US20020050909A1 - Electronic component and method of manufacture therefor - Google Patents
Electronic component and method of manufacture therefor Download PDFInfo
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- US20020050909A1 US20020050909A1 US08/930,440 US93044097A US2002050909A1 US 20020050909 A1 US20020050909 A1 US 20020050909A1 US 93044097 A US93044097 A US 93044097A US 2002050909 A1 US2002050909 A1 US 2002050909A1
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- electronic component
- resin
- alkoxide
- insulation layer
- electrodes
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES OR LIGHT-SENSITIVE DEVICES, OF THE ELECTROLYTIC TYPE
- H01G2/00—Details of capacitors not covered by a single one of groups H01G4/00-H01G11/00
- H01G2/12—Protection against corrosion
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C1/00—Details
- H01C1/02—Housing; Enclosing; Embedding; Filling the housing or enclosure
- H01C1/034—Housing; Enclosing; Embedding; Filling the housing or enclosure the housing or enclosure being formed as coating or mould without outer sheath
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C17/00—Apparatus or processes specially adapted for manufacturing resistors
- H01C17/02—Apparatus or processes specially adapted for manufacturing resistors adapted for manufacturing resistors with envelope or housing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C7/00—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material
- H01C7/10—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material voltage responsive, i.e. varistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C7/00—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material
- H01C7/10—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material voltage responsive, i.e. varistors
- H01C7/102—Varistor boundary, e.g. surface layers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C7/00—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material
- H01C7/18—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material comprising a plurality of layers stacked between terminals
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/43—Electric condenser making
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49082—Resistor making
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49082—Resistor making
- Y10T29/49087—Resistor making with envelope or housing
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49082—Resistor making
- Y10T29/49099—Coating resistive material on a base
Definitions
- the present invention relates to electronic components such as a multilayer varistor etc., and a method of manufacturing the same.
- a conventional electronic component having at least a pair of electrodes on the surface of body is impregnated with resin on the surface only in an area where the electrodes are not formed.
- the water-resisting quality may be improved by the resin impregnated in the body.
- the resin impregnated in the body there is a problem in the above described structure that the water etc. sneaks into through the edge of electrode causing deteriorated characteristics.
- the present invention aims to present an electronic component with which the sneaking of water etc. through the electrode edge is prevented by covering the electrode edge with an insulating layer.
- An electronic component comprises a body, at least a pair of electrodes formed on the surface of the body at a specified gap, and an insulation layer provided for covering the surface of the body in an area where the electrodes are not formed and the edge of the electrode, wherein at least a part of the insulation layer is formed by impregnating an insulation material into within-the-surface of the body.
- FIG. 1 is a cross sectional view showing a multilayer varistor according to an embodiment of the present invention.
- FIG. 2 is a chart showing manufacturing process steps of a multilayer varistor according to an embodiment of the present invention.
- FIG. 3 is a cross sectional view showing a varistor after silicone varnish impregnation according to an embodiment of the present invention.
- FIG. 4 is a cross sectional view showing a varistor after centrifugal processing according to an embodiment of the present invention.
- FIG. 5 is a cross sectional view showing a varistor after toluene impregnation according to an embodiment of the present invention.
- FIG. 6 is a cross sectional view showing a varistor after silicone resin curing according to an embodiment of the present invention.
- FIG. 7 is a cross sectional view showing a varistor after grinding according to an embodiment of the present invention.
- FIG. 1 there are plural internal electrodes 2 made mainly of nickel (Ni), inside varistor 1 . These internal electrodes 2 are alternately pulled out to respective ends of varistor 1 to be electrically connected with external electrodes 3 .
- the external electrode 3 is comprised of at least two layers; an inner layer 3 a is made mainly of Ni, an outer layer 3 b is made mainly of silver (Ag).
- a ceramic sheet la existing between and outside the internal electrodes 2 is made mainly of SrTiO 3 , containing Nb 2 O 5 , SiO 2 etc. as subordinate component.
- a within-the-surface insulation layer 30 is a layer formed by covering the porous surface inside the varistor 1 or filling the pore with silicone resin.
- An outside-the-surface insulation layer 31 is a layer of silicone resin covering the edge of external electrode 3 .
- On the surface of external electrode 3 is a layer of plating 4 , comprised of Ni layer 4 a and solder layer 4 b.
- the ceramic sheet la is manufactured through the process ( 11 ); mixing of raw materials, calcination, crashing, slurrying and forming in a sheet form.
- the ceramic sheet la and internal electrodes 2 are laminated ( 12 ), cut ( 13 ), binder is removed ( 14 ), chamfered ( 15 ), and the edge is curved.
- Inner layer 3 a of external electrode 3 is formed through coating ( 16 ) and sintering ( 17 ) at 1200 - 1300° C. in reducing atmosphere.
- outer layer 3 b is formed through coating ( 18 ) and heating ( 19 ) at 800 - 850° C. for reoxidizing.
- a completely dried varistor 1 is immersed ( 20 ) in silicone varnish containing 75% toluene as resolvent to have the varistor 1 impregnated with silicone varnish.
- Varistor 1 is pressurized ( 21 ) by 6 - 1500 kg/cm 2 for e.g. 2 minutes while being immersed in the silicone varnish in order to have the varistor 1 impregnated further with the silicone varnish, and then restored to the normal atmospheric pressure, at which the multilayer varistor is put on service.
- the varistor 1 at this stage is covered thick with silicone varnish 5 for the entire surface, with the vaistor 1 and the external electrodes 3 impregnated with silicone varnish 5 , as shown in FIG. 3.
- the pressurizing force may be determined according to the density of varistor 1 ; namely, varistor 1 of a higher density may be pressurized with a higher force for the easier impregnation. In the case of a varistor whose main component is ZnO, the density of which is high and the pressurizing force may be raised to 500 - 1500 kg/cm 2 .
- the varistor 1 is taken out of the silicone varnish, and put into a metal basket (or metal net etc.) to be set on a centrifugal separator having inner diameter of e.g. 60 cm running at 500 - 1500 r/min. ( 22 in FIG. 2) for removing most portion of unnecessary silicone varnish sticking on the surface of varistor 1 , as shown in FIG. 4. Then, the metal basket containing the varistor is immersed in toluene ( 23 ), vibrated for 5 - 60 sec., taken out, and quickly heated at e.g. 60° C. for removing the toluene sticking on the surface of varistor 1 , as shown in FIG. 5.
- varistor 1 may be taken out of the metal basket to be put in SiO 2 powder, which is inert to the silicone varnish, to have unnecessary silicone varnish 5 sticking on the surface of varistor 1 absorbed, and then separating the varistor 1 using a sieve or such other devices. Through the above described procedure, unnecessary portion of silicone varnish 5 sticking on the surface of varistor 1 is removed.
- varistor 1 is put on a metal net to be heated at a temperature (approximately 125 - 200° C. ) higher than the curing temperature of silicone resin contained in the silicone varnish 5 for curing ( 24 ) the silicone resin.
- a part of the silicone resin impregnated within external electrodes 3 and inside of varistor 1 is separated out to cover the surface, and a varistor 1 as shown in FIG. 6 is obtained.
- varistor 1 is put into a container of e.g. polyethylene together with an abrasive of SiC and water, the container sealed, and provided with mechanical movement such as revolution, vibration etc.
- the silicone resin on the surface of external electrodes 3 is selectively removed by a mechanical stress given to varistor 1 due to a fact that the adhesion strength of silicone resin after curing is stronger with respect to varistor 1 than with the surface of external electrode 3 .
- Some of the silicone resin may remain in the inner surface of external electrode 3 , the electrical contact of external electrode 3 is not affected by the silicone resin.
- a multilayer varistor having enhanced water-resisting property is implemented by the formation of a silicone resin-impregnated within-the-surface insulation layer 30 inside the varistor 1 , with which multilayer varistor the peeling-off at the edge of external electrode 3 is also prevented by the formation of an outside-the-surface insulation layer 31 , and the external electrode 3 does not ill-affect plating ( 26 ) and other post processes.
- an outside-the-surface insulation layer 31 so as it covers the edge of external electrodes 3 formed at the ends of varistor 1 covering a part of the side surface, the sneaking of plating liquid, water etc. into inside of varistor 1 through the boundary between external electrode 3 and varistor 1 is prevented.
- silicone resin has been exemplified as the insulation material for forming the outside-the-surface insulation layer 31 and the within-the-surface insulation layer 30
- other resins may of course be used provided that they satisfy a certain heat resistivity, insulating property, water-repellent property, and low water-absorbing property; either one, or more than one, of epoxy resin, acrylic resin, polybutadiene resin, phenolic resin, etc. may be used for the purpose, besides the silicone resin.
- At least one kind of metal alkoxide selected from the group of silicon, titanium, aluminium, zirconium, yttrium and magnesium may be used to obtain a same effect.
- the impregnating solution is made with alcohol or other such solvents that dissolve metal alkoxide.
- the within-the-surface insulation layer 30 has preferably a greatest possible thickness in so far as the characteristics of a multilayer varistor is not affected, at the same time the thinnest part of the within-the-surface insulation layer 30 of silicone resin after curing is preferably equal to or thicker than 10 ⁇ m. This is adjustable through the selection of the viscosity of silicone varnish 5 , the rate of solvent and the pressurizing force.
- the effect of pressurizing is enhanced by providing a state where the pressure is lower than the normal atmospheric pressure prior to the step of pressurizing for impregnation of silicone varnish 5 into varistor 1 .
- a harder outside-the-surface insulation layer 31 is formed by thoroughly removing a solvent contained in silicone varnish 5 impregnated into varistor 1 by heating, prior to curing, at a temperature lower than boiling point.
- the moisture-resisting property may be improved further by repeating the process steps from the immersion in silicone varnish 5 through the surface grinding for plural times, preferably twice. By so doing, the silicone resin is impregnated further into inside of varistor 1 .
- the edge of body has a curved shape. This shape alleviates the concentration of stress to one part of external electrode 3 when removing organic substance on external electrode 3 by grinding.
- the same effects are implementable also with a multilayer varistor using zinc oxide as the main component, as well as ceramic thermistors, capacitors, resistors and other electronic components in general.
- the present invention implements the same effects in electronic components of any shapes, for example a disk shape electronic component.
- the insulation layer formed by impregnation into inside of the surface prevents deterioration of the moisture-resisting property, and the insulation layer formed on the surface enhances the strength of electrode preventing the peeling-off at the edge of electrode. Furthermore, this contributes to prevent the sneaking of moisture etc. into the inside through the edge of electrode.
- the moisture-resisting property is enhanced a step further.
Abstract
Description
- The present invention relates to electronic components such as a multilayer varistor etc., and a method of manufacturing the same.
- 1. Background Art
- A conventional electronic component having at least a pair of electrodes on the surface of body is impregnated with resin on the surface only in an area where the electrodes are not formed.
- The water-resisting quality may be improved by the resin impregnated in the body. However, there is a problem in the above described structure that the water etc. sneaks into through the edge of electrode causing deteriorated characteristics.
- 2. Disclosure of the Invention
- The present invention aims to present an electronic component with which the sneaking of water etc. through the electrode edge is prevented by covering the electrode edge with an insulating layer.
- An electronic component according to the present invention comprises a body, at least a pair of electrodes formed on the surface of the body at a specified gap, and an insulation layer provided for covering the surface of the body in an area where the electrodes are not formed and the edge of the electrode, wherein at least a part of the insulation layer is formed by impregnating an insulation material into within-the-surface of the body. With the above described structure in which an insulation layer provided on the surface covers the edge of electrodes, peeling-off at the edge of electrode is prevented, at the same time the sneaking of water through the electrode edge is also avoided.
- FIG. 1 is a cross sectional view showing a multilayer varistor according to an embodiment of the present invention. FIG. 2 is a chart showing manufacturing process steps of a multilayer varistor according to an embodiment of the present invention. FIG. 3 is a cross sectional view showing a varistor after silicone varnish impregnation according to an embodiment of the present invention. FIG. 4 is a cross sectional view showing a varistor after centrifugal processing according to an embodiment of the present invention. FIG. 5 is a cross sectional view showing a varistor after toluene impregnation according to an embodiment of the present invention. FIG. 6 is a cross sectional view showing a varistor after silicone resin curing according to an embodiment of the present invention. FIG. 7 is a cross sectional view showing a varistor after grinding according to an embodiment of the present invention.
- In the following, an electronic component according to the present invention and a method of manufacturing the same is described in detail referring to drawings.
- As shown in FIG. 1, there are plural
internal electrodes 2 made mainly of nickel (Ni), insidevaristor 1. Theseinternal electrodes 2 are alternately pulled out to respective ends ofvaristor 1 to be electrically connected withexternal electrodes 3. Theexternal electrode 3 is comprised of at least two layers; aninner layer 3 a is made mainly of Ni, anouter layer 3 b is made mainly of silver (Ag). A ceramic sheet la existing between and outside theinternal electrodes 2 is made mainly of SrTiO3, containing Nb2O5, SiO2 etc. as subordinate component. A within-the-surface insulation layer 30 is a layer formed by covering the porous surface inside thevaristor 1 or filling the pore with silicone resin. An outside-the-surface insulation layer 31 is a layer of silicone resin covering the edge ofexternal electrode 3. On the surface ofexternal electrode 3 is a layer of plating 4, comprised of Ni layer 4 a andsolder layer 4 b. - As shown in FIG. 2, the ceramic sheet la is manufactured through the process (11); mixing of raw materials, calcination, crashing, slurrying and forming in a sheet form. The ceramic sheet la and
internal electrodes 2 are laminated (12), cut (13), binder is removed (14), chamfered (15), and the edge is curved.Inner layer 3 a ofexternal electrode 3 is formed through coating (16) and sintering (17) at 1200 - 1300° C. in reducing atmosphere. Then,outer layer 3 b is formed through coating (18) and heating (19) at 800 - 850° C. for reoxidizing. A completely driedvaristor 1 is immersed (20) in silicone varnish containing 75% toluene as resolvent to have thevaristor 1 impregnated with silicone varnish. -
Varistor 1 is pressurized (21) by 6 - 1500 kg/cm2 for e.g. 2 minutes while being immersed in the silicone varnish in order to have thevaristor 1 impregnated further with the silicone varnish, and then restored to the normal atmospheric pressure, at which the multilayer varistor is put on service. Thevaristor 1 at this stage is covered thick withsilicone varnish 5 for the entire surface, with thevaistor 1 and theexternal electrodes 3 impregnated withsilicone varnish 5, as shown in FIG. 3. The pressurizing force may be determined according to the density ofvaristor 1; namely,varistor 1 of a higher density may be pressurized with a higher force for the easier impregnation. In the case of a varistor whose main component is ZnO, the density of which is high and the pressurizing force may be raised to 500 - 1500 kg/cm2. - The
varistor 1 is taken out of the silicone varnish, and put into a metal basket (or metal net etc.) to be set on a centrifugal separator having inner diameter of e.g. 60 cm running at 500 - 1500 r/min. (22 in FIG. 2) for removing most portion of unnecessary silicone varnish sticking on the surface ofvaristor 1, as shown in FIG. 4. Then, the metal basket containing the varistor is immersed in toluene (23), vibrated for 5 - 60 sec., taken out, and quickly heated at e.g. 60° C. for removing the toluene sticking on the surface ofvaristor 1, as shown in FIG. 5. Instead of immersing in toluene,varistor 1 may be taken out of the metal basket to be put in SiO2 powder, which is inert to the silicone varnish, to haveunnecessary silicone varnish 5 sticking on the surface ofvaristor 1 absorbed, and then separating thevaristor 1 using a sieve or such other devices. Through the above described procedure, unnecessary portion ofsilicone varnish 5 sticking on the surface ofvaristor 1 is removed. - And then,
varistor 1 is put on a metal net to be heated at a temperature (approximately 125 - 200° C. ) higher than the curing temperature of silicone resin contained in thesilicone varnish 5 for curing (24) the silicone resin. When, a part of the silicone resin impregnated withinexternal electrodes 3 and inside ofvaristor 1 is separated out to cover the surface, and avaristor 1 as shown in FIG. 6 is obtained. After this,varistor 1 is put into a container of e.g. polyethylene together with an abrasive of SiC and water, the container sealed, and provided with mechanical movement such as revolution, vibration etc. for grinding (25) the surface, in order to remove the silicone resin covering the surface ofexternal electrodes 3 to a degree so as plating and other succeeding process steps are not ill-affected. During the surface grinding (25), the silicone resin on the surface ofexternal electrodes 3 is selectively removed by a mechanical stress given tovaristor 1 due to a fact that the adhesion strength of silicone resin after curing is stronger with respect tovaristor 1 than with the surface ofexternal electrode 3. Some of the silicone resin may remain in the inner surface ofexternal electrode 3, the electrical contact ofexternal electrode 3 is not affected by the silicone resin. - The surface of
external electrode 3 ofvaristor 1 is plated (26) to obtain a multilayer varistor as illustrated in FIG. 1. - As described in the above, a multilayer varistor having enhanced water-resisting property is implemented by the formation of a silicone resin-impregnated within-the-
surface insulation layer 30 inside thevaristor 1, with which multilayer varistor the peeling-off at the edge ofexternal electrode 3 is also prevented by the formation of an outside-the-surface insulation layer 31, and theexternal electrode 3 does not ill-affect plating (26) and other post processes. - Now in the following, description will be made on some of the noticeable items regarding a multilayer varistor according to the present embodiment and its manufacturing method.
- Referring to FIG. 1, by forming an outside-the-
surface insulation layer 31 so as it covers the edge ofexternal electrodes 3 formed at the ends ofvaristor 1 covering a part of the side surface, the sneaking of plating liquid, water etc. into inside ofvaristor 1 through the boundary betweenexternal electrode 3 andvaristor 1 is prevented. - As an outside-the-
surface insulation layer 31 and a within-the-surface insulation layer 30 have glossy surface, whether or not the within-the-surface insulation layer 30 and the outside-the-surface insulation layer 31 are formed can be visually identified by inspecting the surface of a multilayer varistor. This makes the selection work easier. - Although silicone resin has been exemplified as the insulation material for forming the outside-the-
surface insulation layer 31 and the within-the-surface insulation layer 30, other resins may of course be used provided that they satisfy a certain heat resistivity, insulating property, water-repellent property, and low water-absorbing property; either one, or more than one, of epoxy resin, acrylic resin, polybutadiene resin, phenolic resin, etc. may be used for the purpose, besides the silicone resin. - Instead of the resin, or in mixture with the resin, at least one kind of metal alkoxide selected from the group of silicon, titanium, aluminium, zirconium, yttrium and magnesium may be used to obtain a same effect.
- When the metal alkoxide is used, the impregnating solution is made with alcohol or other such solvents that dissolve metal alkoxide.
- The within-the-
surface insulation layer 30 has preferably a greatest possible thickness in so far as the characteristics of a multilayer varistor is not affected, at the same time the thinnest part of the within-the-surface insulation layer 30 of silicone resin after curing is preferably equal to or thicker than 10 μm. This is adjustable through the selection of the viscosity ofsilicone varnish 5, the rate of solvent and the pressurizing force. - The effect of pressurizing is enhanced by providing a state where the pressure is lower than the normal atmospheric pressure prior to the step of pressurizing for impregnation of
silicone varnish 5 intovaristor 1. - Besides SiO2 exemplified as the powder inert to
silicone varnish 5, other powders may also be used provided that they do not react with the impregnation solution to be impregnated intovaristor 1; either one, or a mixture, of ZrO2, Al2O3, MgO may serve a same purpose. - A harder outside-the-
surface insulation layer 31 is formed by thoroughly removing a solvent contained insilicone varnish 5 impregnated intovaristor 1 by heating, prior to curing, at a temperature lower than boiling point. - The moisture-resisting property may be improved further by repeating the process steps from the immersion in
silicone varnish 5 through the surface grinding for plural times, preferably twice. By so doing, the silicone resin is impregnated further into inside ofvaristor 1. - It is preferred that the edge of body has a curved shape. This shape alleviates the concentration of stress to one part of
external electrode 3 when removing organic substance onexternal electrode 3 by grinding. - Although in the present embodiment a multilayer varistor using strontium titanium oxide as the main component is exemplified, the same effects are implementable also with a multilayer varistor using zinc oxide as the main component, as well as ceramic thermistors, capacitors, resistors and other electronic components in general. Not only in the multilayer type electronic components, the present invention implements the same effects in electronic components of any shapes, for example a disk shape electronic component.
- Industrial Applicability
- The insulation layer formed by impregnation into inside of the surface prevents deterioration of the moisture-resisting property, and the insulation layer formed on the surface enhances the strength of electrode preventing the peeling-off at the edge of electrode. Furthermore, this contributes to prevent the sneaking of moisture etc. into the inside through the edge of electrode. The moisture-resisting property is enhanced a step further.
Claims (18)
Priority Applications (1)
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US09/296,537 US6171644B1 (en) | 1996-01-24 | 1999-04-22 | Electronic component and method of manufacture therefor |
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JP8-009773 | 1996-01-24 | ||
JP8009773A JPH09205005A (en) | 1996-01-24 | 1996-01-24 | Electronic component and manufacture thereof |
PCT/JP1997/000146 WO1997027598A1 (en) | 1996-01-24 | 1997-01-23 | Electronic parts and method for manufacturing the same |
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US09/296,537 Division US6171644B1 (en) | 1996-01-24 | 1999-04-22 | Electronic component and method of manufacture therefor |
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US20020050909A1 true US20020050909A1 (en) | 2002-05-02 |
US6400253B1 US6400253B1 (en) | 2002-06-04 |
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US08/930,440 Expired - Fee Related US6400253B1 (en) | 1996-01-24 | 1997-01-23 | Electronic component and method of manufacture therefor |
US09/296,537 Expired - Fee Related US6171644B1 (en) | 1996-01-24 | 1999-04-22 | Electronic component and method of manufacture therefor |
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US09/296,537 Expired - Fee Related US6171644B1 (en) | 1996-01-24 | 1999-04-22 | Electronic component and method of manufacture therefor |
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US (2) | US6400253B1 (en) |
EP (1) | EP0821374B1 (en) |
JP (1) | JPH09205005A (en) |
KR (1) | KR100281244B1 (en) |
CN (1) | CN1128453C (en) |
DE (1) | DE69733863T2 (en) |
TW (1) | TW359839B (en) |
WO (1) | WO1997027598A1 (en) |
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US11817271B2 (en) | 2019-08-28 | 2023-11-14 | Samsung Electro-Mechanics Co., Ltd. | Multilayer electronic component including a silicon organic compound layer arranged between layers of an external electrode |
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US6005015A (en) * | 1997-04-02 | 1999-12-21 | Sealed Air Coporation | Polyolefin products and process additives therefor having reduced transfer to substrates |
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DE10062293A1 (en) * | 2000-12-14 | 2002-07-04 | Epcos Ag | Electrical component and method for its production |
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US20220246334A1 (en) * | 2021-02-01 | 2022-08-04 | KYOCERA AVX Components Corporation | Varistor Having Flexible Terminations |
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Family Cites Families (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2253376A (en) * | 1939-06-23 | 1941-08-19 | Westinghouse Electric & Mfg Co | Lightning-arrester block |
US2253360A (en) * | 1939-07-26 | 1941-08-19 | Westinghouse Electric & Mfg Co | Coated lighting-arrester block |
US2305577A (en) * | 1940-08-04 | 1942-12-15 | Line Material Co | Resistor |
US2501322A (en) * | 1946-11-07 | 1950-03-21 | Westinghouse Electric Corp | Moisture-resistant lightning arrester valve block |
US2914742A (en) * | 1957-06-06 | 1959-11-24 | Ohio Brass Co | Valve block for lightning arresters |
US3720543A (en) * | 1971-04-12 | 1973-03-13 | Corning Glass Works | Coated porous ceramic article and method of making |
US3791863A (en) * | 1972-05-25 | 1974-02-12 | Stackpole Carbon Co | Method of making electrical resistance devices and articles made thereby |
JPS6054761B2 (en) * | 1979-01-16 | 1985-12-02 | 株式会社日立製作所 | Voltage nonlinear resistor |
US4371860A (en) * | 1979-06-18 | 1983-02-01 | General Electric Company | Solderable varistor |
JPH0754784B2 (en) * | 1987-07-02 | 1995-06-07 | ニッセイ電機株式会社 | Chip type electronic component and manufacturing method thereof |
JP2744016B2 (en) * | 1988-06-27 | 1998-04-28 | 株式会社東芝 | Manufacturing method of nonlinear resistor |
DE3930000A1 (en) * | 1988-09-08 | 1990-03-15 | Murata Manufacturing Co | VARISTOR IN LAYER DESIGN |
JP2827333B2 (en) * | 1989-10-13 | 1998-11-25 | 住友電気工業株式会社 | Manufacturing method of heat-resistant insulating coil |
JPH03240202A (en) * | 1990-02-19 | 1991-10-25 | Opt D D Meruko Lab:Kk | Thermistor |
JP2847102B2 (en) * | 1990-06-08 | 1999-01-13 | 三菱マテリアル株式会社 | Chip type thermistor and method of manufacturing the same |
JPH05308003A (en) * | 1992-03-30 | 1993-11-19 | Taiyo Yuden Co Ltd | Method of manufacturing chip type thermistor |
JPH06295803A (en) * | 1993-04-07 | 1994-10-21 | Mitsubishi Materials Corp | Chip type thermister and production thereof |
JPH0766006A (en) * | 1993-08-30 | 1995-03-10 | Koa Corp | Square-shaped chip thermistor |
US5455554A (en) * | 1993-09-27 | 1995-10-03 | Cooper Industries, Inc. | Insulating coating |
JPH07201533A (en) * | 1994-01-11 | 1995-08-04 | Tama Electric Co Ltd | Chip part |
KR100255906B1 (en) | 1994-10-19 | 2000-05-01 | 모리시타 요이찌 | Electronic component and method for fabricating the same |
US5614074A (en) * | 1994-12-09 | 1997-03-25 | Harris Corporation | Zinc phosphate coating for varistor and method |
-
1996
- 1996-01-24 JP JP8009773A patent/JPH09205005A/en active Pending
-
1997
- 1997-01-23 KR KR1019970706533A patent/KR100281244B1/en not_active IP Right Cessation
- 1997-01-23 DE DE69733863T patent/DE69733863T2/en not_active Expired - Lifetime
- 1997-01-23 WO PCT/JP1997/000146 patent/WO1997027598A1/en active IP Right Grant
- 1997-01-23 CN CN97190027A patent/CN1128453C/en not_active Expired - Fee Related
- 1997-01-23 US US08/930,440 patent/US6400253B1/en not_active Expired - Fee Related
- 1997-01-23 EP EP97900762A patent/EP0821374B1/en not_active Expired - Lifetime
- 1997-03-31 TW TW086104101A patent/TW359839B/en not_active IP Right Cessation
-
1999
- 1999-04-22 US US09/296,537 patent/US6171644B1/en not_active Expired - Fee Related
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Also Published As
Publication number | Publication date |
---|---|
EP0821374A1 (en) | 1998-01-28 |
CN1178030A (en) | 1998-04-01 |
WO1997027598A1 (en) | 1997-07-31 |
DE69733863T2 (en) | 2006-04-06 |
US6171644B1 (en) | 2001-01-09 |
JPH09205005A (en) | 1997-08-05 |
EP0821374A4 (en) | 1999-09-01 |
CN1128453C (en) | 2003-11-19 |
KR100281244B1 (en) | 2001-02-01 |
US6400253B1 (en) | 2002-06-04 |
DE69733863D1 (en) | 2005-09-08 |
TW359839B (en) | 1999-06-01 |
EP0821374B1 (en) | 2005-08-03 |
KR19980703131A (en) | 1998-10-15 |
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