US5910641A - Selectively filled adhesives for compliant, reworkable, and solder-free flip chip interconnection and encapsulation - Google Patents
Selectively filled adhesives for compliant, reworkable, and solder-free flip chip interconnection and encapsulation Download PDFInfo
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- US5910641A US5910641A US08/895,537 US89553797A US5910641A US 5910641 A US5910641 A US 5910641A US 89553797 A US89553797 A US 89553797A US 5910641 A US5910641 A US 5910641A
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- film
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- pads
- adhesive
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- 239000000853 adhesive Substances 0.000 title claims description 25
- 230000001070 adhesive effect Effects 0.000 title claims description 25
- 238000005538 encapsulation Methods 0.000 title description 4
- 239000002923 metal particle Substances 0.000 claims abstract description 18
- 239000002313 adhesive film Substances 0.000 claims abstract description 17
- 239000002245 particle Substances 0.000 claims abstract description 8
- 239000000758 substrate Substances 0.000 claims description 24
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 8
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 claims description 8
- 239000000945 filler Substances 0.000 claims description 6
- 229910052759 nickel Inorganic materials 0.000 claims description 4
- 229910052763 palladium Inorganic materials 0.000 claims description 4
- 229920001169 thermoplastic Polymers 0.000 claims description 4
- 229920001187 thermosetting polymer Polymers 0.000 claims description 4
- 239000004416 thermosoftening plastic Substances 0.000 claims description 4
- 239000004593 Epoxy Substances 0.000 claims description 2
- 239000004697 Polyetherimide Substances 0.000 claims description 2
- 239000004642 Polyimide Substances 0.000 claims description 2
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 claims description 2
- 239000004643 cyanate ester Substances 0.000 claims description 2
- 239000000203 mixture Substances 0.000 claims description 2
- 229920006162 poly(etherimide sulfone) Polymers 0.000 claims description 2
- 229920002492 poly(sulfone) Polymers 0.000 claims description 2
- 229920001721 polyimide Polymers 0.000 claims description 2
- 229920001296 polysiloxane Polymers 0.000 claims description 2
- 229910052751 metal Inorganic materials 0.000 abstract description 27
- 239000002184 metal Substances 0.000 abstract description 27
- 239000011248 coating agent Substances 0.000 abstract description 2
- 238000000576 coating method Methods 0.000 abstract description 2
- 239000010408 film Substances 0.000 description 15
- 210000001787 dendrite Anatomy 0.000 description 13
- 238000000034 method Methods 0.000 description 10
- 229920002120 photoresistant polymer Polymers 0.000 description 10
- 239000002985 plastic film Substances 0.000 description 9
- 229920006255 plastic film Polymers 0.000 description 9
- 239000000463 material Substances 0.000 description 7
- 239000004033 plastic Substances 0.000 description 6
- 229920003023 plastic Polymers 0.000 description 6
- 238000007747 plating Methods 0.000 description 4
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 230000000295 complement effect Effects 0.000 description 2
- 230000003247 decreasing effect Effects 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 239000013067 intermediate product Substances 0.000 description 2
- 238000003825 pressing Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 229920006300 shrink film Polymers 0.000 description 2
- 229910052582 BN Inorganic materials 0.000 description 1
- PZNSFCLAULLKQX-UHFFFAOYSA-N Boron nitride Chemical compound N#B PZNSFCLAULLKQX-UHFFFAOYSA-N 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000004070 electrodeposition Methods 0.000 description 1
- 239000010438 granite Substances 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
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- 150000002940 palladium Chemical class 0.000 description 1
- 238000004382 potting Methods 0.000 description 1
- 239000012266 salt solution Substances 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 239000000243 solution Substances 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
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- H01L24/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
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- H01L23/373—Cooling facilitated by selection of materials for the device or materials for thermal expansion adaptation, e.g. carbon
- H01L23/3733—Cooling facilitated by selection of materials for the device or materials for thermal expansion adaptation, e.g. carbon having a heterogeneous or anisotropic structure, e.g. powder or fibres in a matrix, wire mesh, porous structures
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- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
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- H01L24/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
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- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/321—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by conductive adhesives
- H05K3/323—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by conductive adhesives by applying an anisotropic conductive adhesive layer over an array of pads
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- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
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- H05K2203/0307—Providing micro- or nanometer scale roughness on a metal surface, e.g. by plating of nodules or dendrites
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- H05K2203/07—Treatments involving liquids, e.g. plating, rinsing
- H05K2203/0703—Plating
- H05K2203/0726—Electroforming, i.e. electroplating on a metallic carrier thereby forming a self-supporting structure
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- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/10—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
- H05K3/20—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern by affixing prefabricated conductor pattern
- H05K3/205—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern by affixing prefabricated conductor pattern using a pattern electroplated or electroformed on a metallic carrier
Definitions
- This invention relates to a system for connecting the conductive pads on electronic circuit modules to corresponding pads on a printed circuit board.
- One approach to the problem utilizes a dielectric film uniformly loaded with round conductive particles.
- the particle size is selected so as to make the electrical connection between particles statistically unlikely over a distance greater then the thickness of the film while maintaining a low resistance path normal to the film between the film surfaces.
- This approach has the inherent disadvantage of requiring adjacent pads on the same surface to be separated by a distance dictated by the statistical probability of an interconnection. As the pad-to-pad distance is decreased, the density of the particle loading must also be decreased to prevent unwanted pad-to-pad interconnection and this also decreases the quality of the through film pad-to-pad interconnection.
- the general purpose of the present invention is a selectively filled adhesives for compliant, reworkable, and solder-free flip chip interconnection and encapsulation.
- Another desirable feature would be the easy removal of a previously mounted module and the substitution of another without damage to the substrate.
- Another desirable characteristic of the interconnection system would be the use of a freestanding film which eliminates the need for dispensing technology and be more likely to be usable in a field environment when a module must be removed and replaced.
- the present invention utilizes a dielectric adhesive film which is fabricated by plating a personalized pattern of a sacrificial metal carrier with highly branched metal filaments having a length approximating the final thickness of the adhesive film.
- the pattern is preferably fabricated utilizing photolithographic techniques on a sacrificial metal carrier. After plating, the photoresist is removed and a dielectric adhesive is applied, creating a film of uniform thickness. The sacrificial metal carrier is then removed with a preferential etchant.
- the finished adhesive film is then positioned and aligned between the pad surfaces on a substrate and the electronic modules.
- the electrical connection of the module pad surfaces and the substrate pads is preferentially accomplished by the application of pressure and/or heat to the module, which causes the sharp dendritic ends of the plated metal filaments to pierce the oxide or other coating on the pads.
- One object of the present invention is to provide an adhesive film carrier having dendritic metal filaments extending from one surface to the other in the regions of the abutting conductive pads.
- Still another object of the present invention is to provide an adhesive film carrier for the interconnection of conductive pads on an electronic module which allows a mounted electronic module to be removed by the application of heat below 200 degrees Fahrenheit.
- FIG. 1 illustrates a partial isometric view of an electronic system utilizing the method of the present invention
- FIG. 2A illustrates an enlarged partial sectional view taken along the line 2--2 of FIG. 1 showing one means for applying pressure to the electronic module to make connections between corresponding pads;
- FIG. 2B is an enlarged partial sectional view taken along the line 2--2 of FIG. 1 showing alternative means for applying pressure to the electronic module to make connections between corresponding pads;
- FIG. 3A is a partial top view and FIG. 3B is a side view taken along the line 3--3 of FIG. 3A, respectively, illustrating the sacrificial metal substrate having a photolithographic pattern for the interconnection pads;
- FIG. 4A is a partial sectional view taken along the line 3--3 of FIG. 3A showing the metal substrate after selective plating of dendritic metal particles with the photolithographic pattern of photoresist still in place;
- FIG. 4B is an enlarged portion of FIG. 4A showing the structure of the dendritic particles with the photolithographic pattern of photoresist still in place;
- FIG. 5 is a partial microscopic view of the dendritic metal particles shown in FIG. 4B;
- FIG. 6 is a partial sectional view of the dendritic metal particles taken along the line 3--3 of FIG. 3A showing the system after the photoresist has been stripped and the layer of adhesive Material applied;
- FIG. 7 is a partial sectional view of the dendritic metal particles and adhesive material taken along the line 3--3 of FIG. 3A showing the system after selective etching of the sacrificial metal substrate;
- FIG. 8 is a partial sectional view of the dendritic metal particles and adhesive material taken along the line 3--3 of FIG. 3A showing the system after the electronic modules are in place;
- FIG. 9 is a microscopic partial sectional view of the dendritic metal particles and adhesive material taken along the line 3--3 of FIG. 3A showing the system with the electronic modules are in place after pressure has been applied to make the interconnection;
- FIG. 10 is a flow chart of the process used to practice the present invention.
- a printed circuit board 2 having a pattern of conductive metal pads 3 connected to internal wiring, not shown, in circuit board 2, carries an electronic module 5, having a plurality of complementary metal pads 6 which are connected to pads 3 through dendritic metal particles carried in an adhesive plastic film and arranged in a pattern corresponding to the metal pads 3 and 6.
- FIG. 2A is a partial sectional view taken along the line 2--2 of FIG. 1 showing the printed circuit board 2 having conductive metal pads 3 which connected to the complementary conductive metal pads 6 on electronic module 5 by means of dendritic metal particles carried in adhesive dielectric film 10 to provide a surface to surface resistivity in the range of less than 40 milliohms/square micrometer arranged in a pattern corresponding to the pattern of pads 3 on the circuit board 2 and pads 6 on electronic module 5.
- the adhesive dielectric film is of a thickness in the range of 1-2 mils and can be selected from a family of adhesives such as epoxy; acrylic; silicone; thermoplastic including polyimide, polyetherimide and polysulfone; thermoset including cyanate ester; and a mixture of thermoplastic and thermoset.
- pressure is applied to electronic module 5 by means of a plastic shrink film 11, which causes the sharp ends of the dendritic metal particles to penetrate the pads 3 and 6, thereby establishing a good electrical connection therebetween.
- FIG. 2B utilizes a plunger 15 having a pressure pad 16 which engages the upper surface of module 5 and applies pressure created by spring means 17 which bears against the base member 18 affixed to the support for circuit board 2 by means not shown.
- spring means 17 has sufficient force to cause the ends of dendritic metal particles carried by adhesive film 10 to penetrate conductive metal pads 3 and 5, thereby establishing a good electrical connection therebetween.
- FIG. 3A is a view of a portion of a sacrificial metal substrate used in the fabrication of the adhesive plastic film 10.
- the metal substrate has a photoresist in which a pattern of holes 20a-20n, corresponding to the pattern of pads 3 and 6 between which connection is desired, has been made by photolithographic techniques.
- FIG. 3B The partial sectional view of FIG. 3B, taken along the line 3--3 of FIG. 3A, shows the sacrificial metal substrate 21, which may be mounted on a temporary backing member 24, and the holes 22a-22n extending through the photoresist 23.
- FIGS. 3A and 3B The intermediate assembly of FIGS. 3A and 3B is placed in a plating solution and dendritic metal particles are grown on the portions of metal substrate 21 exposed by holes 22a-22n, as shown in FIGS. 4A and 4B, utilizing conventional dendrite growing techniques.
- Information on growing dendrites suitable for use in this invention is provided in the publication:
- the dendritic metal particles 31 are grown to a length approximately the thickness of the adhesive plastic film 10.
- FIG. 5 is a microscopic side view of a typical dendritic metal particle 31.
- the structure is an upwardly branching configuration having a base member 32 emanating from the exposed pad areas of sacrificial metal substrate 21.
- the dendrites have a crystalline cross sectional shape and the ends 33a and 33b of branches 34a and 34b are typically sharply pointed. Similarly, the start of the dendrite is also pointed.
- the intermediate product represented in FIG. 5 includes the temporary backing member 24, the sacrificial metal substrate 21 and the dendritic metal particle 31.
- FIG. 6 illustrates the adhesive plastic film 10 which is applied to the intermediate product of FIG. 5, where all numerals correspond to those elements previously described.
- the film has a nominal thickness which is preferably, but not necessarily slightly, less than the nominal height of dendritic metal particles 31, allowing the ends 33a and 33b to project above the upper surface of adhesive plastic film 10.
- adhesive plastic film is applied in liquid form and cured in place by appropriate means.
- FIG. 7 shows the adhesive plastic film 10 after removal from temporary backing member 24 and selective etching of sacrificial metal substrate 21 to remove the pads.
- FIG. 8 shows the adhesive plastic film 10 in position between a circuit board 2 having a conductive pad 3 and electronic circuit module 5 having a conductive pad 6.
- the pad 3 on circuit board 2 will project slightly above the upper surface of the board, while the pad 6 on electronic module 5 is more likely to form a level surface in conjunction with the lower surface of the module. While this might create interconnection problems with other systems, the upper, sharper, dendritic points are positioned to abut the pads 6 of module 5 and the lower, sharp dendritic points formed when the sacrificial metal substrate is etched away are used to connect to the raised pads 3 on the circuit board 2.
- FIG. 9 The final step in the interconnection process is illustrated in FIG. 9.
- Appropriate pressure indicated by the arrows 50 and 51, is applied across adhesive film 10, causing the adhesive film to compress and the dendritic ends 33a and 33b to penetrate the pad 6 on circuit module 5 and the lower portion of dendrites 31 to make contact with the pad 3 on circuit board 2.
- the pressure is maintained by using plastic shrink film or mechanical clamp as shown in FIGS. 2A and 2B.
- pressure may be maintained by the shrinkage which results from curing the adhesive film.
- FIG. 10 illustrates the method of the invention.
- the first step is the generation of the photoresist pattern of conductive pads on a nickel sacrificial substrate supported by a temporary backing member.
- the pattern corresponds to the pads on a circuit board and the electronic circuit modules to be connected thereto.
- the photoresist is exposed to light through a mask and developed to open up holes representing the pads to which connection is to be made.
- the substrate is immersed in a palladium salt solution and palladium dendrites are grown from the nickel pads until the dendrite ends pass beyond the photoresist, or reach such other suitable dimension as may be desired.
- the photoresist is then stripped and a film of plastic adhesive material is applied to the surface, potting the dendrites, but leaving their ends exposed or just slightly below the film surface.
- the plastic adhesive material is then removed from the sacrificial nickel backing and the temporary backing member, providing a thin film having areas, corresponding to the pads to be interconnected, in which palladium dendrites extend through the film.
- the thin plastic adhesive film is then positioned on the circuit board with the dendrite containing areas aligned over the conductive metal pads on the circuit board.
- the circuit modules are then aligned over the adhesive plastic film, placing the conductive pads in alignment with the corresponding dendrite containing areas.
- the pressure is maintained by some suitable means such as plastic shrink wrap or mechanical clamping arrangement.
- the thermal expansion coefficient of the adhesive film may be matched to that of the printed circuit board or the circuit modules by the addition of suitable dielectric fillers such as silica or alumina.
- suitable dielectric fillers such as silica or alumina.
- the thermal conductivity of the film can be improved by the use of suitable fillers such as aluminum nitride, boron nitride, and granite.
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Abstract
An electrically conductive adhesive film having a pattern of microscopic elongate metal particles which extend from one surface to the other to provide an interconnection between confronting conductive metal pads abutting the surface. The particles have sharp ends to penetrate the oxide coating on the conductive metal pads of an electronic module when force is applied to press the module against the film.
Description
This patent application is a division of patent application U.S. Ser. No. 08/781,397 entitled "Selectively Filled Adhesives for Complaint, Reworkable, and Solder-Free Flip Chip Interconnection and Encapsulation" filed on Jan. 10, 1997.
1. Field of the Invention
This invention relates to a system for connecting the conductive pads on electronic circuit modules to corresponding pads on a printed circuit board.
2. Description of the Prior Art
A wide variety of techniques have been used to facilitate the interconnection between semiconductor modules and a substrate containing the interconnection wiring. As the semiconductor modules have become smaller and use correspondingly more power, the interconnection problem has become more difficult and the more conventional solder techniques become impractical.
One approach to the problem utilizes a dielectric film uniformly loaded with round conductive particles. The particle size is selected so as to make the electrical connection between particles statistically unlikely over a distance greater then the thickness of the film while maintaining a low resistance path normal to the film between the film surfaces. This approach has the inherent disadvantage of requiring adjacent pads on the same surface to be separated by a distance dictated by the statistical probability of an interconnection. As the pad-to-pad distance is decreased, the density of the particle loading must also be decreased to prevent unwanted pad-to-pad interconnection and this also decreases the quality of the through film pad-to-pad interconnection.
The general purpose of the present invention is a selectively filled adhesives for compliant, reworkable, and solder-free flip chip interconnection and encapsulation.
To accommodate the interconnection requirements of high density electronic modules it would be desirable to have a system which does not impose a restriction on the pad-to-pad spacing on the modules. Another desirable feature would be the easy removal of a previously mounted module and the substitution of another without damage to the substrate. Another desirable characteristic of the interconnection system would be the use of a freestanding film which eliminates the need for dispensing technology and be more likely to be usable in a field environment when a module must be removed and replaced.
The present invention utilizes a dielectric adhesive film which is fabricated by plating a personalized pattern of a sacrificial metal carrier with highly branched metal filaments having a length approximating the final thickness of the adhesive film. The pattern is preferably fabricated utilizing photolithographic techniques on a sacrificial metal carrier. After plating, the photoresist is removed and a dielectric adhesive is applied, creating a film of uniform thickness. The sacrificial metal carrier is then removed with a preferential etchant.
The finished adhesive film is then positioned and aligned between the pad surfaces on a substrate and the electronic modules. The electrical connection of the module pad surfaces and the substrate pads is preferentially accomplished by the application of pressure and/or heat to the module, which causes the sharp dendritic ends of the plated metal filaments to pierce the oxide or other coating on the pads.
It is therefore an object of the present invention to provide an adhesive film carrier of dendritic metal filaments arranged in a pattern corresponding to the substrate and module pads.
One object of the present invention is to provide an adhesive film carrier having dendritic metal filaments extending from one surface to the other in the regions of the abutting conductive pads.
Still another object of the present invention is to provide an adhesive film carrier for the interconnection of conductive pads on an electronic module which allows a mounted electronic module to be removed by the application of heat below 200 degrees Fahrenheit.
Still other objects, features and advantages of the present invention will become apparent from an understanding of the following description and drawings.
Having thus described embodiments of the present invention, it is the principal object of the present invention to provide a selectively filled adhesive dielectric film for compliant, reworkable, and solder-free flip chip interconnection and encapsulation.
Other objects of the present invention and many of the attendant advantages of the present invention will be readily appreciated as the same becomes better understood by reference to the following detailed description when considered in connection with the accompanying drawings, in which like reference numerals designate like parts throughout the figures thereof and wherein:
FIG. 1 illustrates a partial isometric view of an electronic system utilizing the method of the present invention;
FIG. 2A illustrates an enlarged partial sectional view taken along the line 2--2 of FIG. 1 showing one means for applying pressure to the electronic module to make connections between corresponding pads;
FIG. 2B is an enlarged partial sectional view taken along the line 2--2 of FIG. 1 showing alternative means for applying pressure to the electronic module to make connections between corresponding pads;
FIG. 3A is a partial top view and FIG. 3B is a side view taken along the line 3--3 of FIG. 3A, respectively, illustrating the sacrificial metal substrate having a photolithographic pattern for the interconnection pads;
FIG. 4A is a partial sectional view taken along the line 3--3 of FIG. 3A showing the metal substrate after selective plating of dendritic metal particles with the photolithographic pattern of photoresist still in place;
FIG. 4B is an enlarged portion of FIG. 4A showing the structure of the dendritic particles with the photolithographic pattern of photoresist still in place;
FIG. 5 is a partial microscopic view of the dendritic metal particles shown in FIG. 4B;
FIG. 6 is a partial sectional view of the dendritic metal particles taken along the line 3--3 of FIG. 3A showing the system after the photoresist has been stripped and the layer of adhesive Material applied;
FIG. 7 is a partial sectional view of the dendritic metal particles and adhesive material taken along the line 3--3 of FIG. 3A showing the system after selective etching of the sacrificial metal substrate;
FIG. 8 is a partial sectional view of the dendritic metal particles and adhesive material taken along the line 3--3 of FIG. 3A showing the system after the electronic modules are in place;
FIG. 9 is a microscopic partial sectional view of the dendritic metal particles and adhesive material taken along the line 3--3 of FIG. 3A showing the system with the electronic modules are in place after pressure has been applied to make the interconnection; and,
FIG. 10 is a flow chart of the process used to practice the present invention.
With reference to FIG. 1, a printed circuit board 2, having a pattern of conductive metal pads 3 connected to internal wiring, not shown, in circuit board 2, carries an electronic module 5, having a plurality of complementary metal pads 6 which are connected to pads 3 through dendritic metal particles carried in an adhesive plastic film and arranged in a pattern corresponding to the metal pads 3 and 6.
FIG. 2A is a partial sectional view taken along the line 2--2 of FIG. 1 showing the printed circuit board 2 having conductive metal pads 3 which connected to the complementary conductive metal pads 6 on electronic module 5 by means of dendritic metal particles carried in adhesive dielectric film 10 to provide a surface to surface resistivity in the range of less than 40 milliohms/square micrometer arranged in a pattern corresponding to the pattern of pads 3 on the circuit board 2 and pads 6 on electronic module 5. The adhesive dielectric film is of a thickness in the range of 1-2 mils and can be selected from a family of adhesives such as epoxy; acrylic; silicone; thermoplastic including polyimide, polyetherimide and polysulfone; thermoset including cyanate ester; and a mixture of thermoplastic and thermoset.
In the embodiment shown in FIG. 2A, pressure is applied to electronic module 5 by means of a plastic shrink film 11, which causes the sharp ends of the dendritic metal particles to penetrate the pads 3 and 6, thereby establishing a good electrical connection therebetween.
Alternatively, the embodiment shown in FIG. 2B utilizes a plunger 15 having a pressure pad 16 which engages the upper surface of module 5 and applies pressure created by spring means 17 which bears against the base member 18 affixed to the support for circuit board 2 by means not shown. spring means 17 has sufficient force to cause the ends of dendritic metal particles carried by adhesive film 10 to penetrate conductive metal pads 3 and 5, thereby establishing a good electrical connection therebetween.
FIG. 3A is a view of a portion of a sacrificial metal substrate used in the fabrication of the adhesive plastic film 10. The metal substrate has a photoresist in which a pattern of holes 20a-20n, corresponding to the pattern of pads 3 and 6 between which connection is desired, has been made by photolithographic techniques.
The partial sectional view of FIG. 3B, taken along the line 3--3 of FIG. 3A, shows the sacrificial metal substrate 21, which may be mounted on a temporary backing member 24, and the holes 22a-22n extending through the photoresist 23.
The intermediate assembly of FIGS. 3A and 3B is placed in a plating solution and dendritic metal particles are grown on the portions of metal substrate 21 exposed by holes 22a-22n, as shown in FIGS. 4A and 4B, utilizing conventional dendrite growing techniques. Information on growing dendrites suitable for use in this invention is provided in the publication:
Title: "A Novel Electrodeposition Process Which Enhances Connector Performance"
Authors: J. A. Molla
G. J. Saxenmeyer
A. D. Knight
Dated: 1993
Pages: Volume 93-20', pages 204-12
Name of Publication: Proceedings of the 2nd International Symposium on Electrochemical Technology Applications in Electronics, Electrochemical Society The preferred material for the dendrites is palladium. As shown in FIG. 4A, and more specifically in FIG. 4B, the dendritic metal particles 31 are grown to a length approximately the thickness of the adhesive plastic film 10.
FIG. 5 is a microscopic side view of a typical dendritic metal particle 31. The structure is an upwardly branching configuration having a base member 32 emanating from the exposed pad areas of sacrificial metal substrate 21. The dendrites have a crystalline cross sectional shape and the ends 33a and 33b of branches 34a and 34b are typically sharply pointed. Similarly, the start of the dendrite is also pointed. The intermediate product represented in FIG. 5 includes the temporary backing member 24, the sacrificial metal substrate 21 and the dendritic metal particle 31.
FIG. 6 illustrates the adhesive plastic film 10 which is applied to the intermediate product of FIG. 5, where all numerals correspond to those elements previously described. The film has a nominal thickness which is preferably, but not necessarily slightly, less than the nominal height of dendritic metal particles 31, allowing the ends 33a and 33b to project above the upper surface of adhesive plastic film 10. Preferably, adhesive plastic film is applied in liquid form and cured in place by appropriate means.
FIG. 7 shows the adhesive plastic film 10 after removal from temporary backing member 24 and selective etching of sacrificial metal substrate 21 to remove the pads.
FIG. 8 shows the adhesive plastic film 10 in position between a circuit board 2 having a conductive pad 3 and electronic circuit module 5 having a conductive pad 6. Typically, the pad 3 on circuit board 2 will project slightly above the upper surface of the board, while the pad 6 on electronic module 5 is more likely to form a level surface in conjunction with the lower surface of the module. While this might create interconnection problems with other systems, the upper, sharper, dendritic points are positioned to abut the pads 6 of module 5 and the lower, sharp dendritic points formed when the sacrificial metal substrate is etched away are used to connect to the raised pads 3 on the circuit board 2.
The final step in the interconnection process is illustrated in FIG. 9. Appropriate pressure, indicated by the arrows 50 and 51, is applied across adhesive film 10, causing the adhesive film to compress and the dendritic ends 33a and 33b to penetrate the pad 6 on circuit module 5 and the lower portion of dendrites 31 to make contact with the pad 3 on circuit board 2. The pressure is maintained by using plastic shrink film or mechanical clamp as shown in FIGS. 2A and 2B. Alternatively, pressure may be maintained by the shrinkage which results from curing the adhesive film.
FIG. 10 illustrates the method of the invention. The first step is the generation of the photoresist pattern of conductive pads on a nickel sacrificial substrate supported by a temporary backing member. The pattern corresponds to the pads on a circuit board and the electronic circuit modules to be connected thereto. The photoresist is exposed to light through a mask and developed to open up holes representing the pads to which connection is to be made.
After the pad holes are opened up, the substrate is immersed in a palladium salt solution and palladium dendrites are grown from the nickel pads until the dendrite ends pass beyond the photoresist, or reach such other suitable dimension as may be desired.
The photoresist is then stripped and a film of plastic adhesive material is applied to the surface, potting the dendrites, but leaving their ends exposed or just slightly below the film surface.
The plastic adhesive material is then removed from the sacrificial nickel backing and the temporary backing member, providing a thin film having areas, corresponding to the pads to be interconnected, in which palladium dendrites extend through the film.
The thin plastic adhesive film is then positioned on the circuit board with the dendrite containing areas aligned over the conductive metal pads on the circuit board. The circuit modules are then aligned over the adhesive plastic film, placing the conductive pads in alignment with the corresponding dendrite containing areas.
Pressure is then applied to the modules and the circuit board, causing the dendrite ends to make electrical contact with the conductive pads on the module and the circuit board and establishing the electrical connection between the pads.
The pressure is maintained by some suitable means such as plastic shrink wrap or mechanical clamping arrangement.
It will be appreciated that certain refinements may be desirable, or even necessary, in some instances. For example, the thermal expansion coefficient of the adhesive film may be matched to that of the printed circuit board or the circuit modules by the addition of suitable dielectric fillers such as silica or alumina. Similarly, the thermal conductivity of the film can be improved by the use of suitable fillers such as aluminum nitride, boron nitride, and granite.
Various modifications can be made to the present invention without departing from the apparent scope hereof.
Claims (9)
1. A device for interconnecting electronic modules to a wiring carrying substrate, comprising;
a. a flexible adhesive dielectric film having an upper surface to abut said module and a lower surface to abut said substrate and having a surface to surface thickness in the range of 1 to 2 mils;
b. said film having areas carrying dendritic metal particles oriented perpendicularly to the surfaces of said film; and wherein,
c. said areas correspond to conductive pads on said modules.
2. A device according to claim 1, wherein said dendritic metal particles are palladium.
3. A device according to claim 2, wherein said dendritic particles are grown on a nickel substrate having a pattern corresponding to the modules and substrate pads which are to be connected.
4. A device according to claim 3, wherein said flexible adhesive dielectric film is selected from a group consisting of thermosets including epoxy; acrylic; silicone; cyanate ester; thermoplastics including polyimide, polyetherimide and polysulfone; and a mixture of thermoplastics and thermosets.
5. A device according to claim 3, wherein said adhesive film further contains a dielectric filler of high thermal conductivity.
6. A device according to claim 3, wherein said adhesive film further contains a dielectric filler having a coefficient of thermal expansion chosen to match the film to said electronic modules.
7. A device according to claim 3, wherein said adhesive film further contains a dielectric filler having a coefficient of thermal expansion chosen to match the film to said wiring carrying substrate.
8. A device according to claim 3, wherein said adhesive film further contains a dielectric filler having a coefficient of thermal expansion chosen to minimize the difference in the respective coefficients of thermal expansion between said film, said electronic modules and said substrate.
9. A device according to claim 3, wherein said areas containing dendritic particles have a surface to surface resistance less than 40 milliohms/square micrometer.
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US08/895,537 US5910641A (en) | 1997-01-10 | 1997-07-17 | Selectively filled adhesives for compliant, reworkable, and solder-free flip chip interconnection and encapsulation |
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US78139797A | 1997-01-10 | 1997-01-10 | |
US08/895,537 US5910641A (en) | 1997-01-10 | 1997-07-17 | Selectively filled adhesives for compliant, reworkable, and solder-free flip chip interconnection and encapsulation |
Related Parent Applications (1)
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US78139797A Division | 1997-01-10 | 1997-01-10 |
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US08/895,536 Expired - Fee Related US5798050A (en) | 1997-01-10 | 1997-07-17 | Process for fabrication of a selectively filled flexible adhesive device for solderless connection of electronic modules to a substrate |
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US20050118393A1 (en) * | 2002-01-18 | 2005-06-02 | Corcoran Craig S. | Sheet having microsized architecture |
US20030180190A1 (en) * | 2002-01-18 | 2003-09-25 | Corcoran Craig S. | Covered microchamber structures |
US20030155656A1 (en) * | 2002-01-18 | 2003-08-21 | Chiu Cindy Chia-Wen | Anisotropically conductive film |
US20040126538A1 (en) * | 2002-01-18 | 2004-07-01 | Corcoran Craig S. | Sheet having microsized architecture |
US7514045B2 (en) | 2002-01-18 | 2009-04-07 | Avery Dennison Corporation | Covered microchamber structures |
DE10311964A1 (en) * | 2003-03-18 | 2004-10-07 | Infineon Technologies Ag | A chip module with a chip carrier (1), conduction paths (2) on both sides of the chip carrier, an IC-chip with contact surfaces and provided with a bump (sic) and filler composition useful in Flip-Chip technology |
US20060043608A1 (en) * | 2004-08-31 | 2006-03-02 | International Business Machines Corporation | Low stress conductive polymer bump |
US7170187B2 (en) | 2004-08-31 | 2007-01-30 | International Business Machines Corporation | Low stress conductive polymer bump |
US20070084629A1 (en) * | 2004-08-31 | 2007-04-19 | Bernier William E | Low stress conductive polymer bump |
US7442878B2 (en) | 2004-08-31 | 2008-10-28 | International Business Machines Corporation | Low stress conductive polymer bump |
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