TWI642904B - 測量系統、控制裝置及測量方法 - Google Patents

測量系統、控制裝置及測量方法 Download PDF

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Publication number
TWI642904B
TWI642904B TW106144356A TW106144356A TWI642904B TW I642904 B TWI642904 B TW I642904B TW 106144356 A TW106144356 A TW 106144356A TW 106144356 A TW106144356 A TW 106144356A TW I642904 B TWI642904 B TW I642904B
Authority
TW
Taiwan
Prior art keywords
information
measurement
time
timer
timing
Prior art date
Application number
TW106144356A
Other languages
English (en)
Chinese (zh)
Other versions
TW201835529A (zh
Inventor
鈴木祐太
椹木洋
近藤智則
金谷義宏
Original Assignee
日商歐姆龍股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商歐姆龍股份有限公司 filed Critical 日商歐姆龍股份有限公司
Publication of TW201835529A publication Critical patent/TW201835529A/zh
Application granted granted Critical
Publication of TWI642904B publication Critical patent/TWI642904B/zh

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Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
    • G05B19/4183—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM] characterised by data acquisition, e.g. workpiece identification
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F15/00—Digital computers in general; Data processing equipment in general
    • G06F15/02—Digital computers in general; Data processing equipment in general manually operated with input through keyboard and computation using a built-in program, e.g. pocket calculators
    • G06F15/025—Digital computers in general; Data processing equipment in general manually operated with input through keyboard and computation using a built-in program, e.g. pocket calculators adapted to a specific application
    • G06F15/0275—Digital computers in general; Data processing equipment in general manually operated with input through keyboard and computation using a built-in program, e.g. pocket calculators adapted to a specific application for measuring
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F15/00—Digital computers in general; Data processing equipment in general
    • G06F15/76—Architectures of general purpose stored program computers
    • G06F15/78—Architectures of general purpose stored program computers comprising a single central processing unit
    • G06F15/7807—System on chip, i.e. computer system on a single chip; System in package, i.e. computer system on one or more chips in a single package
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Automation & Control Theory (AREA)
  • Computing Systems (AREA)
  • Quality & Reliability (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
TW106144356A 2017-03-15 2017-12-18 測量系統、控制裝置及測量方法 TWI642904B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2017049486A JP7009751B2 (ja) 2017-03-15 2017-03-15 計測システム、制御装置、計測方法
JP2017-049486 2017-03-15

Publications (2)

Publication Number Publication Date
TW201835529A TW201835529A (zh) 2018-10-01
TWI642904B true TWI642904B (zh) 2018-12-01

Family

ID=63681846

Family Applications (1)

Application Number Title Priority Date Filing Date
TW106144356A TWI642904B (zh) 2017-03-15 2017-12-18 測量系統、控制裝置及測量方法

Country Status (4)

Country Link
JP (1) JP7009751B2 (ja)
KR (1) KR102049291B1 (ja)
CN (1) CN108627118B (ja)
TW (1) TWI642904B (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI785937B (zh) * 2021-12-17 2022-12-01 台灣麗偉電腦機械股份有限公司 複合式工件量測台

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04135210A (ja) * 1990-09-27 1992-05-08 Fanuc Ltd 同期信号発生装置
JP2001027904A (ja) * 1999-05-11 2001-01-30 Fanuc Ltd 数値制御システム
JP2007213474A (ja) * 2006-02-13 2007-08-23 Yaskawa Electric Corp モーション制御システム
TWI498688B (zh) * 2013-06-25 2015-09-01 Mitsubishi Electric Corp 可程式控制器
TWI571712B (zh) * 2015-10-29 2017-02-21 行政院原子能委員會核能研究所 多重容錯控制系統及其同步方法

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JPH0620965Y2 (ja) * 1990-09-28 1994-06-01 株式会社ミツトヨ 三次元測定機
JPH07198542A (ja) * 1993-12-28 1995-08-01 Mitsubishi Materials Corp 缶蓋開口検査装置
JPH0894336A (ja) * 1994-09-28 1996-04-12 Sumitomo Metal Mining Co Ltd 薄板検査装置及び検査方法
JPH0914943A (ja) * 1995-06-29 1997-01-17 Mitsubishi Heavy Ind Ltd 路面状況測定装置
US6507036B1 (en) * 1999-06-01 2003-01-14 National Research Council Of Canada Three dimensional optical scanning
FI20012204A0 (fi) * 2001-11-13 2001-11-13 Mapvision Oy Pistepilvien yhdistäminen
WO2003094582A2 (en) * 2002-05-02 2003-11-13 Orbotech Ltd. A system and method for manufacturing printed circuit boards employing non-uniformly modified images
JP4032421B2 (ja) * 2003-02-25 2008-01-16 横河電機株式会社 測定データ同期システム
JP5141972B2 (ja) 2007-12-07 2013-02-13 オムロン株式会社 産業用コントローラ
JP2009294128A (ja) * 2008-06-06 2009-12-17 Visuatool Inc ３次元計測システム、計測端末、３次元形状の計測方法、およびトータルステーション
JP5349122B2 (ja) * 2009-04-14 2013-11-20 株式会社ミツトヨ 同期移動装置および画像測定装置
JP5316563B2 (ja) * 2011-02-15 2013-10-16 オムロン株式会社 画像処理装置および画像処理システム
CN202092624U (zh) * 2011-04-28 2011-12-28 昆山双虎电子科技有限公司 高通过性三坐标测量装置
CN102937419B (zh) * 2011-05-04 2015-05-27 常州工学院 一种基于直驱式电机的凸轮轮廓检测***
JP2013069054A (ja) 2011-09-21 2013-04-18 Fuji Xerox Co Ltd 情報処理装置、プログラムおよび画像形成装置
JP5868420B2 (ja) * 2011-11-09 2016-02-24 株式会社日立製作所 自律走行システム
CN102749041B (zh) * 2012-07-13 2014-10-08 合肥工业大学 一种螺旋桨型面轮廓误差测量仪及测量方法
JP6094196B2 (ja) * 2012-12-14 2017-03-15 オムロン株式会社 情報処理装置、情報処理プログラムおよび情報処理方法
CN104854523B (zh) * 2013-01-08 2017-07-04 富士电机株式会社 控制***、主可编程控制器、从可编程控制器以及控制方法
WO2015162763A1 (ja) * 2014-04-24 2015-10-29 三菱電機株式会社 ネットワークシステム
JP5976886B1 (ja) * 2015-06-10 2016-08-24 東芝エレベータ株式会社 エレベータの昇降路形状情報生成システム、昇降路形状情報生成方法

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04135210A (ja) * 1990-09-27 1992-05-08 Fanuc Ltd 同期信号発生装置
JP2001027904A (ja) * 1999-05-11 2001-01-30 Fanuc Ltd 数値制御システム
JP2007213474A (ja) * 2006-02-13 2007-08-23 Yaskawa Electric Corp モーション制御システム
TWI498688B (zh) * 2013-06-25 2015-09-01 Mitsubishi Electric Corp 可程式控制器
TWI571712B (zh) * 2015-10-29 2017-02-21 行政院原子能委員會核能研究所 多重容錯控制系統及其同步方法

Also Published As

Publication number Publication date
KR20180105562A (ko) 2018-09-28
CN108627118B (zh) 2020-06-23
TW201835529A (zh) 2018-10-01
JP7009751B2 (ja) 2022-01-26
JP2018152005A (ja) 2018-09-27
KR102049291B1 (ko) 2019-11-27
CN108627118A (zh) 2018-10-09

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