TWM512717U - Optical device for detecting element - Google Patents
Optical device for detecting element Download PDFInfo
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- TWM512717U TWM512717U TW104207447U TW104207447U TWM512717U TW M512717 U TWM512717 U TW M512717U TW 104207447 U TW104207447 U TW 104207447U TW 104207447 U TW104207447 U TW 104207447U TW M512717 U TWM512717 U TW M512717U
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Description
本創作關於一種光學裝置，此裝置可檢測元件是否有瑕疵，其中所檢測之元件的尺寸與可檢測到有瑕疵的位置均不受到限制。 The present invention relates to an optical device which can detect whether a component has flaws, wherein the size of the detected component and the position at which the flaw can be detected are not limited.
如螺絲、螺帽、插銷、或鉚釘等元件常用於電子、機械、醫療、或居家設備中。依目前的工業技藝，這種元件多採大規模生產方式來製造，故於製造過程須嚴密對元件的品質把關。一旦元件出現瑕疵時，除了可能會毀損設備外，還可能會威脅操作設備之人員的安全或性命。因此，檢查這種元件是否有瑕疵確實為製造過程中相當重要的一項環節。 Components such as screws, nuts, bolts, or rivets are commonly used in electronics, machinery, medical, or home equipment. According to the current industrial technology, such components are manufactured by large-scale production methods, so the quality of components must be strictly controlled in the manufacturing process. In the event of a flaw in the component, in addition to possibly damaging the device, it may also threaten the safety or life of the person operating the device. Therefore, checking whether such components are defective is indeed a very important part of the manufacturing process.
如圖7所示，中華民國新型專利公告號M355373提出之「物件外表面的360度檢測裝置」，其包含：承載部(1)、全向反射模組(2)、影像擷取單元(3)、及發光模組(4)。承載部(1)的頂面可承載且運送待檢測物件(S1)；全向反射模組(2)設於承載部(1)上，且含有中空柱體(21)、第一反射鏡(22)與第二反射鏡(23)，第一反射鏡(22)為以特定角度環設於中空柱體(21)內側周緣，以映照出待檢測物件(S1)外表面的360度影像，而第二反射鏡(23)環設於中空柱體(21)內的中央位置，以接收第一反射鏡(22)所反射的影像；影像擷取單元(3)為設置於全向反射模組(2)上，以擷取第二反射鏡(23)所反射的影像。透過此裝置，可拍攝到待檢測物件(S1)外表面的360度影像。 As shown in Fig. 7, the "Third-degree detecting device for the outer surface of the object" proposed by the Republic of China New Patent Publication No. M355373 includes: a carrying portion (1), an omnidirectional reflecting module (2), and an image capturing unit (3) ), and the light module (4). The top surface of the carrying portion (1) can carry and transport the object to be detected (S1); the omnidirectional reflection module (2) is disposed on the carrying portion (1) and includes a hollow cylinder (21) and a first mirror ( 22) and a second mirror (23), the first mirror (22) is annularly disposed at a specific angle on the inner circumference of the hollow cylinder (21) to reflect a 360-degree image of the outer surface of the object to be detected (S1). The second mirror (23) is disposed at a central position in the hollow cylinder (21) to receive the image reflected by the first mirror (22); the image capturing unit (3) is disposed in the omnidirectional reflection mode On the group (2), the image reflected by the second mirror (23) is captured. Through this device, a 360-degree image of the outer surface of the object to be detected (S1) can be captured.
再如圖8所示，中華民國新型專利公告號M370094提出之「物件外 表面的取像裝置」，其能檢測待檢測物件(S2)外表面且包含：由下往上設置的光源(5)、第一反射單元(6)、第二反射單元(7)、及取像單元(8)。第一反射單元(6)圍繞中心軸線(L)並界定有第一光通空間(61)；第二反射單元(7)界定有第二光通空間(71)；光源(5)可將光線投射到待檢測物件(S2)上，光線再進入第一、二光通空間(61、71)，並受第一、二反射單元(6、7)反射至取像單元(8)，使取像單元(8)擷取成像於第二反射單元(7)上的待檢測物件(S2)影像，達到檢測目的。 As shown in Figure 8, the Republic of China new patent announcement number M370094 proposed "outside the object a surface capturing device capable of detecting an outer surface of the object to be detected (S2) and comprising: a light source (5) disposed from bottom to top, a first reflecting unit (6), a second reflecting unit (7), and Like unit (8). The first reflecting unit (6) surrounds the central axis (L) and defines a first light-passing space (61); the second reflecting unit (7) defines a second light-passing space (71); the light source (5) can light Projected onto the object to be detected (S2), the light enters the first and second light-passing spaces (61, 71), and is reflected by the first and second reflecting units (6, 7) to the image capturing unit (8), so that The image unit (8) captures an image of the object to be detected (S2) imaged on the second reflection unit (7) for detection purposes.
然而，以上習用設備因所用的光學元件導致所測的元件尺寸與其可檢測到有瑕疵的位置受到侷限，因而降低習用設備的應用性。於是，本創作乃針對以上習用之設備存在的問題來進行改良。 However, the above-mentioned conventional devices are limited in the position of the measured component and the position at which the flaw can be detected due to the optical component used, thereby reducing the applicability of the conventional device. Therefore, this creation is to improve the problems of the above-mentioned devices.
本創作之一目的在於提供一種新穎的光學裝置，其可檢測元件是否有瑕疵，且檢測之元件的尺寸與其可檢測到有瑕疵的位置均不受限。 One of the aims of the present invention is to provide a novel optical device that can detect whether a component has flaws, and that the size of the detected component and the position at which it can detect flaws are not limited.
於是，本創作提出一種用於檢測元件的光學裝置，其包含：一承載台，為用於供元件承載；一發光源，為用於發出光線以投射元件；一透鏡，具有一自中央處向周緣遞減的厚度，且設置於承載台一側，用於元件反射發光源所投射的光線後，供元件所反射的光線穿透以讓穿透的光線折射；以及一攝影件，為設置於透鏡相對於承載台的一側，用於接收折射後的光線以取得元件的影像。 Thus, the present invention proposes an optical device for detecting a component, comprising: a carrier for carrying the component; a light source for emitting light to project the component; and a lens having a central direction The thickness of the circumference is decreasing, and is disposed on one side of the carrying platform, after the component reflects the light projected by the light source, the light reflected by the component penetrates to refract the transmitted light; and a photographic element is disposed on the lens Relative to the side of the stage for receiving the refracted light to capture an image of the component.
依本創作，透過攝影件所取得的元件影像，可呈現元件的樣貌，進而可確認元件是否有瑕疵。另一方面，依透鏡結構所賦予的光學特性，可讓元件的尺寸及元件可檢測到有瑕疵的位置不受侷限，從而提升元件檢測的應用 性。 According to the creation, the image of the component obtained through the photographic component can show the appearance of the component, and further confirm whether the component is flawed. On the other hand, depending on the optical characteristics imparted by the lens structure, the size of the component and the position at which the component can detect flaws are not limited, thereby improving the application of component detection. Sex.
<相關前案> <Related case>
(1)‧‧‧承載部 (1) ‧‧‧Loading Department
(2)‧‧‧全向反射模組 (2) ‧‧‧ Omnidirectional Reflective Module
(21)‧‧‧中空柱體 (21)‧‧‧ hollow cylinder
(22)‧‧‧第一反射鏡 (22)‧‧‧First mirror
(23)‧‧‧第二反射鏡 (23)‧‧‧second mirror
(3)‧‧‧影像擷取單元 (3) ‧‧‧Image capture unit
(4)‧‧‧發光模組 (4) ‧‧‧Lighting module
(5)‧‧‧光源 (5) ‧‧‧Light source
(6)‧‧‧第一反射單元 (6)‧‧‧First reflection unit
(61)‧‧‧第一光通空間 (61)‧‧‧First light-pass space
(7)‧‧‧第二反射單元 (7) ‧‧‧second reflection unit
(71)‧‧‧第二光通空間 (71)‧‧‧Second light space
(8)‧‧‧取像單元 (8)‧‧‧Image capture unit
(L)‧‧‧中心軸線 (L) ‧ ‧ central axis
(S1、S2)‧‧‧待檢測物件 (S1, S2) ‧ ‧ objects to be tested
<本創作之實施方式> <Implementation of this creation>
(1)‧‧‧承載台 (1) ‧‧‧bearing station
(2)‧‧‧發光源 (2) ‧‧‧Light source
(3)‧‧‧透鏡 (3) ‧ ‧ lens
(4)‧‧‧攝影件 (4) ‧ ‧ photographic parts
(5)‧‧‧支架 (5) ‧‧‧ bracket
(51)‧‧‧滑軌 (51)‧‧‧Slide rails
(6)‧‧‧套筒 (6) ‧ ‧ sleeve
(7)‧‧‧送料件 (7)‧‧‧Feed parts
(8)‧‧‧集料件 (8) ‧‧‧ aggregate parts
(81)‧‧‧第一集料單元 (81)‧‧‧First aggregate unit
(82)‧‧‧第二集料單元 (82) ‧‧‧Second aggregate unit
(83)‧‧‧第三集料單元 (83)‧‧‧ Third aggregate unit
(S)‧‧‧元件 (S)‧‧‧ components
圖1為一立體圖，顯示著本創作一實施方式的光學裝置。 1 is a perspective view showing an optical device of an embodiment of the present invention.
圖2為一側視圖，顯示著上述光學裝置。 Figure 2 is a side elevational view showing the optical device described above.
圖3為一局部側視圖，說明著上述光學裝置中透鏡、發光源、攝影件、套筒及支架的相對位置。 Figure 3 is a partial side elevational view showing the relative positions of the lens, illumination source, photographic element, sleeve and bracket in the optical device.
圖4為一局部側視圖，說明著上述光學裝置中透鏡、發光源、攝影件、套筒及支架的相對位置。 Figure 4 is a partial side elevational view showing the relative positions of the lens, illumination source, photographic element, sleeve and bracket in the optical device.
圖5(A)至圖5(F)為一系列照片圖，呈現上述光學裝置於一條件下檢測元件樣貌的結果。 5(A) to 5(F) are a series of photographic diagrams showing the results of the above-described optical device detecting the appearance of the component under one condition.
圖6(A)至圖6(F)為一系列照片圖，呈現上述光學裝置於另一條件下檢測元件樣貌的結果。 6(A) to 6(F) are a series of photographic diagrams showing the results of the above-described optical device detecting the appearance of the component under another condition.
圖7為一結構示意圖，呈現相關前案中華民國新型專利公告號M355373提出之物件外表面的360度檢測裝置。 Fig. 7 is a schematic structural view showing a 360-degree detecting device for the outer surface of the object proposed by the Republic of China New Patent Publication No. M355373.
圖8為一結構示意圖，呈現相關前案中華民國新型專利公告號M370094提出之物件外表面的取像裝置。 Fig. 8 is a schematic structural view showing an image capturing device for the outer surface of the object proposed in the Chinese Patent No. M370094.
為讓本創作上述及/或其他目的、功效、特徵更明顯易懂，下文特舉較佳實施方式，並配合所附圖式，作詳細說明如下：請參照圖1、2，繪示著本創作之一實施方式的光學裝置，此裝置可檢測元件(S)且含有：一承載台(1)、一發光源(2)、一透鏡(3)、一 攝影件(4)、一支架(5)、一套筒(6)、一送料件(7)、及一集料件(8)。 In order to make the above and/or other objects, functions and features of the present invention more obvious and easy to understand, the preferred embodiments are described below, and the drawings are described in detail as follows: Please refer to FIG. An optical device according to an embodiment of the invention, wherein the device can detect the component (S) and comprises: a carrier (1), a light source (2), a lens (3), a The photographic member (4), a bracket (5), a sleeve (6), a feeding member (7), and a collecting member (8).
承載台(1)可供元件(S)承載。於本實施方式中，承載台(1)為一透明載台，以供光線穿透承載台(1)來投射元件(S)。另於本實施方式中，承載台(1)可為一轉動式載台，以用於後文所述的目的。 The carrier (1) can be carried by the component (S). In the present embodiment, the carrier (1) is a transparent stage for light to penetrate the carrier (1) to project the component (S). In addition, in the present embodiment, the carrier (1) can be a rotary stage for the purposes described later.
發光源(2)可發出光線來投射元件(S)。一般而言，發光源(2)的位置並無任何限制。於本實施方式中，發光源(2)為設置於承載台(1)的一側。由於承載台(1)為透明載台，光線可先穿過承載台(1)而再投射元件(S)。此外，發光源(2)較佳地為環形排列於承載台(1)的此側，而可讓光線均勻以讓後續得到的影像清晰。 The light source (2) emits light to project the component (S). In general, there is no limitation on the position of the light source (2). In the present embodiment, the light source (2) is disposed on one side of the stage (1). Since the carrier (1) is a transparent stage, light can first pass through the stage (1) and re-project the element (S). Furthermore, the illumination source (2) is preferably arranged annularly on this side of the carrier (1) to provide uniform light for clarity of subsequent images.
透鏡(3)具有一自中央處向週緣遞減的厚度，且設置於承載台(1)相對於發光源(2)的一側。如此，於元件(S)反射發光源(2)所投射的光線之後，元件(S)所反射的光線會穿透透鏡(3)，並利用透鏡(3)結構所帶來的光學特性，使穿透的光線折射。須說明的是，透鏡(3)的實例不應受任何限制，只要可達成光線折射即可。較佳地，透鏡(3)可為一非球面凸透鏡(如圖3)或一錐形透鏡(如圖4)。須說明的是，當透鏡(3)為錐形透鏡時，折射的光線較為均勻，即可使後續得到的元件(S)影像更為清晰。另於一未示的實施方式中，透鏡(3)亦可設置於承載台(1)相同於發光源(2)的一側，如此承載台(1)並不限於透明載台，而可直接將光線投射於元件(S)。 The lens (3) has a thickness decreasing from the center toward the periphery and is disposed on a side of the stage (1) with respect to the light source (2). Thus, after the component (S) reflects the light projected by the illumination source (2), the light reflected by the component (S) penetrates the lens (3) and utilizes the optical characteristics brought about by the structure of the lens (3). The transmitted light is refracted. It should be noted that the example of the lens (3) should not be limited as long as light refraction can be achieved. Preferably, the lens (3) can be an aspherical convex lens (as in Figure 3) or a conical lens (as in Figure 4). It should be noted that when the lens (3) is a conical lens, the refracted light is relatively uniform, so that the subsequently obtained component (S) image can be made clearer. In another embodiment, the lens (3) may also be disposed on the side of the carrying platform (1) that is the same as the light source (2), such that the carrying platform (1) is not limited to the transparent carrier, but may be directly Project light onto the component (S).
攝影件(4)為設置於透鏡(3)相對於承載台(1)的一側，而可接收折射後的光線以取得元件(S)的影像。依所取得的影像，可觀察到元件(S)的樣貌以確認元件(S)是否有瑕疵。 The photographic element (4) is disposed on one side of the lens (3) with respect to the stage (1), and can receive the refracted light to obtain an image of the element (S). Depending on the image obtained, the appearance of the component (S) can be observed to confirm whether the component (S) is defective.
支架(5)為連結於發光源(2)、透鏡(3)、攝影件(4)。如 此一來，可透過支架(5)來支撐發光源(2)、透鏡(3)與攝影件(4)。另外，於本實施方式中，支架(5)設有滑軌(51)，滑軌(51)可使發光源(2)、透鏡(3)及攝影件(4)於支架(5)上移動，從而於元件(S)檢測時調整發光源(2)、透鏡(3)或攝影件(4)與元件(S)間的距離以讓得到的影像清晰。 The bracket (5) is connected to the light source (2), the lens (3), and the photographing member (4). Such as In this way, the light source (2), the lens (3) and the photographic element (4) can be supported by the bracket (5). In addition, in the embodiment, the bracket (5) is provided with a slide rail (51), and the slide rail (51) can move the light source (2), the lens (3) and the photographing member (4) on the bracket (5). Therefore, the distance between the light source (2), the lens (3) or the photographing member (4) and the element (S) is adjusted when the element (S) is detected to make the obtained image clear.
套筒(6)為以其一端連結透鏡(3)，並以其另端連結攝影件(4)。透過此種結構，可讓透鏡(3)與攝影件(4)模組化以供支架(5)連結，且能於元件(S)檢測時降低外界光源干擾所造成的影像雜訊。此外，套筒(6)可為一伸縮套筒，藉此可調整透鏡(3)或攝影件(4)與元件(S)之間的距離，讓攝影件(4)取得的影像清晰。另外，於另一未示的實施方式中，當透鏡(3)設置於承載台(1)相同於發光源(2)的此側時，發光源(2)可設置於套筒(6)內、套筒(6)連結透鏡(3)此端的外緣、或套筒(6)外透鏡(3)與承載台(1)之間。而當發光源(2)設置於套筒(6)內、或套筒(6)連結透鏡(3)此端的外緣時，套筒(6)可讓發光源(2)、透鏡(3)與攝影件(4)模組化來供支架(5)連結。 The sleeve (6) is connected to the lens (3) at one end thereof and is connected to the photographic member (4) at the other end. Through this structure, the lens (3) and the photographic member (4) can be modularized for the bracket (5) to be connected, and the image noise caused by the interference of the external light source can be reduced when the component (S) is detected. In addition, the sleeve (6) can be a telescopic sleeve, whereby the distance between the lens (3) or the photographic member (4) and the component (S) can be adjusted to make the image obtained by the photographic member (4) clear. In addition, in another embodiment not shown, when the lens (3) is disposed on the side of the carrying platform (1) that is the same as the light source (2), the light source (2) may be disposed in the sleeve (6). The sleeve (6) is coupled between the outer edge of the end of the lens (3) or the outer lens (3) of the sleeve (6) and the carrier (1). When the light source (2) is disposed in the sleeve (6), or the sleeve (6) is coupled to the outer edge of the end of the lens (3), the sleeve (6) allows the light source (2), the lens (3) It is modularized with the photographic element (4) for attachment to the bracket (5).
送料件(7)為設置於承載台(1)一端，其可自外部輸送元件(S)至承載台(1)。一般而言，送料件(7)可採任何方式來實現元件(S)輸送的功效。如圖2所示，送料件(7)以其遠離承載台(1)的一端向靠近承載台(1)的另端往下傾斜。這麼一來，元件(S)可受地心引力作用滑動至承載台(1)。此外，當承載台(1)為轉動式載台時，於輸送元件(S)至承載台(1)之後，可透過人工或機械操作轉動承載台(1)，使元件(S)轉動至承載台(1)上可實現檢測的位置(如對準透鏡(3)的位置)。 The feed member (7) is disposed at one end of the carrying platform (1), and is capable of transporting the component (S) from the outside to the carrying platform (1). In general, the feed member (7) can be used in any way to achieve the efficiency of the component (S) delivery. As shown in Fig. 2, the feed member (7) is inclined downward toward the other end of the stage (1) with its end remote from the stage (1). In this way, the component (S) can be slid to the carrier (1) by gravity. In addition, when the carrying platform (1) is a rotating stage, after the conveying element (S) to the carrying table (1), the carrying table (1) can be rotated by manual or mechanical operation to rotate the element (S) to the bearing. The position on the table (1) can be detected (such as the position of the alignment lens (3)).
集料件(8)為設置於承載台(1)的另一端，其可於元件(S)檢測之後匯集元件(S)。為有系統地依檢測結果分類元件(S)，集料件(8)另含有：一第一集料單元(81)、一第二集料單元(82)與一第三集料單元(83)，此等單元(81、82、83)依序排列於承載台(1)的此另端。而，第一集料單元(81)可於檢測到元件(S)無瑕疵時，收集此種無瑕疵的元件(S)；第二集料單元(82)可於檢測到元件(S)有瑕疵時，收集此種有瑕疵的元件(S)；第三集料單元(83)可於檢測到元件(S)無法確認有無瑕疵時，收集此種無法確認的元件(S)。而且，於本實施方式中，承載台(1)為轉動式載台的另一用意在於：依檢測結果可透過人工或機械操作轉動承載台(1)，使元件(S)轉動至承載台(1)上靠近上述任一集料單元(81、82、83)的位置，再採用一推動手段(圖未示，如吹氣閥或推桿)移動元件(S)至所靠近的集料單元(81、82或83)。 The collecting member (8) is disposed at the other end of the carrying table (1), which can collect the components (S) after the component (S) is detected. In order to systematically classify the component (S) according to the detection result, the aggregate (8) further comprises: a first aggregate unit (81), a second aggregate unit (82) and a third aggregate unit (83). ), the units (81, 82, 83) are sequentially arranged at the other end of the carrying platform (1). However, the first aggregate unit (81) can collect such a flawless component (S) when detecting that the component (S) is flawless; the second aggregate unit (82) can detect that the component (S) has In the case of 瑕疵, such a defective component (S) is collected; and the third concentrating unit (83) can collect such an unidentifiable component (S) when it is detected that the component (S) cannot confirm the presence or absence of defects. Moreover, in the present embodiment, the other purpose of the carrying platform (1) as a rotating stage is to rotate the carrying platform (1) by manual or mechanical operation according to the detection result, so that the component (S) is rotated to the carrying platform ( 1) Positioning close to any of the above-mentioned aggregate units (81, 82, 83), and then moving the element (S) to the adjacent aggregate unit by a pushing means (not shown, such as a blow valve or a push rod) (81, 82 or 83).
以下呈現本實施方式之光學裝置的元件檢測結果：如圖5(A)至5(F)所示，當元件為一不同直徑x高度的螺絲，透鏡為一特殊規的非球面凸透鏡，且元件與透鏡間有不同距離時，均可觀察到不同尺寸螺絲的樣貌。又如圖6(A)至6(F)所示，當元件為一不同直徑x高度的螺絲，且透鏡為一特殊規的非球面凸透鏡時，亦可觀察到不同尺寸螺絲的樣貌。 The component detection results of the optical device of the present embodiment are shown below: as shown in FIGS. 5(A) to 5(F), when the component is a screw having a different diameter x height, the lens is a special gauge aspherical convex lens, and the component When there are different distances from the lens, the appearance of different size screws can be observed. As shown in Figures 6(A) to 6(F), when the component is a screw of different diameter x height and the lens is a special gauge aspherical convex lens, the appearance of screws of different sizes can also be observed.
另須提出的是，依其他未提供的實驗圖式，當元件為螺帽時，本實施方式的光學裝置亦可同時觀察到元件的內徑表面與外徑表面。 It should be further noted that, according to other experimental diagrams not provided, when the component is a nut, the optical device of the present embodiment can simultaneously observe the inner and outer diameter surfaces of the component.
綜上所述，說明著本創作的光學裝置可呈現所檢測元件的樣貌，以供確認其是否有瑕疵。除此之外，透過光學裝置中的透鏡特性，可使元件的尺寸及其可檢測到有瑕疵的位置不受限。 In summary, it is illustrated that the optical device of the present invention can present the appearance of the detected component for confirmation of its flaws. In addition to this, the size of the element and the position at which the flaw can be detected are not limited by the lens characteristics in the optical device.
雖然本創作已以較佳實施例揭露於上，然其並非用以限定本創作，本創作所屬技術領域中具有通常知識者，在不脫離本創作之精神及範圍內，當可作些許之更動與潤飾，因此本創作的保護範圍當視後附之申請專利範圍所請求者為準。 Although the present invention has been disclosed in the preferred embodiments, it is not intended to limit the present invention, and those skilled in the art to which the present invention pertains can be modified in some ways without departing from the spirit and scope of the present invention. And the retouching, therefore, the scope of protection of this creation is subject to the request of the patent application scope attached.
(2)‧‧‧發光源 (2) ‧‧‧Light source
(4)‧‧‧攝影件 (4) ‧ ‧ photographic parts
(5)‧‧‧支架 (5) ‧‧‧ bracket
(51)‧‧‧滑軌 (51)‧‧‧Slide rails
(6)‧‧‧套筒 (6) ‧ ‧ sleeve
(7)‧‧‧送料件 (7)‧‧‧Feed parts
(8)‧‧‧集料件 (8) ‧‧‧ aggregate parts
(81)‧‧‧第一集料單元 (81)‧‧‧First aggregate unit
(82)‧‧‧第二集料單元 (82) ‧‧‧Second aggregate unit
(83)‧‧‧第三集料單元 (83)‧‧‧ Third aggregate unit
(S)‧‧‧元件 (S)‧‧‧ components
Claims (9)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW104207447U TWM512717U (en) | 2015-05-14 | 2015-05-14 | Optical device for detecting element |
| CN201520622681.5U CN205015284U (en) | 2015-05-14 | 2015-08-18 | Optical device for detecting assembly |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW104207447U TWM512717U (en) | 2015-05-14 | 2015-05-14 | Optical device for detecting element |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TWM512717U true TWM512717U (en) | 2015-11-21 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW104207447U TWM512717U (en) | 2015-05-14 | 2015-05-14 | Optical device for detecting element |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN205015284U (en) |
| TW (1) | TWM512717U (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109342024B (en) * | 2018-09-16 | 2020-10-27 | 林玲 | Contact lens screening equipment and screening method thereof |
| CN109365312B (en) * | 2018-09-16 | 2020-10-13 | 嘉兴麦瑞网络科技有限公司 | Big data management screening assembly line of contact lens |
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2015
- 2015-05-14 TW TW104207447U patent/TWM512717U/en unknown
- 2015-08-18 CN CN201520622681.5U patent/CN205015284U/en active Active
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| CN205015284U (en) | 2016-02-03 |
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