201137367 六、發明說明： 【發明所屬之技術領域] 本發明是有關於一種測試裝置，且特別是有關於一種用於 電性測試的測試裝置。 ' 【先前技術】 圖1是習知一種測試裝置的示意圖。請參照圖i，習知測 試裝置100包括基板110以及探針板12〇，其中探針板12〇樞 接於基板110。探針板120可掀起或蓋上’圖丨係繪示探針板 參120處於蓋上的狀態。此外，基板110具有用以承載液晶顯示 面板50的容置槽112。探針板12〇具有用以測試液晶顯示面 板50的探針122 ’以及暴露出液晶顯示面板50的開口 124。 習知測試裝置100的測試方法是先掀起探針板12〇，以將 液晶顯示面板50放置於容置槽112。之後，再蓋上探針板12〇, 以使探針板120的探針122接觸液晶顯示面板5〇的測試線路 52，如此可對液晶顯示面板50進行電性測試。 ^然而，習知測試裝置1〇〇並無防護機制，在進行測試時， 探針板120仍可掀起。若測試人員不小心在測試時掀起探針板 馨120，則容易產生電弧，導致液晶顯示面板50受損。 【發明内容】 本發明提供一種測試裝置，以防止待測物受損。 _ 為達上述優點，本發明提出一種測試裝置，其包括基座、 ^板以及測試開關。基座具有連接單元，蓋板具有相對的第一 與第二邊。第一邊樞接於基座，而第二邊設有第一固定件。 此，一固定件適於在蓋板蓋合於基座時，將蓋板固定於基座。 測试開關設置於基座旁，且測試開關具有滑動件。此滑動件適 於在電源開啟位置與電源關閉位置之間滑動，其中電源開啟位 4 201137367 置車，電源關閉位置接近基座。滑動件具有第二固定件，且當蓋 板，合於基座且滑動件位於電源開啟位置時，第二固定件係固 在本發明之-實施射，上述之第—固定件為樞接於第二 邊的扣件，而基座設有對應扣件的扣合部。 在本發明之-實施财，上述之第二邊設有朝遠離第一邊 的方向延伸祕伸部，且當蓋板蓋合於基座且滑動件位於電源 開啟位置時，第二固定件係固定延伸部。 在本發明之一實施例中，上述之第二固定件包括至少一擋 板，且當蓋板蓋合於基座且滑動件位於電源開啟位置時，第二 固定件遮蓋延伸部。 邊之間有一 在本發明之一實施例中，上述之延伸部與第二 斷差，以供第二固定件置入。 在本發明之一實施例中，上述之延伸部包括位於第一固定 件兩側的二延伸塊，第二㈣件包括對應延伸塊的二擋板。 在本發明之一實施例中’當蓋板蓋合於基座且滑動件位於 電源開啟位置時，擋板更遮蓋第一固定件。 在本發明之一實施例中，當蓋板蓋合於基座時，第一固 件與第二固定件位於基座的同一側。 在本發明之一實施例中，當蓋板蓋合於基座時，第一固 件與第二固定件位於基座的不同側。 發明之—實施例中，上述之測試開關更具有滑槽，而 /月動件適於沿滑槽移動。 的接=發明之—實施财，上述之連接單元包括多個可伸端 在本發明之一實施例中，上述之接觸針沿一直線排列。 201137367 在本發明之一實施例中，當蓋板蓋合於基座時， 位於蓋板的第一邊與第二邊之間。 而 在♦本發明之-實施例中，上述之測試裝置更包括底板， 基座、蓋板及測試開關配置於底板上。 在本發明之一實施例中，上述之底板具有容置槽。 在^發明之—實施例中，上述之底板具有凹槽，而基座與 盍板-己置於凹槽的底部，且賴關配置於凹槽旁。 、 在本發明之測試裝置中，由於在蓋板蓋合於基座且滑201137367 VI. Description of the Invention: TECHNICAL FIELD OF THE INVENTION The present invention relates to a test apparatus, and more particularly to a test apparatus for electrical testing. [Prior Art] Fig. 1 is a schematic view of a conventional test apparatus. Referring to FIG. 1, the conventional testing device 100 includes a substrate 110 and a probe card 12A, wherein the probe card 12 is pivotally connected to the substrate 110. The probe card 120 can be picked up or covered with a picture showing the state in which the probe card reference 120 is on the cover. Further, the substrate 110 has a receiving groove 112 for carrying the liquid crystal display panel 50. The probe card 12A has a probe 122' for testing the liquid crystal display panel 50 and an opening 124 exposing the liquid crystal display panel 50. The test method of the conventional test apparatus 100 is to first pick up the probe card 12A to place the liquid crystal display panel 50 in the accommodating groove 112. Thereafter, the probe card 12 is covered, so that the probe 122 of the probe card 120 contacts the test line 52 of the liquid crystal display panel 5, so that the liquid crystal display panel 50 can be electrically tested. ^ However, the conventional test device 1 has no protective mechanism, and the probe card 120 can still be picked up during the test. If the tester accidentally picks up the probe card 120 during the test, an arc is easily generated, resulting in damage to the liquid crystal display panel 50. SUMMARY OF THE INVENTION The present invention provides a testing device to prevent damage to a test object. In order to achieve the above advantages, the present invention provides a test apparatus comprising a base, a plate and a test switch. The base has a connecting unit, and the cover has opposite first and second sides. The first side is pivotally connected to the base, and the second side is provided with a first fixing member. Thus, a fixing member is adapted to fix the cover to the base when the cover is closed to the base. The test switch is placed beside the base and the test switch has a slide. This slider is suitable for sliding between the power-on position and the power-off position, where the power-on position 4 201137367 is placed and the power-off position is close to the base. The sliding member has a second fixing member, and when the cover plate is coupled to the base and the sliding member is in the power-on position, the second fixing member is fastened to the present invention, and the first fixing member is pivotally connected to the first fixing member. The second side of the fastener, and the base is provided with a fastening portion corresponding to the fastener. In the present invention, the second side is provided with a secret extending portion extending away from the first side, and when the cover is closed to the base and the sliding member is in the power-on position, the second fixing member is Fixed extension. In an embodiment of the invention, the second fixing member comprises at least one baffle, and the second fixing member covers the extension when the cover is closed to the base and the sliding member is in the power-on position. Between the sides, in one embodiment of the invention, the extension portion is offset from the second portion for the second fixture to be placed. In an embodiment of the invention, the extension portion includes two extension blocks on opposite sides of the first fixing member, and the second (four) member includes two baffles corresponding to the extension block. In an embodiment of the invention, the shutter further covers the first fixing member when the cover is closed to the base and the slider is in the power-on position. In an embodiment of the invention, the first fastener and the second fixture are located on the same side of the base when the cover is closed to the base. In one embodiment of the invention, the first and second fasteners are located on different sides of the base when the cover is closed to the base. In an embodiment of the invention, the test switch described above further has a chute, and the /momentary member is adapted to move along the chute. The connection unit includes a plurality of extendable ends. In one embodiment of the invention, the contact pins are arranged in a straight line. 201137367 In an embodiment of the invention, when the cover is closed to the base, it is located between the first side and the second side of the cover. In the embodiment of the present invention, the test apparatus further includes a bottom plate, and the base, the cover, and the test switch are disposed on the bottom plate. In an embodiment of the invention, the bottom plate has a receiving groove. In the embodiment of the invention, the bottom plate has a recess, and the base and the raft are placed at the bottom of the recess and disposed adjacent to the recess. In the test device of the present invention, since the cover is closed to the base and is slippery
，於/電源麟位置時’第二固定件係岐蓋板，所以在對待測 ，進订^性測試時，蓋板無法被掀起。如此，可防止待測物遭 受電弧損害。 λ為讓本發明之上述和其他目的、特徵和優點能更明顯易 懂，下文特舉較佳實施例，並配合所附圖式，作詳細說明如下。 【實施方式】 β圖2是本發明一實施例之一種測試裝置的立體示意圖，圖 3是圖2中蓋板從基座掀起時的示意圖，而圖4是圖2中滑動 件位於電源關閉位置時的示意圖。請參照圖2至圖4，本實施 例之測s式裝置2〇〇包括基座210、蓋板220以及測試開關230。 基座210具有連接單元212，蓋板220具有相對的第一邊221 與第一邊223。第一邊221樞接於基座210，而第二邊223設 有第一固定件222。此第一固定件222適於在蓋板220蓋合於 基座210時，將蓋板22〇固定於基座21〇。測試開關23〇設置 於基座210旁，且測試開關230具有滑動件232。此滑動件232 適於在電源開啟位置（如圖2所示）與電源關閉位置（如圖4 所示）之間滑動’其中電源開啟位置較電源關閉位置接近基座 21〇 °滑動件232具有第二固定件234，且當蓋板220蓋合於 201137367 基座210且滑動件232位於電源開啟位置時，第二固定件234 係固定盖板220。 上述之測試裝置200可更包括底板240，而基座210、蓋 板220及測試開關230配置於底板240上。此底板240可具有 容置槽242，以容置待測物（圖未示）。底板240可設置凹槽 244，而基座210與蓋板220配置於凹槽244内，且測試開關 230配置於凹槽244旁。 此外’測試開關230例如更具有滑槽236，而滑動件232 適於沿滑槽236移動至電源開啟位置或電源關閉位置。另外， 連接單元212例如包括多個可伸縮的接觸針214，而這些接觸 針214例如是沿著直線排列。當蓋板22〇蓋合於基座21〇時， 連接單元212例如是位於蓋板220的第一邊221與第二邊223 之間，而測試裝置200可透過連接單元212而與待測物電性連 接0 在本實施例中，當蓋板220蓋合於基座210時，第一固定 件222與第一固定件234例如是位於基座210的同一側。但在 另實施例中，當盍板220蓋合於基座210時，第一固定件 鲁 222與第一固定件234可位於基座210的不同側。 、圖5是圖2之測試裝置的蓋板蓋合於基座且滑動件位於電 源開啟位置時的示意圖。請參照圖3與圖5，本實施例之第一 ，定件222例如是樞接於第二邊223的扣件，而基座21〇例如 設有對應第一固定件222的扣合部216。當蓋板22〇蓋合於基 座210時，第一固定件222可扣合於扣合部216，以將蓋板2加 固定於基座210。 ，參照圖2至圖5,上述之蓋板220的第二邊223例如設 有朝遠離第一邊221的方向延伸的延伸部224。當蓋板22〇蓋 201137367 合於基座210且滑動件232位於電源開啟位置時，第二固定件 234係固定延伸部224。更詳細地說，第二固定件234包括至 少一檔板238 (本實施例是以兩個擂板238為例）。蓋板220 的延伸部224包括位於第一固定件222兩侧的二延伸塊226， 此二延伸塊226與上述二擋板238相對應。當蓋板220蓋合於 基座210且滑動件232沿著滑槽236滑動至電源開啟位置時， 第一固定件234亦隨之滑動，以遮蓋延伸部224。 本實施例之測試裝置2〇〇用於測試待測物時，可先將蓋板 220掀起（如圖3所示），接著將待測物放置於容置槽242， 並使連接單元212與待測物電性連接。之後，如圖4所示，將 蓋板22〇蓋合於基座2丨〇’並將第一固定件222扣合於基座210 的扣合部216 (參見圖3)，以將蓋板22〇固定於基座21〇。 然後，將滑動件232從電源關閉位置（如圖4所示）推至電源 開啟位置（如圖2所示），以開啟測試裝置2〇〇，進而對待測 物進行測試。 值得一提的是，如圖2與圖5所示，在將滑動件232從電 源關閉位置推至電源開啟位置時，第二固定件234亦隨著滑動 件232移動’以遮蓋部分蓋板22〇。換言之，當測試進行時， ，二固定件234會遮蓋部分蓋板22〇，以使測試人員無法掀起 蓋板220 ’如此可保護待測物免於受到電弧的損害。 此外，當測試完畢欲關閉測試裝置2〇〇時，需將滑動件 232從電源開啟位置推至電源關閉位置。由於在測試裝置 關閉的瞬間，仍有電流經由連接單元212流至待測物，此時若 連接單元212與待測物電性絕緣，則亦容易產生電弧，導致待 測物受損。為避免產生此情形，本實施例係藉由第一固定件 222來將蓋板220固定於基座210。更詳細地說，在測試裝置 m 8 201137367 2〇〇關閉時’測试人員需將第一固定件222鬆脫後才可掀起蓋 板220:所以可防止測試裝置2〇〇關閉後，蓋板⑽與基座⑽ 立，開。由於在測試裝i 2〇〇關閉的瞬間，蓋板22〇仍固定 於土座210 ’所以可避免測試裝置2〇〇關閉的瞬間，連接單元 待職立即電性絕緣，進而保護待測物免於受到電弧的 損害。 另外’本實施例之測試裝置200使用可伸縮的接觸針 所以可避免連接單元212與待測物之間產生接合不正或 接合不良的問題。 6疋本發明另—實施狀測試I置的立體示意圖。請參 …、圖6’本實施例之測試裝置2〇〇,與圖2之測試裝置謂相似， 差別處在於測試開關的滑動件之第二固定件。具體而言，測試 健200,的測試開關23〇，的滑動件加，之第二固定件w，為 片撞板。當蓋板220 i合於基座21〇且滑動件232，位於電源 開啟位置時，第二固定件234,除了遮蓋蓋板22〇的延伸部224 (參照圖5)外更遮蓋第—蚊件222 (參照圖5)。有關於 測试裝置2GG’的優點與上述之測試裝置細的優點相似，在此 鲁 將不再重述。 圖7是本發明另一實施例之測試裝置的蓋板蓋合於基座 且滑動件位於電源開啟位置時的示意圖。請參照圖7，本實施 例▲之測試裝置蕭，朗5之賴裝置她，差別處在於 測试開關的位置。更詳細地說，測試裝置2〇〇，，的蓋板22〇的 L伸。卩224與蓋板220的第二邊223之間有斷差227，以供滑 動件232的第二固定件234置入。亦即，當蓋板22〇蓋合於基 座210且滑動件232位於電源開啟位置時，第二固定件234係 移動至緊鄰延伸部224之頂面225的位置，以防止蓋板22〇被 201137367 掀起。有關於測試裝置200”的優點與上述之測 優點相似，在此將不再重述。 、、置200的 綜上所述，本發明之職裝置至少具訂 ^由於本發明之職裝置在對待測物進行電_ 一固定件係固定蓋板，所以蓋板無法被、 ' 第 測物遭受電弧損害。 ’可防止待 2·由於在本發明之測試裝置關閉的瞬間 基座，所以可避免測試裝置關閉的瞬間二牛;?將 J待測物立即電性絕緣，進而保護待測物免於受到電 雖然本發明已讀佳實施例揭露如上然其麟用 =發明’本發明所屬技術領域巾具有通常知識者，在不脫離 發明>之，神和範_ ’當可作些許之更動與潤飾，因此本 之保護範圍當視後社f料利範圍所界定者鱗。又 【圖式簡單說明】 圖1是習知一種測試裝置的示意圖。When the / power supply position is used, the second fixing member is a cover plate, so the cover cannot be picked up when the test is to be performed. In this way, the object to be tested can be prevented from being damaged by the arc. The above and other objects, features, and advantages of the present invention will become more apparent from the aspects of the appended claims. [Embodiment] FIG. 2 is a perspective view of a test apparatus according to an embodiment of the present invention, FIG. 3 is a schematic view of the cover plate of FIG. 2 when it is lifted from the base, and FIG. 4 is a view of the slide member of FIG. Schematic diagram of the time. Referring to FIG. 2 to FIG. 4, the s-type device 2 of the present embodiment includes a susceptor 210, a cover 220, and a test switch 230. The base 210 has a connecting unit 212 having a first first side 221 and a first side 223. The first side 221 is pivotally connected to the base 210, and the second side 223 is provided with a first fixing member 222. The first fixing member 222 is adapted to fix the cover 22 to the base 21 when the cover 220 is covered by the base 210. The test switch 23A is disposed beside the base 210, and the test switch 230 has a slider 232. The slider 232 is adapted to slide between a power-on position (as shown in FIG. 2) and a power-off position (as shown in FIG. 4). The power-on position is closer to the base 21 than the power-off position. The slider 232 has The second fixing member 234 fixes the cover plate 220 when the cover 220 covers the base of the 201137367 and the slider 232 is in the power-on position. The test device 200 described above may further include a bottom plate 240, and the base 210, the cover plate 220 and the test switch 230 are disposed on the bottom plate 240. The bottom plate 240 can have a receiving groove 242 for accommodating the object to be tested (not shown). The bottom plate 240 can be provided with a groove 244, and the base 210 and the cover plate 220 are disposed in the groove 244, and the test switch 230 is disposed beside the groove 244. Further, the test switch 230 has, for example, a chute 236, and the slider 232 is adapted to move along the chute 236 to a power-on position or a power-off position. Further, the connecting unit 212 includes, for example, a plurality of retractable contact pins 214, and these contact pins 214 are arranged, for example, along a straight line. When the cover 22 is closed to the base 21 , the connecting unit 212 is located between the first side 221 and the second side 223 of the cover 220 , and the testing device 200 can pass through the connecting unit 212 and the object to be tested. Electrical Connection 0 In the present embodiment, when the cover 220 is covered by the base 210, the first fixing member 222 and the first fixing member 234 are located on the same side of the base 210, for example. However, in another embodiment, when the seesaw 220 is attached to the base 210, the first fixture 222 and the first fixture 234 may be located on different sides of the base 210. Figure 5 is a schematic view of the test device of Figure 2 with the cover attached to the base and the slider in the power-on position. Referring to FIG. 3 and FIG. 5 , in the first embodiment, the fixing member 222 is, for example, a fastener pivotally connected to the second side 223 , and the base 21 is provided with a fastening portion 216 corresponding to the first fixing member 222 . . When the cover 22 is closed to the base 210, the first fixing member 222 can be fastened to the fastening portion 216 to fix the cover 2 to the base 210. Referring to Figures 2 to 5, the second side 223 of the cover plate 220 described above is provided, for example, with an extension 224 extending away from the first side 221. The second fixing member 234 secures the extension portion 224 when the cover 22 is covered by the cover 201137367 and the slider 232 is in the power-on position. In more detail, the second fixing member 234 includes at least one of the shutters 238 (this embodiment is an example of two jaws 238). The extension 224 of the cover plate 220 includes two extension blocks 226 on opposite sides of the first fixing member 222, and the two extension blocks 226 correspond to the two baffles 238 described above. When the cover 220 is closed to the base 210 and the slider 232 is slid along the sliding slot 236 to the power-on position, the first fixing member 234 is also slid to cover the extension 224. When the test device 2 of the embodiment is used for testing the object to be tested, the cover plate 220 can be picked up first (as shown in FIG. 3), then the object to be tested is placed in the receiving groove 242, and the connecting unit 212 is connected with The object to be tested is electrically connected. Then, as shown in FIG. 4, the cover 22 is closed to the base 2'' and the first fixing member 222 is fastened to the engaging portion 216 of the base 210 (see FIG. 3) to cover the cover. 22〇 is fixed to the base 21〇. Then, the slider 232 is pushed from the power-off position (as shown in Fig. 4) to the power-on position (as shown in Fig. 2) to turn on the test device 2, and then the test object is tested. It is worth mentioning that, as shown in FIG. 2 and FIG. 5, when the slider 232 is pushed from the power-off position to the power-on position, the second fixing member 234 also moves along with the slider 232 to cover the partial cover 22 Hey. In other words, when the test is in progress, the two fixing members 234 cover the partial cover 22 〇 so that the tester cannot lift the cover 220 ′ to protect the object to be tested from the arc. In addition, when the test device 2 is to be turned off, the slider 232 is pushed from the power-on position to the power-off position. Since the current flows to the object to be tested via the connection unit 212 at the moment when the test device is turned off, if the connection unit 212 is electrically insulated from the object to be tested, an arc is easily generated, resulting in damage of the object to be tested. In order to avoid this, the present embodiment fixes the cover 220 to the base 210 by the first fixing member 222. In more detail, when the test device m 8 201137367 2〇〇 is closed, the tester needs to loosen the first fixing member 222 before lifting the cover plate 220: so that the cover device can be prevented from being closed after the test device 2 is closed. (10) Stand up and open with the base (10). Since the cover 22 is still fixed to the earth seat 210' at the moment when the test device is closed, the connection of the test device 2 can be avoided, and the connection unit is immediately electrically insulated, thereby protecting the object to be tested. Subject to damage from the arc. Further, the test apparatus 200 of the present embodiment uses the retractable contact pin so that the problem of misalignment or poor joint between the connecting unit 212 and the object to be tested can be avoided. 6疋 The present invention is another three-dimensional schematic diagram of the test I. Referring to Fig. 6', the test device 2 of the present embodiment is similar to the test device of Fig. 2, and the difference lies in the second fixing member of the slider of the test switch. Specifically, the test switch 23 of the test 200, the slider of the test switch 23, and the second fixture w are the plate striker. When the cover 220 i is coupled to the base 21 and the slider 232 is in the power-on position, the second fixing member 234 covers the first mosquito cover except for the extending portion 224 covering the cover 22 (refer to FIG. 5). 222 (Refer to Figure 5). The advantages associated with the test device 2GG' are similar to those of the test device described above, and will not be repeated here. Fig. 7 is a schematic view showing the cover of the test apparatus according to another embodiment of the present invention, which is closed to the base and the slider is in the power-on position. Referring to Fig. 7, the test device of the embodiment ▲ is Xiao, and the device of the Lang 5 is installed. The difference lies in the position of the test switch. In more detail, the test device 2〇〇, the cover 22 is extended by L. A gap 227 is provided between the bore 224 and the second side 223 of the cover plate 220 for the second retaining member 234 of the slider 232 to be inserted. That is, when the cover 22 is closed to the base 210 and the slider 232 is in the power-on position, the second fixing member 234 is moved to a position immediately adjacent to the top surface 225 of the extension 224 to prevent the cover 22 from being smashed. 201137367 picked up. The advantages of the test device 200" are similar to those of the above test, and will not be repeated here. In the above, the device of the present invention is at least ordered to be treated by the device of the present invention. The test object is powered _ a fixed part is fixed to the cover plate, so the cover plate cannot be damaged by the 'test object.' It can prevent the test from being avoided due to the susceptor at the moment when the test device of the present invention is turned off. The moment the device is turned off, the second test piece is electrically insulated, and the object to be tested is electrically insulated immediately, thereby protecting the object to be tested from being subjected to electricity. Although the present invention has been disclosed in the preferred embodiment, the invention is as disclosed above. Those who have the usual knowledge, without leaving the invention, God and Fan _ 'When there can be some changes and refinements, the scope of protection of this book is regarded as the scale defined by the scope of the company. FIG. 1 is a schematic diagram of a conventional test apparatus.
圖2是本發明-實施例之—種測試裝置的立體示意圖。 圖3是圖2令蓋板從基座掀起時的示意圖。 圖4是圖2中滑動件位於電源義位置時的示意圖。 圖5是圖2之測試裝置的蓋板蓋合於基座且 源開啟位置時的示意圖。 、電 圖6是本發明另一實施例之測試裝置的立體示意圖。 圖7是本發明另一實施例之測試裝置的蓋板蓋合於基座 且滑動件位於電源開啟位置時的示意圖。 【主要元件符號說明】 50 ·液晶顯示面板 201137367 52 :測試線路 100、200、200’、200” ：測試裝置 110 :基板 112、242 :容置槽 120 :探針板 122 :探針 124 :開口 210 :基座 212 :連接單元 214 :接觸針 216 :扣合部 220 :蓋板 221 :第一邊 222 :第一固定件 223 :第二邊 224 :延伸部 225 :頂面 226 :延伸塊 227 :斷差 230、230’ ：測試開關 232、232’ ：滑動件 234、234’ ：第二固定件 236 :滑槽 238 :擋板 240 :底板 242 :容置槽 244 :凹槽Figure 2 is a perspective view of a test apparatus of the present invention - an embodiment. Figure 3 is a schematic view of Figure 2 with the cover plate lifted from the base. 4 is a schematic view of the slider of FIG. 2 in a power supply position. Figure 5 is a schematic illustration of the cover of the test apparatus of Figure 2 when it is attached to the base and in the source open position. Figure 6 is a perspective view of a test apparatus according to another embodiment of the present invention. Fig. 7 is a schematic view showing the cover of the test apparatus according to another embodiment of the present invention, which is closed to the base and the slider is in the power-on position. [Main component symbol description] 50 · Liquid crystal display panel 201137367 52 : Test line 100, 200, 200', 200": Test device 110: Substrate 112, 242: accommodating groove 120: Probe plate 122: Probe 124: Opening 210: base 212: connection unit 214: contact pin 216: fastening portion 220: cover plate 221: first side 222: first fixing member 223: second side 224: extension portion 225: top surface 226: extension block 227 : Break 230, 230': test switch 232, 232': slider 234, 234': second fixing member 236: chute 238: baffle 240: bottom plate 242: receiving groove 244: groove