TWI792044B - Light source device for auxiliary optical detection device and optical inspection device composed of the same - Google Patents

Light source device for auxiliary optical detection device and optical inspection device composed of the same Download PDF

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TWI792044B
TWI792044B TW109128265A TW109128265A TWI792044B TW I792044 B TWI792044 B TW I792044B TW 109128265 A TW109128265 A TW 109128265A TW 109128265 A TW109128265 A TW 109128265A TW I792044 B TWI792044 B TW I792044B
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light
light source
refraction
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optical detection
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TW202208824A (en
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楊永賢
楊世宇
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楊永賢
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Abstract

本發明係提供一種光源裝置包括至少一光源與一光折射導引塊。光折射導引塊設置於該光源與一取像區之間，並設置一光折射面，用以折射光源所產生之光線，所述之光折射面設置有複數折射槽。光線於折射後到達通過取像區，使得位於取像區之待測物表面的光強均勻度在50灰度級以內。本發明可使得待測物上的光線分佈均勻，利於進行影像擷取。The invention provides a light source device comprising at least one light source and a light refraction guide block. The light refraction guide block is arranged between the light source and an image-taking area, and a light refraction surface is provided for refracting the light generated by the light source. The light refraction surface is provided with multiple refraction grooves. The light reaches and passes through the imaging area after being refracted, so that the light intensity uniformity of the surface of the object under test located in the imaging area is within 50 gray levels. The invention can make the light distribution on the object to be tested uniform, which is beneficial to image capture.

Description

用於補助光學檢測裝置之光源裝置及其組成之光學檢驗裝置Light source device for auxiliary optical detection device and optical inspection device composed of the same

本發明係為一種用於輔助檢測時所需光線的光源裝置，尤指一種可以使待測區域具有均勻光線分佈的光源裝置以及其組成之光學檢驗裝置。The invention relates to a light source device used for assisting the light required in detection, especially a light source device capable of making the area to be tested have uniform light distribution and an optical inspection device composed of the light source device.

目前，光學檢驗技術大幅被運用於日常生活之中，例如：生物辨識、血液檢驗、文件掃描技術等，其主要方式在於將光線投射於待測物後，再進行待測物的影像擷取，將其影像進行分析以得到所需之資訊。At present, optical inspection technology is widely used in daily life, such as: biometrics, blood test, document scanning technology, etc. The main method is to project light on the object to be tested, and then capture the image of the object to be tested. Analyze the images to obtain the required information.

其中，光線投射於待測物時，於待測物上的光線分佈、強弱都會影響檢測結果，例如：光線太強或太弱都可能使影像擷取裝置受到待測物表面狀態(例如粗糙度、光滑度、顏色)而造成所擷取到的影像模糊，因此，如何營造合適的光線於待測物，係為目前於光學檢驗技術上極重要的一環。Among them, when the light is projected on the object to be tested, the distribution and strength of the light on the object to be tested will affect the detection result. , smoothness, color) will cause the captured image to be blurred. Therefore, how to create a suitable light for the object to be tested is an extremely important part of the current optical inspection technology.

為克服上述問題，本發明係提供一種光源裝置，其可控制位於取像區之待測物表面的光強均勻度，以使得後續影像擷取的效果能夠進行後續的辨識任務。In order to overcome the above problems, the present invention provides a light source device, which can control the light intensity uniformity of the surface of the object under test located in the imaging area, so that the effect of subsequent image capture can be used for subsequent identification tasks.

本發明之一種用於補助光學檢測裝置之光源裝置，其包括至少一光源與一光折射導引塊。所述之光源即用以產生光線，投射至待測物上。光折射導引塊設置於該光源與一取像區之間，並設置一光折射面，用以折射該光源所產生之光線，所述之光折射面設置有複數折射槽。光線於折射後通過取像區，使得位於取像區之待測物表面的光強均勻度在50灰度級以內。A light source device used to assist an optical detection device of the present invention includes at least one light source and a light refraction guide block. The light source is used to generate light, which is projected onto the object to be measured. The light refraction guide block is arranged between the light source and an image-taking area, and a light refraction surface is provided for refracting the light generated by the light source. The light refraction surface is provided with multiple refraction grooves. The light passes through the imaging area after refraction, so that the uniformity of light intensity on the surface of the object under test located in the imaging area is within 50 gray levels.

藉由本發明，可使得待測物上的光線分佈均勻，利於進行影像擷取，尤其是本發明之取像區不限於僅在一平面，可為在一限制距離區間內，可運用於非接觸式的取像方式，提升運用的便利性。With the present invention, the light distribution on the object to be measured can be made uniform, which is convenient for image capture. In particular, the imaging area of the present invention is not limited to only one plane, but can be within a limited distance interval, and can be applied to non-contact The traditional imaging method improves the convenience of use.

進者，該些折射槽之底面可為與光折射面平行或是具有一夾角。藉此可進一步引導光線均勻分佈於待測物。Furthermore, the bottom surfaces of the refraction grooves can be parallel to the light refraction surface or have an included angle. In this way, the light can be further guided to be evenly distributed on the object to be tested.

進者，本發明進一步設置一曝光輔助系統，其包括一待測物表面偵測單元與一運算單元。其中，待測物表面偵測單元用以偵測位於該取像區內的待測物表面之顏色深淺、粗糙或是光滑程度。運算單元依據該待測物表面偵測單元的數據進行運算判斷曝光時間，藉此增加控制之精密度。Furthermore, the present invention further provides an exposure assistance system, which includes a surface detection unit of the object to be tested and a computing unit. Wherein, the surface detection unit of the object to be measured is used for detecting the color depth, roughness or smoothness of the surface of the object to be measured located in the imaging area. The calculation unit calculates and judges the exposure time according to the data of the surface detection unit of the object to be measured, thereby increasing the control precision.

其中該曝光輔助系統進一步包括一增益單元，依據該待測物表面偵測單元的數據進行運算判斷該光源應增益或減低之數值；又，該曝光輔助系統與該光源的一光源控制器訊號連接。藉此可直接供光源控制器取得一調整用的參考數值。Wherein the exposure auxiliary system further includes a gain unit, which calculates and determines the value of the light source should be increased or decreased according to the data of the surface detection unit of the object under test; and, the exposure auxiliary system is connected to a light source controller of the light source for signal connection . In this way, the light source controller can directly obtain a reference value for adjustment.

本發明再提供一實施例，其依上述光源裝置組成之一種光學檢測裝置，其包括前述之光源裝置、一影像擷取裝置與一分析單元。該影像擷取裝置，用以擷取該取像區之待測物的影像；分析單元用以分析該影像擷取裝置所擷取之影像並據以產生一結果。The present invention further provides an embodiment, which is an optical detection device composed of the above-mentioned light source device, which includes the above-mentioned light source device, an image capture device and an analysis unit. The image capture device is used to capture the image of the object under test in the image capture area; the analysis unit is used to analyze the image captured by the image capture device and generate a result accordingly.

進一步包括一抗雜訊單元，用以去除因在待測區上的髒汙而造成該分析單元的誤判。It further includes an anti-noise unit, which is used to eliminate the misjudgment of the analysis unit caused by the dirt on the area to be tested.

本發明可克服習知技術的問題，使得待測物的表面光線均勻，其光強均勻度在50灰度級以內，利於擷取到合適進行分析的照片。The present invention can overcome the problems of the prior art, make the surface light of the object to be measured uniform, and the light intensity uniformity is within 50 gray levels, which is beneficial to capture suitable photos for analysis.

請配合第1圖所示，本實施例一種用於補助光學檢測裝置之光源裝置1，其可對待測物之表面產生均勻分佈之光照。本實施例之光源裝置1包括至少一光源10與一光折射導引塊20。Please refer to FIG. 1 , this embodiment is a light source device 1 used to supplement the optical detection device, which can generate uniformly distributed light on the surface of the object to be tested. The light source device 1 of this embodiment includes at least one light source 10 and a light refraction guide block 20 .

所述之光源10係用以產生光線，其可為白光、黃光、藍光、綠光或紅外光，所述之光線的顏色、頻率等特性可依待測物之種類特質進行選用。又，所述之待測物可為紙張或是具待辨識物的載體。The light source 10 is used to generate light, which can be white light, yellow light, blue light, green light or infrared light. The color, frequency and other characteristics of the light can be selected according to the type and characteristics of the object to be tested. In addition, the object to be detected can be paper or a carrier with the object to be identified.

再者，該光折射導引塊20設置於光源10之周圍或是行經路徑上，位於取像區30與該光源10之間，於光折射導引塊20上設置一光折射面21，該光折射面21用以折射該光源10所產生之光線，使得該些光線往待測物的方向行進。如第2圖示，其中，所述之光折射面21設置有複數折射槽211，藉由該些折射槽211的位置與角度，達到分配光線抵達待取像區30之效果。其中，折射槽211可配合光源10發出之光線抵達時的角度進行設置，即將該些折射槽211的底面2111或是側壁2112產生斜角或是採用塗料來增加或減少其光線折射後的強度。如第3圖所示，所述之取像區30為距離該光折射面之一預設距離的區間，並非為一固定高度。Furthermore, the light refraction guide block 20 is arranged around the light source 10 or on the traveling path, between the image taking area 30 and the light source 10, and a light refraction surface 21 is set on the light refraction guide block 20, the The light refraction surface 21 is used for refracting the light generated by the light source 10 so that the light travels toward the object to be measured. As shown in Figure 2, the light refraction surface 21 is provided with a plurality of refraction grooves 211, through the positions and angles of these refraction grooves 211, the effect of distributing the light to the area 30 to be imaged is achieved. Wherein, the refraction grooves 211 can be set according to the angle when the light from the light source 10 arrives, that is, the bottom surface 2111 or the side wall 2112 of the refraction grooves 211 can be beveled or paint can be used to increase or decrease the intensity of the refracted light. As shown in FIG. 3 , the image-taking area 30 is an interval of a preset distance from the light refraction surface, not a fixed height.

又，參閱第3圖，光線於折射後通過取像區30，使得位於取像區30之待測物表面的光強均勻度在50灰度級以內(即0至50灰度級)。所述之灰度級是指任一顏色光線亮度的明暗程度。 藉由控制光線在待測物表面的光強均勻度，可以使得取像後的結果易於分析，並減少誤判的產生。再者，現有自動光強調整機制，都是採用環境判斷機制，即將待測物周圍的光線納入測量，而非針對單一區域，故光線調整的結果易發生不合適的結果，不利於分析使用。Also, referring to FIG. 3 , the light passes through the imaging area 30 after refraction, so that the uniformity of light intensity on the surface of the object under test located in the imaging area 30 is within 50 gray levels (that is, 0 to 50 gray levels). The gray level refers to the degree of brightness of light of any color. By controlling the light intensity uniformity of the light on the surface of the object to be measured, the result after image capturing can be easily analyzed and the occurrence of misjudgment can be reduced. Furthermore, the existing automatic light intensity adjustment mechanism is based on the environment judgment mechanism, that is, the light around the object to be measured is included in the measurement instead of targeting a single area, so the light adjustment result is prone to inappropriate results, which is not conducive to analysis and use.

其中，配合第4圖所示，本實施例進一步設置一曝光輔助系統40，其包括：一待測物表面偵測單元41與一運算單元42。Wherein, as shown in FIG. 4 , this embodiment further provides an exposure assisting system 40 , which includes: a surface detection unit 41 and a computing unit 42 of the object under test.

待測物表面偵測單元41用以偵測位於該取像區內的待測物表面之顏色深淺、粗糙或是光滑程度。根據該些資訊據以產生對應的資訊數據，而可供該運算單元42進行運算判斷曝光時間，達到提供合適光強之光線之目的。其中，偵測待測物表面資訊的方式是先給予一固定強度光線，接著取得待測物表面光強及分佈狀況，再依此分佈狀況為一基準，再給予適當的光強使待測物上所呈現的光強落於預設範圍內或是預設值上，使取得的影像可用於後續的分析應用。The object surface detection unit 41 is used for detecting the color depth, roughness or smoothness of the surface of the object located in the imaging area. Corresponding information data is generated according to the information, which can be used by the calculation unit 42 to perform calculations to determine the exposure time, so as to achieve the purpose of providing light with a suitable light intensity. Among them, the way to detect the surface information of the object to be measured is to give a fixed intensity of light first, then obtain the light intensity and distribution on the surface of the object to be measured, and then use this distribution as a benchmark, and then give the appropriate light intensity to make the object to be measured The displayed light intensity falls within a preset range or on a preset value, so that the obtained image can be used for subsequent analysis applications.

該曝光輔助系統40進一步包括一增益單元43，增益單元43依據該待測物表面偵測單元41的數據進行運算判斷該光源應增益或減少之數值，並再供該運算單元42進行運算。該曝光輔助系統40與該光源的一光源控制器11訊號連接，藉以進行光源強弱之控制。The exposure assisting system 40 further includes a gain unit 43 , the gain unit 43 performs calculations based on the data of the object surface detection unit 41 to determine the value that the light source should gain or decrease, and then provides the calculation unit 42 for calculation. The exposure assisting system 40 is connected with a light source controller 11 of the light source for controlling the intensity of the light source.

經由本實施例可將待測物的表面產生均勻地光線分佈，使得影像擷取時的照片畫面具有一致性，利於影像分析使用。Through this embodiment, uniform light distribution can be generated on the surface of the object to be measured, so that the photo frames during image capture are consistent, which is beneficial for image analysis.

本發明實施例係再提供一種光學檢測裝置，如第5圖所示，其包括前述之光源裝置1、一影像擷取裝置C與一分析單元A。The embodiment of the present invention further provides an optical detection device, as shown in FIG. 5 , which includes the aforementioned light source device 1 , an image capture device C and an analysis unit A.

影像擷取裝置C用以擷取該取像區之待測物的影像。The image capturing device C is used to capture the image of the object under test in the imaging area.

分析單元A用以分析該影像擷取裝置C所擷取之影像並據以產生一結果。其中，利用光源裝置1的設置，可使得置於該取像區30內的待測物皆受到均勻穩定的光線照射。由於本創作之取像區30並不限於一固定距離，而是在一距離區間內，故其不僅具有可使待測物受到均勻光線照射的效果，亦利於快速地更換待測物，提升檢測效率。The analyzing unit A is used for analyzing the image captured by the image capturing device C and generating a result accordingly. Wherein, by using the arrangement of the light source device 1 , the object to be tested placed in the imaging area 30 can be irradiated by uniform and stable light. Since the imaging area 30 of this invention is not limited to a fixed distance, but within a distance interval, it not only has the effect of allowing the object under test to be irradiated with uniform light, but also facilitates rapid replacement of the object under test and improves detection. efficiency.

進者，該分析單元A可再包括一抗雜訊單元，用以去除因待測物上的髒汙所造成該分析單元的誤判。所述之抗雜訊單元可為一具學習功能之演算法，使其判斷雜訊的機制可隨著狀況累積。Furthermore, the analysis unit A may further include an anti-noise unit for eliminating misjudgment by the analysis unit caused by the dirt on the test object. The anti-noise unit can be an algorithm with a learning function, so that its mechanism for judging noise can accumulate with the situation.

本實施例可運用於手寫文字或符號之辨識設備、考試或樂透等設計過之固定位置之選號單之辨識設備、選舉投票之選票辨識設備、動物相關之細菌或病毒檢測、寵物相關之細菌或病毒檢測、人類各種過敏原、基因、細菌或疾病檢測之生物醫療檢之測試紙或試劑等具有化學變化反應之辨識載體，亦或是食品相關之細菌或病毒檢測之檢測試紙、試劑等具有化學變化反應之辨識載體。土壤、液體、氣體之細菌、病菌或酸鹼值成分含量檢測等具有化學變化反應之辨識載體亦可為本發明實施例所運用之領域。而一般文件影印功能、放大鏡或是顯微鏡功能亦為本發明所運用之範疇。This embodiment can be applied to recognition equipment for handwritten characters or symbols, identification equipment for fixed-position selection lists designed for exams or lotto, ballot identification equipment for election voting, animal-related bacteria or virus detection, and pet-related bacteria Or virus detection, biomedical test paper or reagents for various human allergens, genes, bacteria or disease detection, etc. have chemical change reaction identification carriers, or food-related bacteria or virus detection test papers, reagents, etc. Identification carrier of chemical change reaction. Identification carriers with chemical change reactions such as bacteria, germs, or pH value component content detection of soil, liquid, and gas can also be used in the fields of the embodiments of the present invention. The general document photocopying function, magnifying glass or microscope function are also the scope of application of the present invention.

惟以上所述僅為本發明之較佳實施例，非意欲侷限本發明的專利保護範圍，故舉凡運用本發明說明書及圖式內容所為的等效變化，均同理皆包含於本發明的權利保護範圍內，合予陳明。However, the above description is only a preferred embodiment of the present invention, and is not intended to limit the scope of patent protection of the present invention. Therefore, all equivalent changes made by using the description and drawings of the present invention are equally included in the rights of the present invention. Within the scope of protection, I agree with Chen Ming.

1:光源裝置 10:光源 11:光源控制器 20:光折射導引塊 21:光折射面 211:折射槽 2111:底面 2112:側壁 30:取像區 40:曝光輔助系統 41:待測物表面偵測單元 42:運算單元 43:增益單元 C:影像擷取裝置 A:分析單元1: Light source device 10: light source 11: Light source controller 20: Light refraction guide block 21: light refraction surface 211: Refraction groove 2111: Bottom 2112: side wall 30: imaging area 40: Exposure Assist System 41: Surface detection unit of the object to be tested 42: Operation unit 43: Gain unit C: Image capture device A: Analysis unit

第1圖為本發明實施例之裝置方塊示意圖。 第2圖為本發明實施例之光折射面之剖面示意圖。 第3圖為本發明實施例之取像區的位置示意圖。 第4圖為依本發明實施例所製成之曝光輔助系統示意圖。 第5圖為依本發明實施例所製成之光學檢測裝置示意圖。Figure 1 is a schematic block diagram of a device according to an embodiment of the present invention. Fig. 2 is a schematic cross-sectional view of the light refracting surface of the embodiment of the present invention. Fig. 3 is a schematic diagram of the position of the imaging area of the embodiment of the present invention. Fig. 4 is a schematic diagram of an exposure assistance system made according to an embodiment of the present invention. Fig. 5 is a schematic diagram of an optical detection device manufactured according to an embodiment of the present invention.

10:光源10: light source

20:光折射導引塊20: Light refraction guide block

21:光折射面21: light refraction surface

Claims (6)

一種用於補助光學檢測裝置之光源裝置，其包括：至少二光源，用以產生光線；以及，一光折射導引塊，設置於該光源與一取像區之間，並設置有一平面及一光折射面，光線穿透該平面後，該光折射面用以折射該光源所產生之光線，所述之光折射面設置有複數折射槽，該平面鄰近該光源，而該光折射面遠離該光源；光線於折射後通過該取像區，使得位於該取像區之待測物表面的光強均勻度在50灰度級以內。 A light source device for assisting an optical detection device, comprising: at least two light sources for generating light; A light refraction surface, after the light passes through the plane, the light refraction surface is used to refract the light generated by the light source, the light refraction surface is provided with a plurality of refraction grooves, the plane is adjacent to the light source, and the light refraction surface is far away from the light source Light source: light passes through the imaging area after refraction, so that the light intensity uniformity of the surface of the object to be measured located in the imaging area is within 50 gray levels. 如請求項1所述之用於補助光學檢測裝置之光源裝置，其中該些折射槽之底面可為與光折射面平行或是具有一夾角。 According to claim 1, the light source device used to supplement the optical detection device, wherein the bottom surfaces of the refraction grooves can be parallel to the light refraction surface or have an included angle. 如請求項1所述之用於補助光學檢測裝置之光源裝置，其中進一步設置一曝光輔助系統，其包括：一待測物表面偵測單元，用以偵測位於該取像區內的待測物表面之顏色深淺、粗糙或是光滑程度；一運算單元，依據該待測物表面偵測單元的數據進行運算判斷曝光時間。 The light source device used to assist the optical detection device as described in claim 1, wherein an exposure assistance system is further provided, which includes: a surface detection unit of the object to be measured, which is used to detect the object to be measured located in the imaging area The color depth, roughness or smoothness of the surface of the object; a computing unit, which calculates and judges the exposure time according to the data of the detection unit on the surface of the object to be measured. 如請求項3所述之用於補助光學檢測裝置之光源裝置，其中該曝光輔助系統進一步包括一增益單元，依據該待測物表面偵測單元的數據進行運算判斷該光源應增益或減少之數值；又，該曝光輔助系統與該光源的一光源控制器訊號連接。 The light source device used to assist the optical detection device as described in claim 3, wherein the exposure assistance system further includes a gain unit, which is used to calculate and determine the value of the light source that should be increased or decreased based on the data of the object surface detection unit ; Also, the exposure assistance system is connected to a light source controller signal of the light source. 一種光學檢測裝置，其包括：一如請求項1至4任一項所述之光源裝置；一影像擷取裝置，用以擷取該取像區之待測物的影像；一分析單元，用以分析該影像擷取裝置所擷取之影像並據以產生一結果。 An optical detection device, which includes: a light source device as described in any one of claims 1 to 4; an image capture device, used to capture the image of the object under test in the image capture area; an analysis unit, used The image captured by the image capture device is analyzed to generate a result. 如請求項5所述之光學檢測裝置，其中進一步包括一抗雜訊單 元，用以去除因在待測區上的髒汙而造成該分析單元的誤判。 The optical detection device as described in claim 5, which further includes an anti-noise unit The unit is used to remove the misjudgment of the analysis unit caused by the dirt on the area to be tested.
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Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014135118A (en) * 2011-04-28 2014-07-24 Sharp Corp Lighting device
TWM526654U (en) * 2016-04-01 2016-08-01 冠大股份有限公司 Projection lamp structure with light distribution curve of bat wings
TW202016587A (en) * 2018-10-16 2020-05-01 日商東麗工程股份有限公司 Illumination device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014135118A (en) * 2011-04-28 2014-07-24 Sharp Corp Lighting device
TWM526654U (en) * 2016-04-01 2016-08-01 冠大股份有限公司 Projection lamp structure with light distribution curve of bat wings
TW202016587A (en) * 2018-10-16 2020-05-01 日商東麗工程股份有限公司 Illumination device

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