TWI533186B - 液晶顯示裝置 - Google Patents
液晶顯示裝置 Download PDFInfo
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- TWI533186B TWI533186B TW102141321A TW102141321A TWI533186B TW I533186 B TWI533186 B TW I533186B TW 102141321 A TW102141321 A TW 102141321A TW 102141321 A TW102141321 A TW 102141321A TW I533186 B TWI533186 B TW I533186B
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/13338—Input devices, e.g. touch panels
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- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
- G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
- G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
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- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
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- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
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- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
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Description
本發明係關於一種液晶顯示裝置,特別是關於一種適用於內置有觸控面板之內嵌方式之液晶顯示裝置且有效之技術。
PDA或移動終端等之移動用電子機器、各種家電製品、及自動櫃員機(Automated Teller Machine)等中使用有一種顯示裝置,其包含利用使用者之手指或筆頭等於顯示畫面進行觸控操作(接觸按壓操作,以下簡稱為觸控)而輸入資訊之裝置(以下亦稱為觸控感測器或觸控面板)。
作為此種觸控面板,已知有檢測所觸控之部分之電容變化之靜電電容方式。
作為該靜電電容方式觸控面板,已知有一種將觸控面板功能內置於液晶顯示面板之所謂內嵌方式之液晶顯示裝置。
於內嵌方式之液晶顯示裝置中,作為觸控面板之掃描電極,分割使用形成於構成液晶顯示面板之第1基板(所謂TFT基板)上之對向電極(亦稱為共通電極)。
[專利文獻1]日本專利特開2009-258182號公報
內嵌方式之液晶顯示裝置之觸控面板係相互電容檢測方式,檢測形成於液晶顯示面板之第1基板上之掃描電極、與形成於液晶顯示面板之第2基板上之檢測電極之間之交叉電容(Cxy)而檢測觸控位置。
交叉電容(Cxy)因液晶層、構成第1及第2基板之玻璃基板、偏光板、接著樹脂等之介電常數或厚度之偏差、或不均一性,而具有個體差或面內偏差,必須進行校準。
又,於內嵌方式之液晶顯示裝置之觸控面板之出貨檢查中,裝上可覆蓋觸控面板整面之面積之金屬板,若掃描電極與檢測電極之所有交點之Raw資料之裝上金屬板前後之差分值處於規定範圍內,則判定為良品。
該金屬板檢查可於短時間內判定,另一方面,難以進行相互鄰接之2個檢測電極之鄰接短路不良之檢測。於該鄰接短路不良中,亦包含連接於相互鄰接之2個檢測電極之可撓性配線基板上之配線之鄰接短路不良。
相互鄰接之2個檢測電極之鄰接短路不良之檢測雖可以掃描電極與檢測電極之每個各交點之打點檢查實現,但由於檢查需要時間,故生產效率顯著降低。又,於連接於可撓性配線基板上之檢測電極之配線上設置測試墊片進行接通短路檢查之方法,具有對雜訊或靜電較弱或可撓性配線基板變大等缺點。
本發明係為了解決上述先前技術之問題點而完成者,本發明之目的在於提供一種於內置有觸控面板功能之液晶顯示裝置中,可有效執行交叉電容之校準之技術。
又,本發明之其他目的在於提供一種於內置有觸控面板功能之液晶顯示裝置中,可利用交叉電容之校準電路,檢測相互鄰接之2個檢測電極之鄰接短路不良之技術。
本發明之上述以及其他目的與新穎特徵可藉由本說明書之記述及附加圖式明瞭。
若簡單地說明本申請案所揭示之發明中之代表性者之概要,則如下所述。
本發明係於檢測電極之各者配置於另一端施加校準電壓(VDAC)之校準電容,並藉由調整校準電壓(VDAC)而使電荷提取量可變,而有效執行校準。
再者,於本發明中,利用該校準電路,進行包含可撓性配線基板上之配線且相互鄰接之2個檢測電極是否短路之鄰接短路不良之檢查。
鄰接短路不良之檢查時,於連接於奇數序號之檢測電極之校準電容之另一端,施加不提取電荷之校準電壓(例如VREF之基準電壓),於偶數序號之檢測電極,施加充分提取電荷之校準電壓(例如GND之電壓)。
藉此,由於相互鄰接之2個檢測電極未短路之情形時,自奇數序號之檢測電極檢測,且以AD轉換器予以轉換之Raw資料係例如於10位元成為[0],相互鄰接之2個檢測電極短路之情形時,自奇數序號之檢測電極檢測,且以AD轉換器予以轉換之Raw資料係例如於10位元成為[1023],故可簡單且短時間地檢測出檢測電極之鄰接短路不良。
若簡單地說明藉由本申請案所揭示之發明中之代表性者而獲得之效果,則如下所述。
(1)根據本發明之內置有觸控面板功能之液晶顯示裝置,可有效執行交叉電容之校準。
(2)根據本發明之內置有觸控面板功能之液晶顯示裝置,可利用
交叉電容之校準電路,檢測相互鄰接之2個檢測電極之鄰接短路不良。
2‧‧‧第1基板(TFT基板)
3‧‧‧第2基板(CF基板)
4‧‧‧液晶組合物
5‧‧‧液晶驅動器IC
10‧‧‧積分電路
11‧‧‧取樣保持電路
12‧‧‧AD轉換器
13‧‧‧檢測RAM
14‧‧‧校準RAM
15‧‧‧DA轉換器
21‧‧‧對向電極
22‧‧‧對向電極信號線
25‧‧‧驅動電路用輸入端子
31‧‧‧檢測電極
33‧‧‧虛設電極
36‧‧‧檢測電極用端子
40‧‧‧前窗(或保護膜)
53‧‧‧連接用可撓性配線基板
101‧‧‧LCD驅動器
102‧‧‧序列發生器
103‧‧‧觸控面板掃描電壓產生電路
106‧‧‧解碼器電路
107‧‧‧觸控面板
108‧‧‧檢測電路
200‧‧‧像素部
502‧‧‧手指
A1‧‧‧期間
A2‧‧‧期間
B1~Bn‧‧‧期間
C‧‧‧期間
Cclb‧‧‧校準電容
CINT‧‧‧積分電容
Cxy‧‧‧交叉電容
Hsync‧‧‧水平同步信號
LA‧‧‧非觸控位準
MFPC‧‧‧主可撓性配線基板
MPU‧‧‧微電腦
R0~R5‧‧‧行
RX(RX0~RXn)‧‧‧觸控面板之檢測電極
S1~S6‧‧‧開關
T3‧‧‧返馳期間
T4‧‧‧像素寫入期間
TX(TX0~TXm)‧‧‧觸控面板之掃描電極
Vclb‧‧‧電壓
VINT‧‧‧積分輸出電壓
VREF‧‧‧基準電壓
Vsync‧‧‧垂直同步信號
Vstc‧‧‧觸控面板掃描電壓
△Va‧‧‧電壓值
△Vb‧‧‧電壓值
圖1A係顯示於液晶顯示面板之內部內置有觸控面板之內嵌方式之液晶顯示裝置之一例之概略構成的分解立體圖。
圖1B係顯示於液晶顯示面板之內部內置有觸控面板之內嵌方式之液晶顯示裝置之其他例之概略構成的分解立體圖。
圖2係說明圖1A、圖1B所示之液晶顯示裝置之對向電極與檢測電極之圖。
圖3係放大顯示圖1A、圖1B所示之液晶顯示裝置之顯示部之剖面之一部分的概略剖面圖。
圖4係顯示成為本發明之前提之內嵌方式之液晶顯示裝置之觸控面板之整體概略構成的方塊圖。
圖5係用以說明成為本發明之前提之內嵌方式之液晶顯示裝置之觸控面板之檢測原理的圖。
圖6係成為本發明之前提之內嵌方式之液晶顯示裝置之觸控面板之觸控檢測動作的時序圖。
圖7係用以說明成為本發明之前提之內嵌方式之液晶顯示裝置之觸控面板檢測時、與像素寫入時之時序的圖。
圖8係顯示本發明之實施例之內嵌方式之液晶顯示裝置之檢測電路之更具體之電路構成的電路圖。
圖9係用以說明圖8所示之電路之動作之時序圖。
圖10(a)~(c)係顯示本發明之實施例之內嵌方式之液晶顯示裝置之觸控面板、檢測RAM、及校準RAM之位址映射的圖。
圖11係顯示本發明之實施例之內嵌方式之液晶顯示裝置之校準時之積分電路中之積分波形的圖。
圖12係顯示本發明之實施例之內嵌方式之液晶顯示裝置中,於檢測電極之鄰接短路不良檢查時設定於校準RAM之校準資料的圖。
圖13係顯示本發明之實施例之內嵌方式之液晶顯示裝置中,於檢測電極之鄰接短路不良檢查時設定於校準RAM之校準資料為[00]之情形之積分電路中之積分波形的圖。
圖14係顯示本發明之實施例之內嵌方式之液晶顯示裝置中,於檢測電極之鄰接短路不良檢查時設定於校準RAM之校準資料為[FF]之情形之積分電路中之積分波形的圖。
圖15(a)、(b)係顯示本發明之實施例之內嵌方式之液晶顯示裝置中,於相互鄰接之2個檢測電極未短路之情形、與相互鄰接之2個檢測電極短路之情形時,儲存於檢測RAM之Raw資料之圖。
以下,參照圖式詳細說明本發明之實施例。
另,於用以說明實施例之所有圖中,具有相同功能者標註相同符號,並省略其重複之說明。又,以下實施例並非用以限定本發明之申請專利範圍之解釋者。
圖1A係顯示於液晶顯示面板之內部內置有觸控面板之內嵌方式之液晶顯示裝置之一例之概略構成的分解立體圖。
圖1B係顯示於液晶顯示面板之內部內置有觸控面板之內嵌方式之液晶顯示裝置之其他例之概略構成的分解立體圖。
圖1B所示之內嵌方式之液晶顯示裝置係為了低成本化,將圖1A所示之主可撓性配線基板(MFPC)、與連接用可撓性配線基板53一體化者。
於圖1A、圖1B中,2係第1基板(以下稱為TFT基板),3係第2基板(以下稱為CF基板),21係對向電極(亦稱為共通電極),5係液晶驅動器IC,MFPC係主可撓性配線基板,40係前窗,53係連接用可撓性配線
基板。
於圖1A、圖1B所示之液晶顯示裝置中,將CF基板3上之背面側透明導電膜(CD)分割成帶狀之圖案而成為觸控面板之檢測電極31,且將形成於TFT基板2之內部之對向電極21分割成帶狀之圖案,即分割成複數個區塊,而兼用作觸控面板之掃描電極,藉此削減通常之觸控面板所使用之觸控面板基板。又,於圖1所示之液晶顯示裝置中,觸控面板驅動用之電路設置於液晶驅動器IC(5)之內部。
接著,使用圖2,對圖1所示之液晶顯示裝置之對向電極21與檢測電極31進行說明。
如上所述,對向電極21設置於TFT基板2上,複數條(例如32條左右)對向電極21係以兩端共通地連接,且與對向電極信號線22連接。
於圖2所示之液晶顯示裝置中,帶狀之對向電極21兼用作掃描電極(TX),又,檢測電極31構成檢測電極(RX)。
因此,於對向電極信號中,包含圖像顯示所使用之對向電壓、與觸控位置之檢測所使用之觸控面板掃描電壓。當觸控面板掃描電壓施加至對向電極21時,於與對向電極21保持一定間隔配置而構成電容之檢測電極31中產生檢測信號。該檢測信號係經由檢測電極用端子36而提取至外部。
另,於檢測電極31之兩側形成有虛設電極33。檢測電極31於一端部朝向虛設電極33側擴寬而形成有T字狀之檢測電極用端子36。又,於TFT基板2上,除了對向電極信號線22以外,亦形成如驅動電路用輸入端子25之各種配線、端子等。
圖3中顯示圖1所示之液晶顯示裝置之放大顯示部之剖面之一部分之概略剖面圖。
如圖3所示,於TFT基板2上設置有像素部200,對向電極21係作為像素之一部分而使用於圖像顯示。又,於TFT基板2與CF基板3之間
夾持有液晶組合物4。設置於CF基板3之檢測電極31與設置於TFT基板2之對向電極21形成有電容,當於對向電極21施加驅動信號時,檢測電極31之電壓變化。
此時,如圖3所示,當手指502等之導電體介隔前窗40接近或接觸時,電容發生變化,檢測電極31中產生之電壓與沒有接近、接觸之情形相比發生變化。
如此般,藉由檢測形成於液晶顯示面板之對向電極21與檢測電極31之間所產生之電容之變化,可於液晶顯示面板具備觸控面板之功能。
圖4係顯示成為本發明之前提之內嵌方式之液晶顯示裝置之觸控面板之整體概略構成的方塊圖。
於圖4中,101係LCD驅動器,102係序列發生器,103係觸控面板掃描電壓產生電路,106係解碼器電路,107係觸控面板,108係檢測電路。
於觸控面板107中,形成有用以檢測使用者之觸控之感測器端子即電極圖案(TX0~TX4之掃描電極,RX0~RX4之檢測電極)。
由於成為本發明之前提之內嵌方式之液晶顯示裝置係將觸控面板功能內置於液晶顯示面板,故圖2所示之帶狀之對向電極21兼用作掃描電極(TX),又,檢測電極31構成檢測電極(RX)。
LCD驅動器101將用以於液晶顯示面板顯示圖像之同步信號(垂直同步信號(Vsync)及水平同步信號(Hsync))送出至序列發生器102。序列發生器102控制觸控面板掃描電壓產生電路103、解碼器電路106、及檢測電路108,而控制觸控檢測動作之時序。
觸控面板掃描電壓產生電路103產生用以驅動TX0~TX4之掃描電極之觸控面板掃描電壓(Vstc)並輸出。
解碼器電路106係基於自序列發生器102輸入之選擇信號,將觸
控面板掃描電壓(Vstc)輸出至TX0~TX4之掃描電極中之1個掃描電極之類比開關(解多工器)。
檢測電路108檢測TX0~TX4之掃描電極之中供給有觸控面板掃描電壓(Vstc)之1個掃描電極、與RX0~RX4之各檢測電極之交點之電極間電容(相互電容)。
圖5係用以說明成為本發明之前提之內嵌方式之液晶顯示裝置之觸控面板之檢測原理的圖。
圖6係成為本發明之前提之內嵌方式之液晶顯示裝置之觸控檢測動作的時序圖。
序列發生器102控制觸控面板掃描電壓產生電路103等,與垂直同步信號(Vsync)及水平同步信號(Hsync)同步地向TX0~TX4之掃描電極依序供給觸控面板掃描電壓(Vstc)。此處,如圖5、圖6所示,於各掃描電極中,複數次(圖6中為8次)供給觸控面板掃描電壓(Vstc)。
如圖6所示,檢測電路108累計流入至RX0~RX4之各檢測電極之電流(圖6中為向負方向之累計),且記錄所達到之電壓值(△Va、△Vb)。由於在手指(導體)觸控掃描電極(TX)與檢測電極(RX)之交點附近之情形時,電流亦向手指流動,故累計結果之電壓值發生變化。
例如,於圖6中,於掃描電極(TX0)與檢測電極(RXn)之交點附近不存在手指之情形時(圖6之NA所示之無觸控之狀態),累計流入至檢測電極之電流後之電壓為非觸控位準(LA)。
相對於此,於掃描電極(TX2)與檢測電極(RXn)之交點附近存在手指之情形時(圖6之NB所示之有觸控之狀態),電流亦向手指流動,而累計流入至檢測電極之電流後之電壓為較非觸控位準(LA)更高電位之電壓。可根據該變化量(觸控信號)檢測觸控位置。
圖7係用以說明成為本發明之前提之內嵌方式之液晶顯示裝置之觸控面板檢測時、與像素寫入時之時序的圖。另,於圖7中,T3係返
馳期間,VSYNC係垂直同步信號,HSYNC係水平同步信號。
圖7之A顯示1訊框之像素寫入期間(T4)內,自第1顯示列至第1280顯示列之像素寫入時序,圖7之B顯示分割成20區塊之各區塊之對向電極(CT1~CT20)之觸控面板檢測時序。
如圖7所示,使任意顯示列之對向電極作為掃描電極(TX)發揮功能,觸控面板檢測時之掃描動作係在與進行像素寫入之閘極掃描不同之部位進行。
如圖7所說明般,閘極掃描與觸控面板掃描係於不同之顯示列實施,但由於影像線與對向電極(CT)之間、及掃描線與對向電極(CT)之間存在寄生電容,故因影像線上之電壓(VDL)之變動、或於掃描電壓(VGL)之上升或下降時產生之雜訊,觸控面板檢測時之檢測感度下降。
因此,於成為本發明之前提之內嵌方式之液晶顯示裝置中,觸控位置檢測動作係於無影像線上之電壓(VDL)之變動、或掃描電壓(VGL)之上升或下降之期間予以執行。
圖8係顯示本發明之實施例之內嵌方式之液晶顯示裝置之檢測電路108之更具體之電路構成的電路圖。
圖9係用以說明圖8所示之電路之動作之時序圖。
於圖8中,MPU係微電腦,CINT係積分電容,Cclb係校準電容,10係積分電路,11係取樣保持電路,12係10位元之AD轉換器,13係儲存自AD轉換器12輸出之資料(以下為Raw資料)之檢測RAM,14係校準RAM,15係8位元之DA轉換器,107係觸控面板,108係檢測電路。
以下,使用圖9,說明本實施例之檢測電路108之動作。另,於圖9中,Hsync係水平同步信號。
(1)於檢測(積分)流入至各檢測電極(RX0~RXn)之電流之前,接通開關(S1),而重設積分電路10,且接通開關(S3),而重設各檢測電
極(RX0~RXn)(圖9之A1期間)。若將基準電壓(VREF)設為4V(VREF=4V),則將積分電路10之輸出預充電至4V,各檢測電極(RX0~RXn)預充電至4V。
又,由於開關(S5)連接於基準電壓(VREF)側,於校準電容(Cclb)之兩端施加有基準電壓(VREF)之4V,故校準電容(Cclb)之電荷為「0」。
(2)接著,斷開開關(S1)與開關(S3)後,自TX0~TXm之1個掃描電極輸出觸控面板掃描電壓(Vstc),將開關(S5)切換至DA轉換器15側,於校準電容(Cclb)之一端施加自DA轉換器15輸出之校準電壓(VDAC),進行電荷之提取後,接通開關(S2)而將剩餘之電荷積分至積分電容(CINT)(圖9之B1期間)。
藉此,電流係以TX0~TXm之1個掃描電極交叉電容(Cxy)積分電容(CINT)之路徑流動,積分電路10之輸出電壓(VINT)降低。
此處,係(交叉電容(Cxy)之電荷)-(校準電容(Cclb)之電荷)=積分電容(CINT)之電荷,VINT=VREF-(Vstc*Cxy-Vclb*Cclb)/Cint
另,Cint係積分電容(CINT)之電容值,又,Vclb係施加至校準電容(Cclb)之兩端之電壓,(Vclb=VREF-VDAC)。
(3)積分電路10中之積分結束後,斷開開關(S2),接通開關(S3),且,將開關(S5)連接於基準電壓(VREF)側,而將各檢測電極(RX0~RXn)預充電至4V,且將校準電容(Cclb)之電荷設為「0」(圖9之A2期間)。
(4)重複(2)之積分電路10中之積分動作,累積電壓(圖9之B2、…之期間)。
(5)積分電路10中之積分完成後(圖9之Bn期間後),接通開關(S4),以取樣保持電路11進行取樣及保持(圖9之C期間),其後,依序
接通開關(S6),以AD轉換器12進行AD轉換,而於檢測RAM(13)中儲存RX0~RXn之掃描電極量之Raw資料。
AD轉換器12為10位元之AD轉換器之情形時,Raw資料成為0(積分0V)~1023(積分4V)之範圍。
(6)針對所有掃描電極(TX0~TXm)依序執行(1)~(5)之處理,將各掃描電極(TX0~TXm)與各檢測電極(RX0~RXn)之交點1面量之Raw資料儲存於檢測RAM(13)。
(7)由於交叉電容(Cxy)為非觸控時>觸控時,故如圖6之△Va、△Vb所示,於積分電路10中之積分輸出電壓(VINT)之下降中產生差,於此處設置閾值而進行觸控檢測。
圖10係顯示本發明之實施例之內嵌方式之液晶顯示裝置之觸控面板107、檢測RAM(13)、及校準RAM(14)之位址映射的圖。
同圖(a)顯示觸控面板107之位址映射,同圖(b)顯示檢測RAM(13)之位址映射,同圖(c)顯示後述之校準RAM(14)之位址映射。
如圖10所示,以AD轉換器12將與圖10(a)所示之各掃描電極(TX0~TXm)與各檢測電極(RX0~RXn)之交點對應之積分電路10中之積分輸出電壓(VINT)進行AD轉換,且將交點1面量之Raw資料儲存於檢測RAM(13)之該交點之位址位置。
同樣地,將與圖10(a)所示之各掃描電極(TX0~TXm)與各檢測電極(RX0~RXn)之交點對應之校準資料儲存於校準RAM(14)之該交點之位址位置。
例如,如圖10(a)所示,掃描電極(TX0)與檢測電極(RX0)之交點之位址為(0.0)之情形時,將掃描電極(TX0)與檢測電極(RX0)之交點之積分電路10中之積分輸出電壓(VINT)儲存於檢測RAM(13)之(0.0)之位址位置,將掃描電極(TX0)與檢測電極(RX0)之交點之校準資料儲存於校準RAM(14)之(0.0)之位址位置。
接著,對校準進行說明。
如上所述,各掃描電極(TX0~TXm)與各檢測電極(RX0~RXn)之交點之交叉電容(Cxy)因液晶層、玻璃基板、偏光板、接著樹脂等之介電常數或厚度之偏差、或不均一性,而具有個體差或面內偏差,故必須進行校準。
(7)如圖11所示,將非觸控時Raw資料動作點設為255,而微電腦(MPU)以此作為校準目標值,重寫校準RAM(14)之校準資料,使自DA轉換器15輸出之校準電壓(VDAC)可變地收斂。
另,當然,非觸控時之Raw資料動作點係以取樣保持電路11將非觸控時之積分電路10中之積分輸出電壓(VINT)進行取樣及保持,且係以10位元之AD轉換器12進行AD轉換時之Raw資料。
(8)校準僅為使動作點移動之作用,不會對檢測感度造成影響。
檢測感度=(△Cxy/Cint)*Vstc
△Cxy=Cxy_ut(非觸控時之交叉電容)-Cxy_t(觸控時之交叉電容)
另,通常,以使校準範圍成為於8位元為[8’h80]之附近、即基準電壓(VREF;本實施例中為4V)與GND(0V)之電壓之中間附近之電壓之方式,決定校準電容(Cclb)。又,由於通常校準電容(Cclb)利用二極體連接之MOS電晶體之接合電容,故校準電容(Cclb)之增減係以並聯連接二極體連接之MOS電晶體之個數進行調整。
接著,對相互鄰接之2個檢測電極是否短路之檢查(以下稱為RX鄰接短路檢查)進行說明。
於本實施例中,於RX鄰接短路檢查中,利用上述校準電容(Cclb)。
如圖12所示,RX鄰接短路檢查時,於校準RAM(14)之與奇數序號之檢測電極對應之位址(圖12之R0、R2、R4之行)中設定不提取電
荷之校準資料(8位元為[8’h00]),於校準RAM(14)之與偶數序號之檢測電極對應之位址(圖12之R1、R3、R5之行)中設定充分提取電荷之校準資料(8位元為[8’hFF])。
當於校準RAM(14)中設定不提取電荷之校準資料(8位元為[8’h00])時,自DA轉換器15輸出之校準電壓(VDAC)成為基準電壓(VREF;本實施例中為4V),當於校準RAM(14)中設定充分提取電荷之校準資料(8位元為[8’hFF])時,自DA轉換器15輸出之校準電壓(VDAC)成為GND(0V)附近之電壓。
包含可撓性配線基板(圖1A之53、圖1A、圖1B之MFPC)上之配線,相互鄰接之2個檢測電極未RX鄰接短路之情形時,於連接於奇數序號之檢測電極(RX)之校準電容(Cclb)之另一端施加有基準電壓(VREF)。
因此,由於自掃描電極(TX)流入至奇數序號之檢測電極(RX)之電流流入至積分電路10,即無校準電容(Cclb)中之電荷之提取,故以積分電路10之積分電容(CINT)予以積分,如圖13所示,積分電路10之輸出於GND飽和。
因此,以取樣保持電路11將積分電路10中之積分輸出電壓(VINT)進行取樣及保持,且以AD轉換器12進行AD轉換時之Raw資料成為Raw=0。
又,於相互鄰接之2個檢測電極未RX鄰接短路之情形時,於連接於偶數序號之檢測電極(RX)之校準電容(Cclb)之另一端施加有GND(0V)附近之電壓。
因此,自掃描電極(TX)流入至奇數序號之檢測電極(RX)之所有電流流入至校準電容(Cclb),即藉由校準電容(Cclb)提取所有電荷,又,電荷亦自積分電路10之積分電容(CINT)移動,而使積分電路10之積分輸出電壓(VINT)上升,如圖14所示,於VDD(5V)飽和。
因此,以取樣保持電路11將積分電路10中之積分輸出電壓(VINT)進行取樣及保持,且以AD轉換器12進行AD轉換時之Raw資料成為Raw=1023。
因此,如圖15(a)所示,儲存於檢測RAM(13)之Raw資料係與奇數序號之檢測電極(RX)對應之行於10位元為[1023]之值,係與偶數序號之檢測電極(RX)對應之行於10位元為[0]之值。
另一方面,包含可撓性配線基板(圖1A之53、圖1A、圖1B之MFPC)上之配線,相互鄰接之2個檢測電極RX鄰接短路之情形時,自掃描電極(TX)流入至奇數序號之檢測電極(RX)之所有電流流入至於另一端施加有GND(0V)附近之電壓之連接於偶數序號之檢測電極(RX)之校準電容(Cclb),即提取所有電荷,又,電荷亦自積分電路10之積分電容(CINT)移動,而使積分電路10之積分輸出電壓(VINT)上升,如圖14所示,於VDD(5V)飽和。
因此,以取樣保持電路11將積分電路10中之積分輸出電壓(VINT)進行取樣及保持,且以AD轉換器12進行AD轉換時之Raw資料成為Raw=1023。
因此,如圖15(b)所示,於儲存於檢測RAM(13)之Raw資料中,RX鄰接短路之與相互鄰接之2個檢測電極對應之行之Raw資料於10位元為[1023]之值。
如此般,根據本實施例,可簡單且短時間地檢測RX鄰接短路不良。
另,可自上述說明理解,即便於奇數序號之檢測電極(RX)(或偶數序號之檢測電極(RX))上,經由開關電路連接具有較大電容值之電容元件,且,設置輸出GND之電壓之定電壓源,於RX鄰接短路檢查時,接通開關電路,於奇數序號之檢測電極(RX)(或偶數序號之檢測電極(RX))上,連接於另一端施加有來自定電壓源之GND之電壓之電
容元件,仍可簡單且短時間內檢測出RX鄰接短路不良。
此時,包含可撓性配線基板(圖1A之53、圖1A、圖1B之MFPC)上之配線,相互鄰接之2個檢測電極未RX鄰接短路之情形時,儲存於檢測RAM(13)之Raw資料係經由開關電路,將具有較大電容值之電容元件連接之檢測電極(RX)所對應之行成為於10位元為[1023]之值,此外之檢測電極(RX)所對應之行成為校準結束後之非觸控位準之、於10位元為[255]之值。
以上,雖基於上述實施例具體說明由本發明者所完成之發明,但本發明並非限定於上述實施例,當然可於不脫離其主旨之範圍內進行各種變更。
10‧‧‧積分電路
11‧‧‧取樣保持電路
12‧‧‧AD轉換器
13‧‧‧檢測RAM
14‧‧‧校準RAM
15‧‧‧DA轉換器
107‧‧‧觸控面板
108‧‧‧檢測電路
Cclb‧‧‧校準電容
CINT‧‧‧積分電容
Cxy‧‧‧交叉電容
MPU‧‧‧微電腦
RX0~RXn‧‧‧觸控面板之檢測電極
S1~S6‧‧‧開關
TX0~TXm‧‧‧觸控面板之掃描電極
Vclb‧‧‧電壓
VINT‧‧‧積分輸出電壓
VREF‧‧‧基準電壓
Claims (15)
- 一種液晶顯示裝置,其具有配置成矩陣狀之複數個像素,且包含:第1基板;第2基板;液晶,其夾持於上述第1基板與上述第2基板之間;及檢測電路;且上述第2基板具有觸控面板之檢測電極;上述各像素具有像素電極與對向電極;上述對向電極係被施加用於顯示之對向電壓及用於觸控座標檢測之觸控掃描電壓;上述對向電極分割成複數個區塊;上述所分割之各區塊之對向電極係對連續之複數個顯示列之各像素共通地設置;上述所分割之各區塊之對向電極兼用作上述觸控面板之掃描電極;上述檢測電路具有設置於每個上述各檢測電極且一端連接於上述各檢測電極之校準電容元件,於觸控位置檢測處理時,供給校準電壓至上述各校準電容元件之另一端;上述檢測電極之電壓係於觸控位置檢測處理時,根據供給至上述各校準電容元件之另一端的校準電壓而變化。
- 如請求項1之液晶顯示裝置,其具有配置成矩陣狀之複數個像素,其中上述檢測電路具備記憶元件,其記憶上述各檢測電極與上述所分割之各區塊之對向電極之每個交點之校準資料;且於觸控 位置檢測處理時,產生與記憶於上述記憶元件之校準資料對應之校準資料電壓,並供給至對應之校準電容元件之另一端。
- 如請求項1之液晶顯示裝置,其具有配置成矩陣狀之複數個像素,其中上述第1基板具有上述像素電極與對向電極。
- 如請求項1之液晶顯示裝置,其具有配置成矩陣狀之複數個像素,其中上述檢測電路具有積分電路與取樣保持電路。
- 如請求項4之液晶顯示裝置,其具有配置成矩陣狀之複數個像素,其中上述檢測電路具有A/D轉換器與記憶上述A/D轉換器之輸出資料之記憶元件。
- 一種液晶顯示裝置,其具有配置成矩陣狀之複數個像素,且包含:第1基板;第2基板;液晶,其夾持於上述第1基板與上述第2基板之間;及檢測電路;且上述第2基板具有觸控面板之檢測電極;上述各像素具有像素電極與對向電極;上述對向電極分割成複數個區塊;上述對向電極係被施加用於顯示之對向電壓及用於觸控座標檢測之觸控掃描電壓;上述所分割之各區塊之對向電極係對連續之複數個顯示列之各像素共通地設置;上述所分割之各區塊之對向電極兼用作上述觸控面板之掃描 電極;上述檢測電路具有設置於每個上述各檢測電極且一端連接於上述各檢測電極之校準電容元件,於相互鄰接之2個檢測電極之短路試驗時,供給不提取電荷之第1校準電壓至一端連接於奇數行之檢測電極之校準電容元件之另一端,供給充分提取電荷之第2校準電壓至一端連接於偶數行之檢測電極之校準電容元件之另一端,而執行觸控位置檢測處理;上述檢測電極之電壓係於觸控位置檢測處理時,根據供給至上述各校準電容元件之另一端的校準電壓而變化。
- 如請求項6之液晶顯示裝置,其具有配置成矩陣狀之複數個像素,其中上述檢測電路具有記憶元件,其記憶上述各檢測電極與上述所分割之各區塊之對向電極之每個交點之校準資料;於相互鄰接之2個檢測電極之短路試驗時,作為奇數行之檢測電極與上述所分割之各區塊之對向電極之每個交點之校準資料,記憶第1校準資料,作為偶數行之檢測電極與上述所分割之各區塊之對向電極之每個交點之校準資料,記憶第2校準資料;且於上述相互鄰接之2個檢測電極之短路試驗時,產生與記憶於上述記憶元件之第1校準資料對應之上述第1校準資料電壓,並供給至一端連接於奇數行之檢測電極之校準電容元件之另一端,且產生與記憶於上述記憶元件之第2校準資料對應之上述第2校準資料電壓,並供給至一端連接於偶數行之檢測電極之校準電容元件之另一端,而執行觸控位置檢測處理。
- 如請求項7之液晶顯示裝置,其具有配置成矩陣狀之複數個像素,其中 上述檢測電路具有將記憶於上述記憶元件之資料轉換成校準資料電壓之DA轉換器。
- 如請求項6之液晶顯示裝置,其具有配置成矩陣狀之複數個像素,其中上述檢測電路具有積分電路與取樣保持電路。
- 如請求項9之液晶顯示裝置,其具有配置成矩陣狀之複數個像素,其中上述檢測電路具有A/D轉換器與記憶上述A/D轉換器之輸出資料之記憶元件。
- 一種液晶顯示裝置,其具有配置成矩陣狀之複數個像素,且具備液晶顯示面板,該液晶顯示面板包含:第1基板;第2基板;液晶,其夾持於上述第1基板與上述第2基板之間;及檢測電路;且上述第2基板具有觸控面板之檢測電極;上述各像素具有像素電極與對向電極;上述對向電極分割成複數個區塊;上述所分割之各區塊之對向電極係對連續之複數個顯示列之各像素共通地設置;上述所分割之各區塊之對向電極兼用作上述觸控面板之掃描電極;上述檢測電路包含:複數個積分電路,其設置於每個上述各檢測電極,且連接於上述各檢測電極;校準電容元件,其設置於每個上述各檢測電極,且一端連接 於上述各檢測電極;及記憶元件,其記憶上述各檢測電極與上述所分割之各區塊之對向電極之每個交點之校準資料;且於相互鄰接之2個檢測電極之短路試驗時,作為奇數行之檢測電極與上述所分割之各區塊之對向電極之每個交點之校準資料,記憶不提取電荷之第1校準資料,作為偶數行之檢測電極與上述所分割之各區塊之對向電極之每個交點之校準資料,記憶充分提取電荷之第2校準資料;於上述相互鄰接之2個檢測電極之短路試驗時,作為與記憶於上述記憶元件之第1校準資料對應之校準資料電壓,產生VREF之基準電壓,並供給至一端連接於奇數行之檢測電極之校準電容元件之另一端,且作為與記憶於上述記憶元件之第2校準資料對應之校準資料電壓,產生供給至上述各積分電路之GND之電壓,並供給至一端連接於偶數行之檢測電極之校準電容元件之另一端,而執行觸控位置檢測處理。
- 如請求項11之液晶顯示裝置,其具有配置成矩陣狀之複數個像素,其中上述檢測電路包含:第1開關電路,其連接於上述各檢測電極與上述各積分電路之間;第2開關電路,其對上述各檢測電極供給VREF之基準電壓;第3開關電路,其於上述各校準電容元件之另一端供給校準資料電壓或VREF之基準電壓;且於對上述所分割之各區塊之對向電極供給觸控面板掃描電壓之前,斷開上述第1開關電路,接通上述第2開關電路,且藉由上述第3開關電路於上述各校準電容元件之另一端供給上述VREF之基準電壓; 於對上述所分割之各區塊之對向電極供給觸控面板掃描電壓時,接通上述第1開關電路,斷開上述第2開關電路,且藉由上述第3開關電路於上述各校準電容元件之另一端供給上述校準資料電壓。
- 如請求項11之液晶顯示裝置,其具有配置成矩陣狀之複數個像素,其中上述檢測電路具有將記憶於上述記憶元件之資料轉換成校準資料電壓之DA轉換器。
- 如請求項11之液晶顯示裝置,其具有配置成矩陣狀之複數個像素,其中上述檢測電路具有取樣保持電路。
- 如請求項14之液晶顯示裝置,其具有配置成矩陣狀之複數個像素,其中上述檢測電路具有A/D轉換器與記憶上述A/D轉換器之輸出資料之記憶元件。
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US9535278B2 (en) | 2017-01-03 |
CN103852921A (zh) | 2014-06-11 |
EP2741185A2 (en) | 2014-06-11 |
CN106932946A (zh) | 2017-07-07 |
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TW201423543A (zh) | 2014-06-16 |
TWI604365B (zh) | 2017-11-01 |
US20160283039A1 (en) | 2016-09-29 |
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