TWI588461B - Lcos testing platform - Google Patents
Lcos testing platform Download PDFInfo
- Publication number
- TWI588461B TWI588461B TW105116766A TW105116766A TWI588461B TW I588461 B TWI588461 B TW I588461B TW 105116766 A TW105116766 A TW 105116766A TW 105116766 A TW105116766 A TW 105116766A TW I588461 B TWI588461 B TW I588461B
- Authority
- TW
- Taiwan
- Prior art keywords
- ring body
- adapter
- telescopic
- liquid crystal
- telescopic adapter
- Prior art date
Links
Landscapes
- Liquid Crystal (AREA)
Description
本發明大體上相關於矽基液晶半自動測試平台領域，特定而言，係用於矽基液晶測試平台之伸縮轉接器。 The present invention is generally related to the field of germanium-based liquid crystal semi-automatic test platforms, and in particular, to a telescopic adapter for a germanium-based liquid crystal test platform.
矽基液晶又稱液晶矽基板(Liquid Crystal On Silicon,LCoS)其結構與薄膜電晶體液晶(TFT-LCD)相類似，TFT-LCD是在上下兩塊玻璃基板中灌入液晶，而LCOS則是以CMOS製程形成的驅動電路作為下層基板。 矽-based liquid crystal, also known as liquid crystal on silicon (LCoS), has a structure similar to that of thin film transistor liquid crystal (TFT-LCD). TFT-LCD is filled with liquid crystal in the upper and lower glass substrates, while LCOS is A driving circuit formed in a CMOS process is used as the underlying substrate.
對於LCOS產品，通常而言，可對其外觀及功能性進行檢測，舉例而言，對於功能性之檢測，可在一檢測技術或檢測環境下測試LCOS內部電路之正確性或影像成像之品質；對於外觀上之檢測，可在檢測技術或檢測環境下檢查玻璃或產品外觀的缺陷，例如，表面及內部髒污確認。 For LCOS products, in general, the appearance and functionality can be tested. For example, for functional detection, the correctness of the internal circuit of LCOS or the quality of image imaging can be tested in a detection technology or detection environment; For visual inspection, defects in the appearance of the glass or product, such as surface and internal contamination, may be checked under inspection techniques or testing environments.
為了對LCOS進行檢測，常使用一半自動測試平台，此平台具有一光學路徑以對LCOS進行檢測，此光學路徑可包括具有延遲板、相位板、偏振分光棱镜、分光鏡、透鏡、鏡頭以及一相機。而在此光學路徑中，大部分光學元件之位置及間距是不可調的，舉例而言，LCOS與延遲板的間距係為固定、延遲板至偏振分光棱鏡的間距也為固定，同時，相機位置需配合操作流程與操作環境，因此也可能是固定的。而相機至鏡頭之間通常會有一個轉接器來支撐或固定鏡頭，並且固定鏡頭與相機之間的距離。 In order to detect LCOS, half of the automatic test platform is often used. The platform has an optical path for detecting LCOS. The optical path may include a delay plate, a phase plate, a polarization beam splitting prism, a beam splitter, a lens, a lens, and a camera. . In this optical path, the position and spacing of most optical components are not adjustable. For example, the distance between the LCOS and the retardation plate is fixed, the pitch of the retardation plate to the polarization beam splitting prism is also fixed, and the camera position is also fixed. It needs to match the operating process and operating environment, so it may also be fixed. There is usually an adapter between the camera and the lens to support or fix the lens and to fix the distance between the lens and the camera.
由上述可知，在轉接器的使用下，相機與鏡頭的距離可因此而固定。若需要在測試平台上要對不同LCOS產品進行測試，則因LCOS產品具有不同的面板尺寸，又因光學路徑設計之下無法調動光學元件之間距，故在換一個不同的LCOS產品測試時，需要更換一個不同尺寸的轉接器來配合LCOS產品，以達到測試平台的不同測試條件。另一方面，雖然鏡頭可以微調焦距，然而所能微調的程度較小，不足以應付不同尺寸類型之LCOS產品。製造不同的轉接器來滿足不同產品的測試條件的成本非常高，因為產品的總類可能非常多，同時在更換轉接器時常常使得光學路徑之環境有所變動，可能會影響測試 結果，甚至增加損傷光學元件或鏡頭之風險，換言之，對於不同總類產品之測試環境，若使用單一規格之轉接器對於檢測環境而言係非常不方便、容易變更已固定之檢測環境，並且增加了更多的時間與金錢上之成本。 As can be seen from the above, the distance between the camera and the lens can be fixed by the use of the adapter. If it is necessary to test different LCOS products on the test platform, LCOS products have different panel sizes, and because the optical path design cannot adjust the distance between optical components, it is necessary to test a different LCOS product. Replace a different size adapter to match the LCOS product to achieve different test conditions for the test platform. On the other hand, although the lens can fine-tune the focal length, the degree of fine-tuning can be small enough to cope with LCOS products of different sizes. The cost of manufacturing different adapters to meet the test conditions of different products is very high, because the total class of products may be very large, and the environment of the optical path often changes when replacing the adapter, which may affect the test. As a result, even the risk of damaging the optical component or lens is increased, in other words, for a test environment of different general products, the use of a single-size adapter is very inconvenient for the detection environment, and it is easy to change the fixed detection environment, and Increased time and money costs.
有鑑於上述習知單一規格轉接器的缺失，本發明即用解決上述之問題。本發明之一目的在於提供一種矽基液晶測試平台，改進習知測試平台使用之轉接器需要花費過多時間更換轉接器及需要製造許多不同規格之轉接器之缺失，意即，本發明之矽基液晶測試平台之伸縮轉接器，在更換測試產品的過程中不需將轉接器拿下更換，或製造不同規格之轉接器，而是使用伸縮長度來完成鏡頭位置之調節，可在不需更換轉接器的狀況下達到測試環境之要求。 In view of the above-described lack of conventional single-size adapters, the present invention solves the above problems. It is an object of the present invention to provide a germanium-based liquid crystal test platform that improves the loss of the adapter used in the conventional test platform and requires the installation of many different sizes of adapters, that is, the present invention. The telescopic adapter of the 矽-based liquid crystal test platform does not need to take the adapter to replace or replace the adapter, or manufacture the adapter of different specifications, but use the telescopic length to adjust the lens position. The test environment can be reached without replacing the adapter.
為了達到上揭之目的及其他目的，本發明提供一種矽基液晶測試平台，測試平台之伸縮轉接器，係使用多個環體耦接，進行伸縮，以調節轉接器之長度。本發明之矽基液晶測試平台，至少包含：承載基座；伸縮轉接器，配置於承載基座之上，伸縮轉接器至少包含：至少一第一環體，具有一第一半徑之一第一孔洞貫穿；以及至少一第二環體，具有一第二半徑之一第二孔洞貫穿，耦接至少第一環體，其中至少第一環體與至少第二環體具有至少一部份重疊，以增加或減少伸縮轉接器之長度；鏡頭，連接伸縮轉接器；及偏振分光棱镜，配置於檢測光學路徑上。 In order to achieve the above object and other objects, the present invention provides a 矽-based liquid crystal test platform, and a telescopic adapter of the test platform, which is coupled by using a plurality of ring bodies to perform telescopic adjustment to adjust the length of the adapter. The 矽-based liquid crystal test platform of the present invention comprises at least: a carrier base; a telescopic adapter disposed on the carrier base, the telescopic adapter comprising: at least one first ring body having one of the first radii a first hole penetrating; and at least one second ring body having a second hole penetrating through the second hole, coupling at least the first ring body, wherein at least the first ring body and the at least second ring body have at least a portion Overlap to increase or decrease the length of the telescopic adapter; the lens to connect the telescopic adapter; and the polarization beam splitting prism to be disposed on the detection optical path.
為達上述所有目的，其中該第二半徑大於或等於該至少一第一環體之半徑，使得該至少一第二環體覆蓋於該至少一第一環體上。 For all of the above purposes, the second radius is greater than or equal to the radius of the at least one first ring body such that the at least one second ring body covers the at least one first ring body.
為達上述所有目的，其中該至少第二環體上具有止付螺紋，用以固定該至少第一環體與該至少第二環體。 For all of the above purposes, the at least second ring body has a stop thread for fixing the at least first ring body and the at least second ring body.
為達上述所有目的，其中該至少一第一環體之一第一表面向內延伸，用以嵌入一鏡頭。 For all of the above purposes, the first surface of one of the at least one first ring body extends inwardly for embedding a lens.
為達上述所有目的，其中該至少一第一環體與該至少一第二環體之材料為鋁。 For all the above purposes, the material of the at least one first ring body and the at least one second ring body is aluminum.
為達上述所有目的，其中該驗證模組更包括一掃描器，其中該伸縮轉接器伸縮範圍為0至70mm。 For all of the above purposes, the verification module further includes a scanner, wherein the telescopic adapter has a telescopic range of 0 to 70 mm.
為達上述所有目的，其中更包含至少一第三環體，耦接該至少一第二環體，其中該至少第三環體與該至少第二環體具有至少一部份重疊，以增 加或減少該伸縮轉接器之長度。 In order to achieve the above, the method further includes at least one third ring body coupled to the at least one second ring body, wherein the at least third ring body and the at least second ring body have at least a partial overlap Increase or decrease the length of the telescopic adapter.
為達上述所有目的，本發明提供一種矽基液晶測試平台，至少包含：承載基座；伸縮轉接器，配置於承載基座之上，伸縮轉接器至少包含：至少一第一環體，具有一第一半徑之一第一孔洞貫穿；以及至少一第二環體，具有一第二半徑之一第二孔洞貫穿，耦接至少第一環體，其中至少第一環體與至少第二環體具有至少一部份重疊，以增加或減少伸縮轉接器之長度；鏡頭，連接伸縮轉接器；偏振分光棱镜，配置於檢測光學路徑上；以及延遲板，配置於檢測光學路徑上，鄰接偏振分光棱镜。 In order to achieve the above, the present invention provides a 矽-based liquid crystal test platform, comprising: a carrier base; a telescopic adapter disposed on the carrier base, the telescopic adapter comprising: at least one first ring body, a first hole having a first radius; and at least one second ring body having a second hole penetrating through the second hole, coupling at least the first ring body, wherein at least the first ring body and at least the second The ring body has at least a partial overlap to increase or decrease the length of the telescopic adapter; the lens is connected to the telescopic adapter; the polarization beam splitting prism is disposed on the detecting optical path; and the retardation plate is disposed on the detecting optical path, Adjacent to the polarizing beam splitting prism.
為達上述所有目的，其中該至少一第一環體之第二表面向外延伸、該至少一第二環體之第一表面向內延伸以及該至少一第二環體之第二表面向外延伸，且其中該至少一第一環體之第二表面與該至少一第二環體之第一表面覆蓋時使得該伸縮轉接器內部光線不外漏。 For all of the above purposes, wherein the second surface of the at least one first ring body extends outwardly, the first surface of the at least one second ring body extends inwardly and the second surface of the at least one second ring body is outwardly Extending, and wherein the second surface of the at least one first ring body and the first surface of the at least one second ring body are covered, the internal light of the telescopic adapter is not leaked.
相較於先前習知技術，根據本發明之用於矽基液晶半自動測試平台之伸縮轉接器，除了較傳統轉接器具有不必費時更換轉接器的方便性外，更能達到避免破壞檢測環境及降低製作多個單一規格轉接器之成本等功效。 Compared with the prior art, the telescopic adapter for the silli-based liquid crystal semi-automatic test platform according to the present invention can achieve the avoidance of damage detection, in addition to the convenience of replacing the adapter with time-consuming replacement of the conventional adapter. The environment and the cost of producing multiple single-size adapters.
以上所述係用以說明本發明之目的、技術手段以及其可達成之功效，相關領域內熟悉此技術之人可以經由以下實施例之示範與伴隨之圖式說明及申請專利範圍更清楚明瞭本發明。 The above is to clarify the purpose, technical means and achievable effects of the present invention, and those skilled in the relevant art can clarify the present invention through the following examples and accompanying drawings and patent claims. invention.
900‧‧‧習知之單一規格轉接器 900‧‧‧Single single size adapter
951‧‧‧矽基液晶 951‧‧‧矽-based LCD
952‧‧‧延遲板 952‧‧‧ Delay Board
953‧‧‧偏振分光棱镜 953‧‧‧Polarizing Beamsplitter
954‧‧‧鏡頭 954‧‧‧ lens
955‧‧‧承載基座 955‧‧‧bearing base
956‧‧‧相機 956‧‧‧ camera
200、300、400、500‧‧‧用於矽基液晶半自動測試平台之伸縮轉接器 200, 300, 400, 500‧‧‧ Telescopic adapter for 矽-based liquid crystal semi-automatic test platform
501‧‧‧具有最長長度之伸縮轉接器 501‧‧‧The longest length telescopic adapter
502‧‧‧具有最短長度之伸縮轉接器 502‧‧‧The shortest length telescopic adapter
210、310、410‧‧‧第一環體 210, 310, 410‧‧‧ first ring
212、312‧‧‧第一半徑 212, 312‧‧‧ first radius
213、313‧‧‧第一孔洞 213, 313‧‧‧ first hole
220、320、420‧‧‧第二環體 220, 320, 420‧‧‧ second ring
222、322‧‧‧第二半徑 222, 322‧‧‧ second radius
223、323‧‧‧第二孔洞 223, 323‧‧‧ second hole
330、430‧‧‧第三環體 330, 430‧‧‧ third ring
414‧‧‧第一環體之第一表面 414‧‧‧ First surface of the first ring
415‧‧‧第一環體之第二表面 415‧‧‧Second surface of the first ring
424‧‧‧第二環體之第一表面 424‧‧‧ First surface of the second ring
425‧‧‧第二環體之第二表面 425‧‧‧Second surface of the second ring
434‧‧‧第三環體之第一表面 434‧‧‧ First surface of the third ring
435‧‧‧第三環體之第二表面 435‧‧‧ second surface of the third ring
444‧‧‧第四環體之第一表面 444‧‧‧ First surface of the fourth ring
445‧‧‧第四環體之第二表面 445‧‧‧Second surface of the fourth ring
560‧‧‧伸縮範圍 560‧‧‧Flex range
圖1係根據本發明之一實施例說明矽基液晶測試平台之伸縮轉接器之基本架構示意圖。 1 is a schematic diagram showing the basic structure of a telescopic adapter of a silli-based liquid crystal test platform according to an embodiment of the present invention.
圖2係根據本發明之一實施例說明伸縮轉接器與矽基液晶檢測平台之示意圖。 2 is a schematic diagram showing a telescopic adapter and a sputum-based liquid crystal detection platform according to an embodiment of the present invention.
圖3係根據本發明之一實施例說明矽基液晶測試平台之伸縮轉接器之剖面示意圖。 3 is a cross-sectional view showing a telescopic adapter of a ruthenium-based liquid crystal test platform according to an embodiment of the present invention.
圖4係根據本發明之一實施例說明矽基液晶測試平台之伸縮轉接器之伸縮長度示意圖。 4 is a schematic view showing the telescopic length of a telescopic adapter of a silli-based liquid crystal test platform according to an embodiment of the present invention.
以下藉由特定的具體實施例說明本發明之實施方式，經由說明書中所揭示之內容，熟悉該領域中之技術者將領會多媒體訊號傳輸裝置及其傳輸 方法，並能輕易地瞭解本發明之功效與優點。然該領域之熟習技藝者須瞭解本創作亦可在不具備這些細節之條件下實行。此外，文中不會對一些已熟知之結構或功能或是作細節描述，以避免各種實施例間不必要相關描述之混淆，以下描述中使用之術語將以最廣義的合理方式解釋，即使其與本創作某特定實施例之細節描述一起使用。 The embodiments of the present invention will be described below by way of specific embodiments, and those skilled in the art will appreciate the multimedia signal transmission device and its transmission. Methods and advantages and advantages of the present invention can be readily understood. However, those skilled in the art must understand that the creation can also be carried out without these details. In addition, some well-known structures or functions may be described or described in detail to avoid obscuring the description of the various embodiments. The terms used in the following description will be interpreted in the broadest sense, even if A detailed description of a particular embodiment of the present work is used together.
本發明將以較佳實施例及觀點加以敘述以解釋本發明之結構，僅用來說明而非用以限制本發明之申請專利範圍，因此，除說明書中之較佳實施例外，本發明亦可廣泛實行於其他實施例中。 The present invention will be described in terms of the preferred embodiments and the aspects of the present invention, which are intended to illustrate and not to limit the scope of the invention. It is widely practiced in other embodiments.
第一實施例 First embodiment
圖1係根據本發明之一實施例說明用於矽基液晶測試平台之伸縮轉接器之基本架構示意圖。本發明提供一種用於矽基液晶半自動測試平台之伸縮轉接器，在一實施例中，伸縮轉接器200至少包含：至少一第一環體210，具有一第一半徑212之第一孔洞213(未顯示於圖)貫穿；以及至少一第二環體220，具有一第二半徑222之一第二孔洞223(未顯示於圖)貫穿，耦接至少第一環體210，其中至少第一環體210與至少第二環體220具有至少一部份重疊，以增加或減少伸縮轉接器之長度。 1 is a schematic diagram showing the basic architecture of a telescopic adapter for a silli-based liquid crystal test platform according to an embodiment of the invention. The present invention provides a telescopic adapter for a silli-based liquid crystal semi-automatic test platform. In one embodiment, the telescopic adapter 200 includes at least one first ring body 210 having a first hole of a first radius 212. 213 (not shown); and at least one second ring 220 having a second radius 222, a second hole 223 (not shown) extending through, coupling at least the first ring body 210, wherein at least A ring body 210 has at least a partial overlap with at least the second ring body 220 to increase or decrease the length of the telescopic adapter.
參閱圖1之說明，在一實施例中，矽基液晶測試平台之伸縮轉接器200之第一環體210之第一孔洞213，其半徑為第一半徑212貫穿第一環體210；第二環體220之第二孔洞223，其半徑為第二半徑222貫穿第二環體210，此第二半徑222大於或等於第一環體210之半徑，使得第二環體220耦接於第一環體210並覆蓋於第一環體上210上。當第二半徑222等於第一環體210之半徑時，則第二緩體剛好覆蓋於第一環體210上，當第二半徑222大於第一環體210之半徑時，則可增加墊片或其他材料，以經由墊片使得第二環體220蓋於第一環體210上。此時，第二環體220應耦接並覆蓋於210上，同時，第二環體220與第一環體210重疊，使得第二環體220移動於第一環體210之上，因此伸縮轉接器200之長度可藉由覆蓋之長度伸長或縮短。 Referring to FIG. 1 , in an embodiment, the first hole 213 of the first ring body 210 of the telescopic adapter 200 of the 矽-based liquid crystal test platform has a radius of a first radius 212 extending through the first ring body 210; The second hole 223 of the second ring body 220 has a second radius 222 extending through the second ring body 210. The second radius 222 is greater than or equal to the radius of the first ring body 210, so that the second ring body 220 is coupled to the second ring body 220. A ring body 210 covers the first ring body 210. When the second radius 222 is equal to the radius of the first ring body 210, the second retarder just covers the first ring body 210, and when the second radius 222 is larger than the radius of the first ring body 210, the spacer may be added. Or other material to cover the second ring body 220 to the first ring body 210 via the gasket. At this time, the second ring body 220 should be coupled and covered on the 210, and at the same time, the second ring body 220 overlaps with the first ring body 210, so that the second ring body 220 moves over the first ring body 210, thereby expanding and contracting. The length of the adapter 200 can be elongated or shortened by the length of the cover.
承上所述，在一實施例中，應當注意的是，關於環體之半徑及孔洞之半徑，在此之數值僅為舉例而非加以限制，在不背離本發明範疇下，使用者可考量實際狀況或考量光通量對應之檢測環境來製作環體半徑及孔洞半徑之規格，惟相耦接之兩環體，需滿足後一環體孔洞之半徑大於或等於前一環體之 半徑，使後一環體可覆蓋於前一環體上即可，至於環體半徑或孔洞半徑實際長度則與此無關。 In one embodiment, it should be noted that with respect to the radius of the ring body and the radius of the hole, the numerical values herein are merely examples and are not limiting, and the user may consider without departing from the scope of the present invention. Actual conditions or consider the detection environment corresponding to the luminous flux to make the ring radius and the hole radius specifications, but the two ring bodies coupled to each other need to satisfy the radius of the latter ring body greater than or equal to the previous ring body. The radius allows the latter ring to cover the previous ring, and the actual radius of the ring or the radius of the hole is irrelevant.
承上所述，在一實施例中，第二環體220上具有止付螺紋，可固定第一環體210與第二環體220，如此一來，第一環體210與第二環體220將不互相移動，而可保持伸縮轉接器200之固定長度。通常而言，為使止付螺絲可有效固定第一環體210與第二環體220，第一環體210與第二環體220必須具有一定長度之重疊。故在一實施例中，伸縮轉接器可伸最長之長度為第一環體210之長度加上第二環體220之長度再扣掉兩者至少需重疊部分之長度。舉例而言，若第一環體之長度為28-32mm，較佳為30mm，第二環體之長度為18-22mm，較佳為20mm，至少需重疊5mm，則伸縮轉接器可伸長之最長長度為41-49mm，較佳為45mm。 As described above, in an embodiment, the second ring body 220 has a stop thread on the first ring body 210 and the second ring body 220. Thus, the first ring body 210 and the second ring body The 220 will not move relative to each other, but the fixed length of the telescopic adapter 200 can be maintained. Generally, in order for the stop screw to effectively fix the first ring body 210 and the second ring body 220, the first ring body 210 and the second ring body 220 must have a certain length of overlap. Therefore, in one embodiment, the length of the telescopic adapter can be extended to the length of the first ring body 210 plus the length of the second ring body 220 and then the length of the overlap portion is at least overlapped. For example, if the length of the first ring body is 28-32 mm, preferably 30 mm, and the length of the second ring body is 18-22 mm, preferably 20 mm, at least 5 mm overlap, the telescopic adapter can be elongated. The longest length is 41-49 mm, preferably 45 mm.
承上所述，在一實施例中，應注意的是，第一環體210與第二環體212之長度在製造時可為調整，意即，第一環體210與第二環體220之長度並非固定。如此一來，在第一環體210與第二環體200之最大重疊長度下，伸縮轉接器200之可縮短之最短長度可為第一環體210之長度或第二環體220之長度。舉例而言，若第一環體之長度為28-32，較佳為30mm，第二環體之長度為18-22mm，較佳為20mm，在最大重疊之狀況下，則伸縮轉接器可縮短之最短長度為28-32mm，較佳為30mm。在一實施例中，若第一環體之長度等於第二環體之長度，則在兩者完全重疊時，有最短伸縮長度。 As described above, in an embodiment, it should be noted that the lengths of the first ring body 210 and the second ring body 212 may be adjusted at the time of manufacture, that is, the first ring body 210 and the second ring body 220. The length is not fixed. In this way, the shortest length that can be shortened by the telescopic adapter 200 can be the length of the first ring body 210 or the length of the second ring body 220 at the maximum overlap length of the first ring body 210 and the second ring body 200. . For example, if the length of the first ring body is 28-32, preferably 30 mm, and the length of the second ring body is 18-22 mm, preferably 20 mm, the telescopic adapter can be used under the condition of maximum overlap. The shortest shortening length is 28-32 mm, preferably 30 mm. In one embodiment, if the length of the first ring body is equal to the length of the second ring body, the shortest stretch length is obtained when the two are completely overlapped.
承上所述，在一實施例中，第一環體210與第二環體220所使用之材料為鋁，且需要做陽極霧面染黑表面處理，以使伸縮轉接器200耐用且具有不易透光及不易反光之特性。 As described above, in an embodiment, the material used for the first ring body 210 and the second ring body 220 is aluminum, and an anode matte black surface treatment is required to make the telescopic adapter 200 durable and have It is not easy to transmit light and is not easy to reflect.
第二實施例 Second embodiment
圖2係根據本發明之一實施例說明伸縮轉接器與矽基液晶半自動檢測平台之示意圖。參閱圖2所示，在一實施例中，矽基液晶測試平台，至少包含：承載基座955；伸縮轉接器300，配置於承載基座955之上，伸縮轉接器包含至少一第一環體310，具有一第一半徑312之一第一孔洞313貫穿；以及至少一第二環體320，具有一第二半徑322之一第二孔洞323貫穿，耦接至少第一環體310，其中至少第一環體310與至少第二環體320具有至少一部份重疊，以增加或減少該伸縮轉接器之長度；鏡頭954，連接伸縮轉接器300；及偏振分 光棱镜953，配置於檢測光學路徑上。 2 is a schematic diagram showing a telescopic adapter and a sputum-based liquid crystal semi-automatic detection platform according to an embodiment of the present invention. As shown in FIG. 2, in an embodiment, the 矽-based liquid crystal test platform includes at least a carrier base 955, a telescopic adapter 300 disposed on the carrier base 955, and the telescopic adapter includes at least one first The ring body 310 has a first hole 313 through which the first hole 313 extends; and at least one second ring body 320 has a second radius 322 through which the second hole 323 is coupled to the at least the first ring body 310. At least a first ring body 310 and at least a second ring body 320 have at least partially overlapping to increase or decrease the length of the telescopic adapter; a lens 954, a telescopic adapter 300; and a polarization component The light prism 953 is disposed on the detection optical path.
承上所述，在一實施例中，矽基液晶測試平台之伸縮轉接器300，可包含兩個以上之環體，且每個環體皆具有孔洞並且可相互重疊使得伸縮轉接器300有更長之伸縮量。在一實施例中，伸縮轉接器300具有第三環體330，此第三環體330之孔洞半徑大於或等於第二環體320之第二半徑322，使得第三環體330可覆蓋於第二環體320，並在第二環體320上移動。 As described above, in an embodiment, the telescopic adapter 300 of the 矽-based liquid crystal test platform may include more than two rings, and each ring has holes and may overlap each other such that the expansion adapter 300 There is a longer amount of expansion. In an embodiment, the telescopic adapter 300 has a third ring body 330 having a hole radius greater than or equal to a second radius 322 of the second ring body 320 such that the third ring body 330 can be covered. The second ring body 320 moves on the second ring body 320.
承上所述，在一實施例中，應當注意的是，本發明之環體並不只限於二個或三個，在不違背本發明之範疇下，更可包含超過三個以上之環體。惟每個環體孔洞之半徑皆大於或等於與其耦接之下個環體之半徑，舉例而言，第三環體330之孔洞半徑大於或等於第二環體320之半徑；第二環體320之孔洞半徑大於或等於第一環體310之半徑，故每個環體皆可覆蓋下一個與其耦接之較小半徑之環體上，並可於其上移動或滑動，而使伸縮專接器300之整體長度伸長或縮短。 In view of the above, in an embodiment, it should be noted that the ring body of the present invention is not limited to two or three, and more than three or more rings may be included without departing from the scope of the present invention. The radius of each of the ring holes is greater than or equal to the radius of the ring body coupled thereto. For example, the hole radius of the third ring body 330 is greater than or equal to the radius of the second ring body 320; the second ring body The hole radius of 320 is greater than or equal to the radius of the first ring body 310, so each ring body can cover the next ring body with a smaller radius coupled thereto, and can move or slide thereon, so that the telescopic specialization The overall length of the connector 300 is elongated or shortened.
承上所述，在一實施例中，應當注意的是，關於環體之半徑及孔洞之半徑，在此之數值僅為舉例而非加以限制，在不背離本發明範疇下，使用者可考量實際狀況或考量光通量對應之檢測環境來製作環體半徑及孔洞半徑之規格，惟相耦接之兩環體，需滿足後一環體孔洞之半徑大於或等於前一環體之半徑，使後一環體可覆蓋於前一環體上即可，至於環體半徑或孔洞半徑實際長度則與此無關。 In one embodiment, it should be noted that with respect to the radius of the ring body and the radius of the hole, the numerical values herein are merely examples and are not limiting, and the user may consider without departing from the scope of the present invention. Actual conditions or considering the detection environment corresponding to the luminous flux to make the ring radius and the hole radius specifications, but the two ring bodies coupled to each other need to satisfy the radius of the hole of the latter ring is greater than or equal to the radius of the previous ring body, so that the latter ring body It can be covered on the previous ring body, and the actual length of the ring radius or the hole radius is irrelevant.
參閱圖2所示，在一實施例中，測試平台之測試環境具有一測試之光學路徑。在光學路徑中，從矽基液晶產品951出發之元件可包括有延遲板952、偏振分光棱镜953、鏡頭954及伸縮轉接器300，其中，因第一環體310、第二環體320及第三環體330皆具有孔洞，因此光可通過伸縮轉接器300最後到達相機956。應注意的是，伸縮轉接器300係利用承載基座955所固定，同時也固定與伸縮轉接器之鏡頭954。 Referring to Figure 2, in one embodiment, the test environment of the test platform has a test optical path. In the optical path, the component starting from the NMOS-based liquid crystal product 951 may include a retardation plate 952, a polarization beam splitting prism 953, a lens 954, and a telescopic adapter 300, wherein the first ring body 310 and the second ring body 320 are The third ring 330 has holes, so light can finally reach the camera 956 through the telescopic adapter 300. It should be noted that the telescopic adapter 300 is fixed by the carrier base 955 while also being fixed to the lens 954 of the telescopic adapter.
參閱圖2所示，在一實施例中，伸縮轉接器300與鏡頭954及承載基座955耦接。通常而言，係使用螺絲將伸縮轉接器300、鏡頭954及承載基座955三者固定，舉例而言，在一實施例中，使用止付螺絲將伸縮轉接器300之第一環體310與鏡頭954相固定，使用止付螺絲將伸縮轉接器300之第三環體330固定於承載基座955上。當固定完成後，矽基液晶產品951之檢測環境 也為之固定，測試平台可開始進行測試。應當注意的是，不限於使用止付螺絲，伸縮轉接器300與鏡頭954、及承載基座955之固定在不違背本發明之範疇下還可包括其他方式，舉例而言，使鏡頭嵌入第一環體310，或使用上下壓合的方式固定伸縮轉接器300及承載基座955。 Referring to FIG. 2, in an embodiment, the telescopic adapter 300 is coupled to the lens 954 and the carrier base 955. Generally, the telescopic adapter 300, the lens 954, and the carrier base 955 are fixed by screws. For example, in one embodiment, the first ring of the telescopic adapter 300 is used using a stop screw. The 310 is fixed to the lens 954, and the third ring body 330 of the telescopic adapter 300 is fixed to the carrier base 955 by using a stop screw. When the fixing is completed, the detection environment of the 矽-based liquid crystal product 951 Also fixed for it, the test platform can start testing. It should be noted that, without limitation, the use of the stop screw, the fixing of the telescopic adapter 300 and the lens 954, and the carrier base 955 may include other methods without departing from the scope of the present invention, for example, embedding the lens. The ring body 310 or the upper and lower press-fits fix the telescopic adapter 300 and the carrier base 955.
第三實施例 Third embodiment
圖3係根據本發明之一實施例說明用於矽基液晶半自動測試平台之伸縮轉接器之剖面示意圖。參考圖3所示，在一實施例中，第一環體之一第一表面414為與鏡頭954耦接之表面，而第一表面可向內延伸，使第一孔洞的開口變小，利於鏡頭954之放入。在一實施例中，鏡頭954可平整地嵌入第一表面上而不使得入射或射出鏡頭954之光線受到伸縮轉接器400擋住，並可再利用止付螺絲對鏡頭954與伸縮轉接器400做固定。 3 is a cross-sectional view showing a telescopic adapter for a silli-based liquid crystal semi-automatic test platform in accordance with an embodiment of the present invention. Referring to FIG. 3, in one embodiment, a first surface 414 of the first ring body is a surface coupled to the lens 954, and the first surface may extend inwardly to make the opening of the first hole small, which is advantageous for facilitating the opening of the first hole. The lens 954 is placed. In an embodiment, the lens 954 can be smoothly embedded on the first surface without blocking the light incident or exiting the lens 954 by the telescopic adapter 400, and can reuse the stop screw pair lens 954 and the telescopic adapter 400. Do it fixed.
參閱圖4所示，在一實施例中，第一環體之一第一表面414為與鏡頭954耦接之表面，第一環體之一第二表面415為與第二環體420耦接之表面；第二環體之一第一表面424為與第一環體410耦接之表面，第二環體之第二表面425為與第三環體430耦接之表面；同理而言，第三環體之一第一表面434為與第二環體420耦接之表面，第三環體之第二表面435則為與第四環體410耦接之表面。 As shown in FIG. 4, in one embodiment, a first surface 414 of the first ring body is coupled to the surface of the lens 954, and a second surface 415 of the first ring body is coupled to the second ring body 420. a surface; a first surface 424 of the second ring body is a surface coupled to the first ring body 410, and a second surface 425 of the second ring body is a surface coupled to the third ring body 430; for the same reason The first surface 434 of the third ring body is a surface coupled to the second ring body 420, and the second surface 435 of the third ring body is a surface coupled to the fourth ring body 410.
承上所述，在一實施例中，每兩個環體互相耦接之表面為具有向內或向外延伸之表面，使得伸縮轉接器400之接合處密封，而使得伸縮轉接器之接合處不漏光。舉例而言，第一環體之一第二表面415向外延伸，第二環體之第一表面424向內延伸，兩表面交錯互相蓋合，加強第一環體410與第二環體420接縫處之密合，使其易於固定並不漏光；第二環體之一第二表面425向外延伸，第三環體之第一表面434則向內延伸，兩表面交錯互相蓋合，加強第二環體410與第三環體430接縫處之密合，使其易於固定並不漏光。同理而言，第三環體與第四環體之耦接處亦為相同之設計。 As described above, in one embodiment, the surface of each of the two ring bodies coupled to each other has a surface extending inward or outward so that the joint of the telescopic adapter 400 is sealed, so that the telescopic adapter is There is no light leakage at the joint. For example, one of the first surfaces of the first ring body 415 extends outwardly, and the first surface 424 of the second ring body extends inwardly, and the two surfaces are alternately overlapped to each other to reinforce the first ring body 410 and the second ring body 420. The seam is tightly closed to make it easy to fix without leaking light; one second surface 425 of the second ring body extends outward, and the first surface 434 of the third ring body extends inwardly, and the two surfaces are mutually overlapped. The adhesion between the second ring body 410 and the third ring body 430 is strengthened to make it easy to fix without leaking light. Similarly, the coupling between the third ring and the fourth ring is the same.
第四實施例 Fourth embodiment
圖4係根據本發明之一實施例說明矽基液晶測試平台之伸縮轉接器之伸縮長度示意圖。在一實施例中，矽基液晶測試平台之伸縮轉接器，可包含兩個以上之環體，且每個環體皆具有孔洞並且可相互重疊使得伸縮轉接器有足夠之伸縮量。在一實施例中，伸縮轉接器501具有三個環體，且環體間互 相有部分重疊，而伸縮轉接器之一端偶接鏡頭954，另一端耦接相機956，此外，伸縮轉接器501為當三個環體互相移動使得伸縮轉接器501具有最長之長度。反之，伸縮轉接器502為當三個環體互相重疊使伸縮轉接器502具有最短之長度，參閱圖4所示，在一實施例中，應注意的是，三個環體之長度不一定相同，應視測試環境使用者所決定，舉例而言，若第三環體有最長之長度，則伸縮轉接器502之最短長度可為第三環體之長度；同理可言，若三個環體長度相等，則在三個環體完全重疊時，伸縮轉接器502具有最短長度。總而言之，使用者可根據測試環境製造出相對應之伸縮轉接器501，在此之環體數量、每一環體之長度及環體覆蓋之長度均為舉例而不為之限制，在不違背本發明範疇下，環體數量、每一環體之長度及每一環體之覆蓋長度皆為可調，應視使用者實際需求之考量而設定。 4 is a schematic view showing the telescopic length of a telescopic adapter of a silli-based liquid crystal test platform according to an embodiment of the present invention. In one embodiment, the telescopic adapter of the 矽-based liquid crystal test platform may include more than two rings, and each of the rings has holes and may overlap each other such that the telescopic adapter has a sufficient amount of expansion and contraction. In an embodiment, the telescopic adapter 501 has three rings, and the rings are mutually There is a partial overlap, and one end of the telescopic adapter is coupled to the lens 954, and the other end is coupled to the camera 956. In addition, the telescopic adapter 501 is such that when the three rings move relative to each other, the telescopic adapter 501 has the longest length. On the contrary, the telescopic adapter 502 is such that when the three rings overlap each other, the telescopic adapter 502 has the shortest length. Referring to FIG. 4, in an embodiment, it should be noted that the lengths of the three rings are not It must be the same, depending on the user of the test environment. For example, if the third ring has the longest length, the shortest length of the telescopic adapter 502 can be the length of the third ring; for the same reason, if The three rings are of equal length, and the telescopic adapter 502 has the shortest length when the three rings are completely overlapped. In summary, the user can manufacture a corresponding telescopic adapter 501 according to the test environment, and the number of the ring body, the length of each ring body, and the length of the ring body cover are all examples and are not limited thereto. Under the scope of the invention, the number of rings, the length of each ring, and the length of coverage of each ring are adjustable, and should be set according to the actual needs of the user.
參閱圖4所示，在一實施例中，伸縮轉接器501、502之伸縮範圍560則為伸縮轉接器501之長度減去伸縮轉接器502之長度。換言之，伸縮範圍560為鏡頭954至相機956之距離變化量。伸縮範圍560為伸縮轉接器501是否適用於多個不同產品之判斷，舉例而言，若多個矽基液晶951需調動鏡頭954向相機956方向移動48-52mm，較佳為50mm，則伸縮範圍560需介於0-50mm可在範圍內適用此伸縮轉接器。 Referring to FIG. 4, in an embodiment, the telescopic range 560 of the telescopic adapters 501, 502 is the length of the telescopic adapter 501 minus the length of the telescopic adapter 502. In other words, the telescopic range 560 is the amount of change in the distance from the lens 954 to the camera 956. The telescopic range 560 is a determination of whether the telescopic adapter 501 is suitable for a plurality of different products. For example, if the plurality of 矽-based liquid crystals 951 need to move the lens 954 to move toward the camera 956 by 48-52 mm, preferably 50 mm, the telescopic The range 560 needs to be between 0-50mm and the telescopic adapter can be applied within the range.
承上所示，在一實施例中，伸縮轉接器501之伸縮範圍為0至72mm，較佳為0-70mm，意即，鏡頭954至相機956之距離可藉伸縮轉接器501移動70-72mm，較佳為70mm。應注意的是，在此之伸縮轉接器501之伸縮範圍506僅為舉例而非加以限制，在不違背本發明範疇之下，還可為其他值，例如0-71mm或0-50mm，應視使用者實際需求所設定。而設定之規格同樣也可調整，舉例而言，若伸縮範圍560為0-71mm，可將最長伸長量71mm平均分散到四個環體之伸長量，或者對每個環體設定不同伸長量之規格，只要總伸長量可達71mm即可。 As shown, in one embodiment, the telescopic adapter 501 has a telescopic range of 0 to 72 mm, preferably 0-70 mm, that is, the distance from the lens 954 to the camera 956 can be moved by the telescopic adapter 501. -72 mm, preferably 70 mm. It should be noted that the telescopic range 506 of the telescopic adapter 501 herein is merely an example and not a limitation, and may be other values, such as 0-71 mm or 0-50 mm, without departing from the scope of the present invention. It is set according to the actual needs of the user. The set specifications can also be adjusted. For example, if the telescopic range 560 is 0-71 mm, the longest elongation of 71 mm can be evenly distributed to the elongation of the four rings, or different elongations can be set for each ring. Specifications, as long as the total elongation can reach 71mm.
參閱圖2及圖4所示，在一實施例中，使用者可先預估所有矽基液晶產品可能會使鏡頭954移動之距離，規劃所需之伸長範圍，再行製作對應此伸縮範圍560之伸縮轉接器300，或直接選擇已製作好之可容許伸長量之伸縮轉接器300。當鏡頭954已固定於伸縮轉接器300前端之環體310，且伸縮轉接 器之尾端環體320固定於承載基座955上後，則完成伸縮轉接器300之設置，可使用矽基液晶半自動測試平台開始測試矽基液晶產品951，而需要變更矽基產品951進行測試，使用者不須將鏡頭954、伸縮轉接器300及承載基座955拆下，而是調整環體之止付螺絲，變更環體間之覆蓋長度，進一步調整伸縮轉接器適當之長度，即可進行下一個不同矽基液晶產品951之測試。 Referring to FIG. 2 and FIG. 4, in an embodiment, the user can first estimate the distance that all the sputum-based liquid crystal products may move the lens 954, plan the required extension range, and then make the corresponding expansion range 560. The telescopic adapter 300, or directly selects the stretchable adapter 300 that has been made to allow for elongation. When the lens 954 is fixed to the ring body 310 at the front end of the telescopic adapter 300, and the telescopic transfer After the tail end body 320 of the device is fixed on the carrying base 955, the setting of the telescopic adapter 300 is completed, and the 矽-based liquid crystal product 951 can be started to be tested using the 矽-based liquid crystal semi-automatic testing platform, and the 矽-based product 951 needs to be changed. In the test, the user does not need to remove the lens 954, the telescopic adapter 300 and the carrier base 955, but adjust the stop screw of the ring body, change the cover length between the rings, and further adjust the appropriate length of the telescopic adapter. , the next test of the different 矽-based liquid crystal products 951 can be performed.
綜上所述，本發明提供一種用於矽基液晶半自動測試平台之伸縮轉接器，改進習知測試平台使用之轉接器需要花費過多時間更換轉接器及需要製造許多不同規格之轉接器之缺失，意即，本發明之用於矽基液晶半自動測試平台之伸縮轉接器，在更換測試產品的過程中不需將轉接器拿下更換，甚至花費較多時間與成本製造不同規格之轉接器，而是使用不同半徑大小之環體互相耦接，以移動環體相互覆蓋之長度來完成長度之伸長或縮短，固定鏡頭之後，藉由伸縮長度來完成鏡頭位置之調節，可在不需更換單一規格轉接器的狀況下節省時間與成本來達到測試環境之要求。 In summary, the present invention provides a telescopic adapter for a silli-based liquid crystal semi-automatic test platform. The adapter used in the conventional test platform needs to take too much time to replace the adapter and needs to manufacture many different specifications of the adapter. The lack of the device means that the telescopic adapter for the silli-based liquid crystal semi-automatic test platform of the present invention does not need to take the adapter and replace it during the process of replacing the test product, and even spends more time and cost manufacturing. The adapter of the specification is coupled to each other by a ring body of different radius, and the length of the ring body is moved to extend or shorten the length of the ring body. After the lens is fixed, the lens position is adjusted by the telescopic length. Save time and money to meet test environment requirements without having to replace a single size adapter.
上述之目的在於解釋，各種特定細節係為了提供對於本發明之徹底理解。熟知本發明領域之通常知識者應可實施本發明，而無需其中某些特定細節。在其他實施例中，習知的結構及裝置並未顯示於方塊圖中。在圖式元件之間可能包含中間結構。所述的元件可能包含額外的輸入和輸出，其並未詳細描繪於附圖中。 The above description is intended to be illustrative of specific details of the invention. Those skilled in the art of the invention will be able to practice the invention without some specific details. In other embodiments, conventional structures and devices are not shown in the block diagram. Intermediate structures may be included between the schematic elements. The elements described may include additional inputs and outputs, which are not depicted in detail in the drawings.
本發明包含各種處理程序，該處理程序得以硬碟元件加以執行，或內嵌於電腦可讀取指令中，其可形成一般或特殊目的且具有編程指令的處理器或邏輯電路，以執行程序，除此之外，該程序亦得由硬體及軟體之組合加以執行。 The present invention includes various processing programs that are executable by hard disk components or embedded in computer readable instructions that form a general or special purpose processor or logic circuit with programmed instructions to execute the program. In addition, the program must be executed by a combination of hardware and software.
用基本形式來描述方法，在未脫離本發明範疇下，任一方法或訊息得自程序中增加或刪除，熟知該項技術領域之通常知識者應可進一步改良或修正本發明，特定實施方式僅用以說明，非限制本發明。 The method is described in a basic form, and any method or message may be added or deleted from the program without departing from the scope of the invention, and those skilled in the art should be able to further improve or modify the invention. It is intended to illustrate and not to limit the invention.
若文中有一元件“A”耦接(或耦合)至元件“B”，元件A可能直接耦接(或耦合)至B，亦或是經元件C間接地耦接(或耦合)至B。若說明書載明一元件、特徵、結構、程序或特性A會導致一元件、特徵、結構、程序或特性B，其表示A至少為B之一部分原因，亦或是表示有其他元件、特徵、結構、程序或特性協助造成B。在說明書中所提到的“可能”一詞，其元件、特徵、程序 或特性不受限於說明書中；說明書中所提到的數量不受限於“一”或“一個”等詞。 If a component "A" is coupled (or coupled) to component "B", component A may be directly coupled (or coupled) to B, or indirectly coupled (or coupled) to B via component C. If the specification states that a component, feature, structure, program, or characteristic A will result in a component, feature, structure, procedure, or characteristic B, it indicates that A is at least part of B, or indicates that there are other components, features, or structures. , program or feature assists in causing B. The word "may" mentioned in the specification, its components, characteristics, procedures Or the characteristics are not limited to the specification; the number mentioned in the specification is not limited to the words "one" or "one".
本發明無論就目的、手段及功效，在在均顯示其迥異於習知技術之特徵，為一大突破。惟須注意，上述實施例僅為例示性說明本發明之原理及其功效，而非用於限制本發明之範圍。雖然在這裡已闡明與解釋特定實施例與所揭露之應用，該實施例並不意圖侷限於精確解釋，任何熟於此項技藝之人士均可在不違背本發明之技術原理及精神下，對實施例作修改與變化。也應當了解，在不背離本發明所揭露之精神與範疇下，本發明所揭露於此之元件與其之各種修正、變更、對於此領域之技術者為顯而易見之加以排列之延伸、操作、該方法之細節，以及在此所揭露之裝置與方法將不被侷限，且應包含於下述專利申請範圍內。 The present invention is a breakthrough in terms of its purpose, means, and efficacy, both of which are distinct from the characteristics of conventional techniques. It is to be noted that the above-described embodiments are merely illustrative of the principles of the invention and its advantages, and are not intended to limit the scope of the invention. Although the specific embodiments and the disclosed applications have been illustrated and described herein, the embodiments are not intended to be limited to the precise explanation, and those skilled in the art can do without departing from the technical principles and spirit of the invention. The examples are subject to modification and variation. It is also to be understood that the present invention is not limited by the spirit and scope of the invention, and the various modifications, changes, and permutations, operations, and methods of the present invention will be apparent to those skilled in the art. The details, as well as the devices and methods disclosed herein, are not intended to be limiting, and are included in the scope of the following patent applications.
954‧‧‧鏡頭 954‧‧‧ lens
210‧‧‧第一環體 210‧‧‧First ring
212‧‧‧第一半徑 212‧‧‧First radius
220‧‧‧第二環體 220‧‧‧Second ring
222‧‧‧第二半徑 222‧‧‧second radius
Claims (9)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW105116766A TWI588461B (en) | 2016-05-27 | 2016-05-27 | Lcos testing platform |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW105116766A TWI588461B (en) | 2016-05-27 | 2016-05-27 | Lcos testing platform |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TWI588461B true TWI588461B (en) | 2017-06-21 |
| TW201741640A TW201741640A (en) | 2017-12-01 |
Family
ID=59688331
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW105116766A TWI588461B (en) | 2016-05-27 | 2016-05-27 | Lcos testing platform |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TWI588461B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112858343A (en) * | 2021-02-02 | 2021-05-28 | 西安中科微星光电科技有限公司 | Multifunctional silicon-based liquid crystal chip online detection system and method |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW200401106A (en) * | 2002-05-15 | 2004-01-16 | Three Five Ststems Inc | Testing liquid crystal microdisplays |
| US20070247619A1 (en) * | 2006-04-24 | 2007-10-25 | Icf Technology Limited | Inspecting system for color filters |
| TW200946865A (en) * | 2008-02-21 | 2009-11-16 | Corning Inc | Apparatus and method for measuring surface topography of an object |
| CN101726824A (en) * | 2008-10-20 | 2010-06-09 | 承奕科技股份有限公司 | Magnification transformable lens and pick-up device |
| CN101762759A (en) * | 2010-01-07 | 2010-06-30 | 苏州佳世达电通有限公司 | Flat-panel display tester |
-
2016
- 2016-05-27 TW TW105116766A patent/TWI588461B/en active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW200401106A (en) * | 2002-05-15 | 2004-01-16 | Three Five Ststems Inc | Testing liquid crystal microdisplays |
| US20070247619A1 (en) * | 2006-04-24 | 2007-10-25 | Icf Technology Limited | Inspecting system for color filters |
| TW200946865A (en) * | 2008-02-21 | 2009-11-16 | Corning Inc | Apparatus and method for measuring surface topography of an object |
| CN101726824A (en) * | 2008-10-20 | 2010-06-09 | 承奕科技股份有限公司 | Magnification transformable lens and pick-up device |
| CN101762759A (en) * | 2010-01-07 | 2010-06-30 | 苏州佳世达电通有限公司 | Flat-panel display tester |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112858343A (en) * | 2021-02-02 | 2021-05-28 | 西安中科微星光电科技有限公司 | Multifunctional silicon-based liquid crystal chip online detection system and method |
| CN112858343B (en) * | 2021-02-02 | 2021-11-16 | 西安中科微星光电科技有限公司 | Multifunctional silicon-based liquid crystal chip online detection system and method |
Also Published As
| Publication number | Publication date |
|---|---|
| TW201741640A (en) | 2017-12-01 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR101291843B1 (en) | Apparatus for inspection of liquid crystal display device and inspecting method thereof | |
| JP2008151814A5 (en) | ||
| TW201623944A (en) | Inspection device of display device and inspection method of display device | |
| TWI588461B (en) | Lcos testing platform | |
| JP6977141B2 (en) | Display panel test circuit and display device | |
| WO2018209936A1 (en) | Coordinate correction method for image obtaining device, and image obtaining device | |
| CN101261347A (en) | Camera module group and method of manufacture | |
| KR101756904B1 (en) | Apparatus for Measuring the Position for Applying Optical Film | |
| TW200712467A (en) | Liquid crystal panel inspection device | |
| WO2015090060A1 (en) | Method and system for repairing defective pixel, and display panel | |
| CN104865741B (en) | A kind of liquid crystal display panel | |
| CN107783307A (en) | Spliced optical imaging system | |
| TW202129263A (en) | Inspection method, inspection apparatus and inspection system | |
| CN103676490B (en) | A kind of method monitoring weakness Crack cause | |
| CN106200049B (en) | Image quality detection method for curved surface display equipment | |
| TWM568454U (en) | Optical inspection apparatus | |
| WO2016045431A1 (en) | Array substrate, display panel, display apparatus, and method for repairing display panel | |
| JP4876803B2 (en) | Inspection image acquisition method | |
| US20080259290A1 (en) | Projection apparatus | |
| KR20070006480A (en) | Apparatus for detecting the badness of the seal line and method for detecting the badness of the seal line using the apparatus | |
| US11546564B2 (en) | Projection system and self-adaptive adjustment method thereof | |
| CN107688248A (en) | liquid crystal on silicon test platform | |
| US20140167298A1 (en) | Alignment apparatus, exposing appratus including the same, and manufacturing method of liquid crystal display device | |
| TWM451540U (en) | Testing apparatus | |
| TWI749409B (en) | Optical measuring method |