TWI563274B - Test circuit board for sata connector testing - Google Patents

Test circuit board for sata connector testing

Info

Publication number
TWI563274B
TWI563274B TW104143986A TW104143986A TWI563274B TW I563274 B TWI563274 B TW I563274B TW 104143986 A TW104143986 A TW 104143986A TW 104143986 A TW104143986 A TW 104143986A TW I563274 B TWI563274 B TW I563274B
Authority
TW
Taiwan
Prior art keywords
circuit board
test circuit
sata connector
connector testing
testing
Prior art date
Application number
TW104143986A
Other languages
Chinese (zh)
Other versions
TW201723520A (en
Inventor
Ping Song
Chang Qin Mu
xiao qian Li
Original Assignee
Inventec Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Inventec Corp filed Critical Inventec Corp
Priority to TW104143986A priority Critical patent/TWI563274B/en
Application granted granted Critical
Publication of TWI563274B publication Critical patent/TWI563274B/en
Publication of TW201723520A publication Critical patent/TW201723520A/en

Links

TW104143986A 2015-12-28 2015-12-28 Test circuit board for sata connector testing TWI563274B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW104143986A TWI563274B (en) 2015-12-28 2015-12-28 Test circuit board for sata connector testing

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW104143986A TWI563274B (en) 2015-12-28 2015-12-28 Test circuit board for sata connector testing

Publications (2)

Publication Number Publication Date
TWI563274B true TWI563274B (en) 2016-12-21
TW201723520A TW201723520A (en) 2017-07-01

Family

ID=58227449

Family Applications (1)

Application Number Title Priority Date Filing Date
TW104143986A TWI563274B (en) 2015-12-28 2015-12-28 Test circuit board for sata connector testing

Country Status (1)

Country Link
TW (1) TWI563274B (en)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1997022013A1 (en) * 1995-12-08 1997-06-19 Samsung Electronics Co., Ltd. Jtag testing of buses using plug-in cards with jtag logic mounted thereon
US20050028062A1 (en) * 2003-04-30 2005-02-03 Konrad Herrmann Test method and apparatus for high-speed semiconductor memory devices
TWM346011U (en) * 2008-07-14 2008-12-01 Inventec Corp Memory testing fixture
TW201310458A (en) * 2011-08-26 2013-03-01 Powertech Technology Inc Testing interface board specially for DRAM memory packages

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1997022013A1 (en) * 1995-12-08 1997-06-19 Samsung Electronics Co., Ltd. Jtag testing of buses using plug-in cards with jtag logic mounted thereon
TW311176B (en) * 1995-12-08 1997-07-21 Ast Res Inc
US20050028062A1 (en) * 2003-04-30 2005-02-03 Konrad Herrmann Test method and apparatus for high-speed semiconductor memory devices
TWM346011U (en) * 2008-07-14 2008-12-01 Inventec Corp Memory testing fixture
TW201310458A (en) * 2011-08-26 2013-03-01 Powertech Technology Inc Testing interface board specially for DRAM memory packages

Also Published As

Publication number Publication date
TW201723520A (en) 2017-07-01

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