TWI709883B - Touch panel driving device and touch panel device - Google Patents

Touch panel driving device and touch panel device Download PDF

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TWI709883B
TWI709883B TW108103855A TW108103855A TWI709883B TW I709883 B TWI709883 B TW I709883B TW 108103855 A TW108103855 A TW 108103855A TW 108103855 A TW108103855 A TW 108103855A TW I709883 B TWI709883 B TW I709883B
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capacitance
capacitor
touch panel
capacitance value
capacitors
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TW201937354A (en
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杉本照和
六車雄
田中博之
高山勝己
何政哲
大元文一
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日商雙葉電子工業股份有限公司
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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/044—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/0416—Control or interface arrangements specially adapted for digitisers
    • G06F3/04166—Details of scanning methods, e.g. sampling time, grouping of sub areas or time sharing with display driving
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/0416—Control or interface arrangements specially adapted for digitisers
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/0412—Digitisers structurally integrated in a display
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/044—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means
    • G06F3/0446—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means using a grid-like structure of electrodes in at least two directions, e.g. using row and column electrodes

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
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  • General Physics & Mathematics (AREA)
  • Position Input By Displaying (AREA)
  • Electronic Switches (AREA)

Abstract

A touch panel driving device, for sequentially performing scanning for selecting a pair of adjacent transmission signal lines and a pair of adjacent reception signal lines on a touch panel, includes a reception circuit configured to receive reception signals whose waveforms are changed by a capacitance change caused by an operation from the pair of reception signal lines of the touch panel and generate a detection value for monitoring a touch panel operation. The reception circuit generates the detection value by comparing levels of the reception signals from the reception signal lines while sequentially switching capacitance values of ameasurement capacitance unit connected to one of the reception signal lines. The measurement capacitance unit includes capacitance units each forming a certain capacitance value by parallel connection or series connection of capacitors as a capacitance unit forming one capacitance value used for switching the capacitance value of the measurement capacitance unit.

Description

觸控面板驅動裝置及觸控面板裝置Touch panel driving device and touch panel device

發明領域 Invention field

本發明是有關於一種觸控面板驅動裝置及觸控面板裝置，特別是有關於一種用於觸控面板操作檢測的技術。 The present invention relates to a touch panel driving device and a touch panel device, and more particularly to a technology used for touch panel operation detection.

發明背景 Background of the invention

有關於觸控面板已知有各種技術，在下述專利文獻1中揭示有一種感測技術，前述感測技術是藉由同時地進行2組(一對發送訊號線與一對接收訊號線)的訊號線(電極)之感測來進行觸控操作位置的檢測，以提升解析度。又，在下述專利文獻2中揭示有所謂的單層方式的構造，前述構造是設成在X、Y方向的電極配線中不設置電極交叉的部分。 There are various technologies known for touch panels. The following patent document 1 discloses a sensing technology. The aforementioned sensing technology is performed by simultaneously performing two sets (a pair of transmitting signal lines and a pair of receiving signal lines). The signal line (electrode) is used to detect the touch operation position to improve the resolution. In addition, the following Patent Document 2 discloses a so-called single-layer structure. The structure is provided so that the electrode wirings in the X and Y directions do not provide intersecting portions of the electrodes.

先前技術文獻 Prior art literature 專利文獻 Patent literature

專利文獻1：日本專利特開2014-219961號公報 Patent Document 1: Japanese Patent Laid-Open No. 2014-219961

專利文獻2：日本專利特開2010-182277號公報 Patent Document 2: Japanese Patent Laid-Open No. 2010-182277

發明概要 Summary of the invention

在觸控面板中維持或提升感測精度是重要的。並且，為了操作的檢測會變得要進行觸控面板的訊號線的掃描，且在靜電電容方式的觸控面板之情況下，是形成為在掃描時，檢測因應於觸控操作所造成的電容變化之來自訊號線的訊號電壓的變化或差分。因此，形成下述情形：成為用於檢測訊號電壓的變化或差分的基準之值的精度，會支配觸控面板操作的感測精度。 It is important to maintain or improve the sensing accuracy in the touch panel. In addition, it is necessary to scan the signal line of the touch panel for operation detection, and in the case of an electrostatic capacitive touch panel, it is formed to detect the capacitance caused by the touch operation during scanning. The change comes from the change or difference of the signal voltage of the signal line. Therefore, there is a situation in which the accuracy that becomes the reference value for detecting the change or difference of the signal voltage will dominate the sensing accuracy of the touch panel operation.

在本發明中，是考慮下述作法：接收來自觸控面板的一對接收訊號線的各接收訊號並進行檢測。特別是進行包含下述動作的感測動作：一面依序切換連接於一邊的接收訊號線之測量用電容部之電容值，一面比較來自一邊與另一邊的接收訊號線的各接收訊號之位準。在此情況下，目的是提高電容值的精度並且提升感測精度。 In the present invention, the following method is considered: receiving and detecting each receiving signal from a pair of receiving signal lines of the touch panel. In particular, the sensing operation includes the following actions: while sequentially switching the capacitance value of the measuring capacitor connected to the receiving signal line on one side, and comparing the level of each received signal from the receiving signal line on one side and the other side . In this case, the purpose is to improve the accuracy of the capacitance value and improve the sensing accuracy.

本發明之觸控面板驅動裝置，是對觸控面板進行掃描的觸控面板驅動裝置，前述掃描是依序選擇相鄰的一對發送訊號線與相鄰的一對接收訊號線之掃描，前述觸控面板驅動裝置具備接收電路，前述接收電路是接收來自前述觸控面板的一對接收訊號線之藉由伴隨於操作的電容變化而使波形變化的各接收訊號，並且生成用於觸控面板操作監視的檢測值。前述接收電路是設成進行下述動作 來生成前述檢測值：一面依序切換連接於一邊的接收訊號線的測量用電容部之電容值，一面比較來自一邊與另一邊的接收訊號線的各接收訊號之位準。並且，在前述測量用電容部中，作為在該測量用電容部的電容值之切換中所使用之形成1個電容值之電容部，設置有藉由複數個電容器的並聯連接或串聯連接來形成某個電容值的電容部。在像這樣的本發明中是利用差動方式來作為觸控面板的感測。亦即，生成相當於來自一對接收訊號線的接收訊號的差分之檢測值。作為用於此的手法，是一面依序切換連接於一邊的接收訊號線的測量用電容部之電容值，一面比較來自一邊與另一邊的接收訊號線的各接收訊號之位準。根據此動作，各接收訊號的位準成為大致同等時的電容值(或電容值的選擇控制訊號)，會成為相當於各接收訊號的差分之值。從而，可以藉由上述動作來生成用於觸控面板操作監視的檢測值。然而，若測量用電容部的各階段的電容值之線性度(linearity)較差，會無法作正確的檢測。於是，作為用於得到各個電容值之形成某個電容值之電容部，而設成設置藉由複數個電容器的並聯連接或串聯連接來形成某個電容值的電容部。藉此，可將電容器的電容的類別減少，並且將電容器間的電容誤差減小。 The touch panel driving device of the present invention is a touch panel driving device that scans a touch panel. The aforementioned scanning is a scan that sequentially selects a pair of adjacent transmitting signal lines and a pair of adjacent receiving signal lines. The touch panel driving device is provided with a receiving circuit, and the receiving circuit receives the received signals from the pair of receiving signal lines of the touch panel whose waveform is changed by the capacitance change accompanying the operation, and generates the signals for the touch panel Operation monitoring detection value. The aforementioned receiving circuit is set to perform the following actions To generate the aforementioned detection value: while sequentially switching the capacitance value of the measuring capacitor connected to the receiving signal line on one side, and comparing the level of each received signal from the receiving signal line on one side and the other side. In addition, in the aforementioned measuring capacitance portion, as a capacitance portion forming one capacitance value used in the switching of the capacitance value of the measurement capacitance portion, it is provided that a plurality of capacitors are connected in parallel or in series. The capacitance part of a certain capacitance value. In the present invention like this, a differential method is used as the sensing of the touch panel. That is, a detection value equivalent to the difference of the received signal from a pair of received signal lines is generated. The method used for this is to sequentially switch the capacitance values of the measuring capacitors connected to the receiving signal line on one side, and to compare the levels of the received signals from the receiving signal line on one side and the other side. According to this action, the capacitance value (or the selection control signal of the capacitance value) when the levels of the received signals become approximately the same will become a value equivalent to the difference of the received signals. Therefore, it is possible to generate a detection value for monitoring the operation of the touch panel by the above-mentioned operation. However, if the linearity of the capacitance value of each stage of the capacitance portion for measurement is poor, accurate detection may not be performed. Therefore, as a capacitor portion that forms a certain capacitance value for obtaining each capacitance value, a capacitor portion that forms a certain capacitance value by connecting a plurality of capacitors in parallel or in series is provided. In this way, the type of capacitance of the capacitor can be reduced, and the capacitance error between the capacitors can be reduced.

在上述之觸控面板驅動裝置中，可考慮下述作法：設成在前述測量用電容部中，全部的前述電容部全部都是藉由特定的電容值的電容器來形成。在測量用電容部中將用於得到各電容值的電容器，全部設為某個特定的 電容值的電容器，藉此將電容器間的電容誤差均一化。 In the above-mentioned touch panel driving device, the following method can be considered: In the above-mentioned measuring capacitor part, all the above-mentioned capacitor parts are formed by capacitors of a specific capacitance value. In the measurement capacitor section, set the capacitors used to obtain each capacitance value to a specific Capacitors of capacitance value, thereby uniformizing the capacitance error between capacitors.

在上述之觸控面板驅動裝置中，可考慮下述作法：在前述測量用電容部中的成為電容值比前述特定的電容值更大的電容部，是藉由前述特定的電容值的複數個電容器的並聯連接所構成。藉由特定的電容值的複數個電容器的並聯連接，可以形成電容值比該電容值更大的電容部。 In the above-mentioned touch panel driving device, the following method can be considered: in the aforementioned measurement capacitor portion, the capacitance portion having a capacitance value larger than the aforementioned specific capacitance value is formed by a plurality of the aforementioned specific capacitance values. Consists of parallel connection of capacitors. By connecting a plurality of capacitors with a specific capacitance value in parallel, a capacitance portion having a capacitance value larger than the capacitance value can be formed.

在上述之觸控面板驅動裝置中，可考慮下述作法：在前述測量用電容部中的成為電容值比前述特定的電容值更小的電容部，是藉由前述特定的電容值的複數個電容器的串聯連接所構成。藉由特定的電容值的複數個電容器的串聯連接，可以形成比電容值比該電容值更小的電容部。 In the above-mentioned touch panel driving device, the following method can be considered: in the aforementioned measuring capacitor portion, the capacitance portion having a capacitance value smaller than the aforementioned specific capacitance value is determined by a plurality of the aforementioned specific capacitance values. Consists of a series connection of capacitors. The series connection of a plurality of capacitors with a specific capacitance value can form a capacitance portion smaller than the capacitance value.

在上述之觸控面板驅動裝置中，可考慮下述作法：在前述測量用電容部中設置有藉由第1特定的電容值的電容器的串聯連接而形成電容值比前述第1特定的電容值更小的前述電容部、以及藉由第2特定的電容值的電容器的並聯連接而形成電容值比前述第2特定的電容值更大的前述電容部。藉由在要得到較小的電容值之情況下利用第1特定的電容值的電容器的串聯連接之作法，又，在要得到較大的電容值之情況下利用第2特定的電容值的電容器的並聯連接之作法，可減少電容器的電容類別。藉此，可將電容器間的電容誤差變小。 In the above-mentioned touch panel driving device, the following method can be considered: the capacitance portion for measurement is provided with a capacitor having a first specific capacitance value connected in series to form a capacitance value greater than the first specific capacitance value. The smaller capacitance portion and the parallel connection of capacitors of the second specific capacitance value form the capacitance portion having a larger capacitance value than the second specific capacitance value. By using a series connection method of capacitors of the first specific capacitance value in the case of obtaining a smaller capacitance value, and using the capacitor of the second specific capacitance value in the case of obtaining a larger capacitance value The method of parallel connection can reduce the capacitance category of the capacitor. Thereby, the capacitance error between capacitors can be reduced.

在上述之觸控面板驅動裝置中，可考慮下述 作法：前述測量用電容部設置有可對於前述一邊的接收訊號線各自並聯地連接的第1電容部至第X電容部之複數個電容部，且前述第1電容部至前述第X電容部之各電容部是可各自獨立且對於前述一邊的接收訊號線開啟/關閉(ON/OFF)連接地構成(X為2以上的自然數)。藉由將第1電容部至第X電容部之各電容部並聯地連接於一邊的接收訊號線，測量用電容部可以藉由電容部的選擇而讓合成電容值以分成複數個階段的方式來改變。 In the above touch panel driving device, the following can be considered Method: The measuring capacitor portion is provided with a plurality of capacitor portions from the first capacitor portion to the Xth capacitor portion that can be connected in parallel to the receiving signal line on the one side, and the first capacitor portion to the Xth capacitor portion Each of the capacitor parts can be configured independently and connected to the receiving signal line on one side (ON/OFF) (X is a natural number greater than 2). By connecting the capacitors from the first capacitor to the X-th capacitor in parallel to the receiving signal line on one side, the capacitor for measurement can be divided into a plurality of stages by selecting the capacitor. change.

在上述之觸控面板驅動裝置中，可考慮下述作法：將前述測量用電容部中的前述第1電容部至第X電容部之各電容部的電容值設為2的乘冪的關係之電容值。例如第1電容部至第X電容部的各電容值是設為具有21、22、23...2X之比例關係的電容值。 In the above-mentioned touch panel driving device, the following method can be considered: the capacitance value of each of the first capacitance portion to the Xth capacitance portion in the measurement capacitance portion is set to a power of two. Capacitance value. For example each of the capacitance value of the capacitor section to the second X capacitor portion is set to have 21, 22, 23 ... capacitance values of 2 X a proportional relationship.

在上述之觸控面板驅動裝置中，可考慮下述作法：在前述測量用電容部中，作為前述電容部，設置有可對於前述一邊的接收訊號線各自並聯地連接的第1電容部至第X電容部之複數個電容部，且前述第1電容部至前述第X電容部之各電容部是可藉由各自對應的開關而獨立且對於前述一邊的接收訊號線開啟/關閉連接地構成，並且對應於以複數個電容器的並聯連接所構成的電容部的前述開關，是藉由連接於前述複數個電容器的每一個的複數個開關元件所構成(X是2以上的自然數)。 In the above-mentioned touch panel driving device, the following method can be considered: in the measurement capacitor portion, as the capacitor portion, a first capacitor portion to a second capacitor portion that can be connected in parallel to each of the receiving signal lines on the one side are provided. A plurality of capacitor portions of the X capacitor portion, and each capacitor portion of the first capacitor portion to the foregoing Xth capacitor portion can be independently constituted by the respective corresponding switches and connected to the receiving signal line on/off of the foregoing side. In addition, the switch corresponding to the capacitor portion formed by connecting a plurality of capacitors in parallel is constituted by a plurality of switching elements connected to each of the plurality of capacitors (X is a natural number of 2 or more).

亦即，相對於藉由並聯連接的電容器所構成的電容部，按每個電容器來設置開關元件，使各開關元件同時地 開啟/關閉，藉此，使其作為該電容部的開關來發揮功能。 That is, with respect to the capacitor portion formed by capacitors connected in parallel, switching elements are provided for each capacitor, so that each switching element is simultaneously Turning on/off allows it to function as a switch of the capacitor section.

本發明的觸控面板裝置是具有觸控面板、及上述的觸控面板驅動裝置而構成。亦即，藉由利用已提高電容精度的觸控面板驅動裝置，以實現感測精度較佳的觸控面板裝置。 The touch panel device of the present invention includes a touch panel and the aforementioned touch panel driving device. That is, by using a touch panel driving device with improved capacitance accuracy, a touch panel device with better sensing accuracy is realized.

根據本發明，作為在測量用電容部的電容值之切換中所使用之形成1個電容值之電容部，設置有藉由複數個電容器的並聯連接或串聯連接來形成某個電容值的電容部，藉此可以抑制配置的電容器的電容類別之數量。藉此，可抑制各電容器的電容誤差之影響，並且可提升測量用電容部賦與於接收訊號線之各階段的電容的線性度。藉此，可以提升觸控面板的感測精度，並且可以提升作為操作位置的座標的再現性或正確性。 According to the present invention, as the capacitance portion forming one capacitance value used for switching the capacitance value of the capacitance portion for measurement, a capacitance portion forming a certain capacitance value by connecting a plurality of capacitors in parallel or in series is provided Therefore, the number of capacitance types of capacitors can be suppressed. Thereby, the influence of the capacitance error of each capacitor can be suppressed, and the linearity of the capacitance imparted to each stage of the receiving signal line by the measurement capacitor can be improved. Thereby, the sensing accuracy of the touch panel can be improved, and the reproducibility or accuracy of the coordinates as the operating position can be improved.

1:觸控面板裝置 1: Touch panel device

2:觸控面板 2: touch panel

3:觸控面板驅動裝置 3: Touch panel drive device

4:感測器IC 4: Sensor IC

5:MCU 5: MCU

21、21-1~21-n:發送訊號線 21, 21-1~21-n: Send signal line

22、22-1~22-m:接收訊號線 22, 22-1~22-m: receiving signal line

31:觸控面板側連接端子部 31: Connecting terminal on the touch panel side

32:製品側連接端子部 32: Product side connection terminal part

41:發送電路 41: sending circuit

42:接收電路 42: receiving circuit

43:多工器 43: Multiplexer

44:介面暫存器電路 44: Interface register circuit

45:電源電路 45: power circuit

90:製品側MCU 90: Product side MCU

411、412:驅動器 411, 412: Drive

421:比較器 421: Comparator

422:基準電容部 422: Reference capacitor

423、425、SW、SW0~SW7:開關 423, 425, SW, SW0~SW7: switch

424:測量用電容部 424: Capacitance part for measurement

426:運算控制部 426: Operation Control Department

A1、A2:位置 A1, A2: location

C22、C23、C32、C33:電容 C22, C23, C32, C33: capacitance

CM、CM0~CM7:電容部 CM, CM0~CM7: Capacitor

S100、S101、S102、S103、S104、S105、S106、S107、S108、S109:步驟 S100, S101, S102, S103, S104, S105, S106, S107, S108, S109: steps

Sg1、Sg2、Sg3:波形 Sg1, Sg2, Sg3: Waveform

Ta、Ti:端子 Ta, Ti: terminal

圖1是本發明之實施形態的觸控面板裝置之方塊圖。 Fig. 1 is a block diagram of a touch panel device according to an embodiment of the present invention.

圖2是實施形態的觸控面板的訊號線構造之說明圖。 2 is an explanatory diagram of the signal line structure of the touch panel of the embodiment.

圖3是實施形態的感測動作之說明圖。 Fig. 3 is an explanatory diagram of the sensing operation of the embodiment.

圖4是實施形態的測量用電容部之說明圖。 Fig. 4 is an explanatory diagram of the measurement capacitor portion of the embodiment.

圖5是實施形態的感測動作順序之流程圖。 Fig. 5 is a flowchart of the sensing operation sequence of the embodiment.

圖6是不同的電容的佈置影像之說明圖。 Figure 6 is an explanatory diagram of the layout images of different capacitors.

圖7是實施形態的測量用電容部之電容器的構成例I之說明圖。 Fig. 7 is an explanatory diagram of a configuration example I of a capacitor of a capacitor for measurement in the embodiment.

圖8是實施形態中的座標檢測精度提升之說明圖。 Fig. 8 is an explanatory diagram of an improvement in the accuracy of coordinate detection in the embodiment.

圖9是電容器電容的製造誤差的影響之說明圖。 Fig. 9 is an explanatory diagram of the influence of manufacturing errors in the capacitance of a capacitor.

圖10是實施形態的測量用電容部之電容器的構成例II之說明圖。 Fig. 10 is an explanatory diagram of a configuration example II of a capacitor of a capacitor for measurement in the embodiment.

圖11是實施形態的測量用電容部之電容器的構成例III之說明圖。 Fig. 11 is an explanatory diagram of a configuration example III of a capacitor of a capacitor for measurement in the embodiment.

圖12是實施形態的測量用電容部之電容器的構成例IV之說明圖。 Fig. 12 is an explanatory diagram of a configuration example IV of a capacitor of a capacitor for measurement in the embodiment.

用以實施發明之形態 The form used to implement the invention

以下，以如下的順序來說明本發明的實施形態。 Hereinafter, the embodiments of the present invention will be described in the following order.

<1.觸控面板裝置之構成> <1. Structure of touch panel device>

<2.感測動作> <2. Sensing action>

<3.用於線性度改善的構成> <3. Composition for linearity improvement>

[3-1：構成例I] [3-1: Configuration example I]

[3-2：構成例II] [3-2: Configuration example II]

[3-3：構成例III] [3-3: Configuration example III]

[3-4：構成例IV] [3-4: Composition Example IV]

<4.實施形態之效果及變形例> <4. Effects and Modifications of the Implementation Mode>

<1.觸控面板裝置之構成> <1. Structure of touch panel device>

將實施形態的觸控面板裝置1的構成例顯示於圖1。 A configuration example of the touch panel device 1 of the embodiment is shown in FIG. 1.

觸控面板裝置1是在各種機器中作為使用者介面裝置而裝設。在此，所謂各種機器，可設想的是例如電子機器、通訊機器、資訊處理裝置、製造設備機器、工作機械、車 輛、航空機、建築設備機器、及其他非常多樣化的領域的機器。觸控面板裝置1是在這些多樣化的機器製品中作為於使用者的操作輸入上所使用的操作輸入器件而被採用。 The touch panel device 1 is installed as a user interface device in various machines. Here, the so-called various machines are, for example, electronic machines, communication machines, information processing equipment, manufacturing equipment, machine tools, and vehicles. Vehicles, aircraft, construction equipment and machinery, and other very diverse fields of machinery. The touch panel device 1 is adopted as an operation input device used for the user's operation input in these various machine products.

在圖1中顯示有觸控面板裝置1與製品側MCU(微控制單元，Micro Control Unit)90，所謂製品側MCU90是指裝設觸控面板裝置1的機器中的控制裝置。觸控面板裝置1是形成為進行下述動作：對製品側MCU90供給使用者的觸控面板操作之資訊。 In FIG. 1, a touch panel device 1 and a product-side MCU (Micro Control Unit) 90 are shown. The product-side MCU 90 refers to a control device in a machine where the touch panel device 1 is installed. The touch panel device 1 is formed to perform the following operation: provide the user's touch panel operation information to the product-side MCU 90.

觸控面板裝置1具有觸控面板2及觸控面板驅動裝置3。觸控面板驅動裝置3具有感測器IC(積體電路，Integrated Circuit)4與MCU5。此觸控面板驅動裝置3是透過觸控面板側連接端子部31來與觸控面板2連接。觸控面板驅動裝置3是透過此連接來進行觸控面板2的驅動(感測)。又，作為操作輸入器件而搭載於機器時，觸控面板驅動裝置3是透過製品側連接端子部32來與製品側MCU90連接。觸控面板驅動裝置3是藉由此連接而將所感測到的操作資訊發送至製品側MCU90。 The touch panel device 1 has a touch panel 2 and a touch panel driving device 3. The touch panel driving device 3 has a sensor IC (Integrated Circuit) 4 and an MCU 5. The touch panel driving device 3 is connected to the touch panel 2 through the touch panel side connection terminal portion 31. The touch panel driving device 3 drives (senses) the touch panel 2 through this connection. In addition, when it is installed in a machine as an operation input device, the touch panel drive device 3 is connected to the product-side MCU 90 through the product-side connection terminal portion 32. The touch panel driving device 3 sends the sensed operation information to the product-side MCU 90 through this connection.

觸控面板驅動裝置3中的感測器IC4具有發送電路41、接收電路42、多工器43、介面暫存器電路44及電源電路45。 The sensor IC 4 in the touch panel driving device 3 has a transmitting circuit 41, a receiving circuit 42, a multiplexer 43, an interface register circuit 44 and a power circuit 45.

感測器IC4的發送電路41是對藉由多工器43所選擇的觸控面板2中的端子輸出發送訊號。又，接收電路42是從藉由多工器43所選擇的觸控面板2中的端子接收訊號，並且進行必要的比較處理。在圖2中示意地顯示發 送電路41、接收電路42、多工器43與觸控面板2的連接狀態。觸控面板2是在形成觸控面的面板平面中，配設作為發送側的電極之n條發送訊號線21-1至21-n。又，同樣地在面板平面中，配設有作為接收側的電極之m條接收訊號線22-1至22-m。 The sending circuit 41 of the sensor IC4 outputs a sending signal to the terminal in the touch panel 2 selected by the multiplexer 43. In addition, the receiving circuit 42 receives signals from the terminals in the touch panel 2 selected by the multiplexer 43 and performs necessary comparison processing. The hair is shown schematically in Figure 2 The connection state of the sending circuit 41, the receiving circuit 42, the multiplexer 43 and the touch panel 2. The touch panel 2 has n transmission signal lines 21-1 to 21-n arranged as electrodes on the transmission side in the panel plane forming the touch surface. Also, in the plane of the panel, m receiving signal lines 22-1 to 22-m are arranged as electrodes on the receiving side.

再者，在不特別區別發送訊號線21-1...21-n、接收訊號線22-1...22-m的情況下，是統稱並表記為「發送訊號線21」、「接收訊號線22」。 Furthermore, if there is no special distinction between the sending signal line 21-1...21-n and the receiving signal line 22-1...22-m, they are collectively referred to as "transmitting signal line 21" and "receiving signal line 21". Signal line 22".

發送訊號線21-1...21-n、接收訊號線22-1...22-m，會有如圖所示地交叉而配設的情況，也會有作為所謂的單層構造，而如上述之專利文獻2所示地配設成不產生交叉的情況。無論為何種情況，均在配設發送訊號線21與接收訊號線22的範圍內形成觸控操作面，並且形成為藉由觸控操作時的電容變化來檢測操作位置的構造。 The transmitting signal lines 21-1...21-n and the receiving signal lines 22-1...22-m may be crossed and arranged as shown in the figure, and may also have a so-called single-layer structure. As shown in the above-mentioned Patent Document 2, it is arranged so that no crossing occurs. In any case, the touch operation surface is formed in the range where the transmitting signal line 21 and the receiving signal line 22 are arranged, and the structure is formed to detect the operation position by the capacitance change during the touch operation.

雖然在圖中僅例示有一部分在發送訊號線21與接收訊號線22之間所產生的電容(電容C22、C23、C32、C33)，但是在觸控操作面的整體存在有在發送訊號線21與接收訊號線22之間所產生的電容(例如交叉位置中的電容)，而變得可藉由接收電路42來檢測已藉由觸控操作而產生電容變化的位置。 Although only a part of the capacitances (capacitors C22, C23, C32, C33) generated between the transmitting signal line 21 and the receiving signal line 22 are illustrated in the figure, there is a transmission signal line 21 in the entire touch operation surface. The capacitance generated between the receiving signal line 22 and the receiving signal line 22 (for example, the capacitance in the cross position) can be detected by the receiving circuit 42 at the position where the capacitance has been changed by the touch operation.

發送電路41是對多工器43所選擇的發送訊號線21-1...21-n輸出發送訊號。在本實施形態中，多工器43進行在各個時間點各選擇2條相鄰的發送訊號線21的掃描。接收電路42是接收來自藉由多工器43所選擇的接收訊 號線22-1...22-m的接收訊號。在本實施形態中，多工器43在各時間點各選擇2條相鄰的接收訊號線22。針對藉由發送電路41、接收電路42所進行的感測動作將於後文描述。 The transmission circuit 41 outputs transmission signals to the transmission signal lines 21-1...21-n selected by the multiplexer 43. In this embodiment, the multiplexer 43 performs scanning for selecting two adjacent transmission signal lines 21 at each time point. The receiving circuit 42 receives the received signal selected by the multiplexer 43 Receiving signals for lines 22-1...22-m. In this embodiment, the multiplexer 43 selects two adjacent reception signal lines 22 at each time point. The sensing operation performed by the transmitting circuit 41 and the receiving circuit 42 will be described later.

返回到圖1來說明。在感測器IC4的介面暫存器電路44中，是藉由MCU5將對發送電路41、多工器43、接收電路42及電源電路45的各種設定資訊寫入。發送電路41、多工器43、接收電路42及電源電路45是各自藉由儲存於介面暫存器電路44的設定資訊而使動作受到控制。 Return to Figure 1 for explanation. In the interface register circuit 44 of the sensor IC4, various setting information for the transmitting circuit 41, the multiplexer 43, the receiving circuit 42 and the power circuit 45 are written by the MCU5. The transmitting circuit 41, the multiplexer 43, the receiving circuit 42 and the power circuit 45 are each controlled by the setting information stored in the interface register circuit 44.

又，在介面暫存器電路44中，是設為可儲存藉由接收電路42所檢測出的檢測值(在說明上也稱為「RAW值」)，而可以供MCU5取得。 In addition, the interface register circuit 44 is configured to store the detection value (also referred to as the "RAW value" in the description) detected by the receiving circuit 42 and make it available to the MCU5.

電源電路45是生成驅動電壓AVCC，並且供給至發送電路41及接收電路42。雖然將於後文描述，發送電路41是將利用了驅動電壓AVCC的脈衝，施加於多工器43所選擇的發送訊號線21。又，接收電路42在感測動作之時，也是對藉由多工器43所選擇的接收訊號線22施加驅動電壓AVCC。關於電源電路45的構成將於之後詳細描述。 The power supply circuit 45 generates the drive voltage AVCC and supplies it to the transmission circuit 41 and the reception circuit 42. Although it will be described later, the transmission circuit 41 applies a pulse using the driving voltage AVCC to the transmission signal line 21 selected by the multiplexer 43. In addition, the receiving circuit 42 also applies the driving voltage AVCC to the receiving signal line 22 selected by the multiplexer 43 during the sensing operation. The configuration of the power supply circuit 45 will be described in detail later.

MCU5是進行感測器IC4的設定、控制。具體而言，MCU5是藉由對介面暫存器電路44寫入必要的設定資訊，以控制感測器IC4的各部分的動作。又，MCU5是將來自接收電路42的RAW值藉由從介面暫存器電路44讀出以取得。並且，MCU5是利用RAW值來進行座標計算，並且進行將作為使用者的觸控操作位置資訊的座標值發送至製品側MCU90的處理。 MCU5 is for setting and controlling the sensor IC4. Specifically, the MCU5 writes necessary setting information into the interface register circuit 44 to control the actions of each part of the sensor IC4. In addition, the MCU5 obtains the RAW value from the receiving circuit 42 by reading it from the interface register circuit 44. In addition, the MCU5 performs coordinate calculation using the RAW value, and performs a process of transmitting the coordinate value as the user's touch operation position information to the product-side MCU 90.

<2.感測動作> <2. Sensing action>

說明以上的構成之由觸控面板裝置1所進行的感測動作。 The sensing operation performed by the touch panel device 1 of the above configuration will be described.

首先，藉由圖3來說明發送電路41、接收電路42相對於觸控面板2的動作。在圖中是於觸控面板2中顯示有2個發送訊號線21-2、21-3、及2個接收訊號線22-2、22-3。在本實施形態的情況下，是成為下述構成：藉由對如之前的圖2所示的發送訊號線21、接收訊號線22，讓發送電路41與接收電路42各自對每相鄰的2條進行發送、接收，來進行觸控操作的檢測。亦即，將一對發送訊號線21與一對接收訊號線22之2條×2條設為基本單元(cell)，並且依序以單元單位來進行檢測掃描。在圖3中是形成為顯示有其中1個單元部分。 First, the operations of the transmitting circuit 41 and the receiving circuit 42 with respect to the touch panel 2 will be described with reference to FIG. 3. In the figure, the touch panel 2 shows two sending signal lines 21-2, 21-3, and two receiving signal lines 22-2, 22-3. In the case of this embodiment, the configuration is as follows: by pairing the transmission signal line 21 and the reception signal line 22 shown in FIG. 2 above, the transmission circuit 41 and the reception circuit 42 are arranged for each adjacent 2 The bar sends and receives to detect touch operations. That is, 2×2 of the pair of transmitting signal lines 21 and the pair of receiving signal lines 22 are set as basic cells, and the detection and scanning are performed in the unit of the cell in sequence. In FIG. 3, it is formed to show one of the unit parts.

發送電路41是對2條發送訊號線21(在圖的情況下為21-2、21-3)，從驅動器411、412輸出驅動電壓AVCC1。亦即，將驅動器411、412的輸出即發送訊號T+、T-供給至藉由多工器43所選擇的發送訊號線21-2、21-3。 The transmission circuit 41 outputs the driving voltage AVCC1 from the drivers 411 and 412 to the two transmission signal lines 21 (21-2 and 21-3 in the case of the figure). That is, the output signals T+ and T- of the drivers 411 and 412 are supplied to the transmission signal lines 21-2 and 21-3 selected by the multiplexer 43.

再者，驅動電壓AVCC1是圖1的電源電路45所生成的驅動電壓AVCC本身、或依據驅動電壓AVCC的電壓。在此情況下，發送電路41是將來自驅動器411的發送訊號T+如圖示地於閒置(Idle)期間設為低位準(以下表記為「L位準」)。例如設為0V。並且，在接著的作動(Active)期間中是設為高位準(以下表記為「H位準」)。在此情況下，作為H位準的訊號具體而言是進行驅動電壓AVCC1的施 加。又，發送電路41是將來自另一個驅動器412的發送訊號T-於閒置期間設為H位準(驅動電壓AVCC1的施加)，並且將接著的作動期間設為L位準。在此，閒置期間是使接收訊號R+、R-的電位安定的期間，作動期間是成為感測接收訊號R+、R-的電位變化的期間。 Furthermore, the driving voltage AVCC1 is the driving voltage AVCC itself generated by the power supply circuit 45 in FIG. 1 or a voltage according to the driving voltage AVCC. In this case, the transmitting circuit 41 sets the transmitting signal T+ from the driver 411 to a low level during the idle period as shown in the figure (hereinafter referred to as "L level"). For example, set to 0V. In addition, it is set to a high level during the next active period (denoted as "H level" in the following table). In this case, the signal of the H level is specifically the application of the driving voltage AVCC1. plus. In addition, the transmitting circuit 41 sets the transmission signal T- from the other driver 412 to the H level during the idle period (application of the driving voltage AVCC1), and sets the subsequent operating period to the L level. Here, the idle period is a period in which the potentials of the received signals R+ and R- are stabilized, and the operating period is a period in which the potential changes of the received signals R+ and R- are sensed.

在此閒置期間、作動期間中，接收電路42是接收來自藉由多工器43所選擇的2個接收訊號線22(在圖的情況下為22-3、22-2)的接收訊號R+、R-。接收電路42具備有比較器421、基準電容部422、開關423、425、測量用電容部424、運算控制部426。來自2個接收訊號線22的接收訊號R+、R-是在比較器421被接收。比較器421是比較接收訊號R+、R-的電位，並且將該比較結果以H位準或L位準的方式輸出至運算控制部426。 In this idle period and active period, the receiving circuit 42 receives the receiving signal R+, the receiving signal from the two receiving signal lines 22 (22-3, 22-2 in the case of the figure) selected by the multiplexer 43. R-. The receiving circuit 42 includes a comparator 421, a reference capacitor section 422, switches 423 and 425, a measurement capacitor section 424, and an arithmetic control section 426. The receiving signals R+ and R- from the two receiving signal lines 22 are received by the comparator 421. The comparator 421 compares the potentials of the received signals R+ and R-, and outputs the comparison result to the arithmetic control unit 426 in an H-level or L-level manner.

在構成基準電容部422的電容器之一端施加有驅動電壓AVCC2。驅動電壓AVCC2是圖1的電源電路45所生成的驅動電壓AVCC本身、或依據驅動電壓AVCC的電壓。構成基準電容部422的電容器的另一端是透過開關423的端子Ta而連接於比較器421的+輸入端子。又，在測量用電容部424的一端施加有驅動電壓AVCC2。此測量用電容部424的另一端是透過開關425的端子Ta而連接於比較器421的-輸入端子。 The drive voltage AVCC2 is applied to one end of the capacitor constituting the reference capacitance portion 422. The driving voltage AVCC2 is the driving voltage AVCC itself generated by the power supply circuit 45 of FIG. 1 or a voltage according to the driving voltage AVCC. The other end of the capacitor constituting the reference capacitance portion 422 is connected to the + input terminal of the comparator 421 through the terminal Ta of the switch 423. In addition, the driving voltage AVCC2 is applied to one end of the measuring capacitor 424. The other end of the measuring capacitor 424 is connected to the-input terminal of the comparator 421 through the terminal Ta of the switch 425.

開關423、425在閒置期間中是選擇端子Ti。從而，在閒置期間是將比較器421的+輸入端子(接收訊號線22-3)、-輸入端子(接收訊號線22-2)進行接地連接，且 接收訊號R+、R-是成為接地電位。開關423、425在作動期間是選擇端子Ta。從而，在作動期間中是對比較器421的+輸入端子(接收訊號線22-3)、-輸入端子(接收訊號線22-2)施加驅動電壓AVCC2。 The switches 423 and 425 select the terminal Ti during the idle period. Therefore, during the idle period, the + input terminal (receiving signal line 22-3) and-input terminal (receiving signal line 22-2) of the comparator 421 are grounded, and The received signals R+ and R- become ground potentials. The switches 423 and 425 select the terminal Ta during operation. Therefore, during the operation period, the driving voltage AVCC2 is applied to the + input terminal (receiving signal line 22-3) and-input terminal (receiving signal line 22-2) of the comparator 421.

在圖3中是以實線來顯示該單元為非觸控狀態時的接收訊號R+、R-的波形。在閒置期間是藉由開關423、425選擇端子Ti，以使接收訊號R+、R-在某個電位(接地電位)安定。當成為作動期間時，是藉由開關423、425選擇端子Ta，而對接收訊號線22-3、22-2施加驅動電壓AVCC2。藉此，接收訊號R+、R-的電位上升△V。在非觸控的狀態下，此△V的電位上升是一起發生於接收訊號R+、R-。另一方面，在發送電路41側，當成為作動期間時，是如上所述地發送訊號T+上升，且發送訊號T-下降。藉此，在有觸控操作的情況下，會使接收訊號R+、R-的電位上升的程度變化。假設對電容C22帶來影響的A1位置已受到觸控的情況下，會使接收訊號R-的電位在作動期間中如虛線所示地上升相當於△VH。又，假設讓電容C32變化的A2位置已受到觸控的情況下，會使接收訊號R-的電位在作動期間中如虛線所示地上升相當於△VL。像這些這樣，因應於對該單元的觸控操作位置，而讓接收訊號R-的電位變化量變得比接收訊號R+的電位變化量(△V)更大或更小。比較器421是形成為對像這樣的接收訊號R+、R-進行比較。 In FIG. 3, the waveforms of the received signals R+ and R- when the unit is in a non-touch state are shown by solid lines. During the idle period, the terminal Ti is selected by the switches 423 and 425 so that the received signals R+ and R- are stable at a certain potential (ground potential). When it becomes the active period, the terminal Ta is selected by the switches 423 and 425, and the driving voltage AVCC2 is applied to the reception signal lines 22-3 and 22-2. As a result, the potentials of the received signals R+ and R- rise by ΔV. In the non-touch state, the potential rise of this ΔV occurs together with the received signals R+ and R-. On the other hand, on the transmission circuit 41 side, when it becomes the active period, the transmission signal T+ rises as described above, and the transmission signal T- falls. As a result, when there is a touch operation, the degree of potential rise of the received signals R+ and R- will change. Assuming that the position A1 that affects the capacitor C22 has been touched, the potential of the received signal R- will rise as shown by the dotted line during the operation period, which is equivalent to ΔVH. Furthermore, assuming that the position A2 where the capacitor C32 changes has been touched, the potential of the received signal R- will rise as indicated by the broken line during the operation period, which is equivalent to ΔVL. Like these, depending on the touch operation position of the unit, the potential change of the received signal R- becomes larger or smaller than the potential change (ΔV) of the received signal R+. The comparator 421 is formed to compare such received signals R+ and R-.

再者，雖然也可以設成將像這樣地變化的接 收訊號R+、R-的電位差量本身作為RAW值(檢測結果)來輸出，但是在本實施形態中，接收電路42是設成：運算控制部426進行測量用電容部424的設定變更，以得到接收訊號R+、R-的電壓平衡，而得到RAW值。運算控制部426是依照已寫入介面暫存器電路44的設定資訊，來進行開關423、425的開啟/關閉或測量用電容部424的電容值之切換處理。又，對比較器421的輸出進行監視，並且以後述之處理來算出RAW值。藉由將在運算控制部426所算出的RAW值寫入介面暫存器電路44，以設成使MCU5可取得。 Furthermore, although it can also be set to change the connection like this The potential difference between the received signals R+ and R- is output as the RAW value (detection result). However, in this embodiment, the receiving circuit 42 is set so that the arithmetic control unit 426 changes the setting of the measurement capacitor unit 424 to obtain The voltage of the received signal R+ and R- is balanced to obtain the RAW value. The arithmetic control section 426 performs the on/off of the switches 423 and 425 or the switching process of the capacitance value of the measurement capacitor section 424 in accordance with the setting information written in the interface register circuit 44. In addition, the output of the comparator 421 is monitored, and the RAW value is calculated by processing described later. By writing the RAW value calculated by the arithmetic control unit 426 into the interface register circuit 44, it is set to be available to the MCU5.

在以上的圖3中，以可變電容電容器的記號所表示的測量用電容部424，是如例如圖4所示地藉由複數個電容部CM(CM0~CM7)與開關SW(SW0~SW7)所構成。再者，圖4是顯示已將開關423、425連接於端子Ta的狀態(作動期間)下的等效電路，並且省略開關423、425的圖示。各電容部CM0~CM7是在驅動電壓AVCC2的電位與比較器421的-輸入端子之間並聯地連接。又，對於各電容部CM0~CM7是各自串聯地連接有開關SW0~SW7。亦即，為可以藉由開關SW0~SW7的開啟/關閉，以變更對接收訊號R-帶來影響的電容部CM之構成。再者，在圖4中雖然是將各電容部CM0~CM7以1個電容器的記號來表示，但是在本實施形態中是如在圖7中並於後文所描述地各自以1個或複數個電容器來構成。又，開關SW0~SW7雖然是各自利用例如FET(場效電晶體，Field effect transistor)等之開關元件所構成，但也有如在圖11等中並於後文所描述 地設置複數個開關元件來作為1個開關SW的情況。 In the above FIG. 3, the measuring capacitance part 424 represented by the symbol of the variable capacitance capacitor is formed by a plurality of capacitance parts CM (CM0~CM7) and switches SW (SW0~SW7) as shown in FIG. ) Constituted. Furthermore, FIG. 4 shows an equivalent circuit in a state (operating period) in which the switches 423 and 425 are connected to the terminal Ta, and the illustration of the switches 423 and 425 is omitted. The capacitors CM0 to CM7 are connected in parallel between the potential of the drive voltage AVCC2 and the −input terminal of the comparator 421. In addition, the switches SW0 to SW7 are connected in series to each of the capacitor portions CM0 to CM7. That is, the configuration of the capacitor CM that affects the received signal R- can be changed by turning on/off the switches SW0 to SW7. In addition, although the capacitors CM0 to CM7 are represented by the symbol of one capacitor in FIG. 4, in this embodiment, they are each represented by one or plural numbers as shown in FIG. 7 and described later. To form a capacitor. In addition, although the switches SW0 to SW7 are each composed of switching elements such as FETs (Field Effect Transistors), they are also similar to those shown in FIG. 11, etc. and described later. When a plurality of switching elements are provided as one switch SW.

各電容部CM0~CM7的電容值是設為例如電容部CM0=2fF(毫微微法拉，femtofarad)、CM1=4fF、CM2=8fF、CM3=16fF、CM4=32fF、CM5=64fF、CM6=128fF、CM7=256fF。電容部CM0至CM7是以位元“0”至位元“7”之8位元之值來進行選擇。電容部CM0及開關SW0是作為位元0來發揮功能，電容部CM1及開關SW1是作為位元“1”來發揮功能，...電容部CM7及開關SW7是作為位元“7”來發揮功能。並且，作為8位元之值可賦與0(=「00000000」)至255(=「11111111」)之電容設定值。電容設定值是MCU5寫入介面暫存器電路44的設定資訊的一個。在接收電路42中，是因應於此8位元的電容設定值來將開關SW0~SW7設為開啟/關閉。亦即，開關SW0~SW7是對應的位元若為「0」時會成為關閉，若為「1」時會成為開啟。藉此，變得可讓測量用電容部424整體的電容值在0fF~510fF的範圍中以可分成256個階段的方式來改變。 The capacitance value of each capacitor part CM0~CM7 is set to, for example, the capacitor part CM0=2fF (femtofarad), CM1=4fF, CM2=8fF, CM3=16fF, CM4=32fF, CM5=64fF, CM6=128fF, CM7=256fF. The capacitor parts CM0 to CM7 are selected with 8-bit values from bit "0" to bit "7". Capacitor CM0 and switch SW0 function as bit 0, capacitor CM1 and switch SW1 function as bit "1",...capacitor CM7 and switch SW7 function as bit "7" Features. And, as an 8-bit value, a capacitance setting value from 0 (= "00000000") to 255 (= "11111111") can be assigned. The capacitance setting value is one of the setting information written into the interface register circuit 44 by the MCU5. In the receiving circuit 42, the switches SW0 to SW7 are set to on/off according to the 8-bit capacitance setting value. That is, the corresponding bits of switches SW0~SW7 will be turned off if they are "0", and they will be turned on if they are "1". Thereby, it becomes possible to change the capacitance value of the entire measuring capacitance portion 424 in a range of 0 fF to 510 fF in 256 stages.

另一方面，接收訊號R+側的基準電容部422的電容器之電容值是設為例如256fF。 On the other hand, the capacitance value of the capacitor of the reference capacitance portion 422 on the side of the received signal R+ is set to, for example, 256 fF.

如上述，接收訊號R-是根據觸控的有無及位置來改變作動期間的波形之電位上升的程度。且變得比接收訊號R+的波形上升程度(△V)更大或更小。 As mentioned above, the received signal R- changes the degree of potential rise of the waveform during the actuation period according to the presence or absence and position of the touch. And it becomes larger or smaller than the waveform rise (△V) of the received signal R+.

在圖4的構成中，可以藉由變更測量用電容部424的電容設定值來使接收訊號R-的波形之電位上升程度變化，並 且可以找出例如成為與接收訊號R+同等的測量用電容部424的電容設定值。 In the configuration of FIG. 4, it is possible to change the level of potential rise of the waveform of the received signal R- by changing the capacitance setting value of the measurement capacitor 424, and In addition, it is possible to find, for example, the capacitance setting value of the measurement capacitor 424 equivalent to the received signal R+.

例如，將圖4的接收訊號R-的虛線所示的波形Sg1設為初始狀態時，若將測量用電容部424的電容減小，接收訊號R-會如波形Sg2所示地變得比波形Sg1更小。又，若將測量用電容部424的電容增大，接收訊號R-會如波形Sg3所示地變得比波形Sg1更大。 For example, when the waveform Sg1 shown by the dotted line of the received signal R- in FIG. 4 is set to the initial state, if the capacitance of the measurement capacitor section 424 is reduced, the received signal R- will become larger than the waveform as shown by the waveform Sg2. Sg1 is smaller. In addition, if the capacitance of the measuring capacitor 424 is increased, the received signal R- becomes larger than the waveform Sg1 as shown by the waveform Sg3.

亦即，在比較器421中接收訊號R+、R-的電壓位準成為同等時的測量用電容部424的電容設定值，是成為與相當於由觸控所造成之接收訊號R-的電壓變化之值等效。從而，一邊觀察比較器421的輸出，一邊使測量用電容部424的電容設定值變化，來搜尋使接收訊號R+、R-的作動期間的電壓成為同等的電容設定值。如此一來，即變得可以讓搜尋出的電容設定值形成作為觸控操作的感測資訊之RAW值。 That is, when the voltage levels of the received signals R+ and R- are equal in the comparator 421, the capacitance setting value of the measurement capacitor 424 is equivalent to the voltage change of the received signal R- caused by touch. The value is equivalent. Therefore, while observing the output of the comparator 421, the capacitance setting value of the measuring capacitance portion 424 is changed, and the voltage during the operation period of the received signals R+ and R- is searched for the same capacitance setting value. In this way, it becomes possible to make the found capacitance setting value form the RAW value as the sensing information of the touch operation.

以圖5來說明以上之感測動作的具體順序。此圖5是顯示依據MCU5已寫入介面暫存器電路44的各種設定資訊，以發送電路41、接收電路42來進行的處理。在圖5中步驟S100至S109的環路處理是顯示對於1個單元(2個發送訊號線21與2個接收訊號線22之組)的感測之順序。再者，在得到RAW值之前，電容設定值是取8個階段之不同的值(從初始狀態開始變更7次)。 Figure 5 illustrates the specific sequence of the above sensing action. This FIG. 5 shows the processing performed by the sending circuit 41 and the receiving circuit 42 according to various setting information that the MCU 5 has written into the interface register circuit 44. The loop processing of steps S100 to S109 in FIG. 5 shows the sequence of sensing for 1 unit (a group of two transmitting signal lines 21 and two receiving signal lines 22). Furthermore, before the RAW value is obtained, the capacitance setting value takes 8 different values (changes 7 times from the initial state).

在步驟S100中首先將變數n作為初始值而設定為n=7。又，接收電路42是依據MCU5的指示(電容設 定值)將測量用電容部424的電容值設定為256fF。亦即，設為電容設定值=128(=10000000)，並藉由只有位元“7”為「1」，而僅將開關SW7設為開啟。 In step S100, first, the variable n is set to n=7 as an initial value. In addition, the receiving circuit 42 is based on the instruction of the MCU5 (capacitance setting Fixed value) The capacitance value of the measuring capacitor 424 is set to 256 fF. That is, set the capacitance setting value=128 (=10000000), and by setting only the bit “7” to “1”, only the switch SW7 is set to open.

在步驟S101中進行閒置期間的設定。 In step S101, the idle period is set.

在發送電路41中，來自驅動器411的發送訊號T+是設為L位準，且發送訊號T-是設為H位準(=驅動電壓AVCC1)。在接收電路42中，是將開關423、425連接於端子Ti。藉此，比較器421的+輸入端子、-輸入端子是進行接地連接。 In the transmission circuit 41, the transmission signal T+ from the driver 411 is set to the L level, and the transmission signal T- is set to the H level (= the driving voltage AVCC1). In the receiving circuit 42, switches 423 and 425 are connected to the terminal Ti. Thereby, the + input terminal and-input terminal of the comparator 421 are grounded.

接著在步驟S102中，是藉由經過規定的期間，以進行從閒置期間至作動期間的切換。在發送電路41中，來自驅動器411的發送訊號T+是設為H位準(=驅動電壓AVCC1)，且來自驅動器412的發送訊號T-是設為L位準。在接收電路42中，是將開關423、425連接於端子Ta。藉此，比較器421的+輸入端子是透過基準電容部422而連接於驅動電壓AVCC2，-輸入端子是透過測量用電容部424而連接於驅動電壓AVCC2。 Next, in step S102, switching from the idle period to the operating period is performed by passing a predetermined period. In the transmission circuit 41, the transmission signal T+ from the driver 411 is set to the H level (= the driving voltage AVCC1), and the transmission signal T- from the driver 412 is set to the L level. In the receiving circuit 42, switches 423 and 425 are connected to the terminal Ta. Thereby, the + input terminal of the comparator 421 is connected to the driving voltage AVCC2 through the reference capacitor section 422, and the − input terminal is connected to the driving voltage AVCC2 through the measurement capacitor section 424.

雖然當成為作動期間時，會使接收訊號R+、R-上升△V，但是會因發送訊號T+上升且發送訊號T-下降，而產生接收訊號R-的變化(上升量成為△VH或△VL)，其中前述接收訊號R-的變化是因應於對於檢測中的單元之觸控操作的有無或觸控操作位置之變化。在步驟S103中，是比較器421比較接收訊號R+、R-，並輸出比較結果。從比較器421為：若為(接收訊號R+)>(接收訊號R-)可得 到H位準輸出，若為(接收訊號R+)<(接收訊號R-)可得到L位準輸出。 Although the receiving signal R+ and R- will rise by △V when it is in the active period, the sending signal T+ will rise and the sending signal T- will fall, resulting in a change in the receiving signal R- (the rise becomes △VH or △VL ), wherein the change of the aforementioned received signal R- is due to the presence or absence of the touch operation or the change of the touch operation position of the unit under test. In step S103, the comparator 421 compares the received signals R+ and R-, and outputs the comparison result. From the comparator 421: if it is (receive signal R+)>(receive signal R-), it can be obtained To H-level output, if it is (receive signal R+)<(receive signal R-), L-level output can be obtained.

步驟S104是因應於比較器421的輸出而將處理分歧。 Step S104 is to divide the processing according to the output of the comparator 421.

若比較器421的輸出為H位準，則在步驟S105中進行測量用電容部424的電容切換。在此情況下，是在已將位元“n”的開關設為開啟的狀態下，將位元“n-1”的開關設為開啟。到那之前如上述地在初始狀態下設為電容設定值=「10000000」而僅將位元“7”設為開啟時，是接著設為電容設定值=「11000000」而將位元“7”與位元“6”設為開啟。亦即，將開關SW7、SW6設為開啟，使測量用電容部424的電容值成為384fF。並且，若在步驟S107中為變數n>0，則在步驟S108中將變數n遞減(decrement)並且返回到步驟S101。亦即，在已將測量用電容部424的電容增大後，進行閒置期間、作動期間的動作並確認比較器421的輸出。 If the output of the comparator 421 is at the H level, the capacitance switching of the measurement capacitor 424 is performed in step S105. In this case, the switch of bit "n-1" is set to on in a state where the switch of bit "n" has been set to on. Before that, set the capacitance setting value = "10000000" in the initial state as described above and only set the bit "7" to on, then set the capacitance setting value = "11000000" and set the bit "7" And bit "6" is set to on. That is, the switches SW7 and SW6 are turned on, so that the capacitance value of the measurement capacitor 424 becomes 384 fF. And, if the variable n>0 in step S107, the variable n is decremented in step S108 and the process returns to step S101. That is, after the capacitance of the measuring capacitor 424 has been increased, the operation during the idle period and the active period is performed, and the output of the comparator 421 is checked.

又，在步驟S104中若比較器421的輸出為L位準，則在步驟S106中進行測量用電容部424的電容切換。在此情況下，將位元“n”的開關設為關閉，並且將位元“n-1”的開關設為開啟。若在那之前在初始狀態下設為電容設定值=「10000000」而僅將位元“7”設為開啟時，接著是設為電容設定值=「01000000」而將位元“7”設為關閉，且將位元“6”設為開啟。亦即，將開關SW7設為關閉並且將開關SW6設為開啟，使測量用電容部424的電容 值成為128fF。並且，若在步驟S107中為變數n>0，則在步驟S108中將變數n遞減(decrement)並且返回到步驟S101。亦即，在已將測量用電容部424的電容減小後，進行閒置期間、作動期間的動作並且確認比較器421的輸出。 In addition, if the output of the comparator 421 is at the L level in step S104, the capacitance switching of the measurement capacitor 424 is performed in step S106. In this case, set the switch of bit "n" to off, and set the switch of bit "n-1" to on. If you set the capacitance setting value = "10000000" in the initial state before then and only set the bit "7" to on, then set the capacitance setting value = "01000000" and set the bit "7" to Turn off, and set bit "6" to on. That is, the switch SW7 is turned off and the switch SW6 is turned on, so that the capacitance of the measuring capacitor 424 is The value becomes 128fF. And, if the variable n>0 in step S107, the variable n is decremented in step S108 and the process returns to step S101. That is, after the capacitance of the measuring capacitor 424 has been reduced, the operation during the idle period and the active period is performed, and the output of the comparator 421 is checked.

藉由將此處理進行到成為變數n=0為止，即可判定已達到接收訊號R-的作動期間的電壓值與接收訊號R+的作動期間的電壓值之平衡時的電容設定值。再者，在變數n=0時的步驟S105、S106中，由於位元“n-1”並不存在，因此不進行位元“n-1”的處理。在步驟S107中已成為變數n=0後，即前進至步驟S109，且接收電路42會算出RAW值。這會成為下述之處理：在測量用電容部424中取已成為開啟的開關SW的位元之2的乘冪的總和。例如假設在最後已設為開關SW5、SW3、SW2成為開啟後，即成為25+23+22=44，而成為RAW值=44。 By carrying out this process until the variable n=0, it can be determined that the voltage value during the operation period of the received signal R- and the voltage value during the operation period of the received signal R+ have reached the balance of the capacitance setting value. In addition, in steps S105 and S106 when the variable n=0, since the bit "n-1" does not exist, the bit "n-1" is not processed. After the variable n=0 in step S107, proceed to step S109, and the receiving circuit 42 will calculate the RAW value. This will be a process of taking the sum of the powers of 2 of the bits of the switch SW that have been turned on in the measurement capacitor section 424. For example, suppose that after the switches SW5, SW3, and SW2 are turned on at the end, it becomes 2 5 +2 3 +2 2 =44, and becomes the RAW value =44.

如此求出的RAW值是透過介面暫存器電路44作為1個單元的檢測值而被MCU5所取得。針對觸控面板2中的各單元(2條發送訊號線21與2條接收訊號線22之組)可同樣地進行圖5的處理，而求出RAW值。MCU5是取得針對各單元的RAW值，並且進行觸控操作位置的座標計算，而將所求出的座標值發送至製品側MCU90。 The RAW value obtained in this way is obtained by the MCU 5 as a detection value of one unit through the interface register circuit 44. For each unit in the touch panel 2 (a group of two transmitting signal lines 21 and two receiving signal lines 22), the processing of FIG. 5 can be performed in the same manner to obtain the RAW value. The MCU5 obtains the RAW value for each cell, performs the coordinate calculation of the touch operation position, and sends the obtained coordinate value to the product-side MCU90.

在本實施形態中藉由取接收訊號R+、R-的差分來作為如以上的感測動作，可以使所取得的RAW值變得難以受到來自外部環境的影響，且可以提升觸控操作的檢測精度。尤其是設成在非觸控時是已達到接收訊號R+、 R-的電位之平衡，並設為藉由觸控所造成的電容變化而在接收訊號R+、R-的電位上產生差異。將此進行成使測量用電容部424的電容依序變化，並搜尋可達到接收訊號R+、R-的平衡之電容值，而從指定該電容值的電容設定值中得到RAW值。藉此，可以正確地檢測起因於藉由觸控操作所造成的電容變化之接收訊號R+、R-的差分。 In this embodiment, by taking the difference of the received signal R+ and R- as the above-mentioned sensing operation, the obtained RAW value can be made difficult to be affected by the external environment, and the detection of touch operation can be improved. Accuracy. Especially if it is set to reach the receiving signal R+, The balance of the potential of R- is set to produce a difference in the potential of the received signal R+ and R- due to the capacitance change caused by touch. This is done so that the capacitance of the measuring capacitor 424 is sequentially changed, and the capacitance value that can achieve the balance of the received signals R+ and R- is searched, and the RAW value is obtained from the capacitance setting value that specifies the capacitance value. In this way, the difference between the received signals R+ and R- caused by the capacitance change caused by the touch operation can be accurately detected.

再者，作為從接收電路42施加驅動電壓AVCC2來對所選擇的接收訊號線22充電之理由主要有2個。1個是觸控面板2為單層構造時的情形。在單層構造的情況下，在非觸控的狀態下，發送訊號線21與接收訊號線22之間幾乎不會產生電容。亦即，發送訊號線21與接收訊號線22之間(電極間)為絕緣狀態。但是即使在非觸控狀態下，仍然必須設為使接收訊號波形在作動期間上升。藉由為此而發送驅動電壓AVCC2，以進行成即使是對單層的情況也對應並良好地完成上述的感測動作。又，另1個理由並不限定於單層之情形。在上述的感測方式中，雖然是形成為觀看已進入作動期間後的接收訊號R-的電位上升幅度之情形，但是對由發送訊號T-的下降所造成的影響也欲掌握。亦即，必須也觀測圖3中以虛線表示的△VL的電位上升。當作動期間中的非觸控狀態下的接收訊號R+、R-的電位為0V時，在受到下降的影響之情況下，會使接收訊號R-的電位成為負值，而成為在接收電路42中難以處理的電位。於是，設成先讓接收訊號R-的電位提高以免成為0V以下，且為了容易且適當地觀測由發送訊號T-的下降的影 響所造成的接收波形的電位，因而施加有驅動電壓AVCC2。 Furthermore, there are mainly two reasons for applying the driving voltage AVCC2 from the receiving circuit 42 to charge the selected receiving signal line 22. One is when the touch panel 2 has a single-layer structure. In the case of a single-layer structure, in the non-touch state, there is almost no capacitance between the transmitting signal line 21 and the receiving signal line 22. That is, the transmission signal line 21 and the reception signal line 22 (between the electrodes) are in an insulated state. But even in the non-touch state, it must still be set to make the received signal waveform rise during the actuation period. By sending the driving voltage AVCC2 for this purpose, the above-mentioned sensing operation can be completed satisfactorily even in the case of a single layer. In addition, the other reason is not limited to the case of a single layer. In the above-mentioned sensing method, although it is formed to observe the rising amplitude of the potential of the received signal R- after the active period has entered, it is also necessary to grasp the influence caused by the drop of the transmitted signal T-. That is, it is necessary to also observe the potential rise of ΔVL indicated by the broken line in FIG. 3. When the potential of the received signal R+ and R- in the non-touch state during the active period is 0V, under the influence of the drop, the potential of the received signal R- will become a negative value, and it will become in the receiving circuit 42 Potential that is difficult to handle. Therefore, it is assumed that the potential of the received signal R- is increased first so as not to become below 0V, and in order to easily and appropriately observe the influence of the drop of the transmitted signal T- The potential of the received waveform caused by the noise, therefore, the driving voltage AVCC2 is applied.

<3.用於線性度改善的構成> <3. Composition for linearity improvement>

[3-1：構成例I] [3-1: Configuration example I]

然而，在藉由如以上地一面切換測量用電容部424的電容值一面比較接收訊號R+、R-，以檢測觸控時的電容變化的感測動作中，與其檢測精度非常相關的是測量用電容部424的電容值的線性度(Linearity)。 However, in the sensing operation that detects changes in capacitance during touch by switching the capacitance value of the measurement capacitor 424 while comparing the received signals R+ and R- as described above, the measurement accuracy is very related to the measurement accuracy. The linearity of the capacitance value of the capacitance portion 424.

例如當成為電容設定值=63(=00111111)且開關SW0至SW5為開啟時，測量用電容部424的電容值應該是成為126fF，又，當成為電容設定值=64(=01000000)且僅開關SW6為開啟時，測量用電容部424的電容值應該是成為128fF。 For example, when the capacitance setting value=63 (=00111111) and the switches SW0 to SW5 are on, the capacitance value of the measuring capacitor 424 should become 126fF, and when it becomes the capacitance setting value=64 (=01000000) and only switches When SW6 is turned on, the capacitance value of the measurement capacitor 424 should be 128 fF.

在此設為假設電容部CM0~CM7各自為1個電容器。例如電容部CM0是設為2fF的電容器，電容部CM1是設為4fF的電容器，電容部CM2是設為8fF的電容器，...電容部CM7是設為256fF的電容器。在圖6中所顯示的是像這樣各自使用1個電容器的情況下之各電容部CM的電容器之面積。如上述，在電容設定值=63時，是藉由電容部CM0~CM5之6個電容器的並聯連接，以使測量用電容部424的電容值成為126fF，且在電容設定值=64時是藉由電容部CM6以使測量用電容部424的電容值成為128fF。然而，有例如2fF之類的極小電容的電容器，要設為正確的電容會較困難的情形。又，也有面積越小的電容器越容易 受到製造誤差的影響之情形。從這些情形來看，有下述情形：由電容部CM0~CM5的6個電容器的並聯連接所形成的電容因製造誤差的影響並不是成為126fF，而是成為比128fF更大。如此一來，會導致電容設定值=64的電容變得比電容設定值=63時的電容更小。如此，在應以電容設定值來控制的256個階段的電容值中，有發生大小關係的逆轉現象之情形。將發生大量這樣的逆轉現象的狀態稱為線性度變差的狀態。並且，如考慮上述之圖5的處理而可理解地，當線性度變差時，會變得無法正確地生成RAW值。 Here, it is assumed that the capacitance portions CM0 to CM7 are each one capacitor. For example, the capacitance portion CM0 is a 2fF capacitor, the capacitance portion CM1 is a 4fF capacitor, the capacitance portion CM2 is a 8fF capacitor, ... the capacitance portion CM7 is a 256fF capacitor. What is shown in FIG. 6 is the area of the capacitor of each capacitor portion CM when one capacitor is used in this way. As mentioned above, when the capacitance setting value=63, the 6 capacitors of the capacitance section CM0~CM5 are connected in parallel so that the capacitance value of the measuring capacitance section 424 becomes 126fF, and when the capacitance setting value=64, it is borrowed The capacitance value of the measuring capacitance portion 424 is 128 fF by the capacitance portion CM6. However, there are very small capacitance capacitors such as 2fF, and it is difficult to set the correct capacitance. Also, there are capacitors with a smaller area, the easier it is Conditions affected by manufacturing errors. Judging from these situations, there are cases where the capacitance formed by the parallel connection of the six capacitors of the capacitor portions CM0 to CM5 is not 126fF but larger than 128fF due to the influence of manufacturing errors. As a result, the capacitance with the capacitance setting value=64 will become smaller than the capacitance when the capacitance setting value=63. In this way, in the 256-stage capacitance value that should be controlled by the capacitance setting value, there may be a reversal phenomenon of the magnitude relationship. A state in which a large number of such reversal phenomena occurs is called a state in which linearity is degraded. And, as understood from the processing of FIG. 5 described above, when the linearity deteriorates, it becomes impossible to generate the RAW value correctly.

於是，在本實施形態中，在測量用電容部424中，是藉由設為將用於得到所切換的各電容部CM0~CM7的複數個電容器，全部都藉由特定的電容值的電容器來形成，以改善線性度。 Therefore, in the present embodiment, in the measurement capacitor section 424, a plurality of capacitors used to obtain the switched capacitor sections CM0 to CM7 are all made of capacitors with specific capacitance values. Formed to improve linearity.

在圖7中顯示具體例。如圖4中所說明，測量用電容部424的電容部CM0~CM7是2fF、4fF、8fF、16fF、32fF、64fF、128fF、256fF。將此全部都以16fF的電容器來構成。 A specific example is shown in FIG. 7. As illustrated in FIG. 4, the capacitance portions CM0 to CM7 of the measurement capacitance portion 424 are 2fF, 4fF, 8fF, 16fF, 32fF, 64fF, 128fF, and 256fF. All of these are constructed with 16fF capacitors.

電容部CM3是以1個16fF的電容器來構成。電容部CM4是以2個16fF的電容器的並聯連接來構成32fF的電容。電容部CM5是以4個16fF的電容器的並聯連接來構成64fF的電容。 The capacitor CM3 is composed of one 16fF capacitor. The capacitor CM4 is a parallel connection of two 16fF capacitors to form a 32fF capacitor. The capacitor CM5 is a parallel connection of four 16fF capacitors to form a 64fF capacitor.

電容部CM6是以8個16fF的電容器的並聯連接來構成128fF的電容。電容部CM7是以16個16fF的電容器的並聯連接來構成256fF的電容。電容部CM2是以2個16fF的電容 器的串聯連接來構成8fF的電容。電容部CM1是以4個16fF的電容器的串聯連接來構成4fF的電容。電容部CM0是以8個16fF的電容器的串聯連接來構成2fF的電容。 The capacitor CM6 is a parallel connection of eight 16fF capacitors to form a 128fF capacitor. The capacitance portion CM7 is a parallel connection of 16 16fF capacitors to form a 256fF capacitance. Capacitor CM2 is two 16fF capacitors The series connection of the device forms an 8fF capacitor. The capacitance portion CM1 is a series connection of four 16fF capacitors to form a 4fF capacitance. The capacitor CM0 is a series connection of eight 16fF capacitors to form a 2fF capacitor.

將藉由如此構成所產生的線性度改善效果顯示於圖8。圖8A是將各電容部CM0~CM7各自以電容值不同的1個電容器來形成的情況，圖8B是將各電容部CM0~CM7如圖7所示地全部以相同的電容值的電容器來形成的情況。橫軸是顯示作為電容設定值的0~255。縱軸是設為輸出電壓Vc。此輸出電壓Vc是指在不將測量用電容部424連接於接收訊號線22的狀態下，施加驅動電壓AVCC2時的上升波形的電壓值(輸出至比較器421側的電壓值)。所觀測的輸出電壓Vc是成為間接地表示測量用電容部424的各階段的電容值之電壓。 The linearity improvement effect produced by this configuration is shown in FIG. 8. Fig. 8A is a case where each of the capacitor parts CM0 to CM7 is formed with one capacitor with a different capacitance value. Fig. 8B is a case where the capacitor parts CM0 to CM7 are all formed with capacitors of the same capacitance value as shown in Fig. 7 Case. The horizontal axis shows 0~255 as the capacitance setting value. The vertical axis is the output voltage Vc. This output voltage Vc refers to the voltage value of the rising waveform (the voltage value output to the comparator 421 side) when the driving voltage AVCC2 is applied without connecting the measurement capacitor 424 to the reception signal line 22. The observed output voltage Vc is a voltage that indirectly indicates the capacitance value of each stage of the measuring capacitor 424.

在圖8A的情況下，可看到測量用電容部424的電容值的線性度較差之情形。亦即，所觀測的輸出電壓Vc(電容值)的上下變動較大，線性度擾動得較大。另一方面，在圖8B中所觀測的輸出電壓Vc(電容值)的上下變動已相當地受到抑制，可知線性度已相當地得到改善。 In the case of FIG. 8A, it can be seen that the linearity of the capacitance value of the measurement capacitor 424 is poor. That is, the observed output voltage Vc (capacitance value) fluctuates greatly, and the linearity is greatly disturbed. On the other hand, the fluctuation of the output voltage Vc (capacitance value) observed in FIG. 8B has been considerably suppressed, and it can be seen that the linearity has been considerably improved.

可以將如圖7所示地將各電容部CM0~CM7全部以相同的電容值的電容器來形成的情況下可改善線性度的理由考慮如下。 The reason why the linearity can be improved in the case where all the capacitance portions CM0 to CM7 are formed with capacitors of the same capacitance value as shown in FIG. 7 can be considered as follows.

電容器的電容是依賴於面積或周邊長度。並且，可將IC內的電容器的佈置之成品尺寸的誤差表現為電容誤差。此時，佈置面積越大越難以受到尺寸誤差的影響，面 積越小變得越容易受到影響。再者，基本上(理論上)電容器電容是與面積成比例。 The capacitance of a capacitor is dependent on the area or peripheral length. Moreover, the error of the finished product size of the arrangement of the capacitor in the IC can be expressed as a capacitance error. At this time, the larger the layout area, the harder it is to be affected by dimensional errors. The smaller the product, the more susceptible it becomes. Furthermore, basically (theoretically) the capacitance of a capacitor is proportional to the area.

在此，在圖9A中所顯示的是16fF與64fF的設計尺寸與成品尺寸的例子。設為16fF的電容器是設計尺寸為5μm×5μm的正方形，64fF的電容器是設計尺寸為10μm×10μm的正方形。在此，設想在IC上的成品尺寸已成為+0.1μm的情況。16fF的電容器是成為成品尺寸為5.1μm×5.1μm的正方形，64fF的電容器是成為成品尺寸為10.1μm×10.1μm的正方形。 Here, shown in FIG. 9A is an example of the design size and finished size of 16fF and 64fF. The capacitor set to 16fF is a square with a design size of 5 μm×5 μm, and the capacitor of 64fF is a square with a design size of 10 μm×10 μm. Here, suppose that the size of the finished product on the IC has become +0.1μm. The 16fF capacitor is a square with a finished size of 5.1 μm×5.1 μm, and the 64fF capacitor is a square with a finished size of 10.1 μm×10.1 μm.

16fF的電容的變化量是成為(5.1μm×5.1μm)÷(5μm×5μm)=1.04，而形成為產生有4%的電容誤差之情形。64fF的電容的變化量是成為(10.1μm×10.1μm)÷(10μm×10μm)=1.01，而形成為產生有2%的電容誤差之情形。 The amount of change in the capacitance of 16fF is (5.1μm×5.1μm)÷(5μm×5μm)=1.04, and a capacitance error of 4% occurs. The amount of change in the capacitance of 64fF is (10.1μm×10.1μm)÷(10μm×10μm)=1.01, and a 2% capacitance error occurs.

將成品尺寸設為+0.1μm並同樣地計算時，實際的電容即成為如下所述。 When the product size is set to +0.1μm and calculated in the same way, the actual capacitance becomes as follows.

‧16fF：4%的誤差=16.64 ‧16fF: 4% error = 16.64

‧32fF：2.8%的誤差=32.9fF ‧32fF: 2.8% error = 32.9fF

‧64fF：2%的誤差=65.28fF ‧64fF: 2% error=65.28fF

‧128fF：1.4%的誤差=129.79fF ‧128fF: 1.4% error=129.79fF

‧256fF：1%的誤差=258.56fF ‧256fF: 1% error=258.56fF

在此，將測量用電容部424的電容值設為254fF的情況下，是取電容部CM0~CM6的各電容值的總和。該電容部CM0~CM6的各電容值的總和，即使將2fF 至8fF的誤差設為與16fF相同的4%，仍然會成為2.08+4.16+8.32+16.64+32.9+65.28+129.79=259.17[fF]。亦即，欲將電容設為「254fF」時的電容值成為「259.17fF」。另一方面，由於實際的「256fF」的電容器是因上述的誤差而為258.56fF，因此會成為「254fF」≧「256fF」而導致發生逆轉現象。亦即，成品尺寸的誤差所帶來的電容誤差按每個電容而偏差，因而使這樣的逆轉現象在例如256階段之類的可變電容的各階段中大量發生，而使線性度惡化。 Here, when the capacitance value of the measuring capacitance portion 424 is 254 fF, the sum of the capacitance values of the capacitance portions CM0 to CM6 is taken. The sum of the capacitance values of the capacitors CM0~CM6, even if 2fF The error to 8fF is set to the same 4% as 16fF, and it will still become 2.08+4.16+8.32+16.64+32.9+65.28+129.79=259.17[fF]. That is, the capacitance value when the capacitance is to be set to "254fF" becomes "259.17fF". On the other hand, since the actual "256fF" capacitor is 258.56fF due to the above-mentioned error, it will become "254fF"≧"256fF" and a reversal phenomenon will occur. That is, the capacitance error caused by the error of the finished product size varies for each capacitor, so that such reversal phenomenon occurs in a large amount in each stage of the variable capacitor such as 256 stages, and the linearity is deteriorated.

相對於此，由於在本實施形態的情況下僅使用「16fF」的電容器，因此成品尺寸的誤差對各電容器所帶來的電容誤差成為幾乎均一。如此一來，於各電容部CM所產生的電容誤差，無論該電容的大小如何，都會成為幾乎相同的誤差。亦即，如圖9B所示，當假設為成品尺寸為+0.1μm而和上述同樣地計算時，實際的電容會成為如下所述。全部的電容器成為5.1μm×5.1μm的正方形之情況。 On the other hand, since only the "16fF" capacitor is used in the case of the present embodiment, the error in the product size is almost uniform for the capacitance error caused by each capacitor. In this way, the capacitance error generated in each capacitance portion CM will become almost the same error regardless of the size of the capacitance. That is, as shown in FIG. 9B, when the product size is assumed to be +0.1 μm and calculated in the same manner as described above, the actual capacitance will be as follows. All capacitors have a square shape of 5.1 μm×5.1 μm.

‧16fF的電容部CM3：4%誤差=16.64fF ‧16fF capacitor part CM3: 4% error=16.64fF

‧32fF的電容部CM4：16.64fF×2=33.28fF ‧32fF capacitor part CM4: 16.64fF×2=33.28fF

‧64fF的電容部CM5：16.64fF×4=66.56fF ‧64fF capacitor part CM5: 16.64fF×4=66.56fF

‧128fF的電容部CM6：16.64fF×8=133.12fF ‧128fF capacitor part CM6: 16.64fF×8=133.12fF

‧256fF的電容部CM7：16.64fF×16=266.24fF ‧ 256fF capacitor part CM7: 16.64fF×16=266.24fF

在此情況下，由於電容誤差全部都是4%，因此不會發生如上述之「254fF」≧「256fF」的逆轉現象。因此，變得可大幅地改善線性度。 In this case, since the capacitance error is all 4%, the above-mentioned "254fF" ≧ "256fF" reversal phenomenon will not occur. Therefore, it becomes possible to greatly improve linearity.

[3-2：構成例II] [3-2: Configuration example II]

說明用於線性度改善的測量用電容部424的其他構成(構成例II)。如之前的圖7所示，可以藉由全部以相同的電容值的電容器來形成各電容部CM0~CM7以改善線性度，在圖10中則顯示可以進一步提升電容精度的情形。 A description will be given of another configuration of the measurement capacitor 424 for improving linearity (Configuration Example II). As shown in FIG. 7 before, the capacitor portions CM0 to CM7 can be formed by all capacitors with the same capacitance value to improve linearity. FIG. 10 shows a situation where the accuracy of the capacitance can be further improved.

在圖10的測量用電容部424中電容部CM0~CM7的構成是與圖7相同，全部都是利用16fF的電容器來構成。在此圖10中，是將對應於藉由複數個電容器的並聯連接所構成的電容部CM4~CM7之開關SW4~SW7，設置成開關元件各自以1：1的方式對應於電容元件。 The configuration of the capacitor portions CM0 to CM7 in the measurement capacitor portion 424 in FIG. 10 is the same as that of FIG. 7, and all are configured with 16 fF capacitors. In this FIG. 10, the switches SW4 to SW7 corresponding to the capacitor portions CM4 to CM7 formed by the parallel connection of a plurality of capacitors are arranged so that the switch elements each correspond to the capacitor element in a 1:1 manner.

例如電容部CM4是設成藉由2個16fF的電容器的並聯連接而得到32fF，作為開關SW4則是設成設置與此2個電容器的每一個相對應的2個開關元件。開關SW5、SW6、SW7也是同樣。例如電容部CM7是設成藉由16個16fF的電容器的並聯連接而得到256fF，作為對應於此的開關SW7則是設成設置與此16個電容器相對應的16個開關元件。如此，針對作為測量用電容部424內的電容部CM而並聯連接的電容器，是對應於1個1個的16fF的電容器來設置開關元件。 For example, the capacitor portion CM4 is set to obtain 32fF by connecting two 16fF capacitors in parallel, and the switch SW4 is set to provide two switching elements corresponding to each of the two capacitors. The same applies to switches SW5, SW6, and SW7. For example, the capacitor portion CM7 is set to obtain 256fF by connecting 16 16fF capacitors in parallel, and as the switch SW7 corresponding to this, 16 switching elements corresponding to the 16 capacitors are provided. In this way, the capacitors connected in parallel as the capacitance portion CM in the measurement capacitance portion 424 are provided with switching elements corresponding to each of the 16 fF capacitors.

構成與1個電容部CM相對應的開關SW之複數個開關元件，是同時受到開啟/關閉控制。例如開關SW4的2個開關元件，是在選擇電容部CM4時同時設為開啟，又，將電容部CM4從整體的電容排除時是同時設為關閉。 The plurality of switching elements constituting the switch SW corresponding to one capacitor portion CM are simultaneously controlled on/off. For example, the two switching elements of the switch SW4 are simultaneously turned on when the capacitor portion CM4 is selected, and when the capacitor portion CM4 is excluded from the overall capacitance, they are simultaneously turned off.

如此，藉由將開關元件也並聯地形成，即可以促進線性度的改善。雖然在電容部CM的電容器與開關SW的開關元件的配線間會產生寄生電容，但是在電容部CM4~CM7中，藉由對並聯的各電容器各自連接開關元件，即可以謀求寄生電容的均一化，並可以藉此減少起因於寄生電容的電容誤差，並形成精度較高的電容值。從而，可以有助於線性度的改善。 In this way, by forming the switching elements in parallel, the linearity improvement can be promoted. Although parasitic capacitance occurs between the wiring of the capacitor of the capacitor portion CM and the switching element of the switch SW, in the capacitor portions CM4 to CM7, by connecting the switching element to each capacitor in parallel, the parasitic capacitance can be made uniform. , And can reduce the capacitance error caused by the parasitic capacitance, and form a higher precision capacitance value. Thus, it can contribute to the improvement of linearity.

[3-3：構成例III] [3-3: Configuration example III]

以圖11來說明測量用電容部424的構成例III。 The configuration example III of the measurement capacitor 424 will be described with reference to FIG. 11.

這是針對電容部CM0~CM7，利用第1特定的電容值的電容器與第2特定的電容值的電容器之例子。 This is an example of using a capacitor with a first specific capacitance value and a capacitor with a second specific capacitance value for the capacitor portions CM0 to CM7.

將第1特定的電容值的電容器設為16fF的電容器，並且將第2特定的電容值的電容器設為32fF的電容器。針對電容部CM0~CM3是利用第1特定的電容值即16fF的電容器，而和圖7的例子同樣地構成。 The capacitor of the first specific capacitance value is a 16fF capacitor, and the capacitor of the second specific capacitance value is a 32fF capacitor. The capacitors CM0 to CM3 are capacitors using the first specific capacitance value, that is, 16 fF, and are configured in the same manner as the example in FIG. 7.

另一方面，針對電容部CM4~CM7是利用第2特定的電容值即32fF的電容器，而如下地構成。電容部CM4是以1個32fF的電容器來構成。電容部CM5是以2個32fF的電容器的並聯連接來構成64fF的電容。電容部CM6是以4個32fF的電容器的並聯連接來構成128fF的電容。電容部CM7是以8個32fF的電容器的並聯連接來構成256fF的電容。 On the other hand, the capacitor portions CM4 to CM7 are capacitors using a second specific capacitance value of 32 fF, and are configured as follows. The capacitor CM4 is composed of one 32fF capacitor. The capacitor CM5 is a parallel connection of two 32fF capacitors to form a 64fF capacitor. The capacitor CM6 is a parallel connection of four 32fF capacitors to form a 128fF capacitor. The capacitor CM7 is a parallel connection of eight 32fF capacitors to form a 256fF capacitor.

再者，在此圖11的例子中，如之前的圖10所示，在將電容器並聯連接的情況下，是設為各自連接開關 元件。亦即，在與圖11的電容部CM5~CM7相對應的開關SW5~SW7中，是設為配置各自與電容器相對應的開關元件之例子。當然並不限定於此，亦可如圖7所示地將與電容部CM5~CM7相對應的開關SW5~SW7以1個開關元件來形成。 Furthermore, in the example of FIG. 11, as shown in the previous FIG. 10, in the case of connecting capacitors in parallel, it is set as respective connection switches element. That is, in the switches SW5 to SW7 corresponding to the capacitor portions CM5 to CM7 in FIG. 11, it is an example in which switching elements corresponding to the capacitors are arranged. Of course, it is not limited to this, and the switches SW5 to SW7 corresponding to the capacitor portions CM5 to CM7 may be formed with one switching element as shown in FIG. 7.

如此圖11所示，利用第1特定的電容值的電容器與第2特定的電容值的電容器，而以較少的電容類別(16fF與32fF之2個種類的電容)的電容器來形成電容部CM0~CM7，藉此相較於各自以1個電容元件(8個種類的電容的電容器)來形成電容部CM0~CM7的全部之情況，可以減小電容誤差的影響，而對線性度改善變得有效。再者，將第1、第2特定的電容值的電容器設為16fF、32fF的電容器不過只是一個例子。當然也可以採用其他的電容值。 As shown in FIG. 11, a capacitor with a first specific capacitance value and a capacitor with a second specific capacitance value are used, and capacitors of a smaller capacitance type (two types of capacitors of 16fF and 32fF) are used to form the capacitor portion CM0. ~CM7, compared with the case where all the capacitance parts CM0~CM7 are formed by 1 capacitance element (capacitors of 8 types of capacitance), the influence of capacitance error can be reduced, and the linearity improvement becomes effective. In addition, the capacitors of the first and second specific capacitance values as 16fF and 32fF are just an example. Of course, other capacitance values can also be used.

[3-4：構成例IV] [3-4: Composition Example IV]

以圖12來說明測量用電容部424的構成例IV。這也是針對電容部CM0~CM7，利用第1特定的電容值的電容器與第2特定的電容值的電容器之例子。但是，是將第1特定的電容值的電容器設為16fF的電容器，將第2特定的電容值的電容器設為128fF的電容器，並且也是利用此第1、第2特定的電容值以外的電容值之電容器的例子。 The configuration example IV of the measurement capacitor 424 will be described with reference to FIG. 12. This is also an example of using a capacitor with a first specific capacitance value and a capacitor with a second specific capacitance value for the capacitor portions CM0 to CM7. However, the capacitor with the first specific capacitance value is 16fF, and the capacitor with the second specific capacitance value is 128fF, and capacitance values other than the first and second specific capacitance values are also used. Examples of capacitors.

針對電容部CM0~CM3是利用第1特定的電容值即16fF的電容器並和圖7的例子同樣地構成。電容部CM4是以1個32fF的電容器來構成。電容部CM5是以1個64fF的電容器來構成。電容部CM6是以1個第2特定的電容 值即128fF的電容器來構成。電容部CM7是以2個第2特定的電容值即128fF的電容器的並聯連接來構成256fF的電容。 The capacitors CM0 to CM3 are constructed in the same manner as the example of FIG. 7 using capacitors of 16 fF, which is the first specific capacitance value. The capacitor CM4 is composed of one 32fF capacitor. The capacitor CM5 is composed of a single 64fF capacitor. Capacitor CM6 is a second specific capacitor The value is a 128fF capacitor. The capacitance portion CM7 is a parallel connection of two 128fF capacitors having a second specific capacitance value to form a 256fF capacitance.

如此，藉由利用第1特定的電容值的電容器的串聯連接或第2特定的電容值的電容器的並聯連接，能夠以較少的電容類別(在此情況下為16fF與128fF、及32fF、64fF之4個種類的電容)的電容器來構成電容部CM0~CM7。從而，相較於各自以1個電容元件(8個種類的電容的電容器)來形成電容部CM0~CM7的全部之情況，可以減小電容誤差的影響，而對線性度改善變得有效。 In this way, by using the series connection of the capacitors of the first specific capacitance value or the parallel connection of the capacitors of the second specific capacitance value, it is possible to use less capacitance types (in this case, 16fF and 128fF, and 32fF, 64fF). The four types of capacitors) constitute capacitors CM0~CM7. Therefore, compared to the case where all of the capacitance portions CM0 to CM7 are formed by one capacitance element (capacitors of 8 types of capacitance), the influence of capacitance error can be reduced, and the linearity improvement becomes effective.

再者，將第1、第2特定的電容值的電容器設為16fF、128fF的電容器不過只是一個例子。當然也可以採用其他的電容值。又，在圖12的例子中，如之前的圖10所示，在將電容器並聯連接的情況下，也是設為各自連接開關元件(電容部CM7、開關SW7)。當然並不限定於此，亦可如圖7所示地將對應於電容部CM7的開關SW7以1個開關元件來形成。 In addition, the capacitors with the first and second specific capacitance values as 16fF and 128fF are just an example. Of course, other capacitance values can also be used. In the example of FIG. 12, as shown in the previous FIG. 10, when the capacitors are connected in parallel, the switching elements (capacitor portion CM7, switch SW7) are connected to each other. Of course, it is not limited to this, and the switch SW7 corresponding to the capacitor portion CM7 may be formed with one switching element as shown in FIG. 7.

<4.實施形態之效果及變形例> <4. Effects and Modifications of the Implementation Mode>

根據以上之實施形態的觸控面板裝置1或觸控面板驅動裝置3可以得到如下的效果。 According to the touch panel device 1 or the touch panel driving device 3 of the above embodiment, the following effects can be obtained.

實施形態的觸控面板驅動裝置3(構成例I~IV)是對觸控面板2進行掃描，前述掃描是依序選擇相鄰的一對發送訊號線21與相鄰的一對接收訊號線22之掃描。並且具備有接收電路42，前述接收電路42是接收來自 觸控面板2的一對接收訊號線22之藉由伴隨於使用者的操作的電容變化而使波形變化的各接收訊號R+、R-，並且生成用於觸控面板操作監視的檢測值(RAW值)。此接收電路42是進行下述之動作以生成RAW值：一邊依序切換連接於一邊的接收訊號線的測量用電容部424之電容值，一邊比較來自一邊與另一邊的接收訊號線的各接收訊號R-、R+之位準。並且，在測量用電容部424中，是作為在測量用電容部424整體的電容值之切換中所使用之形成1個電容值之電容部CM，而設置有藉由複數個電容器的並聯連接或串聯連接而形成某個電容值的電容部CM。藉由利用電容器的並聯連接或串聯連接，即可以作為測量用電容部424整體而抑制電容器的電容的類別之數量。這是因為可以利用某個電容值的電容器，來形成各種電容值的電容部。藉此，可抑制各電容器的電容誤差之影響，並且可提升測量用電容部424賦與於接收訊號線22之各階段的電容的線性度。藉此，可以提升觸控面板的感測精度，並且可以提升作為操作位置的座標的再現性或正確性。 The touch panel driving device 3 (Configuration Examples I to IV) of the embodiment scans the touch panel 2. The foregoing scan is to sequentially select a pair of adjacent transmitting signal lines 21 and a pair of adjacent receiving signal lines 22之scan. It also has a receiving circuit 42, the aforementioned receiving circuit 42 receives The pair of receiving signal lines 22 of the touch panel 2 have respective received signals R+ and R- whose waveforms are changed by the change in capacitance accompanying the user's operation, and generate detection values (RAW) for monitoring the operation of the touch panel. value). The receiving circuit 42 performs the following actions to generate the RAW value: while sequentially switching the capacitance value of the measuring capacitor section 424 connected to the receiving signal line on one side, it compares the received signals from the receiving signal line on one side and the other side. The level of the signal R- and R+. In addition, in the measuring capacitor section 424, a capacitor section CM forming one capacitance value used for switching the capacitance value of the entire measuring capacitor section 424 is provided with a parallel connection of a plurality of capacitors or Connected in series to form a capacitance portion CM of a certain capacitance value. By using the parallel connection or the series connection of the capacitors, the number of types of capacitance of the capacitors can be suppressed as the entire measurement capacitor 424. This is because capacitors of a certain capacitance value can be used to form capacitor portions of various capacitance values. Thereby, the influence of the capacitance error of each capacitor can be suppressed, and the linearity of the capacitance imparted by the measurement capacitor 424 to each stage of the receiving signal line 22 can be improved. Thereby, the sensing accuracy of the touch panel can be improved, and the reproducibility or accuracy of the coordinates as the operating position can be improved.

具備實施形態之構成例I、II的測量用電容部424的觸控面板驅動裝置3，在測量用電容部424中，是將全部的電容部CM都藉由特定的電容值(例如16fF)的電容器來形成。如此，可以藉由在測量用電容部424中將用於得到各電容值之電容器，全部設為特定的電容值的電容器，以讓電容器間的電容誤差均一化。如上述，IC內的電容器的電容是依賴於膜厚、面積、周圍長度。並且，若在 同一IC內考慮，因為可將影響各電容器的膜厚考慮為同等，所以針對一個個的電容器是面積或周圍長度影響電容偏差。並且，成品尺寸的誤差是按各電容而影響的程度不同。反過來說，若全部都是相同的電容，會成為下述情形：由成品尺寸的偏差所造成的電容誤差是形成均一化。因此，根據本構成，測量用電容部424的各電容器是成為包含相同誤差的電容值，從而，形成為下述情形：以例如8位元的電容設定值來控制的256階段的電容，並不會或者難以發生電容值的逆轉。作為結果，變得可改善測量用電容部424的線性度，並可藉此確保RAW值的正確性。從而，變得也將MCU5所求出的操作位置座標的資訊之精度提升，而能夠對製品側MCU90提供高精度的操作檢測資訊。 In the touch panel driving device 3 provided with the measuring capacitor section 424 of the configuration examples I and II of the embodiment, in the measuring capacitor section 424, all the capacitor sections CM have a specific capacitance value (for example, 16fF) Capacitor to form. In this way, by setting all the capacitors for obtaining each capacitance value in the measurement capacitor 424 as capacitors of a specific capacitance value, the capacitance error between the capacitors can be made uniform. As mentioned above, the capacitance of a capacitor in an IC depends on the film thickness, area, and surrounding length. And if in Considering within the same IC, because the film thickness that affects each capacitor can be considered equal, the area or surrounding length of each capacitor affects the capacitance deviation. In addition, the error of the finished product size is affected by each capacitor. On the other hand, if all the capacitors are the same, it will become the following situation: the capacitance error caused by the deviation of the finished product size is uniform. Therefore, according to the present configuration, the capacitors of the measurement capacitor 424 have the same capacitance value including the same error. Therefore, a situation is formed in which a 256-step capacitance controlled by, for example, an 8-bit capacitance setting value does not Reversal of the capacitance value can or is difficult to occur. As a result, it becomes possible to improve the linearity of the measurement capacitor 424, and thereby to ensure the accuracy of the RAW value. Therefore, the accuracy of the information of the operation position coordinates obtained by the MCU 5 is also improved, and it is possible to provide high-precision operation detection information to the product-side MCU 90.

在實施形態的構成例I、II的測量用電容部424中，在第1電容部至第X電容部當中，成為比特定的電容值更大的電容值之電容部，是由特定的電容值的複數個電容器的並聯連接所構成。例如，藉由此並聯構成來實現電容部CM4~CM7。藉此，能夠以特定的電容值(16fF)的電容器來實現電容部CM4~CM7。 In the measurement capacitor portion 424 of the configuration examples I and II of the embodiment, among the first capacitor portion to the Xth capacitor portion, the capacitor portion having a capacitance value larger than the specific capacitance value is determined by the specific capacitance value. A plurality of capacitors are connected in parallel. For example, the capacitor parts CM4 to CM7 are realized by this parallel configuration. Thereby, the capacitors CM4 to CM7 can be realized with capacitors of a specific capacitance value (16fF).

在實施形態的構成例I、II的測量用電容部424中，在第1電容部至第X電容部當中，成為比特定的電容值更小的電容值之電容部，是以特定的電容值的複數個電容器的串聯連接所構成。例如，藉由此串聯構成來實現電容部CM0~CM3。藉此，能夠以特定的電容值(16fF)的 電容器來實現電容部CM0~CM3。又，可以藉由如圖7所示地利用16fF的電容器來形成2fF~256fF之8個電容部CM0~CM7，以減少必要的電容器數量。例如當全部都設為2fF的電容器時，會為了256fF而變得要將128個電容器並聯連接，為了構成電容部CM0~CM7會變得需要合計255個電容器。又，即使全部都設為256fF的電容器，為了構成電容部CM0~CM7同樣會變得需要合計255個電容器。相對於此，若利用16fF(或32fF)的電容器，則電容部CM0~CM7能夠以合計45個電容器來實現。亦即，藉由利用成為電容部CM0~CM7當中的中央值的電容之電容器，可以減少必要的電容器數量，對IC設計變得有利。再者，當對利用16fF的電容器與32fF的電容器之情況進行比較時，1個電容器面積是16fF的較小。從而，成為中央值的電容之電容器有2個種類的情況下，為較小電容者在IC佈置中於面積上變得較有利。又，如實施形態所述，在fF等級之類的非常小的電容之情況下，特別是2fF等之電容會變得難以進行正確的製造。從那樣的意義上來說，藉由不利用成為作為電容部CM0~CM7的最小值的電容器，而是利用成為中央值的電容器，對製造的安定性及由其形成的品質之提升而言是較理想的。 In the measurement capacitor portion 424 of the configuration examples I and II of the embodiment, among the first capacitor portion to the Xth capacitor portion, the capacitor portion having a capacitance value smaller than a specific capacitance value is a specific capacitance value. The series connection of a plurality of capacitors. For example, the capacitor parts CM0 to CM3 are realized by this series configuration. With this, it is possible to use a specific capacitance value (16fF) Capacitors realize the capacitance parts CM0~CM3. In addition, 8 capacitors CM0 to CM7 of 2fF to 256fF can be formed by using 16fF capacitors as shown in FIG. 7 to reduce the number of necessary capacitors. For example, when all capacitors are 2fF, 128 capacitors are connected in parallel for 256fF, and a total of 255 capacitors are required to form the capacitors CM0 to CM7. In addition, even if all capacitors are 256fF, in order to configure the capacitors CM0 to CM7, a total of 255 capacitors are required. On the other hand, if a 16fF (or 32fF) capacitor is used, the capacitors CM0 to CM7 can be realized with a total of 45 capacitors. That is, by using the capacitor that becomes the median value of the capacitance among the capacitor portions CM0 to CM7, the number of necessary capacitors can be reduced, which is advantageous for IC design. Furthermore, when comparing the use of a 16fF capacitor with a 32fF capacitor, the area of one capacitor is smaller than 16fF. Therefore, when there are two types of capacitors that have a central capacitance, the smaller capacitance is more advantageous in terms of area in the IC layout. In addition, as described in the embodiment, in the case of very small capacitors such as fF class, especially 2fF capacitors, it becomes difficult to manufacture accurately. In that sense, instead of using the capacitor as the minimum value of the capacitance parts CM0 to CM7, but using the capacitor as the median value, the stability of the manufacturing and the improvement of the quality resulting from it are more improved. ideal.

實施形態的構成例III、IV的測量用電容部424設置有：藉由第1特定的電容值的電容器的串聯連接而形成比第1特定的電容值更小的電容值之電容部(圖11、圖12的電容部CM0~CM3)、以及藉由第2特定的電容值的電 容器的並聯連接而形成比第2特定的電容值更大的電容值之電容部(圖11的電容部CM5~CM7、圖12的電容部CM7)。亦即，藉由利用2個特定的電容值的電容器，並在較小的電容值的電容部、及較大的電容值的電容部中分開使用，可以作為測量用電容部424整體而抑制電容器的電容的類別之數量。藉此，可抑制各電容器的電容誤差之影響，並且可提升測量用電容部424賦與於接收訊號線22之各階段的電容的線性度。 The measurement capacitor portion 424 of the configuration examples III and IV of the embodiment is provided with a capacitor portion having a capacitance value smaller than the first specific capacitance value formed by series connection of capacitors of the first specific capacitance value (FIG. 11 , Capacitor parts CM0~CM3 in FIG. 12), and the second specific capacitance value The parallel connection of the containers forms a capacitor portion (capacitance portion CM5 to CM7 in FIG. 11, capacitor portion CM7 in FIG. 12) having a capacitance value larger than the second specific capacitance value. That is, by using two capacitors with specific capacitance values and separately using the capacitor portion with a smaller capacitance value and the capacitor portion with a larger capacitance value, the capacitor can be suppressed as the entire measuring capacitor portion 424. The number of types of capacitors. Thereby, the influence of the capacitance error of each capacitor can be suppressed, and the linearity of the capacitance imparted by the measurement capacitor 424 to each stage of the receiving signal line 22 can be improved.

在實施形態(構成例I~IV)中，測量用電容部424設置有可對於一邊的接收訊號線各自並聯地連接的第1電容部(CM0)至第X電容部(CM7)之複數個電容部，第1電容部至第X電容部之各電容部是各自獨立，並且以可相對於一邊的接收訊號線進行開啟/關閉連接之方式所構成。如此，藉由將電容部CM0~CM7並聯地連接於一邊的接收訊號線，測量用電容部424可以藉由電容部CM0~CM7的選擇而以複數個階段的方式來改變合成電容值。並且，藉由將各電容器的電容誤差均一化，以成為像這樣在複數個階段當中不產生逆轉現象，前述逆轉現象是導致較小的電容值這方相較於較大的電容值，實際的電容變得較大之類的現象。從而，可以藉由第1電容部(CM0)至第X電容部(CM7)的選擇，來將線性度較佳之多階段的合成電容值賦與於接收訊號線22。 In the embodiment (Configuration Examples I to IV), the measurement capacitor portion 424 is provided with a plurality of capacitors from the first capacitor portion (CM0) to the Xth capacitor portion (CM7) that can be connected in parallel to each of the received signal lines on one side. Each of the first capacitor portion to the X-th capacitor portion is independent of each other, and is constructed in such a way that it can be connected on/off to the receiving signal line on one side. In this way, by connecting the capacitor portions CM0 to CM7 in parallel to the receiving signal line on one side, the measurement capacitor portion 424 can change the combined capacitance value in multiple stages by selecting the capacitor portions CM0 to CM7. In addition, by averaging the capacitance error of each capacitor, the reversal phenomenon does not occur in a plurality of stages like this. The aforementioned reversal phenomenon results in a smaller capacitance value than a larger capacitance value. The phenomenon that the capacitance becomes larger. Therefore, by selecting the first capacitor portion (CM0) to the X-th capacitor portion (CM7), a multi-stage composite capacitance value with better linearity can be assigned to the receiving signal line 22.

實施形態(構成例I~IV)的測量用電容部424是將第1電容部至第X電容部之各電容部的各電容值設為2 的乘冪的關係之電容值。 In the measurement capacitor section 424 of the embodiment (Configuration Examples I to IV), the capacitance value of each capacitor section from the first capacitor section to the Xth capacitor section is set to 2. The relationship between the power of the capacitance value.

具體而言，在實施形態的情況下，電容部CM0~CM7的各電容值是設為具有21、22、23...28之比例關係的2的1次方至2的X次方的電容值。 Specifically, in the case of the embodiment, each of the capacitance of the capacitor portion CM0 ~ CM7 is set to have X 2 1, 2 2, 2 3 ... 28 of the proportional relationship of 1 2 to the power of 2 The power of the capacitance value.

藉此，測量用電容部可以藉由電容部的選擇以2X個階段的方式來改變合成電容值。並且，藉由將各電容器的電容誤差均一化，以形成為如此在2X個階段當中不產生逆轉現象，前述逆轉現象是導致較小的電容值這方相較於較大的電容值，實際的電容變得較大之類的現象。此外，在此情況下，較理想的是以X位元的電容設定值來進行電容可變控制。例如以8位元的電容設定值，將各位元分配於電容部CM0~CM7的開關SW0~SW7的開啟/關閉控制。藉此，電容設定值本身成為顯示合成電容值之值，且如上述，可以利用電容設定值來得到RAW值，其中前述合成電容值是藉由第1電容部(CM0)至第X電容部(CM7)的選擇而實現的256個階段的合成電容值。這在運算處理上會成為非常有效率的處理。 Accordingly, by measuring the capacitance portion can be selected at a capacitance section 2 X stages way to change the combined capacitance value. Moreover, by uniformizing the capacitance error of each capacitor, it is formed so that no reversal phenomenon occurs in 2 X stages. The aforementioned reversal phenomenon results in a smaller capacitance value compared to a larger capacitance value. The capacitance becomes larger. In addition, in this case, it is more desirable to perform capacitance variable control with the X-bit capacitance setting value. For example, with an 8-bit capacitor setting value, each bit is allocated to the on/off control of the switches SW0 to SW7 of the capacitor portions CM0 to CM7. Thereby, the capacitance setting value itself becomes the value showing the composite capacitance value, and as mentioned above, the RAW value can be obtained by using the capacitance setting value, wherein the aforementioned composite capacitance value is obtained by the first capacitor portion (CM0) to the Xth capacitor portion ( The choice of CM7) realizes the combined capacitance value of 256 stages. This will become a very efficient process in arithmetic processing.

在實施形態(構成例II~IV)的測量用電容部424中，顯示了在電容部CM中並聯連接複數個電容器的情況下，作為所對應的開關SW，而設為相對於各部電容器來各自設置開關元件的例子。藉由如此進行，因為可以抑制電容器與開關元件間的配線間之寄生電容的誤差，所以此構成也可以有助於線性度的改善。 In the measurement capacitor section 424 of the embodiment (Configuration Examples II to IV), it is shown that when a plurality of capacitors are connected in parallel in the capacitor section CM, the corresponding switch SW is set to be independent of each capacitor. Example of setting the switching element. By doing this, since the error of the parasitic capacitance between the wiring between the capacitor and the switching element can be suppressed, this configuration can also contribute to the improvement of linearity.

再者，在實施形態中，雖然敘述了用於測量 用電容部424的256個階段的電容值之線性度的改善之手法，但是也可以考慮下述情形：在基準電容部422側也利用和測量用電容部424的電容器相同的電容值之電容器。 Furthermore, in the embodiment, although the The method of improving the linearity of the capacitance value of the capacitance portion 424 in 256 steps is used, but it is also conceivable that a capacitor having the same capacitance value as that of the measurement capacitance portion 424 is also used on the reference capacitance portion 422 side.

例如基準電容部422側，雖然以1個256fF的電容器來構成即可，但是若考慮作為比較基準的精度提升，也可考慮在基準電容部422也以16個16fF的電容器的並聯連接來構成256fF的電容。 For example, the reference capacitor 422 side may be configured with one 256fF capacitor. However, if the accuracy of the comparison reference is improved, the reference capacitor 422 can also be configured with 16 16fF capacitors connected in parallel to form 256fF. The capacitance.

又，在實施形態的觸控面板裝置1中，雖然是以進行觸控操作之構成來說明，但是也可以作為與所謂的懸停感測(hover sensing)(非接觸式接近操作)相對應的觸控面板裝置來實現。 In addition, in the touch panel device 1 of the embodiment, although the configuration for performing a touch operation is described, it can also be used as a corresponding to so-called hover sensing (non-contact proximity operation) Touch panel device to achieve.

又，實施形態的構成或動作僅是一例。本發明可考慮到其他各種的構成例、動作例。接收電路42或測量用電容部424並不限定於圖3或圖7所示的構成。雖然測量用電容部424是利用16fF的電容器，但是當然也可以考慮利用32fF的電容器、或利用8fF的電容器之類的例子。又，雖然是設為可以在電容部CM0~CM7中以256階段的方式來改變電容的構成，但是也可考慮下述情形：設為設置更多數量的電容部CM，而能夠以更多階段的方式來改變電容。當然也可以考慮減少可變電容階段數量的例子。 In addition, the configuration or operation of the embodiment is only an example. In the present invention, various other configuration examples and operation examples can be considered. The receiving circuit 42 or the measurement capacitor 424 is not limited to the configuration shown in FIG. 3 or FIG. 7. Although the measurement capacitor 424 uses a 16fF capacitor, of course, an example of using a 32fF capacitor or an 8fF capacitor can also be considered. In addition, although it is assumed that the configuration of the capacitance can be changed in 256 steps in the capacitor parts CM0 to CM7, the following situation can also be considered: a larger number of capacitor parts CM can be provided, and more steps can be used Way to change the capacitance. Of course, an example of reducing the number of variable capacitor stages can also be considered.

421‧‧‧比較器 421‧‧‧Comparator

422‧‧‧基準電容部 422‧‧‧Reference capacitor

424‧‧‧測量用電容部 424‧‧‧Capacitance part for measurement

CM0~CM7‧‧‧電容部 CM0~CM7‧‧‧Capacitor

SW0~SW7‧‧‧開關 SW0~SW7‧‧‧Switch

Claims (9)

一種觸控面板驅動裝置，是對觸控面板進行掃描，前述掃描是依序選擇相鄰的一對發送訊號線與相鄰的一對接收訊號線之掃描，前述觸控面板驅動裝置具備接收電路，前述接收電路是接收來自前述觸控面板的一對接收訊號線之藉由伴隨於操作的電容變化而使波形變化的各接收訊號，並且生成用於觸控面板操作監視的檢測值，前述接收電路是設成進行下述之動作來生成前述檢測值：一面依序切換連接於一邊的接收訊號線的測量用電容部之電容值，一面比較來自一邊與另一邊的接收訊號線的各接收訊號之位準，在前述測量用電容部中，作為在該測量用電容部的電容值之切換中所使用之形成1個電容值之電容部，設置有藉由複數個電容器的並聯連接或串聯連接來形成某個電容值的電容部，在前述測量用電容部中，全部的前述電容部全部都是藉由具有相同之電容值的電容器來形成。 A touch panel driving device scans a touch panel. The aforementioned scan is a scan that sequentially selects a pair of adjacent transmitting signal lines and an adjacent pair of receiving signal lines. The aforementioned touch panel driving device has a receiving circuit The aforementioned receiving circuit receives each of the received signals from the pair of received signal lines of the touch panel whose waveform changes due to changes in capacitance accompanying the operation, and generates detection values for monitoring the operation of the touch panel. The circuit is set to perform the following actions to generate the aforementioned detection value: while sequentially switching the capacitance value of the measuring capacitor connected to the receiving signal line on one side, and comparing each received signal from the receiving signal line on one side and the other side The level of the aforementioned measuring capacitance portion, as a capacitance portion forming one capacitance value used in the switching of the capacitance value of the measurement capacitance portion, is provided by connecting a plurality of capacitors in parallel or in series To form a capacitance portion with a certain capacitance value, all of the capacitance portions for the measurement are formed by capacitors having the same capacitance value. 如請求項1之觸控面板驅動裝置，其中在前述測量用電容部中成為比前述相同之電容值更大的電容值之電容部，是藉由前述相同之電容值的複數個電容器的並聯連接所構成。 The touch panel drive device of claim 1, wherein the capacitance portion having a capacitance value larger than the same capacitance value in the measurement capacitance portion is connected in parallel with a plurality of capacitors of the same capacitance value. Constituted. 如請求項1或2之觸控面板驅動裝置，其中在前述測量用電容部中成為比前述相同之電容值更小的電 容值之電容部，是藉由前述相同之電容值的複數個電容器的串聯連接所構成。 The touch panel driving device according to claim 1 or 2, wherein the capacitance value of the aforementioned measurement capacitor is smaller than the aforementioned same capacitance value. The capacitance portion of the capacitance is formed by the series connection of a plurality of capacitors of the same capacitance value. 如請求項1或2之觸控面板驅動裝置，其中在前述測量用電容部中，作為前述電容部，設置有可對於前述一邊的接收訊號線各自並聯地連接的第1電容部至第X電容部之複數個電容部，前述第1電容部至前述第X電容部之各電容部是各自獨立且可對於前述一邊的接收訊號線開啟/關閉連接地構成，其中，X為2以上的自然數。 The touch panel driving device of claim 1 or 2, wherein in the measurement capacitor portion, as the capacitor portion, a first capacitor portion to an X-th capacitor that can be connected in parallel to each of the receiving signal lines on the one side are provided The plurality of capacitor portions of the first capacitor portion to the foregoing X-th capacitor portion are each independent and can be connected to the receiving signal line on one side, wherein X is a natural number greater than 2 . 如請求項4之觸控面板驅動裝置，其中前述測量用電容部中的前述第1電容部至第X電容部之各電容部的電容值，是設為2的乘冪的關係之電容值。 The touch panel driving device according to claim 4, wherein the capacitance value of each of the first capacitance portion to the Xth capacitance portion in the measurement capacitance portion is a capacitance value set to a power of two. 如請求項2之觸控面板驅動裝置，其中在前述測量用電容部中，作為前述電容部，設置有可對於前述一邊的接收訊號線各自並聯地連接的第1電容部至第X電容部之複數個電容部，前述第1電容部至前述第X電容部之各電容部是藉由各自對應的開關而獨立且可對於前述一邊的接收訊號線開啟/關閉連接地構成，並且與以複數個電容器的並聯連接所構成的電容部相對應的前述開關，是藉由連接於前述複數個電容器的每一個的複數個開關元件所構成，其中，X為2以上的自然數。 The touch panel driving device according to claim 2, wherein in the capacitance portion for measurement, as the capacitance portion, one of the first capacitance portion to the Xth capacitance portion that can be connected in parallel to the receiving signal line on the one side is provided A plurality of capacitor portions, each of the first capacitor portion to the foregoing X-th capacitor portion is independently constituted by its corresponding switch and can be connected to the receiving signal line on one side, and is connected with a plurality of The switch corresponding to the capacitor portion formed by the parallel connection of capacitors is formed by a plurality of switching elements connected to each of the plurality of capacitors, wherein X is a natural number of 2 or more. 一種觸控面板裝置，具有觸控面板及觸控面板驅動裝置，前述觸控面板驅動裝置是對前述觸控面板 進行掃描，前述掃描是依序選擇相鄰的一對發送訊號線與相鄰的一對接收訊號線之掃描，前述觸控面板驅動裝置具備接收電路，前述接收電路是接收來自前述觸控面板的一對接收訊號線之藉由伴隨於操作的電容變化而使波形變化的各接收訊號，並且生成用於觸控面板操作監視的檢測值，前述接收電路是設成進行下述之動作而生成前述檢測值：一面依序切換連接於一邊的接收訊號線的測量用電容部之電容值，一面比較來自一邊與另一邊的接收訊號線的各接收訊號之位準，在前述測量用電容部中，作為在該測量用電容部的電容值之切換中所使用之形成1個電容值之電容部，設置有藉由複數個電容器的並聯連接或串聯連接來形成某個電容值的電容部，在前述測量用電容部中，全部的前述電容部全部都是藉由具有相同之電容值的電容器來形成。 A touch panel device is provided with a touch panel and a touch panel drive device. The aforementioned touch panel drive device is for the aforementioned touch panel Scanning is performed. The scanning is to sequentially select a pair of adjacent transmitting signal lines and a pair of adjacent receiving signal lines. The touch panel driving device is equipped with a receiving circuit, and the receiving circuit receives signals from the touch panel. A pair of receiving signal lines changes each receiving signal whose waveform is changed by the change of capacitance accompanying the operation, and generates a detection value for monitoring the operation of the touch panel. The aforementioned receiving circuit is set to perform the following actions to generate the aforementioned Detection value: while sequentially switching the capacitance value of the measuring capacitor connected to the receiving signal line on one side, and comparing the level of each received signal from the receiving signal line on one side and the other side, in the aforementioned measuring capacitor part, As the capacitance portion forming one capacitance value used in the switching of the capacitance value of the capacitance portion for measurement, a capacitance portion forming a certain capacitance value by connecting a plurality of capacitors in parallel or in series is provided. In the measuring capacitor part, all the aforementioned capacitor parts are all formed by capacitors having the same capacitance value. 一種觸控面板驅動裝置，是對觸控面板進行掃描，前述掃描是依序選擇相鄰的一對發送訊號線與相鄰的一對接收訊號線之掃描，前述觸控面板驅動裝置具備接收電路，前述接收電路是接收來自前述觸控面板的一對接收訊號線之藉由伴隨於操作的電容變化而使波形變化的各接收訊號，並且生成用於觸控面板操作監視的檢測值，前述接收電路是設成進行下述之動作來生成前述檢 測值：一面依序切換連接於一邊的接收訊號線的測量用電容部之電容值，一面比較來自一邊與另一邊的接收訊號線的各接收訊號之位準，在前述測量用電容部中，作為在該測量用電容部的電容值之切換中所使用之形成1個電容值之電容部，設置有藉由複數個電容器的並聯連接或串聯連接來形成某個電容值的電容部，在前述測量用電容部中設置有：藉由第1特定的電容值的電容器的串聯連接而形成比前述第1特定的電容值更小的電容值之前述電容部、及藉由第2特定的電容值的電容器的並聯連接而形成比前述第2特定的電容值更大的電容值之前述電容部。 A touch panel driving device scans a touch panel. The aforementioned scan is a scan that sequentially selects a pair of adjacent transmitting signal lines and an adjacent pair of receiving signal lines. The aforementioned touch panel driving device has a receiving circuit The aforementioned receiving circuit receives each of the received signals from the pair of received signal lines of the touch panel whose waveform changes due to changes in capacitance accompanying the operation, and generates detection values for monitoring the operation of the touch panel. The circuit is set to perform the following actions to generate the aforementioned detection Measured value: While sequentially switching the capacitance value of the measuring capacitor connected to the receiving signal line on one side, while comparing the level of each received signal from the receiving signal line on one side and the other, in the aforementioned measuring capacitor, As the capacitance portion forming one capacitance value used in the switching of the capacitance value of the capacitance portion for measurement, a capacitance portion forming a certain capacitance value by connecting a plurality of capacitors in parallel or in series is provided. The measuring capacitor section is provided with the capacitor section having a capacitance value smaller than the first specific capacitance value formed by the series connection of capacitors of the first specific capacitance value, and the second specific capacitance value The parallel connection of the capacitors forms the capacitor portion having a capacitance value larger than the second specific capacitance value. 如請求項8之觸控面板驅動裝置，其中在前述測量用電容部中，作為前述電容部，設置有可對於前述一邊的接收訊號線各自並聯地連接的第1電容部至第X電容部之複數個電容部，前述第1電容部至前述第X電容部之各電容部是藉由各自對應的開關而獨立且可對於前述一邊的接收訊號線開啟/關閉連接地構成，並且與以複數個電容器的並聯連接所構成的電容部相對應的前述開關，是藉由連接於前述複數個電容器的每一個的複數個開關元件所構成，其中，X為2以上的自然數。 The touch panel driving device according to claim 8, wherein in the capacitance portion for measurement, as the capacitance portion, one of the first capacitance portion to the Xth capacitance portion that can be connected in parallel to each of the received signal lines on the one side is provided A plurality of capacitor portions, each of the first capacitor portion to the foregoing X-th capacitor portion is independently constituted by its corresponding switch and can be connected to the receiving signal line on one side, and is connected with a plurality of The switch corresponding to the capacitor portion formed by the parallel connection of capacitors is formed by a plurality of switching elements connected to each of the plurality of capacitors, wherein X is a natural number of 2 or more.
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