TWI545430B - Method and tool apparatus for setting over current protection of ic embedded in power supply - Google Patents
Method and tool apparatus for setting over current protection of ic embedded in power supply Download PDFInfo
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Description
本發明是關於一種電源供應器用之一控制治具裝置，更特別地，本發明是關於一種用於設定一電源供應器的一保護晶片之一過電流保護態樣之控制治具裝置及方法。 BACKGROUND OF THE INVENTION 1. Field of the Invention This invention relates to a control fixture apparatus for a power supply, and more particularly to a control fixture apparatus and method for setting an overcurrent protection aspect of a protection wafer of a power supply.
傳統的過電流保護架構是由硬體電路設計，完全是由保護晶片及其週邊電路設計而成。零件的誤差以及電路佈局設計的誤差往往造成同一批生產出來的產品的OCP(Over Current Protection，過電流保護，以下簡稱OCP)的保護電流範圍非常不集中，甚至與預期設定相差甚遠，除了考量保護晶片本身的誤差外並且需要使用高精密度的零件(RL,RS,Ri等電阻)做匹配，因此增加零件成本；即使使用可變電阻(VR)，也需要由人工於生產流程中進行調整，但仍無法避免人工手調的誤差。 The traditional overcurrent protection architecture is designed by a hardware circuit and is designed entirely from the protection chip and its peripheral circuits. The error of the parts and the error of the circuit layout design often cause the OCP (Over Current Protection, OCP) protection current range of the same batch of products to be very inconsistent, even far from the expected setting, except for the protection. The error of the chip itself and the need to use high-precision parts (resistances such as RL, RS, Ri) to match, thus increasing the cost of parts; even if a variable resistor (VR) is used, it needs to be adjusted manually by the production process. However, it is still impossible to avoid the error of manual adjustment.
雖然新一代的保護晶片本身具備可接收設定訊號的功能，控制治具可以送出啟動OCP調整的訊號，當保護晶片接受到訊號後，保護晶片會讓電源供應器(Power Supply Unit，以下簡稱PSU)開機並且進行OCP設定。所有的傳輸方式皆為單線單向，是由ATE(Automatic Test Equipment，自動測試設備，以下簡稱ATE)設定好負載後再送出觸發訊號(TTL)給控制治 具；控制治具根據該觸發訊號來送出特定固定的訊號到保護晶片的輸入腳(如PSON)。 Although the new generation of protection chip itself has the function of receiving the setting signal, the control fixture can send the signal for starting the OCP adjustment. When the protection chip receives the signal, the protection chip will make the power supply unit (Power Supply Unit, PSU for short). Power on and perform OCP settings. All transmission methods are single-line one-way. After the load is set by ATE (Automatic Test Equipment, ATE), the trigger signal (TTL) is sent to the control. The control fixture sends a specific fixed signal to the input pin (such as PSON) of the protection chip according to the trigger signal.
但是，由於控制治具只用來觸發保護晶片進行設定OCP保護的訊號，在設定期間控制治具無法讀取保護晶片及PSU的狀態，且保護晶片設定完成後控制治具也無法確認寫入結果。因此一旦保護晶片在設定OCP保護的過程中有錯誤發生，控制治具當然也無法確認異常緣由，從而無法立即排除。 However, since the control jig is only used to trigger the protection chip to set the OCP protection signal, the control jig cannot read the state of the protection chip and the PSU during the setting period, and the control jig cannot confirm the writing result after the protection chip setting is completed. . Therefore, once the protection wafer has an error in the process of setting the OCP protection, the control fixture can of course not confirm the cause of the abnormality, and thus cannot be immediately eliminated.
請參照第1圖，第1圖係顯示具有一傳統單線單向控制介面的一控制系統1a，該控制系統1a包含一自動化測試設備100、一控制治具101、一電源供應器102及一負載103，其中該電源供應器102包含一保護晶片102.1。該自動化測試設備100與該控制治具101、該電源供應器102及該負載103電連接，該自動化測試設備100可自動化地測試該電源供應器102之開、關機等功能。 Please refer to FIG. 1. FIG. 1 shows a control system 1a having a conventional single-wire one-way control interface. The control system 1a includes an automatic test equipment 100, a control fixture 101, a power supply 102, and a load. 103, wherein the power supply 102 includes a protection wafer 102.1. The automated test equipment 100 is electrically coupled to the control fixture 101, the power supply 102, and the load 103. The automated test equipment 100 can automatically test the power supply 102 for opening, shutting down, and the like.
在該自動化測試設備100設定完成該負載103之負載狀態後，該自動化測試設備100發送觸發訊號(TTL)至該控制治具101，此時該自動化測試設備100對該電源供應器102斷開控制；再由該控制治具101送出特定訊號至該保護晶片102.1。由於該自動化測試設備100不知道整個設定流程是否結束，因此該自動化測試設備100等待一特定時間(例如10秒)後，確定該整個設定流程結束後再重新控制該電源供應器102。由於該整個流程皆為單線單向，因此該自動化測試設備100也無從得知該設定流程是否結束。 After the automated test equipment 100 sets the load state of the load 103, the automated test equipment 100 sends a trigger signal (TTL) to the control fixture 101, at which time the automated test equipment 100 turns off the power supply 102. Then, the control jig 101 sends a specific signal to the protection chip 102.1. Since the automated test equipment 100 does not know whether the entire set process is finished, the automated test equipment 100 waits for a certain time (for example, 10 seconds) to determine that the power supply 102 is re-controlled after the entire set flow is completed. Since the entire process is a single-line one-way, the automated test equipment 100 also has no way of knowing whether the setting process is over.
在具有公告號I367612的台灣發明專利中，揭露了一種過電流保護電路及應用其之電源轉換器。該電源轉換器雖包含一迴授控制電 路，但該迴授控制電路並不具雙向傳輸的功能。 In the Taiwan invention patent having the publication number I367612, an overcurrent protection circuit and a power converter using the same are disclosed. The power converter includes a feedback control Road, but the feedback control circuit does not have the function of two-way transmission.
在具有公開號201417433的台灣發明專利申請中，揭露了一種電源供應器之過電流保護晶片及其設定方法。該專利雖揭露一過電流保護晶片，但該專利主要是利用接收一負載電流偵測訊號、一基準訊號、一單元設定資料及一比較訊號等，來進行過電流保護設定，該過電流保護晶片並未具有雙向傳輸的功能。 In the Taiwan invention patent application with the publication No. 201417433, an overcurrent protection wafer of a power supply and a setting method thereof are disclosed. Although the patent discloses an overcurrent protection chip, the patent mainly uses an input current detection signal, a reference signal, a unit setting data, and a comparison signal to perform an overcurrent protection setting. It does not have the function of two-way transmission.
具有該傳統單線單向控制介面的該控制系統1a如上所述。由於目前的保護晶片不具有迴授功能，因此控制治具送出特定脈波後，後續的控制皆由保護晶片自己辨識，如此發生異常或產生誤差都無法即時偵測。 The control system 1a having the conventional single-line one-way control interface is as described above. Since the current protection chip does not have a feedback function, after the control jig sends a specific pulse wave, the subsequent control is recognized by the protection chip itself, and such an abnormality or an error cannot be detected immediately.
為了解決習知技術中存在的缺失，本案發明人提出一種用於設定電源供應器的保護晶片之過電流保護態樣之控制治具裝置及方法來有效改善上述缺失。本發明特殊的設計不只解決上述所提之缺失同時也易於實現，因此，本發明具有產業可利用性。 In order to solve the shortcomings in the prior art, the inventors of the present invention have proposed a control jig apparatus and method for setting an overcurrent protection pattern of a protection chip of a power supply to effectively improve the above-mentioned deficiency. The particular design of the present invention not only solves the above-mentioned drawbacks but is also easy to implement, and therefore, the present invention has industrial applicability.
依據上述構想，本發明的一實施例提出一種電源供應器用之一控制治具裝置，其中該電源供應器包含一保護晶片。該控制治具裝置包含一控制單元，一第一傳輸線以及一第二傳輸線。其中該第一傳輸線電連接於該控制單元及該保護晶片之間並於第一情況，自該控制單元傳輸一第一訊號至該保護晶片。其中該第二傳輸線，電連接於該控制單元及該保護晶片之間，並於第二情況，自該保護晶片傳輸一第二訊號至該控制單元。 In accordance with the above concept, an embodiment of the present invention provides a control fixture apparatus for a power supply, wherein the power supply includes a protection wafer. The control fixture device includes a control unit, a first transmission line and a second transmission line. The first transmission line is electrically connected between the control unit and the protection chip. In the first case, a first signal is transmitted from the control unit to the protection chip. The second transmission line is electrically connected between the control unit and the protection chip, and in the second case, a second signal is transmitted from the protection chip to the control unit.
本發明之另一實施例是提供一種用於設定一電源供應器的一保護晶片之一第一過電流保護態樣之方法，其中該保護晶片電連接於一 控制治具裝置，該控制治具裝置包含一控制單元。該方法包括為該保護晶片提供一第一及第二傳輸線、一第一及第二記憶體，依據該第一及第二訊號判斷該保護晶片是否已有設定該第一過電流保護態樣，如無，將該第一過電流保護態樣設定於該第一記憶體，以及如該保護晶片需一第二過電流保護態樣，將該第二過電流保護態樣設定於該第二記憶體。其中該第一及第二傳輸線電連接於該控制治具裝置，該第一傳輸線於第一情況，自該控制單元傳輸一第一訊號至該保護晶片，且該第二傳輸線於第二情況自該保護晶片傳輸一第二訊號至該控制單元。 Another embodiment of the present invention provides a method for setting a first overcurrent protection aspect of a protection wafer of a power supply, wherein the protection wafer is electrically connected to a A control fixture device includes a control unit. The method includes providing a first and a second transmission line, a first and a second memory for the protection chip, and determining, according to the first and second signals, whether the protection wafer has set the first overcurrent protection mode. If not, setting the first overcurrent protection mode to the first memory, and if the protection chip requires a second overcurrent protection aspect, setting the second overcurrent protection aspect to the second memory body. The first transmission line is electrically connected to the control fixture device. The first transmission line transmits a first signal from the control unit to the protection chip in the first case, and the second transmission line is in the second case. The protection chip transmits a second signal to the control unit.
本發明還有一個實施例是提供一種用於設定一電源供應器的一保護晶片之一第一過電流保護態樣之方法，其中該保護晶片電連接於一控制治具裝置。該方法包括為該保護晶片提供一傳輸線、一第一及第二記憶體，依據該第一及第二訊號判斷該保護晶片是否已有設定該第一過電流保護態樣，如無，將該第一過電流保護態樣設定於該第一記憶體，以及如該保護晶片需一第二過電流保護態樣，將該第二過電流保護態樣設定於該第二記憶體。其中該控制治具裝置包含一控制單元，該傳輸線電連接於該控制單元，該傳輸線於第一情況，自該控制單元傳輸一第一訊號至該保護晶片，且於第二情況自該保護晶片傳輸一第二訊號至該控制單元。 Still another embodiment of the present invention provides a method for setting a first overcurrent protection aspect of a protection wafer of a power supply, wherein the protection wafer is electrically coupled to a control fixture. The method includes providing a protection line, a first and second memory for the protection chip, and determining, according to the first and second signals, whether the protection wafer has set the first overcurrent protection aspect, if not, The first overcurrent protection aspect is set in the first memory, and if the protection wafer requires a second overcurrent protection aspect, the second overcurrent protection aspect is set in the second memory. The control fixture device includes a control unit electrically connected to the control unit. The transmission line transmits a first signal from the control unit to the protection chip in the first case, and the protection chip in the second case. A second signal is transmitted to the control unit.
本發明之又一實施例是提供一種電源供應器用之一控制治具裝置，其中該電源供應器包含一保護晶片。該控制治具裝置包含一控制單元，以及一傳輸線。其中該傳輸線電連接於該控制單元及該保護晶片之間，並於第一情況，自該控制單元傳輸一第一訊號至該保護晶片，於第二情況自該保護晶片傳輸一第二訊號至該控制單元。 Yet another embodiment of the present invention provides a control fixture apparatus for a power supply, wherein the power supply includes a protection wafer. The control fixture device includes a control unit and a transmission line. The transmission line is electrically connected between the control unit and the protection chip, and in a first case, a first signal is transmitted from the control unit to the protection chip, and in the second case, a second signal is transmitted from the protection chip to The control unit.
本發明得藉由下列實施例及圖示說明，俾得本領域具一般知識者更深入之了解上述之目的與優點。 The invention will be more fully understood by those of ordinary skill in the art the
1a‧‧‧傳統單線單向控制介面 1a‧‧‧Traditional single-line one-way control interface
2a‧‧‧雙線單向控制介面 2a‧‧‧Two-wire one-way control interface
3a-1‧‧‧單線雙向控制介面 3a-1‧‧‧Single line two-way control interface
3a-2~3a-3‧‧‧多單元自動辨識功能之程序 3a-2~3a-3‧‧‧Multi-unit automatic identification function program
3a-4~3a-5‧‧‧多次重工之程序 3a-4~3a-5‧‧‧Multiple rework procedures
4a-1‧‧‧第一例示性實施例結構示意圖 4a-1‧‧‧ Schematic diagram of the first exemplary embodiment
4a-2‧‧‧第二例示性實施例結構示意圖 4a-2‧‧‧ Schematic diagram of the second exemplary embodiment
100、200、300、500‧‧‧自動化測試設備 100, 200, 300, 500‧‧‧ automated test equipment
101‧‧‧控制治具 101‧‧‧Control fixture
102、202、302‧‧‧電源供應器 102, 202, 302‧‧‧ power supply
103、203、303‧‧‧負載 103, 203, 303‧‧‧ load
102.1、202.1、302.1、402.1、403.1‧‧‧保護晶片 102.1, 202.1, 302.1, 402.1, 403.1‧‧‧ Protected wafers
201、301、401、501‧‧‧控制治具裝置 201, 301, 401, 501‧‧‧ control fixtures
201.1、301.1、401.1‧‧‧控制單元 201.1, 301.1, 401.1‧‧‧ control unit
310~314、320~324‧‧‧步驟 310~314, 320~324‧‧‧ steps
401.2‧‧‧邏輯分析運算單元 401.2‧‧‧Logical Analysis Unit
401.3‧‧‧記錄單元 401.3‧‧‧recording unit
401.4‧‧‧除錯單元 401.4‧‧‧Debug unit
502‧‧‧指示燈 502‧‧‧ indicator light
503‧‧‧狀態顯示器 503‧‧‧Status display
504‧‧‧模式開關 504‧‧‧ mode switch
505‧‧‧通訊埠 505‧‧‧Communication埠
506‧‧‧啟動按鈕 506‧‧‧Start button
A1‧‧‧第一過電流保護態樣 A1‧‧‧First overcurrent protection
A2‧‧‧第二過電流保護態樣 A2‧‧‧Second overcurrent protection
An‧‧‧第N過電流保護態樣 An‧‧‧Nth overcurrent protection
G1‧‧‧第一設定單元 G1‧‧‧ first setting unit
G2‧‧‧第二設定單元 G2‧‧‧Second setting unit
G3‧‧‧第三設定單元 G3‧‧‧ third setting unit
Gp‧‧‧過電流保護設定目標單元 Gp‧‧‧Overcurrent protection setting target unit
Gn‧‧‧第N設定單元 Gn‧‧‧Nth setting unit
G11‧‧‧第一設定單元之第一記憶體 G11‧‧‧First memory of the first setting unit
G12‧‧‧第一設定單元之第二記憶體 G12‧‧‧Second memory of the first setting unit
G21‧‧‧第二設定單元之第一記憶體 G21‧‧‧First memory unit of the second setting unit
G22‧‧‧第二設定單元之第二記憶體 G22‧‧‧Second memory of the second setting unit
G31‧‧‧第三設定單元之第一記憶體 G31‧‧‧First memory unit of the third setting unit
G32‧‧‧第三設定單元之第二記憶體 G32‧‧‧Second memory of the third setting unit
G1n‧‧‧第一設定單元之第N記憶體 G1n‧‧‧Nth memory of the first setting unit
H1‧‧‧設定訊號 H1‧‧‧Setting signal
K1‧‧‧觸發訊號 K1‧‧‧ trigger signal
P‧‧‧過電流保護設定 P‧‧‧Overcurrent protection setting
S1‧‧‧第一訊號 S1‧‧‧ first signal
S2‧‧‧第二訊號 S2‧‧‧ second signal
S3‧‧‧第三訊號 S3‧‧‧ third signal
S4‧‧‧第四訊號 S4‧‧‧fourth signal
T1‧‧‧第一傳輸線 T1‧‧‧ first transmission line
T2‧‧‧第二傳輸線 T2‧‧‧second transmission line
Tx‧‧‧傳輸線 Tx‧‧‧ transmission line
第1圖為具有一傳統單線單向控制介面的控制系統的示意圖；第2圖為根據本發明之第一例示性實施例之具有一雙線單向控制介面的一控制系統的示意圖；第3(a)圖係顯示本發明之第二例示性實施例之具有一單線雙向控制介面的一控制系統的示意圖；第3(b)圖係顯示執行多單元數自動辨識功能之程序之第一例示性實施例流程圖；第3(c)圖係顯示執行多單元數自動辨識功能之程序之第二例示性實施例流程圖；第3(d)圖係顯示執行多次重工之程序之第一例示性實施例流程圖；第3(e)圖係顯示執行多次重工之程序之第二例示性實施例流程圖；第4(a)圖係顯示本發明之一控制治具裝置與一保護晶片之第一例示性實施例結構示意圖；第4(b)圖係顯示本發明之一控制治具裝置與一保護晶片之第二例示性實施例結構示意圖；以及第5圖係顯示本發明之一控制治具裝置之示意圖。 1 is a schematic diagram of a control system having a conventional single-wire unidirectional control interface; and FIG. 2 is a schematic diagram of a control system having a two-wire unidirectional control interface according to a first exemplary embodiment of the present invention; (a) is a schematic diagram showing a control system having a single-line bidirectional control interface according to a second exemplary embodiment of the present invention; and FIG. 3(b) is a first illustration showing a procedure for performing a multi-unit number automatic identification function Flowchart of a preferred embodiment; Figure 3(c) is a flow chart showing a second exemplary embodiment of a program for performing a multi-unit number automatic identification function; and Figure 3(d) is a first program showing a procedure for performing multiple rework Flowchart of an exemplary embodiment; FIG. 3(e) is a flow chart showing a second exemplary embodiment of a procedure for performing multiple rework; and FIG. 4(a) shows a control fixture device and a protection of the present invention Schematic diagram of a first exemplary embodiment of a wafer; FIG. 4(b) is a schematic view showing the structure of a second exemplary embodiment of a control fixture device and a protective wafer of the present invention; and FIG. 5 shows the structure of the present invention. A schematic diagram of a control fixture device.
本案所提出之發明將可由以下的實施例說明而得到充分暸解，使得熟悉本技藝之人士可以據以完成之。然而，本領域普通技術人員將會認識到，可以在沒有一個或者多個特定細節的情況下實踐本發明。在下文所述的特定實施例代表本發明的示例性實施例，並且本質上僅為示例說明而非限制。本說明書中公開的所有特徵，或公開的所有方法或過程中的步驟，除了互相排斥的特徵和/或步驟以外，均可以以任何方式組合。 The invention as set forth in the present disclosure will be fully understood from the following description of the embodiments so that those skilled in the art can. However, one skilled in the art will recognize that the invention may be practiced without one or more specific details. The specific embodiments described below are representative of the exemplary embodiments of the invention and are merely illustrative and not limiting. All of the features disclosed in this specification, or steps in all methods or processes disclosed, may be combined in any manner other than mutually exclusive features and/or steps.
本發明之創作目的為改進傳統的過電流保護架構，其以人力調整可變電阻，既費時又耗費人工成本，尤其調整精度無法統一控制；再加上習知技術為單線單向應用，僅用於提供保護晶片的觸發訊號使用，無法監測保護晶片狀態也無法變更治具設定流程。 The purpose of the invention is to improve the traditional overcurrent protection architecture, which adjusts the variable resistor by manpower, which is time consuming and labor intensive, especially the adjustment precision cannot be uniformly controlled; and the conventional technology is a single-line one-way application, only used In order to provide a trigger signal for protecting the wafer, it is impossible to monitor the state of the protection wafer and the process of setting the fixture cannot be changed.
本發明主要是藉由一個可程式化的控制治具，配合具備可自動調整電流保護的保護晶片，並於習知技術新增一迴授訊號，改以單線雙向或雙線單向的方式達到傳輸與迴授之效果。控制治具本身具有可程式化的控制功能，除了用來設定輸出的保護電流外，針對特定的保護晶片還同時具有多單元自動判定以及多次重工、偵錯、記憶資料等功能，更可相容於所有自動化或非自動化環境。 The invention mainly comprises a programmable control fixture, a protection chip with automatic current adjustment protection, and a new feedback signal in the prior art, which is realized by a single-wire bidirectional or two-wire one-way method. Transmission and feedback effects. The control fixture itself has a programmable control function. In addition to setting the protection current of the output, it also has multi-unit automatic determination and multiple rework, debugging, memory data and other functions for a specific protection chip. Responsible for all automated or non-automated environments.
請參照第2圖，第2圖係顯示本發明之第一例示性實施例之具有一雙線單向控制介面的一控制系統2a。在第2圖中，該控制系統2a包含一自動化測試設備200、一控制治具裝置201、一電源供應器202、一第一傳輸線T1、一第二傳輸線T2及一負載203。該電源供應器202包含一保護晶片202.1，該控制治具裝置201包含一控制單元201.1。在第2圖中，該自動化測 試設備200耦接於該控制治具裝置201、該電源供應器202及該負載203，而該電源供應器202耦接於該負載203。該控制單元201.1經由該第一傳輸線T1及該第二傳輸線T2與該保護晶片202.1電連接。 Referring to FIG. 2, a second diagram showing a control system 2a having a two-wire one-way control interface according to a first exemplary embodiment of the present invention. In FIG. 2, the control system 2a includes an automated test equipment 200, a control fixture device 201, a power supply 202, a first transmission line T1, a second transmission line T2, and a load 203. The power supply 202 includes a protective wafer 202.1, and the control fixture device 201 includes a control unit 201.1. In Figure 2, the automated test The test device 200 is coupled to the control fixture device 201, the power supply 202, and the load 203, and the power supply 202 is coupled to the load 203. The control unit 201.1 is electrically connected to the protection wafer 202.1 via the first transmission line T1 and the second transmission line T2.
本發明之該控制治具裝置201具備自動化之啟動方式。控制系統2a的自動化架構包含多個連接器(線材)，該多個連接器(線材)將可編程的該自動化測試設備200連接到該控制治具裝置201、該負載203和該電源供應器202，以便該自動化測試設備200進行控制。該自動化測試設備200可以送出觸發訊號K1(TTL訊號)啟動該控制治具裝置201，送出設定訊號H1以自動化設定該負載203以模擬該電源供應器202所需之負載值，並且可以針對該電源供應器202進行電源系統的全功能驗證(例如像是開機、關機以及效能等)，以達到全自動化測試流程。 The control jig device 201 of the present invention is provided with an automated starting method. The automation architecture of the control system 2a includes a plurality of connectors (wires) that connect the programmable automated test equipment 200 to the control fixture device 201, the load 203, and the power supply 202 In order for the automated test equipment 200 to control. The automatic test equipment 200 can send the trigger signal K1 (TTL signal) to activate the control fixture device 201, send the setting signal H1 to automatically set the load 203 to simulate the load value required by the power supply 202, and can be used for the power source. The provider 202 performs full-feature verification of the power system (such as booting, shutdown, and performance, etc.) to achieve a fully automated testing process.
該自動化測試設備200亦可送出觸發信號K1以啟動該控制治具裝置201。該控制治具裝置201只在當要設定該保護晶片202.1時才會被啟動，當該自動化測試設備200送出觸發信號K1以啟動該控制治具裝置201時，該自動化測試設備200同時斷開對該電源供應器202控制的動作。 The automated test equipment 200 can also send a trigger signal K1 to activate the control fixture device 201. The control fixture device 201 is only activated when the protection wafer 202.1 is to be set. When the automatic test equipment 200 sends the trigger signal K1 to activate the control fixture device 201, the automatic test equipment 200 is simultaneously disconnected. The action controlled by the power supply 202.
請再回到第2圖，當該控制治具裝置201接收到該自動化測試設備200送出之觸發信號K1時，即進入第一情況，此時該控制單元201.1會經由該第一傳輸線T1傳輸一第一訊號S1至該保護晶片202.1。由於該負載203為直接耦接於該電源供應器202，因此只有該電源供應器202之該保護晶片202.1能偵測到該負載203被設定的數值。透過傳輸該第一訊號S1至該保護晶片202.1以探詢該第一訊號S1是否與該負載203的數值相吻合。 Please return to FIG. 2, when the control fixture device 201 receives the trigger signal K1 sent by the automated test equipment 200, the first situation is entered, at which time the control unit 201.1 transmits a first transmission line T1. The first signal S1 to the protection wafer 202.1. Since the load 203 is directly coupled to the power supply 202, only the protection chip 202.1 of the power supply 202 can detect the value set by the load 203. The first signal S1 is transmitted to the protection chip 202.1 to inquire whether the first signal S1 matches the value of the load 203.
於第二情況時，該保護晶片202.1在接收該第一訊號S1後， 該保護晶片202.1會經由該第二傳輸線T2，迴授一第二訊號S2至該控制單元201.1。例如當該負載203被設定為具有15A的負載電流，則該控制單元201.1透過傳輸該第一訊號S1(例如，代表10A的負載電流)，至該保護晶片202.1，因10A與15A並不吻合，該保護晶片202.1經由該第二傳輸線T2，迴授該第二訊號S2告知該第一訊號S1所代表的值不合。在該控制單元201.1收到該第二訊號S2後，會再送出代表11A之該第一訊號S1再次探詢。經由不斷的嘗試與錯誤來達到類似於傳統可變電阻調整之效果。 In the second case, after the protection chip 202.1 receives the first signal S1, The protection chip 202.1 sends a second signal S2 to the control unit 201.1 via the second transmission line T2. For example, when the load 203 is set to have a load current of 15A, the control unit 201.1 transmits the first signal S1 (for example, a load current representing 10A) to the protection wafer 202.1, because 10A and 15A do not match. The protection chip 202.1 sends back the second signal S2 via the second transmission line T2 to notify the value represented by the first signal S1. After the second signal S2 is received by the control unit 201.1, the first signal S1 of the representative 11A is sent again to interrogate. Achieving effects similar to conventional variable resistance adjustments through constant trials and errors.
第一例示性實施例之控制系統2a的應用原理為利用該保護晶片202.1原有的PSON接腳來作為該第一傳輸線T1的連接端，再利用PGO(Power Good)接腳來作為該第二傳輸線T2的連接端，以增加迴授訊號。 The application principle of the control system 2a of the first exemplary embodiment is to use the original PSON pin of the protection chip 202.1 as the connection end of the first transmission line T1, and then use the PGO (Power Good) pin as the second. The connection end of the transmission line T2 to increase the feedback signal.
請參照第3(a)圖，第3(a)圖係顯示本發明之第二例示性實施例之具有一單線雙向控制介面的一控制系統3a-1的示意圖。在第3(a)圖中，具有該單線雙向控制介面的該控制系統3a-1包含一自動化測試設備300、一控制治具裝置301、一電源供應器302、一傳輸線Tx及一負載303。其中該電源供應器302包含一保護晶片302.1，該保護晶片302.1包含一第一設定單元G1、一第二設定單元G2及一第三設定單元G3，而該控制治具裝置301包含一控制單元301.1。該第一設定單元G1包含一第一設定單元之第一記憶體G11及一第一設定單元之第二記憶體G12；該第二設定單元G2包含一第二設定單元之第一記憶體G21及一第二設定單元之第二記憶體G22；以及該第三設定單元G3包含一第三設定單元之第一記憶體G31及一第三設定單元之第二記憶體G32。 Referring to FIG. 3(a), FIG. 3(a) is a schematic diagram showing a control system 3a-1 having a single-line bidirectional control interface according to a second exemplary embodiment of the present invention. In the third (a) diagram, the control system 3a-1 having the single-wire bidirectional control interface includes an automated test equipment 300, a control fixture device 301, a power supply 302, a transmission line Tx, and a load 303. The power supply device 302 includes a protection chip 302.1. The protection device 302.1 includes a first setting unit G1, a second setting unit G2, and a third setting unit G3. The control fixture device 301 includes a control unit 301.1. . The first setting unit G1 includes a first memory unit G11 of a first setting unit and a second memory unit G12 of a first setting unit. The second setting unit G2 includes a first memory unit G21 of a second setting unit and a second memory unit G22 of the second setting unit; and the third setting unit G3 includes a first memory unit G31 of a third setting unit and a second memory unit G32 of a third setting unit.
如第3(a)圖所示，該自動化測試設備300耦接於該控制治具 裝置301、該電源供應器302及該負載303，而該電源供應器302耦接於該負載303。該控制單元301.1經由該傳輸線Tx與該保護晶片302.1電連接。具有該單線雙向控制介面的控制系統3a-1與具有該雙線單向控制介面的控制系統2a之主要區別技術特徵為，該控制單元301.1只經由一條傳輸線Tx與該保護晶片302.1電連接。由於部份的保護晶片並不具有PGO接腳，因此採取訊號共用的方式。本發明之控制系統3a-1可應用於只有PSON接腳之保護晶片。 As shown in FIG. 3( a ), the automated test equipment 300 is coupled to the control fixture The device 301, the power supply 302 and the load 303, and the power supply 302 is coupled to the load 303. The control unit 301.1 is electrically connected to the protection wafer 302.1 via the transmission line Tx. The main distinguishing feature of the control system 3a-1 having the single-wire bidirectional control interface and the control system 2a having the two-wire unidirectional control interface is that the control unit 301.1 is electrically connected to the protection wafer 302.1 via only one transmission line Tx. Since some of the protection chips do not have PGO pins, signal sharing is adopted. The control system 3a-1 of the present invention can be applied to a protection wafer having only PSON pins.
在本發明之一實施例中，該控制單元301.1為微處理器。該控制單元301.1可經由送出指令至該保護晶片302.1以詢問該保護晶片302.1是否具有PGO接腳，再根據來自該保護晶片302.1的回傳訊號來決定要採用單線雙向介面或雙線單向介面。 In an embodiment of the invention, the control unit 301.1 is a microprocessor. The control unit 301.1 can send a command to the protection chip 302.1 to inquire whether the protection chip 302.1 has a PGO pin, and then decide whether to use a single-wire bidirectional interface or a two-wire unidirectional interface according to the return signal from the protection chip 302.1.
請參照第3(b)圖，第3(b)圖係顯示執行多單元自動辨識功能之程序3a-2之第一例示性實施例流程圖。請額外參照第3(a)圖。該控制治具裝置301根據接收自該保護晶片302.1之迴授訊號可進行多單元自動辨識功能以進行一過電流保護設定P。該程序3a-2是敘述如下。在步驟310中，該控制單元301.1經由該傳輸線Tx傳輸一第一訊號S1至該保護晶片302.1以詢問要對哪個設定單元(該第一設定單元G1、該第二設定單元G2及該第三設定單元G3的其中之一)進行過電流保護設定。在步驟311中，該保護晶片302.1自為判斷並確認一過電流保護設定目標單元Gp(如第3(b)圖所示即該第一設定單元G1)。 Please refer to FIG. 3(b), which shows a flow chart of the first exemplary embodiment of the program 3a-2 for performing the multi-cell automatic identification function. Please refer to Figure 3(a) for additional reference. The control fixture device 301 can perform a multi-cell automatic identification function based on the feedback signal received from the protection chip 302.1 to perform an overcurrent protection setting P. This procedure 3a-2 is described below. In step 310, the control unit 301.1 transmits a first signal S1 to the protection chip 302.1 via the transmission line Tx to inquire which setting unit to be used (the first setting unit G1, the second setting unit G2 and the third setting) One of the units G3) performs an overcurrent protection setting. In step 311, the protection wafer 302.1 determines and confirms an overcurrent protection setting target unit Gp (as shown in FIG. 3(b), the first setting unit G1).
接著，在步驟312中，該保護晶片302.1經由該傳輸線Tx迴授代表該過電流保護設定目標單元Gp的一第二訊號S2至該控制單元301.1。在步驟313中，該控制單元301.1經由該傳輸線Tx對該過電流保護設定目標單元 Gp進行該過電流保護設定P。在步驟314中，該控制單元301.1完成對該保護晶片302.1之該過電流保護設定P。 Next, in step 312, the protection chip 302.1 returns a second signal S2 representing the overcurrent protection setting target unit Gp to the control unit 301.1 via the transmission line Tx. In step 313, the control unit 301.1 sets the target unit for the overcurrent protection via the transmission line Tx. Gp performs this overcurrent protection setting P. In step 314, the control unit 301.1 completes the overcurrent protection setting P for the protection wafer 302.1.
該電源供應器302具備分別供應多個輸出電流給多個負載的能力，例如輸出電流至硬碟、中央處理器及顯示卡的其中至少一個。該保護晶片302.1能夠針對該多個輸出電流進行各自的過電流保護設定。當使用者決定好要對哪個設定單元(該被決定好的設定單元即之後會被該保護晶片302.1指定為過電流保護設定目標單元Gp)進行該過電流保護設定P後，即於該自動化測試設備300進行設定。以該第一設定單元G1代表負責供應輸出電流至硬碟、該第二設定單元G2代表負責供應輸出電流至中央處理器及該第三設定單元G3代表負責供應輸出電流至顯示卡為例(該負載303內部分別會有三個與該第一設定單元G1、該第二設定單元G2及該第三設定單元G3相對應的模擬單元)，如使用者決定對該第一設定單元G1進行過電流保護設定，又該硬碟需要18A的電流，則該自動化測試設備300即會對該負載303進行模擬成該硬碟(不會對中央處理器及顯示卡進行模擬，一次一組)。 The power supply 302 has the capability of supplying a plurality of output currents to a plurality of loads, for example, output current to at least one of a hard disk, a central processing unit, and a display card. The protection wafer 302.1 is capable of performing respective overcurrent protection settings for the plurality of output currents. After the user decides which setting unit (the determined setting unit is to be designated as the overcurrent protection setting target unit Gp by the protection chip 302.1), the overcurrent protection setting P is performed, and the automatic test is performed. The device 300 performs setting. Taking the first setting unit G1 for supplying the output current to the hard disk, the second setting unit G2 for supplying the output current to the central processing unit, and the third setting unit G3 for supplying the output current to the display card as an example (the There are three analog units corresponding to the first setting unit G1, the second setting unit G2 and the third setting unit G3 respectively in the load 303, and the user decides to protect the first setting unit G1 from overcurrent. If the hard disk requires a current of 18 A, the automated test device 300 will simulate the load 303 into the hard disk (the CPU and the display card will not be simulated, one at a time).
此時該自動化測試設備300即會將該第一設定單元G1相對應的模擬單元設定為需要18A電流的負載，對其他兩個模擬單元設定為需要1A電流的負載。該負載303即會對該第一設定單元G1抽載18A電流，此時該保護晶片302.1能明顯辨識出此時該對該第一設定單元G1進行過電流保護設定(18A電流代表高電壓訊號，1A電流代表低電壓訊號)。首先，該控制治具裝置301使用具有迴授功能之該傳輸線Tx送出該第一訊號S1到該保護晶片302.1；然後，該保護晶片302.1迴授該第二訊號S2到該控制單元301.1以確認該保護晶片302.1的該過電流保護設定目標單元Gp(即於本例為該第一設 定單元G1)；然後，該控制單元301.1針對該過電流保護設定單元Gp進行該過電流保護設定P。 At this time, the automatic test equipment 300 sets the analog unit corresponding to the first setting unit G1 to a load requiring 18A current, and sets the other two analog units to a load requiring 1A current. The load 303 will draw 18A current to the first setting unit G1. At this time, the protection chip 302.1 can clearly recognize that the first setting unit G1 is overcurrent protection setting (the 18A current represents a high voltage signal, 1A current represents a low voltage signal). First, the control fixture device 301 sends the first signal S1 to the protection chip 302.1 using the transmission line Tx having a feedback function; then, the protection chip 302.1 returns the second signal S2 to the control unit 301.1 to confirm the The overcurrent protection setting target unit Gp of the protection chip 302.1 (ie, the first design in this example) The unit G1); then, the control unit 301.1 performs the overcurrent protection setting P for the overcurrent protection setting unit Gp.
請參照第3(c)圖，第3(c)圖係顯示執行多單元自動辨識功能之程序3a-3之第二例示性實施例流程圖。請額外參照第3(a)圖。該保護晶片302.1更可延伸至包含該第一設定單元G1至一第N設定單元Gn。該程序3a-3是敘述如下。在步驟310中，該控制單元301.1經由該傳輸線Tx傳輸該第一訊號S1至該保護晶片302.1以詢問要對哪個設定單元(或過電流保護設定目標單元Gp)(該第一設定單元G1至該第N設定單元Gn其中之一)進行過電流保護設定。在步驟311中，該保護晶片302.1自為判斷及確認該過電流保護設定目標單元Gp。 Referring to FIG. 3(c), FIG. 3(c) is a flow chart showing a second exemplary embodiment of the program 3a-3 for performing the multi-cell automatic identification function. Please refer to Figure 3(a) for additional reference. The protection wafer 302.1 can further extend to include the first setting unit G1 to an Nth setting unit Gn. This procedure 3a-3 is described below. In step 310, the control unit 301.1 transmits the first signal S1 to the protection chip 302.1 via the transmission line Tx to inquire which setting unit (or overcurrent protection setting target unit Gp) is to be applied (the first setting unit G1 to the One of the Nth setting units Gn performs an overcurrent protection setting. In step 311, the protection wafer 302.1 sets the target unit Gp for determining and confirming the overcurrent protection.
接著，在步驟312中，該保護晶片302.1經由該傳輸線迴授代表該過電流保護設定目標單元Gp的該第二訊號S2至該控制單元301.1。在步驟313中，該控制單元301.1經由該傳輸線Tx對該過電流保護設定目標單元Gp進行該過電流保護設定P。在步驟314中，該控制單元301.1完成對該保護晶片302.1之該過電流保護設定P。 Next, in step 312, the protection chip 302.1 returns the second signal S2 representing the overcurrent protection setting target unit Gp to the control unit 301.1 via the transmission line. In step 313, the control unit 301.1 performs the overcurrent protection setting P on the overcurrent protection setting target unit Gp via the transmission line Tx. In step 314, the control unit 301.1 completes the overcurrent protection setting P for the protection wafer 302.1.
該程序3a-2與該程序3a-3之主要區別技術特徵是該保護晶片302.1可延伸到包含該第1設定單元G1至該第N設定單元Gn。 The main distinguishing feature of the program 3a-2 and the program 3a-3 is that the protection wafer 302.1 can be extended to include the first setting unit G1 to the Nth setting unit Gn.
請參照第3(d)圖，第3(d)圖係顯示執行多次重工之程序3a-4之第一例示性實施例流程圖。該控制治具裝置301根據接收自該保護晶片302.1之迴授訊號可進行多次重工功能。該程序3a-4是敘述如下。在步驟320中，該控制單元301.1經由該傳輸線Tx傳輸一第三訊號S3至該保護晶片302.1以了解該第一設定單元G1內之該第一設定單元之第一記憶體G11的儲存狀 況。在步驟321中，該保護晶片302.1根據該第一設定單元之第一記憶體G11的該儲存狀況來迴授代表該第一設定單元之第一記憶體G11的該儲存狀況的一第四訊號S4至該控制單元301.1；當該第一設定單元之第一記憶體G11之資料是在過電流保護未設定狀態中時(為空時)，即表示無進行過該過電流保護設定P，則進入步驟322。在步驟322中，該控制單元301.1對該第一設定單元之第一記憶體G11進行初次之一第一過電流保護態樣A1的寫入。其中該第一過電流保護態樣A1代表例如像是保護點為18A的電流。 Please refer to FIG. 3(d), which shows a flow chart of the first exemplary embodiment of the procedure 3a-4 for performing multiple rework. The control fixture device 301 can perform multiple rework functions based on the feedback signal received from the protection chip 302.1. This procedure 3a-4 is described below. In step 320, the control unit 301.1 transmits a third signal S3 to the protection chip 302.1 via the transmission line Tx to learn the storage state of the first memory G11 of the first setting unit in the first setting unit G1. condition. In step 321 , the protection chip 302.1 reclaims a fourth signal S4 representing the storage condition of the first memory G11 of the first setting unit according to the storage condition of the first memory G11 of the first setting unit. To the control unit 301.1; when the data of the first memory G11 of the first setting unit is in the overcurrent protection unset state (when it is empty), that is, the overcurrent protection setting P has not been performed, then enter Step 322. In step 322, the control unit 301.1 performs writing of the first one of the first overcurrent protection patterns A1 on the first memory G11 of the first setting unit. Wherein the first overcurrent protection aspect A1 represents, for example, a current having a protection point of 18A.
當該第一設定單元之第一記憶體G11是在過電流保護已設定狀態中時(為有資料時)，則進入步驟323。在步驟323中，該保護晶片302.1根據該第一設定單元之第二記憶體G12的儲存狀況來迴授代表該第一設定單元之第二記憶體G12的儲存狀況的一第四訊號S4至該控制單元301.1；當該第一設定單元之第二記憶體G12是在過電流保護未設定狀態中時(資料為空時)，則回到步驟322；在步驟322中，該控制單元301.1對該第一設定單元之第二記憶體G12進行一第二過電流保護態樣A2的寫入，此即二次重工，其中該第二過電流保護態樣A2代表例如像是保護點為16A的電流。 When the first memory G11 of the first setting unit is in the overcurrent protection set state (when there is data), the process proceeds to step 323. In step 323, the protection chip 302.1 returns a fourth signal S4 representing the storage condition of the second memory G12 of the first setting unit according to the storage condition of the second memory G12 of the first setting unit. Control unit 301.1; when the second memory G12 of the first setting unit is in the overcurrent protection unset state (when the data is empty), return to step 322; in step 322, the control unit 301.1 The second memory G12 of the first setting unit performs writing of a second overcurrent protection pattern A2, that is, secondary rework, wherein the second overcurrent protection pattern A2 represents, for example, a current with a protection point of 16A. .
請參照第3(e)圖，第3(e)圖係顯示執行多次重工之程序3a-5之第二例示性實施例流程圖。該程序3a-5與該程序3a-4之區別技術特徵為步驟324。該第一設定單元G1可包含該第一設定單元之第一記憶體G11至一第一設定單元之第N記憶體G1n，該第二設定單元G2以及該第三設定單元G3亦可包含至第N記憶體。因此該控制治具裝置301本身亦同時具備多次重工的功能。針對特定設定單元，該控制治具裝置301需要知道哪一次要寫入哪一設定單元，因此需具備辨識第幾次進行該過電流保護設定P(重工)的功能。 Referring to Figure 3(e), Figure 3(e) is a flow chart showing a second exemplary embodiment of the procedure 3a-5 for performing multiple rework. The distinguishing feature of the program 3a-5 from the program 3a-4 is step 324. The first setting unit G1 may include the first memory G11 of the first setting unit to the Nth memory G1n of the first setting unit, and the second setting unit G2 and the third setting unit G3 may also be included N memory. Therefore, the control fixture device 301 itself also has the function of multiple rework. For the specific setting unit, the control fixture device 301 needs to know which setting unit is to be written, and therefore needs to recognize the function of performing the overcurrent protection setting P (rework) a few times.
由於當拿到該保護晶片302.1時不知道該保護晶片302.1進行過幾次該過電流保護設定P，該控制治具裝置301要能傳送指令至該保護晶片302.1才能夠知道該保護晶片302.1的該特定設定單元寫過幾次，假如已寫過了一次，那即進行第二次的寫入(即二次重工)。以該第一設定單元G1為例，該控制治具裝置301會針對該第一設定單元G1來依序送出不同的指令到該保護晶片302.1(即步驟320)；該保護晶片302.1首先會根據該第一設定單元之第一記憶體G11的儲存狀況，將代表該第一設定單元之第一記憶體G11的儲存狀況的資料經迴授該第二訊號S2而傳回該控制治具裝置301(即步驟321)。當該控制治具裝置301接收到該保護晶片302.1的該第二訊號S2時，可以依照該第二訊號S2自動判定需進行寫入的重工順序(即步驟322)。 Since the protection chip 302.1 is not known to have performed the overcurrent protection setting P several times when the protection wafer 302.1 is obtained, the control fixture device 301 can transmit the command to the protection wafer 302.1 to know the protection wafer 302.1. The specific setting unit is written several times. If it has been written once, then the second write (ie, secondary rework) is performed. Taking the first setting unit G1 as an example, the control fixture device 301 sequentially sends different instructions to the protection chip 302.1 for the first setting unit G1 (ie, step 320); the protection chip 302.1 first depends on the The storage condition of the first memory G11 of the first setting unit returns the data representing the storage status of the first memory G11 of the first setting unit to the control fixture device 301 by returning the second signal S2 ( That is, step 321). When the control fixture device 301 receives the second signal S2 of the protection chip 302.1, the rework sequence to be written can be automatically determined according to the second signal S2 (ie, step 322).
當該第一設定單元之第一記憶體G11是在過電流保護已設定狀態中時(為有資料時)，則進行步驟323；當該第一設定單元之第二記憶體G12是在過電流保護已設定狀態中時(為有資料時)，則進行第三次重工，以此方式進行，可以直到進入步驟324；及對該第一設定單元之第N記憶體G1n進行一第N過電流保護態樣An的寫入。 When the first memory G11 of the first setting unit is in the overcurrent protection set state (when there is data), proceed to step 323; when the second memory G12 of the first setting unit is in an overcurrent When the protection state is set (when there is data), the third rework is performed in this manner, and may proceed to step 324; and an Nth overcurrent is performed on the Nth memory G1n of the first setting unit. Write the protection pattern An.
請參照第4(a)圖，第4(a)圖係顯示本發明之一控制治具裝置401與一保護晶片402.1之第一例示性實施例結構4a-1示意圖。在第4(a)圖中之結構4a-1包含該控制治具裝置401、一第一傳輸線T1、一第二傳輸線T2及該保護晶片402.1。該控制治具裝置401包含一控制單元401.1、一邏輯分析運算單元401.2、一記錄單元401.3及一除錯單元401.4。其中該第一傳輸線T1係用來控制電源供應器(Power Supply Unit，PSU)的遠端開啟(On)及關閉(Off)，該第二傳輸線T2係用來顯示PSU的狀態。於實務應用上，該第一傳 輸線T1可於PSON接腳上來實現，該第二傳輸線T2可於PGO接腳來加以實現。 Referring to FIG. 4(a), FIG. 4(a) is a view showing a structure 4a-1 of a first exemplary embodiment of a control fixture device 401 and a protective wafer 402.1 of the present invention. The structure 4a-1 in Fig. 4(a) includes the control fixture device 401, a first transmission line T1, a second transmission line T2, and the protection wafer 402.1. The control fixture device 401 includes a control unit 401.1, a logic analysis operation unit 401.2, a recording unit 401.3, and a debug unit 401.4. The first transmission line T1 is used to control the remote power on (On) and off (Off) of the power supply unit (PSU), and the second transmission line T2 is used to display the state of the PSU. In practical applications, the first pass The transmission line T1 can be implemented on the PSON pin, and the second transmission line T2 can be implemented on the PGO pin.
重新回到第4(a)圖，該控制單元401.1耦接於該邏輯分析運算單元401.2以進行雙向讀寫；該控制單元401.1耦接於該記錄單元401.3以進行資料儲存；該控制單元401.1同時耦接於該除錯單元401.4以進行雙向讀寫；該邏輯分析運算單元401.2經由該第一傳輸線T1與該保護晶片402.1電連接，並傳輸一第一訊號S1；該保護晶片402.1經由該第二傳輸線T2與該邏輯分析運算單元401.2電連接，並迴授一第二訊號S2。 Returning to FIG. 4(a), the control unit 401.1 is coupled to the logic analysis operation unit 401.2 for bidirectional read and write; the control unit 401.1 is coupled to the recording unit 401.3 for data storage; the control unit 401.1 is simultaneously The logic analysis operation unit 401.2 is electrically connected to the protection chip 402.1 via the first transmission line T1 and transmits a first signal S1; the protection wafer 402.1 is connected to the second The transmission line T2 is electrically connected to the logic analysis operation unit 401.2 and returns a second signal S2.
本發明之該控制治具裝置401為一可程式化的控制治具。該控制治具裝置401主要功能是藉由傳輸該第一訊號S1來進行OCP(過電流保護)設定，並將迴授自該保護晶片402.1的該第二訊號S2解讀後自動判定進行下一步驟，如此反覆運作達到OCP設定之目的。另外該控制治具裝置401還具備偵錯、記憶等功能。 The control fixture device 401 of the present invention is a programmable control fixture. The main function of the control fixture device 401 is to perform OCP (overcurrent protection) setting by transmitting the first signal S1, and automatically interpret the second signal S2 that is fed back from the protection chip 402.1 to perform the next step. So, this operation is repeated to achieve the purpose of OCP setting. In addition, the control fixture device 401 also has functions such as debugging and memory.
該控制單元401.1之功能為設定過程中對PSU(電源供應器)的保護晶片進行OCP參數校正與數據取得，並將PSU的開/關機程序加以自動化。 The function of the control unit 401.1 is to perform OCP parameter correction and data acquisition on the protection chip of the PSU (power supply) during the setting process, and to automate the on/off procedure of the PSU.
該記錄單元401.3之功能為針對每一次在該控制單元401.1與該保護晶片402.1間進行的該第一訊號S1之傳輸與該第二訊號S2之迴授狀況進行儲存。甚至，該記錄單元401.3延伸到對錯誤現象進行儲存，且可轉換數值資料與錯誤代碼儲存於該控制治具裝置401中，可作為參考資料使用。上述之錯誤現象為基於使用者預先所設定的條件情況下(例如電源異常)，進行轉換數值資料與儲存於該記錄單元401.3。 The function of the recording unit 401.3 is to store the feedback of the first signal S1 and the feedback status of the second signal S2 between the control unit 401.1 and the protection chip 402.1. In even, the recording unit 401.3 extends to store an error phenomenon, and the convertible numerical data and the error code are stored in the control fixture device 401 and can be used as a reference material. The above error phenomenon is based on the condition set by the user in advance (for example, a power supply abnormality), and the conversion value data is stored and stored in the recording unit 401.3.
該除錯單元401.4包括下述功能。由於該控制治具裝置401可以監控傳送訊號與迴授訊號兩者，因此具備偵錯功能，因此避免設定過程中發生非預期錯誤；當發生異常時，控制治具401可以提供警告訊息(如錯誤代碼)以方便使用者加速排除異常現象。上述之非預期錯誤例如像是在正常流程下，電源或訊號出現問題時。 The debug unit 401.4 includes the following functions. Since the control fixture device 401 can monitor both the transmission signal and the feedback signal, it has a debugging function, thereby avoiding an unexpected error in the setting process; when an abnormality occurs, the control fixture 401 can provide a warning message (such as an error). Code) to facilitate the user to speed up the elimination of anomalies. Unexpected errors described above, for example, are caused by problems with power or signals during normal processes.
該邏輯分析運算單元401.2包括下述功能。該邏輯分析運算單元401.2接收來自該保護晶片402.1作為迴授訊號的該第二訊號S2，並使用特定的演算法對該第二訊號S2進行處理，將經處理資料解析後所獲得的經解析資料傳送給該控制單元401.1以進行判定。由於該第二訊號S2為二進位訊號(0和1)，該演算法的作用為在該二進位訊號上進行特殊處理以避免雜訊。一方面透過持續的雙向溝通來確認保護點(例如18A的電流)。有別於習知用人工的方式除錯，而採用數位的方式予以改良。 The logic analysis arithmetic unit 401.2 includes the following functions. The logic analysis operation unit 401.2 receives the second signal S2 from the protection chip 402.1 as a feedback signal, and processes the second signal S2 using a specific algorithm to analyze the processed data. It is transmitted to the control unit 401.1 for determination. Since the second signal S2 is a binary signal (0 and 1), the algorithm acts to perform special processing on the binary signal to avoid noise. On the one hand, the protection point (for example, the current of 18A) is confirmed through continuous two-way communication. It is different from the conventional method of manual debugging, and it is improved by digital means.
請參照第4(b)圖，第4(b)圖係顯示本發明之一控制治具裝置401與一保護晶片402.1之第二例示性實施例結構4a-2示意圖。在第4(b)圖中之結構4a-2包含該控制治具裝置401、一傳輸線Tx及該保護晶片403.1。需要說明的是，該保護晶片403.1係有別於第一例示性實施例結構4a-1中之該保護晶片402.1，如4(b)圖所示，該保護晶片403.1係只有單一接腳。其中該控制治具裝置401包含一控制單元401.1、一邏輯分析運算單元401.2、一記錄單元401.3及一除錯單元401.4。第二例示性實施例結構4a-2與第一例示性實施例結構4a-1的主要區別技術特徵為傳輸線的數量。第二例示性實施例結構示意圖4a-2只應用了單一傳輸線，即該傳輸線Tx。即此結構為應用在只有單一接腳(例如PSON)而無第二接腳(例如PGO)之保護晶片。該傳輸線Tx同時 具有傳輸該第一訊號S1及迴授該第二訊號S2的功能。 Referring to FIG. 4(b), FIG. 4(b) is a view showing a structure 4a-2 of a second exemplary embodiment of a control fixture device 401 and a protective wafer 402.1 of the present invention. The structure 4a-2 in Fig. 4(b) includes the control jig device 401, a transmission line Tx, and the protection wafer 403.1. It should be noted that the protection wafer 403.1 is different from the protection wafer 402.1 in the structure 4a-1 of the first exemplary embodiment. As shown in FIG. 4(b), the protection wafer 403.1 has only a single pin. The control fixture device 401 includes a control unit 401.1, a logic analysis operation unit 401.2, a recording unit 401.3, and a debug unit 401.4. The main distinguishing feature of the second exemplary embodiment structure 4a-2 and the first exemplary embodiment structure 4a-1 is the number of transmission lines. The schematic diagram 4a-2 of the second exemplary embodiment applies only a single transmission line, that is, the transmission line Tx. That is, the structure is a protection wafer applied to a single pin (eg, PSON) without a second pin (eg, PGO). The transmission line Tx is simultaneously The function of transmitting the first signal S1 and feeding back the second signal S2.
請參照第5圖，第5圖係顯示本發明之一控制治具裝置501之示意圖。該控制治具裝置501包含一指示燈502、一狀態顯示器503、一模式開關504、一通訊埠505以及一啟動按鈕506，其中該通訊埠505耦接於一自動化測試設備500。本發明之該控制治具裝置501亦具備非自動化之啟動方式，即研發人員或生產人員以人工方式進行負載設定後，經由該啟動按鈕506以啟動該控制治具裝置501進行OCP設定流程，並可依照生產流程架設於任一非自動化的測試環境或是研發人員的測試環境。該模式開關504為用於切換第一次過電流保護態樣之寫入與第二次過電流保護態樣之寫入。 Please refer to FIG. 5, which shows a schematic diagram of a control fixture device 501 of the present invention. The control fixture 501 includes an indicator light 502, a status display 503, a mode switch 504, a communication port 505, and a start button 506. The communication port 505 is coupled to an automated test device 500. The control fixture device 501 of the present invention also has a non-automatic startup mode, that is, after the developer or the production personnel manually set the load, the startup fixture 506 is used to activate the control fixture device 501 to perform an OCP setting process, and It can be installed in any non-automated test environment or in the test environment of the R&D personnel according to the production process. The mode switch 504 is for writing the first overcurrent protection mode and the second overcurrent protection mode.
請再回到第5圖，該指示燈502係在該控制治具裝置501完成校準後，用於指示操作狀態最後的指示燈。當該控制治具裝置501校準成功後則發出綠光，失敗則發出紅光。該狀態顯示器503即在正常流程下可顯示寫入結果，若發生異常時則用錯誤碼顯示出來。該控制治具裝置501經由該通訊埠505與該自動化測試設備500連接，以達到與自動化測試環境結合。如此之設計具有可依照生產流程架設於任一非自動化的測試環境或是研發人員的測試環境之優點。 Returning to Fig. 5, the indicator light 502 is used to indicate the last indicator light of the operating state after the control fixture device 501 has finished calibration. When the control fixture device 501 is successfully calibrated, it emits green light, and if it fails, it emits red light. The status display 503 displays the write result under normal flow, and displays an error code if an abnormality occurs. The control fixture device 501 is coupled to the automated test equipment 500 via the communication port 505 for integration with an automated test environment. Such a design has the advantage of being able to be built into any non-automated test environment or a test environment of a developer in accordance with the production process.
1.一種電源供應器202用之一控制治具裝置201，該控制治具裝置201包含一控制單元201.1、一第一傳輸線T1以及一第二傳輸線T2。該電源供應器202包含一保護晶片202.1，該第一傳輸線T1電連接於該控制單元201.1及該保護晶片202.1之間，其中該第一傳輸線T1於第一情況，自該控制單元201.1傳輸一第一訊號S1至該保護晶片202.1。該第二傳輸線T2電連接 於該控制單元201.1及該保護晶片202.1之間，其中該第二傳輸線T2於第二情況，自該保護晶片202.1傳輸一第二訊號S2至該控制單元201.1。 1. A power supply 202 for controlling a fixture device 201, the control fixture device 201 comprising a control unit 201.1, a first transmission line T1 and a second transmission line T2. The power supply 202 includes a protection chip 202.1 electrically connected between the control unit 201.1 and the protection chip 202.1. The first transmission line T1 is transmitted from the control unit 201.1 in the first case. A signal S1 to the protection wafer 202.1. The second transmission line T2 is electrically connected Between the control unit 201.1 and the protection chip 202.1, wherein the second transmission line T2 transmits a second signal S2 from the protection chip 202.1 to the control unit 201.1 in the second case.
2.如實施例1所述的控制治具裝置201，其中：該保護晶片202.1更具有一第一設定單元G1及一第二設定單元G2；該控制單元201.1經由傳輸該第一訊號S1以詢問該保護晶片202.1要對於該第一設定單元G1及該第二設定單元G2的其中之一進行一過電流保護設定P；以及該保護晶片202.1自為判斷後選擇該第一設定單元G1及該第二設定單元G2的其中之一以作為一過電流保護設定目標單元Gp，並傳輸代表該過電流保護設定目標單元Gp的該第二訊號S2至該控制單元201.1以對於該過電流保護設定目標單元Gp進行該過電流保護設定P。 2. The control fixture device 201 of the embodiment 1, wherein the protection chip 202.1 further has a first setting unit G1 and a second setting unit G2; the control unit 201.1 queries by transmitting the first signal S1. The protection wafer 202.1 is configured to perform an overcurrent protection setting P for one of the first setting unit G1 and the second setting unit G2; and the protection wafer 202.1 selects the first setting unit G1 and the first One of the setting units G2 serves as an overcurrent protection setting target unit Gp, and transmits the second signal S2 representing the overcurrent protection setting target unit Gp to the control unit 201.1 to set the target unit for the overcurrent protection. Gp performs this overcurrent protection setting P.
3.如實施例1或2所述的控制治具裝置201，其中：該過電流保護設定目標單元Gp具有一第一及第二記憶體；該控制單元201.1對該過電流保護設定目標單元Gp傳輸該第一訊號S1以詢問是否已有設定一第一過電流保護態樣A1；如無，將該第一過電流保護態樣A1設定於該第一記憶體；以及如該過電流保護設定目標單元Gp需一第二過電流保護態樣A2，將該第二過電流保護態樣A2設定於該第二記憶體。 3. The control fixture device 201 of embodiment 1 or 2, wherein: the overcurrent protection setting target unit Gp has a first and second memory; the control unit 201.1 sets the target unit Gp for the overcurrent protection Transmitting the first signal S1 to query whether a first overcurrent protection mode A1 has been set; if not, setting the first overcurrent protection mode A1 to the first memory; and if the overcurrent protection setting The target cell Gp needs a second overcurrent protection pattern A2, and the second overcurrent protection pattern A2 is set to the second memory.
4.如實施例1~3其中之一所述的控制治具裝置201更包含：一邏輯分析運算單元401.2、一狀態顯示器503、一記錄單元401.3以及一除錯單元401.4。該邏輯分析運算單元401.2儲存有一演算法，用以對該第二訊號S2進行運算。該狀態顯示器503用於顯示一錯誤代碼。該記錄單元401.3用於記錄該第一訊號S1及該第二訊號S2。該除錯單元401.4儲存有一預設錯誤代碼表，當發生異常時將對應的錯誤代碼顯示於該狀態顯示器503 上。 4. The control fixture device 201 according to one of the embodiments 1 to 3 further includes: a logic analysis operation unit 401.2, a status display 503, a recording unit 401.3, and a debug unit 401.4. The logic analysis operation unit 401.2 stores an algorithm for performing operation on the second signal S2. The status display 503 is used to display an error code. The recording unit 401.3 is configured to record the first signal S1 and the second signal S2. The debug unit 401.4 stores a preset error code table, and displays a corresponding error code on the status display 503 when an abnormality occurs. on.
5.如實施例1~4其中之一所述的控制治具裝置201，其中：該第一傳輸線T1係用來控制該電源供應器的遠端開啟及關閉，該第二傳輸線T2係用來顯示該電源供應器的狀態；該控制治具裝置201更耦接於一可編程的自動化測試機台200，其中該可編程的自動化測試機台200耦接於一負載203及該電源供應器202，該負載203耦接於該電源供應器202；該可編程的自動化測試機台200經由傳輸一觸發訊號K1至該控制治具裝置201以自動化進行該過電流保護設定P；以及該可編程的自動化測試機台200經由傳輸一設定訊號H1至該負載203以自動化進行設定。 5. The control fixture device 201 of any one of embodiments 1 to 4, wherein: the first transmission line T1 is used to control the opening and closing of the remote end of the power supply, and the second transmission line T2 is used to The state of the power supply is displayed. The control fixture device 201 is further coupled to a programmable automated test machine 200. The programmable automatic test machine 200 is coupled to a load 203 and the power supply 202. The load 203 is coupled to the power supply 202; the programmable automatic test machine 200 automatically transmits the overcurrent protection setting P by transmitting a trigger signal K1 to the control fixture device 201; and the programmable The automated test machine 200 automates the setting by transmitting a set signal H1 to the load 203.
6.如實施例1~5其中之一所述的控制治具裝置201，其中：該負載203可經由該可編程的自動化測試機台200進行自動設定或經由人工進行手動設定；以及該控制治具裝置201更包含一啟動按鈕501以用於手動設定時啟動該控制治具裝置201。 6. The control fixture device 201 of any one of embodiments 1 to 5, wherein: the load 203 is automatically set via the programmable automated test machine 200 or manually set manually; and the control The device 201 further includes a start button 501 for activating the control fixture device 201 for manual setting.
7.一種用於設定一電源供應器202的一保護晶片202.1之一第一過電流保護態樣A1之方法，其中該保護晶片202.1電連接於一控制治具裝置201，該控制治具裝置201包含一控制單元201.1，該方法包括：為該保護晶片202.1提供一第一傳輸線T1及一第二傳輸線T2、一第一及第二記憶體，其中該第一傳輸線T1及該第二傳輸線T2電連接於該控制治具裝置201，該第一傳輸線T1於第一情況，自該控制單元201.1傳輸一第一訊號S1至該保護晶片202.1，且該第二傳輸線T2於第二情況自該保護晶片202.1傳輸一第二訊號S2至該控制單元201.1；依據該第一及第二訊號判斷該保護晶片202.1是否已有設定該第一過電流保護態樣A1；如無，將該第一過電流保護態樣A1 設定於該第一記憶體；以及如該保護晶片需一第二過電流保護態樣A2，將該第二過電流保護態樣A2設定於該第二記憶體。 7. A method for setting a first overcurrent protection pattern A1 of a protection wafer 202.1 of a power supply 202, wherein the protection wafer 202.1 is electrically connected to a control fixture device 201, the control fixture device 201 A control unit 201.1 is provided. The method includes: providing a first transmission line T1 and a second transmission line T2, a first and second memory for the protection chip 202.1, wherein the first transmission line T1 and the second transmission line T2 are electrically Connected to the control fixture device 201, the first transmission line T1 transmits a first signal S1 to the protection chip 202.1 from the control unit 201.1 in the first case, and the second transmission line T2 is in the second case from the protection chip. 202.1 transmitting a second signal S2 to the control unit 201.1; determining, according to the first and second signals, whether the protection chip 202.1 has set the first overcurrent protection aspect A1; if not, the first overcurrent protection Aspect A1 The first memory is set in the first memory; and if the protection chip requires a second overcurrent protection pattern A2, the second overcurrent protection pattern A2 is set in the second memory.
8.一種用於設定一電源供應器202的一保護晶片102.1之一第一過電流保護態樣A1之方法，其中該保護晶片202.1電連接於一控制治具裝置201，該方法包括：為該保護晶片202.1提供一傳輸線Tx、一第一及第二記憶體，其中該控制治具裝置201包含一控制單元201.1，該傳輸線Tx電連接於該控制單元201.1，該傳輸線Tx於第一情況，自該控制單元201.1傳輸一第一訊號S1至該保護晶片202.1，且於第二情況自該保護晶片202.1傳輸一第二訊號S2至該控制單元201.1；依據該第一及第二訊號判斷該保護晶片202.1是否已有設定該第一過電流保護態樣A1；如無，將該第一過電流保護態樣A1設定於該第一記憶體；以及如該保護晶片202.1需一第二過電流保護態樣A2，將該第二過電流保護態樣A2設定於該第二記憶體。 A method for setting a first overcurrent protection pattern A1 of a protection wafer 102.1 of a power supply 202, wherein the protection wafer 202.1 is electrically connected to a control fixture device 201, the method comprising: The protection chip 202.1 provides a transmission line Tx, a first and a second memory, wherein the control fixture device 201 comprises a control unit 201.1, the transmission line Tx is electrically connected to the control unit 201.1, the transmission line Tx is in the first case, The control unit 201.1 transmits a first signal S1 to the protection chip 202.1, and in the second case, transmits a second signal S2 from the protection chip 202.1 to the control unit 201.1; and the protection chip is determined according to the first and second signals. 202.1 whether the first overcurrent protection aspect A1 is set; if not, the first overcurrent protection aspect A1 is set to the first memory; and if the protection wafer 202.1 requires a second overcurrent protection state In the sample A2, the second overcurrent protection pattern A2 is set in the second memory.
9.一種電源供應器202用之一控制治具裝置201，其中該電源供應器202包含一保護晶片202.1，該控制治具裝置201包含一控制單元201.1以及一傳輸線Tx。該傳輸線Tx電連接於該控制單元201.1及該保護晶片202.1之間，其中該傳輸線Tx於第一情況，自該控制單元201.1傳輸一第一訊號S1至該保護晶片202.1，且於第二情況自該保護晶片202.1傳輸一第二訊號S2至該控制單元201.1。 A power supply device 202 is used to control the fixture device 201. The power supply device 202 includes a protection chip 202.1. The control fixture device 201 includes a control unit 201.1 and a transmission line Tx. The transmission line Tx is electrically connected between the control unit 201.1 and the protection chip 202.1. The transmission line Tx transmits a first signal S1 to the protection chip 202.1 from the control unit 201.1 in the first case, and in the second case The protection chip 202.1 transmits a second signal S2 to the control unit 201.1.
如實施例9所述的控制治具裝置201，其中：該保護晶片202.1更具有一第一設定單元G1及一第二設定單元G2；該控制單元201.1經由傳輸該第一訊號S1以詢問該保護晶片202.1要對於該第一設定單元G1及該第二設定單元G2的其中之一進行一過電流保護設定P；以及該保護晶片202.1自 為判斷後選擇該第一設定單元G1及該第二設定單元G2的其中之一以作為一過電流保護設定目標單元Gp，並傳輸代表該過電流保護設定目標單元Gp的該第二訊號S2至該控制單元201.1以對於該過電流保護設定目標單元Gp進行該過電流保護設定P。 The control fixture device 201 of the embodiment 9 further includes a first setting unit G1 and a second setting unit G2; the control unit 201.1 queries the protection by transmitting the first signal S1. The wafer 202.1 is subjected to an overcurrent protection setting P for one of the first setting unit G1 and the second setting unit G2; and the protection wafer 202.1 is Determining, selecting one of the first setting unit G1 and the second setting unit G2 as an overcurrent protection setting target unit Gp, and transmitting the second signal S2 representing the overcurrent protection setting target unit Gp to The control unit 201.1 performs the overcurrent protection setting P for the overcurrent protection setting target unit Gp.
綜上所述，本發明的說明與實施例已揭露於上，然其非用來限制本發明，凡習知此技藝者，在不脫離本發明的精神與範圍之下，當可做各種更動與修飾，其仍應屬在本發明專利的涵蓋範圍之內。 In the above, the description and the embodiments of the present invention have been disclosed, and are not intended to limit the present invention, and those skilled in the art can make various changes without departing from the spirit and scope of the present invention. And modifications, which still fall within the scope of the present invention.
4a-2‧‧‧第二例示性實施例結構示意圖 4a-2‧‧‧ Schematic diagram of the second exemplary embodiment
401‧‧‧控制治具裝置 401‧‧‧Control fixture device
401.1‧‧‧控制單元 401.1‧‧‧Control unit
401.2‧‧‧邏輯分析運算單元 401.2‧‧‧Logical Analysis Unit
401.3‧‧‧記錄單元 401.3‧‧‧recording unit
401.4‧‧‧除錯單元 401.4‧‧‧Debug unit
403.1‧‧‧保護晶片 403.1‧‧‧Protected wafer
S1‧‧‧第一訊號 S1‧‧‧ first signal
S2‧‧‧第二訊號 S2‧‧‧ second signal
Tx‧‧‧傳輸線 Tx‧‧‧ transmission line
Claims (8)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW104115123A TWI545430B (en) | 2015-05-12 | 2015-05-12 | Method and tool apparatus for setting over current protection of ic embedded in power supply |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW104115123A TWI545430B (en) | 2015-05-12 | 2015-05-12 | Method and tool apparatus for setting over current protection of ic embedded in power supply |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TWI545430B true TWI545430B (en) | 2016-08-11 |
| TW201640267A TW201640267A (en) | 2016-11-16 |
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| Application Number | Title | Priority Date | Filing Date |
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| TW104115123A TWI545430B (en) | 2015-05-12 | 2015-05-12 | Method and tool apparatus for setting over current protection of ic embedded in power supply |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI767194B (en) * | 2020-03-02 | 2022-06-11 | 香港商蜜蜂計算（香港）股份有限公司 | Power supply device for multi-stage series circuit and mining machine having the same |
| US11693519B2 (en) | 2018-07-10 | 2023-07-04 | Sensortek Technology Corp. | Proximity sensor and proximity sensing method |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11170675B2 (en) * | 2020-03-19 | 2021-11-09 | Himax Technologies Limited | Method for performing hybrid over-current protection detection in a display module, and associated timing controller |
| TWI780910B (en) * | 2021-09-15 | 2022-10-11 | 英業達股份有限公司 | Testing tool |
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2015
- 2015-05-12 TW TW104115123A patent/TWI545430B/en active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11693519B2 (en) | 2018-07-10 | 2023-07-04 | Sensortek Technology Corp. | Proximity sensor and proximity sensing method |
| TWI767194B (en) * | 2020-03-02 | 2022-06-11 | 香港商蜜蜂計算（香港）股份有限公司 | Power supply device for multi-stage series circuit and mining machine having the same |
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| Publication number | Publication date |
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| TW201640267A (en) | 2016-11-16 |
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