Asm Intenational N.V. | Metal anneal with oxidation prevention |
US6878628B2 (en) | 2000-05-15 | 2005-04-12 | Asm International Nv | In situ reduction of copper oxide prior to silicon carbide deposition |
US6887795B2 (en) | 2000-05-15 | 2005-05-03 | Asm International N.V. | Method of growing electrical conductors |
US6921712B2 (en) | 2000-05-15 | 2005-07-26 | Asm International Nv | Process for producing integrated circuits including reduction using gaseous organic compounds |
US7241677B2 (en) | 2000-05-15 | 2007-07-10 | Asm International N.V. | Process for producing integrated circuits including reduction using gaseous organic compounds |
US7494927B2 (en) | 2000-05-15 | 2009-02-24 | Asm International N.V. | Method of growing electrical conductors |
US9139906B2 (en) | 2001-03-06 | 2015-09-22 | Asm America, Inc. | Doping with ALD technology |
US7799680B2 (en) | 2003-08-04 | 2010-09-21 | Asm America, Inc. | Surface preparation prior to deposition on germanium |
US7067407B2 (en) | 2003-08-04 | 2006-06-27 | Asm International, N.V. | Method of growing electrical conductors |
US7498242B2 (en) | 2005-02-22 | 2009-03-03 | Asm America, Inc. | Plasma pre-treating surfaces for atomic layer deposition |
US9587307B2 (en) | 2005-03-15 | 2017-03-07 | Asm International N.V. | Enhanced deposition of noble metals |
US8927403B2 (en) | 2005-03-15 | 2015-01-06 | Asm International N.V. | Selective deposition of noble metal thin films |
US9469899B2 (en) | 2005-03-15 | 2016-10-18 | Asm International N.V. | Selective deposition of noble metal thin films |
US7541284B2 (en) | 2006-02-15 | 2009-06-02 | Asm Genitech Korea Ltd. | Method of depositing Ru films having high density |
US7923382B2 (en) | 2006-04-28 | 2011-04-12 | Asm International N.V. | Method for forming roughened surface |
US7491634B2 (en) | 2006-04-28 | 2009-02-17 | Asm International N.V. | Methods for forming roughened surfaces and applications thereof |
US8252703B2 (en) | 2006-04-28 | 2012-08-28 | Asm International N.V. | Methods for forming roughened surfaces and applications thereof |
US8545936B2 (en) | 2008-03-28 | 2013-10-01 | Asm International N.V. | Methods for forming carbon nanotubes |
US7927942B2 (en) | 2008-12-19 | 2011-04-19 | Asm International N.V. | Selective silicide process |
US9379011B2 (en) | 2008-12-19 | 2016-06-28 | Asm International N.V. | Methods for depositing nickel films and for making nickel silicide and nickel germanide |
US9129897B2 (en) | 2008-12-19 | 2015-09-08 | Asm International N.V. | Metal silicide, metal germanide, methods for making the same |
US8293597B2 (en) | 2008-12-19 | 2012-10-23 | Asm International N.V. | Selective silicide process |
US9634106B2 (en) | 2008-12-19 | 2017-04-25 | Asm International N.V. | Doped metal germanide and methods for making the same |
US10553440B2 (en) | 2008-12-19 | 2020-02-04 | Asm International N.V. | Methods for depositing nickel films and for making nickel silicide and nickel germanide |
US10043880B2 (en) | 2011-04-22 | 2018-08-07 | Asm International N.V. | Metal silicide, metal germanide, methods for making the same |
US9607842B1 (en) | 2015-10-02 | 2017-03-28 | Asm Ip Holding B.V. | Methods of forming metal silicides |
US10199234B2 (en) | 2015-10-02 | 2019-02-05 | Asm Ip Holding B.V. | Methods of forming metal silicides |
CN117690869A (zh) * | 2024-01-30 | 2024-03-12 | 安徽大学 | 一种在空气环境中的铜-铜低温直接键合方法 |
CN117690869B (zh) * | 2024-01-30 | 2024-05-07 | 安徽大学 | 一种在空气环境中的铜-铜低温直接键合方法 |
Also Published As
Publication number | Publication date |
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TW197985B (fr) | 1993-01-11 |
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