TWI399543B - Testing and classifying machine for electronic elements - Google Patents
Testing and classifying machine for electronic elements Download PDFInfo
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- TWI399543B TWI399543B TW99106475A TW99106475A TWI399543B TW I399543 B TWI399543 B TW I399543B TW 99106475 A TW99106475 A TW 99106475A TW 99106475 A TW99106475 A TW 99106475A TW I399543 B TWI399543 B TW I399543B
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Description
本發明係提供一種可易於增設取放器，並更加調整縮小各取放器之X-Y軸向間距，以利取放電子元件，而大幅提升測試產能及作業便利性之電子元件測試分類機。The invention provides an electronic component test sorting machine which can easily add a pick-and-place device and further adjust and reduce the X-Y axial spacing of each pick-and-place device to facilitate the electronic component discharge, thereby greatly improving the test productivity and the work convenience.
按，請參閱第1圖，係為坊間電子元件測試分類機之示意圖，其係於機台之前方設有供料裝置10及收料裝置20，並於機台之後方設有複數個測試裝置30，該供料裝置10係設有至少一具容置槽之料盤11，用以盛裝複數個待測之電子元件，收料裝置20亦設有複數個具容置槽之料盤21，用以盛裝不同等級完測之電子元件，而測試裝置30則設有具複數個測試座32之測試電路板31，用以測試電子元件，另於機台上設有輸送裝置40，用以於供、收料裝置10、20及測試裝置30間移載待測/完測之電子元件，該輸送裝置40係於收料裝置20與測試裝置30間設有載具41，用以載送待測/完測之電子元件，並於供、收料裝置10、20與載具41間設有具複數個取放器421之第一移料臂42，用以移載待測/完測之電子元件，以及於測試裝置30與載具41間設有具取放器431之第二移料臂43，用以移載待測/完測之電子元件，由於料盤11、21之各容置槽的間距與各測試座32之間距不同，即必須使第一、二移料臂42、43之各取放器421、431可作Y軸向間距調整，以便於料盤11、21及測試座32處取放待測/完測之電子元件；請參閱第2、3圖，以第一移料臂42為例，其係於機架422上設有第一、二馬達423A、423B，用以各別驅動第一、二Z軸向皮帶輪組424A、424B，並於第一Z軸向皮帶輪組424A上裝配有第一取放器421A，而第二Z軸向皮帶輪組424B上則裝配有一具Y軸向滑槽4251之掣動架425，並以Y軸向滑槽4251供一滑動架426之凸榫4261滑置，滑動架426之前面係裝配有第二取放器421B，並於背面裝設有傳動架427，且於傳動架427與滑動架426間設有相配合之Z軸向滑軌4271及Z軸向滑座4262，另於機架422之背面設有第三馬達423C，用以驅動一位於機架422前面之Y軸向皮帶輪組428作動，該Y軸向皮帶輪組428則連結傳動架427，於調整第一、二取放器421A、421B之Y軸向間距時，係以第一取放器421A作基準件，並控制第三馬達423C驅動Y軸向皮帶輪組428作動，令Y軸向皮帶輪組428帶動傳動架427作Y軸向位移，傳動架427利用Z軸向滑軌4271及Z軸向滑座4262之傳動而驅動滑動架426以凸榫4261沿掣動架425之Y軸向滑槽4251作Y軸向位移，使滑動架426帶動第二取放器421B相對於第一取放器421A作Y軸向位移，而調整第一、二取放器421A、421B之Y軸向間距；惟，該第一移料臂42雖可使第一、二取放器421A、421B作Y軸向變距調整及Z軸向升降位移，但第一、二取放器421A、421B作Z軸向升降位移係用以取放電子元件，並不涉及第一、二取放器421A、421B之間距調整，於第一、二取放器421A、421B之Y軸向間距調整設計上，該移料臂42僅以第三馬達423C驅動Y軸向皮帶輪組428，並經傳動架427帶動第二取放器421B作單一Y軸向位移，然在現今講求高產能之趨勢下，業者欲於第一移料臂42上增設X軸向平行排列之取放器，以提升取放電子元件作業之產能時，即必須使各列取放器可作X-Y軸向間距之調整，以因應不同料盤之容置槽間距及各測試座之間距，方可便利取放電子元件，但該第一移料臂42之設計僅可使第一、二取放器421A、421B作單一Y軸向之間距調整，以致無法增設可作X軸向間距調整之取放器，造成取放電子元件作業產能受限之缺失。Press, please refer to Figure 1, which is a schematic diagram of the electronic component test sorting machine. The feeding device 10 and the receiving device 20 are arranged in front of the machine, and a plurality of testing devices are arranged behind the machine. 30, the feeding device 10 is provided with at least one tray 11 for accommodating grooves for holding a plurality of electronic components to be tested, and the receiving device 20 is also provided with a plurality of trays 21 having accommodating grooves. The test device 30 is provided with a test circuit board 31 having a plurality of test sockets 32 for testing electronic components, and a transport device 40 is provided on the machine platform for The electronic components to be tested/completed are transferred between the supply and receiving devices 10 and 20 and the testing device 30. The conveying device 40 is provided with a carrier 41 between the receiving device 20 and the testing device 30 for carrying Measuring/finishing the electronic component, and providing a first moving arm 42 with a plurality of pick-and-placers 421 between the supply and receiving device 10, 20 and the carrier 41 for transferring the tested/completed test An electronic component, and a second transfer arm 43 having a pick-and-placer 431 between the test device 30 and the carrier 41 for transferring the test/test The electronic components are different in the distance between the receiving slots of the trays 11 and 21 and the distance between the test sockets 32, that is, the pick-and-place units 421 and 431 of the first and second moving arms 42 and 43 must be used as Y. The axial spacing is adjusted so as to pick up the electronic components to be tested/completed at the trays 11, 21 and the test socket 32; please refer to Figures 2 and 3, taking the first moving arm 42 as an example, which is attached to the machine. The frame 422 is provided with first and second motors 423A, 423B for respectively driving the first and second Z-axis pulley sets 424A, 424B, and the first Z-axis pulley set 424A is equipped with a first pick-and-placer. 421A, and the second Z-axis pulley set 424B is equipped with a yoke frame 425 having a Y-axis sliding groove 4251, and is provided with a Y-axis sliding groove 4251 for sliding the bracket 4261 of the sliding frame 426, the sliding frame The front surface of the 426 is equipped with a second pick-and-placer 421B, and a transmission frame 427 is mounted on the back side, and a Z-axis slide rail 4271 and a Z-axis slide seat are provided between the transmission frame 427 and the carriage 426. 4262, further disposed on the back of the frame 422 is a third motor 423C for driving a Y-axis pulley set 428 located in front of the frame 422, and the Y-axis pulley set 428 is coupled. The frame 427, when adjusting the Y-axis spacing of the first and second pick-and-place devices 421A, 421B, uses the first pick-and-placer 421A as a reference member, and controls the third motor 423C to drive the Y-axis pulley set 428 to operate. The Y-axis pulley set 428 drives the transmission frame 427 for Y-axis displacement, and the transmission frame 427 drives the carriage 426 with the Z-axis slide 4271 and the Z-axis slide 4262 to drive the bracket 4261 along the turret 425. The Y-axis sliding groove 4251 is displaced in the Y-axis, so that the sliding frame 426 drives the second pick-and-placer 421B to be axially displaced relative to the first pick-and-placer 421A, and the first and second pick-and-place devices 421A, 421B are adjusted. Y-axis spacing; however, the first moving arm 42 can make the first and second pick-and-placers 421A, 421B make the Y-axis variable pitch adjustment and the Z-axis lifting displacement, but the first and second pick-and-placers 421A 421B for Z-axis lifting displacement is used for pick-and-place electronic components, does not involve the adjustment of the distance between the first and second pick-and-place 421A, 421B, and the Y-axis spacing adjustment of the first and second pick-and-place 421A, 421B In design, the moving arm 42 drives the Y-axis pulley set 428 only by the third motor 423C, and drives the second pick-and-placer 421B as a single Y-axis position via the transmission frame 427. However, in the current trend of high-capacity, the industry wants to add X-axis parallel-arranged pick-and-place devices to the first transfer arm 42 to improve the capacity of the electronic components. The XY axial spacing can be adjusted to facilitate the access to the electronic components in response to the spacing of the receiving slots of the different trays and the distance between the test sockets. However, the first moving arm 42 can only be designed first. The two pick-and-place devices 421A and 421B are adjusted as a single Y-axis axial distance, so that the pick-and-place device capable of adjusting the X-axis spacing cannot be added, resulting in a lack of limited production capacity of the pick-and-place electronic components.
故，如何設計一種易於增設取放器，並可更加調整縮小各取放器之間距而便利取放電子元件，以提升測試產能及作業便利性之電子元件測試分類機，即為業者研發之標的。Therefore, how to design an electronic component test sorting machine that is easy to add a pick-and-place device and can adjust and adjust the distance between the pick-and-placers to facilitate the pick-and-place of electronic components to improve test productivity and work convenience, is the target for the research and development of the industry. .
本發明之目的一，係提供一種電子元件測試分類機，係於機台上配置有供料裝置、收料裝置、測試裝置及輸送裝置，該供料裝置係容納複數個待測之電子元件，收料裝置係容納複數個不同等級完測之電子元件，測試裝置係設有複數個測試座，用以測試電子元件，該輸送裝置係於測試裝置之前、後方各設有至少一載具，該載具係用以於供、收料裝置及測試裝置間載送待測/完測之電子元件，另設有至少二移料臂，各移料臂係設有複數個可作X-Y軸向變距及Z軸向升降位移之取放器，用以於供料裝置、收料裝置、測試裝置及載具間移載待測/完測之電子元件；藉此，可易於增設X軸向平行排列之取放器，並使各取放器作X-Y軸向變距而便利取放電子元件，達到大幅提升測試產能之實用效益。An object of the present invention is to provide an electronic component test sorting machine, which is provided with a feeding device, a receiving device, a testing device and a conveying device, and the feeding device is for accommodating a plurality of electronic components to be tested. The receiving device is configured to accommodate a plurality of electronic components of different levels, and the testing device is provided with a plurality of test sockets for testing electronic components. The conveying device is provided with at least one carrier before and behind the testing device. The carrier is used for carrying the electronic components to be tested/tested between the supply and receiving device and the testing device, and at least two moving arms are provided, and each of the moving arms is provided with a plurality of XY axial changes. The pick-and-place device with the Z-axis lifting displacement is used for transferring the electronic components to be tested/finished between the feeding device, the receiving device, the testing device and the carrier; thereby, the X-axis parallel can be easily added. Arranging the pick-and-place device and making each pick-and-place device XY axially variable pitch facilitates access to electronic components, achieving the practical benefit of greatly increasing test throughput.
本發明之目的二，係提供一種電子元件測試分類機，該輸送裝置之各移料臂係設有Z軸向驅動機構、X軸向調整機構及Y軸向調整機構，該Z軸向驅動機構係設有各具取放器之第一、二、三、四傳動組，其第一、三傳動組係分別設有Y軸向滑槽及X軸向滑槽，以供二取放器可與第二傳動組之取放器作X-Y軸向之相對位移，第四傳動組則樞設有可擺動之傳動滑軌，以供取放器可與第二傳動組之取放器作對角位移，該X軸向調整機構及Y軸向調整機構則分別設有X軸向移動架及Y軸向移動架，用以各別帶動第一、三傳動組之各取放器相對於第二傳動組之取放器作X軸向位移或Y軸向位移，以及使第四傳動組之取放器相對於第二傳動組之取放器作對角位移，使得各取放器相互靠合排列；藉此，可更加調整縮小各取放器之間距，以適用於間距微小之各容置槽及各測試座處取放電子元件，達到提升使用效能之實用效益。An object of the present invention is to provide an electronic component testing and sorting machine, wherein each of the moving arms of the conveying device is provided with a Z-axis driving mechanism, an X-axis adjusting mechanism and a Y-axis adjusting mechanism, and the Z-axis driving mechanism The first, second, third and fourth transmission groups each have a pick-and-place device, and the first and third transmission groups are respectively provided with a Y-axis chute and an X-axis chute for the second pick-and-place device. The pick-and-place of the second transmission group is XY axially displaced, and the fourth transmission group is pivotally provided with a swingable transmission rail for the diagonal displacement of the pick-and-placer with the pick-and-place of the second transmission set The X-axis adjustment mechanism and the Y-axis adjustment mechanism are respectively provided with an X-axis moving frame and a Y-axis moving frame for respectively driving the respective pickers of the first and third transmission groups with respect to the second transmission. The pick and place device of the group is X-axis displacement or Y-axis displacement, and the pick-and-place device of the fourth transmission group is diagonally displaced with respect to the pick-and-place device of the second transmission group, so that the pick-and-placers are arranged to be aligned with each other; Thereby, the distance between the pick-and-placers can be further adjusted and reduced, so as to be suitable for each of the accommodating slots with small pitches and the pick-and-places of the test seats. Sub-elements, to enhance the performance of practical use efficiency.
為使 貴審查委員對本發明作更進一步之瞭解，茲舉一較佳實施例並配合圖式，詳述如后：請參閱第4圖，本發明電子元件測試分類機係於機台上配置有供料裝置50、收料裝置60、空匣裝置70、測試裝置80及輸送裝置90，該供料裝置50係設有至少一料盤501，該料盤501係具有複數個容置槽502，用以承置待測之電子元件，該收料裝置60係設有至少一料盤601，該料盤601係具有複數個容置槽602，用以承置完測之電子元件，空匣裝置70係用以收置供料裝置50之空料盤，並將空料盤補充於收料裝置60，用以盛裝完測之電子元件，該測試裝置80係設有具測試座82之測試電路板81，該測試座82可為常開型測試座或常閉型測試座，於本實施例中，該測試電路板81上係配置有4個常開型測試座82，用以同步執行4個電子元件之測試作業，並以測試器(圖未示出)將測試結果傳輸至中央控制單元(圖未示出)，由中央控制單元控制各裝置作動；該輸送裝置90包含有至少一載具及至少二移料臂，該載具可採活動式或固定式設計，於本實施例中，該輸送裝置90係於測試裝置80之前方設有可作X軸向位移之第一載具91，第一載具91係設有複數個定位槽911，例如設有4個採X-Y軸向排列之定位槽911，用以載送待測之電子元件，以及於測試裝置80之後方亦設有一可作X軸向位移之第二載具92，第二載具92係設有複數個定位槽921，例如設有4個採X-Y軸向排列之定位槽921，用以載送完測之電子元件，另該輸送裝置90係於供料裝置50與第一載具91間設有可作X-Y-Z軸向位移之第一移料臂93，用以移載待測之電子元件，於第一載具91與測試裝置80間設有可作Y-Z軸向位移之第二移料臂95，用以移載待測之電子元件，於測試裝置80與第二載具92間設有可作Y-Z軸向位移之第三移料臂96，用以移載完測之電子元件，於第二載具92與收料裝置60間設有可作X-Y-Z軸向位移之第四移料臂97，用以移載完測之電子元件，該輸送裝置90可視移載電子元件作業所需，而於各移料臂上設有固定式取放器或變距式取放器，由於第一、二載具91、92之各定位槽911、921的X-Y軸向間距係相對於測試裝置80之各測試座82的X-Y軸向間距，於本實施例中，該第二移料臂95及第三移料臂96可分別設置複數個固定式之取放器951、961，而供、收料裝置50、60之容置槽502、602的X-Y軸向間距，因不同待測電子元件，而可能不同於第一、二載具91、92之定位槽911、921的X-Y軸向間距，於本實施例中，該第一移料臂93及第四移料臂97係可分別設置複數個變距式之取放器931、971，以配合不同電子元件進行取放作業。In order to make the present invention more fully understood by the reviewing committee, a preferred embodiment and a drawing will be described in detail as follows: Referring to FIG. 4, the electronic component testing and sorting machine of the present invention is arranged on the machine. a feeding device 50, a receiving device 60, an empty device 70, a testing device 80, and a conveying device 90. The feeding device 50 is provided with at least one tray 501, and the tray 501 has a plurality of receiving grooves 502. For receiving the electronic component to be tested, the receiving device 60 is provided with at least one tray 601, the tray 601 has a plurality of receiving slots 602 for receiving the tested electronic components, the open device The 70 series is used for accommodating the empty tray of the feeding device 50, and the empty tray is replenished to the receiving device 60 for holding the tested electronic components. The testing device 80 is provided with a test circuit with a test socket 82. The test board 82 can be a normally open test stand or a normally closed test stand. In this embodiment, the test circuit board 81 is provided with four normally open test sockets 82 for synchronous execution. Test of electronic components and transfer the test results to the central control with a tester (not shown) The unit (not shown) controls the operation of each device by the central control unit; the conveying device 90 includes at least one carrier and at least two moving arms, and the carrier can adopt a movable or fixed design, in this embodiment The conveying device 90 is provided with a first carrier 91 capable of X-axis displacement in front of the testing device 80. The first carrier 91 is provided with a plurality of positioning slots 911, for example, four XY axes are provided. The alignment slot 911 is configured to carry the electronic component to be tested, and the second carrier 92 is disposed in the X-axis displacement after the test device 80. The second carrier 92 is provided with a plurality of The positioning groove 921 is provided with, for example, four positioning grooves 921 arranged in the axial direction of the XY for carrying the measured electronic components, and the conveying device 90 is disposed between the feeding device 50 and the first carrier 91. a first transfer arm 93 for XYZ axial displacement for transferring the electronic component to be tested, and a second transfer arm 95 capable of YZ axial displacement between the first carrier 91 and the test device 80, For transferring the electronic component to be tested, a third transfer arm 96 capable of YZ axial displacement is disposed between the testing device 80 and the second carrier 92. For transferring the electronic component to be tested, a fourth transfer arm 97 capable of XYZ axial displacement is disposed between the second carrier 92 and the receiving device 60 for transferring the completed electronic component. The device 90 can be used for the operation of the electronic component to be transferred, and a fixed pick-and-place device or a variable pitch pick-and-place device is disposed on each of the moving arms, and the positioning grooves 911 and 921 of the first and second carriers 91 and 92 are provided. The XY axial spacing is relative to the XY axial spacing of the test sockets 82 of the testing device 80. In this embodiment, the second moving arm 95 and the third moving arm 96 can be respectively provided with a plurality of fixed types. The XY axial spacing of the accommodating slots 502, 602 of the supply and receiving devices 50, 60 may be different from the first and second carriers 91, 92 due to different electronic components to be tested. The XY axial spacing of the positioning slots 911, 921, in the embodiment, the first moving arm 93 and the fourth moving arm 97 can respectively be provided with a plurality of variable pitch pickers 931, 971 to match Different electronic components are used for pick and place operations.
請參閱第4、5、6、7圖，由於第一、四移料臂93、97之設計相同，於本實施例中，係以第一移料臂93作一說明，該第一移料臂93包含有Z軸向驅動機構、X軸向調整機構及Y軸向調整機構，該Z軸向驅動機構係於一Z軸向機架932上裝設有至少一Z軸向驅動源，於本實施例中，係設有第一、二、三、四Z軸向驅動源，該第一、二、三、四Z軸向驅動源包含有第一、二、三、四Z軸向馬達933A、933B、933C、933D及第一、二、三、四Z軸向皮帶輪組934A、934B、934C、934D，並以第一、二、三、四Z軸向皮帶輪組934A、934B、934C、934D各別帶動第一、二、三、四傳動組作Z軸向位移，其中，第一傳動組係設有一連結於第一Z軸向皮帶輪組934A之第一傳動架935A，第一傳動架935A係設有Y軸向滑槽9351A，供一第一Z軸向滑動件936A之凸榫9361A滑置，該第一Z軸向滑動件936A之底部則裝配有第一取放器931A，使第一Z軸向滑動件936A可帶動第一取放器931A作Y-Z軸向位移，第二傳動組係設有一連結於第二Z軸向皮帶輪組934B之第二傳動架935B，第二傳動架935B係連結一第二Z軸向滑動件936B，第二Z軸向滑動件936B係滑置於一固設於Y軸向機架937上之第二Z軸向滑座9371，並於底部裝配有第二取放器931B，且使第二取放器931B位於第一取放器931A之Y軸向側方，使第二Z軸向滑動件936B可帶動第二取放器931B作Z軸向位移，第三傳動組係設有一連結於第三Z軸向皮帶輪組934C之第三傳動架935C，第三傳動架935C係設有X軸向滑槽9351C，供一第三Z軸向滑動件936C之凸榫9361C滑置，該第三Z軸向滑動件936C之底部則裝配有第三取放器931C，並使第三取放器931C位於第二取放器931B之X軸向側方，使第三Z軸向滑動件936C可帶動第三取放器931C作X-Z軸向位移，第四傳動組係設有一連結於第四Z軸向皮帶輪組934D之第四傳動架935D，並於第四傳動架935D上樞設一可作水平角度擺動之傳動滑軌9351D，該傳動滑軌9351D供一第四Z軸向滑動件936D樞設之滑座9361D滑置，而第四Z軸向滑動件936D之底部則裝配有第四取放器931D，並使第四取放器931D位於第二取放器931B之對角處，使第四Z軸向滑動件936D可帶動第四取放器931D作Z軸向位移及X-Y軸向位移，該X軸向調整機構係於Z軸向機架932上裝設有X軸向驅動源，於本實施例中，該X軸向驅動源包含X軸向馬達938及X軸向皮帶輪組939，並以X軸向皮帶輪組939連結一呈Y軸向擺置之X軸向移動架940，於本實施例中，該X軸向移動架940係為一滑軌，並於X軸向移動架940與Z軸向機架932間係設有相互配合之X軸向滑座9401及X軸向滑軌9321，用以輔助X軸向移動架940作X軸向位移，另於X軸向移動架940之一端固設有一Z軸向滑座9402，供第三Z軸向滑動件936C滑置連結，X軸向移動架940上則滑置一間傳滑座9403，再於間傳滑座9403上設有Z軸向滑座9404，供第四Z軸向滑動件936D滑置連結，使得X軸向移動架940可帶動第三、四Z軸向滑動件936C、936D及第三、四取放器931C、931D作X軸向同步位移，以調整與第一、二取放器931A、931B之X軸向間距，該Y軸向調整機構係於Z軸向機架932上裝設有Y軸向驅動源，於本實施例中，該Y軸向驅動源包含Y軸向馬達941及Y軸向皮帶輪組942，並以Y軸向皮帶輪組942連結一呈X軸向擺置之Y軸向移動架943，該Y軸向移動架943與Y軸向機架937間係設有相互配合之Y軸向滑座9431及Y軸向滑軌9372，用以輔助Y軸向移動架943作Y軸向位移，另於Y軸向移動架943上設有Z軸向滑座9432及X軸向滑軌9433，該Z軸向滑座9432係供第一Z軸向滑動件936A滑置連結，而X軸向滑軌9433則供間傳滑座9403之X軸向滑座9405滑置，使得Y軸向移動架943可帶動第一、四Z軸向滑動件936A、936D及第一、四取放器931A、931D作Y軸向位移，以調整與第二、三取放器931B、931C間之Y軸向間距。Referring to Figures 4, 5, 6, and 7, since the first and fourth transfer arms 93, 97 are identical in design, in the present embodiment, the first transfer arm 93 is used as a description, and the first transfer material is used. The arm 93 includes a Z-axis drive mechanism, an X-axis adjustment mechanism, and a Y-axis adjustment mechanism. The Z-axis drive mechanism is mounted on a Z-axis frame 932 with at least one Z-axis drive source. In this embodiment, the first, second, third, and fourth Z-axis driving sources are provided, and the first, second, third, and fourth Z-axis driving sources include the first, second, third, and fourth Z-axis motors. 933A, 933B, 933C, 933D and first, second, third, and fourth Z-axis pulley sets 934A, 934B, 934C, 934D, and the first, second, third, and fourth Z-axis pulley sets 934A, 934B, 934C, The 934D drives the first, second, third and fourth transmission groups for Z-axis displacement, wherein the first transmission group is provided with a first transmission frame 935A coupled to the first Z-axis pulley set 934A, the first transmission frame The 935A is provided with a Y-axis sliding slot 9351A for sliding the projection 9361A of a first Z-axis sliding member 936A, and the bottom of the first Z-axis sliding member 936A is equipped with a first pick-and-placer 931A. The first Z-axis slide 936A can drive the first pick-and-placer 931A for YZ axial displacement, and the second drive set is provided with a second drive frame 935B coupled to the second Z-axis pulley set 934B, the second drive frame 935B is coupled to a second Z-axis slide 936B, and the second Z-axis slide 936B is slidably disposed on a second Z-axis slide 9371 fixed to the Y-axis frame 937, and assembled at the bottom. There is a second pick-and-placer 931B, and the second pick-and-placer 931B is located on the Y-axis side of the first pick-and-placer 931A, so that the second Z-axis slide 936B can drive the second pick-and-placer 931B as the Z-axis. To the displacement, the third transmission set is provided with a third transmission frame 935C coupled to the third Z-axis pulley set 934C, and the third transmission frame 935C is provided with an X-axis sliding groove 9351C for a third Z-axis sliding. The tenon 9361C of the member 936C is slid, the bottom of the third Z-axis slide member 936C is equipped with a third pick-and-placer 931C, and the third pick-and-placer 931C is located on the X-axis side of the second pick-and-placer 931B. Therefore, the third Z-axis slide member 936C can drive the third pick-and-placer 931C to perform XZ axial displacement, and the fourth drive train is provided with a fourth link to the fourth Z-axis pulley set 934D. The movable frame 935D is disposed on the fourth transmission frame 935D, and a horizontally oscillating transmission sliding rail 9351D is disposed. The transmission sliding rail 9351D is slidably disposed by a sliding seat 9361D pivoted by a fourth Z-axis sliding member 936D. The bottom of the fourth Z-axis slide member 936D is equipped with a fourth pick-and-placer 931D, and the fourth pick-and-placer 931D is located at a diagonal of the second pick-and-placer 931B, so that the fourth Z-axis slide member 936D The fourth pick-and-placer 931D can be driven to perform Z-axis displacement and XY axial displacement. The X-axis adjustment mechanism is provided with an X-axis driving source on the Z-axis frame 932. In this embodiment, the The X-axis drive source includes an X-axis motor 938 and an X-axis pulley set 939, and is coupled to the X-axis moving frame 940 in the Y-axis direction by the X-axis pulley set 939. In this embodiment, The X-axis moving frame 940 is a sliding rail, and an X-axis sliding seat 9401 and an X-axis sliding rail 9321 are interposed between the X-axis moving frame 940 and the Z-axis frame 932 for The auxiliary X-axis moving frame 940 is X-axis displacement, and the Z-axis sliding seat 9402 is fixed at one end of the X-axis moving frame 940 for sliding connection of the third Z-axis sliding member 936C, and the X-axis is moved. On the 940, a transfer slide 9403 is slid, and a Z-axis slide 9404 is disposed on the transfer slide 9403 for the fourth Z-axis slide 936D to be slidably coupled, so that the X-axis movement frame 940 can be The third and fourth Z axial sliding members 936C and 936D and the third and fourth pick and placers 931C and 931D are synchronously displaced in the X-axis to adjust the X-axis spacing between the first and second pick-and-place devices 931A and 931B. The Y-axis adjustment mechanism is provided with a Y-axis drive source on the Z-axis frame 932. In the embodiment, the Y-axis drive source includes a Y-axis motor 941 and a Y-axis pulley set 942. And a Y-axis moving frame 943 disposed in the X-axis direction is coupled with the Y-axis pulley set 942. The Y-axis moving frame 943 and the Y-axis frame 937 are provided with a Y-axis sliding seat that cooperates with each other. 9431 and Y-axis slide rails 9372 are used to assist the Y-axis moving frame 943 for Y-axis displacement, and the Y-axis moving frame 943 is provided with a Z-axis slide seat 9432 and an X-axis slide rail 9433. The Z-axis slide seat 9432 is for sliding connection of the first Z-axis slide member 936A, and the X-axis slide rail 9433 is for sliding the X-axis slide seat 9405 of the transfer slide 9403 so that the Y-axis slide frame is moved. 943 can drive the first and fourth Z axial slide Member 936A, 936D and the first and fourth pick and place unit 931A, 931D for Y axial displacement, and to adjust the second and third pick and place unit 931B, 931C between the Y-axis pitch.
請參閱第6、8、9、10圖，於使用時，該輸送裝置90之第一移料臂93係帶動第一、二、三、四取放器931A、931B、931C、931D位移至供料裝置50之料盤501上方，並以第二取放器931B作為基準件，而控制X軸向馬達938及Y軸向馬達941各別驅動X軸向皮帶輪組939及Y軸向皮帶輪組942作動，該X軸向皮帶輪組939係帶動X軸向移動架940作X軸向位移，X軸向移動架940即以Z軸向滑座9402及間傳滑座9403分別帶動第三Z軸向滑動件936C及第四Z軸向滑動件936D作X軸向位移，並使間傳滑座9403以X軸向滑座9405沿Y軸向移動架943之X軸向滑軌9433位移，該第三Z軸向滑動件936C係以凸榫9361C於第三傳動架935C之X軸向滑槽9351C滑移，並與第二Z軸向滑動件936B作X軸向相對位移，使第三取放器931C靠合於第二取放器931B之側面，而可調整縮小第二、三取放器931B、931C之間距，又該Y軸向馬達941則驅動Y軸向皮帶輪組942作動，使Y軸向皮帶輪組942帶動Y軸向移動架943作Y軸向位移，該Y軸向移動架943即以Z軸向滑座9432及間傳滑座9403分別帶動第一Z軸向滑動件936A及第四Z軸向滑動件936D作Y軸向位移，並使間傳滑座9403於X軸向移動架940上作Y軸向位移，該第一Z軸向滑動件936A係以凸榫9361A於第一傳動架935A之Y軸向滑槽9351A滑移，並與第二Z軸向滑動件936B作Y軸向相對位移，使第一取放器931A靠合於第二取放器931B之另一側面，而可調整縮小第一、二取放器931A、931B之間距，再者，由於第四Z軸向滑動件936D係裝配於一可作水平角度擺動之傳動滑軌9351D上，當X軸向移動架940及Y軸向移動架943分別帶動間傳滑座9403作X-Y軸向位移時，該間傳滑座9403可於X軸向移動架940上作Y軸向位移，並以X軸向滑座9405沿Y軸向移動架943之X軸向滑軌9433作X軸向位移，以帶動第四Z軸向滑動件936D頂推傳動滑軌9351D作一擺動，第四Z軸向滑動件936D並以滑座9361D沿傳動滑軌9351D滑移，使得第四Z軸向滑動件936D可帶動第四取放器931D作X-Y軸向位移，即使得第四取放器931D相對於第二取放器931B作對角位移，使第四取放器931D靠合於第二取放器931B，而可調整縮小第二、四取放器931B、931D之間距，使得第一、二、三、四取放器931A、931B、931C、931D可作一相互靠合排列，而調整X-Y軸向之間距；請參閱第8、10、11圖，當調整第一、二、三、四取放器931A、931B、931C、931D之X-Y軸向間距完畢後，則可控制第一、二、三、四Z軸向馬達933A、933B、933C、933D各別驅動第一、二、三、四Z軸向皮帶輪組934A、934B、934C、934D，該第一Z軸向皮帶輪組934A即帶動第一傳動架935A及第一Z軸向滑動件936A作Z軸向位移，第一Z軸向滑動件936A則沿Z軸向滑座9432位移，而可帶動第一取放器931A作Z軸向位移，以於料盤501之容置槽502中取出電子元件100，而第二Z軸向皮帶輪組934B係帶動第二傳動架935B及第二Z軸向滑動件936B作Z軸向位移，第二Z軸向滑動件936B則可帶動第二取放器931B作Z軸向位移，用以取出電子元件100，該第三Z軸向皮帶輪組934C帶動第三傳動架935C及第三Z軸向滑動件936C作Z軸向位移，第三Z軸向滑動件936C則沿Z軸向滑座9402位移，而帶動第三取放器931C作Z軸向位移，用以取出電子元件100，而第四Z軸向皮帶輪組934D經第四傳動架935D及傳動滑軌9351D而帶動第四Z軸向滑動件936D作Z軸向位移，第四Z軸向滑動件936D則沿Z軸向滑座9404位移，而帶動第四取放器931D作Z軸向位移，用以取出電子元件100。Referring to Figures 6, 8, 9, and 10, in use, the first transfer arm 93 of the transport device 90 drives the first, second, third, and fourth pick and placers 931A, 931B, 931C, and 931D to be displaced. Above the tray 501 of the material device 50, and using the second pick-and-placer 931B as a reference member, the X-axis motor 938 and the Y-axis motor 941 are controlled to drive the X-axis pulley set 939 and the Y-axis pulley set 942, respectively. Actuation, the X-axis pulley set 939 drives the X-axis moving frame 940 to perform X-axis displacement, and the X-axis moving frame 940 drives the third Z-axis by the Z-axis slide 9402 and the intermediate slide 9403, respectively. The sliding member 936C and the fourth Z-axis sliding member 936D are X-axis displaced, and the intermediate sliding carriage 9403 is displaced by the X-axis sliding seat 9405 along the X-axis sliding rail 9433 of the Y-axis moving frame 943. The three-Z axial sliding member 936C is slidably bent by the tenon 9361C on the X-axis sliding slot 9351C of the third transmission frame 935C, and is axially displaced relative to the second Z-axis sliding member 936B, so that the third pick-and-place The 931C is fixed to the side of the second pick-and-placer 931B, and the distance between the second and third pick-and-placers 931B and 931C can be adjusted and reduced, and the Y-axis motor 941 drives the Y-axis pulley set 942 to actuate. The Y-axis pulley set 942 drives the Y-axis moving frame 943 to perform Y-axis displacement, and the Y-axis moving frame 943 drives the first Z-axis sliding by the Z-axis sliding seat 9432 and the intermediate sliding seat 9403, respectively. The piece 936A and the fourth Z-axis slide member 936D are displaced in the Y-axis direction, and the inter-slide slide 9403 is displaced in the Y-axis on the X-axis moving frame 940. The first Z-axis slide member 936A is convex. The 榫9361A slides on the Y-axis sliding slot 9351A of the first transmission frame 935A, and is axially displaced relative to the second Z-axis sliding member 936B, so that the first pick-and-placer 931A abuts against the second pick-and-placer The other side of the 931B can adjust and reduce the distance between the first and second pick-and-placers 931A, 931B. Furthermore, since the fourth Z-axis slide member 936D is mounted on a drive rail 9351D capable of horizontal angle swinging When the X-axis moving frame 940 and the Y-axis moving frame 943 respectively drive the intermediate sliding seat 9403 to perform XY axial displacement, the intermediate sliding seat 9403 can be displaced in the Y-axis on the X-axis moving frame 940. And X-axis displacement of the X-axis slide rail 9433 of the X-axis slide 9405 along the Y-axis moving frame 943 to drive the fourth Z-axis slide member 936D to push the transmission rail 9351D for swinging. The four Z-axis slides 936D are slid along the drive rails 9351D by the slides 9361D, so that the fourth Z-axis slides 936D can drive the fourth pick-and-placer 931D to perform XY axial displacement, that is, the fourth pick-and-placer The 931D is diagonally displaced relative to the second pick-and-placer 931B, so that the fourth pick-and-placer 931D is engaged with the second pick-and-placer 931B, and the distance between the second and fourth pick-and-placers 931B and 931D can be adjusted and reduced so that the first The second, third, and fourth pick-and-place devices 931A, 931B, 931C, and 931D can be arranged in a mutual arrangement, and the distance between the XY axes can be adjusted; see Figures 8, 10, and 11 when adjusting the first, second, and third After the XY axial spacing of the four pick and placeers 931A, 931B, 931C, and 931D is completed, the first, second, third, and fourth Z-axis motors 933A, 933B, 933C, and 933D can be controlled to drive the first and second, respectively. The three Z-axis pulley sets 934A, 934B, 934C, 934D, the first Z-axis pulley set 934A drives the first transmission frame 935A and the first Z-axis sliding member 936A for Z-axis displacement, the first Z The axial sliding member 936A is displaced along the Z-axis sliding seat 9432, and the first pick-and-placer 931A can be driven to be axially displaced to take the receiving groove 502 of the tray 501. The electronic component 100, and the second Z-axis pulley set 934B drives the second drive frame 935B and the second Z-axis slide 936B to perform Z-axis displacement, and the second Z-axis slide 936B can drive the second access The 931B is Z-axis displacement for taking out the electronic component 100. The third Z-axis pulley set 934C drives the third transmission frame 935C and the third Z-axis sliding member 936C to perform Z-axis displacement, and the third Z-axis. The sliding member 936C is displaced along the Z-axis sliding seat 9402, and drives the third pick-and-placer 931C for Z-axis displacement for taking out the electronic component 100, and the fourth Z-axis pulley set 934D passes through the fourth transmission frame 935D and The driving slide rail 9351D drives the fourth Z-axis sliding member 936D to perform Z-axis displacement, and the fourth Z-axis sliding member 936D is displaced along the Z-axis sliding seat 9404, and drives the fourth pick-and-placer 931D as the Z-axis. Displacement for taking out the electronic component 100.
請參閱第12、13、14圖，當第一移料臂93之複數個取放器931A、931B、931C、931D取出待測之電子元件100後，係移載至第一載具91處，由於供料裝置50之各容置槽502的X-Y軸向間距因不同電子元件而不同於第一載具91之定位槽911的X-Y軸向間距，該第一移料臂93則調整放大第一、二、三、四取放器931A、931B、931C、931D之X-Y軸向間距，於調整時，係控制X軸向馬達938經X軸向皮帶輪組939而驅動X軸向移動架940作X軸向向外位移，以及控制Y軸向馬達941經Y軸向皮帶輪組942而驅動Y軸向移動架943作Y軸向向外位移，其中，X軸向移動架940即以Z軸向滑座9402帶動第三Z軸向滑動件936C及第三取放器931C作X軸向向外位移，而調整放大第二、三取放器931B、931C之間距，該Y軸向移動架943則以Z軸向滑座9432帶動第一Z軸向滑動件936A及第一取放器931A作Y軸向向外位移，而調整放大第一、二取放器931A、931B之間距，又該X軸向移動架940及Y軸向移動架943可利用間傳滑座9403、第四Z軸向滑動件936D及傳動滑軌9351D而帶動第四取放器931D作X-Y軸向位移，即使得第四取放器931D相對於第二取放器931B作對角向外位移，而調整放大第二、四取放器931B、931D之間距，使得第一、二、三、四取放器931A、931B、931C、931D之X-Y軸向間距對應於第一載具91之定位槽911的X-Y軸向間距，而將待測之電子元件100放置於第一載具91上。Referring to the figures 12, 13, and 14, when the plurality of pick-and-place devices 931A, 931B, 931C, and 931D of the first transfer arm 93 take out the electronic component 100 to be tested, they are transferred to the first carrier 91. Since the XY axial spacing of each receiving slot 502 of the feeding device 50 is different from the XY axial spacing of the positioning slot 911 of the first carrier 91 due to different electronic components, the first moving arm 93 is adjusted to be enlarged first. The XY axial spacing of the second, third, and fourth pick and placeers 931A, 931B, 931C, and 931D, when adjusting, controls the X-axis motor 938 to drive the X-axis moving frame 940 to X through the X-axis pulley set 939. Displacement axially outward, and controlling the Y-axis motor 941 to drive the Y-axis moving frame 943 through the Y-axis pulley set 942 for Y-axis outward displacement, wherein the X-axis moving frame 940 is sliding in the Z-axis The seat 9402 drives the third Z-axis slide member 936C and the third pick-and-placer 931C to be X-axis outwardly displaced, and adjusts the distance between the second and third pick-and-placers 931B and 931C, and the Y-axis moving frame 943 is The Z-axis slide 9342 drives the first Z-axis slide 936A and the first pick-up 931A to be displaced outwardly in the Y-axis, and the first and second pick-and-place 931A and 931 are adjusted and enlarged. The distance between the B, the X-axis moving frame 940 and the Y-axis moving frame 943 can drive the fourth pick-and-placer 931D as XY by using the intermediate sliding seat 9403, the fourth Z-axis sliding member 936D and the transmission sliding rail 9351D. The axial displacement, that is, the fourth pick-and-placer 931D is diagonally displaced outward relative to the second pick-and-placer 931B, and the distance between the second and fourth pick-and-placers 931B and 931D is adjusted to be enlarged, so that the first, second, third, The XY axial spacing of the four pick and placeers 931A, 931B, 931C, and 931D corresponds to the XY axial spacing of the positioning slots 911 of the first carrier 91, and the electronic component 100 to be tested is placed on the first carrier 91.
請參閱第15圖，第一載具91係承載待測之電子元件100至測試裝置80之前方，第二移動臂95之各取放器951即於第一載具91之定位槽911中取出待測之電子元件100；請參閱第16圖，第二移動臂95之各取放器951係將待測之電子元件100移載至測試裝置80之各測試座82中，各測試座82即執行測試作業，並使測試電路板81將測試訊號傳輸至測試器，測試器再將測試結果傳輸至中央控制單元，此時，該第一載具91則復位承載下一待測之電子元件110；請參閱第17圖，於測試座82之測試作業完畢後，由於第一載具91已承載下一待測之電子元件110至測試裝置80之前方，該第二移動臂95之各取放器951則移動至第一載具91之上方，並取出下一待測之電子元件110，此時，第三移動臂96之各取放器961係位移至測試裝置80之上方，使各取放器961於各測試座82中取出完測之電子元件100；請參閱第18圖，第三移動臂96之各取放器961係將完測之電子元件100移載放置於第二載具92之定位槽921上，此時，第二移動臂95之各取放器951則將下一待測之電子元件110移載置入於測試裝置80之各測試座82內而接續執行測試作業；請參閱第19、20圖，第二載具92係載出完測之電子元件100，第四移動臂97係利用X軸向調整機構及Y軸向調整機構驅動調整放大第一、二、三、四取放器971A、971B、971C、971D之X-Y軸向間距對應於第二載具92之定位槽921的X-Y軸向間距，而取出完測之電子元件100；請參閱第21、22圖，第四移動臂97係將完測之電子元件100移載至收料裝置60之料盤601處，再利用X軸向調整機構及Y軸向調整機構驅動調整縮小第一、二、三、四取放器971A、971B、971C、971D之X-Y軸向間距對應於料盤61之容置槽602的X-Y軸向間距，並依測試結果(如良品電子元件、不良品電子元件或次級品電子元件)，而直接將完測之電子元件100置入於料盤601之各容置槽602中，以完成分類收置作業。Referring to FIG. 15 , the first carrier 91 carries the electronic component 100 to be tested to the front of the testing device 80 , and the pick-and-place 951 of the second moving arm 95 is taken out in the positioning slot 911 of the first carrier 91 . The electronic component 100 to be tested; referring to FIG. 16, each of the pick-and-place devices 951 of the second moving arm 95 transfers the electronic component 100 to be tested to each test socket 82 of the testing device 80, and each test socket 82 is The test operation is performed, and the test circuit board 81 transmits the test signal to the tester, and the tester transmits the test result to the central control unit. At this time, the first carrier 91 resets and carries the next electronic component 110 to be tested. Referring to FIG. 17, after the test operation of the test socket 82 is completed, since the first carrier 91 has carried the next electronic component 110 to be tested to the front of the test device 80, the second mobile arm 95 is placed and removed. The device 951 moves to the top of the first carrier 91 and takes out the next electronic component 110 to be tested. At this time, each of the pick-and-placers 961 of the third moving arm 96 is displaced above the testing device 80 to make each The receiver 961 takes out the tested electronic component 100 in each test socket 82; see Figure 18 Each of the pick-and-place devices 961 of the third moving arm 96 is placed on the positioning groove 921 of the second carrier 92 by the transfer of the electronic component 100, and the pick-and-placer 951 of the second moving arm 95 will The next electronic component 110 to be tested is placed in each test socket 82 of the testing device 80 to perform the test operation; please refer to FIGS. 19 and 20, and the second carrier 92 carries out the tested electronic component 100. The fourth moving arm 97 is driven and adjusted by the X-axis adjusting mechanism and the Y-axis adjusting mechanism. The XY axial spacing of the first, second, third, and fourth pick and placeers 971A, 971B, 971C, and 971D corresponds to the second load. The XY axial spacing of the positioning groove 921 of 92 is taken out, and the electronic component 100 is taken out; referring to FIGS. 21 and 22, the fourth moving arm 97 transfers the completed electronic component 100 to the receiving device 60. At the tray 601, the X-axis adjustment mechanism and the Y-axis adjustment mechanism are used to drive the adjustment and reduction. The XY axial spacing of the first, second, third, and fourth pick-and-placers 971A, 971B, 971C, and 971D corresponds to the tray 61. The XY axial spacing of the receiving slot 602, and according to the test results (such as good electronic components, defective electronic components or secondary electronics) Member), and direct measurement of the finished electronic component 100 placed in each receiving groove 602 of the material 601 in order to complete the job classification stowed.
據此，本發明可易於增設取放器，並更加調整縮小各取放器之X-Y軸向間距，以利取放電子元件，而大幅提升測試產能及作業便利性，實為一深具實用性及進步性之設計，然未見有相同之產品及刊物公開，從而允符發明專利申請要件，爰依法提出申請。Accordingly, the present invention can easily add a pick and place device, and further adjust and reduce the XY axial spacing of each pick and place device, so as to facilitate the electronic components, thereby greatly improving the test capacity and work convenience, which is practical. And the progressive design, but did not see the same products and publications open, thus allowing the invention patent application requirements, 提出 apply in accordance with the law.
10．．．供料裝置10. . . Feeding device
11．．．料盤11. . . Trays
20．．．收料裝置20. . . Receiving device
21．．．料盤twenty one. . . Trays
30．．．測試裝置30. . . Test device
31．．．測試電路板31. . . Test board
32．．．測試座32. . . Test stand
40．．．輸送裝置40. . . Conveyor
41．．．載具41. . . vehicle
42．．．第一移料臂42. . . First transfer arm
421．．．取放器421. . . Pick and place
421A．．．第一取放器421A. . . First pick and place
421B．．．第二取放器421B. . . Second pick and place
422．．．機架422. . . frame
423A．．．第一馬達423A. . . First motor
423B．．．第二馬達423B. . . Second motor
423C．．．第三馬達423C. . . Third motor
424A．．．第一Z軸向皮帶輪組424A. . . First Z-axis pulley set
424B．．．第二Z軸向皮帶輪組424B. . . Second Z-axis pulley set
425．．．掣動架425. . . Swing frame
4251．．．Y軸向滑槽4251. . . Y axial chute
426．．．滑動架426. . . Sliding frame
4261．．．凸榫4261. . . Convex
4262．．．Z軸向滑座4262. . . Z axial slide
427．．．傳動架427. . . Drive frame
4271．．．Z軸向滑軌4271. . . Z axial slide
428．．．Y軸向皮帶輪組428. . . Y axial pulley set
43．．．第二移料臂43. . . Second transfer arm
431．．．取放器431. . . Pick and place
50．．．供料裝置50. . . Feeding device
501．．．料盤501. . . Trays
502．．．容置槽502. . . Locating slot
60．．．收料裝置60. . . Receiving device
601．．．料盤601. . . Trays
602．．．容置槽602. . . Locating slot
70．．．空匣裝置70. . . Open device
80．．．測試裝置80. . . Test device
81．．．測試電路板81. . . Test board
82．．．測試座82. . . Test stand
90．．．輸送裝置90. . . Conveyor
91．．．第一載具91. . . First vehicle
911．．．定位槽911. . . Positioning slot
92．．．第二載具92. . . Second vehicle
921．．．定位槽921. . . Positioning slot
93．．．第一移料臂93. . . First transfer arm
931．．．取放器931. . . Pick and place
931A．．．第一取放器931A. . . First pick and place
931B．．．第二取放器931B. . . Second pick and place
931C．．．第三取放器931C. . . Third pick and place
931D．．．第四取放器931D. . . Fourth pick and place
932．．．Z軸向機架932. . . Z-axis rack
9321．．．X軸向滑軌9321. . . X axial slide
933A．．．第一Z軸向馬達933A. . . First Z axial motor
933B．．．第二Z軸向馬達933B. . . Second Z axial motor
933C．．．第三Z軸向馬達933C. . . Third Z axial motor
933D．．．第四Z軸向馬達933D. . . Fourth Z axial motor
934A．．．第一Z軸向皮帶輪組934A. . . First Z-axis pulley set
934B．．．第二Z軸向皮帶輪組934B. . . Second Z-axis pulley set
934C．．．第三Z軸向皮帶輪組934C. . . Third Z-axis pulley set
934D．．．第四Z軸向皮帶輪組934D. . . Fourth Z-axis pulley set
935A．．．第一傳動架935A. . . First drive frame
9351A．．．Y軸向滑槽9351A. . . Y axial chute
935B．．．第二傳動架935B. . . Second drive frame
935C．．．第三傳動架935C. . . Third drive frame
9351C．．．X軸向滑槽9351C. . . X axial chute
935D．．．第四傳動架935D. . . Fourth drive frame
9351D．．．傳動滑軌9351D. . . Drive rail
936A．．．第一Z軸向滑動件936A. . . First Z axial slide
9361A．．．凸榫9361A. . . Convex
936B．．．第二Z軸向滑動件936B. . . Second Z axial slide
936C．．．第三Z軸向滑動件936C. . . Third Z axial slide
9361C．．．凸榫9361C. . . Convex
936D．．．第四Z軸向滑動件936D. . . Fourth Z axial slide
9361D．．．滑座9361D. . . Slide
937．．．Y軸向機架937. . . Y axial frame
9371．．．第二Z軸向滑座9371. . . Second Z axial slide
9372．．．Y軸向滑軌9372. . . Y axial slide
938．．．X軸向馬達938. . . X-axis motor
939．．．X軸向皮帶輪組939. . . X-axis pulley set
940．．．X軸向移動架940. . . X-axis moving frame
9401．．．X軸向滑座9401. . . X axial slide
9402．．．Z軸向滑座9402. . . Z axial slide
9403．．．間傳滑座9403. . . Interspersed slide
9404．．．Z軸向滑座9404. . . Z axial slide
9405．．．X軸向滑座9405. . . X axial slide
941．．．Y軸向馬達941. . . Y axial motor
942．．．Y軸向皮帶輪組942. . . Y axial pulley set
943．．．Y軸向移動架943. . . Y-axis moving frame
9431．．．Y軸向滑座9431. . . Y axial slide
9432．．．Z軸向滑座9432. . . Z axial slide
9433．．．X軸向滑軌9433. . . X axial slide
95．．．第二移料臂95. . . Second transfer arm
951．．．取放器951. . . Pick and place
96．．．第三移料臂96. . . Third transfer arm
961．．．取放器961. . . Pick and place
97．．．第四移料臂97. . . Fourth transfer arm
971．．．取放器971. . . Pick and place
100、110．．．電子元件100, 110. . . Electronic component
第1圖：習式電子元件測試分類機各裝置之配置示意圖。Figure 1: Schematic diagram of the configuration of each device of the analog electronic component test classification machine.
第2圖：習式移料裝置之外觀圖。Figure 2: Appearance of the conventional material transfer device.
第3圖：習式移料裝置之側視圖。Figure 3: Side view of the conventional shifting device.
第4圖：本發明電子元件測試分類機各裝置之配置示意圖。Fig. 4 is a schematic view showing the arrangement of each device of the electronic component test sorting machine of the present invention.
第5圖：本發明移料裝置之示意圖。Figure 5: Schematic diagram of the material transfer device of the present invention.
第6圖：本發明移料裝置之另一角度示意圖。Figure 6 is a schematic view showing another angle of the material transfer device of the present invention.
第7圖：本發明移料裝置之仰視圖。Figure 7: A bottom view of the transfer device of the present invention.
第8圖：本發明測試分類機之使用示意圖(一)。Figure 8: Schematic diagram of the use of the test sorter of the present invention (1).
第9圖：係第一移料臂調整縮小各取放器間距之使用示意圖。Figure 9: Schematic diagram of the use of the first transfer arm to adjust and reduce the spacing of each pick and place.
第10圖：係第一移料臂調整各取放器間距之仰視圖。Figure 10: A bottom view of the first transfer arm adjusting the spacing of each pick and place.
第11圖：係第一移料臂之各取放器取料示意圖。Figure 11 is a schematic diagram of the pick-and-place of each pick-and-place device of the first transfer arm.
第12圖：本發明測試分類機之使用示意圖(二)。Figure 12: Schematic diagram of the use of the test sorter of the present invention (2).
第13圖：係第一移料臂調整放大各取放器間距之使用示意圖。Figure 13: Schematic diagram of the use of the first transfer arm to adjust the magnification of each pick and place.
第14圖：係第一移料臂調整各取放器間距之仰視圖。Figure 14: A bottom view of the first transfer arm adjusting the spacing of each pick and place.
第15圖：本發明測試分類機之使用示意圖(三)。Figure 15: Schematic diagram of the use of the test sorter of the present invention (3).
第16圖：本發明測試分類機之使用示意圖(四)。Figure 16: Schematic diagram of the use of the test sorter of the present invention (4).
第17圖：本發明測試分類機之使用示意圖(五)。Figure 17: Schematic diagram of the use of the test sorter of the present invention (5).
第18圖：本發明測試分類機之使用示意圖(六)。Figure 18: Schematic diagram of the use of the test sorter of the present invention (6).
第19圖：本發明測試分類機之使用示意圖(七)。Figure 19: Schematic diagram of the use of the test sorter of the present invention (7).
第20圖：係第二移料臂調整各取放器間距之仰視圖。Figure 20: A bottom view of the second transfer arm adjusting the spacing of each pick and place.
第21圖：本發明測試分類機之使用示意圖(八)。Figure 21: Schematic diagram of the use of the test sorter of the present invention (8).
第22圖：係第二移料臂調整各取放器間距之仰視圖。Figure 22: A bottom view of the second transfer arm adjusting the spacing of each pick and place.
50．．．供料裝置50. . . Feeding device
501．．．料盤501. . . Trays
502．．．容置槽502. . . Locating slot
60．．．收料裝置60. . . Receiving device
601．．．料盤601. . . Trays
602．．．容置槽602. . . Locating slot
70．．．空匣裝置70. . . Open device
80．．．測試裝置80. . . Test device
81．．．測試電路板81. . . Test board
82．．．測試座82. . . Test stand
90．．．輸送裝置90. . . Conveyor
91．．．第一載具91. . . First vehicle
911．．．定位槽911. . . Positioning slot
92．．．第二載具92. . . Second vehicle
921．．．定位槽921. . . Positioning slot
93．．．第一移料臂93. . . First transfer arm
931．．．取放器931. . . Pick and place
95．．．第二移料臂95. . . Second transfer arm
951．．．取放器951. . . Pick and place
96．．．第三移料臂96. . . Third transfer arm
961．．．取放器961. . . Pick and place
97．．．第四移料臂97. . . Fourth transfer arm
971．．．取放器971. . . Pick and place
Claims (9)
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| TW99106475A TWI399543B (en) | 2010-03-05 | 2010-03-05 | Testing and classifying machine for electronic elements |
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| TW99106475A TWI399543B (en) | 2010-03-05 | 2010-03-05 | Testing and classifying machine for electronic elements |
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|---|---|---|---|---|
| TW201407171A (en) * | 2012-08-10 | 2014-02-16 | Hon Tech Inc | Electronic component testing and classification equipment |
| TW201412620A (en) * | 2012-09-28 | 2014-04-01 | Hon Tech Inc | Electronic component pick up unit and test equipment applying same |
| KR101942062B1 (en) * | 2012-11-21 | 2019-01-24 | (주)테크윙 | Pick and place apparatus for test handler |
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| TWI474016B (en) * | 2013-07-05 | 2015-02-21 | Hon Tech Inc | Lightweight correction unit and its application equipment |
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Also Published As
| Publication number | Publication date |
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| TW201131170A (en) | 2011-09-16 |
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