TWI364545B - Switched type measurement system for measuring resistance value and voltage resisting value of tested duty - Google Patents

Description

1364545 九、發明說明： 【發明所屬之技術領域】 ^發明係關於-種切換式檢測系統，特別是指一種 二给:貝!,少一待測物件之一阻抗值與一耐壓值之切 換式檢測系統。 【先前技術】 ，現有之電子零配件完成部份或全部之製作程序 進’ ：：了確保其品質符合特定之安全規範或產品規格標 ，Li都必須對其進行特定之電性檢測。尤其對於馬 ί、發電機等利用電磁轉換原理而運作之電子零 -而§，通常都會具備感應線圈。 雪3於Ϊ備感應線圈’就·⑤達、風扇、發電機等電子 5常都會就阻抗、耐壓以及層間（各線圈 曰B 、堅等三項檢測項目進行檢測。其原因詳述如下： ^ p' 為了確涊線圈品質的良窥，並確認線圈各區 圈）具備良好的平衡度，因此要進行（各區域線 圈）阻抗值的檢測。 Λ ^ 曰不^一，為了確認馬達、風扇、發電機等電子零配件 品規格標準所規範之高壓 若干於包覆於線圈外的漆包線本身可能會存在 孔，同時，在纏繞漆包線或是喊馬達、 漆包複^鱗電子零配狀加I過財，可能會發生 漆線剥洛之情況，因此’必須進行層間耐壓檢測^ 5 1364545 【發明内容】 本發明所欲解決之技術問題與目的： 综觀以上所述，在習知技 式將彼此獨立之阻抗檢測:壓線的方 成檢測工作線的緣故檢=置以耐 本發明之主要目的在於提2於此， 統可獨立設置於單一裝置中，利用^统，該系 物件分別進行用阻抗值檢測與高壓值檢^式來對待測 阻抗值檢測與高壓值檢測之外，亦可利：二別 方式來對同—待測物件進行層間耐壓測切換的 本發明解決問題之技術手段： 參 係』=以之技術手段 物件之-阻抗值與一耐=，該測 微處理單元接收―在 抗值時，微處理單元係傳送出—切表^測阻 項目，f，使阻抗檢測 件電r生連通’藉以檢測阻抗值；當 :’、j物 換信號== 換開關而傳送至待凜’，==== 7 述各元件可設置在一主檢測裝置中。 在本發明較佳實施例中，切換式檢測系統更包含一 二間耐壓檢測單元，藉以檢測該待測物件之一層間耐壓 層間耐壓檢測單元係電性連通該檢測項目切換電 /、中，當該操作信號係代表檢測該層間耐壓值時， 理單兀係傳送出該切換信號以接通（Switch Off) =ί Γ刀換開關，使該層間耐壓檢測單元電性連通於 ，層間耐壓檢測單元不僅可内建於上述 以外亦可另外設置於一外接檢測裝置中， 以外接方式與主檢測裝置電性連通。 本發明對照先前技術之功效： =裝ί時料微控制單元係依據操作信號ί發送= Μ，以對待測物件切換進行阻抗值、 換 耐壓值等檢測。因此，只需要單 間 時完成上述三項檢測。顯而易見地，本==可同 =測予置本身所佔用的空間，藉以節：， 的是’本發明更可節省搭接待測物件; 有效節省進行上述三項 及圖體實施例’將藉由以下之實施例 【實施方式】 由於本發明所提供之切換式檢測系統， 可廣泛 壤 1364545 值等檢測，、m件進行阻抗值、耐壓值或層間耐壞 電路…十卜：：依據待測物件之特質與量測範圍，而在 f 舉，故在此不再--贅述，僅列ί其c 的兩個實施例來加以具體說明。 較 路功其係顯示本發明第-實施例之電 月匕万塊不思圖。如圖所示，一电 =系用以對三待測物件_、4()ΰ與' i::統 行阻抗值、鳴或層間耐難等檢洌。二 式檢測糸統200包含一人機介面2、 換 -檢測項目切換電路4、一電力，理3、 與一層間耐騎測Ϊ元t 7、—阻抗檢測迴路8 微處理單元3係轉接於人機介面2，並 項i切換電路4、電力供應單元5、電粬則 檢知單元7以及層間耐驗測單元 遠電路 3，目_電路4係與電力供應單元5 ^^ ^ 6、共用檢知單元7、阻抗檢測迴路8 =切 耐昼檢測單元9電性連通。電力供及層間 ，高電壓源。電力輸_奐電路;y為一交/ 阻抗檢測迴路8、待測物件·、彻與卿紐連通於 至少一使用者（未標示）可利用八 輸入至微處理單元3，在微處理單以::操 力供應單元5供應—檢 5 ’使電 ，作:號係代表檢測待測物件= 至>、一者之阻抗值時，微處理單元 二00中之 以接通（Switch On )檢測項目切換、g刀^言說 目切換開關叫標示於第三圖)，使阻=¾ 136454^ ί待測物件300、400與500中之至少一者電性連通， =以利用阻抗檢測迴路8來檢測待測物件3〇〇、4〇〇與 500中之至少一者之阻抗值。 右操作彳§號係代表檢測待測物件、4〇〇與500 至少一者之耐壓值時，微處理單元3係傳送出'切換 =:以切斷（Switch 〇ff)檢測項目切換電路4内之檢 二:目:丨：切換開關S 41 (標示於第三圖），使檢測電力經由 目切換開關S41而傳送至待測物件3〇〇、400與 之至少一者，藉以檢測待測物件300、400與500 之至J 者之耐壓值。 若操作“號係代表檢測待測物件300、400盘500 者之層間耐壓值時，微處理料3係^送出 =;以切斷（SWitCh 〇ff)檢測項目切換電路4内 SI 開關S41(標示於第三圖 >使層_壓 =兀9電性連通於待測物件3〇〇、4〇〇與5⑻中之 一者，藉以檢測待測物件3〇〇、4〇〇盥5〇 〉 '一者之層間耐壓值。 ^ 更輕屬技術領域巾具有通常知識者能夠 技術之電路圖。請夫閱第一 R^下將進頻路上述 係顯示太二岔第二圖與第四圖，其中，第三圖 顯示本發明第—f餘丨夕穿' 心桃圖，第四圖係 併參閱第二圖。：分電路圖。同時，請- 單元3、给、胃丨5圖所不，上述之人機介面2、微處理 早兀3檢測項目切換電路4、 出切換電路6、丑用拾知留_ Λ刀供應早70 5、電力輸 置於-主檢測裝置7與阻抗檢測迴路8係設 介面CP1，連^介面CP1檢測裝置D1具備一連接 為一 RS232tt埠 輕接於微處理單元3，並可 'i 1364545 檢測項目切換電路4包含檢測項目切換開關so以 及六個開關S42、S43、S44、S45、S46盥S47 ;其中， 開關S44為高壓開關，開關S42、S45與S46為低'壓開 關，開關S43為（高壓）層間耐壓控制開關，開關S47 為（低壓）層間耐壓控制開關。電力輸出切換電路6包 含十八個切換開關S60卜S618、八個輸出端子'J62i〜j628 以及一低壓端子J629。其中，切換開關S6〇1為高壓 出控制切換開關，切換開關S602為低壓輸出控制切換 開關。切換開關S603〜S618係分別兩兩耦接於輸出端子 =21〜J628。輸出端子】62卜腿係分難接於待測物件 300、400與500之一端，輸出端子J627與j628係妓同 耦接於待測物件300、400與500之另一端。低壓 J629係耦接於（低壓層間财壓控制）開關。 共用檢知單元7包含一分壓器71、一阻抗 72、一電流檢知器73與一類比/數位轉換器7 = 測迴路8包含-阻抗信號源81，藉以發送出一阻抗$ 來檢測阻抗值。各相關元件之配置與搭接關鱗如二 圖所不。 一 層間耐壓檢測單元9係設置於-外接檢測 内，外接檢測裝置D2具備一連接介面cp2，連^ CP2可與連接介面⑵相互連通，並 接槔。層間耐壓檢測單元9包含—人機介面91、 理控制器92、-直流電力供應單元93、 ^ -取樣元件95、一測試波形記錄元件96以二、 97。儲能元件94通常可為—電容ϋ。各㈣ 置與搭接關係詳如第四圖所示。 _件之配 的是，在使用者可利用人機介面2或91 /刀別將代表核測待測物件300、4〇〇盥5〇〇 ^丨、 者之層f树壓值之操作信號輸人至微處理單元^ 111364545 IX. Description of the invention: [Technical field to which the invention pertains] ^Inventive system relates to a type of switching detection system, in particular to a type of two-feed: shell!, switching between one impedance value and one withstand voltage value of one object to be tested Detection system. [Prior Art] Existing electronic parts complete some or all of the production procedures. Please ensure that the quality meets the specific safety specifications or product specifications. Li must perform specific electrical testing. Especially for electronic zeros that operate on the principle of electromagnetic conversion, such as horses and generators, and §, usually have induction coils. Snow 3 is equipped with induction coils. '5·5, fans, generators, etc. 5 are often tested for impedance, withstand voltage, and between layers (each coil 曰B, firm, etc.). The reasons are as follows: ^ p' In order to confirm the good quality of the coil and confirm that the coils have a good balance, it is necessary to detect the impedance value of each coil. Λ ^ 曰不一一, in order to confirm the high voltage specified in the specifications of motors, fans, generators and other electronic components, there may be holes in the enameled wire itself wrapped around the coil, and at the same time, winding the enameled wire or shouting motor漆 漆 ^ 鳞 鳞 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 漆 漆 漆 漆 漆 漆 漆 漆 漆 漆 漆 漆 漆 漆 漆 漆 漆 漆 漆 漆 漆 漆 漆 漆 漆 漆 漆 漆 漆 漆 漆: Looking at the above, in the conventional technique, the impedance detection is independent of each other: the detection of the working line of the crimping line is detected. The main purpose of the invention is to provide a second purpose, which can be independently set in In a single device, the system uses the impedance value detection and the high-voltage value detection method to measure the impedance value detection and the high-voltage value detection separately, and can also benefit: the two-way way to the same-to-be-tested object The technical means for solving the problem by performing the inter-layer withstand voltage switching: the parameter 』=the technical means of the object-impedance value and one resistance=, the micro-processing unit receives the ―in the anti-value, the micro-processing single Send out the - cut table ^ resistance test item, f, so that the impedance detection piece is electrically connected to 'by detecting the impedance value; when: ', j material change signal == change the switch and send it to wait', ==== 7 The components can be arranged in a main detecting device. In a preferred embodiment of the present invention, the switching detection system further includes one or two withstand voltage detecting units, thereby detecting that one of the inter-layer withstand voltage between the test object and the withstand voltage detecting unit is electrically connected to the detecting item to switch electricity/, When the operation signal is representative of detecting the inter-layer withstand voltage value, the control unit transmits the switching signal to turn on (Switch Off) = Γ 换 换 change switch, so that the interlayer withstand voltage detecting unit is electrically connected to The interlayer withstand voltage detecting unit may be provided not only in the above but also in an external detecting device, and the external detecting device is electrically connected to the main detecting device. The present invention compares the effects of the prior art: = 装 时 微 微 微 微 微 微 微 微 微 微 微 微 微 微 微 微 微 微 微 微 微 微 微 微 微 微 微 微 微 微 微 微 微 微 微 微Therefore, it is only necessary to complete the above three tests in a single room. Obviously, this == can be the same as = the space occupied by the test itself, by the section:, the 'the invention can save the receiving test object; the effective saving of the above three and the figure embodiment' will be borrowed The following embodiments [Embodiment] Since the switching detection system provided by the present invention can detect a wide range of 1364545 values, and the m pieces are subjected to impedance values, withstand voltage values or interlayer resistance circuits. The characteristics and measurement range of the object are measured, but they are not mentioned here, and only two embodiments of c are specifically described. Compared with the road function, the electric moon of the first embodiment of the present invention is shown. As shown in the figure, an electric = is used to check the impedance values, sound or inter-layer resistance of the three objects to be tested _, 4 () and 'i::. The two-type detection system 200 includes a human-machine interface 2, a change-detection item switching circuit 4, an electric power, a rationality 3, and an inter-layer resistance test unit t7, an impedance detection circuit, and a micro-processing unit 3 Man-machine interface 2, parallel i switching circuit 4, power supply unit 5, power detection unit 7 and interlayer resistance test unit remote circuit 3, and the circuit 4 is shared with the power supply unit 5^^^6 The detecting unit 7 and the impedance detecting circuit 8 = the cut resistance detecting unit 9 are electrically connected. Power supply and interlayer, high voltage source. Power transmission _ 奂 circuit; y is an intersection / impedance detection loop 8, the object to be tested ·, and the singular connection with at least one user (not labeled) can use eight inputs to the micro-processing unit 3, in the micro-processing single :: Operation supply unit 5 supply - check 5 'Enable electricity, make: the number represents the detection of the object to be tested = to >, one of the impedance values, the microprocessor unit is turned on in the second (Switch On) The detection item is switched, the g-switch is called the third switch, and the resistance is set to be electrically connected to at least one of the objects to be tested 300, 400 and 500, and the impedance detection circuit 8 is utilized. The impedance value of at least one of the objects to be tested 3〇〇, 4〇〇, and 500 is detected. The right operation 彳§ represents the detection of the withstand value of at least one of the object to be tested, 4〇〇 and 500, and the microprocessor unit 3 transmits a 'switch=: to cut (Switch 〇ff) detection item switching circuit 4 In the second check: 目: 切换: switch S 41 (labeled in the third figure), so that the detected power is transmitted to the object to be tested 3 〇〇, 400 and at least one of them via the target switch S41, thereby detecting the test The withstand voltage values of the objects 300, 400 and 500 to J. If the operation "represents the detection of the inter-layer withstand voltage value of the object to be tested 300, 400, 500, the micro-processing material 3 is sent out =; the SI switch S41 in the item switching circuit 4 is detected by the cut-off (SWitCh 〇 ff) ( Marked in the third figure > layer _ pressure = 兀 9 is electrically connected to one of the objects to be tested 3 〇〇, 4 〇〇 and 5 (8), thereby detecting the object to be tested 3 〇〇, 4 〇〇盥 5 〇 〉 'The resistance between the layers of one. ^ Lighter technical field towel has a circuit diagram that can be technically used by the general knowledge. Please read the first R^ will enter the frequency road. The above system shows too second, second and fourth In the figure, the third figure shows the first-female of the present invention, and the fourth figure is attached to the second figure. The circuit diagram is divided. At the same time, please - unit 3, give, stomach sputum 5 No, the above-mentioned human-machine interface 2, micro-processing early detection device 4 switching circuit 4, output switching circuit 6, ugly pick-up _ 供应 供应 supply early 70 5, power transmission-main detection device 7 and impedance detection The circuit 8 is provided with an interface CP1, and the interface CP1 detecting device D1 has a connection as an RS232tt, which is lightly connected to the micro processing unit 3, and can be 'i 1364545 The detection item switching circuit 4 includes a detection item switching switch so and six switches S42, S43, S44, S45, S46盥S47; wherein, the switch S44 is a high voltage switch, the switches S42, S45 and S46 are low 'pressure switches, and the switch S43 is (High voltage) interlayer pressure control switch, switch S47 is a (low voltage) interlayer pressure control switch. The power output switching circuit 6 includes eighteen switch S60, S618, eight output terminals 'J62i to j628, and one low voltage terminal J629. The switch S6〇1 is a high-voltage output control switch, and the switch S602 is a low-voltage output control switch. The switch S603~S618 are respectively coupled to the output terminal=21~J628. The output terminal is 62 It is difficult to connect to one end of the object to be tested 300, 400 and 500, and the output terminals J627 and j628 are coupled to the other end of the object to be tested 300, 400 and 500. The low voltage J629 is coupled to (low voltage inter-layer financial control) The common detection unit 7 includes a voltage divider 71, an impedance 72, a current detector 73 and an analog/digital converter 7 = the measurement circuit 8 includes an impedance signal source 81, thereby transmitting an impedance $ To detect the impedance value, the configuration of each related component and the overlapping scale are as shown in the second figure. The inter-layer withstand voltage detecting unit 9 is set in the external detection, and the external detecting device D2 has a connection interface cp2, and the CP 2 can be connected. The interface (2) is connected to each other and connected to each other. The inter-layer withstand voltage detecting unit 9 includes a human-machine interface 91, a controller 92, a DC power supply unit 93, a sampling component 95, and a test waveform recording component 96. . The energy storage element 94 can typically be a capacitor. The relationship between each (4) and the lap is as shown in the fourth figure. _ The component is equipped with the human-machine interface 2 or 91 / knife to represent the operation signal of the layer f tree pressure value of the object to be tested 300, 4〇〇盥5〇〇^丨Input to the microprocessor unit ^ 11

V/U 吁 J 理控制器92後，可驻士、垂杜人工t > =理單元=控= k遽能同步更新並隨時保持吻合。收之麵作 將進ίίίίίΐ靜態配置與搭接關係的描述後，以下 物件3〇ί、°_盘^例中’如何實現對待測 層間耐驗等測試 切換進行阻抗值、耐錄或 ;具3昼；行==== = :ΐ£Γ:==號在:== 出切換電路6。檢測項目切換電路4在接收切 ，會接通（SWltCh〇n)檢測項目切換開關S41， 開關S_6。同時，電力輸出： 關電===S6f8接通一)切換開 此日寸，阻抗信號源81所發送出之阻抗信號4产 =則物件300與阻抗檢知n 72 α產生—贱檢知After V/U calls the controller 92, it can be relocated, and the manual can be synchronized and updated at any time. After receiving the description of the static configuration and the splicing relationship, the following objects 3〇ί,°_盘^examples, how to achieve the test switch between the test layers, such as resistance value, resistance record or;昼; Line ==== = :ΐΐ:==号 at:== Exit circuit 6. The detection item switching circuit 4 turns on (SWltCh〇n) the detection item changeover switch S41 and the switch S_6. At the same time, the power output: turn off the power ===S6f8 turn on a) switch open this day, the impedance signal source 81 sent out the impedance signal 4 production = then the object 300 and the impedance detection n 72 α generated - 贱 detection

iti知信號經由類比/數位轉換器74數位化後，會。傳U 阻抗值。同時，電流檢知器73 ίϊΐ 74叙，檢知信號’電流檢知信號經由類比/數位轉λ哭 4數位化後，會傳送至微處理單元3，並在微處理單二 二解析出一電流值，以對計算出之阻抗值做進一步= 請繼續參閱第六圖’其係顯示本發明第一實施例對 12 1364545 具低阻抗之待測物件進行阻抗值檢測之方 不二當使用者經由人機介面2輸入操作信號，二 之操作信號係代表檢測具備低阻抗（^ ^ 試值）之待測物件姻阻抗值時，在 ffi乍信號後，會傳送出切換信號至檢測項目切換=Once the signal is digitized via the analog/digital converter 74, it will. Pass the U impedance value. At the same time, the current detector 73 ϊΐ 74, the detection signal 'current detection signal is digitized via the analog/digital turn λ crying 4, is transmitted to the micro processing unit 3, and a current is resolved in the micro processing single two two Value, in order to further calculate the impedance value = Please continue to refer to the sixth figure, which shows that the first embodiment of the present invention performs the impedance value detection on the object with the low impedance of 12 1364545. The man-machine interface 2 inputs the operation signal, and the second operation signal represents the detection of the impedance value of the object to be tested with the low impedance (^^ test value). After the ffi乍 signal, the switching signal is transmitted to the detection item switching=

:，力輸出切換電路6。檢測項目切換電路4在J ^，^^接^㈤滅叫檢測項目切換開關:, force output switching circuit 6. The detection item switching circuit 4 is connected to the control item switching switch in J^, ^^^(5)

同時mi關’與（低壓）開關祕。 ，時·’，力輸出娜電路6在接收切換信號後， (SwitchOn)切換開關 S6〇3 與 S616。 ，時，阻抗信號源81所發送出之 g 72 料生知^ ί=浐气由類比/數位轉換器74數位化後，會傳送 微處理早疋3 ’並在微處理單元3中（ if 3〇0之阻抗值。同時，電流檢知器73亦Ϊ產 74 崎位轉換器At the same time mi off 'and low voltage switch secret. When the time output circuit 6 receives the switching signal, (SwitchOn) switches S6〇3 and S616. At the time, the impedance signal source 81 sends out the g 72 material to know that ^ 浐 = helium is digitized by the analog/digital converter 74, and the micro-processing is transmitted 3 ' and in the micro-processing unit 3 (if 3阻抗0 impedance value. At the same time, current detector 73 also produces 74-slot converter

待測參閱苐七圖、，其係顯示本發明第—實施例對 瘦由人機值制之方式。如圖所^，當使用者 代表檢、輸人操作信號，且所輸人之操作信號係 元1垃/、物件300與400之耐壓值時，在微處理單 切換作信號後，會傳送出切換信號至檢測項目 、 電力輸出切換電路6。檢測項目切換電路 換ηΪ t換信號後，會切斷（Switch0ff)檢測項目切 n J。同時，電力輸出切換電路6在接收切換信 i 。曰接通（SWitCh 〇n)切換開關編1、S6〇2、S603For reference, see Fig. 7, which shows the manner in which the first embodiment of the present invention is based on the human value system. As shown in the figure, when the user represents the check and input operation signals, and the input signal of the input signal is 1 or /, and the withstand voltage values of the objects 300 and 400, the data is transmitted after the micro-processing unit switches the signal. The switching signal is output to the detection item and the power output switching circuit 6. Detection item switching circuit After changing the signal of ηΪ t, it will cut off (Switch0ff) detection item cut n J. At the same time, the power output switching circuit 6 is receiving the switching signal i.曰Connect (SWitCh 〇n) switch switch 1, S6 〇 2, S603

1313

丄J叶J 丄J叶J 此時，電力供應單元5 二力！70 5所發送出之檢測電力會流丄J leaf J 丄J leaf J At this time, the power supply unit 5 is two! 70 5 detected power flow

以對計算出之耐壓值做進 出一低電壓，低電壓經由類; 後，會傳送至微處理單元3， 一步之補正。 翻^_^圖，其侧示本發明第—實施例對 ^物件進行賴耐壓值檢狀方式。同時，請-併來 閱苐三圖與第四圖。如圖所示，當使用者經由人機介面 5 1輸入操作信號，且所輸入之操作信號係代表檢測 f測物件300之層間耐壓值時，在微處理單元3接收到 操作L號後，會傳送出切換信號至檢測項目切換電路4 與，力輸出切換電路6。檢測項目切換電路4在接收切 換“號後’會切斷（Switch Off)檢測項目切換開關S41， 並且接通（高壓層間耐壓控制）開關S43與（低壓層間 耐壓控制）開關S47。同時，電力輸出切換電路6在接 收切換信號後，會接通（Switch On)切換開關S601、 S602、S603與S 618。因此，層間耐壓檢測單元9會經 由檢測項目切換電路4、電力輸出切換電路6而與；4測 物件電性連通。 此時，直流電力供應單元93會對儲能元件94進行 充電，當儲能元件94所累積之電能達到一標準檢測電 能時，微處理控制器92會傳送出一切換信號以接通放 電開關97 ’此時，儲能元件94會釋放出標準檢測電能， 取樣元件95會一直不斷擷取儲能元件94釋放標準檢測 電能後所產生之電性參數震盪波形（如電壓震盪波In order to make a low voltage to the calculated withstand voltage value, the low voltage is passed through the class; after that, it is transmitted to the micro processing unit 3, and is corrected in one step. Turning on the figure, the side view of the first embodiment of the present invention is used to check the value of the article. At the same time, please - and read the three and fourth pictures. As shown in the figure, when the user inputs an operation signal via the human machine interface 51, and the input operation signal represents the detection of the inter-layer withstand voltage value of the f-test object 300, after the micro-processing unit 3 receives the operation L number, A switching signal is transmitted to the detection item switching circuit 4 and the force output switching circuit 6. The detection item switching circuit 4 turns off the (Switch Off) detection item changeover switch S41 after receiving the switching "number", and turns on (high-voltage inter-layer withstand voltage control) switch S43 and (low-voltage inter-layer withstand voltage control) switch S47. After receiving the switching signal, the power output switching circuit 6 turns on (Switch On) the switches S601, S602, S603, and S 618. Therefore, the interlayer withstand voltage detecting unit 9 passes the detection item switching circuit 4 and the power output switching circuit 6 The electronic power supply unit 93 charges the energy storage element 94. When the energy accumulated by the energy storage element 94 reaches a standard detection power, the microprocessor controller 92 transmits A switching signal is output to turn on the discharge switch 97'. At this time, the energy storage element 94 releases the standard detection power, and the sampling element 95 continuously draws the electrical parameter oscillation waveform generated by the energy storage element 94 after releasing the standard detection power. (such as voltage shock wave

<' X 14 1364545<' X 14 1364545

藉由連接介面CP2與CPI 送至微處理單元3。 思锻或暫存器）所預 以解析出一層間耐壓值。在 耐壓值的解析工作之後，可 而將所解析之層間耐壓值傳It is sent to the micro processing unit 3 through the connection interface CP2 and CPI. The forging or the scratchpad is pre-solved to interpret the inter-layer withstand voltage. After the analysis of the withstand voltage value, the inter-layer withstand voltage value can be analyzed

一層間耐壓檢測單元9,包含一儲能元件91，、一取 料一測试波形記錄几件93’與一放電開關94,。 配置與搭接關係詳如第九圖所示。顯而易 發明第二實施例中’係將第-實施例中之人 ^^ 9卜微處理控制器92與直流電力供應單元％ ^功此为別融入人機介面2、微處理單元3與電力供應 單元5。因此’可進一步將層間耐壓檢測單忑9,内； ^•述之主檢測裝置D1中。惟在檢測待測物件3〇〇、4的 二H中之至少—者之層間耐壓值時，電力供應單元5 所供應之檢測電力必須為直流電。 舉凡在所述技術領域中具有通常知識者皆能輕 本發明第二實施例中，由於更進一步將層間耐 壓核測皁元9,内建於主檢測裝置D1中；因此，只需要 部主檢測裝置D1即可對待測物件3〇〇、4〇〇與5〇〇 之至少一者切換進行阻抗值、耐壓值或層間耐壓值等檢 15 1364545 ^顯而易見地，本發明確實不僅可有效節省檢測 本身所佔用的空間，藉以節省空間成本；更重要的 本發明更可節省搭接待測物件所需之時間與人力，因此 y進一步有效節省進行上述三項檢測所需之 力成本。 ^八 藉由上述之本發明實施例可知，本發明確具產業 亡之利用價值。惟以上之實施例說明，僅為本^明之 =佳實施例說明，舉凡所屬技術領域中具有通常知識 考當可依據本發明之上述實施例說明而作其它種種 之改良及变化。然而這些依據本發明實施例所作的種 ，改良及變化，當仍屬於本發明之發明精神及界定之 專利範圍内。 【圖式簡單說明】 第一圖係顯示在習知技術中對一待測物件進行阻抗、耐 壓以及層間耐壓等檢測之檢測技術； 第二圖係顯示本發明第—實施例之電路功能方塊示意 圖， 第三圖係顯示本發明第一實施例之第一部分電路圖； 第四圖係顯示本發明第一實施例之第二部分電路圖； 第五圖係顯示本發明第一實施例對具高阻抗之待測物 件進行阻抗值檢測之方式； 第六圖係顯示本發明第一實施例對具低阻抗之待測物 件進行阻抗值檢測之方式； 第七圖係顯示本發明第一實施例對待測物件進行耐壓 值檢測之方式； 16 1364545 5 電力供應單元 6 電力輸出切換電路 S601 (高壓輸出控制）切換開關 S602 (低壓輸出控制）切換開關 S603〜S618 切換開關 ； J621 〜J628 輸出端子 J629 低壓端子 7 共用檢知單元 71 分壓器 72 阻抗檢知器 73 電流檢知器 74 類比/數位轉換器 8 阻抗檢測迴路 81 阻抗信號源 9 > 9， 層間财塵檢測單元 91 人機介面 92 微處理控制器 93 直流電力供應單元 94、91， 儲能元件 95、92， 取樣元件 96、93， 測試波形記錄元件 97、94， 放電開關 18 1364545 D1 主檢測裝置 D2 外接檢測裝置 CPI、CP2 連接介面The inter-layer withstand voltage detecting unit 9 includes an energy storage element 91, and a sample-receiving waveform records a few pieces 93' and a discharge switch 94. The configuration and lap relationship are as shown in the ninth figure. It is obvious that in the second embodiment, the human processing controller 92 and the DC power supply unit % in the first embodiment are integrated into the human machine interface 2 and the micro processing unit 3 Power supply unit 5. Therefore, the interlayer withstand voltage can be further detected in the main detecting device D1. However, when detecting the inter-layer withstand voltage value of at least one of the two Hs of the object to be tested 3, 4, the detection power supplied from the power supply unit 5 must be direct current. The second embodiment of the present invention can be lightly used in the second embodiment of the present invention, since the interlayer pressure-resistant nuclear soap element 9 is further built in the main detecting device D1; therefore, only the main unit is required. The detecting device D1 can switch the impedance value, the withstand voltage value or the inter-layer withstand voltage value by at least one of the object to be tested 3〇〇, 4〇〇 and 5〇〇. 15 1364545 ^ Obviously, the present invention is indeed effective not only effective The space occupied by the detection itself is saved, thereby saving space cost; more importantly, the invention can save the time and manpower required for receiving the test object, so that the power cost required for performing the above three tests is further effectively saved. ^ By the above embodiments of the present invention, it can be seen that the present invention has the use value of industrial death. However, the above embodiments are merely illustrative of the preferred embodiments, and various modifications and changes can be made in accordance with the above-described embodiments of the present invention. However, the inventions, modifications and variations made in accordance with the embodiments of the present invention are still within the scope of the invention and the scope of the invention. BRIEF DESCRIPTION OF THE DRAWINGS The first figure shows the detection technique for detecting impedance, withstand voltage and inter-layer withstand voltage of an object to be tested in the prior art; the second figure shows the circuit function of the first embodiment of the present invention. The first part is a circuit diagram of a first part of the first embodiment of the present invention; the fourth part is a circuit diagram showing a second part of the first embodiment of the present invention; The method for detecting the impedance value of the object to be tested for impedance; the sixth figure shows the manner of detecting the impedance value of the object to be tested with low impedance according to the first embodiment of the present invention; the seventh figure shows the first embodiment of the present invention Method for detecting the withstand voltage value of the object; 16 1364545 5 Power supply unit 6 Power output switching circuit S601 (high voltage output control) switch S602 (low voltage output control) switch S603~S618 switch; J621 ~ J628 output terminal J629 low voltage Terminal 7 Common Detector Unit 71 Voltage Divider 72 Impedance Detector 73 Current Detector 74 Analog/Digital Converter 8 Impedance Detection circuit 81 impedance signal source 9 > 9, interlayer dust detection unit 91 human interface 92 microprocessor controller 93 DC power supply unit 94, 91, energy storage elements 95, 92, sampling elements 96, 93, test waveform record Components 97, 94, discharge switch 18 1364545 D1 main detection device D2 external detection device CPI, CP2 connection interface

1919

Claims (1)

1364545 抑年’1月z日修正本i ______ 十、申請專利範圚·· -種切換式檢測系統 值與一耐顧，並且包含：少—待測物件之一阻抗 一電力供應單元，係提供—檢測電力； -檢測項目_電路，係電1364545 Year of the Inaugural 'January z Day Amendment i _________ Ten, apply for a patent 圚 · · A kind of switching detection system value and a good, and include: less - one of the object to be tested impedance - power supply unit, is provided - detection of electricity; - detection of items _ circuit, electricity 測物传，勺八 、於该電力供應單元與該待 至:件包含-檢測項目切換開關，更包含： 開闕，係電性連通該電力供應單元;以及 至夕一低壓_，係電性連通該電力供應單元; :广迴路’峨於該檢測項目切換電路;以及 7理單元，係分別電性連通於該電力供應單元與該檢測 項目切換電路； 其I，顧微處理單元接收一操作信號後，當該操作信號係 厂表檢翁阻抗斜’賴處理單元係傳送出—切換信號 以接通（Switch 0n)該檢測項目切換_，使該阻抗檢 測迴路與該待測物件電性連通，藉以檢測該阻抗值；當該 操作信號係代表檢繼_值時，該微處理單元係傳送出 k刀換彳。號以切辦（Switch 〇ff)該檢測項目切換開關， 使該檢測電力,經由該檢測項目切換開關而傳送至該待測 物件，藉以檢測該耐壓值；當該待測物件之該阻抗值低於 一臨界測試值時’該切換信號係接通上述至少一高壓開關 20 之一者，亚且同時接通上述至少—低壓開财之一者。 2·如申請專利範圍第〗項所述之切換式檢測系統，更包含一帝 力輸出切換電路，該電力輸出切換電路係分別電性連通該: 測項目切換電路與該待測物件，並且包含： 魏個輸㈣子，係_接於該待測物件；以及 • 複數個切換開關，係兩兩輕接於上述複數個輸出端子。 3.如申請專利範圍第〗項所述之切換式檢測系統，更包含一人 機介面’該人機介面係耦接於該微處理單元，以供至少一使 用者將該操作信號輸入至該微處理單元。 4. 如申請專利範圍第1項所述之切換式檢測系統，更包含一層 啊壓檢測單元，該層間耐壓檢測單元係電性連通該檢測項 目切換電路，藉⑽換檢繼酬物件之—賴耐壓值。 5. 如申請專利範圍第4項所述之切換式檢測系統，其中，該檢 測項目切換電路更包含至少一層間耐屢控制開關，且該層間 耐[控制開關係分別電性連通於該層間耐壓檢測單元與該 待測當該操作信號係代表檢測該層間财壓值時，該微 處理單凡知傳送出該切換信號以切斷（Switch Off)該檢測 、、销並接通（Switch 〇n)該層間对壓控制開關， 21 U64-545 件，藉以檢測該 鱗測物件， 6.如申請專利範圍第5項所述 / 性連通於該微處理單元之第—連接⑽更包含一電 -連接:::圍弟6項所述之切換式檢測系統，其中，該第 遷接，丨面係一RS232連接埠。 8. 如申睛專利範圍第6項所述之切拖 間耐麵測單元更包含檢測系統，其中，該層 传雷m 接細，且該第二連接介面 糸電性連通於該第-連接介面。 9.t申物範_項所述之切換式檢測系統，其中，該第 一連接介面係一RS232連接埠。 如月專利軌圍第i項所述之切換式檢測系統，更包含一共 用仏知早疋，且該共用檢知單元係輕接於該檢測項目切換電 路…織處理單凡’藉雜據賴作錢*切碰知該阻抗 值與該耐麗值。 其中，該 U.如申請專利範圍第1G項所述之切換式檢測系統， 22 1364545 12 :申請專_第1G項所述之切換式_統，其中，該 “用檢知單元包含—電流檢 —恭、、 稭以心知—電流值，並以 电々IL榀知k號將該電流值傳送 出該_值。 U錢處理以，據以計算The test object transmission, the spoon eight, in the power supply unit and the waiting for: the component includes - detection item switch, further comprising: opening, electrically connecting the power supply unit; and the first low voltage _, the electrical Connecting the power supply unit; the wide loop 'being the detection item switching circuit; and the seventh unit are electrically connected to the power supply unit and the detection item switching circuit respectively; and I, the micro processing unit receives an operation After the signal, when the operation signal is detected by the factory, the impedance is transmitted by the processing unit, and the switching signal is turned on (Switch 0n) to switch the detection item, so that the impedance detection circuit is electrically connected to the object to be tested. The impedance value is detected; when the operation signal represents a detection value, the micro processing unit transmits a k-switch. No. (Switch 〇 ff) the detection item switch, so that the detected power is transmitted to the object to be tested via the detection item switching switch, thereby detecting the withstand voltage value; when the impedance value of the object to be tested When the value is lower than a critical test value, the switching signal is turned on by one of the at least one high-voltage switch 20, and simultaneously turns on at least one of the low-voltage start-ups. 2. The switching detection system according to the application scope of the patent scope, further comprising a Dili output switching circuit, wherein the power output switching circuit is electrically connected to: the item switching circuit and the object to be tested, and includes : Wei loses (four), is connected to the object to be tested; and • a plurality of switches, which are lightly connected to the plurality of output terminals. 3. The switching detection system of claim 1, further comprising a human machine interface, wherein the human machine interface is coupled to the micro processing unit for at least one user to input the operation signal to the micro Processing unit. 4. The switching detection system according to item 1 of the patent application scope further comprises a layer of pressure detecting unit, wherein the interlayer withstand voltage detecting unit is electrically connected to the detecting item switching circuit, and (10) is exchanged for the checking item. Lai pressure value. 5. The switching detection system according to claim 4, wherein the detection item switching circuit further comprises at least one layer of resistance-tolerant control switch, and the interlayer resistance [control open relationship is electrically connected to the interlayer resistance respectively) The pressure detecting unit and the to-be-tested unit when detecting the inter-layer financial pressure value, the micro-processing unit knows to transmit the switching signal to cut off the detection, pin and turn on (Switch 〇 n) The inter-layer pressure control switch, 21 U64-545, is used to detect the scaled object, 6. As described in claim 5, the first connection (10) of the micro-processing unit is further included - Connection::: The switching detection system described in the sixth item of the brothers, wherein the first connection is a RS232 connection. 8. The cutting-tolerant surface-sensing unit according to item 6 of the scope of the patent application further comprises a detecting system, wherein the layer of lightning is finely connected, and the second connecting interface is electrically connected to the first connection interface. 9. The switching detection system of claim 11, wherein the first connection interface is an RS232 connection port. The switching detection system described in item i of the monthly patent track includes a shared knowing device, and the shared detecting unit is lightly connected to the detecting item switching circuit. The money* cuts the impedance value and the resistance value. Wherein, the U. The switching detection system described in claim 1G of the patent scope, 22 1364545 12: the switching mode described in the application of the first _1G item, wherein the "using detection unit includes - current detection - Christine, and the straw knows the current value, and transmits the current value out of the _ value by the electric 々IL榀知k. U money processing, according to calculation 13.如申請專利範圍第 抗檢測迴路包含一 測該阻抗值。 1項所述之切換式檢_統，其中，該阻 阻抗信號源，H崎卽—阻抗信號來檢13. The patented anti-detection loop includes a measure of the impedance value. The switching detection method described in item 1, wherein the resistance signal source, the H rugged-impedance signal is detected 23twenty three