TWI764670B - Electronic parts inspection equipment - Google Patents

Electronic parts inspection equipment

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Publication number
TWI764670B
TWI764670B TW110113268A TW110113268A TWI764670B TW I764670 B TWI764670 B TW I764670B TW 110113268 A TW110113268 A TW 110113268A TW 110113268 A TW110113268 A TW 110113268A TW I764670 B TWI764670 B TW I764670B
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Taiwan
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station
turntable
conveying
inspection
unit
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TW110113268A
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Chinese (zh)
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TW202239689A (en
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林東緯
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奧多馬特科技有限公司
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Priority to TW110113268A priority Critical patent/TWI764670B/en
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Publication of TWI764670B publication Critical patent/TWI764670B/en
Publication of TW202239689A publication Critical patent/TW202239689A/en

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  • Testing Of Individual Semiconductor Devices (AREA)
  • Specific Conveyance Elements (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

The invention relates to an electronic parts detection equipment, which comprises: a table; a pair of conveying mechanisms arranged on the table, which are used to move a group of platforms in the conveying path; each platform group is provided with a plurality of turntables, and the turntable is provided with a suction cup which can rotate horizontally; a plurality of operation platforms, including a feeding station, a plurality of detection stations and a material transfer station; a plurality of detection devices are arranged at the detection station; and a processing unit, which is used to detect the electronic parts When moving to the transfer station, the electronic parts are automatically removed, and then the platform group is lowered to the low level and moved back to the other side of another platform group along the regression path, and then it is raised to the high level and arranged adjacent to the other platform group head and tail.

Description

電子零件檢測設備 Electronic parts testing equipment

本發明為一種電子零件檢測設備,特別是有關於一種結合逐個轉台傳輸、檢測及批次預置多個轉台的輸送機構和在檢測時進行四面、二面或一面取像檢測的電子零件檢測設備。 The invention relates to an electronic parts testing device, in particular to a conveying mechanism that combines the transmission, testing and batch presetting of a plurality of turntables one by one, and an electronic part testing device that performs four-sided, two-sided or one-sided image detection during testing .

常見的電子零件例如有電阻、電容與電感,而在大部分之電子零件中,由於電容具有正負極,且電容之正負極若接反會造成電容過熱而***,因此電容在製造生產時需更加謹慎。在現有的電容檢測製程中,例如台灣發明專利第TWM607715公告號所公開之一種電容檢測設備,其係先透過一轉盤之轉動來帶動電容依序進行分腳、整腳、腳長檢測與轉向等整理作業,然後再將經過整理之電容移送至另一工作站來進行外觀檢測與電性測試。惟此種檢測結構係採用轉盤工作站專司電容針腳的檢側,其他項目,如外觀是否破裂、打印字體是否清晰、字體走向是否正確、外殼是否沾膠等,則需要移送至其他工作站,而無法由原來的轉盤結構加以擴充。 Common electronic parts include resistors, capacitors and inductors. In most electronic parts, since the capacitor has positive and negative electrodes, and if the positive and negative electrodes of the capacitor are reversed, the capacitor will overheat and explode, so the capacitor needs to be more cautious. In the existing capacitance detection process, such as a capacitance detection device disclosed in Taiwan Invention Patent No. TWM607715, the capacitance is firstly driven by the rotation of a turntable to perform foot separation, foot adjustment, foot length detection and steering in sequence, etc. After finishing the work, move the sorted capacitors to another workstation for appearance inspection and electrical testing. However, this kind of inspection structure uses the turntable workstation to inspect the side of the capacitor pins. Other items, such as whether the appearance is broken, whether the printed font is clear, whether the font direction is correct, whether the shell is glued, etc., need to be transferred to other workstations, and cannot be used. Expanded from the original turntable structure.

本發明的目的在於提供一種電子零件檢測設備,直接於輸送路徑沿線設置多個不同項目的檢測站,並使電子零件逐一停靠在多個檢測站,並在多個檢測站同時進行其檢測作業。 The purpose of the present invention is to provide an electronic parts inspection equipment, which directly sets up a plurality of inspection stations of different items along the conveying path, makes the electronic parts stop at the plurality of inspection stations one by one, and performs their inspection operations at the plurality of inspection stations simultaneously.

為達成上述目的,本發明提供一種電子零件檢測設備,包含:一機台;一對輸送機構,係設置於該機台上,每對輸送機構分別具有一水平暨垂直移動裝置,用以將一設置於其上的載台組垂直移動至一高位高度或一低位高度,以及沿著一輸送路徑或回歸路徑水平移動該載台組,每一載台組具有沿著該輸送路徑的一輸送方向依序串列設置的多個轉台,每個轉台具有一吸盤,可透過一氣體壓力控制產生吸附力或撤除吸力,該轉台並可根據一控制信號進行相對於該載台組的水平轉向與轉動角度的驅動;多個作業站台,係設置於該輸送路徑上,該些作業站台包括朝向該輸送方向依序設置的一入料站、多個檢測站及一移料站;多組檢測裝置,係對應配置於該些檢測站,每組檢測站至少包括一取像單元及一照明單元;以及一處理單元,係電性連接該對輸送機構與該些檢測裝置,用以控制該對輸送機構之該對載台組串連排列地在該高位高度之該輸送路徑移動,並使每個轉台依序停在該入料站、每一檢測站及該移料站,以使該轉台於該入料站時,以該吸盤吸住輸入之待檢測之該電子零件,並在使該電子零件依序移至該些檢測站時,控制該些檢測裝置進行檢測,且移至該移料站時,將該電子零件自該吸盤移除,並在該載台組最後一個轉台移除該電子零件後,使該載台組降至該低位高度,並沿著該回歸路徑逆向該輸送方向移動至另一載台組的另一側後,再升至高位高度而使該載台組之第一個轉台與該另一載台組的最末個轉台鄰接排列。 In order to achieve the above object, the present invention provides an electronic parts testing equipment, comprising: a machine; a pair of conveying mechanisms are arranged on the machine, and each pair of conveying mechanisms respectively has a horizontal and vertical moving device for moving a The carrier group disposed thereon is vertically moved to a high level or a low level, and the carrier group is moved horizontally along a conveying path or return path, each carrier group having a conveying direction along the conveying path A plurality of turntables arranged in series, each turntable has a suction cup, which can generate suction force or remove suction force through a gas pressure control, and the turntable can perform horizontal steering and rotation relative to the carrier group according to a control signal angle drive; a plurality of operation stations are arranged on the conveying path, and the operation stations include a feeding station, a plurality of detection stations and a moving station arranged in sequence towards the conveying direction; a plurality of groups of detection devices, Correspondingly arranged at the detection stations, each group of detection stations includes at least an image capturing unit and an illumination unit; and a processing unit, which is electrically connected to the pair of conveying mechanisms and the detection devices for controlling the pair of conveying mechanisms The pair of carrier groups are arranged in series to move on the conveying path of the high height, and each turntable is stopped at the feeding station, each detection station and the moving station in sequence, so that the turntable is in the When entering the material station, the suction cup is used to suck the input electronic component to be tested, and when the electronic component is moved to the detection stations in sequence, the detection devices are controlled for detection, and then moved to the moving station When the electronic part is removed from the suction cup, and after the electronic part is removed from the last turntable of the carrier group, the carrier group is lowered to the low height and moved along the return path against the conveying direction After reaching the other side of the other carrier group, the height is raised again to make the first turntable of the carrier group adjacent to the last turntable of the other carrier group.

在一些實施方案中,該水平暨垂直移動裝置包括:一第一水平輸送單元,用以使一設置於該第一水平輸送單元的第一升降單元沿著該輸送路徑或該回歸路徑移動,該第一升降單元具有可相對於該第一升降單 元上下移動於該高位高度與該低位高度的一第一載台組,該第一載台組具有沿著該輸送路徑或該回歸路徑方向依序串列設置的多個該些轉台;以及一第二水平輸送單元,用以使一設置於該第二水平輸送單元的第二升降單元沿著該輸送路徑或該回歸路徑移動,該第二升降單元具有可相對於該第二升降單元上下移動於該高位高度與該低位高度的一第二載台組,該第二載台組具有沿著該輸送路徑或該回歸路徑方向依序串列設置的多個該些轉台。 In some implementations, the horizontal and vertical moving device includes: a first horizontal conveying unit for moving a first lifting unit disposed on the first horizontal conveying unit along the conveying path or the return path, the The first lifting unit has a a first stage group that moves up and down on the high level and the low level, the first stage group has a plurality of the turntables arranged in series along the conveying path or the return path direction; and a The second horizontal conveying unit is used to move a second lifting unit disposed on the second horizontal conveying unit along the conveying path or the return path, and the second lifting unit is capable of moving up and down relative to the second lifting unit In a second stage group at the high level and the low level, the second stage group has a plurality of the turntables arranged in series along the conveying path or the direction of the return path.

在一些實施方案中,該轉台之該吸盤之一中心軸係樞接一步進馬達轉軸,藉由驅動該步進馬達轉軸的轉動圈數而控制該吸盤的水平轉動方向及角度。 In some implementations, a central shaft of the suction cup of the turntable is pivotally connected to a rotating shaft of a stepper motor, and the horizontal rotation direction and angle of the suction cup are controlled by driving the rotation of the rotating shaft of the stepping motor.

在一些實施方案中,每一載台組的轉台數與該些檢測站之站數相同。 In some implementations, the number of turntables for each carrier group is the same as the number of stations for the detection stations.

在一些實施方案中,該電子零件的檢測項目包含殼體結構、字碼打印方向及表面裂痕、針腳結構、底材結構、氣泡孔、殼體沾膠以及針腳沾膠。 In some embodiments, the inspection items of the electronic part include shell structure, character printing direction and surface cracks, stitch structure, substrate structure, bubble holes, shell glue and pin glue.

在一些實施方案中,每一載台組的真空轉台數為五個,該些檢測站依該輸送路徑包括一第一站、一第二站、一第三站、一第四站及一第五站,該第一站係自側面取像檢測該該電子零件殼體結構是否有破裂,該第二站係自側面取像檢測該電子零件四面之字碼打印方向及表面裂痕,該第三站係自側面取像檢測該電子零件針腳結構、自上面取像檢測該電子零件底材是否外露、自上面取像檢測該電子零件氣泡孔,該第四站係自側面取像檢測該電子零件四面殼體沾膠狀態,該第五站係自側面取像檢測該 電子零件兩面的針腳沾膠狀態。 In some embodiments, the number of vacuum turntables in each carrier group is five, and the inspection stations include a first station, a second station, a third station, a fourth station and a first station according to the conveying path Five stations. The first station is to take images from the side to detect whether the shell structure of the electronic part is broken. The second station is to take images from the side to detect the printing direction and surface cracks of the four sides of the electronic component. The third station It is to take an image from the side to detect the pin structure of the electronic part, to take an image from the top to detect whether the substrate of the electronic part is exposed, and to take an image from the top to detect the bubble hole of the electronic part. The fourth station is to take an image from the side to detect the four sides of the electronic part. The shell is in the glued state, the fifth station is to take images from the side to detect the The glued state of the pins on both sides of the electronic part.

在一些實施方案中,該檢測站之該第一站係於該輸送路徑的該轉台之左、右側分別設置一面向該轉台上之該電子零件取像的灰階取像單元及一照明單元。 In some implementations, the first station of the inspection station is disposed on the left and right sides of the turntable in the conveying path, respectively, with a grayscale image capturing unit and an illumination unit facing the electronic components on the turntable.

在一些實施方案中,該檢測站之該第三站係於該輸送路徑的該轉台之左、右兩側分別設置一面向該電子零件取像的灰階取像單元和一背光單元,並於該轉台之上方設置一面向該電子零件取像的彩色取像單元、一面向該電子零件照射的高亮度同軸燈源及一面向該電子零件照射的環型光源。 In some implementations, the third station of the inspection station is disposed on the left and right sides of the turntable of the conveying path, respectively, with a gray-scale image capturing unit and a backlight unit facing the electronic part for capturing images, and at the Above the turntable, a color imaging unit for capturing images of the electronic components, a high-brightness coaxial light source for illuminating the electronic components, and a ring light source for illuminating the electronic components are arranged.

本發明的至少具有下列特點:本發明應用直線的輸送路徑上依序設置的多個檢測站及其對應的檢測裝置,進行逐個送料與利用整排的轉台在不同高度的移動路徑進行批次移動承接待測電子零件的銜接作業,以達到連續不間斷地承載待檢測的電子零件並依序輸送到檢測站進行檢驗、檢驗完後自轉台移除等作業,較習知之圓型轉盤週邊設置檢測站的方式,本發明可更彈性地、方便地擴充檢測站數量。 The present invention has at least the following characteristics: the present invention uses a plurality of detection stations and their corresponding detection devices arranged in sequence on a straight conveying path to perform one-by-one feeding and use the entire row of turntables to move in batches at different heights. Undertake the connection operation of the electronic parts to be tested, so as to continuously carry the electronic parts to be tested and sequentially transport them to the testing station for inspection, remove the self-turntable after the inspection, etc., compared with the conventional circular turntable. The present invention can expand the number of detection stations more flexibly and conveniently.

1:電子零件檢測設備 1: Electronic parts testing equipment

2:機台 2: Machine

3:輸送機構 3: Conveying mechanism

31:水平暨垂直移動裝置 31: Horizontal and vertical movement device

311:第一水平輸送單元 311: The first horizontal conveying unit

3111:第一升降單元 3111: First lift unit

312:第二水平輸送單元 312: Second horizontal conveying unit

3121:第二升降單元 3121: Second lift unit

32:載台組 32: Stage group

321:第一載台組 321: The first stage group

322:第二載台組 322: Second stage group

33,33’:轉台 33,33': turntable

331,331a,331b,331c,331d,331e:第一轉台 331, 331a, 331b, 331c, 331d, 331e: First turntable

332,332a,332b,332c,332d,332e:第二轉台 332, 332a, 332b, 332c, 332d, 332e: Second turntable

34,34’:吸盤 34,34': Sucker

341:空氣通道 341: Air channel

35:步進馬達轉軸 35: Stepper motor shaft

4:作業站台 4: Work station

41:入料站 41: Feeding station

42:檢測站 42: Inspection Station

42A:第一檢測站 42A: First Inspection Station

42B:第二檢測站 42B: Second Inspection Station

42C:第三檢測站 42C: The third inspection station

42D:第四檢測站 42D: Fourth Inspection Station

42E:第五檢測站 42E: Fifth Inspection Station

43:移料站 43: Transfer station

5:檢測裝置 5: Detection device

51:取像單元 51: Acquisition unit

511:彩色取像單元 511: Color acquisition unit

512:灰階取像單元 512: Grayscale image acquisition unit

52:照明單元 52: Lighting unit

53:背光單元 53: Backlight unit

54:高亮度同軸燈源 54: High brightness coaxial light source

55:環型光源 55: Ring light source

6:處理單元 6: Processing unit

C:電子零件 C: Electronic parts

C1:殼體 C1: Shell

C2:針腳 C2: Pin

T1:輸送路徑 T1: conveying path

T2:回歸路徑 T2: return path

W1:輸送方向 W1: conveying direction

W2:回歸方向 W2: return direction

[圖1]為本發明一實施例之電子零件檢測設備的立體示意圖;[圖2]為本發明一實施例之輸送機構的另一角度的立體示意圖;[圖3]為圖2的前視圖;[圖4]為圖2的側視圖;[圖5]為本發明一實施例之輸送機構的載台組與其轉台的立體分解圖;[圖6a]為本發明一實施例之輸送機構的轉台的剖面圖;[圖6b]為本發明另一實施例之輸送機構的轉台的剖面圖;[圖7a~圖7e]為本發明一實施例之輸送機構的載台組輸送作動示意圖;[圖8]為本發明一實施例之輸送機構的第一檢測站的檢測裝置配置示意圖;[圖9]為本發明一實施例之輸送機構的第三檢測站的檢測裝置配置示意圖。 [ Fig. 1 ] is a schematic perspective view of an electronic component testing device according to an embodiment of the present invention; [ Fig. 2 ] is a perspective schematic view of another angle of the conveying mechanism according to an embodiment of the present invention; [ Fig. 3 ] is a front view of Fig. 2 ; [Fig. 4] is a side view of Fig. 2; [Fig. 5] is an exploded perspective view of the carrier group and its turntable of the conveying mechanism of an embodiment of the present invention; [Fig. 6a] is an embodiment of the conveying mechanism of the present invention. A cross-sectional view of the turntable; [Fig. 6b] is a cross-sectional view of a turntable of a conveying mechanism according to another embodiment of the present invention; [Fig. 7a~Fig. 7e] are schematic views of the conveying action of the carrier group of the conveying mechanism according to an embodiment of the present invention; [Fig. FIG. 8 is a schematic diagram of the configuration of the detection device of the first detection station of the conveying mechanism according to an embodiment of the present invention; FIG. 9 is a schematic diagram of the configuration of the detection device of the third detection station of the conveying mechanism according to an embodiment of the present invention.

[圖10]為本發明一實施例之系統架構圖。 FIG. 10 is a system architecture diagram of an embodiment of the present invention.

茲配合圖式將本發明實施例詳細說明如下,其所附圖式主要為簡化之示意圖,僅以示意方式說明本發明之基本結構,因此在該等圖式中僅標示與本發明有關之元件,且所顯示之元件並非以實施時之數目、形狀、尺寸比例等加以繪製,其實際實施時之規格尺寸實為一種選擇性之設計,且其元件佈局形態有可能更為複雜。 Hereinafter, the embodiments of the present invention will be described in detail in conjunction with the drawings. The accompanying drawings are mainly simplified schematic diagrams, and only illustrate the basic structure of the present invention in a schematic manner. Therefore, only the elements related to the present invention are indicated in these drawings. , and the displayed components are not drawn according to the number, shape, size ratio, etc. of the actual implementation. The size of the actual implementation is actually a selective design, and the layout of the components may be more complicated.

以下各實施例的說明是參考附加的圖式,用以例示本發明可據以實施的特定實施例。本發明所提到的方向用語,例如「上」、「下」、「前」、「後」、「左」、「右」、「內」、「外」、「側面」等,僅是參考附加圖式的方向。因此,使用的方向用語是用以說明及理解本申請,而非用以限制本申請。另外,在說明書中,除非明確地描述為相反的,否則詞語“包括”將被理解為意指包括所述元件,但是不排除任何其它元件。 The following descriptions of the various embodiments refer to the accompanying drawings to illustrate specific embodiments in accordance with which the invention may be practiced. The directional terms mentioned in the present invention, such as "up", "down", "front", "rear", "left", "right", "inside", "outside", "side", etc., are only for reference Additional schema orientation. Therefore, the directional terms used are used to describe and understand the present application, rather than to limit the present application. Additionally, in the specification, unless explicitly described to the contrary, the word "comprising" will be understood to mean the inclusion of stated elements but not the exclusion of any other elements.

請參照圖1至圖6b所示。本實施例之電子零件檢測設備1,包含:一機台2、一對輸送機構3、多個作業站台4、多組檢測裝置5以及處理單元6。該機台2提供各構件建置的基礎;該對輸送機構3,係設置在機台2上,每對輸送機構3分別具有一水平暨垂直移動裝置31,用以將一 設置於其上的載台組32垂直移動至一高位高度或一低位高度,以及沿著一輸送路徑T1或一回歸路徑T2水平移動該載台組32,每一載台組32具有沿著該輸送路徑T1的輸送方向W1依序串列設置的多個轉台33,每個轉台具有一吸盤34,以便吸附待測的電子零件C,實務上該吸盤34可選用電磁力吸附型式,例如以導電陶瓷製成,並應用通電後產生磁場吸附力抓住該電子零件C、斷電後解除歡電子零件C的吸附力,如圖6a所示;或者是該吸盤34’可透過一氣體控制而產生對電子零件C的吸附力或釋放吸力,如圖6b所示,該轉台33’並可根據一控制信號進行相對於該載台組32的水平轉向與轉動角度的驅動,如圖5所示。如圖7a所示,該些多個作業站台4係設置在該輸送路徑T1上,該些作業站台4具有朝向該輸送方向W1依序設置的一入料站41、多個檢測站42及一移料站43。如圖8及圖9所示,該多組檢測裝置5,係對應配置於該些作業站台4的該些檢測站42,每個檢測站42至少包括一取像單元51及一照明單元52。 Please refer to FIG. 1 to FIG. 6b. The electronic component testing apparatus 1 of this embodiment includes: a machine 2 , a pair of conveying mechanisms 3 , a plurality of work stations 4 , a plurality of sets of testing devices 5 and a processing unit 6 . The machine table 2 provides the basis for the construction of each component; the pair of conveying mechanisms 3 are arranged on the machine table 2, and each pair of conveying mechanisms 3 respectively has a horizontal and vertical moving device 31 for moving a The stage group 32 disposed thereon moves vertically to a high level or a low level, and moves the stage group 32 horizontally along a conveying path T1 or a return path T2, and each stage group 32 has a A plurality of turntables 33 are arranged in series in the conveying direction W1 of the conveying path T1. Each turntable has a suction cup 34 to absorb the electronic component C to be tested. It is made of ceramics, and the magnetic field adsorption force is applied to grasp the electronic part C after being energized, and the adsorption force of the electronic part C is released after power off, as shown in Figure 6a; or the suction cup 34' can be controlled by a gas to generate As shown in FIG. 6 b , the turntable 33 ′ can drive the horizontal steering and rotation angle relative to the stage group 32 according to a control signal, as shown in FIG. 5 . As shown in FIG. 7a , the plurality of operation stations 4 are disposed on the conveying path T1, and the operation stations 4 have a feeding station 41, a plurality of detection stations 42 and a feeding station 41 arranged in sequence toward the conveying direction W1. Transfer station 43. As shown in FIG. 8 and FIG. 9 , the plurality of sets of detection devices 5 are correspondingly disposed on the detection stations 42 of the operation stations 4 , and each detection station 42 at least includes an imaging unit 51 and an illumination unit 52 .

詳細而言,如圖7a至圖7e所示。該一處理單元6例如一微控制器(MCU),係電性連接該對輸送機構3與該些檢測裝置5,用以控制該對輸送機構3之該對載台組32串連排列地在該高位高度之該輸送路徑T1移動,並使每個轉台33依序停在該入料站41、每一檢測站42及該移料站43,以使該轉台33於該入料站41時,以該吸盤331吸住輸入之待檢測之該電子零件C,並在使該電子零件C依序移至該些檢測站42時,控制該些檢測裝置5進行檢測,且移至該移料站43時,將該電子零件C自該吸盤331移除,並在該載台組32最後一個轉台33移除該電子零件C後,使該載台組32,如第二載台組322降至該低位高度,並沿著該回歸路徑T2逆向該輸 送方向W1移動至另一載台組32(如第一載台組321)的相對之另一側後,再升至高位高度而使該載台組(第二載台組322)之第一個轉台33(如第二轉台332a)與該另一載台組(如第一載台組321)的最末個轉台(如第一轉台331e)鄰接排列,再使該第一載台組321與該第二載台組322同步朝著輸送方向W1進行輸送。 In detail, as shown in Figs. 7a to 7e. The processing unit 6, such as a microcontroller (MCU), is electrically connected to the pair of conveying mechanisms 3 and the detection devices 5 to control the pair of stage groups 32 of the pair of conveying mechanisms 3 to be arranged in series in The conveying path T1 of the high height moves, and each turntable 33 stops at the feeding station 41 , each detection station 42 and the feeding station 43 in sequence, so that the turntable 33 stops at the feeding station 41 when the turntable 33 is in the feeding station 41 , the sucker 331 is used to suck the inputted electronic component C to be tested, and when the electronic component C is moved to the testing stations 42 in sequence, the testing devices 5 are controlled for testing, and moved to the moving material When standing at 43, the electronic component C is removed from the suction cup 331, and after the electronic component C is removed from the last turntable 33 of the carrier group 32, the carrier group 32, such as the second carrier group 322, is lowered. to the low level and reverse the output along the return path T2 After moving to the opposite side of another stage group 32 (such as the first stage group 321 ) in the feeding direction W1, it is then raised to a high height to make the first stage of the stage group (the second stage group 322 ) the first Each turntable 33 (eg, the second turntable 332a ) is adjacent to the last turntable (eg, the first turntable 331e ) of the other stage group (eg, the first stage set 321 ), and then the first stage set 321 The conveyance is carried out in the conveyance direction W1 in synchronization with the second stage group 322 .

具體而言,如圖2至圖3、圖7a至7e及圖10所示,前述實施例之該水平暨垂直移動裝置31包括:一第一水平輸送單元311、一第一升降單元3111、一第一載台組321、多個第一轉台331(331a,331b,331c,331d,331e)以及設置在該些第一轉台331上的吸盤34。本實施例中,該第一載台組321上具有五個排成一列的第一轉台331(331a,331b,331c,331d,331e),該第一載台組321設置於該第一升降單元3111(的升降滑塊)上,以便於在該高位高度或該低位高度之間升降,該第一升降單元3111再設置於該第一水平輸送單元311(的平移滑塊)上,以便使第一升降單元3111沿著該高位高度的該輸送路徑T1或該低位高度的該回歸路徑T2移動;以及該水平暨垂直移動裝置31也包括:一第二水平輸送單元312、一第二升降單元3121、一第二載台組322、多個第二轉台332(332a,332b,332c,332d,332e)以及設置在該些第二轉台332上的吸盤34。本實施例中,該第二載台組322上同樣具有五個排成一列的第二轉台332(332a,332b,332c,332d,332e),該第二載台組322架設於該第二升降單元3121(的升降滑塊)上,以便於在該高位高度或該低位高度之間升降,該第二升降單元3121再設置於該第二水平輸送單元312(的平移滑塊)上,以便使第二升降單元3121沿著該高位高度的該輸送路徑T1或該低位高度的該回歸路徑T2移動。 Specifically, as shown in FIG. 2 to FIG. 3 , FIGS. 7 a to 7 e and FIG. 10 , the horizontal and vertical moving device 31 of the foregoing embodiment includes: a first horizontal conveying unit 311 , a first lifting unit 3111 , a The first stage group 321 , a plurality of first turntables 331 ( 331 a , 331 b , 331 c , 331 d , 331 e ), and the suction cups 34 provided on the first turntables 331 . In this embodiment, the first stage set 321 has five first turntables 331 (331a, 331b, 331c, 331d, 331e) arranged in a row, and the first stage set 321 is disposed on the first lifting unit The first lifting unit 3111 is then installed on the first horizontal conveying unit 311 (the translation slider) to make the first lifting unit 3111 A lifting unit 3111 moves along the conveying path T1 of the high height or the return path T2 of the low height; and the horizontal and vertical moving device 31 also includes: a second horizontal conveying unit 312, a second lifting unit 3121 , a second stage group 322 , a plurality of second turntables 332 ( 332a , 332b , 332c , 332d , 332e ) and the suction cups 34 arranged on the second turntables 332 . In this embodiment, the second stage set 322 also has five second turntables 332 (332a, 332b, 332c, 332d, 332e) arranged in a row, and the second stage set 322 is erected on the second lift The second lifting unit 3121 is then installed on the second horizontal conveying unit 312 (the translation slider) to make The second lifting unit 3121 moves along the conveying path T1 of the high height or the return path T2 of the low height.

上述該轉台33的電磁式吸盤34係;若為真空式吸盤34內部具有一空氣通道341,用以連接一氣泵控制裝置(未圖式),藉由該氣體控制裝置的吸放空氣而使吸盤342盤面吸住或釋放電子零件C(當然,該吸盤342的吸附面積需匹配適用於該電子零件C的接觸面積),且該轉台33之一中心軸係樞接一步進馬達轉軸35,藉由處理單元6發出該控制信號驅動該步進馬達轉軸35的轉動圈數而控制該吸盤34的水平轉動方向及角度。 The electromagnetic suction cup 34 of the turntable 33 is described above; if it is a vacuum suction cup 34, there is an air channel 341 inside, which is used to connect an air pump control device (not shown), and the suction cup is made to suck and release air by the air control device. The surface of the 342 plate sucks or releases the electronic part C (of course, the suction area of the suction cup 342 needs to match the contact area suitable for the electronic part C), and a central shaft of the turntable 33 is pivotally connected to the step motor rotating shaft 35 by The processing unit 6 sends the control signal to drive the rotation of the stepping motor shaft 35 to control the horizontal rotation direction and angle of the suction cup 34 .

在本實施例中,本發明對該電子零件C,例如電容,其檢測項目包含電容的殼體結構、字碼打印方向及表面裂痕、針腳結構、底材結構、氣泡孔、殼體沾膠以及針腳沾膠。 In this embodiment, for the electronic component C, such as a capacitor, the detection items of the present invention include the shell structure of the capacitor, the printing direction of the character code and the surface cracks, the stitch structure, the substrate structure, the bubble hole, the shell glue and the stitch. Glue.

在本實施例中,每一載台組32的轉台33的設置數量與該些檢測站42設置的站數相同。該些檢測站42沿著該輸送路徑T1設置有包括一第一檢測站42A、一第二檢測站42B、一第三檢測站42C、一第四檢測站42D及一第五檢測站42E,該第一檢測站42A係自承載該電子零件C的轉台33的側面拍攝該電子零件C殼體C1結構,以檢測是否有破裂;該第二檢測站42B係自側面拍攝該電子零件C殼體C1結構,以檢測其是否四面之字碼打印方向及表面裂痕;該第三檢測站42C係自側面拍攝該電子零件C,以檢測該電子零件C針腳C2結構、自上面拍攝該電子零件C,以檢測該電子零件底材是否外露、從轉台33上方(頂面)拍攝該電子零件C氣泡孔;該第四檢測站42D係自側面拍攝及檢測該電子零件C殼體C1四個面的沾膠狀態;該第五檢測站42E係自側面拍攝該電子零件C,以檢測該電子零件C殼體的兩面的針腳C2沾膠狀態。 In this embodiment, the number of the turntables 33 of each stage group 32 is the same as the number of the detection stations 42 . The inspection stations 42 are disposed along the conveying path T1 and include a first inspection station 42A, a second inspection station 42B, a third inspection station 42C, a fourth inspection station 42D and a fifth inspection station 42E. The first inspection station 42A photographed the structure of the casing C1 of the electronic component C from the side of the turntable 33 carrying the electronic component C to detect whether there was any rupture; the second inspection station 42B photographed the casing C1 of the electronic component C from the side structure to detect whether it has four-sided zigzag printing direction and surface cracks; the third inspection station 42C shoots the electronic component C from the side to detect the pin C2 structure of the electronic component C, and shoots the electronic component C from above to detect Whether the electronic component substrate is exposed, photograph the bubble hole of the electronic component C from the top (top surface) of the turntable 33; the fourth inspection station 42D is to photograph and detect the glued state of the four surfaces of the casing C1 of the electronic component C from the side ; The fifth detection station 42E shoots the electronic component C from the side to detect the glued state of the pins C2 on both sides of the housing of the electronic component C.

如圖7a所示,本實施例之該作業站台4之該入料站41係使 一待檢測之電子零件C輸送至位於該入料站41之定位的轉台33之吸盤34上,並予以吸附固定,其輸入電子零件C的方法可應用如機械夾爪抓取至該轉台33;該些檢測站42係依序輸送至每個檢測站42的定位,並進行檢測動作(如後述);該移料站43係將檢測完之電子零件C自該轉台33移除至一儲料箱(未圖示)。 As shown in Fig. 7a, the feeding station 41 of the work station 4 in this embodiment is An electronic part C to be inspected is transported to the suction cup 34 of the turntable 33 positioned at the feeding station 41 and fixed by suction. The method of inputting the electronic part C can be applied such as grasping the turntable 33 with a mechanical gripper; The inspection stations 42 are sequentially conveyed to the positioning of each inspection station 42 and perform inspection operations (as described later); the transfer station 43 removes the inspected electronic components C from the turntable 33 to a storage box (not shown).

如圖8所示。本實施例之該第一檢測站42A、該第四檢測站42D係分別於其對應的該輸送路徑T1定點之左或右側之同一側分別設置一面朝向該轉台33上之該電子零件C取像的灰階取像單元512及一照明單元52,且該第一檢測站42A及該第四檢測站42D的檢測動作順序係:使該轉台33承載該電子零件C輸送至定位、開啟對應的照明燈源、拍照該電子零件C殼體C1之第一面、驅動該步進馬達轉軸轉90度角、拍照該電子零件C殼體C1之第二面、驅動該步進馬達轉軸轉90度角、拍照該電子零件C殼體C1之第三面、驅動該步進馬達轉軸轉90度角、拍照該電子零件C殼體C1之第四面、驅動該步進馬達轉軸轉90度角以使該電子零件C殼體轉回原位、使該轉台33承載該電子零件C輸送離開該檢測站42。 As shown in Figure 8. In this embodiment, the first inspection station 42A and the fourth inspection station 42D are respectively disposed on the same side of the left or right side of the corresponding fixed point of the conveying path T1 with a surface facing the electronic component C on the turntable 33 to capture images The gray-scale image capturing unit 512 and an illumination unit 52, and the detection action sequence of the first detection station 42A and the fourth detection station 42D is: make the turntable 33 carry the electronic component C and transport it to positioning, turn on the corresponding lighting Light source, take a picture of the first side of the casing C1 of the electronic component C, drive the rotating shaft of the stepping motor to rotate at an angle of 90 degrees, take a picture of the second side of the casing C1 of the electronic component C, and drive the rotating shaft of the stepping motor to rotate at an angle of 90 degrees , Take a picture of the third side of the housing C1 of the electronic component C, drive the rotating shaft of the stepping motor to rotate at an angle of 90 degrees, take a picture of the fourth side of the casing C1 of the electronic component C, and drive the rotating shaft of the stepping motor to rotate at an angle of 90 degrees to make The housing of the electronic component C is turned back to the original position, so that the turntable 33 carries the electronic component C and transports it away from the inspection station 42 .

該第二檢測站42B、第五檢測站42D的檢測動作順序係分別於其對應的該輸送路徑T1定點之左、右側分別設置一面朝向該轉台33上之該電子零件C取像的彩色取像單元511及一照明單元,且該第二檢測站42B的檢測順序係:使該轉台33承載該電子零件C輸送至定位、開啟對應的照明燈源、拍照該電子零件C殼體C1之第一面、驅動該步進馬達轉軸轉90度角、拍照該電子零件C殼體C1之第二面、驅動該步進馬達轉軸轉90度角、拍照該電子零件C殼體C1之第三面、驅動該步進馬達轉軸轉90度 角、拍照該電子零件C殼體C1之第四面、驅動該步進馬達轉軸轉90度角以傳該電子零件C殼體轉回原位、使該轉台33承載該電子零件C輸送離開該檢測站42;該第五檢測站42E的檢測順序係:使該轉台33承載該電子零件C輸送至定位、開啟對應的照明燈源、拍照該電子零件C殼體C1之第一面、驅動該步進馬達轉軸轉180度角、拍照該電子零件C殼體C1之第三面、驅動該步進馬達轉軸轉180度角以將該電子零件C殼體轉回原位、使該轉台33承載該電子零件C輸送離開該檢測站42。 The inspection sequence of the second inspection station 42B and the fifth inspection station 42D is that color image capturing with one side facing the electronic component C on the turntable 33 is respectively set on the left and right sides of the corresponding fixed point of the conveying path T1. The unit 511 and a lighting unit, and the detection sequence of the second detection station 42B is: make the turntable 33 carry the electronic component C and transport it to positioning, turn on the corresponding lighting source, and take a photo of the first electronic component C shell C1. face, drive the rotating shaft of the stepping motor to rotate at an angle of 90 degrees, take a picture of the second face of the casing C1 of the electronic part C, drive the rotating shaft of the stepping motor to rotate at an angle of 90 degrees, take a picture of the third face of the casing C1 of the electronic part C, Drive the stepping motor shaft to rotate 90 degrees angle, take a picture of the fourth side of the casing C1 of the electronic component C, drive the stepping motor shaft to rotate 90 degrees to transmit the casing of the electronic component C back to its original position, so that the turntable 33 carries the electronic component C and transports it away from the The inspection station 42; the inspection sequence of the fifth inspection station 42E is: make the turntable 33 carry the electronic component C and transport it to positioning, turn on the corresponding lighting source, photograph the first side of the casing C1 of the electronic component C, drive the electronic component C The rotating shaft of the stepping motor is rotated 180 degrees, the third side of the casing C1 of the electronic component C is photographed, and the rotating shaft of the stepping motor is driven to rotate 180 degrees to rotate the casing of the electronic component C back to its original position, so that the turntable 33 can carry it. The electronic part C is conveyed away from the inspection station 42 .

再者,如圖9所示。該第三站檢測站42C係於該輸送路徑T1的該轉台33之左、右兩側分別設置一面向該電子零件C拍攝的灰階取像單元512和一背光單元53,並於該轉台33之上方(頂面)設置一面向該電子零件C取像的彩色取像單元511、一面向該電子零件C照射的高亮度同軸燈源54(如採用型號COG80)及一面向該電子零件C照射的環型光源55(如採用型號RI7060)。該第三站檢測站42C的檢測動作順序係:使該轉台33承載該電子零件C輸送至定位、以側面的灰階取像單元512拍攝該電子零件C殼體C1之第一面、驅動該步進馬達轉軸35轉90度角、以側面的灰階取像單元512拍攝該電子零件C殼體C1之第二面、關閉側面背光單元53、打開高亮度同軸燈源54、以上方彩色取像單元511拍攝該電子零件C頂面、關閉該高亮度同軸燈源54、打開該環型光源55、同樣以該上方彩色取像單元511拍攝該電子零件C頂面、使該轉台33承載該電子零件C輸送離開該檢測站42同時關閉該環型光源55並開啟對應本檢驗的該背光單元53。本實施例之上述作動的系統架構如圖10所示。 Furthermore, as shown in FIG. 9 . The third station inspection station 42C is provided with a grayscale image capturing unit 512 and a backlight unit 53 facing the electronic component C on the left and right sides of the turntable 33 of the conveying path T1, respectively, and on the turntable 33 The upper part (top surface) is provided with a color image capturing unit 511 facing the electronic part C for taking images, a high-brightness coaxial light source 54 (such as using model COG80) facing the electronic part C and illuminating the electronic part C on the other side. The ring light source 55 (such as using model RI7060). The inspection sequence of the third inspection station 42C is as follows: make the turntable 33 carry the electronic component C and transport it to positioning, photograph the first surface of the casing C1 of the electronic component C with the grayscale imaging unit 512 on the side, drive the electronic component C The rotating shaft of the stepping motor rotates 35 degrees at an angle of 90 degrees, and the second side of the casing C1 of the electronic component C is photographed with the gray-scale imaging unit 512 on the side. The side backlight unit 53 is turned off, and the high-brightness coaxial light source 54 is turned on. The imaging unit 511 shoots the top surface of the electronic part C, turns off the high-brightness coaxial light source 54, turns on the ring light source 55, and also shoots the top surface of the electronic part C with the upper color imaging unit 511, so that the turntable 33 carries the The electronic part C is conveyed away from the inspection station 42 while turning off the ring light source 55 and turning on the backlight unit 53 corresponding to the inspection. The system architecture of the above operations in this embodiment is shown in FIG. 10 .

承上所述,本創作以初始可將第二載台組322及第一載台組 321並列於輸送路徑T1,並將該第一載台組321的第一轉台331a移至該入料站41的位置就定位後,始將待檢測的該電子零件C以自動化的夾爪放至該入料站41位置的第一轉台331a上,並以吸盤34吸固,再移至下個作業站台4,即第一檢測站42A進行檢測,同時下個第一轉台331b接續移至該入料站41的位置待置電子零件C、檢測站42內再依序移至第二~第五檢測站進行檢測,同時入料側也依序放料至該第一轉台(331b,331c,331d,331e:)上,而在該第二轉台332e的電子零件C移至移料站43並在移除該電子零件C之後,再將該第二載台組322下降至低位高度,並沿著該回歸路徑T2,朝向回歸方向W2(逆向該輸送方向W1)移至該第一載台組321的另一側,再上升該第二載台組322至該高位高度,而與該該第一載台組321串連排列,此時該第二載台組322的第二轉台332a位於該入料站41的位置。 Continuing from the above, in this creation, the second stage group 322 and the first stage group can be initially 321 are juxtaposed on the conveying path T1, and after the first turntable 331a of the first stage group 321 is moved to the position of the feeding station 41 for positioning, the electronic part C to be tested is placed on the automatic gripper. The first turntable 331a at the position of the feeding station 41 is sucked by the suction cup 34, and then moved to the next work station 4, that is, the first inspection station 42A for inspection, and at the same time, the next first turntable 331b is successively moved to the incoming station 42A. The position of the material station 41 is to place the electronic parts C, and the inspection station 42 is moved to the second to fifth inspection stations in sequence for inspection, and the feeding side is also sequentially discharged to the first turntable (331b, 331c, 331d). , 331e:), and the electronic part C of the second turntable 332e is moved to the moving station 43 and after the electronic part C is removed, the second stage group 322 is lowered to a low height, and along the The return path T2 moves to the other side of the first stage set 321 toward the return direction W2 (reverse to the conveying direction W1 ), and then ascends the second stage set 322 to the high level, and the first stage set 322 The carrier groups 321 are arranged in series. At this time, the second turntable 332 a of the second carrier group 322 is located at the position of the feeding station 41 .

因此,本發明以直線的輸送路徑上依序設置的多個檢測站及其對應的檢測裝置,進行直線式逐一入料、送料、檢測、移料作業,並利用整排的轉台群在不同高度的移動路徑進行批次移動的覆歸並承接待測電子零件的銜接作業,以達到連續不間斷地承載待檢測的電子零件並依序輸送到檢測站進行檢驗、檢驗完後自轉台移除等作業,即可更彈性、方便地以最少的結構改動來擴充檢測站數量。 Therefore, the present invention uses a plurality of detection stations and their corresponding detection devices arranged in sequence on a linear conveying path to perform linear feeding, feeding, detection, and material shifting operations one by one, and utilizes the entire row of turntable groups at different heights. The moving path of the machine is used to carry out the reversion of the batch movement and undertake the connection operation of the electronic parts to be tested, so as to continuously carry the electronic parts to be tested and transport them to the testing station for inspection in sequence, and remove them from the turntable after the inspection, etc. It is more flexible and convenient to expand the number of inspection stations with minimal structural changes.

上述揭示的實施形態僅例示性說明本發明之原理、特點及其功效,並非用以限制本發明之可實施範疇,任何熟習此項技藝之人士均可在不違背本發明之精神及範疇下,對上述實施形態進行修飾與改變。任何運用本發明所揭示內容而完成之等效改變及修飾,均仍應為下述之申請專利範圍所涵蓋。 The embodiments disclosed above are only illustrative of the principles, features and effects of the present invention, and are not intended to limit the scope of the present invention. Modifications and changes are made to the above-described embodiments. Any equivalent changes and modifications made by using the contents disclosed in the present invention should still be covered by the following claims.

2:機台 2: Machine

3:輸送機構 3: Conveying mechanism

32:載台組 32: Stage group

321:第一載台組 321: The first stage group

322:第二載台組 322: Second stage group

33:轉台 33: Turntable

331a,331b,331c,331d,331e:第一轉台 331a, 331b, 331c, 331d, 331e: First turntable

332a,332b,332c,332d,332e:第二轉台 332a, 332b, 332c, 332d, 332e: Second turntable

34:吸盤 34: Sucker

35:步進馬達轉軸 35: Stepper motor shaft

Claims (10)

一種電子零件檢測設備,包含:一機台;一對輸送機構,係設置於該機台上,每一該輸送機構分別具有一水平暨垂直移動裝置,用以將一設置於其上的載台組垂直移動至一高位高度或一低位高度,以及沿著一輸送路徑或回歸路徑水平移動該載台組,每一載台組具有沿著該輸送路徑的一輸送方向依序串列設置的多個轉台,每個轉台具有一吸附或釋放該電子零件之電磁力或真空吸力之吸盤,可根據一控制信號進行相對於該載台組的水平轉向與轉動角度的驅動;多個作業站台,係設置於該輸送路徑上,該些作業站台包括朝向該輸送方向依序設置的一入料站、多個檢測站及一移料站;多組檢測裝置,係對應配置於該些檢測站,每組檢測站至少包括一取像單元及一照明單元;以及一處理單元,係電性連接該對輸送機構與該些檢測裝置,用以控制該對輸送機構之該對載台組串連排列地在該高位高度之該輸送路徑移動,並使每個轉台依序停在該入料站、每一檢測站及該移料站,以使該轉台於該入料站時,以該吸盤吸住輸入之待檢測之該電子零件,並在使該電子零件依序移至該些檢測站時,控制該些檢測裝置進行檢測,且移至該移料站時,將該電子零件自該吸盤移除,並在該載台組最後一個轉台移除該電子零件後,使該載台組降至該低位高度,並沿著該回歸路徑逆向該輸送方向移動至另一載台組的另一側後,再升至高位高度而使該載台組之第一個轉台與該另一載台組的最末個轉台鄰接排列。 An electronic parts testing equipment, comprising: a machine; a pair of conveying mechanisms, which are arranged on the machine, each of the conveying mechanisms respectively has a horizontal and vertical moving device for moving a carrier set on it The group moves vertically to a high level or a low level, and moves the carrier group horizontally along a conveying path or a return path, each carrier group having a plurality of carriers arranged in series along a conveying direction of the conveying path. a turntable, each turntable has a suction cup for attracting or releasing the electromagnetic force or vacuum suction force of the electronic part, and can drive the horizontal steering and rotation angle relative to the stage group according to a control signal; Set on the conveying path, the operation stations include a feeding station, a plurality of detection stations and a moving station arranged in sequence toward the conveying direction; a plurality of sets of detection devices are correspondingly arranged in the detection stations, each The group detection station at least includes an imaging unit and an illumination unit; and a processing unit, which is electrically connected to the pair of conveying mechanisms and the detection devices, and used to control the pair of carrier groups of the pair of conveying mechanisms to be arranged in series Move the conveying path at the high height, and make each turntable stop at the feeding station, each detection station and the moving station in sequence, so that when the turntable is at the feeding station, it is sucked by the suction cup The electronic component to be tested is input, and when the electronic component is moved to the testing stations in sequence, the testing devices are controlled to perform testing, and when the electronic component is moved to the moving station, the electronic component is moved from the suction cup After removing the electronic component from the last turntable of the carrier group, the carrier group is lowered to the low height, and moved along the return path against the conveying direction to the other side of the other carrier group Then, the height is raised again to make the first turntable of the carrier group adjacent to the last turntable of the other carrier group. 如請求項1所述電子零件檢測設備,其中一該水平暨垂直移動 裝置包括:一第一水平輸送單元,用以使一設置於該第一水平輸送單元的第一升降單元沿著該輸送路徑或該回歸路徑移動,該第一升降單元具有可相對於該第一升降單元上下移動於該高位高度與該低位高度的一第一載台組,該第一載台組具有沿著該輸送路徑或該回歸路徑方向依序串列設置的多個該些轉台;以及另一該水平暨垂直移動裝置包括:一第二水平輸送單元,用以使一設置於該第二水平輸送單元的第二升降單元沿著該輸送路徑或該回歸路徑移動,該第二升降單元具有可相對於該第二升降單元上下移動於該高位高度與該低位高度的一第二載台組,該第二載台組具有沿著該輸送路徑或該回歸路徑方向依序串列設置的多個該些轉台。 The electronic parts testing equipment according to claim 1, wherein one of the horizontal and vertical movement The device includes: a first horizontal conveying unit, used to make a first lifting unit arranged on the first horizontal conveying unit move along the conveying path or the return path, the first lifting unit has a relative to the first lifting unit The lifting unit moves up and down on a first stage set of the high height and the low height, and the first stage set has a plurality of the turntables arranged in series along the conveying path or the return path direction; and The other horizontal and vertical moving device includes: a second horizontal conveying unit for moving a second lifting unit disposed on the second horizontal conveying unit along the conveying path or the return path, the second lifting unit There is a second stage group that can move up and down at the high level and the low level relative to the second lifting unit, and the second stage group has serially arranged along the conveying path or the direction of the return path. a plurality of these turntables. 如請求項1所述電子零件檢測設備,其中該轉台之該吸盤為電磁力吸附型式。 The electronic component testing device according to claim 1, wherein the suction cup of the turntable is of an electromagnetic force suction type. 如請求項1所述電子零件檢測設備,其中該轉台之該吸盤之一中心軸係樞接一步進馬達轉軸,藉由驅動該步進馬達轉軸的轉動圈數而控制該吸盤的水平轉動方向及角度。 The electronic parts testing device as claimed in claim 1, wherein a central shaft of the suction cup of the turntable is pivotally connected to a rotating shaft of a stepping motor, and the horizontal rotation direction of the suction cup is controlled by driving the rotation of the rotating shaft of the stepping motor. angle. 如請求項1所述電子零件檢測設備,其中每一載台組的轉台數與該些檢測站之站數相同。 The electronic parts inspection equipment according to claim 1, wherein the number of turntables of each carrier group is the same as the number of stations of the inspection stations. 如請求項3所述電子零件檢測設備,其中對該電子零件的檢測項目包含殼體結構、字碼打印方向及表面裂痕、針腳結構、底材結構、氣泡孔、殼體沾膠以及針腳沾膠。 The electronic parts testing equipment according to claim 3, wherein the testing items for the electronic parts include shell structure, character code printing direction and surface cracks, stitch structure, substrate structure, bubble holes, shell glue and pin glue. 如請求項5所述電子零件檢測設備,其中每一載台組的轉台數為五個,該些檢測站沿著該輸送路徑的設置包括一第一檢測站、一第二檢測站、一第三檢測站、一第四檢測站及一第五檢測站,該第一檢測站係自側面取像檢測該該電子零件殼體結構是否有破裂,該第二檢測站係自側面取像檢測該 電子零件四面之字碼打印方向及表面裂痕,該第三檢測站係自側面取像檢測該電子零件針腳結構、自上面取像檢測該電子零件底材是否外露、自上面取像檢測該電子零件氣泡孔,該第四檢測站係自側面取像檢測該電子零件四面殼體沾膠狀態,該第五檢測站係自側面取像檢測該電子零件兩面的針腳沾膠狀態。 The electronic parts inspection equipment according to claim 5, wherein the number of turntables in each carrier group is five, and the inspection stations along the conveying path include a first inspection station, a second inspection station, and a first inspection station. Three inspection stations, a fourth inspection station and a fifth inspection station, the first inspection station takes images from the side to detect whether the electronic component casing structure is broken, and the second inspection station takes images from the side to detect the The printing direction and surface cracks of the zigzag on the four sides of the electronic parts, the third inspection station is to take images from the side to detect the stitch structure of the electronic parts, from the top to detect whether the substrate of the electronic parts is exposed, and from the top to detect the bubbles of the electronic parts The fourth inspection station takes images from the side to detect the glued state of the four-sided shell of the electronic part, and the fifth inspection station takes images from the side to detect the glued state of the pins on both sides of the electronic part. 如請求項6所述電子零件檢測設備,其中該檢測站之該第一檢測站、該第四檢測站係分別於該輸送路徑的該轉台之左、右側分別設置一面向該轉台上之該電子零件取像的灰階取像單元及一照明單元。 The electronic parts testing equipment according to claim 6, wherein the first testing station and the fourth testing station of the testing station are respectively disposed on the left and right sides of the turntable of the conveying path, facing the electronic parts on the turntable. A grayscale image capturing unit and an illumination unit for image capturing of parts. 如請求項6所述電子零件檢測設備,其中該檢測站之該第二檢測站、該第五檢測站係分別於該輸送路徑的該轉台之左側或右側之同一側分別設置一面向該轉台上之該電子零件取像的彩色取像單元及一照明單元。 The electronic parts testing equipment as claimed in claim 6, wherein the second testing station and the fifth testing station of the testing station are respectively disposed on the same side of the left or right side of the turntable in the conveying path and face the turntable. A color image capturing unit for capturing images of the electronic component and an illumination unit. 如請求項6所述電子零件檢測設備,其中該檢測站之該第三站檢測站係於該輸送路徑的該轉台之左、右兩側分別設置一面向該電子零件取像的灰階取像單元和一背光單元,並於該轉台之上方設置一面向該電子零件取像的彩色取像單元、一面向該電子零件照射的高亮度同軸燈源及一面向該電子零件照射的環型光源。 The electronic parts inspection equipment as claimed in claim 6, wherein the third inspection station of the inspection station is set on the left and right sides of the turntable of the conveying path, respectively, and a grayscale image for taking images of the electronic parts is disposed. unit and a backlight unit, and above the turntable are arranged a color imaging unit for capturing images of the electronic components, a high-brightness coaxial light source for illuminating the electronic components, and a ring light source for illuminating the electronic components.
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