TWI403741B - Testing apparatus - Google Patents
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- TWI403741B TWI403741B TW99113960A TW99113960A TWI403741B TW I403741 B TWI403741 B TW I403741B TW 99113960 A TW99113960 A TW 99113960A TW 99113960 A TW99113960 A TW 99113960A TW I403741 B TWI403741 B TW I403741B
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Abstract
Description
本發明是有關於一種測試裝置，且特別是有關於一種用於電性測試的測試裝置。This invention relates to a test device and, more particularly, to a test device for electrical testing.
圖1是習知一種測試裝置的示意圖。請參照圖1，習知測試裝置100包括基板110以及探針板120，其中探針板120樞接於基板110。探針板120可掀起或蓋上，圖1係繪示探針板120處於蓋上的狀態。此外，基板110具有用以承載液晶顯示面板50的容置槽112。探針板120具有用以測試液晶顯示面板50的探針122，以及暴露出液晶顯示面板50的開口124。Figure 1 is a schematic illustration of a conventional test apparatus. Referring to FIG. 1 , the conventional test apparatus 100 includes a substrate 110 and a probe card 120 , wherein the probe card 120 is pivotally connected to the substrate 110 . The probe card 120 can be picked up or covered. FIG. 1 shows the state in which the probe card 120 is on the cover. In addition, the substrate 110 has a receiving groove 112 for carrying the liquid crystal display panel 50. The probe card 120 has a probe 122 for testing the liquid crystal display panel 50, and an opening 124 exposing the liquid crystal display panel 50.
習知測試裝置100的測試方法是先掀起探針板120，以將液晶顯示面板50放置於容置槽112。之後，再蓋上探針板120，以使探針板120的探針122接觸液晶顯示面板50的測試線路52，如此可對液晶顯示面板50進行電性測試。The test method of the conventional test device 100 is to first pick up the probe card 120 to place the liquid crystal display panel 50 in the accommodating groove 112. Thereafter, the probe card 120 is further covered so that the probe 122 of the probe card 120 contacts the test line 52 of the liquid crystal display panel 50, so that the liquid crystal display panel 50 can be electrically tested.
然而，習知測試裝置100並無防護機制，在進行測試時，探針板120仍可掀起。若測試人員不小心在測試時掀起探針板120，則容易產生電弧，導致液晶顯示面板50受損。However, the conventional test device 100 does not have a protective mechanism, and the probe card 120 can still be picked up when the test is performed. If the tester accidentally picks up the probe card 120 during the test, an arc is easily generated, resulting in damage to the liquid crystal display panel 50.
本發明提供一種測試裝置，以防止待測物受損。The present invention provides a test device to prevent damage to a test object.
為達上述優點，本發明提出一種測試裝置，其包括基座、蓋板以及測試開關。基座具有連接單元，蓋板具有相對的第一邊與第二邊。第一邊樞接於基座，而第二邊設有第一固定件。此第一固定件適於在蓋板蓋合於基座時，將蓋板固定於基座。測試開關設置於基座旁，且測試開關具有滑動件。此滑動件適於在電源開啟位置與電源關閉位置之間滑動，其中電源開啟位置較電源關閉位置接近基座。滑動件具有第二固定件，且當蓋板蓋合於基座且滑動件位於電源開啟位置時，第二固定件係固定蓋板。To achieve the above advantages, the present invention provides a test apparatus comprising a base, a cover plate and a test switch. The base has a connecting unit, and the cover has opposite first and second sides. The first side is pivotally connected to the base, and the second side is provided with a first fixing member. The first fixing member is adapted to fix the cover plate to the base when the cover is closed to the base. The test switch is placed beside the base and the test switch has a slide. The slider is adapted to slide between a power-on position and a power-off position, wherein the power-on position is closer to the base than the power-off position. The sliding member has a second fixing member, and the second fixing member fixes the cover plate when the cover plate is closed to the base and the sliding member is in the power-on position.
在本發明之一實施例中，上述之第一固定件為樞接於第二邊的扣件，而基座設有對應扣件的扣合部。In an embodiment of the invention, the first fixing member is a fastener pivotally connected to the second side, and the base is provided with a fastening portion corresponding to the fastening member.
在本發明之一實施例中，上述之第二邊設有朝遠離第一邊的方向延伸的延伸部，且當蓋板蓋合於基座且滑動件位於電源開啟位置時，第二固定件係固定延伸部。In an embodiment of the invention, the second side is provided with an extending portion extending away from the first side, and when the cover is closed to the base and the sliding member is in the power-on position, the second fixing member A fixed extension.
在本發明之一實施例中，上述之第二固定件包括至少一擋板，且當蓋板蓋合於基座且滑動件位於電源開啟位置時，第二固定件遮蓋延伸部。In an embodiment of the invention, the second fixing member comprises at least one baffle, and the second fixing member covers the extension when the cover is closed to the base and the sliding member is in the power-on position.
在本發明之一實施例中，上述之延伸部與第二邊之間有一斷差，以供第二固定件置入。In an embodiment of the invention, a gap is formed between the extension portion and the second side for the second fixing member to be placed.
在本發明之一實施例中，上述之延伸部包括位於第一固定件兩側的二延伸塊，第二固定件包括對應延伸塊的二擋板。In an embodiment of the invention, the extension portion includes two extension blocks on opposite sides of the first fixing member, and the second fixing member includes two baffles corresponding to the extension block.
在本發明之一實施例中，當蓋板蓋合於基座且滑動件位於電源開啟位置時，擋板更遮蓋第一固定件。In an embodiment of the invention, the baffle further covers the first fixing member when the cover is closed to the base and the sliding member is in the power-on position.
在本發明之一實施例中，當蓋板蓋合於基座時，第一固定件與第二固定件位於基座的同一側。In an embodiment of the invention, when the cover is closed to the base, the first fixing member and the second fixing member are located on the same side of the base.
在本發明之一實施例中，當蓋板蓋合於基座時，第一固定件與第二固定件位於基座的不同側。In an embodiment of the invention, the first fixing member and the second fixing member are located on different sides of the base when the cover is closed to the base.
在本發明之一實施例中，上述之測試開關更具有滑槽，而滑動件適於沿滑槽移動。In an embodiment of the invention, the test switch described above further has a chute, and the slider is adapted to move along the chute.
在本發明之一實施例中，上述之連接單元包括多個可伸縮的接觸針。In an embodiment of the invention, the connecting unit comprises a plurality of telescopic contact pins.
在本發明之一實施例中，上述之接觸針沿一直線排列。In an embodiment of the invention, the contact pins are arranged in a straight line.
在本發明之一實施例中，當蓋板蓋合於基座時，連接單元位於蓋板的第一邊與第二邊之間。In an embodiment of the invention, when the cover is closed to the base, the connecting unit is located between the first side and the second side of the cover.
在本發明之一實施例中，上述之測試裝置更包括底板，而基座、蓋板及測試開關配置於底板上。In an embodiment of the invention, the testing device further includes a bottom plate, and the base, the cover and the test switch are disposed on the bottom plate.
在本發明之一實施例中，上述之底板具有容置槽。In an embodiment of the invention, the bottom plate has a receiving groove.
在本發明之一實施例中，上述之底板具有凹槽，而基座與蓋板配置於凹槽的底部，且測試開關配置於凹槽旁。In an embodiment of the invention, the bottom plate has a groove, and the base and the cover plate are disposed at the bottom of the groove, and the test switch is disposed beside the groove.
在本發明之測試裝置中，由於在蓋板蓋合於基座且滑動件位於電源開啟位置時，第二固定件係固定蓋板，所以在對待測物進行電性測試時，蓋板無法被掀起。如此，可防止待測物遭受電弧損害。In the testing device of the present invention, since the second fixing member fixes the cover plate when the cover is closed to the base and the sliding member is in the power-on position, the cover cannot be electrically tested when the object to be tested is electrically tested. set off. In this way, the object to be tested can be prevented from being damaged by the arc.
為讓本發明之上述和其他目的、特徵和優點能更明顯易懂，下文特舉較佳實施例，並配合所附圖式，作詳細說明如下。The above and other objects, features and advantages of the present invention will become more <RTIgt;
圖2是本發明一實施例之一種測試裝置的立體示意圖，圖3是圖2中蓋板從基座掀起時的示意圖，而圖4是圖2中滑動件位於電源關閉位置時的示意圖。請參照圖2至圖4，本實施例之測試裝置200包括基座210、蓋板220以及測試開關230。基座210具有連接單元212，蓋板220具有相對的第一邊221與第二邊223。第一邊221樞接於基座210，而第二邊223設有第一固定件222。此第一固定件222適於在蓋板220蓋合於基座210時，將蓋板220固定於基座210。測試開關230設置於基座210旁，且測試開關230具有滑動件232。此滑動件232適於在電源開啟位置(如圖2所示)與電源關閉位置(如圖4所示)之間滑動，其中電源開啟位置較電源關閉位置接近基座210。滑動件232具有第二固定件234，且當蓋板220蓋合於基座210且滑動件232位於電源開啟位置時，第二固定件234係固定蓋板220。2 is a perspective view of a test apparatus according to an embodiment of the present invention, FIG. 3 is a schematic view of the cover of FIG. 2 when it is lifted from the base, and FIG. 4 is a schematic view of the slide of FIG. 2 when the power is turned off. Referring to FIGS. 2 to 4 , the testing device 200 of the present embodiment includes a base 210 , a cover plate 220 , and a test switch 230 . The base 210 has a connecting unit 212 having a first first side 221 and a second side 223 opposite to each other. The first side 221 is pivotally connected to the base 210, and the second side 223 is provided with a first fixing member 222. The first fixing member 222 is adapted to fix the cover plate 220 to the base 210 when the cover plate 220 is covered by the base 210. The test switch 230 is disposed beside the base 210, and the test switch 230 has a slider 232. The slider 232 is adapted to slide between a power-on position (shown in FIG. 2) and a power-off position (shown in FIG. 4), wherein the power-on position is closer to the base 210 than the power-off position. The sliding member 232 has a second fixing member 234, and when the cover plate 220 is closed to the base 210 and the sliding member 232 is in the power-on position, the second fixing member 234 fixes the cover plate 220.
上述之測試裝置200可更包括底板240，而基座210、蓋板220及測試開關230配置於底板240上。此底板240可具有容置槽242，以容置待測物(圖未示)。底板240可設置凹槽244，而基座210與蓋板220配置於凹槽244內，且測試開關230配置於凹槽244旁。The test device 200 described above may further include a bottom plate 240, and the base 210, the cover plate 220 and the test switch 230 are disposed on the bottom plate 240. The bottom plate 240 can have a receiving groove 242 for accommodating the object to be tested (not shown). The bottom plate 240 can be provided with a groove 244, and the base 210 and the cover plate 220 are disposed in the groove 244, and the test switch 230 is disposed beside the groove 244.
此外，測試開關230例如更具有滑槽236，而滑動件232適於沿滑槽236移動至電源開啟位置或電源關閉位置。另外，連接單元212例如包括多個可伸縮的接觸針214，而這些接觸針214例如是沿著直線排列。當蓋板220蓋合於基座210時，連接單元212例如是位於蓋板220的第一邊221與第二邊223之間，而測試裝置200可透過連接單元212而與待測物電性連接。In addition, the test switch 230 has, for example, a chute 236, and the slider 232 is adapted to move along the chute 236 to a power-on position or a power-off position. In addition, the connecting unit 212 includes, for example, a plurality of retractable contact pins 214, and the contact pins 214 are arranged, for example, along a straight line. When the cover 220 is closed to the base 210, the connecting unit 212 is located between the first side 221 and the second side 223 of the cover 220, and the testing device 200 can communicate with the object to be tested through the connecting unit 212. connection.
在本實施例中，當蓋板220蓋合於基座210時，第一固定件222與第二固定件234例如是位於基座210的同一側。但在另一實施例中，當蓋板220蓋合於基座210時，第一固定件222與第二固定件234可位於基座210的不同側。In the embodiment, when the cover 220 is covered by the base 210, the first fixing member 222 and the second fixing member 234 are located on the same side of the base 210, for example. However, in another embodiment, when the cover 220 is covered by the base 210, the first fixing member 222 and the second fixing member 234 may be located on different sides of the base 210.
圖5是圖2之測試裝置的蓋板蓋合於基座且滑動件位於電源開啟位置時的示意圖。請參照圖3與圖5，本實施例之第一固定件222例如是樞接於第二邊223的扣件，而基座210例如設有對應第一固定件222的扣合部216。當蓋板220蓋合於基座210時，第一固定件222可扣合於扣合部216，以將蓋板220固定於基座210。5 is a schematic view of the test device of FIG. 2 with the cover attached to the base and the slider in the power-on position. Referring to FIG. 3 and FIG. 5 , the first fixing member 222 of the embodiment is, for example, a fastener pivotally connected to the second side 223 , and the base 210 is provided with a fastening portion 216 corresponding to the first fixing member 222 . When the cover 220 is attached to the base 210 , the first fixing member 222 can be fastened to the fastening portion 216 to fix the cover 220 to the base 210 .
請參照圖2至圖5，上述之蓋板220的第二邊223例如設有朝遠離第一邊221的方向延伸的延伸部224。當蓋板220蓋合於基座210且滑動件232位於電源開啟位置時，第二固定件234係固定延伸部224。更詳細地說，第二固定件234包括至少一擋板238(本實施例是以兩個擋板238為例)。蓋板220的延伸部224包括位於第一固定件222兩側的二延伸塊226，此二延伸塊226與上述二擋板238相對應。當蓋板220蓋合於基座210且滑動件232沿著滑槽236滑動至電源開啟位置時，第二固定件234亦隨之滑動，以遮蓋延伸部224。Referring to FIGS. 2 to 5 , the second side 223 of the cover plate 220 described above is provided with an extending portion 224 extending away from the first side 221 , for example. The second fixing member 234 fixes the extension portion 224 when the cover plate 220 is closed to the base 210 and the slider 232 is in the power-on position. In more detail, the second fixing member 234 includes at least one baffle 238 (this embodiment is exemplified by two baffles 238). The extension 224 of the cover plate 220 includes two extension blocks 226 on opposite sides of the first fixing member 222, and the two extension blocks 226 correspond to the two baffles 238 described above. When the cover 220 covers the base 210 and the slider 232 slides along the sliding slot 236 to the power-on position, the second fixing member 234 also slides to cover the extension 224.
本實施例之測試裝置200用於測試待測物時，可先將蓋板220掀起(如圖3所示)，接著將待測物放置於容置槽242，並使連接單元212與待測物電性連接。之後，如圖4所示，將蓋板220蓋合於基座210，並將第一固定件222扣合於基座210的扣合部216(參見圖3)，以將蓋板220固定於基座210。然後，將滑動件232從電源關閉位置(如圖4所示)推至電源開啟位置(如圖2所示)，以開啟測試裝置200，進而對待測物進行測試。When the test device 200 of the embodiment is used for testing the object to be tested, the cover plate 220 can be picked up first (as shown in FIG. 3), then the object to be tested is placed in the receiving groove 242, and the connection unit 212 is tested. Electrical connection. Then, as shown in FIG. 4, the cover 220 is closed to the base 210, and the first fixing member 222 is fastened to the fastening portion 216 of the base 210 (see FIG. 3) to fix the cover 220 to the cover 220. Base 210. Then, the slider 232 is pushed from the power-off position (as shown in FIG. 4) to the power-on position (as shown in FIG. 2) to turn on the test device 200, and then the test object is tested.
值得一提的是，如圖2與圖5所示，在將滑動件232從電源關閉位置推至電源開啟位置時，第二固定件234亦隨著滑動件232移動，以遮蓋部分蓋板220。換言之，當測試進行時，第二固定件234會遮蓋部分蓋板220，以使測試人員無法掀起蓋板220，如此可保護待測物免於受到電弧的損害。It is worth mentioning that, as shown in FIG. 2 and FIG. 5, when the sliding member 232 is pushed from the power-off position to the power-on position, the second fixing member 234 also moves along with the sliding member 232 to cover the partial cover 220. . In other words, when the test is performed, the second fixing member 234 covers the partial cover plate 220 so that the tester cannot lift the cover plate 220, thereby protecting the object to be tested from the arc.
此外，當測試完畢欲關閉測試裝置200時，需將滑動件232從電源開啟位置推至電源關閉位置。由於在測試裝置200關閉的瞬間，仍有電流經由連接單元212流至待測物，此時若連接單元212與待測物電性絕緣，則亦容易產生電弧，導致待測物受損。為避免產生此情形，本實施例係藉由第一固定件222來將蓋板220固定於基座210。更詳細地說，在測試裝置200關閉時，測試人員需將第一固定件222鬆脫後才可掀起蓋板220，所以可防止測試裝置200關閉後，蓋板220與基座210立即鬆開。由於在測試裝置200關閉的瞬間，蓋板220仍固定於基座210，所以可避免測試裝置200關閉的瞬間，連接單元212與待測物立即電性絕緣，進而保護待測物免於受到電弧的損害。In addition, when the test device 200 is to be turned off after the test is completed, the slider 232 is pushed from the power-on position to the power-off position. Since the current flows to the object to be tested through the connection unit 212 at the moment when the test device 200 is turned off, if the connection unit 212 is electrically insulated from the object to be tested, an arc is easily generated, resulting in damage of the object to be tested. In order to avoid this, the present embodiment fixes the cover 220 to the base 210 by the first fixing member 222. In more detail, when the test device 200 is closed, the tester needs to loosen the first fixing member 222 to lift the cover plate 220, so that the cover plate 220 and the base 210 are immediately released after the test device 200 is closed. . Since the cover plate 220 is still fixed to the base 210 at the moment when the test device 200 is closed, the connection unit 212 can be immediately electrically insulated from the object to be tested, thereby protecting the object to be tested from the arc. Damage.
另外，本實施例之測試裝置200使用可伸縮的接觸針214，所以可避免連接單元212與待測物之間產生接合不正或接合不良的問題。In addition, the test device 200 of the present embodiment uses the retractable contact pin 214, so that the problem of misalignment or poor joint between the connection unit 212 and the object to be tested can be avoided.
圖6是本發明另一實施例之測試裝置的立體示意圖。請參照圖6，本實施例之測試裝置200’與圖2之測試裝置200相似，差別處在於測試開關的滑動件之第二固定件。具體而言，測試裝置200’的測試開關230’的滑動件232’之第二固定件234’為一片擋板。當蓋板220蓋合於基座210且滑動件232’位於電源開啟位置時，第二固定件234’除了遮蓋蓋板220的延伸部224(參照圖5)外更遮蓋第一固定件222(參照圖5)。有關於測試裝置200’的優點與上述之測試裝置200的優點相似，在此將不再重述。Figure 6 is a perspective view of a test apparatus according to another embodiment of the present invention. Referring to Figure 6, the test apparatus 200' of the present embodiment is similar to the test apparatus 200 of Figure 2, with the difference being the second fixture of the slider of the test switch. Specifically, the second fixing member 234' of the slider 232' of the test switch 230' of the testing device 200' is a one-piece shutter. When the cover 220 is closed to the base 210 and the slider 232' is in the power-on position, the second fixing member 234' covers the first fixing member 222 in addition to the extending portion 224 of the cover 220 (refer to FIG. 5). Refer to Figure 5). The advantages associated with the test device 200' are similar to those of the test device 200 described above and will not be repeated here.
圖7是本發明另一實施例之測試裝置的蓋板蓋合於基座且滑動件位於電源開啟位置時的示意圖。請參照圖7，本實施例之測試裝置200”與圖5之測試裝置200相似，差別處在於測試開關的位置。更詳細地說，測試裝置200”的蓋板220的延伸部224與蓋板220的第二邊223之間有斷差227，以供滑動件232的第二固定件234置入。亦即，當蓋板220蓋合於基座210且滑動件232位於電源開啟位置時，第二固定件234係移動至緊鄰延伸部224之頂面225的位置，以防止蓋板220被掀起。有關於測試裝置200”的優點與上述之測試裝置200的優點相似，在此將不再重述。Fig. 7 is a schematic view showing the cover of the test device according to another embodiment of the present invention, which is closed to the base and the slider is in the power-on position. Referring to Figure 7, the test apparatus 200" of the present embodiment is similar to the test apparatus 200 of Figure 5, with the difference being in the position of the test switch. More specifically, the extension 224 of the cover 220 of the test apparatus 200" and the cover There is a gap 227 between the second sides 223 of the 220 for the second fixture 234 of the slider 232 to be placed. That is, when the cover plate 220 is closed to the base 210 and the slider 232 is in the power-on position, the second fixing member 234 is moved to a position immediately adjacent to the top surface 225 of the extension portion 224 to prevent the cover plate 220 from being lifted. The advantages associated with the test device 200" are similar to those of the test device 200 described above and will not be repeated here.
綜上所述，本發明之測試裝置至少具有下列優點：In summary, the test apparatus of the present invention has at least the following advantages:
1.由於本發明之測試裝置在對待測物進行電性測試時，第二固定件係固定蓋板，所以蓋板無法被掀起。如此，可防止待測物遭受電弧損害。1. Since the test device of the present invention performs electrical testing on the object to be tested, the second fixing member fixes the cover plate, so the cover plate cannot be picked up. In this way, the object to be tested can be prevented from being damaged by the arc.
2.由於在本發明之測試裝置關閉的瞬間，第一固定件仍將蓋板固定於基座，所以可避免測試裝置關閉的瞬間，連接單元與待測物立即電性絕緣，進而保護待測物免於受到電弧的損害。2. Since the first fixing member still fixes the cover plate to the base at the moment when the testing device of the present invention is closed, the moment that the testing device is turned off can be avoided, the connecting unit and the object to be tested are immediately electrically insulated, thereby protecting the test piece to be tested. The object is protected from arc damage.
雖然本發明已以較佳實施例揭露如上，然其並非用以限定本發明，本發明所屬技術領域中具有通常知識者，在不脫離本發明之精神和範圍內，當可作些許之更動與潤飾，因此本發明之保護範圍當視後附之申請專利範圍所界定者為準。Although the present invention has been disclosed in the above preferred embodiments, it is not intended to limit the invention, and it is intended to be a part of the invention. The scope of protection of the present invention is therefore defined by the scope of the appended claims.
50．．．液晶顯示面板50. . . LCD panel
52．．．測試線路52. . . Test line
100、200、200’、200”．．．測試裝置100, 200, 200', 200"... test device
110．．．基板110. . . Substrate
112、242．．．容置槽112, 242. . . Locating slot
120．．．探針板120. . . Probe board
122．．．探針122. . . Probe
124．．．開口124. . . Opening
210．．．基座210. . . Pedestal
212．．．連接單元212. . . Connection unit
214．．．接觸針214. . . Contact pin
216．．．扣合部216. . . Buckle
220．．．蓋板220. . . Cover
221．．．第一邊221. . . First side
222．．．第一固定件222. . . First fixture
223．．．第二邊223. . . Second side
224．．．延伸部224. . . Extension
225．．．頂面225. . . Top surface
226．．．延伸塊226. . . Extension block
227．．．斷差227. . . Break
230、230’．．．測試開關230, 230’. . . Test switch
232、232’．．．滑動件232, 232’. . . Slide
234、234’．．．第二固定件234, 234’. . . Second fixture
236．．．滑槽236. . . Chute
238．．．擋板238. . . Baffle
240．．．底板240. . . Bottom plate
242．．．容置槽242. . . Locating slot
244．．．凹槽244. . . Groove
圖1是習知一種測試裝置的示意圖。Figure 1 is a schematic illustration of a conventional test apparatus.
圖2是本發明一實施例之一種測試裝置的立體示意圖。2 is a perspective view of a test apparatus according to an embodiment of the present invention.
圖3是圖2中蓋板從基座掀起時的示意圖。Figure 3 is a schematic view of the cover of Figure 2 as it is lifted from the base.
圖4是圖2中滑動件位於電源關閉位置時的示意圖。Figure 4 is a schematic view of the slider of Figure 2 in a power off position.
圖5是圖2之測試裝置的蓋板蓋合於基座且滑動件位於電源開啟位置時的示意圖。5 is a schematic view of the test device of FIG. 2 with the cover attached to the base and the slider in the power-on position.
圖6是本發明另一實施例之測試裝置的立體示意圖。Figure 6 is a perspective view of a test apparatus according to another embodiment of the present invention.
圖7是本發明另一實施例之測試裝置的蓋板蓋合於基座且滑動件位於電源開啟位置時的示意圖。Fig. 7 is a schematic view showing the cover of the test device according to another embodiment of the present invention, which is closed to the base and the slider is in the power-on position.
200．．．測試裝置200. . . Test device
210．．．基座210. . . Pedestal
220．．．蓋板220. . . Cover
221．．．第一邊221. . . First side
222．．．第一固定件222. . . First fixture
223．．．第二邊223. . . Second side
230．．．測試開關230. . . Test switch
232．．．滑動件232. . . Slide
234．．．第二固定件234. . . Second fixture
236．．．滑槽236. . . Chute
238．．．擋板238. . . Baffle
240．．．底板240. . . Bottom plate
242．．．容置槽242. . . Locating slot
244．．．凹槽244. . . Groove
Claims (16)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW99113960A TWI403741B (en) | 2010-04-30 | 2010-04-30 | Testing apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW99113960A TWI403741B (en) | 2010-04-30 | 2010-04-30 | Testing apparatus |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201137367A TW201137367A (en) | 2011-11-01 |
| TWI403741B true TWI403741B (en) | 2013-08-01 |
Family
ID=46759503
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW99113960A TWI403741B (en) | 2010-04-30 | 2010-04-30 | Testing apparatus |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TWI403741B (en) |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5514959A (en) * | 1994-12-27 | 1996-05-07 | General Electric Company | Electric meter including a switch cover lockable in an open position |
| JP2006114488A (en) * | 2004-10-12 | 2006-04-27 | Texas Instruments Inc | Motor overload preventing device |
| TW200928393A (en) * | 2007-10-31 | 2009-07-01 | Qrg Ltd | Testing apparatus and method |
-
2010
- 2010-04-30 TW TW99113960A patent/TWI403741B/en not_active IP Right Cessation
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5514959A (en) * | 1994-12-27 | 1996-05-07 | General Electric Company | Electric meter including a switch cover lockable in an open position |
| JP2006114488A (en) * | 2004-10-12 | 2006-04-27 | Texas Instruments Inc | Motor overload preventing device |
| TW200928393A (en) * | 2007-10-31 | 2009-07-01 | Qrg Ltd | Testing apparatus and method |
Also Published As
| Publication number | Publication date |
|---|---|
| TW201137367A (en) | 2011-11-01 |
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