M255404 捌、新型說明： 【新型所屬之技術領域】 本創作係關於一種電路拓 板線路測試機之探針基座，尤 /糸扎一種使用壽命長且探針更換 機之探針基座。 尺換奋易之電路板線路測試 【先前技術】 電路板在製造完畢後，且 ^ ^ ^ ^ _ ”上會佈滿電路，為了測試電 路板的電路導通是否正常，客 ^ _ 夕9利用一電路板線路測試機 進^心―旦發現線路導通不良之電路板，便可立即進 ::換，以避免當電子元件焊接在電路板後，而發現電路 換之問題。 …將整組電子元件及電路板加以更 一般用在測試電路板雷故 如二、t斩刑八I# 路、、、°構之電路板線路測試機， 二告68118號之「模組化探針裝置及 使用該探針裝置之雷敗、日丨u T衣置及 姑μ松 板測試治具」，其係利用設置在基 反上之^木針模組與電路 ,,口 ， 之冤路接觸以進行電路導通之測 5式，另外如台灣新型公止 、 試探釙…白 6 9 4 4號之「電路板之測 、」亦係利用相同原理，利用探針與電路板 之電路接觸來進行轉板㈣m 板 :述=板線路測試機之探針結構，如第四圖所示， 路板（二 0)之基板（41)上設置有對應於電 路板（5 0 )線路之穿 电 中组梦右〜太 牙孔（41〇)，各穿孔（41〇) 、4有疋位套管（42)，該定位套管（ 置有弹黃（430)，彈菩x 择汽（430)上方設置有由定位 5 套管（42)突出其 套管“2)下端則藉由(=)(之探針（43)，而定位 析誠具（圖中未示）上。、’ 4 4 )連接到如電腦等分 請參看第五圖所示，當 (4 1 )移動以按壓探針（4路板（5 〇 )之線路向基板 定位套管（4 2 )内部内縮，f )時，探針（4 3 )會朝 3 )均可和電路板（$ 〇 )㈢此以使得所有的探針（4 彈簧“ 3 0 )長期受到探=線路加以接觸，然而由於 久便會產生彈性疲乏，使彳θ 4 3 )之壓迫，待時間一 不—致，甚至會產生所有: = 4 3 )尖端之水平高度 (5 〇 )上線路之問題，另 4 3 )無法接觸到電路板 直接組裝在基板（4 i、）外，由於定位套管（4 2 )係 同線路之電路板（5 Q =易更換，當欲進行具有不 )進行更換，若欲強行移除;基板(“ 使得定位套管（42)損壞而=^42)，則很容易 分不便。 …、法使用，因此在使用上十 【新型内容】 本創作人有鐘於此，乃著手進行研究開發，以期可提 種月b夠解决上述習用問題之電路板線路測試機之探針 基座經過不斷的試驗及努力，終於開發出本創作。 本創作之主要目的在於提供一種使用壽命長且探針更 換容易之電路板線路測試機之探針基座。 為了達到上述之創作目的，本創作係採取以下之技術 手段予以達成，其中本創作具備有： M255404 基座，其下方設置有具多數穿孔之底板，穿孔内側設 有導電金屬層，而上方設置具有相對於底板穿孔之穿孔的 上板’上板及底板之間猎由支撐柱加以連接· 楝針，其係一外側塗佈有絕緣層之金屬導線，其上端 穿出上板之穿孔，下端與底板之穿孔的導電金屬層接觸。 藉由金屬導線之探針本身之金屬彈性，當盥 板接觸後，金屬導線會略為彎曲，使得所有探針均可和電 路板接觸，因此沒有彈簧般彈性疲乏之問題，故使用妄命 之穿孔即可，使用上十分簡單方便。 【實施方式】 网"I小 之 探針基座具備有： 基座（1 〇)，其下方設置有具多數穿孔（U 之底板（11 )，空：丨f (11〇)内側設有導電金屬層（ ，而上核置具有相對於底板（i丨）穿 10)之穿孔（120)的上板（12) 及底板（1 1、十叫- 工极、1 2 ) 1 )之間糟由支撐柱（1 3 )加以連接； 探針（9 η、 β 之 ）’ m塗佈有絕緣層（2 i 〇) 、’ A ( 2 1 )，其上端之金屬内芯（2 1 穿出上板（! 91 2 1 1 )部分 2 1 1 )鱼广 牙孔（1 2 0 )，下端之金屬内芯( 。 底板（10)之穿孔（n〇)的導電全屬声 (111)接觸。 *电金屬層 為了增加探針之定位效果，上板（12)之下侧可4 M255404 設有-定位板（3 Q )，該定位板（3 Q )上設置有相對 於上板（1 2 )之穿孔（1 2 0 )的定位孔（3 〇 〇 )， 各定位孔（3 0 〇 )之大小相對於金屬導線（2丄）絕緣 層（2 1 〇 )之外徑’而上板（1 2 )穿孔（1 2 0 )之 大小則洽可供金屬導線（2 1 )之金屬内芯（2工丄）穿 過° 中段部位之穩定性 間的支撐柱（1 3 亦M255404 新型 Description of the new type: [Technical field to which the new type belongs] This creation is about a probe base for a circuit board tester, especially a probe base with a long service life and a probe replacement machine. Rule change for easy circuit board circuit test [prior art] After the circuit board is manufactured, and ^ ^ ^ ^ _ "will be full of circuits, in order to test whether the circuit of the circuit board is normal, the customer _ _ 9 The heart of the circuit board circuit tester-once you find a circuit board with poor continuity, you can immediately enter the :: change to avoid the problem of circuit replacement when the electronic components are soldered to the circuit board.... And circuit boards are more commonly used to test circuit board lightning, such as two, t cut penalty eight I # circuit, circuit board tester, "No. 68118" modular probe device and use of the The failure of the probe device, the Japanese test equipment, and the test board for loosening test fixtures ", are based on the use of the wooden needle module and the circuit, which are placed on the base, to conduct the circuit. Continuity test 5 type, in addition, such as Taiwan's new public stop, test 钋 ... White 6 9 4 4 "circuit board test," also uses the same principle, using the probe to contact the circuit of the circuit board ㈣m Board: description = probe structure of board circuit tester, such as the fourth As shown in the figure, the substrate (41) of the circuit board (20) is provided with the right through the group corresponding to the circuit board (50). The right through the tooth hole (41〇), the perforations (41〇), 4 There is a positioning sleeve (42), and the positioning sleeve (with elastic yellow (430), and the upper end of the sleeve "2) protruding from the positioning 5 sleeve (42) is provided above the elastic pump (430). With (=) (the probe (43), locate the analysis tool (not shown)., '4 4) Connect to a computer aliquot, please refer to the fifth figure, when (4 1) When moving to press the line of the probe (4 way board (50)) toward the inside of the substrate positioning sleeve (4 2), the probe (4 3) will face 3) and the circuit board ($ 〇). ) As a result, all the probes (4 springs "3 0) are contacted by the probe = line for a long time, but due to the elastic fatigue fatigue, 产生 θ 4 3) will be pressed for a long time. Will produce all: = 4 3) the problem of the line on the horizontal level of the tip (50), the other 4 3) can not contact the circuit board directly assembled outside the substrate (4 i,), because the positioning sleeve (4 2) system Circuit board (5 Q = easy to replace, if you want to do not have) to replace, if you want to forcibly remove; the base plate ("makes the positioning sleeve (42) damaged and = ^ 42), it is easy to separate inconvenience. Therefore, the use of ten [new content] The creator has the clock here, and is engaged in research and development, with a view to improving the type of month b. The probe base of the circuit board circuit tester that can solve the above-mentioned conventional problems has undergone continuous tests and Efforts have finally led to the creation of this creation. The main purpose of this creation is to provide a probe base for a circuit board circuit tester with a long service life and easy probe replacement. In order to achieve the above-mentioned creation purpose, this creation is achieved by the following technical means, among which this creation is provided with: M255404 base, which is provided with a bottom plate with most perforations underneath, a conductive metal layer inside the perforations, and an upper part with The perforated upper plate, which is perforated with respect to the bottom plate, is connected between the upper plate and the bottom plate by a support post. The pin is a metal wire coated with an insulating layer on the outside, and the upper end of the upper plate penetrates the perforation of the upper plate. The perforated conductive metal layer of the base plate is in contact. Due to the metal elasticity of the metal wire probe, the metal wire will be slightly bent after the toilet plate contacts, so that all the probes can be in contact with the circuit board, so there is no problem of spring-like elastic fatigue, so use arrogant perforation Yes, it is very simple and convenient to use. [Embodiment] The probe base of the net "I" is provided with: a base (10), and a bottom plate (11) with a plurality of perforations (U) is arranged below, and a space is provided inside f (11) The conductive metal layer (, and the upper core is disposed between the upper plate (12) and the bottom plate (1 1, ten call-working electrode, 1 2) 1) with a perforation (120) that penetrates 10) relative to the bottom plate (i 丨). The probe is connected by a supporting post (1 3); the probe (9 η, β) is coated with an insulating layer (2 i 〇), 'A (2 1), and a metal inner core (2 1 through The upper plate (! 91 2 1 1) part 2 1 1) Yuguang tooth hole (1 2 0), the metal core at the lower end (. The conduction of the perforation (n〇) of the bottom plate (10) is all acoustic (111) Contact. * In order to increase the positioning effect of the electric metal layer, the lower side of the upper plate (12) can be provided with a positioning plate (3 Q). The positioning plate (3 Q) is provided opposite to the upper plate (3 Q). 1 2) positioning holes (300) of the perforations (120), the size of each positioning hole (300) relative to the outer diameter of the metal wire (2 丄) insulating layer (2 1〇) The size of the plate (1 2) perforation (1 2 0) is available. Genus metal core wire (21) of (2 ENGINEERING Shang) through the supporting column through (13 ° between the stability of the middle portion are also
另外，為了增加探針（2 〇 ) 可在上板（12)及底板（11) 5該中層板（3 1 )上設置有相對 (120)的定位孔（31〇)， )的中段部位，其中該定位孔（3 金屬導線（2 1 )絕緣層（2 1 〇 增設一中層板（3 1 ) 於上板（12)之穿孔 藉此以固定探針（2 〇 1 0 )之大小係相對於 )之外徑。 同樣的’在底板（11)上側亦可增加-如同增設在 上板（1 2)處之疋位板（3〇)的定位板（3〇)，藉 此以達到相同之探針（20)端部定位效果。 9 請彎看第三圖所示， 穿孔（1 1 0 )之導電金 2 )與例如電腦之分析儀 屬導線（2 1 )之探針（ (20)之金屬内芯（2 ，金屬導線（2 1 )會略 之金屬内芯（2 1 1 )均 沒有彈簧般彈性疲乏之問 本創作於使用時，底板（丄工） 屬層（1 1 1 )係藉由電線（3 器（圖中未示）相連接，藉由金 2 〇 )本身之金屬彈性，當探針 1 1 )與電路板（3 3 )接觸後 為彎曲，使得所有探針（2 〇 ) 可和電路板（3 3 )接觸，因此 題，故使用壽命更長，當欲更換 M255404 探針（2 Ο )時，只要將探針（2 Ο )加以移出上板（ 2)及底板（11)之穿孔（120) (110)即可 使用上十分簡單方便。 【圖式簡單說明】 (一） 圖式部分 第一圖為本創作之剖面示意圖。 第二圖為本創作底板部位之部分剖面示意圖。 第三圖為本創作之使用狀態示意圖。 第四圖為習用結構之剖面示意圖。 第五圖為習用結構之使用狀態示意圖。 (二） 元件代表符號 (10)基座 (1 1 )底板 (1 1 0 )穿孔 (111)導電金屬層 (1 2 )上板 (1 2 0 )穿孔 (13)支撐柱 (2 0 )探針 (2 1 )金屬導線 (210)絕緣層 (2 1 1 )金屬内芯 (3 0 )定位板 (3 0 0 )定位孔 M255404 (3 1 )中層板 (3 1 Ο )定位孔 (3 2 )電線 (3 3 )電路板 (4 0 )基座 (4 1 )基板 (4 1 0 )穿孔 (42)定位套管 (4 3 )探針 (4 3 0 )彈簧 (4 4 )電線 (5 0 )電路板In addition, in order to increase the probe (20), the upper plate (12) and the bottom plate (11) 5 may be provided with a middle portion (120) of positioning holes (31),) in the middle plate (3 1), Wherein, the positioning hole (3 metal wire (2 1)), an insulating layer (2 1 0), a middle layer plate (3 1) is added to the perforation of the upper plate (12), so that the size of the fixed probe (2 0 1 0) is relative. The outer diameter of ()). The same 'can also be added on the upper side of the bottom plate (11)-like the positioning plate (30) of the positioning plate (30) on the upper plate (12), so as to achieve the same The positioning effect of the end of the probe (20). 9 Bend to see the third picture, the conductive gold (2) of the perforation (1 1 0) and the probe (for example, the analyzer of the computer is a wire (2 1)) (20 ) Of the metal core (2, the metal wire (2 1) will be slightly less than the spring-like elasticity of the metal core (2 1 1). When this book is used, the base plate (masonry) is a layer (1 1 1 ) Is connected by wires (3 devices (not shown), and by the metal elasticity of gold 2 0) itself, when the probe 1 1) contacts the circuit board (3 3), it is bent, so that all the probes (2 〇 ) Can contact the circuit board (3 3), so it has a longer life span. When you want to replace the M255404 probe (2 Ο), just remove the probe (2 Ο) from the upper board (2) and the bottom plate ( 11) The perforation (120) (110) is very simple and convenient to use. [Simplified description of the drawings] (1) The first part of the schematic part is a schematic cross-section of the creation. The second image is a part of the bottom part of the creation. Sectional schematic diagram. The third diagram is the schematic diagram of the use state of the creation. The fourth diagram is the schematic diagram of the conventional structure. The fifth diagram is the diagram of the conventional state of use. (II) The symbol of the component (10) the base (1 1) Bottom plate (1 1 0) Perforation (111) Conductive metal layer (1 2) Upper plate (1 2 0) Perforation (13) Support post (2 0) Probe (2 1) Metal wire (210) Insulation layer (2 1 1) Metal core (3 0), positioning plate (3 0 0), positioning hole M255404 (3 1), mid-layer board (3 1 〇), positioning hole (3 2), wire (3 3), circuit board (4 0), base ( 4 1) Substrate (4 1 0) Perforation (42) Positioning sleeve (4 3) Probe (4 3 0) Spring (4 4) Wire (50) Circuit board