TWM618645U - Post-processing apparatus for a semi-finished test paper - Google Patents

Post-processing apparatus for a semi-finished test paper Download PDF

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Publication number
TWM618645U
TWM618645U TW110207459U TW110207459U TWM618645U TW M618645 U TWM618645 U TW M618645U TW 110207459 U TW110207459 U TW 110207459U TW 110207459 U TW110207459 U TW 110207459U TW M618645 U TWM618645 U TW M618645U
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Taiwan
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test paper
test
paper sheets
post
transfer
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TW110207459U
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Chinese (zh)
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蔡東陽
李文捷
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富揚晶機股份有限公司
李文捷
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Priority to TW110207459U priority Critical patent/TWM618645U/en
Publication of TWM618645U publication Critical patent/TWM618645U/en

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Abstract

A post-processing apparatus for a semi-finished test paper includes a cooling device, a test paper cutting device and a test paper transportation device. The cooling device is configured to provide a low temperature environment for decreasing viscoelasticity of an adhesive component of the semi-finished test paper. The test paper cutting device is configured to cut the semi-finished test paper into a plurality of test paper pieces in the low temperature environment provided by the cooling device. The test paper transportation device is configured to transport the plurality of test paper pieces. The test paper transportation device includes a first carrying assembly and a second carrying assembly. The first carrying assembly and the second carrying assembly are respectively configured to transport one and the other one of two adjacent test paper pieces of the plurality of test paper pieces at different times.

Description

用於試紙半成品之後處理設備Equipment for the post-processing of test paper semi-finished products

本創作係關於一種自動化設備，尤指一種用於一試紙半成品之後處理設備。This creation is about a kind of automation equipment, especially a kind of equipment used for the post-processing of a test paper semi-finished product.

試紙片大多是由一大張的試紙半成品切割而得，然由於試紙半成品包含有設置於親水膜與基板之間的黏著劑，而黏著劑具有黏彈性，因此於切割後切割刀具或裁切模具上往往會有黏著劑殘留，而殘留在切割刀具或裁切模具上的黏著劑不但會使切割刀具或裁切模具不再鋒利，也會使試紙片容易附著於切割刀具或裁切模具，進而造成切割刀具或裁切模具卡死而無法裁切，此外，殘留在刀具上的黏著劑也不易清理。再者，切割後得到的試紙片會送去檢測，經檢測判定為不合格之試紙片則會在裝罐前被剔除，若切割刀具或裁切模具上的黏著劑又轉移至試紙片而使試紙片彼此互相沾黏，則會影響不合格之試紙片之剔除，而目前也尚未發展出快速且有效的方式來剔除不合格之試紙片，因此如何解決上述問題便成為業界的焦點。Most of the test strips are cut from a large sheet of semi-finished test paper. However, because the semi-finished test paper contains an adhesive disposed between the hydrophilic film and the substrate, and the adhesive has viscoelasticity, the cutting tool or cutting die is cut after cutting. There will always be adhesive residue on the cutting tool or cutting mold, and the adhesive remaining on the cutting tool or cutting mold will not only make the cutting tool or cutting mold no longer sharp, but also make the test paper easily adhere to the cutting tool or cutting mold, and then The cutting tool or the cutting die is stuck and cannot be cut. In addition, the adhesive remaining on the tool is not easy to clean. Furthermore, the test strips obtained after cutting will be sent to the test strips, and the test strips determined to be unqualified by the test will be rejected before filling. If the adhesive on the cutting tool or cutting mold is transferred to the test strips again, If the test strips stick to each other, it will affect the rejection of the unqualified test strips. At present, a fast and effective method has not been developed to reject the unqualified test strips. Therefore, how to solve the above problems has become the focus of the industry.

本創作之目的在於提供一種用於一試紙半成品之後處理設備，以解決上述問題。The purpose of this creation is to provide a post-processing equipment for a semi-finished test paper to solve the above-mentioned problems.

為達成上述目的，本創作揭露一種用於一試紙半成品之後處理設備，其包含有一致冷裝置、一試紙切割裝置以及一試紙移載裝置，該致冷裝置係用以提供一低溫環境，以降低該試紙半成品之一黏著劑之一黏彈性（viscoelasticity），該試紙切割裝置係用以於該低溫環境將該試紙半成品切割成複數個試紙片，該試紙移載裝置係用以運送複數個試紙片，該試紙移載裝置包含有一第一移載組件以及一第二移載組件，該第一移載組件與該第二移載組件係分別用以於不同時間點運送該複數個試紙片之相鄰兩試紙片的其中一者與另一者。In order to achieve the above objective, the present invention discloses a post-processing equipment for a test paper semi-finished product, which includes a uniform cooling device, a test paper cutting device and a test paper transfer device. The cooling device is used to provide a low temperature environment to reduce One of the adhesives of the test paper semi-finished product is viscoelasticity, the test paper cutting device is used to cut the test paper semi-finished product into a plurality of test paper pieces in the low temperature environment, and the test paper transfer device is used to transport the plurality of test paper pieces The test paper transfer device includes a first transfer component and a second transfer component, the first transfer component and the second transfer component are respectively used to transport the phases of the plurality of test paper sheets at different time points Adjacent to one of the two test strips and the other.

根據本創作其中一實施例，該第一移載組件包含有複數個第一上夾持件以及複數個第一下夾持件，該第二移載組件包含有複數個第二上夾持件以及複數個第二下夾持件，該複數個第一上夾持件係間隔設置，各第二上夾持件係位於相對應的該兩第一上夾持件之間，該複數個第一下夾持件係間隔設置，各第二下夾持件係位於相對應的該兩第一下夾持件之間。According to one of the embodiments of the present invention, the first transfer assembly includes a plurality of first upper clamps and a plurality of first lower clamps, and the second transfer assembly includes a plurality of second upper clamps And a plurality of second lower clamping members, the plurality of first upper clamping members are arranged at intervals, each second upper clamping member is located between the two corresponding first upper clamping members, the plurality of first upper clamping members The lower clamping pieces are arranged at intervals, and each second lower clamping piece is located between the two corresponding first lower clamping pieces.

根據本創作其中一實施例，該複數個第一上夾持件的其中一者與相對應的該第一下夾持件可相對於彼此沿一垂直方向移動以夾持或釋放該複數個試紙片之相鄰該兩試紙片的其中該一者，該複數個第二上夾持件的其中一者與相對應的該第二下夾持件可相對於彼此沿該垂直方向移動以夾持或釋放該複數個試紙片之相鄰該兩試紙片的其中該另一者。According to one of the embodiments of the present invention, one of the plurality of first upper clamping members and the corresponding first lower clamping member can move relative to each other in a vertical direction to clamp or release the plurality of test papers The adjacent one of the two test paper sheets, one of the plurality of second upper clamping members and the corresponding second lower clamping member can move relative to each other in the vertical direction to clamp Or release the other one of the two adjacent test paper sheets of the plurality of test paper sheets.

根據本創作其中一實施例，當該複數個第一上夾持件的其中該一者與相對應的該第一下夾持件夾持該複數個試紙片之相鄰該兩試紙片的其中該一者之後，該複數個第一上夾持件的其中該一者與相對應的該第一下夾持件同步地沿該垂直方向移動以沿該垂直方向運送該複數個試紙片之相鄰該兩試紙片的其中該一者，當該複數個第二上夾持件的其中該一者與相對應的該第二下夾持件夾持該複數個試紙片之相鄰該兩試紙片的其中該另一者之後，該複數個第二上夾持件的其中該一者與相對應的該第二下夾持件同步地沿該垂直方向移動以沿該垂直方向運送該複數個試紙片之相鄰該兩試紙片的其中該一者。According to one embodiment of the present invention, when one of the plurality of first upper clamping members and the corresponding first lower clamping member clamps one of the adjacent two test paper sheets of the plurality of test paper sheets After the one, the one of the plurality of first upper clamping members moves in the vertical direction synchronously with the corresponding first lower clamping member to transport the phases of the plurality of test paper sheets in the vertical direction Adjacent to the one of the two test paper sheets, when the one of the plurality of second upper clamps and the corresponding second lower clamp clamp the adjacent two test papers of the plurality of test paper sheets After the other one of the sheets, the one of the plurality of second upper clamping members moves in the vertical direction synchronously with the corresponding second lower clamping member to transport the plurality of second upper clamping members in the vertical direction The test paper sheet is adjacent to the one of the two test paper sheets.

根據本創作其中一實施例，該試紙移載裝置另包含有一運送裝置，其係用以運送來自該第一移載組件與該第二移載組件之該複數個試紙片之相鄰該兩試紙片的其中該一者與該另一者。According to one of the embodiments of the present invention, the test strip transfer device further includes a transport device for transporting the two adjacent test strips of the plurality of test strips from the first transfer assembly and the second transfer assembly One of the pieces and the other.

根據本創作其中一實施例，該第一移載組件之一運送方向相同於該第二移載組件之一運送方向且垂直於該運送裝置之一運送方向。According to one of the embodiments of the present invention, a conveying direction of the first transfer component is the same as a conveying direction of the second transfer component and perpendicular to a conveying direction of the conveying device.

根據本創作其中一實施例，該後處理設備另包含有一檢測裝置以及一移除裝置，該檢測裝置係用以檢測位於該運送裝置上之該複數個試紙片，該移除裝置係用以依據該檢測裝置之一檢測結果移除該複數個試紙片之至少一不合格者。According to one of the embodiments of the present invention, the post-processing equipment further includes a detection device and a removal device. The detection device is used to detect the plurality of test strips on the conveying device, and the removal device is used according to The detection result of one of the detection devices removes at least one unqualified one of the plurality of test strips.

根據本創作其中一實施例，該檢測裝置為一影像擷取裝置，且該移除裝置為一風機。According to one of the embodiments of the present invention, the detecting device is an image capturing device, and the removing device is a fan.

根據本創作其中一實施例，該後處理設備另包含有一振動裝置，其係用以將該複數個試紙片之至少一合格者以振動的方式裝入至少一分裝罐。According to one of the embodiments of the present invention, the post-processing equipment further includes a vibrating device, which is used to vibrate at least one of the plurality of test strips into at least one sub-packing tank.

根據本創作其中一實施例，該致冷裝置為一冷凍空調裝置。According to one of the embodiments of the present invention, the refrigerating device is a refrigerating and air-conditioning device.

綜上所述，於本創作中，由於致冷裝置可提供低溫環境，以降低試紙半成品之黏著劑之黏彈性，且試紙切割裝置可低溫環境將試紙半成品切割成複數個試紙片，因此本創作可有效地避免黏著劑殘留於試紙切割裝置。此外，由於第一移載組件與第二移載組件可於不同時間點將相鄰兩試紙片的其中一者與另一者運送至運送裝置，因此位於運送裝置的每一試紙片不與另一試紙片相鄰，且位於運送裝置的連續兩試紙片彼此分隔，故檢測裝置可準確地對每一試紙片進行檢測，且移除裝置可準確地移除複數個試紙片之至少一不合格者（如果有的話）。To sum up, in this creation, because the refrigeration device can provide a low temperature environment to reduce the viscoelasticity of the adhesive of the test paper semi-finished product, and the test paper cutting device can cut the test paper semi-finished product into a plurality of test strips in a low temperature environment, so this creation Can effectively avoid the adhesive residue in the test paper cutting device. In addition, since the first transfer assembly and the second transfer assembly can transport one and the other of the two adjacent test strips to the transport device at different points in time, each test strip located in the transport device is not connected to the other one. The test strips are adjacent, and the two consecutive test strips located in the conveying device are separated from each other, so the detection device can accurately detect each test strip, and the removal device can accurately remove at least one unqualified of the plurality of test strips (if so).

以下實施例中所提到的方向用語，例如：上、下、左、右、前或後等，僅是參考附加圖式的方向。因此，使用的方向用語是用來說明並非用來限制本創作。此外，「耦接」或「連接」一詞在此係包含任何直接及間接的電氣或結構連接手段。因此，若文中描述一第一裝置耦接/連接於一第二裝置，則代表該第一裝置可直接電氣/結構連接於該第二裝置，或透過其他裝置或連接手段間接地電氣/結構連接至該第二裝置。The directional terms mentioned in the following embodiments, for example: up, down, left, right, front or back, etc., are only directions for referring to the attached drawings. Therefore, the directional terms used are used to illustrate and not to limit this creation. In addition, the term "coupled" or "connected" herein includes any direct and indirect electrical or structural connection means. Therefore, if the text describes that a first device is coupled/connected to a second device, it means that the first device can be directly electrically/structurally connected to the second device, or indirectly electrically/structurally connected through other devices or connection means To the second device.

請參閱第1圖至第10圖，第1圖為本創作實施例一後處理設備1之外觀示意圖，第2圖至第4圖為本創作實施例後處理設備1之部分內部結構於不同視角之示意圖，第5圖至第6圖為本創作實施例後處理設備1之部分結構於不同視角之示意圖，第7圖至第8圖為本創作實施例一試紙移載裝置13之部分結構之放大圖，第8圖至第10圖為本創作實施例後處理設備1之另一部分於不同視角之示意圖。如第1圖至第10圖所示，後處理設備1係用於試紙半成品且包含有一致冷裝置11、一試紙切割裝置12以及試紙移載裝置13，致冷裝置11係用以提供低溫環境，以降低試紙半成品之黏著劑之黏彈性（viscoelasticity），其中黏著劑可為壓敏膠，然本創作並不侷限於此，舉例來說，黏著劑也可為丙烯酸膠、聚酯膠或聚乙烯膠等。試紙切割裝置12係用以於低溫環境將試紙半成品切割成複數個試紙片2（例如將一大張血糖試紙半成品切割成複數個血糖試紙片），試紙移載裝置13係用以運送複數個試紙片2，於此實施例中，由於試紙切割裝置12係於低溫環境將試紙半成品切割成複數個試紙片2，且試紙半成品之黏著劑在低溫環境下具有較低之黏彈性，故黏著劑較不容易殘留於試紙切割裝置12。較佳地，於此實施例中，致冷裝置11可為冷凍空調裝置，試紙切割裝置12可包含有滾刀裁切機，然本創作並不侷限於此，舉例來說，在另一實施例中，致冷裝置可為致冷晶片，試紙切割裝置可包含有滑刀裁切機或具有裁切作用之任一裝置。Please refer to Figures 1 to 10. Figure 1 is a schematic diagram of the appearance of the post-processing device 1 of the creative embodiment 1, and Figures 2 to 4 are part of the internal structure of the post-processing device 1 of the creative embodiment in different viewing angles. Figures 5 to 6 are schematic diagrams of part of the structure of the post-processing device 1 of the creative embodiment from different perspectives, and Figures 7 to 8 are part of the structure of the test paper transfer device 13 of the creative embodiment 1 Enlarged view, FIG. 8 to FIG. 10 are schematic diagrams of another part of the post-processing device 1 of the creative embodiment in different viewing angles. As shown in Figures 1 to 10, the post-processing equipment 1 is used for test paper semi-finished products and includes a uniform cooling device 11, a test paper cutting device 12, and a test paper transfer device 13. The cooling device 11 is used to provide a low-temperature environment In order to reduce the viscoelasticity of the adhesive of the test paper semi-finished product, the adhesive can be a pressure-sensitive adhesive, but this creation is not limited to this. For example, the adhesive can also be acrylic glue, polyester glue or poly Vinyl rubber, etc. The test strip cutting device 12 is used to cut the test strip semi-finished product into a plurality of test strips 2 (for example, a large blood sugar test strip semi-finished product is cut into a plurality of blood sugar test strips) in a low temperature environment, and the test strip transfer device 13 is used to transport the plurality of test strips Sheet 2. In this embodiment, because the test paper cutting device 12 cuts the test paper semi-finished product into a plurality of test paper sheets 2 in a low temperature environment, and the adhesive of the test paper semi-finished product has lower viscoelasticity in the low temperature environment, the adhesive is more It is not easy to remain in the test paper cutting device 12. Preferably, in this embodiment, the refrigerating device 11 may be a refrigerating and air-conditioning device, and the test paper cutting device 12 may include a hob cutter, but the invention is not limited to this, for example, in another implementation In an example, the cooling device may be a cooling chip, and the test paper cutting device may include a sliding knife cutter or any device with a cutting function.

如第2圖至第8圖所示，試紙移載裝置13包含有分別用以於不同時間點運送經試紙切割裝置12切割而得之複數個試紙片2之相鄰兩試紙片2的其中一者與另一者之一第一移載組件131以及一第二移載組件132。As shown in Figures 2 to 8, the test paper transfer device 13 includes one of two adjacent test paper sheets 2 used to transport a plurality of test paper sheets 2 cut by the test paper cutting device 12 at different time points. One and the other are a first transfer component 131 and a second transfer component 132.

較佳地，第一移載組件131可於第一時間點運送複數個試紙片2之奇數者，第二移載組件132可於晚於第一時間點之第二時間點運送複數個試紙片2之偶數者。然本創作並不侷限於此，舉例來說，在另一實施例中，第一移載組件可於第一時間點運送複數個試紙片之偶數者，第二移載組件可於晚於第一時間點之第二時間點運送複數個試紙片之奇數者，以實現第一移載組件與第二移載組件於不同時間點分別運送相互間隔之複數個試紙片。Preferably, the first transfer unit 131 can transport an odd number of test strips 2 at a first time point, and the second transfer unit 132 can transport a plurality of test strips at a second time point later than the first time point The even number of 2. However, the present creation is not limited to this. For example, in another embodiment, the first transfer assembly may transport an even number of the plurality of test strips at the first time point, and the second transfer assembly may be later than the first transfer assembly. An odd number of test strips are transported at a second time point at one time point, so that the first transfer component and the second transfer component transport the plurality of test strips spaced apart at different time points.

具體地，如第7圖與第8圖所示，第一移載組件131包含有複數個第一上夾持件1311以及複數個第一下夾持件1312，第二移載組件132包含有複數個第二上夾持件1321以及複數個第二下夾持件1322，複數個第一上夾持件1311係間隔設置，各第二上夾持件1321係位於相對應的兩第一上夾持件1311之間，複數個第一下夾持件1312係間隔設置，各第二下夾持件1322係位於相對應的兩第一下夾持件1312之間。Specifically, as shown in FIGS. 7 and 8, the first transfer assembly 131 includes a plurality of first upper clamping members 1311 and a plurality of first lower clamping members 1312, and the second transfer assembly 132 includes A plurality of second upper clamping members 1321 and a plurality of second lower clamping members 1322, a plurality of first upper clamping members 1311 are arranged at intervals, and each second upper clamping member 1321 is located on the corresponding two first upper Between the clamping members 1311, a plurality of first lower clamping members 1312 are arranged at intervals, and each second lower clamping member 1322 is located between two corresponding first lower clamping members 1312.

更具體地，如第3圖、第7圖至第8圖所示，各第一上夾持件1311與相對應的第一下夾持件1312可相對於彼此沿一垂直方向V移動以夾持或釋放複數個試紙片2之相對應的奇數者，且各第二上夾持件1321與相對應的第二下夾持件1322可相對於彼此沿垂直方向V移動以夾持或釋放複數個試紙片2之相對應的偶數者。也就是說，複數個第一上夾持件1311的其中一者與相對應的第一下夾持件1312可相對於彼此沿垂直方向V移動以夾持或釋放複數個試紙片2之相鄰兩試紙片2的其中一者；複數個第二上夾持件1321之相鄰於前述第一上夾持件1311的其中一者與相對應的第二下夾持件1322可相對於彼此沿垂直方向V移動以夾持或釋放複數個試紙片2之相鄰兩試紙片2的其中另一者。More specifically, as shown in FIGS. 3 and 7 to 8, each of the first upper clamping members 1311 and the corresponding first lower clamping member 1312 can move relative to each other in a vertical direction V to clamp Hold or release the corresponding odd number of the plurality of test strips 2, and each second upper clamping member 1321 and the corresponding second lower clamping member 1322 can move relative to each other in the vertical direction V to clamp or release the plurality The even number corresponding to two test strips. That is, one of the plurality of first upper clamping members 1311 and the corresponding first lower clamping member 1312 can move relative to each other in the vertical direction V to clamp or release the neighboring of the plurality of test strips 2 One of the two test strips 2; one of the plurality of second upper clamping members 1321 adjacent to the aforementioned first upper clamping member 1311 and the corresponding second lower clamping member 1322 may be relative to each other Move in the vertical direction V to clamp or release the other of the two adjacent test paper sheets 2 of the plurality of test paper sheets 2.

此外，如第2圖至第10圖所示，試紙移載裝置13另包含有一運送裝置133，其係用以運送來自第一移載組件131之複數個試紙片2之奇數者與來自第二移載組件132之複數個試紙片2之偶數者。In addition, as shown in FIGS. 2 to 10, the test strip transfer device 13 further includes a transport device 133, which is used to transport the odd number of the plurality of test strips 2 from the first transfer assembly 131 and the second The even number of the plurality of test strips 2 of the transfer assembly 132.

較佳地，第一移載組件131之運送方向可相同於第二移載組件132之運送方向且垂直於運送裝置133之運送方向。Preferably, the conveying direction of the first transfer unit 131 can be the same as the conveying direction of the second transfer unit 132 and perpendicular to the conveying direction of the conveying device 133.

具體地，如第3圖與第7圖至第10圖所示，第一移載組件131之運送方向與第二移載組件132之運送方向可為垂直方向V，運送裝置133之運送方向可為垂直於垂直方向V之一第一水平方向H1， 當複數個第一上夾持件1311與相對應的第一下夾持件1312夾持複數個試紙片2之奇數者，且複數個第二上夾持件1321與相對應的第二下夾持件1322夾持複數個試紙片2之偶數者之後，複數個第一上夾持件1311與相對應的第一下夾持件1312可於第一時間點同步地沿垂直方向V移動以沿垂直方向V運送複數個試紙片2之奇數者，從而將複數個試紙片2之奇數者放置於運送裝置133，且複數個第二上夾持件1321與相對應的第二下夾持件1322可於第二時間點同步地沿垂直方向V移動以沿垂直方向V運送複數個試紙片2之偶數者，從而將複數個試紙片2之偶數者放置於運送裝置133，以使運送裝置133可沿第一水平方向H1於不同時間點分別運送複數個試紙片2之奇數者與偶數者。於此實施例中，由於第一移載組件131與第二移載組件132係分別於不同時間點將複數個試紙片2之奇數者與偶數者放置於運送裝置133，因此位於運送裝置133的每一試紙片2不與另一試紙片2相鄰，且位於運送裝置133的連續兩試紙片彼此分隔。Specifically, as shown in Figs. 3 and 7 to 10, the conveying direction of the first transfer unit 131 and the conveying direction of the second transfer unit 132 can be the vertical direction V, and the conveying direction of the conveying device 133 can be Is a first horizontal direction H1 that is perpendicular to the vertical direction V, when the plurality of first upper clamping members 1311 and the corresponding first lower clamping member 1312 clamp an odd number of the plurality of test paper sheets 2, and the plurality of first After the two upper clamping members 1321 and the corresponding second lower clamping members 1322 clamp the even number of the plurality of test strips 2, the plurality of first upper clamping members 1311 and the corresponding first lower clamping members 1312 can be Synchronously move along the vertical direction V at the first time point to transport the odd number of the plurality of test strips 2 along the vertical direction V, so that the odd number of the plurality of test strips 2 is placed on the conveying device 133, and a plurality of second upper clamps The holding member 1321 and the corresponding second lower holding member 1322 can move synchronously in the vertical direction V at the second time point to transport the even number of the plurality of test paper sheets 2 in the vertical direction V, thereby separating the plurality of test paper sheets 2 The even-numbered ones are placed on the conveying device 133 so that the conveying device 133 can respectively convey the odd-numbered and even-numbered test strips 2 along the first horizontal direction H1 at different time points. In this embodiment, since the first transfer unit 131 and the second transfer unit 132 respectively place the odd and even numbers of the plurality of test strips 2 on the conveying device 133 at different time points, they are located at each of the conveying devices 133. One test paper sheet 2 is not adjacent to another test paper sheet 2, and two consecutive test paper sheets located in the conveying device 133 are separated from each other.

可理解地，如第2圖至第4圖、第7圖與第8圖所示，當第一移載組件131或第二移載組件132沿垂直方向V運送試紙片2之前、之後或之同時，第一移載組件131或第二移載組件132可沿一第二水平方向H2平移，以避免第一移載組件131或第二移載組件132於沿垂直方向V運送試紙片2時與其他結構產生干涉。Understandably, as shown in FIGS. 2 to 4, 7 and 8, when the first transfer assembly 131 or the second transfer assembly 132 transports the test paper sheet 2 in the vertical direction V, before, after, or after At the same time, the first transfer unit 131 or the second transfer unit 132 can be translated along a second horizontal direction H2 to prevent the first transfer unit 131 or the second transfer unit 132 from transporting the test strip 2 in the vertical direction V. Interference with other structures.

另外，如第2圖與第3圖所示，後處理設備1另包含有一檢測裝置14以及一移除裝置15，檢測裝置14係用以檢測位於運送裝置133上之複數個試紙片2，移除裝置15係用以依據檢測裝置14之檢測結果移除複數個試紙片2之至少一不合格者（如果有的話）。由於第一移載組件131與第二移載組件132係分別於不同時間點將複數個試紙片2之奇數者與偶數者放置於運送裝置133，因此檢測裝置14係於不同時間點分別對複數個試紙片2之奇數者與偶數者進行檢測，移除裝置15係於不同時間點分別移除複數個試紙片2之奇數者之至少一不合格者（如果有的話）與複數個試紙片2之偶數者之至少一不合格者（如果有的話）。於此實施例中，由於位於運送裝置133的每一試紙片2不與另一試紙片2相鄰，且位於運送裝置133的連續兩試紙片彼此分隔，因此檢測裝置14可準確地對每一試紙片進行檢測，而不會因為連續兩試紙片距離過近或相連而容易造成檢測誤判；且移除裝置15可準確地移除複數個試紙片2之至少一不合格者（如果有的話），而不會因為連續兩試紙片距離過近或相連而容易發生移除不合格試紙片時連帶地移除其相鄰之合格試紙片。較佳地，檢測裝置14可為影像擷取裝置（例如攝影機），而以光學檢測之方式檢測試紙片；且移除裝置15可為風機（例如正壓風扇），而以吹風方式移除不合格試紙片，然本創作並不侷限於此。In addition, as shown in Figures 2 and 3, the post-processing equipment 1 further includes a detection device 14 and a removal device 15. The detection device 14 is used to detect a plurality of test strips 2 located on the conveying device 133 and move The removing device 15 is used to remove at least one unqualified (if any) of the plurality of test strips 2 according to the detection result of the detection device 14. Since the first transfer assembly 131 and the second transfer assembly 132 place the odd and even numbers of the test strips 2 on the transport device 133 at different time points, respectively, the detection device 14 performs the inspection on the plurality of test strips 2 at different time points. The odd number and the even number of the test strips 2 are tested, and the removing device 15 removes at least one of the odd number of the plurality of test strips 2 (if any) and the plurality of test strips 2 at different time points. At least one unqualified of the even number (if any). In this embodiment, since each test strip 2 located in the conveying device 133 is not adjacent to another test strip 2, and two consecutive test strips located in the conveying device 133 are separated from each other, the detection device 14 can accurately measure each test strip 2 The test strips are tested without causing misjudgment because two consecutive test strips are too close or connected; and the removal device 15 can accurately remove at least one unqualified (if any) of the plurality of test strips 2 ), it will not be prone to remove the unqualified test strips because the distance between two consecutive test strips is too close or connected. Preferably, the detection device 14 may be an image capturing device (such as a camera), and the test paper sheet is detected by optical detection; and the removal device 15 may be a fan (such as a positive pressure fan), and the removal device may be removed by blowing. Qualified test strips, but this creation is not limited to this.

再者，如第2圖、第3圖與第10圖所示，後處理設備1另包含有一振動裝置16，其係用以將由運送裝置133運送來之複數個試紙片2之至少一合格者以振動的方式裝入至少一分裝罐，從而避免複數個試紙片2之至少一合格者因摩擦力過大而無法順利裝罐。Furthermore, as shown in Figures 2, 3, and 10, the post-processing equipment 1 further includes a vibrating device 16 for transferring at least one of the plurality of test strips 2 carried by the transporting device 133. At least one sub-packing can is packed in a vibrating manner, so as to avoid that at least one qualified person of the plurality of test strips 2 cannot be packed smoothly due to excessive friction.

然本創作並不侷限於上述實施例，舉例來說，在另一實施例中，第二時間點可早於第一時間點。又或者，在另一實施例中，試紙移載裝置可包含有第一移載組件、第二移載組件以及第三移載組件，其中第一移載組件、第二移載組件以及第三移載組件可分別於第一時間點、第二時間點以及第三時間點運送複數個試紙片之相鄰三試紙片，例如第一移載組件可於第一時間點運送複數個試紙片之第一、四、七個試紙片，第二移載組件可於晚於第一時間點之第二時間點運送複數個試紙片之第二、五、八個試紙片，第三移載組件可於晚於第二時間點之第三時間點運送複數個試紙片之第三、六、九個試紙片，只要是能於不同時間點移載相互間隔之試紙片之移載機制皆屬於本創作所保護之範疇；且第一移載組件、第二移載組件和/或第三移載組件可利用負壓來吸附相對應的試紙片等。However, the present creation is not limited to the above-mentioned embodiment. For example, in another embodiment, the second time point may be earlier than the first time point. Or, in another embodiment, the test paper transfer device may include a first transfer assembly, a second transfer assembly, and a third transfer assembly, wherein the first transfer assembly, the second transfer assembly, and the third transfer assembly The transfer component can transport three adjacent test strips of the plurality of test strips at the first time point, the second time point, and the third time point, respectively. For example, the first transfer component can transport one of the plurality of test strips at the first time point. The first, four, and seven test strips, the second transfer assembly can transport the second, fifth, and eight test strips of the plurality of test strips at a second time point later than the first time point, and the third transfer assembly can The third, sixth, and ninth test strips of the plurality of test strips are transported at the third time point later than the second time point. The transfer mechanism of the test strips that can be moved at different time points belongs to this creation. The scope of protection; and the first transfer component, the second transfer component, and/or the third transfer component can use negative pressure to absorb the corresponding test strips, etc.

綜上所述，於本創作中，由於致冷裝置可提供低溫環境，以降低試紙半成品之黏著劑之黏彈性，且試紙切割裝置可低溫環境將試紙半成品切割成複數個試紙片，因此本創作可有效地避免黏著劑殘留於試紙切割裝置。此外，由於第一移載組件與第二移載組件可於不同時間點將相鄰兩試紙片的其中一者與另一者運送至運送裝置，因此位於運送裝置的每一試紙片不與另一試紙片相鄰，且位於運送裝置的連續兩試紙片彼此分隔，故檢測裝置可準確地對每一試紙片進行檢測，且移除裝置可準確地移除複數個試紙片之至少一不合格者（如果有的話）。To sum up, in this creation, because the refrigeration device can provide a low temperature environment to reduce the viscoelasticity of the adhesive of the test paper semi-finished product, and the test paper cutting device can cut the test paper semi-finished product into a plurality of test strips in a low temperature environment, so this creation Can effectively avoid the adhesive residue in the test paper cutting device. In addition, since the first transfer assembly and the second transfer assembly can transport one and the other of the two adjacent test strips to the transport device at different points in time, each test strip located in the transport device is not connected to the other one. The test strips are adjacent, and the two consecutive test strips located in the conveying device are separated from each other, so the detection device can accurately detect each test strip, and the removal device can accurately remove at least one unqualified of the plurality of test strips (if so).

以上所述僅為本創作之較佳實施例，凡依本創作申請專利範圍所做之均等變化與修飾，皆應屬本創作之涵蓋範圍。The above are only the preferred embodiments of this creation, and all equal changes and modifications made in accordance with the scope of the patent application for this creation should fall within the scope of this creation.

1:後處理設備 11:致冷裝置 12:試紙切割裝置 13:試紙移載裝置 131:第一移載組件 1311:第一上夾持件 1312:第一下夾持件 132:第二移載組件 1321:第二上夾持件 1322:第二下夾持件 133:運送裝置 14:檢測裝置 15:移除裝置 16:振動裝置 2:試紙片 H1:第一水平方向 H2:第二水平方向 V:垂直方向 1: Post-processing equipment 11: Refrigeration device 12: Test paper cutting device 13: Test paper transfer device 131: The first transfer component 1311: The first upper clamping piece 1312: The first lower clamping piece 132: The second transfer component 1321: The second upper clamping piece 1322: The second lower clamping piece 133: transport device 14: Detection device 15: Remove device 16: Vibration device 2: Test strip H1: The first horizontal direction H2: second horizontal direction V: vertical direction

第1圖為本創作實施例後處理設備之外觀示意圖。 第2圖至第4圖為本創作實施例後處理設備之部分內部結構於不同視角之示意圖。 第5圖至第6圖為本創作實施例後處理設備之部分結構於不同視角之示意圖。 第7圖至第8圖為本創作實施例試紙移載裝置之部分結構之放大圖。 第9圖至第10圖為本創作實施例後處理設備之另一部分於不同視角之示意圖。 Figure 1 is a schematic diagram of the appearance of the post-processing device of the creative embodiment. Figures 2 to 4 are schematic diagrams of part of the internal structure of the post-processing device of the creative embodiment from different perspectives. Figures 5 to 6 are schematic diagrams of part of the structure of the post-processing device of the creative embodiment from different perspectives. Figures 7 to 8 are enlarged views of part of the structure of the test paper transfer device of the creative embodiment. Figures 9 to 10 are schematic diagrams of another part of the post-processing device of the creative embodiment from different perspectives.

1:後處理設備 1: Post-processing equipment

11:致冷裝置 11: Refrigeration device

Claims (10)

一種用於一試紙半成品之後處理設備，其包含有： 一致冷裝置，其係用以提供一低溫環境，以降低該試紙半成品之一黏著劑之一黏彈性（viscoelasticity）； 一試紙切割裝置，其係用以於該低溫環境將該試紙半成品切割成複數個試紙片；以及 一試紙移載裝置，其係用以運送複數個試紙片，該試紙移載裝置包含有一第一移載組件以及一第二移載組件，該第一移載組件與該第二移載組件係分別用以於不同時間點運送該複數個試紙片之相鄰兩試紙片的其中一者與另一者。 A device used for the post-processing of a test paper semi-finished product, which contains: The uniform cooling device is used to provide a low temperature environment to reduce the viscoelasticity of the adhesive of the semi-finished test paper; A test paper cutting device for cutting the test paper semi-finished product into a plurality of test paper pieces in the low temperature environment; and A test paper transfer device for transporting a plurality of test paper sheets, the test paper transfer device includes a first transfer component and a second transfer component, the first transfer component and the second transfer component are It is used to transport one of the two adjacent test paper sheets and the other of the plurality of test paper sheets at different time points. 如請求項1所述之後處理設備，其中該第一移載組件包含有複數個第一上夾持件以及複數個第一下夾持件，該第二移載組件包含有複數個第二上夾持件以及複數個第二下夾持件，該複數個第一上夾持件係間隔設置，各第二上夾持件係位於相對應的該兩第一上夾持件之間，該複數個第一下夾持件係間隔設置，各第二下夾持件係位於相對應的該兩第一下夾持件之間。As claimed in claim 1, wherein the first transfer assembly includes a plurality of first upper clamping members and a plurality of first lower clamping members, and the second transfer assembly includes a plurality of second upper clamping members. A clamping piece and a plurality of second lower clamping pieces, the plurality of first upper clamping pieces are arranged at intervals, each second upper clamping piece is located between the two corresponding first upper clamping pieces, the A plurality of first lower clamping members are arranged at intervals, and each second lower clamping member is located between the two corresponding first lower clamping members. 如請求項2所述之後處理設備，其中該複數個第一上夾持件的其中一者與相對應的該第一下夾持件可相對於彼此沿一垂直方向移動以夾持或釋放該複數個試紙片之相鄰該兩試紙片的其中該一者，該複數個第二上夾持件的其中一者與相對應的該第二下夾持件可相對於彼此沿該垂直方向移動以夾持或釋放該複數個試紙片之相鄰該兩試紙片的其中該另一者。As claimed in claim 2, wherein one of the plurality of first upper clamping members and the corresponding first lower clamping member can move relative to each other in a vertical direction to clamp or release the The adjacent one of the two test paper sheets of the plurality of test paper sheets, one of the plurality of second upper clamping members and the corresponding second lower clamping member can move relative to each other in the vertical direction To clamp or release the other of the two adjacent test paper sheets of the plurality of test paper sheets. 如請求項3所述之後處理設備，其中當該複數個第一上夾持件的其中該一者與相對應的該第一下夾持件夾持該複數個試紙片之相鄰該兩試紙片的其中該一者之後，該複數個第一上夾持件的其中該一者與相對應的該第一下夾持件同步地沿該垂直方向移動以沿該垂直方向運送該複數個試紙片之相鄰該兩試紙片的其中該一者，當該複數個第二上夾持件的其中該一者與相對應的該第二下夾持件夾持該複數個試紙片之相鄰該兩試紙片的其中該另一者之後，該複數個第二上夾持件的其中該一者與相對應的該第二下夾持件同步地沿該垂直方向移動以沿該垂直方向運送該複數個試紙片之相鄰該兩試紙片的其中該一者。The post-processing device according to claim 3, wherein when the one of the plurality of first upper clamping members and the corresponding first lower clamping member clamp the two adjacent test strips of the plurality of test strips After the one of the sheets, the one of the plurality of first upper clamping members and the corresponding first lower clamping member move in the vertical direction synchronously to transport the plurality of test papers in the vertical direction The adjacent one of the two test paper sheets, when the one of the plurality of second upper clamps and the corresponding second lower clamp clamp the adjacent one of the plurality of test paper sheets After the other of the two test paper sheets, the one of the plurality of second upper clamping members and the corresponding second lower clamping member move in the vertical direction to be transported in the vertical direction in synchronization with the corresponding second lower clamping member The one of the two adjacent test paper sheets of the plurality of test paper sheets. 如請求項1所述之後處理設備，其中該試紙移載裝置另包含有一運送裝置，其係用以運送來自該第一移載組件與該第二移載組件之該複數個試紙片之相鄰該兩試紙片的其中該一者與該另一者。The post-processing equipment according to claim 1, wherein the test paper transfer device further includes a transport device for transporting the adjacent test paper sheets from the first transfer component and the second transfer component The one and the other of the two test strips. 如請求項5所述之後處理設備，其中該第一移載組件之一運送方向相同於該第二移載組件之一運送方向且垂直於該運送裝置之一運送方向。The post-processing equipment according to claim 5, wherein a conveying direction of the first transfer component is the same as a conveying direction of the second transfer component and perpendicular to a conveying direction of the conveying device. 如請求項5所述之後處理設備，其另包含有： 一檢測裝置，其係用以檢測位於該運送裝置上之該複數個試紙片；以及 一移除裝置，其係用以依據該檢測裝置之一檢測結果移除該複數個試紙片之至少一不合格者。 The post-processing equipment as described in claim 5, which additionally includes: A detection device for detecting the plurality of test strips on the conveying device; and A removing device is used to remove at least one unqualified one of the plurality of test strips according to a detection result of one of the detection devices. 如請求項7所述之後處理設備，其中該檢測裝置為一影像擷取裝置，且該移除裝置為一風機。The post-processing equipment according to claim 7, wherein the detecting device is an image capturing device, and the removing device is a fan. 如請求項7所述之後處理設備，另包含有一振動裝置，其係用以將該複數個試紙片之至少一合格者以振動的方式裝入至少一分裝罐。As described in claim 7, the post-processing equipment further includes a vibrating device, which is used to vibrate at least one of the plurality of test strips into at least one sub-packing tank. 如請求項1所述之後處理設備，其中該致冷裝置為一冷凍空調裝置。The post-processing equipment according to claim 1, wherein the refrigerating device is a refrigerating and air-conditioning device.
TW110207459U 2021-06-28 2021-06-28 Post-processing apparatus for a semi-finished test paper TWM618645U (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI789801B (en) * 2021-06-28 2023-01-11 富揚晶機股份有限公司 Post-processing apparatus for a semi-finished test paper

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI789801B (en) * 2021-06-28 2023-01-11 富揚晶機股份有限公司 Post-processing apparatus for a semi-finished test paper

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