TWI603101B - Thermostat - Google Patents
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- TWI603101B TWI603101B TW102143646A TW102143646A TWI603101B TW I603101 B TWI603101 B TW I603101B TW 102143646 A TW102143646 A TW 102143646A TW 102143646 A TW102143646 A TW 102143646A TW I603101 B TWI603101 B TW I603101B
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Description
本發明係關於使用於LED(發光二極體)的溫度加速壽命試驗的恆溫器具。 The present invention relates to a thermostat for use in a temperature accelerated life test of an LED (Light Emitting Diode).
雖然LED是一種以長壽命為特長的光源,但現狀是其亮度隨著點亮時間的增加而緩慢地衰減。因此,作為LED壽命的評價方法之一,已知有“北美照明工程協會”所制定的“IES LM-80”的規格。該規格是試驗亮度對LED的點亮時間的維持率(光通量維持率),依該試驗結果是否在恆定值以上來評價LED壽命。 Although LED is a light source with a long life, the current situation is that its brightness is slowly attenuated as the lighting time increases. Therefore, as one of the evaluation methods of the life of the LED, the specification of the "IES LM-80" developed by the "North American Lighting Engineering Association" is known. This specification is a maintenance rate (light flux maintenance ratio) of the test luminance to the lighting time of the LED, and the LED lifetime is evaluated based on whether or not the test result is equal to or higher than the constant value.
具體而言,該試驗方法是對於以同一電流值驅動的試驗體LED,在55℃、85℃和製造商所決定的任意溫度(最高125℃)的3種溫度條件下連續點亮6000小時(250天),每1000小時測定LED的亮度。在進行如此試驗的情況下,必須將作為試驗體的LED長時間內保持在恆定溫度下,以往多採用熱風循環式的恆溫槽。 Specifically, the test method is to continuously illuminate for 6000 hours under the three temperature conditions of 55 ° C, 85 ° C and any temperature determined by the manufacturer (up to 125 ° C) for the test body LED driven by the same current value ( 250 days), the brightness of the LED was measured every 1000 hours. In the case of such a test, it is necessary to maintain the LED as a test body at a constant temperature for a long period of time, and a hot air circulation type thermostatic bath has been conventionally used.
然而,在將作為試驗體的LED置於熱風循環式的恆溫槽內的情況下,為了維持溫度會使在恆溫槽內循環的熱 風直接吹到LED上,故有可能對試驗結果導致不良影響。另外,習知的熱風循環式恆溫槽,由於槽內溫度分佈的均一性差,在收容有多個LED的情況下會有試驗精度降低的情形。 However, in the case where the LED as the test body is placed in a hot air circulating type thermostat, the heat circulating in the thermostat is maintained in order to maintain the temperature. The wind blows directly onto the LED, so it may have an adverse effect on the test results. Further, in the conventional hot air circulating type thermostatic bath, since the uniformity of the temperature distribution in the tank is poor, when a plurality of LEDs are housed, the test accuracy may be lowered.
另一方面,作為進行LED的溫度加速壽命試驗的裝置,以往,有許多種類的試驗裝置被提出,作為與本發明相關的裝置,例如為專利文獻1所載的試驗裝置。 On the other hand, as a device for performing a temperature accelerated life test of an LED, many types of test devices have been proposed, and the device related to the present invention is, for example, a test device disclosed in Patent Document 1.
[專利文獻1]日本特開2011-179937號公報 [Patent Document 1] Japanese Laid-Open Patent Publication No. 2011-179937
專利文獻1所載的LED壽命試驗裝置,由於將一個被試驗LED配置於HAST裝置內進行試驗,雖然溫度分佈的均一性優異,但由於在連續發光的LED的光線中所包含的熱線成分導致裝置內的溫度上升而超過設定溫度,對試驗結果造成不良影響。作為試驗對象的LED越是高輸出(高亮度)此種狀況就越顯著,故近年來,對於有高亮度化趨勢的LED進行正確的壽命試驗變得困難。 In the LED life test device disclosed in Patent Document 1, since one test LED is placed in a HAST device and tested, the temperature distribution is excellent in uniformity, but the device is caused by the hot wire component contained in the light of the continuously emitted LED. The temperature inside rises above the set temperature and adversely affects the test results. The higher the output of the LED to be tested (higher brightness), the more remarkable the situation is. Therefore, in recent years, it has become difficult to perform accurate life testing on an LED having a high luminance.
本發明所要解決的課題在於,提供一種可在LED的溫度加速壽命試驗中,將LED保持於在均一溫度下穩定的氣氛中且結構也簡單的恆溫器具。 An object of the present invention is to provide a thermostat which can maintain an LED in an atmosphere which is stable at a uniform temperature in a temperature accelerated life test of an LED and has a simple structure.
本發明的恆溫器具,其特徵在於,係具備:具有加熱手段和冷卻手段的恆溫板、設置在上述恆溫板上的試驗體裝載台、以及以覆蓋上述試驗體裝載台的方式所配置的透光性頂部構件,作為上述加熱手段,設置有加熱上述恆溫 板的發熱體,作為上述冷卻手段,設置有對上述恆溫板進行氣冷的送風風扇。 The thermostat according to the present invention includes: a constant temperature plate having a heating means and a cooling means, a test body loading table provided on the constant temperature plate, and a light transmission disposed to cover the test body loading table. a top member, as the above heating means, is provided with heating the above constant temperature As the heating element of the plate, as the cooling means, a blower fan that air-cools the above-mentioned constant temperature plate is provided.
此處,較佳為在上述恆溫板與上述送風風扇之間設置散熱器。 Here, it is preferable that a heat sink is provided between the thermostat plate and the blower fan.
另外,亦可設置對上述送風風扇供給冷卻氣體的冷氣供給手段。 Further, a cooling air supply means for supplying a cooling gas to the air blowing fan may be provided.
再者,亦可藉由排列多個上述恆溫器具並設置用來覆蓋多個上述恆溫器具的上表面的開閉式罩子,形成能同時執行多個LED的溫度加速壽命試驗的恆溫裝置。 Furthermore, it is also possible to form a thermostat capable of simultaneously performing a temperature accelerated life test of a plurality of LEDs by arranging a plurality of the above-described thermostats and providing an opening and closing cover for covering the upper surfaces of the plurality of thermostats.
依據本發明,可提供一種能在LED的溫度加速壽命試驗中,將LED保持於在均一溫度下穩定的氣氛中且結構也簡單的恆溫器具。 According to the present invention, it is possible to provide a thermostat which can maintain an LED in an atmosphere which is stable at a uniform temperature and has a simple structure in the temperature accelerated life test of the LED.
10‧‧‧恆溫板 10‧‧‧ thermostat
11、31‧‧‧電發熱體 11, 31‧‧‧ electric heating body
12a、12b‧‧‧鎖定構件 12a, 12b‧‧‧Locking members
20‧‧‧試驗體裝載台 20‧‧‧Test body loading platform
20a、20b‧‧‧缺口部 20a, 20b‧‧‧ gap
30‧‧‧隔壁構件 30‧‧‧ partition member
30a‧‧‧開口部 30a‧‧‧ openings
40‧‧‧頂部構件 40‧‧‧ top member
50‧‧‧送風風扇 50‧‧‧Air supply fan
60‧‧‧散熱器 60‧‧‧ radiator
圖1是示出作為本發明的實施方式的恆溫器具的局部省略立體圖。 Fig. 1 is a partially omitted perspective view showing a thermostat according to an embodiment of the present invention.
圖2是示於圖1的恆溫器具的局部省略前視圖。 Fig. 2 is a partially omitted front elevational view of the thermostat shown in Fig. 1.
圖3是示於圖1的恆溫器具的局部省略立體圖。 Fig. 3 is a partially omitted perspective view of the thermostat shown in Fig. 1.
以下,基於附圖說明本發明的實施方式。如圖1~圖3所示,本實施方式的恆溫器具100係具備:內置有作為加 熱手段的電發熱體11的恆溫板10;設置於恆溫板10上的試驗體裝載台20;配置於恆溫板10上,具有包圍試驗體裝載台20的周圍的開口部30a之平板狀的隔壁構件30;以及以覆蓋試驗體裝載台20和開口部30a的狀態配置於隔壁構件30上的透光性的耐熱玻璃製的頂部構件40。在本實施方式中,在隔壁構件30內也內置有電發熱體31。再者,圖1、圖3示出將頂部構件40拆卸後的狀態。 Hereinafter, embodiments of the present invention will be described based on the drawings. As shown in FIG. 1 to FIG. 3, the thermostat 100 of the present embodiment is provided with a built-in The thermostatic plate 10 of the electric heating element 11 of the thermal device; the test body loading table 20 provided on the thermostatic plate 10; and the flat-shaped partition wall which is disposed on the thermostatic plate 10 and has an opening 30a surrounding the test body loading table 20 The member 30; and a translucent heat-resistant glass top member 40 disposed on the partition member 30 in a state of covering the test body loading table 20 and the opening 30a. In the present embodiment, the electric heating element 31 is also built in the partition member 30. 1 and 3 show a state in which the top member 40 is detached.
另外,作為恆溫板10的冷卻手段,對恆溫板10進行氣冷的送風風扇50被設置於恆溫板10的下方。在恆溫板10與送風風扇50之間以密合於恆溫板10的下表面的狀態配置散熱器60,在散熱器60的下表面側配置送風風扇50。 Moreover, as a cooling means of the thermostat plate 10, the blower fan 50 which air-cools the thermostat plate 10 is provided below the thermostat plate 10. The heat sink 60 is disposed between the thermostat plate 10 and the blower fan 50 in a state of being in close contact with the lower surface of the thermostat plate 10, and the blower fan 50 is disposed on the lower surface side of the heat sink 60.
再者,在恆溫板10的左右側面,為了可裝卸地卡止於隔壁構件30上所載置的頂部構件40,以相對向狀配置剖面呈L字形的一對鎖定構件12a、12b。再者,雖然未圖示,但為了提高冷卻風扇50所產生的冷卻作用,亦可設置對送風風扇50供給冷卻氣體的冷氣供給裝置。另外,亦可在頂部構件40上設置通氣孔。 Further, in order to detachably lock the top member 40 placed on the partition member 30 on the left and right side surfaces of the thermostat plate 10, a pair of locking members 12a and 12b having an L-shaped cross section are disposed in a facing shape. Further, although not shown, in order to increase the cooling action by the cooling fan 50, a cold air supply device that supplies the cooling gas to the blower fan 50 may be provided. In addition, a vent hole may be provided in the top member 40.
如圖1所示,在試驗體裝載台20的周緣部分設置多個缺口部20a、20b,其用於對置於試驗體裝載台20上的LED的供電線(未圖示)及測定LED附近溫度的溫度感測器的信號線(未圖示)等進行配線。 As shown in Fig. 1, a plurality of cutout portions 20a and 20b are provided on the peripheral portion of the test body loading table 20 for supplying a power supply line (not shown) for the LEDs placed on the test object loading table 20 and measuring LEDs. The signal line (not shown) of the temperature sensor of the temperature is wired.
再者,在恆溫裝置100中,試驗體裝載台20和開口 部30a的俯視形狀皆大致呈圓形,但並不限定於此,亦可採取其它形狀(例如,俯視形狀為正方形、橢圓形或多邊形等)。 Furthermore, in the thermostat device 100, the test body loading table 20 and the opening The shape of the portion 30a is substantially circular, but the shape is not limited thereto, and other shapes (for example, a square shape, an elliptical shape, a polygonal shape, or the like) may be adopted.
在使用恆溫裝置100的情況下,如圖1、圖3所示,打開頂部構件40(參照圖2),分別將作為試驗體的LED載置於試驗體裝載台20上,在對供電線和溫度感測器的信號線進行配線後,封閉頂部構件40,用鎖定構件12a、12b鎖定頂部構件40。其後,開始對恆溫板10和隔壁構件30的電發熱體11、31供電。藉此,試驗體裝載台20上的LED上升至預先設定的溫度(例如,55℃、85℃或125℃),並保持在該溫度。 When the thermostat device 100 is used, as shown in FIGS. 1 and 3, the top member 40 (see FIG. 2) is opened, and the LED as a test body is placed on the test body loading table 20, respectively, on the power supply line and After the signal lines of the temperature sensor are wired, the top member 40 is closed and the top member 40 is locked with the locking members 12a, 12b. Thereafter, the electric heating elements 11 and 31 of the thermostat plate 10 and the partition member 30 are started to be supplied with power. Thereby, the LED on the test body loading table 20 rises to a preset temperature (for example, 55 ° C, 85 ° C or 125 ° C) and is maintained at this temperature.
另一方面,藉由LED的連續點亮,若試驗體裝載台20和LED附近變得欲超過設定溫度,則送風風扇50自動啟動,向散熱器60開始送風,藉由散熱器60的散熱,使恆溫板10冷卻。另外,若試驗體裝載台20和LED附近下降至設定溫度,則送風風扇50自動停止。這樣,由於對應於試驗體裝載台20和LED附近的溫度使送風風扇50自動啟閉,可防止試驗體裝載台20和LED的過熱或過冷,可維持高的溫度精度。另外,作為恆溫板10的冷卻手段的送風風扇50,因無需用於供給冷卻液的供液路徑及排液路徑等,所以結構也簡單。 On the other hand, when the test body loading table 20 and the vicinity of the LEDs are to exceed the set temperature by the continuous lighting of the LEDs, the blower fan 50 is automatically activated, and the air is blown to the heat sink 60, and the heat is dissipated by the heat sink 60. The thermostat plate 10 is cooled. Further, when the test body loading table 20 and the vicinity of the LED are lowered to the set temperature, the blower fan 50 is automatically stopped. In this way, since the blower fan 50 is automatically opened and closed corresponding to the temperature in the vicinity of the test body loading table 20 and the LED, overheating or overcooling of the test body loading table 20 and the LED can be prevented, and high temperature accuracy can be maintained. Moreover, since the blower fan 50 which is a cooling means of the thermostat plate 10 does not require a liquid supply path and a liquid discharge path for supplying a coolant, the structure is also simple.
這樣,在恆溫器具100中,試驗體裝載台20和LED藉由隔壁構件30和頂部構件40與大氣區隔,並且,藉由具有加熱功能的恆溫板10和隔壁構件30連續地加熱至既 定溫度,所以可將置於試驗體裝載台20上的LED保持於在均一溫度下穩定的氣氛中。從而,能以高精度高效率地進行LED的溫度加速壽命試驗。再者,如果在頂部構件40上開設通氣孔(未圖示)以保持通氣性的話,則在防止LED的過熱方面是有效的。 Thus, in the thermostat device 100, the test body loading table 20 and the LED are separated from the atmosphere by the partition member 30 and the top member 40, and the constant temperature plate 10 and the partition member 30 having the heating function are continuously heated to both. The temperature is set so that the LED placed on the test body loading table 20 can be held in an atmosphere that is stable at a uniform temperature. Therefore, the temperature accelerated life test of the LED can be performed with high precision and high efficiency. Further, if a vent hole (not shown) is formed in the top member 40 to maintain air permeability, it is effective in preventing overheating of the LED.
再者,雖然未圖示,如果縱橫排列多個恆溫器具100並且設置用來覆蓋多個恆溫器具100的上表面的開閉式罩子等的話,可形成能同時執行多個LED的溫度加速壽命試驗的恆溫裝置。 Further, although not shown, if a plurality of thermostats 100 are arranged vertically and horizontally, and an open-close type cover or the like for covering the upper surfaces of the plurality of thermostats 100 is provided, it is possible to form a temperature accelerated life test capable of simultaneously performing a plurality of LEDs. Thermostat.
再者,基於圖1~圖3所說明的恆溫器具100是示出本發明的一例的器具,本發明的恆溫器具並不限定於上述的恆溫器具100。 The thermostat 100 described with reference to FIGS. 1 to 3 is an apparatus showing an example of the present invention, and the thermostat according to the present invention is not limited to the above-described thermostat 100.
本發明的恆溫器具可在進行各種LED的溫度加速壽命試驗的電子及電機產業或機械產業等領域中廣泛地利用。 The thermostat of the present invention can be widely used in fields such as the electronics and motor industry or the mechanical industry where various temperature accelerated life tests of LEDs are performed.
10‧‧‧恆溫板 10‧‧‧ thermostat
11‧‧‧電發熱體 11‧‧‧Electrical heating element
12a、12b‧‧‧鎖定構件 12a, 12b‧‧‧Locking members
20‧‧‧試驗體裝載台 20‧‧‧Test body loading platform
20a、20b‧‧‧缺口部 20a, 20b‧‧‧ gap
30‧‧‧隔壁構件 30‧‧‧ partition member
30a‧‧‧開口部 30a‧‧‧ openings
31‧‧‧電發熱體 31‧‧‧Electrical heating element
50‧‧‧送風風扇 50‧‧‧Air supply fan
60‧‧‧散熱器 60‧‧‧ radiator
100‧‧‧恆溫器具 100‧‧‧Constant thermostat
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JP2012265398A JP5805615B2 (en) | 2012-12-04 | 2012-12-04 | Constant temperature apparatus |
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CN101559391B (en) * | 2009-05-26 | 2011-04-06 | 北京新雷能科技股份有限公司 | Temperature control heating and cooling device |
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CN1087100C (en) * | 1996-08-27 | 2002-07-03 | 株式会社爱德万测试 | Constant temperature chamber of handler for use with semiconductor device testing apparatus |
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JP2002267714A (en) * | 2001-03-08 | 2002-09-18 | Furukawa Electric Co Ltd:The | Holder for aging test of semiconductor device |
KR100436657B1 (en) * | 2001-12-17 | 2004-06-22 | 미래산업 주식회사 | Apparatus for heating and cooling semiconductor in handler for testing semiconductor |
JP2003337156A (en) * | 2002-05-20 | 2003-11-28 | Nec Tokin Corp | Temperature testing device |
US7296430B2 (en) * | 2003-11-14 | 2007-11-20 | Micro Control Company | Cooling air flow control valve for burn-in system |
JP3151612U (en) * | 2009-03-18 | 2009-07-02 | 理想計測株式会社 | Electronic equipment testing equipment |
CN201611377U (en) * | 2009-09-27 | 2010-10-20 | 宜准科技股份有限公司 | Service life test device of high-brightness light-emitting diode |
CN201772946U (en) * | 2010-05-20 | 2011-03-23 | 江西省通用半导体照明检测有限公司 | High-power silicon substrate LED junction temperature detection device |
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JP2005069938A (en) * | 2003-08-26 | 2005-03-17 | Risou Keisoku Kk | Testing arrangement of electronic component |
TWM251940U (en) * | 2004-02-27 | 2004-12-01 | Tangteck Equipment Inc | Blowing apparatus used in high-temperature environment |
JP2007064925A (en) * | 2005-09-02 | 2007-03-15 | Matsushita Electric Ind Co Ltd | Electronic component tester |
CN101559391B (en) * | 2009-05-26 | 2011-04-06 | 北京新雷能科技股份有限公司 | Temperature control heating and cooling device |
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JP2014109544A (en) | 2014-06-12 |
CN103852705A (en) | 2014-06-11 |
CN103852705B (en) | 2018-02-13 |
JP5805615B2 (en) | 2015-11-04 |
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