TWM650153U - Circuit board electrical test editing system - Google Patents
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- TWM650153U TWM650153U TW112209717U TW112209717U TWM650153U TW M650153 U TWM650153 U TW M650153U TW 112209717 U TW112209717 U TW 112209717U TW 112209717 U TW112209717 U TW 112209717U TW M650153 U TWM650153 U TW M650153U
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Abstract
一種電路板電性測試編輯系統,用以解決習知電路板的電性測試混亂且編輯整理困難的問題。係包含:一影像模組,擷取一待測電路板之一線路圖;及一編輯模組,耦合連接該影像模組,該編輯模組在該線路圖選取數個測試點,並在各該測試點上標記一測試編碼,該編輯模組判定各該測試點的電性狀態,該編輯模組輸出一電性設定表,該電性設定表係包含該數個測試點的測試編碼及電性狀態。 A circuit board electrical test editing system is used to solve the conventional problems of confusing electrical test of circuit boards and difficulty in editing and sorting. The system includes: an imaging module, which captures a circuit diagram of a circuit board under test; and an editing module, which is coupled to the imaging module. The editing module selects several test points in the circuit diagram, and in each The test point is marked with a test code. The editing module determines the electrical status of each test point. The editing module outputs an electrical setting table. The electrical setting table includes the test codes of the several test points and electrical state.
Description
本創作係關於一種電路板的製程改善技術,尤其是一種快速判定電路板上的測試點位置及電性狀態的電路板電性測試編輯系統。 This creation is about a circuit board process improvement technology, especially a circuit board electrical test editing system that can quickly determine the position and electrical status of test points on the circuit board.
電路板上分布大量且功能不同的金屬線,例如:用於電連接二個以上的電子元件、焊接晶片引腳、填補空白區域等,在電路板製造完成後,會對上述金屬線進行電性測試或稱開路/短路測試(Open/Short Test),例如:測試各該金屬線的連通性(Continuity)及絕緣性(Isolation),以判斷未連接電路板迴路的金屬線是否與其他線路絕緣而為開路,及判斷電性連接的金屬線是否導通而為短路,以檢測電路板用於承載電子元件能否使電性功能正常運作。又,電路板的電性測試方法可以是全面接觸探針測試或利用飛針(Flying Probe)測試,係利用可移動的二至四個探針,在電路板上的數個測試點之間來回移動、接觸、測量,反復多次後完成一塊電路板的測試,雖然能夠測試各種不同電路圖案的電路板,但是測試過程緩慢耗時;或可以利用專用治具(Dedicated Fixture)測試,藉由在治具上安插數個探針及連接測試線,並使探針逐一對應電路板產品的所有測試點位置,係可以透過該治具一次測試整個電路板,但是對應不同產品必須製造專用的治具。 There are a large number of metal wires with different functions distributed on the circuit board. For example, they are used to electrically connect two or more electronic components, solder chip pins, fill blank areas, etc. After the circuit board is manufactured, the above-mentioned metal wires will be electrically The test is also called an Open/Short Test, for example: testing the continuity and insulation of each metal wire to determine whether the metal wires that are not connected to the circuit board circuit are insulated from other lines. It is an open circuit, and it is judged whether the electrically connected metal wire is conductive and it is a short circuit, to detect whether the circuit board used to carry electronic components can operate the electrical function normally. In addition, the electrical testing method of the circuit board can be full contact probe testing or flying probe testing, which uses two to four movable probes to go back and forth between several test points on the circuit board. Move, touch, measure, and repeat several times to complete the test of a circuit board. Although circuit boards with various circuit patterns can be tested, the test process is slow and time-consuming; or you can use a dedicated fixture (Dedicated Fixture) to test, by By placing several probes on the fixture and connecting the test lines, and making the probes correspond to all the test point positions of the circuit board product one by one, the entire circuit board can be tested through the fixture at one time, but special fixtures must be manufactured for different products. .
惟,隨著電子產品的微型化且功能提升,電路板上的線路及接點複雜且密集,導致電路板之各測試點的位置及特性(開路/短路)分佈混亂而辨認困難,因此,在執行上述習知電路板的電性測試方法之前,必須確 認各測試點所接受的測試種類,以避免錯誤的測試結果造成誤判,而導致測試製成報廢正常的電路板或使有瑕疵的電路板出貨。 However, with the miniaturization and improvement of functions of electronic products, the circuits and contacts on the circuit board are complex and dense, resulting in confusing distribution of the locations and characteristics (open circuit/short circuit) of each test point on the circuit board, making it difficult to identify. Therefore, in Before performing the above conventional circuit board electrical testing method, it must be confirmed Identify the types of tests accepted by each test point to avoid misjudgments caused by incorrect test results, which may lead to the scrapping of normal circuit boards or the shipment of defective circuit boards.
有鑑於此,習知的電路板電性測試確實仍有加以改善之必要。 In view of this, there is still a need to improve conventional circuit board electrical testing.
為解決上述問題,本創作的目的是提供一種電路板電性測試編輯系統,係可以節省判定電路板電性的人力及時間。 In order to solve the above problems, the purpose of this creation is to provide a circuit board electrical testing and editing system, which can save manpower and time in determining the electrical properties of circuit boards.
本創作的次一目的是提供一種電路板電性測試編輯系統,係可以提升測試製程效率。 The secondary purpose of this creation is to provide a circuit board electrical test editing system that can improve the efficiency of the test process.
本創作的又一目的是提供一種電路板電性測試編輯系統,係可以檢測電路板的迴路功能及安裝品質。 Another purpose of this invention is to provide a circuit board electrical testing and editing system that can detect the circuit function and installation quality of the circuit board.
本創作全文所述方向性或其近似用語,例如「左」、「右」、「上(頂)」、「下(底)」、「內」、「側面」等,主要係參考附加圖式的方向,各方向性或其近似用語僅用以輔助說明及理解本創作的各實施例,非用以限制本創作。 Directionality or similar terms used throughout this article, such as "left", "right", "top (top)", "bottom (bottom)", "inside", "side", etc., are mainly referred to the attached drawings The direction, directionality or similar terms are only used to assist in explaining and understanding the embodiments of the present invention, but are not intended to limit the present invention.
本創作全文所記載的元件及構件使用「一」或「一個」之量詞,僅是為了方便使用且提供本創作範圍的通常意義;於本創作中應被解讀為包括一個或至少一個,且單一的概念也包括複數的情況,除非其明顯意指其他意思。 The use of the quantifier "a" or "one" in the components and components recorded in the entire text of this creation is only for convenience of use and to provide the usual meaning of the scope of this creation; in this creation, it should be interpreted as including one or at least one, and single The concept of also includes the plural unless it is obvious that something else is meant.
本創作全文所述有關「系統」、「模組」者,各係可包含至少一「處理器(Processor)」,所述處理器係指具備特定功能且以硬體或硬體與軟體實現的各式資料處理裝置,以處理分析資訊或產生對應控制資訊,例如:電子控制器、伺服器、雲端平台、虛擬機器、桌上型電腦、筆記型電腦、平板電腦或智慧型手機等,係本創作所屬技術領域中具有通常知識者可以理解。 本創作所述系統及模組,另可包含對應的資料接收或傳輸單元,以進行所需資料的接收或傳輸。本創作所述系統及模組,另可包含對應的資料庫或儲存單元,以儲存所需資料。特別是,所述處理器可以是基於分散式系統架構中的多個處理器的集合,用於多個處理器間資訊串流處理的過程、機制及結果。 The "system" and "module" mentioned in the full text of this article may each include at least one "processor". The processor refers to a processor that has specific functions and is implemented by hardware or hardware and software. Various data processing devices are used to process analysis information or generate corresponding control information, such as electronic controllers, servers, cloud platforms, virtual machines, desktop computers, notebook computers, tablet computers or smart phones, etc. The creation can be understood by those with ordinary knowledge in the technical field to which the creation belongs. The systems and modules described in this creation may also include corresponding data receiving or transmitting units to receive or transmit the required data. The systems and modules described in this creation may also include corresponding databases or storage units to store required data. In particular, the processor may be a collection of multiple processors based on a distributed system architecture, and is used for the process, mechanism and result of information streaming processing between multiple processors.
本創作的電路板電性測試編輯系統,包含:一影像模組,擷取一待測電路板之一線路圖;及一編輯模組,耦合連接該影像模組,該編輯模組在該線路圖選取數個測試點,並在各該測試點上標記一測試編碼,該編輯模組判定各該測試點的電性狀態,該編輯模組輸出一電性設定表,該電性設定表係包含該數個測試點的測試編碼及電性狀態。 The circuit board electrical test and editing system of this invention includes: an image module that captures a circuit diagram of a circuit board to be tested; and an editing module that is coupled to the image module, and the editing module is connected to the circuit board Select several test points and mark a test code on each test point. The editing module determines the electrical status of each test point. The editing module outputs an electrical setting table. The electrical setting table is Contains the test codes and electrical status of the several test points.
據此,本創作的電路板電性測試編輯系統,藉由產生待測試電路板之線路圖及電性設定表,係可以判定電路板上的測試點位置及電性狀態,如此,在電路板測試過程中,參照該線路圖及該電性設定表係能夠快速辨別測試探針要接觸的測試點的位置,及判定測試結果是否正常,係具有節省測試作業人力及縮短測試製程時間的功效。 According to this, the circuit board electrical test editing system of this invention can determine the test point position and electrical status of the circuit board by generating the circuit diagram and electrical setting table of the circuit board to be tested. In this way, on the circuit board During the test process, referring to the circuit diagram and the electrical setting table can quickly identify the position of the test point that the test probe is to contact, and determine whether the test result is normal. This has the effect of saving testing work manpower and shortening the testing process time.
其中,該線路圖係由數條線路排列分布而成,且該數條線路圍繞一安裝區。如此,藉由該線路圖的分布情形,係可以辨識該數條線路形成導電迴路或填補空白區域,係具有供系統判斷線路電性的功效。 Wherein, the circuit diagram is composed of several lines arranged and distributed, and the several lines surround an installation area. In this way, through the distribution of the circuit diagram, it can be identified that the several circuits form conductive loops or fill blank areas, which has the effect of allowing the system to determine the electrical properties of the circuits.
其中,該數個測試點係該數條線路分布於該線路圖之相對兩側的端點。如此,該數個測試點的位置係可以讓測試探針容易位移至定位,係具有提升測試效率的功效。 The test points are the end points of the lines distributed on opposite sides of the circuit diagram. In this way, the position of the several test points allows the test probe to be easily moved to the position, which has the effect of improving the test efficiency.
其中,各該線路具有至少一個測試點。如此,透過該數個測試點係可以分別測試該數個線路,係具有檢測電路板品質的功效。 Each line has at least one test point. In this way, the plurality of circuits can be tested separately through the plurality of test points, which has the effect of detecting the quality of the circuit board.
其中,一個該測試點與至少一個其他測試點位於同一個線路上,該測試點的電性狀態為一短路狀態。如此,檢測該短路狀態係可以確認 線路的電連接功能是否正常,係具有檢查電路板之迴路功能的功效。 One of the test points is located on the same line as at least one other test point, and the electrical state of the test point is a short circuit state. In this way, detecting the short circuit status can confirm Whether the electrical connection function of the line is normal has the function of checking the loop function of the circuit board.
其中,一個該測試點與至少一個其他測試點位於同一個線路上,且該線路重疊於該安裝區的範圍內,該測試點的電性狀態為一安裝短路狀態。如此,檢測該安裝短路狀態還可以確認所安裝電子元件的使用狀況,係具有確認安裝品質及元件正常的功效。 Wherein, one of the test points and at least one other test point are located on the same line, and the line overlaps within the range of the installation area. The electrical state of the test point is an installation short circuit state. In this way, detecting the short-circuit status of the installation can also confirm the usage status of the installed electronic components, which has the effect of confirming the installation quality and the normality of the components.
其中,一個該測試點所在的線路未連接其他測試點,該測試點的電性狀態為一開路狀態。如此,電路板上的空白區域以不導電的支撐線路填補,藉由檢測該開路狀態係可以確認支撐線路不會導電且不會影響迴路,係具有避免支撐線路造成短路的功效。 Among them, the line where one of the test points is located is not connected to other test points, and the electrical state of the test point is an open circuit state. In this way, the blank area on the circuit board is filled with non-conductive support lines. By detecting the open circuit state, it can be confirmed that the support lines are not conductive and will not affect the circuit. This has the effect of avoiding short circuits caused by the support lines.
其中,一個該測試點所在的線路未連接其他測試點,且該線路重疊於該安裝區的範圍內,該測試點的電性狀態為一安裝開路狀態。如此,檢測該安裝開路狀態可以確認電子元件的引腳不會接觸其他迴路,係具有確認元件正常運作的功效。 Among them, if the line where one of the test points is located is not connected to other test points, and the line overlaps within the range of the installation area, the electrical state of the test point is an installation open circuit state. In this way, detecting the open circuit status of the installation can confirm that the pins of the electronic components do not contact other circuits, which has the effect of confirming the normal operation of the components.
其中,該編輯模組依據該數個測試點的電性狀態判定結果修改該線路圖,將各種電性狀態之測試點所在的線路轉換為不同顏色、粗細或虛線的框線。如此,透過修改後的線路圖係可以快速辨識個線路的功能及分布情形,係具有節省人工判讀時間及提升檢測效率的功效。 Among them, the editing module modifies the circuit diagram based on the electrical status determination results of the several test points, and converts the lines where the test points of various electrical statuses are located into frame lines of different colors, thicknesses, or dotted lines. In this way, the function and distribution of each line can be quickly identified through the modified line diagram, which has the effect of saving manual interpretation time and improving detection efficiency.
A1:影像模組 A1:Image module
A2:編輯模組 A2: Edit module
G:線路圖 G:Road map
E:電性設定表 E: Electrical setting table
C:線路 C: Line
F:安裝區 F:Installation area
T:測試點 T: test point
M:測試編碼 M: Test encoding
S1:短路狀態 S1: short circuit status
S2:安裝短路狀態 S2: Installation short circuit status
O1:開路狀態 O1: open circuit status
O2:安裝開路狀態 O2: Installation open circuit status
〔第1圖〕本創作一較佳實施例的系統方塊圖。 [Figure 1] System block diagram of a preferred embodiment of this invention.
〔第2圖〕本創作一較佳實施例未編輯的待測電路板佈線圖案。 [Figure 2] The unedited wiring pattern of the circuit board to be tested according to a preferred embodiment of this invention.
〔第3圖〕本創作一較佳實施例擷取待測電路板之線路圖影像的情形圖。 [Figure 3] A diagram of a preferred embodiment of this invention capturing a circuit diagram image of a circuit board under test.
〔第4圖〕本創作一較佳實施例選取測試點及標記測試編碼的情形圖。 [Figure 4] A diagram showing the selection of test points and marking of test codes in a preferred embodiment of this invention.
〔第5圖〕本創作一較佳實施例判定測試點之電性狀態的情形圖。 [Figure 5] A diagram showing the situation of determining the electrical status of a test point according to a preferred embodiment of this invention.
為讓本創作之上述及其他目的、特徵及優點能更明顯易懂,下文特舉本創作之較佳實施例,並配合所附圖式作詳細說明;此外,在不同圖式中標示相同符號者視為相同,會省略其說明。 In order to make the above and other purposes, features and advantages of the present invention more obvious and easy to understand, the following is a preferred embodiment of the present invention and a detailed description with accompanying drawings; in addition, the same symbols are marked in different drawings. are considered to be the same and their description will be omitted.
請參照第1圖所示,其係本創作電路板電性測試編輯系統的較佳實施例,係包含一影像模組A1及一編輯模組A2,該編輯模組A2耦合連接該影像模組A1,由該影像模組A1讀取電路板之一線路圖G,並由該編輯模組A2處理該線路圖G並輸出一電性設定表E。 Please refer to Figure 1, which is a preferred embodiment of the circuit board electrical test editing system of the present invention. It includes an image module A1 and an editing module A2. The editing module A2 is coupled to the image module. A1, the imaging module A1 reads a circuit diagram G of the circuit board, and the editing module A2 processes the circuit diagram G and outputs an electrical setting table E.
請參照第1及2圖所示,該影像模組A1係可以包含一攝影鏡頭,用於對一電路板半成品之線路圖層或對曝光顯影產生電路板線路之一底片,直接擷取影像以得到該線路圖G,該線路圖G係由數條線路C排列分布而成,且該數條線路C圍繞一安裝區F,該安裝區F係預留安裝電子元件的區域,其中數條該線路C延伸進入該安裝區F,該數條線路排列的方向可以依據電子元件安裝需求呈現橫向、直向或斜方向,本創作不以此為限。 Please refer to Figures 1 and 2. The imaging module A1 can include a photographic lens, which is used to directly capture the circuit layer of a circuit board semi-finished product or the film of the circuit board circuit produced by exposure and development to obtain The circuit diagram G is composed of several circuits C arranged and distributed, and the several circuits C surround an installation area F. The installation area F is an area reserved for installing electronic components, in which several circuits C C extends into the installation area F. The direction in which the lines are arranged can be horizontal, vertical or diagonal according to the installation requirements of electronic components. This invention is not limited to this.
請再參照第3~5圖所示,該編輯模組A2透過該影像模組A1取得該線路圖G後,係可以將該線路圖G上的圖案包括該數條線路C及該安裝區F轉換為框線形式,使該編輯模組A2能夠對轉換後的該線路圖G進行辨識、標記、分類等編輯處理,如第3圖所示,各該線路C及該安裝區F係分別形成封閉框線,且框線內部較佳是無填滿,其中數條該線路C係重疊於該安裝區F而進入該安裝區F的框線範圍內。 Please refer to Figures 3 to 5 again. After the editing module A2 obtains the circuit diagram G through the image module A1, the pattern on the circuit diagram G can include the several circuits C and the installation area F. Convert to frame line form, so that the editing module A2 can identify, mark, classify and other editing processes on the converted circuit diagram G. As shown in Figure 3, each circuit C and the installation area F are formed respectively. The frame line is closed, and the inside of the frame line is preferably not filled. Several of the lines C overlap the installation area F and enter the frame line range of the installation area F.
又,該編輯模組A2係能夠在多個框線構成的幾何圖案中,辨識出該數條線路C,如第4圖所示,在本實施例中,該編輯模組A2係可以由 該線路圖G的下排左側開始往右側進行圖案選取,再依序往上排右側至左側已挑選出所有的線路C及其測試點T,惟,本創作的選取方向及順序不以此為限。詳言之,各該線路C的端點分布於該線路圖G的相對兩側為該測試點T,各該線路C可以具有數個測試點T,該數個測試點T可以分布於該線路圖G的上、下兩側,也可以是左、右兩側,而位於同一該線路C上的數個測試點T可以分列該線路圖G的兩側,也可以位於同一側,本創作不以此為限。該編輯模組A2還可以依據選取順序,在該數個測試點T的位置分別標記數個測試編碼M,該數個測試編碼M可以是依照被選取順序所給予的由小至大數列,例如在本實施例中係1、2、3、…、18。 In addition, the editing module A2 can identify the several lines C in the geometric pattern composed of multiple frame lines, as shown in Figure 4. In this embodiment, the editing module A2 can be The pattern selection starts from the left side of the lower row of the circuit diagram G and goes to the right, and then from the right to the left of the upper row, all the lines C and their test points T have been selected. However, the selection direction and order of this creation are not based on this. limit. Specifically, the endpoints of each line C are distributed on opposite sides of the line diagram G as test points T. Each line C can have several test points T, and the several test points T can be distributed on the line. The upper and lower sides of the diagram G can also be the left and right sides, and several test points T located on the same line C can be arranged on both sides of the line diagram G, or they can be located on the same side. This creation Not limited to this. The editing module A2 can also mark several test codes M at the positions of the test points T according to the selection order. The test codes M can be a sequence from small to large given in the order of selection, for example In this embodiment, it is 1, 2, 3, ..., 18.
接下來,該編輯模組A2依據各該測試點T與其他測試點T、各該線路C、該安裝區F的對應關係,判斷及分類該數個測試點T的電性狀態,如第5圖所示,係可以包括一短路狀態S1、一安裝短路狀態S2、一開路狀態O1及一安裝開路狀態O2,其中,該短路狀態S1及該安裝短路狀態S2之測試點T係與至少一個其他測試點T位於同一個線路C上,該短路狀態S1之測試點T所在的線路C係用於在電路板迴路中導電;而該安裝短路狀態S2之測試點T所在的線路C係重疊於該安裝區F的框線範圍內,還可以用於電連接電子元件;該開路狀態O1及該安裝開路狀態O2之測試點T所在的線路C未連接其他測試點T,該開路狀態O1之測試點T所在的線路C用於支撐電路板佈線的空白區域,未電連接其他迴路;而該安裝開路狀態O2之測試點T所在的線路C係重疊於該安裝區F的框線範圍內,僅用於電連接電子元件。依據判斷及分類的結果,該編輯模組A2還可以將各種電性狀態之測試點T所在的線路C轉換為不同顏色、粗細或虛線的框線,係可以用於快速識別各該線路C的連接功能及電性測試應得的結果。 Next, the editing module A2 determines and classifies the electrical status of the test points T based on the corresponding relationship between each test point T and other test points T, each line C, and the installation area F, such as No. 5 As shown in the figure, the system may include a short circuit state S1, an installation short circuit state S2, an open circuit state O1 and an installation open circuit state O2, wherein the test point T of the short circuit state S1 and the installation short circuit state S2 is connected to at least one other The test point T is located on the same line C. The line C where the test point T of the short-circuit state S1 is located is used to conduct electricity in the circuit board circuit; and the line C where the test point T of the installation short-circuit state S2 is located overlaps with this Within the frame line of the installation area F, it can also be used to electrically connect electronic components; the line C where the test point T of the open circuit state O1 and the installation open circuit state O2 is located is not connected to other test points T, and the test point of the open circuit state O1 The line C where T is located is used to support the blank area of the circuit board wiring and is not electrically connected to other circuits; and the line C where the test point T of the installation open circuit state O2 is located overlaps within the frame line of the installation area F, and is only used For electrically connecting electronic components. Based on the results of judgment and classification, the editing module A2 can also convert the line C where the test point T of various electrical states is located into a frame line of different colors, thicknesses or dotted lines, which can be used to quickly identify the line C. The expected results of the connection function and electrical tests.
最後,該編輯模組A2係可以將各該測試點T依據其電性狀 態,以其測試編碼M的順序分類填入表格以產生該電性設定表E。如此,在一電路板進行測試前後,藉由檢視該電路板之該線路圖G並對照其電性設定表E,係可以快速辨別測試探針要接觸的該數個測試點T的位置,及判定各該測試點T的測試結果是否正常,係具有節省人工判斷及測試作業時間的作用。舉例而言,在電子元件安裝於該安裝區F之前,進行電路板測試,對於該短路狀態S1及該安裝短路狀態S2的各該測試點T所測量到的電阻值,能夠小於導通閾值則測試正常,而對於該開路狀態O1及該安裝開路狀態O2的各該測試點T所測量到的電阻值,能夠大於絕緣電阻則測試正常;又,將電子元件安裝於該安裝區F之後,在該安裝短路狀態S2及該安裝開路狀態O2的各該測試點T還能夠測試到該電子元件的電性,係可以對照該電子元件的功能特性判斷電路板的焊接是否有瑕疵或該電子元件的功能是否正常。 Finally, the editing module A2 can edit each test point T according to its electrical properties. state, and fill in the table according to the order of the test codes M to generate the electrical setting table E. In this way, before and after a circuit board is tested, by checking the circuit diagram G of the circuit board and comparing it with the electrical setting table E, the positions of the test points T to be contacted by the test probes can be quickly identified, and Determining whether the test results of each test point T are normal has the effect of saving manual judgment and test operation time. For example, before the electronic components are installed in the installation area F, a circuit board test is performed. For the short-circuit state S1 and the installation short-circuit state S2, the resistance value measured at each test point T is tested if it can be less than the conduction threshold. Normal, and for the resistance value measured at each test point T of the open circuit state O1 and the installation open circuit state O2, if it can be greater than the insulation resistance, the test is normal; also, after the electronic components are installed in the installation area F, in the Each test point T in the installation short-circuit state S2 and the installation open-circuit state O2 can also test the electrical properties of the electronic component. It can be compared with the functional characteristics of the electronic component to determine whether there are defects in the welding of the circuit board or the function of the electronic component. Is it normal?
請參照第4及5圖所示,其係本創作電路板電性測試編輯系統之編輯結果的較佳實施例,在本實施例中,係在該線路圖G的下排選取數個該線路C末端為數個該測試點T,並由左至右標記1~10的數個測試編碼M,接著在該線路圖G的上排選取數個該線路C末端為數個該測試點T,並由右至左標記11~18的數個測試編碼M;依據該數個測試點T的相對位置進行判斷,其中,該測試編碼M為1、2、18的三個測試點T位於同一個線路C上,因此該三個測試點T為該短路狀態S1,同理,該測試編碼M為3、11、12、17的測試點T亦為該短路狀態S1;又,該測試編碼M為5、7、9、10、14、15的六個測試點T除了短路還連接至該安裝區F,因此該六個測試點T為該安裝短路狀態S2;該測試編碼M為4、6、16的三個測試點T分別位於不同的線路C上,因此該三個測試點T為該開路狀態O1;又,該測試編碼M為8、13的二個測試點T除了短路還連接至該安裝區F,因此該二個測試點T為該安裝開路狀態O2。請參照第1表所示,其係本實施例的上述分類結果 輸出為表格而產生的該電性設定表E。 Please refer to Figures 4 and 5, which are a preferred embodiment of the editing results of the circuit board electrical test editing system. In this embodiment, several circuits are selected in the lower row of the circuit diagram G. The end of C is a number of test points T, and several test codes M from 1 to 10 are marked from left to right. Then select a few of the line C in the upper row of the line diagram G. The end of C is a number of test points T, and marked by Several test codes M marked from 11 to 18 from right to left; judgment is made based on the relative positions of the several test points T. Among them, the three test points T with the test codes M 1, 2, and 18 are located on the same line C. above, so the three test points T are in the short-circuit state S1. Similarly, the test points T with the test codes M of 3, 11, 12, and 17 are also in the short-circuit state S1; and the test codes M are 5, 12, and 17. The six test points T of 7, 9, 10, 14, and 15 are not only short-circuited but also connected to the installation area F. Therefore, the six test points T are in the installation short-circuit state S2; the test codes M are 4, 6, and 16. The three test points T are located on different lines C, so the three test points T are in the open circuit state O1; in addition, the two test points T with the test codes M 8 and 13 are connected to the installation area in addition to short circuit F, so the two test points T are in the open circuit state O2 of the installation. Please refer to Table 1, which is the above classification result of this embodiment. The electrical setting table E generated as a table is output.
綜上所述,本創作的電路板電性測試編輯系統,藉由產生待測試電路板之線路圖及電性設定表,係可以判定電路板上的測試點位置及電性狀態,如此,在電路板測試過程中,參照該線路圖及該電性設定表係能夠快速辨別測試探針要接觸的測試點的位置,及判定測試結果是否正常,係具有節省測試作業人力及縮短測試製程時間的功效。 To sum up, the circuit board electrical test editing system of this invention can determine the test point position and electrical status of the circuit board by generating the circuit diagram and electrical setting table of the circuit board to be tested. In this way, During the circuit board testing process, referring to the circuit diagram and the electrical setting table can quickly identify the position of the test point that the test probe is to contact, and determine whether the test result is normal. This can save testing work manpower and shorten the testing process time. effect.
雖然本創作已利用上述較佳實施例揭示,然其並非用以限定本創作,任何熟習此技藝者在不脫離本創作之精神和範圍之內,相對上述實施例進行各種更動與修改仍屬本創作所保護之技術範疇,因此本創作之保護範圍當包含後附之申請專利範圍所記載的文義及均等範圍內之所有變更。 Although the present invention has been disclosed using the above-mentioned preferred embodiments, it is not intended to limit the invention. Any person skilled in the art can make various changes and modifications relative to the above-described embodiments without departing from the spirit and scope of the invention. The technical scope protected by the creation, therefore, the protection scope of the creation shall include all changes within the literal and equivalent scope recorded in the appended patent application scope.
A1:影像模組 A1:Image module
A2:編輯模組 A2: Edit module
G:線路圖 G:Road map
F:電性設定表 F: Electrical setting table
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