TWI764670B - Electronic parts inspection equipment - Google Patents
Electronic parts inspection equipmentInfo
- Publication number
- TWI764670B TWI764670B TW110113268A TW110113268A TWI764670B TW I764670 B TWI764670 B TW I764670B TW 110113268 A TW110113268 A TW 110113268A TW 110113268 A TW110113268 A TW 110113268A TW I764670 B TWI764670 B TW I764670B
- Authority
- TW
- Taiwan
- Prior art keywords
- station
- turntable
- conveying
- inspection
- unit
- Prior art date
Links
Images
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Specific Conveyance Elements (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
Description
本發明為一種電子零件檢測設備,特別是有關於一種結合逐個轉台傳輸、檢測及批次預置多個轉台的輸送機構和在檢測時進行四面、二面或一面取像檢測的電子零件檢測設備。 The invention relates to an electronic parts testing device, in particular to a conveying mechanism that combines the transmission, testing and batch presetting of a plurality of turntables one by one, and an electronic part testing device that performs four-sided, two-sided or one-sided image detection during testing .
常見的電子零件例如有電阻、電容與電感,而在大部分之電子零件中,由於電容具有正負極,且電容之正負極若接反會造成電容過熱而***,因此電容在製造生產時需更加謹慎。在現有的電容檢測製程中,例如台灣發明專利第TWM607715公告號所公開之一種電容檢測設備,其係先透過一轉盤之轉動來帶動電容依序進行分腳、整腳、腳長檢測與轉向等整理作業,然後再將經過整理之電容移送至另一工作站來進行外觀檢測與電性測試。惟此種檢測結構係採用轉盤工作站專司電容針腳的檢側,其他項目,如外觀是否破裂、打印字體是否清晰、字體走向是否正確、外殼是否沾膠等,則需要移送至其他工作站,而無法由原來的轉盤結構加以擴充。 Common electronic parts include resistors, capacitors and inductors. In most electronic parts, since the capacitor has positive and negative electrodes, and if the positive and negative electrodes of the capacitor are reversed, the capacitor will overheat and explode, so the capacitor needs to be more cautious. In the existing capacitance detection process, such as a capacitance detection device disclosed in Taiwan Invention Patent No. TWM607715, the capacitance is firstly driven by the rotation of a turntable to perform foot separation, foot adjustment, foot length detection and steering in sequence, etc. After finishing the work, move the sorted capacitors to another workstation for appearance inspection and electrical testing. However, this kind of inspection structure uses the turntable workstation to inspect the side of the capacitor pins. Other items, such as whether the appearance is broken, whether the printed font is clear, whether the font direction is correct, whether the shell is glued, etc., need to be transferred to other workstations, and cannot be used. Expanded from the original turntable structure.
本發明的目的在於提供一種電子零件檢測設備,直接於輸送路徑沿線設置多個不同項目的檢測站,並使電子零件逐一停靠在多個檢測站,並在多個檢測站同時進行其檢測作業。 The purpose of the present invention is to provide an electronic parts inspection equipment, which directly sets up a plurality of inspection stations of different items along the conveying path, makes the electronic parts stop at the plurality of inspection stations one by one, and performs their inspection operations at the plurality of inspection stations simultaneously.
為達成上述目的,本發明提供一種電子零件檢測設備,包含:一機台;一對輸送機構,係設置於該機台上,每對輸送機構分別具有一水平暨垂直移動裝置,用以將一設置於其上的載台組垂直移動至一高位高度或一低位高度,以及沿著一輸送路徑或回歸路徑水平移動該載台組,每一載台組具有沿著該輸送路徑的一輸送方向依序串列設置的多個轉台,每個轉台具有一吸盤,可透過一氣體壓力控制產生吸附力或撤除吸力,該轉台並可根據一控制信號進行相對於該載台組的水平轉向與轉動角度的驅動;多個作業站台,係設置於該輸送路徑上,該些作業站台包括朝向該輸送方向依序設置的一入料站、多個檢測站及一移料站;多組檢測裝置,係對應配置於該些檢測站,每組檢測站至少包括一取像單元及一照明單元;以及一處理單元,係電性連接該對輸送機構與該些檢測裝置,用以控制該對輸送機構之該對載台組串連排列地在該高位高度之該輸送路徑移動,並使每個轉台依序停在該入料站、每一檢測站及該移料站,以使該轉台於該入料站時,以該吸盤吸住輸入之待檢測之該電子零件,並在使該電子零件依序移至該些檢測站時,控制該些檢測裝置進行檢測,且移至該移料站時,將該電子零件自該吸盤移除,並在該載台組最後一個轉台移除該電子零件後,使該載台組降至該低位高度,並沿著該回歸路徑逆向該輸送方向移動至另一載台組的另一側後,再升至高位高度而使該載台組之第一個轉台與該另一載台組的最末個轉台鄰接排列。 In order to achieve the above object, the present invention provides an electronic parts testing equipment, comprising: a machine; a pair of conveying mechanisms are arranged on the machine, and each pair of conveying mechanisms respectively has a horizontal and vertical moving device for moving a The carrier group disposed thereon is vertically moved to a high level or a low level, and the carrier group is moved horizontally along a conveying path or return path, each carrier group having a conveying direction along the conveying path A plurality of turntables arranged in series, each turntable has a suction cup, which can generate suction force or remove suction force through a gas pressure control, and the turntable can perform horizontal steering and rotation relative to the carrier group according to a control signal angle drive; a plurality of operation stations are arranged on the conveying path, and the operation stations include a feeding station, a plurality of detection stations and a moving station arranged in sequence towards the conveying direction; a plurality of groups of detection devices, Correspondingly arranged at the detection stations, each group of detection stations includes at least an image capturing unit and an illumination unit; and a processing unit, which is electrically connected to the pair of conveying mechanisms and the detection devices for controlling the pair of conveying mechanisms The pair of carrier groups are arranged in series to move on the conveying path of the high height, and each turntable is stopped at the feeding station, each detection station and the moving station in sequence, so that the turntable is in the When entering the material station, the suction cup is used to suck the input electronic component to be tested, and when the electronic component is moved to the detection stations in sequence, the detection devices are controlled for detection, and then moved to the moving station When the electronic part is removed from the suction cup, and after the electronic part is removed from the last turntable of the carrier group, the carrier group is lowered to the low height and moved along the return path against the conveying direction After reaching the other side of the other carrier group, the height is raised again to make the first turntable of the carrier group adjacent to the last turntable of the other carrier group.
在一些實施方案中,該水平暨垂直移動裝置包括:一第一水平輸送單元,用以使一設置於該第一水平輸送單元的第一升降單元沿著該輸送路徑或該回歸路徑移動,該第一升降單元具有可相對於該第一升降單 元上下移動於該高位高度與該低位高度的一第一載台組,該第一載台組具有沿著該輸送路徑或該回歸路徑方向依序串列設置的多個該些轉台;以及一第二水平輸送單元,用以使一設置於該第二水平輸送單元的第二升降單元沿著該輸送路徑或該回歸路徑移動,該第二升降單元具有可相對於該第二升降單元上下移動於該高位高度與該低位高度的一第二載台組,該第二載台組具有沿著該輸送路徑或該回歸路徑方向依序串列設置的多個該些轉台。 In some implementations, the horizontal and vertical moving device includes: a first horizontal conveying unit for moving a first lifting unit disposed on the first horizontal conveying unit along the conveying path or the return path, the The first lifting unit has a a first stage group that moves up and down on the high level and the low level, the first stage group has a plurality of the turntables arranged in series along the conveying path or the return path direction; and a The second horizontal conveying unit is used to move a second lifting unit disposed on the second horizontal conveying unit along the conveying path or the return path, and the second lifting unit is capable of moving up and down relative to the second lifting unit In a second stage group at the high level and the low level, the second stage group has a plurality of the turntables arranged in series along the conveying path or the direction of the return path.
在一些實施方案中,該轉台之該吸盤之一中心軸係樞接一步進馬達轉軸,藉由驅動該步進馬達轉軸的轉動圈數而控制該吸盤的水平轉動方向及角度。 In some implementations, a central shaft of the suction cup of the turntable is pivotally connected to a rotating shaft of a stepper motor, and the horizontal rotation direction and angle of the suction cup are controlled by driving the rotation of the rotating shaft of the stepping motor.
在一些實施方案中,每一載台組的轉台數與該些檢測站之站數相同。 In some implementations, the number of turntables for each carrier group is the same as the number of stations for the detection stations.
在一些實施方案中,該電子零件的檢測項目包含殼體結構、字碼打印方向及表面裂痕、針腳結構、底材結構、氣泡孔、殼體沾膠以及針腳沾膠。 In some embodiments, the inspection items of the electronic part include shell structure, character printing direction and surface cracks, stitch structure, substrate structure, bubble holes, shell glue and pin glue.
在一些實施方案中,每一載台組的真空轉台數為五個,該些檢測站依該輸送路徑包括一第一站、一第二站、一第三站、一第四站及一第五站,該第一站係自側面取像檢測該該電子零件殼體結構是否有破裂,該第二站係自側面取像檢測該電子零件四面之字碼打印方向及表面裂痕,該第三站係自側面取像檢測該電子零件針腳結構、自上面取像檢測該電子零件底材是否外露、自上面取像檢測該電子零件氣泡孔,該第四站係自側面取像檢測該電子零件四面殼體沾膠狀態,該第五站係自側面取像檢測該 電子零件兩面的針腳沾膠狀態。 In some embodiments, the number of vacuum turntables in each carrier group is five, and the inspection stations include a first station, a second station, a third station, a fourth station and a first station according to the conveying path Five stations. The first station is to take images from the side to detect whether the shell structure of the electronic part is broken. The second station is to take images from the side to detect the printing direction and surface cracks of the four sides of the electronic component. The third station It is to take an image from the side to detect the pin structure of the electronic part, to take an image from the top to detect whether the substrate of the electronic part is exposed, and to take an image from the top to detect the bubble hole of the electronic part. The fourth station is to take an image from the side to detect the four sides of the electronic part. The shell is in the glued state, the fifth station is to take images from the side to detect the The glued state of the pins on both sides of the electronic part.
在一些實施方案中,該檢測站之該第一站係於該輸送路徑的該轉台之左、右側分別設置一面向該轉台上之該電子零件取像的灰階取像單元及一照明單元。 In some implementations, the first station of the inspection station is disposed on the left and right sides of the turntable in the conveying path, respectively, with a grayscale image capturing unit and an illumination unit facing the electronic components on the turntable.
在一些實施方案中,該檢測站之該第三站係於該輸送路徑的該轉台之左、右兩側分別設置一面向該電子零件取像的灰階取像單元和一背光單元,並於該轉台之上方設置一面向該電子零件取像的彩色取像單元、一面向該電子零件照射的高亮度同軸燈源及一面向該電子零件照射的環型光源。 In some implementations, the third station of the inspection station is disposed on the left and right sides of the turntable of the conveying path, respectively, with a gray-scale image capturing unit and a backlight unit facing the electronic part for capturing images, and at the Above the turntable, a color imaging unit for capturing images of the electronic components, a high-brightness coaxial light source for illuminating the electronic components, and a ring light source for illuminating the electronic components are arranged.
本發明的至少具有下列特點:本發明應用直線的輸送路徑上依序設置的多個檢測站及其對應的檢測裝置,進行逐個送料與利用整排的轉台在不同高度的移動路徑進行批次移動承接待測電子零件的銜接作業,以達到連續不間斷地承載待檢測的電子零件並依序輸送到檢測站進行檢驗、檢驗完後自轉台移除等作業,較習知之圓型轉盤週邊設置檢測站的方式,本發明可更彈性地、方便地擴充檢測站數量。 The present invention has at least the following characteristics: the present invention uses a plurality of detection stations and their corresponding detection devices arranged in sequence on a straight conveying path to perform one-by-one feeding and use the entire row of turntables to move in batches at different heights. Undertake the connection operation of the electronic parts to be tested, so as to continuously carry the electronic parts to be tested and sequentially transport them to the testing station for inspection, remove the self-turntable after the inspection, etc., compared with the conventional circular turntable. The present invention can expand the number of detection stations more flexibly and conveniently.
1:電子零件檢測設備 1: Electronic parts testing equipment
2:機台 2: Machine
3:輸送機構 3: Conveying mechanism
31:水平暨垂直移動裝置 31: Horizontal and vertical movement device
311:第一水平輸送單元 311: The first horizontal conveying unit
3111:第一升降單元 3111: First lift unit
312:第二水平輸送單元 312: Second horizontal conveying unit
3121:第二升降單元 3121: Second lift unit
32:載台組 32: Stage group
321:第一載台組 321: The first stage group
322:第二載台組 322: Second stage group
33,33’:轉台 33,33': turntable
331,331a,331b,331c,331d,331e:第一轉台 331, 331a, 331b, 331c, 331d, 331e: First turntable
332,332a,332b,332c,332d,332e:第二轉台 332, 332a, 332b, 332c, 332d, 332e: Second turntable
34,34’:吸盤 34,34': Sucker
341:空氣通道 341: Air channel
35:步進馬達轉軸 35: Stepper motor shaft
4:作業站台 4: Work station
41:入料站 41: Feeding station
42:檢測站 42: Inspection Station
42A:第一檢測站 42A: First Inspection Station
42B:第二檢測站 42B: Second Inspection Station
42C:第三檢測站 42C: The third inspection station
42D:第四檢測站 42D: Fourth Inspection Station
42E:第五檢測站 42E: Fifth Inspection Station
43:移料站 43: Transfer station
5:檢測裝置 5: Detection device
51:取像單元 51: Acquisition unit
511:彩色取像單元 511: Color acquisition unit
512:灰階取像單元 512: Grayscale image acquisition unit
52:照明單元 52: Lighting unit
53:背光單元 53: Backlight unit
54:高亮度同軸燈源 54: High brightness coaxial light source
55:環型光源 55: Ring light source
6:處理單元 6: Processing unit
C:電子零件 C: Electronic parts
C1:殼體 C1: Shell
C2:針腳 C2: Pin
T1:輸送路徑 T1: conveying path
T2:回歸路徑 T2: return path
W1:輸送方向 W1: conveying direction
W2:回歸方向 W2: return direction
[圖1]為本發明一實施例之電子零件檢測設備的立體示意圖;[圖2]為本發明一實施例之輸送機構的另一角度的立體示意圖;[圖3]為圖2的前視圖;[圖4]為圖2的側視圖;[圖5]為本發明一實施例之輸送機構的載台組與其轉台的立體分解圖;[圖6a]為本發明一實施例之輸送機構的轉台的剖面圖;[圖6b]為本發明另一實施例之輸送機構的轉台的剖面圖;[圖7a~圖7e]為本發明一實施例之輸送機構的載台組輸送作動示意圖;[圖8]為本發明一實施例之輸送機構的第一檢測站的檢測裝置配置示意圖;[圖9]為本發明一實施例之輸送機構的第三檢測站的檢測裝置配置示意圖。 [ Fig. 1 ] is a schematic perspective view of an electronic component testing device according to an embodiment of the present invention; [ Fig. 2 ] is a perspective schematic view of another angle of the conveying mechanism according to an embodiment of the present invention; [ Fig. 3 ] is a front view of Fig. 2 ; [Fig. 4] is a side view of Fig. 2; [Fig. 5] is an exploded perspective view of the carrier group and its turntable of the conveying mechanism of an embodiment of the present invention; [Fig. 6a] is an embodiment of the conveying mechanism of the present invention. A cross-sectional view of the turntable; [Fig. 6b] is a cross-sectional view of a turntable of a conveying mechanism according to another embodiment of the present invention; [Fig. 7a~Fig. 7e] are schematic views of the conveying action of the carrier group of the conveying mechanism according to an embodiment of the present invention; [Fig. FIG. 8 is a schematic diagram of the configuration of the detection device of the first detection station of the conveying mechanism according to an embodiment of the present invention; FIG. 9 is a schematic diagram of the configuration of the detection device of the third detection station of the conveying mechanism according to an embodiment of the present invention.
[圖10]為本發明一實施例之系統架構圖。 FIG. 10 is a system architecture diagram of an embodiment of the present invention.
茲配合圖式將本發明實施例詳細說明如下,其所附圖式主要為簡化之示意圖,僅以示意方式說明本發明之基本結構,因此在該等圖式中僅標示與本發明有關之元件,且所顯示之元件並非以實施時之數目、形狀、尺寸比例等加以繪製,其實際實施時之規格尺寸實為一種選擇性之設計,且其元件佈局形態有可能更為複雜。 Hereinafter, the embodiments of the present invention will be described in detail in conjunction with the drawings. The accompanying drawings are mainly simplified schematic diagrams, and only illustrate the basic structure of the present invention in a schematic manner. Therefore, only the elements related to the present invention are indicated in these drawings. , and the displayed components are not drawn according to the number, shape, size ratio, etc. of the actual implementation. The size of the actual implementation is actually a selective design, and the layout of the components may be more complicated.
以下各實施例的說明是參考附加的圖式,用以例示本發明可據以實施的特定實施例。本發明所提到的方向用語,例如「上」、「下」、「前」、「後」、「左」、「右」、「內」、「外」、「側面」等,僅是參考附加圖式的方向。因此,使用的方向用語是用以說明及理解本申請,而非用以限制本申請。另外,在說明書中,除非明確地描述為相反的,否則詞語“包括”將被理解為意指包括所述元件,但是不排除任何其它元件。 The following descriptions of the various embodiments refer to the accompanying drawings to illustrate specific embodiments in accordance with which the invention may be practiced. The directional terms mentioned in the present invention, such as "up", "down", "front", "rear", "left", "right", "inside", "outside", "side", etc., are only for reference Additional schema orientation. Therefore, the directional terms used are used to describe and understand the present application, rather than to limit the present application. Additionally, in the specification, unless explicitly described to the contrary, the word "comprising" will be understood to mean the inclusion of stated elements but not the exclusion of any other elements.
請參照圖1至圖6b所示。本實施例之電子零件檢測設備1,包含:一機台2、一對輸送機構3、多個作業站台4、多組檢測裝置5以及處理單元6。該機台2提供各構件建置的基礎;該對輸送機構3,係設置在機台2上,每對輸送機構3分別具有一水平暨垂直移動裝置31,用以將一
設置於其上的載台組32垂直移動至一高位高度或一低位高度,以及沿著一輸送路徑T1或一回歸路徑T2水平移動該載台組32,每一載台組32具有沿著該輸送路徑T1的輸送方向W1依序串列設置的多個轉台33,每個轉台具有一吸盤34,以便吸附待測的電子零件C,實務上該吸盤34可選用電磁力吸附型式,例如以導電陶瓷製成,並應用通電後產生磁場吸附力抓住該電子零件C、斷電後解除歡電子零件C的吸附力,如圖6a所示;或者是該吸盤34’可透過一氣體控制而產生對電子零件C的吸附力或釋放吸力,如圖6b所示,該轉台33’並可根據一控制信號進行相對於該載台組32的水平轉向與轉動角度的驅動,如圖5所示。如圖7a所示,該些多個作業站台4係設置在該輸送路徑T1上,該些作業站台4具有朝向該輸送方向W1依序設置的一入料站41、多個檢測站42及一移料站43。如圖8及圖9所示,該多組檢測裝置5,係對應配置於該些作業站台4的該些檢測站42,每個檢測站42至少包括一取像單元51及一照明單元52。
Please refer to FIG. 1 to FIG. 6b. The electronic
詳細而言,如圖7a至圖7e所示。該一處理單元6例如一微控制器(MCU),係電性連接該對輸送機構3與該些檢測裝置5,用以控制該對輸送機構3之該對載台組32串連排列地在該高位高度之該輸送路徑T1移動,並使每個轉台33依序停在該入料站41、每一檢測站42及該移料站43,以使該轉台33於該入料站41時,以該吸盤331吸住輸入之待檢測之該電子零件C,並在使該電子零件C依序移至該些檢測站42時,控制該些檢測裝置5進行檢測,且移至該移料站43時,將該電子零件C自該吸盤331移除,並在該載台組32最後一個轉台33移除該電子零件C後,使該載台組32,如第二載台組322降至該低位高度,並沿著該回歸路徑T2逆向該輸
送方向W1移動至另一載台組32(如第一載台組321)的相對之另一側後,再升至高位高度而使該載台組(第二載台組322)之第一個轉台33(如第二轉台332a)與該另一載台組(如第一載台組321)的最末個轉台(如第一轉台331e)鄰接排列,再使該第一載台組321與該第二載台組322同步朝著輸送方向W1進行輸送。
In detail, as shown in Figs. 7a to 7e. The
具體而言,如圖2至圖3、圖7a至7e及圖10所示,前述實施例之該水平暨垂直移動裝置31包括:一第一水平輸送單元311、一第一升降單元3111、一第一載台組321、多個第一轉台331(331a,331b,331c,331d,331e)以及設置在該些第一轉台331上的吸盤34。本實施例中,該第一載台組321上具有五個排成一列的第一轉台331(331a,331b,331c,331d,331e),該第一載台組321設置於該第一升降單元3111(的升降滑塊)上,以便於在該高位高度或該低位高度之間升降,該第一升降單元3111再設置於該第一水平輸送單元311(的平移滑塊)上,以便使第一升降單元3111沿著該高位高度的該輸送路徑T1或該低位高度的該回歸路徑T2移動;以及該水平暨垂直移動裝置31也包括:一第二水平輸送單元312、一第二升降單元3121、一第二載台組322、多個第二轉台332(332a,332b,332c,332d,332e)以及設置在該些第二轉台332上的吸盤34。本實施例中,該第二載台組322上同樣具有五個排成一列的第二轉台332(332a,332b,332c,332d,332e),該第二載台組322架設於該第二升降單元3121(的升降滑塊)上,以便於在該高位高度或該低位高度之間升降,該第二升降單元3121再設置於該第二水平輸送單元312(的平移滑塊)上,以便使第二升降單元3121沿著該高位高度的該輸送路徑T1或該低位高度的該回歸路徑T2移動。
Specifically, as shown in FIG. 2 to FIG. 3 , FIGS. 7 a to 7 e and FIG. 10 , the horizontal and vertical moving
上述該轉台33的電磁式吸盤34係;若為真空式吸盤34內部具有一空氣通道341,用以連接一氣泵控制裝置(未圖式),藉由該氣體控制裝置的吸放空氣而使吸盤342盤面吸住或釋放電子零件C(當然,該吸盤342的吸附面積需匹配適用於該電子零件C的接觸面積),且該轉台33之一中心軸係樞接一步進馬達轉軸35,藉由處理單元6發出該控制信號驅動該步進馬達轉軸35的轉動圈數而控制該吸盤34的水平轉動方向及角度。
The
在本實施例中,本發明對該電子零件C,例如電容,其檢測項目包含電容的殼體結構、字碼打印方向及表面裂痕、針腳結構、底材結構、氣泡孔、殼體沾膠以及針腳沾膠。 In this embodiment, for the electronic component C, such as a capacitor, the detection items of the present invention include the shell structure of the capacitor, the printing direction of the character code and the surface cracks, the stitch structure, the substrate structure, the bubble hole, the shell glue and the stitch. Glue.
在本實施例中,每一載台組32的轉台33的設置數量與該些檢測站42設置的站數相同。該些檢測站42沿著該輸送路徑T1設置有包括一第一檢測站42A、一第二檢測站42B、一第三檢測站42C、一第四檢測站42D及一第五檢測站42E,該第一檢測站42A係自承載該電子零件C的轉台33的側面拍攝該電子零件C殼體C1結構,以檢測是否有破裂;該第二檢測站42B係自側面拍攝該電子零件C殼體C1結構,以檢測其是否四面之字碼打印方向及表面裂痕;該第三檢測站42C係自側面拍攝該電子零件C,以檢測該電子零件C針腳C2結構、自上面拍攝該電子零件C,以檢測該電子零件底材是否外露、從轉台33上方(頂面)拍攝該電子零件C氣泡孔;該第四檢測站42D係自側面拍攝及檢測該電子零件C殼體C1四個面的沾膠狀態;該第五檢測站42E係自側面拍攝該電子零件C,以檢測該電子零件C殼體的兩面的針腳C2沾膠狀態。
In this embodiment, the number of the
如圖7a所示,本實施例之該作業站台4之該入料站41係使
一待檢測之電子零件C輸送至位於該入料站41之定位的轉台33之吸盤34上,並予以吸附固定,其輸入電子零件C的方法可應用如機械夾爪抓取至該轉台33;該些檢測站42係依序輸送至每個檢測站42的定位,並進行檢測動作(如後述);該移料站43係將檢測完之電子零件C自該轉台33移除至一儲料箱(未圖示)。
As shown in Fig. 7a, the feeding
如圖8所示。本實施例之該第一檢測站42A、該第四檢測站42D係分別於其對應的該輸送路徑T1定點之左或右側之同一側分別設置一面朝向該轉台33上之該電子零件C取像的灰階取像單元512及一照明單元52,且該第一檢測站42A及該第四檢測站42D的檢測動作順序係:使該轉台33承載該電子零件C輸送至定位、開啟對應的照明燈源、拍照該電子零件C殼體C1之第一面、驅動該步進馬達轉軸轉90度角、拍照該電子零件C殼體C1之第二面、驅動該步進馬達轉軸轉90度角、拍照該電子零件C殼體C1之第三面、驅動該步進馬達轉軸轉90度角、拍照該電子零件C殼體C1之第四面、驅動該步進馬達轉軸轉90度角以使該電子零件C殼體轉回原位、使該轉台33承載該電子零件C輸送離開該檢測站42。 As shown in Figure 8. In this embodiment, the first inspection station 42A and the fourth inspection station 42D are respectively disposed on the same side of the left or right side of the corresponding fixed point of the conveying path T1 with a surface facing the electronic component C on the turntable 33 to capture images The gray-scale image capturing unit 512 and an illumination unit 52, and the detection action sequence of the first detection station 42A and the fourth detection station 42D is: make the turntable 33 carry the electronic component C and transport it to positioning, turn on the corresponding lighting Light source, take a picture of the first side of the casing C1 of the electronic component C, drive the rotating shaft of the stepping motor to rotate at an angle of 90 degrees, take a picture of the second side of the casing C1 of the electronic component C, and drive the rotating shaft of the stepping motor to rotate at an angle of 90 degrees , Take a picture of the third side of the housing C1 of the electronic component C, drive the rotating shaft of the stepping motor to rotate at an angle of 90 degrees, take a picture of the fourth side of the casing C1 of the electronic component C, and drive the rotating shaft of the stepping motor to rotate at an angle of 90 degrees to make The housing of the electronic component C is turned back to the original position, so that the turntable 33 carries the electronic component C and transports it away from the inspection station 42 .
該第二檢測站42B、第五檢測站42D的檢測動作順序係分別於其對應的該輸送路徑T1定點之左、右側分別設置一面朝向該轉台33上之該電子零件C取像的彩色取像單元511及一照明單元,且該第二檢測站42B的檢測順序係:使該轉台33承載該電子零件C輸送至定位、開啟對應的照明燈源、拍照該電子零件C殼體C1之第一面、驅動該步進馬達轉軸轉90度角、拍照該電子零件C殼體C1之第二面、驅動該步進馬達轉軸轉90度角、拍照該電子零件C殼體C1之第三面、驅動該步進馬達轉軸轉90度
角、拍照該電子零件C殼體C1之第四面、驅動該步進馬達轉軸轉90度角以傳該電子零件C殼體轉回原位、使該轉台33承載該電子零件C輸送離開該檢測站42;該第五檢測站42E的檢測順序係:使該轉台33承載該電子零件C輸送至定位、開啟對應的照明燈源、拍照該電子零件C殼體C1之第一面、驅動該步進馬達轉軸轉180度角、拍照該電子零件C殼體C1之第三面、驅動該步進馬達轉軸轉180度角以將該電子零件C殼體轉回原位、使該轉台33承載該電子零件C輸送離開該檢測站42。
The inspection sequence of the
再者,如圖9所示。該第三站檢測站42C係於該輸送路徑T1的該轉台33之左、右兩側分別設置一面向該電子零件C拍攝的灰階取像單元512和一背光單元53,並於該轉台33之上方(頂面)設置一面向該電子零件C取像的彩色取像單元511、一面向該電子零件C照射的高亮度同軸燈源54(如採用型號COG80)及一面向該電子零件C照射的環型光源55(如採用型號RI7060)。該第三站檢測站42C的檢測動作順序係:使該轉台33承載該電子零件C輸送至定位、以側面的灰階取像單元512拍攝該電子零件C殼體C1之第一面、驅動該步進馬達轉軸35轉90度角、以側面的灰階取像單元512拍攝該電子零件C殼體C1之第二面、關閉側面背光單元53、打開高亮度同軸燈源54、以上方彩色取像單元511拍攝該電子零件C頂面、關閉該高亮度同軸燈源54、打開該環型光源55、同樣以該上方彩色取像單元511拍攝該電子零件C頂面、使該轉台33承載該電子零件C輸送離開該檢測站42同時關閉該環型光源55並開啟對應本檢驗的該背光單元53。本實施例之上述作動的系統架構如圖10所示。
Furthermore, as shown in FIG. 9 . The third
承上所述,本創作以初始可將第二載台組322及第一載台組
321並列於輸送路徑T1,並將該第一載台組321的第一轉台331a移至該入料站41的位置就定位後,始將待檢測的該電子零件C以自動化的夾爪放至該入料站41位置的第一轉台331a上,並以吸盤34吸固,再移至下個作業站台4,即第一檢測站42A進行檢測,同時下個第一轉台331b接續移至該入料站41的位置待置電子零件C、檢測站42內再依序移至第二~第五檢測站進行檢測,同時入料側也依序放料至該第一轉台(331b,331c,331d,331e:)上,而在該第二轉台332e的電子零件C移至移料站43並在移除該電子零件C之後,再將該第二載台組322下降至低位高度,並沿著該回歸路徑T2,朝向回歸方向W2(逆向該輸送方向W1)移至該第一載台組321的另一側,再上升該第二載台組322至該高位高度,而與該該第一載台組321串連排列,此時該第二載台組322的第二轉台332a位於該入料站41的位置。
Continuing from the above, in this creation, the
因此,本發明以直線的輸送路徑上依序設置的多個檢測站及其對應的檢測裝置,進行直線式逐一入料、送料、檢測、移料作業,並利用整排的轉台群在不同高度的移動路徑進行批次移動的覆歸並承接待測電子零件的銜接作業,以達到連續不間斷地承載待檢測的電子零件並依序輸送到檢測站進行檢驗、檢驗完後自轉台移除等作業,即可更彈性、方便地以最少的結構改動來擴充檢測站數量。 Therefore, the present invention uses a plurality of detection stations and their corresponding detection devices arranged in sequence on a linear conveying path to perform linear feeding, feeding, detection, and material shifting operations one by one, and utilizes the entire row of turntable groups at different heights. The moving path of the machine is used to carry out the reversion of the batch movement and undertake the connection operation of the electronic parts to be tested, so as to continuously carry the electronic parts to be tested and transport them to the testing station for inspection in sequence, and remove them from the turntable after the inspection, etc. It is more flexible and convenient to expand the number of inspection stations with minimal structural changes.
上述揭示的實施形態僅例示性說明本發明之原理、特點及其功效,並非用以限制本發明之可實施範疇,任何熟習此項技藝之人士均可在不違背本發明之精神及範疇下,對上述實施形態進行修飾與改變。任何運用本發明所揭示內容而完成之等效改變及修飾,均仍應為下述之申請專利範圍所涵蓋。 The embodiments disclosed above are only illustrative of the principles, features and effects of the present invention, and are not intended to limit the scope of the present invention. Modifications and changes are made to the above-described embodiments. Any equivalent changes and modifications made by using the contents disclosed in the present invention should still be covered by the following claims.
2:機台 2: Machine
3:輸送機構 3: Conveying mechanism
32:載台組 32: Stage group
321:第一載台組 321: The first stage group
322:第二載台組 322: Second stage group
33:轉台 33: Turntable
331a,331b,331c,331d,331e:第一轉台 331a, 331b, 331c, 331d, 331e: First turntable
332a,332b,332c,332d,332e:第二轉台 332a, 332b, 332c, 332d, 332e: Second turntable
34:吸盤 34: Sucker
35:步進馬達轉軸 35: Stepper motor shaft
Claims (10)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW110113268A TWI764670B (en) | 2021-04-13 | 2021-04-13 | Electronic parts inspection equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW110113268A TWI764670B (en) | 2021-04-13 | 2021-04-13 | Electronic parts inspection equipment |
Publications (2)
Publication Number | Publication Date |
---|---|
TWI764670B true TWI764670B (en) | 2022-05-11 |
TW202239689A TW202239689A (en) | 2022-10-16 |
Family
ID=82594266
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW110113268A TWI764670B (en) | 2021-04-13 | 2021-04-13 | Electronic parts inspection equipment |
Country Status (1)
Country | Link |
---|---|
TW (1) | TWI764670B (en) |
Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101699297A (en) * | 2009-09-04 | 2010-04-28 | 无锡先导自动化设备有限公司 | Improved capacitance measurement charging mechanism |
CN103808732A (en) * | 2014-01-21 | 2014-05-21 | 图灵视控(北京)科技有限公司 | Capacitance detection system and capacitance detection method based on machine vision |
CN206485975U (en) * | 2017-02-28 | 2017-09-12 | 佛山市顺德区生海电子科技有限公司 | One is used for the automatic charging device of capacitance detector |
CN108169238A (en) * | 2018-01-29 | 2018-06-15 | 周大银 | Six face detection devices |
CN109813724A (en) * | 2019-01-28 | 2019-05-28 | 无锡立赫智能科技有限公司 | A kind of capacitor appearance automatic fraction collector |
CN110160587A (en) * | 2019-06-20 | 2019-08-23 | 珠海格力智能装备有限公司 | capacitance detection method and device |
CN110261398A (en) * | 2019-08-05 | 2019-09-20 | 东莞市瑞科智能科技有限公司 | A kind of capacitor automatic detecting machine |
CN110426537A (en) * | 2019-08-22 | 2019-11-08 | 东莞士格电子集团有限公司 | A kind of capacitor detection device |
CN212291785U (en) * | 2020-07-03 | 2021-01-05 | 无锡立赫智能科技有限公司 | Automatic row equipment of inserting of electric capacity |
TWM607715U (en) * | 2020-11-03 | 2021-02-11 | 致茂電子股份有限公司 | Capacitor detection device |
-
2021
- 2021-04-13 TW TW110113268A patent/TWI764670B/en active
Patent Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101699297A (en) * | 2009-09-04 | 2010-04-28 | 无锡先导自动化设备有限公司 | Improved capacitance measurement charging mechanism |
CN103808732A (en) * | 2014-01-21 | 2014-05-21 | 图灵视控(北京)科技有限公司 | Capacitance detection system and capacitance detection method based on machine vision |
CN206485975U (en) * | 2017-02-28 | 2017-09-12 | 佛山市顺德区生海电子科技有限公司 | One is used for the automatic charging device of capacitance detector |
CN108169238A (en) * | 2018-01-29 | 2018-06-15 | 周大银 | Six face detection devices |
CN109813724A (en) * | 2019-01-28 | 2019-05-28 | 无锡立赫智能科技有限公司 | A kind of capacitor appearance automatic fraction collector |
CN110160587A (en) * | 2019-06-20 | 2019-08-23 | 珠海格力智能装备有限公司 | capacitance detection method and device |
CN110261398A (en) * | 2019-08-05 | 2019-09-20 | 东莞市瑞科智能科技有限公司 | A kind of capacitor automatic detecting machine |
CN110426537A (en) * | 2019-08-22 | 2019-11-08 | 东莞士格电子集团有限公司 | A kind of capacitor detection device |
CN212291785U (en) * | 2020-07-03 | 2021-01-05 | 无锡立赫智能科技有限公司 | Automatic row equipment of inserting of electric capacity |
TWM607715U (en) * | 2020-11-03 | 2021-02-11 | 致茂電子股份有限公司 | Capacitor detection device |
Also Published As
Publication number | Publication date |
---|---|
TW202239689A (en) | 2022-10-16 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR0137629B1 (en) | Transport mechanism for ic handlers | |
TWI249619B (en) | Display panel inspection apparatus and inspection method | |
TW533131B (en) | Screen printing apparatus | |
TWI383936B (en) | Substrate exchange apparatus and substrate processing apparatus, and substrate inspection apparatus | |
JP2007053156A (en) | Apparatus and method for turning over chip, and apparatus and method for mounting chip | |
CN110624856A (en) | OCA check out test set | |
CN219391854U (en) | PCB outward appearance automatic checkout device | |
JP2020183907A (en) | Electronic component inspection device | |
TWI764670B (en) | Electronic parts inspection equipment | |
CN113567360B (en) | Color difference and gloss detection device compatible with multiple products and operation method thereof | |
CN215844315U (en) | Sorting equipment capable of automatically feeding and discharging | |
TWI728511B (en) | Substrate processing apparatus and substrate processing method | |
TWI707130B (en) | Carrier device, optical inspection apparatus and optical inspection method | |
CN116008295B (en) | Copper-clad ceramic substrate detection equipment | |
JP4592070B2 (en) | Liquid crystal panel visual inspection apparatus and visual inspection method | |
CN116539529A (en) | Visual inspection apparatus | |
JP2000203713A (en) | Visual inspection device | |
JP6786381B2 (en) | Alignment device | |
WO2018003578A1 (en) | Alignment device | |
KR101669992B1 (en) | apparatus for inspecting both sides of substrate | |
JP2005104524A (en) | Transfer device | |
JPH05109849A (en) | Board external appearance inspecting device | |
JP2811939B2 (en) | Electronic component transfer head device | |
JP3261892B2 (en) | TAB mounting device | |
JPH10154743A (en) | Wafer treating device |