1353469 九、發明說明： 【發明所屬之技術領域】 本發明係關於一種液晶顯示面板及測試其之探針，尤 t一種適用於降低測試成本及重複測試液晶顯示面板之液 日日顯示面板及測試其之探針。 【先前技術】 10 ，-般在製作液晶顯示器的前段過程中，係使用磊晶的 方法在一基板上形成數百萬顆的薄膜電晶體以作為 元’然而，若有部分之薄膜電晶體在製作時品f不如^期， 導致無法表現出其開關控制特性，則會產生如亮點及暗點 的缺陷’大幅的降低液晶顯示器的品質。因此，必須有嗖 率的對薄膜電晶體進行測試，以維持液晶顯示㈣品質; 15 請參考圖1，係為習知之液晶顯示器測試線路示意圖。 在液晶顯示器的基板上包含了複數條資料線i i '複數條閑 極線12、兩個資料短路桿13以及兩個閘極短路桿14。此兩 個資料短路桿13係分別連接至奇數條的資料線iu及偶數 條的資料線112，而兩個閘極短路桿14係分別連接至奇數條 的閘極線12i及偶數條的閘極線122，最後，將資料短路桿 13以及閘極短路桿14之一端分別連接至相對應之測試墊 15,16，以供測試裝置之探測端接觸進行測試。此種方式係 為2D2G(即兩條資料線11以及兩極閘極線作測試12)之測試 線路。當進行測試時，測試裝置可藉由複數個探測端與相 對應之測試墊15，16相接觸後，將測試訊號經由資料短路桿 20 1353469 13以及閘極短路桿14送入特定之複數個薄膜電晶體中以進 行測試。在此測試方法由於任相鄰之兩條資料線u或是閘 極線12均沒有連接至相同的短路桿。因此，當任相鄰之兩 條資料線11或是閘極線12在製作上便已短路，可將此製造 5 瑕疵測試出來。 又，另一種習知液晶顯示器測試線路，請參考圖2，同 樣地在液晶顯示器的基板上包含了複數條資料線u、複數 條閘極線12、三個資料短路桿17以及兩個間極短路桿14。 三個資料短路桿17分別連接至3m+1、3m+2&3m+3之資料 10線113,114,115 ’其中m為零或正整數。@兩個閘極短路桿 14係分別連接至奇數條之閘極線121及偶數條之閘極線 122。最後將資料短路桿17以及閘極短路桿抖一端分別連接 至相對應之測試墊18,16，此種方式係為3D2G(即三條資料 線11以及兩極閘極線作測試12)之測試線路。當進行測試 15時，測試裝置藉由複數個探測端與相對應之測試墊16,18相 接觸後，將測試訊號經由資料短路桿17以及閘極短路“桿 送入特定之薄膜電晶體中以進行測試。此測試方式將資料 線分類成與基本原色（紅色、綠色、藍色）相對應，經由特定 之資料短路桿輸入測試訊號後輸出特定的基本原色。 20 然而，無論是圖1中2D2G或是圖2中3D2G的測試線路 方式，均無法有效的同時提升液晶顯示器製作時陣列段 (Array)及晶胞段（Cell)的測試效率。此外，在線路測試完之 後均會將短路桿，亦即資料短路桿及閘極短路桿切斷，此 種方式在短路桿切斷之後無法再重新測試。即當要在液晶1353469 IX. Description of the Invention: [Technical Field] The present invention relates to a liquid crystal display panel and a probe for testing the same, and a liquid daily display panel and test suitable for reducing test cost and repeatedly testing a liquid crystal display panel Its probe. [Prior Art] 10, in the process of fabricating the front section of a liquid crystal display, an epitaxial method is used to form millions of thin film transistors on a substrate as a component. However, if a part of the thin film transistor is in When the product f is not as good as the ^, it can not show its switching control characteristics, it will produce defects such as bright spots and dark spots 'significantly reduce the quality of the liquid crystal display. Therefore, the thin film transistor must be tested to maintain the liquid crystal display (4) quality; 15 Please refer to FIG. 1 , which is a schematic diagram of a conventional liquid crystal display test circuit. On the substrate of the liquid crystal display, a plurality of data lines i i 'multiple idle lines 12, two data shorting bars 13 and two gate shorting bars 14 are included. The two data shorting bars 13 are respectively connected to the odd-numbered data lines iu and the even-numbered data lines 112, and the two gate short-circuiting bars 14 are respectively connected to the odd-numbered gate lines 12i and the even-numbered gates. Line 122, and finally, one end of the data shorting bar 13 and the gate shorting bar 14 are respectively connected to the corresponding test pads 15, 16 for contact with the detecting end of the test device for testing. This method is the test line for 2D2G (ie, two data lines 11 and two-pole gate lines for test 12). When the test is performed, the test device can contact the corresponding test pads 15, 16 by a plurality of probe ends, and then send the test signals to the specific plurality of films via the data shorting bar 20 1353469 13 and the gate shorting bar 14. Tested in the transistor. In this test method, either the adjacent two data lines u or the gate lines 12 are not connected to the same shorting bar. Therefore, when the two adjacent data lines 11 or the gate lines 12 are short-circuited in production, the manufacturing can be tested. Moreover, another conventional liquid crystal display test circuit, please refer to FIG. 2, similarly, a plurality of data lines u, a plurality of gate lines 12, three data shorting bars 17, and two interpoles are included on the substrate of the liquid crystal display. Shorting the rod 14. The three data shorting bars 17 are respectively connected to the data of 3m+1, 3m+2&3m+3, 10 lines 113, 114, 115' where m is zero or a positive integer. @Two gate shorting bars 14 are connected to the odd-numbered gate lines 121 and the even-numbered gate lines 122, respectively. Finally, the data shorting bar 17 and the gate shorting bar shaking end are respectively connected to the corresponding test pads 18, 16, which is a test circuit of 3D2G (ie, three data lines 11 and two pole gate lines for test 12). When the test 15 is performed, the test device contacts the corresponding test pads 16, 18 by a plurality of probe terminals, and then sends the test signal to the specific thin film transistor via the data shorting rod 17 and the gate short circuit. This test method classifies the data lines into the basic primary colors (red, green, and blue), and outputs a specific basic primary color after inputting the test signal through a specific data shorting bar. 20 However, whether it is 2D2G in Figure 1. Or the test line mode of 3D2G in Figure 2 can not effectively improve the test efficiency of the array segment (Array) and the cell segment (Cell) during the manufacture of the liquid crystal display. In addition, after the line test, the short-circuit bar will be That is, the data shorting rod and the gate shorting rod are cut off. This method cannot be retested after the shorting rod is cut off.
10 15 20 【發明内容】 有鑑於習知之缺點，本發明 柘，勹杯·一锫一且 ' 種液晶顯示面 *丰 第：基板、—液晶層、複數個 旦素、複錢訊號線、複數個㈣墊。第二基 顯示區及一週邊線路區，而顯 ’' 3不£係對應於第—基板，週 邊線路區係位於該顯示區層係㈣㈣ 及該第二基板之間。複數個畫素係形成於該第二基板:卞 顯示區心複數條訊號線係、電性連接至該等晝素。複數: 測试墊係形成於該第二基板 伋夂。亥週邊線路區内並對應電性 、妾至該等訊號線’該等測試㈣係以錯位排列之方 成、，並叫固測試塾作—循環排列，分成_測試塾群 一測試墊群之該些測試墊係平行排列配置，其中，口係 於等於2之正整數。 ...... 本發明之液晶顯示面板，其中，d 訊，垂直方向作循環排列…此等訊號線包= 條貝料線、複數條閘極線或共同電極線。此外，測試墊可 電性連接爲複數條資料線。而此等賴塾巾較佳地係可 包括以n=2為-循環排列或者是以n=3為一循環排列。再 者’此等測試塾係較佳可為—導電材料。較佳地，測試 的材質可與晝素的材質相同。 在本發明中第一基板係可為一彩色濾光基板，而第二 7 丄 基板係可為-薄膜電晶體基板。在第二基板上的該等測試 在本發明中的測試塾係可與—測㈣置接觸，以測試該 =顯不面板。其中，該測試裝置係可包括一薄膜探針或 :軟性電路板（FPCB)。而此等測試裝置可包括複數個感測 塾，此複數個感測墊係可分別對應位於第二基板上週邊線 路區的測試墊所形成的測試墊群。 ίο 、由前述可知，本發明可更提供—種職液晶顯示面板 之測式探針，用於測試—液晶顯示面板，該液晶顯示面板 具有複數個賴塾群，至少包括：―薄材、複數個導線以 及，數個感測塾。複數個導線係位於該薄材内或或該薄材 之表面’㈣㈣線間不電性連接，該些導線電性連接至 一測试驅動電路。而複數個感測塾係位於該薄材之一側並 電性連接該等導線’且該些感測塾個別對應電性連接至該 液晶顯不面板之該些測試墊群。 15 本發明令測試液晶顯示面板的探針，其中，部分之導 ^糸與其感㈣係不限呈現何種形狀’只要可與液晶顯示 面板中的測試墊接觸即可，例如可呈現 字型等形狀。 飞疋 由别述可知，本發明經由在第二基板中的週邊線路區 =料的配置’可同時提供短路桿（细叫㈣或是使測 :的探針中之感㈣完全接觸_ contact)兩種測試方 =。虽短路桿測試線路被切斷後，仍然可以在完成晶胞㈣ 二之。在作測試時可針對奇數線路或偶數線路進行 H也W針對不同區域的線路組進行獨立測試。本發 20 1353469 同時也提 明係降低了測試成本 質。 阿了液晶顯示器產 品的品 【貫施方式】 :下係藉由特定的具體實施例說明本發明 式’熟習此技蟄之人士可由本 Μ %方 了解本發明之其他優點與功效=不之内容輕易地 m 尽發明亦可藉A i仙π 的具體實_加㈣行或制，本說 項=同 10 15 可基於不同觀點與應用，在不恃離本發明之郎亦 種修飾與變更。 ^之精神下進行各 本發明之實施例中該等圖式均為簡化之示意圖。㈣ 圖式僅顯讀本發明有關之元件，其所顯*之_ 實際實施時之態樣，其實際實施時之元件數目、形狀等 = 例為-選擇性之設計，且其元件佈局型態可能更複雜。 實施例1 請參考圖3,係為本發明之一液晶顯示面板2〇簡單示意 圖。其具有-彩色據光基板21、—薄膜電晶體基板22以及 一液晶層23。其令，液晶層23係位於彩色濾光基板21及薄 膜電晶體基板2 2之間且液晶層2 3的外側具有一止膠層2 4。 20而本實施例中薄膜電晶體基板22的結構，請參考圖4，係為 依據本發明之一種液晶顯示面板2〇之薄膜電晶體基板22示 思圖。此薄膜電晶體基板22具有一顯示區221及一週邊線路 區222 ’ s玄顯示區221係對應於一如圖3所示之彩色渡光基板 21 ’該週邊線路區222係位於該顯示區221周圍。又在薄膜 1353469 電晶體基板22的顯示區221内形成複數個晝素31。此外具有 複數條可作為訊號線的資料線32以及閘極線33電性連接至 晝素31中。 15 接著，請參考圖5A係為圖3之液晶顯示面板20俯視圖且 係為薄膜電晶體基板22週邊線路區222放大示意圖。以 2D2G結構為例，在薄膜電晶體基板22的週邊線路區222 中’係具有複數個測試墊34並對應電性連接至該等訊號 線’即資料線32或是閘極線33。此等測試墊34間係以兩兩 錯位排列之方式形成，可分成2組測試墊群34丨，342，每一測 試墊群341，342間之測試墊34a，34b係平行排列配置。此種測 試墊34間係以兩兩錯位排列之方式可先應用短路桿35，即 與訊號線連接的短路桿35經由短路測試墊36以2D2G(即分 別可對應連接至如圖4所示之資料線32及閘極線33)的線路 測試方式測試，如圖5A所示。在測試完之後，即將與短路 才干35連接的訊號線以磨斷或以雷射的方式切斷，如圖㈤所 示在此之後，在製作液晶顯示器的後續製程時，則此等 測試方式不會再針對液晶顯示面板20作測試。 另^，在本實施例中亦提供一種測試此種液晶顯示面 板之測试探針。此探針在本實_係為—軟性電路板仰， 亦可使用薄膜探針。請參考，，係為本實施例巾軟性電路 板40與液晶顯示面板2()的電性連接示意圖。兹將軟性電路 板40”週邊線路區222接觸的區域更放大來看，此軟性電路 =與/I:示面板20的薄膜電晶體基板22的週邊線路 隨接觸。關於本實施例之探針，請參考圖7，其至少包 20 括：薄材41、複數個導線421，422,423以及複數個感測墊 431，432,433。此等導線421,422,423係位於薄材41内或是薄 材41之表面，且導線421，422 423間不電性連接，這些導線 421，422,423電性連接至一測試驅動電路（圖未示）。感測墊 431,432，433則位於薄材41之一側並分別電性連接導線 421，422,423 ’且請再參考圖6，此等感測墊431，432個別對 應電性連接至液晶顯示面板2〇之測試塾群μ 1，342。 本實施例如圖7所示之的導線421與其感測墊431呈現 一T型，其係與本實施例中液晶顯示面板2〇的奇數個排列的 測試墊群341電性連接。而與其感測墊432呈現一[型的導線 422則與偶數個測試墊群342電性連接。而與其感測墊433呈 現一 一字型的導線423則與其中一測試墊34電性連接，此測 試墊34c則電性連接至液晶顯示面板2〇中的一訊號線。又， 此訊號線係為液晶顯示面板2〇中的共同電極線（圖未示），此 共同電極線係連接薄膜電晶體基板22以及彩色遽光基板 21因此由則述可知，本實施例可依此探針偵測液晶顯 示面板20的薄膜電晶體是否有短路的現象。 又，可依此探針，請參考圖8，作一種2D2G的測試。 以測試驅動裝置電性連結測試探針之另—端，以電路板9〇 為例，在電路板_Χ軸方向，包括了如圖6所示之一條連 接薄膜電晶體基板22中週邊線路區222之奇數個排列的測 4整群341之導線421、一條連接薄膜電晶體基板22中週邊 線路區222之偶數個㈣的測試祕342之導線422以及一 條與連接至液晶顯示面板2〇中共同電極線之測試墊*之 1353469 導線423,而在X軸方向的測試墊34則電性連接至薄膜電晶 體基板22的資料線32(如圖4所示）或共同電極線（圖未示）。 同樣地’在電路板的γ軸方向則包括了 一條連接薄膜電晶體 基板22中週邊線路區222之奇數個排列的測試墊群341之導 5線421以及一條連接薄膜電晶體基板22中週邊線路區222之 偶數個排列的測試墊群342之導線422。此時，γ軸方向的測 试墊34則電性連接至薄膜電晶體基板22的閘極線33(如圖4 所示）’並且探針中的導線421，422可與其感測墊43ι,432形 成兩個L型。最後，、經由信號輪入至電路板9〇中之信號輸入 10塾91，可測試出液晶顯示面板中的薄膜電晶體是否短路。 在本實施例中，經過探針的測試之後，可在薄膜電晶 體基板2 2中之週邊線路區2 2 2的測試墊3 4上與複數個半導 體晶片連接，再繼續後續的製程，以完成液晶顯示器的组 裝。 15 實施例2 本實施例係與實施例1大致上相同，但不同的是，請參 考圖9Α ’此等測試墊50中本身係可分為第-測試塾51及第 二測試塾52，第-測試塾51仙錯位排狀方式形成，並 以3個第-測試塾51作一播環排列，分成恤測試塾群，亦 20 Ρ以第1 4、7…等測試墊作為第一組測試墊群5 i丨，以第2、 5々、8...等測試塾作為第二組測試塾群⑴，以帛3、6、9· 等測試塾作為第三組測試塾群513，每一測試塾群之測試墊 51係平行排列配置。此外，此三組的測試塾群（第-組測試 塾群511、第一組测試塾群512及第三組測試塾群M3)係可 ⑧ 1353469 •- 分別測試如圖3所示之彩色濾光基板21的基本原色，即紅 (R)、綠（G)、藍（B)。測試墊5〇中的第二測試墊52則兩兩互 ' 相交錯著排列》 隨著薄膜電晶體基板22上的測試墊50的排列不同。因 -5此，再請參考圖9B，本實施例的探針材料亦與實施例1材料 相同，然本實施例中探針，即軟性電路板4〇(或薄膜探針） 中導線423,424,425,426與感測塾433,434,435,436所呈現的 • 形狀亦隨之改變。本實施例中與薄膜電晶體基板22中第— 測試墊51中之第一組測試墊群511電性連接的導線424及发 ' 1〇感測墊434則呈現丁型的形狀，其係可測試藍色（B广另，與 ·- 薄膜電晶體基板22中第一測試墊51中之第二組測試墊群 • 511電性連接的導線425及其感測墊们5則呈現[型的形狀， 其係可測試綠色⑹。此外，與薄膜電晶體基板22中第—測 試墊51中之第三組測試塾群513電性連接的導線似及其感 15測墊436亦可呈現[型的形狀，其係可測試紅色（R)。再者， 與實施例1相同的導線423及其感測墊433可呈現一字型，此 • $式則電性連接至液晶顯^面板中的—作為共同電極線的 訊號線。 本貫施例同樣與貫施例丨相同，利用電路板進行測試， 20請同時參考圖9及圖1〇,係為做一種3腦的測試方式，在 電路板90的X轴方向，包括了一條連接薄膜電晶體基板 :週邊線路區222之第-測試塾51的第一組測試塾群51工之 V在、條連接薄膜電晶體基板22中週邊線路區222之 第；貝K式塾51的第二組測試塾群5 i 2之導線、—條連接 13 (S) 1353469 薄膜電晶體基板22中週邊線路區222之第一測試塾5 1的第 三组測試墊群5 13之導線426以及一條與連接至液晶顯示面 板20中共同電極線之測试塾5〇之導線423。本實施例在電路 板90的Y軸方向則與實施例1相同。本實施例經由信號輸入 5至電路板90令之信號輸入墊91，可測試出液晶顯示面板令 的薄膜電晶體是否短路。其餘部分則與實施例i相同。 實施例3 本實施例係與實施例1大致上相同，但不同的是，請參 考圖11A ’本實施例的測試墊6 〇中係以兩兩錯位排列之^式 10形成，並可分為2組測試墊群6〇1，6〇2。而測試墊6〇本身又^ 分為第一測試墊61及第二測試墊6 2，而第—測試墊6丨係以 錯位排列之方式形成且每一測試墊群6〇1，6〇2中之第—測試 塾61係平行排列配置。每—測試塾群6()1,6()2中第二測試二 62則互相平行排列。 15 測試本實施例中液晶顯示面板的探針（如圖i i b所亍） 以及利用電路板將信號輸入的方式則與實施例i相同。此 測試完ΐ的測試塾⑼係可與—薄膜連接，再繼續後 、.男的衣私，以元成液晶顯示器的組裝。 實施例4 20 本實施例係與實施例2大致相同，但不同的是，往 ’::非列’大致上而言’本實施例的測試墊係 …71作一循環排列’而可分成3組測4: 14 ⑧ 1353469 7〇1，702,703。 另外，本實施例中測試液晶顯示面板的探針其排列方式 則可如實施例2相同。而與探針連接的電路板亦與實施例之 相同。 5 實施例5〜1 〇 實施例5〜10係可依照實施例丨〜4中的測試墊之排列方 式，而製作出如圖13A所示之2D4G(實施例5)、如圖13B所 示之3D4G(實施例6)、如圖13C所示之4D2(}(實施例乃、如 圖13D所示之4D4G(實施例8)、如圊丨3E所示之6〇2(}(實施例 10 9)以及如圖13F所示之6D4G(實施例10)等測試。熟習此技藝 者，可據上作等效的變化與擴增，並不因此而限制本發^ 之實施方式。10 15 20 [Description of the Invention] In view of the disadvantages of the prior art, the present invention 柘, cups, 锫 且 ' ' 种 液晶 液晶 液晶 液晶 液晶 液晶 : : : : : : : : : : : : : : : : : : : : : : : : : : : : (four) pad. The second base display area and a peripheral line area, and the display area corresponds to the first substrate, and the peripheral line area is located between the display area layer system (4) (4) and the second substrate. A plurality of pixels are formed on the second substrate: 卞 The display region has a plurality of signal lines and is electrically connected to the pixels. The plurality of test pads are formed on the second substrate. In the surrounding area of the sea, and corresponding to the electrical, to the signal line 'the test (four) is arranged in a wrong position, and called the solid test - cycle arrangement, divided into _ test group test pad group The test pads are arranged in parallel, wherein the mouth is a positive integer equal to two. The liquid crystal display panel of the present invention, wherein the d signal is arranged in a vertical direction in the vertical direction... the signal line package is a strip line, a plurality of gate lines or a common electrode line. In addition, the test pads can be electrically connected to a plurality of data lines. Preferably, the slings may comprise a cycle of n=2 or a cycle of n=3. Further, the test lanthanum is preferably a conductive material. Preferably, the material tested can be the same as the material of the halogen. In the present invention, the first substrate may be a color filter substrate, and the second substrate may be a thin film transistor substrate. The test on the second substrate The test tether in the present invention can be contacted with the test (four) to test the = display panel. Wherein, the testing device may comprise a thin film probe or a flexible circuit board (FPCB). The test devices may include a plurality of sensing pads, respectively, corresponding to the test pad groups formed by the test pads located in the peripheral line regions on the second substrate. In view of the foregoing, the present invention can further provide a test probe for a liquid crystal display panel for testing - a liquid crystal display panel, the liquid crystal display panel having a plurality of scorpion groups, including at least: "thin material, plural" Wires, as well as several senses. A plurality of wires are electrically connected in the thin material or between the (4) and (4) wires of the thin material, and the wires are electrically connected to a test driving circuit. And a plurality of sensing lanthanums are located on one side of the thin material and electrically connected to the wires ′ and the sensing 塾 are correspondingly electrically connected to the test pad groups of the liquid crystal display panel. 15 The invention relates to testing a probe of a liquid crystal display panel, wherein a part of the guide and its sense (4) are not limited to what shape is provided as long as it can be in contact with the test pad in the liquid crystal display panel, for example, a font can be presented. shape. As can be seen from the above description, the present invention can simultaneously provide a shorting bar via a peripheral line region in the second substrate, or a sense of the probe in the probe (four). Two test parties =. Although the short-circuit bar test line is cut, the unit cell (4) can still be completed. In the test, it can be performed for odd-numbered lines or even-numbered lines. H is also tested independently for line groups in different areas. This also 20 1353469 also suggests that the cost of testing is reduced. A product of a liquid crystal display product is generally described by a specific embodiment. The person skilled in the art can understand the other advantages and effects of the present invention. Easily, the invention can also be based on the specific real-plus (four) line or system of A ixian π, and the present item = the same as 10 15 can be modified and changed without departing from the invention. In the spirit of the present invention, the drawings are simplified in the embodiments of the present invention. (4) The drawings only show the components of the present invention, which are shown in the actual implementation, the number of components, the shape, etc. in the actual implementation = the example is - selective design, and the component layout type may More complex. Embodiment 1 Please refer to Fig. 3, which is a simplified schematic view of a liquid crystal display panel 2 of the present invention. It has a color light substrate 21, a thin film transistor substrate 22, and a liquid crystal layer 23. The liquid crystal layer 23 is disposed between the color filter substrate 21 and the thin film transistor substrate 2 and has a stopper layer 24 on the outer side of the liquid crystal layer 23. 20, and the structure of the thin film transistor substrate 22 in this embodiment, please refer to FIG. 4, which is a schematic diagram of a thin film transistor substrate 22 of a liquid crystal display panel 2 according to the present invention. The thin film transistor substrate 22 has a display area 221 and a peripheral line area 222 s. The display area 221 corresponds to a color light-emitting substrate 21 as shown in FIG. 3 . The peripheral line area 222 is located in the display area 221 . around. Further, a plurality of halogen elements 31 are formed in the display region 221 of the film 1353469 transistor substrate 22. In addition, a plurality of data lines 32, which are available as signal lines, and a gate line 33 are electrically connected to the pixel 31. 15, FIG. 5A is a plan view of the liquid crystal display panel 20 of FIG. 3 and is an enlarged schematic view of a peripheral line region 222 of the thin film transistor substrate 22. Taking the 2D2G structure as an example, a plurality of test pads 34 are disposed in the peripheral line region 222 of the thin film transistor substrate 22 and are electrically connected to the signal lines ′, that is, the data lines 32 or the gate lines 33. The test pads 34 are formed by two or two misalignment arrangements, and can be divided into two sets of test pad groups 34, 342, and the test pads 34a, 34b between each test pad group 341, 342 are arranged in parallel. The short-circuit bar 35 can be applied to the test pads 34 in a two-to-two misalignment manner, that is, the short-circuit bar 35 connected to the signal line is connected to the short-circuit test pad 36 by 2D2G (ie, respectively, correspondingly connected to FIG. 4). The line test mode test of the data line 32 and the gate line 33) is as shown in FIG. 5A. After the test, the signal line to be connected to the short-circuit 35 is cut off or laser-cut. As shown in Figure (5), after the subsequent process of making the liquid crystal display, the test mode is not The liquid crystal display panel 20 will be tested again. In addition, in the present embodiment, a test probe for testing such a liquid crystal display panel is also provided. This probe is in the form of a flexible circuit board, and a thin film probe can also be used. Please refer to this, which is a schematic diagram of the electrical connection between the flexible circuit board 40 and the liquid crystal display panel 2 of the present embodiment. The soft circuit = contact with the peripheral line of the /I: thin film transistor substrate 22 of the display panel 20 as seen in the enlarged area of the peripheral circuit region 222 of the flexible circuit board 40". With regard to the probe of the present embodiment, Referring to FIG. 7, at least 20 includes: a thin material 41, a plurality of wires 421, 422, 423, and a plurality of sensing pads 431, 432, 433. The wires 421, 422, 423 are located in the thin material 41 or on the surface of the thin material 41, and The wires 421, 422, 423 are electrically connected, and the wires 421, 422, and 423 are electrically connected to a test driving circuit (not shown). The sensing pads 431, 432, and 433 are located on one side of the thin material 41 and electrically connected to the wires. 421, 422, 423 ′ and please refer to FIG. 6 again. The sensing pads 431 and 432 are correspondingly connected to the test group μ 1, 342 electrically connected to the liquid crystal display panel 2 . This embodiment is, for example, the wire 421 shown in FIG. 7 . The sensing pad 431 is electrically connected to the odd-numbered test pad group 341 of the liquid crystal display panel 2 本 in the embodiment, and the sensing pad 432 presents a [type wire 422 An even number of test pad groups 342 are electrically connected. The test pad 433 is electrically connected to one of the test pads 34, and the test pad 34c is electrically connected to a signal line in the liquid crystal display panel 2. The signal line is A common electrode line (not shown) in the liquid crystal display panel 2 is connected to the thin film transistor substrate 22 and the color light-emitting substrate 21. Therefore, the present embodiment can detect the liquid crystal according to the probe. Whether the thin film transistor of the display panel 20 has a short circuit phenomenon. Further, according to the probe, please refer to Fig. 8 for a 2D2G test. The test drive device is electrically connected to the other end of the test probe to the circuit board. For example, in the direction of the board_axis, a plurality of wires 421 and a connecting film of the fourth group 341 which are arranged in an odd number of the peripheral circuit regions 222 in the thin film transistor substrate 22 are connected as shown in FIG. A plurality of (four) test wires 422 of the peripheral circuit region 222 in the transistor substrate 22 and a 1353469 wire 423 connected to the test pad* of the common electrode line in the liquid crystal display panel 2 are tested in the X-axis direction. Pad 34 is electrically The data line 32 (shown in FIG. 4) or the common electrode line (not shown) is connected to the thin film transistor substrate 22. Similarly, the periphery of the thin film transistor substrate 22 is included in the γ-axis direction of the circuit board. A fifth line 421 of the odd-numbered test pad group 341 of the line region 222 and a wire 422 connecting the even-numbered test pad groups 342 of the peripheral line region 222 of the thin film transistor substrate 22. At this time, the γ-axis direction The test pad 34 is electrically connected to the gate line 33 of the thin film transistor substrate 22 (shown in FIG. 4) and the wires 421, 422 in the probe can form two L-shapes with the sensing pads 43ι, 432. Finally, the signal input to the circuit board 9A via the signal input 10塾91 can test whether the thin film transistor in the liquid crystal display panel is short-circuited. In this embodiment, after the test of the probe, a plurality of semiconductor wafers can be connected to the test pads 34 of the peripheral line region 2 2 2 in the thin film transistor substrate 2 2, and then the subsequent process is continued to complete. Assembly of liquid crystal displays. 15 Embodiment 2 This embodiment is substantially the same as Embodiment 1, but the difference is that, referring to FIG. 9 Α 'The test pads 50 can be divided into the first test 塾 51 and the second test 塾 52, respectively. - Test 塾 51 错 错 位 排 , 仙 仙 仙 仙 仙 仙 仙 仙 仙 仙 仙 仙 仙 仙 仙 仙 仙 仙 仙 仙 仙 仙 仙 仙 仙 仙 仙 仙 仙 仙 仙 仙 仙 仙 仙 仙 仙 仙 仙 仙 仙 仙 仙Pad group 5 i丨, using test 第 2, 5々, 8... as the second group of test ( group (1), 帛 3, 6, 9· and other test 塾 as the third group test group 513, each A test pad 51 of the test group is arranged in parallel. In addition, the test group of the three groups (the first group test group 511, the first group test group 512 and the third group test group M3) can be 8 1353469 •- respectively test the color as shown in FIG. The basic primary colors of the filter substrate 21, namely red (R), green (G), and blue (B). The second test pad 52 of the test pad 5 is arranged in a staggered relationship with each other. The arrangement of the test pads 50 on the thin film transistor substrate 22 is different. Referring to FIG. 9B, the probe material of this embodiment is also the same as that of the embodiment 1, but in the embodiment, the probe, that is, the flexible circuit board 4 (or thin film probe), the wires 423, 424, 425, 426 and The shape of the sense 塾 433, 434, 435, 436 also changes. In the embodiment, the wires 424 and the '1' sensing pads 434 electrically connected to the first group of test pads 511 in the first test pad 51 of the thin film transistor substrate 22 are in the shape of a D-type. Test blue (B wide, and - - the second set of test pads in the first test pad 51 of the thin film transistor substrate 22 • 511 electrically connected wires 425 and their sensing pads 5 are [type The shape can be tested green (6). In addition, the wire electrically connected to the third group of test spurs 513 in the first test pad 51 of the thin film transistor substrate 22 and the sense 15 pad 436 can also be presented. The shape of the wire 423 can be tested in red (R). Further, the same wire 423 and the sensing pad 433 as in the embodiment 1 can be in a line shape, and the type is electrically connected to the liquid crystal display panel. - as the signal line of the common electrode line. The same example is the same as the example, using the circuit board for testing, 20 please refer to Figure 9 and Figure 1 at the same time, is to do a 3 brain test mode, in the circuit The X-axis direction of the board 90 includes a connection film transistor substrate: the first test area of the peripheral line region 222 The first group of test 塾 51 workers V, the strip connection film transistor substrate 22 in the peripheral line area 222; the second group of test 塾 51 type 塾 group 5 i 2 wire, - strip connection 13 ( S) 1353469 Lead 426 of the third test pad group 5 13 of the first test port 5 of the peripheral circuit region 222 of the thin film transistor substrate 22 and a test 塾 5 connected to the common electrode line in the liquid crystal display panel 20 The wire 423 of the circuit board is the same as that of the first embodiment in the Y-axis direction of the circuit board 90. In this embodiment, the signal input pad 91 via the signal input 5 to the circuit board 90 can test the film of the liquid crystal display panel. Whether the transistor is short-circuited. The rest is the same as in Embodiment i. Embodiment 3 This embodiment is substantially the same as Embodiment 1, except that, referring to FIG. 11A, the test pad 6 of the present embodiment is The two types of misalignment are formed by the formula 10, and can be divided into two groups of test pads 6〇1, 6〇2, and the test pad 6〇 itself is divided into a first test pad 61 and a second test pad 6 2, The first test pad 6 is formed in a misaligned manner and each test pad group is 6〇1,6 The second test-test 61 is arranged in parallel. Each test group 6()1,6()2 and the second test two 62 are arranged in parallel with each other. 15 Testing the probe of the liquid crystal display panel in this embodiment (as shown in Figure iib) and the way to input the signal by using the circuit board is the same as that of the embodiment i. The test 塾 (9) after the test is completed can be connected with the film, and then the man's clothing is private. Assembly of a liquid crystal display. Embodiment 4 20 This embodiment is substantially the same as Embodiment 2 except that the test matrix of the present embodiment is substantially a ':: non-column' Arranged 'and can be divided into 3 groups of 4: 14 8 1353469 7〇 1,702,703. In addition, the probes for testing the liquid crystal display panel in this embodiment can be arranged in the same manner as in Embodiment 2. The board to which the probe is connected is also the same as the embodiment. 5 Embodiments 5 to 1 〇 Embodiments 5 to 10 can produce 2D4G (Example 5) as shown in FIG. 13A according to the arrangement of the test pads in Embodiments 丨4, as shown in FIG. 13B. 3D4G (Embodiment 6), 4D2 (} as shown in FIG. 13C (Example, 4D4G (Example 8) as shown in FIG. 13D, 6〇2 (} as shown in FIG. 3E) (Example 10 9) and 6D4G (Example 10) and the like as shown in Fig. 13F. Those skilled in the art can make equivalent changes and amplifications according to the above, and do not limit the implementation of the present invention.
綜上所述，本發明所提供的液晶顯示面板以及測試此種 液晶顯示面板的探針，係降低了測試成本。並且，在液晶 顯示面板上的線路可局部在基板、電路板及軟性電路板 上，取代了習知原來面板上的線路。此外，本發明亦提升 了液晶顯示器的品質。 上述實施例僅係為了方便說明而舉例而已，本發明所 主張之權利範圍自應以申請專利範圍所述為準，而非僅限 20 於上述實施例。 【圖式簡單說明】 圖1係習知之液晶顯不測試線路示音圖。 圖2係另一習知之液晶顯示器測試線路示意圖。 ⑧ —--- 15 1353469 圖3係本發明—較佳實施例之液晶顯示面板剖視圖。 圖4係本發明一較佳實施例之薄膜電晶體基板示意圖。 圖5係本發明—較佳實施例之薄膜電晶體基板上週邊 線路區示意圖。 圖6係本發明一較佳實施例之液晶顯示面板與探針接 觸示意圖。 圖7係本發明—較佳實施例之測試液晶顯示面板之探 針示意圖。In summary, the liquid crystal display panel provided by the present invention and the probe for testing such a liquid crystal display panel reduce the test cost. Moreover, the lines on the liquid crystal display panel can be partially on the substrate, the circuit board, and the flexible circuit board, replacing the conventional lines on the original panel. In addition, the present invention also improves the quality of the liquid crystal display. The above-described embodiments are merely examples for convenience of description, and the scope of the claims is intended to be limited to the above embodiments. [Simple description of the drawing] Fig. 1 is a schematic diagram of a conventional LCD display circuit. 2 is a schematic diagram of another conventional liquid crystal display test circuit. 8 —--- 15 1353469 FIG. 3 is a cross-sectional view of a liquid crystal display panel of the preferred embodiment of the present invention. 4 is a schematic view of a thin film transistor substrate in accordance with a preferred embodiment of the present invention. Figure 5 is a schematic view of a peripheral line region on a thin film transistor substrate of the preferred embodiment of the present invention. Fig. 6 is a schematic view showing the contact of a liquid crystal display panel and a probe according to a preferred embodiment of the present invention. Figure 7 is a schematic view of a probe for testing a liquid crystal display panel of the present invention - a preferred embodiment.
圖係本^明較佳實施例之以電路板測試液晶顯示 10 面板示意圖。 圖9係本發明另—較佳實施例之薄膜電晶體基板上週 邊線路區及與其接觸之探針接觸示意圖。 圖10係本發明—較佳實施例之以電路板測試液晶顯示 面板示意圖。 15 20 圖11係本發明另—較佳實施例之薄膜電晶體基板上週 邊線路區及與其接觸之探針接觸示意圖。 圖12係本發明另—較佳實施例之薄膜電晶體基板上週 邊線路區示意圖。 -圖係、本發明其他車父佳實施例之以電路板測試液 不面板示意圖。 八 【主要元件符號說明】 資料短路桿 i1，111，112，113，114，115，^ 資料線 12,121，122,33 閘極線 n v 1353469 14 閘極短路桿 15，16,18測試墊 20 液晶顯不面板 21 彩色濾光基板 22 薄膜電晶體基板 221 顯不區 222 週邊線路區 23 液晶層 24 止膠層 31 畫素 34,34a，34b，34c，50,60,70 測試塾 341,342,51 1,512,513,601,602,701,702,703 測試墊群 35 短路桿 36 短路測試墊 40 軟性電路板 41 薄材 421,422,423,424,425,426 導線 431,432,433,434,435,436 感測墊 51，61,71第一測試墊 52,62,72第二測試墊 90 電路板 91 信號輸入墊 17BRIEF DESCRIPTION OF THE DRAWINGS The present invention is a schematic diagram of a panel test liquid crystal display 10 panel. Figure 9 is a schematic view showing the contact between the peripheral line region on the thin film transistor substrate and the probe in contact therewith in another preferred embodiment of the present invention. Figure 10 is a schematic illustration of a liquid crystal display panel tested by a circuit board in accordance with the present invention. 15 20 is a schematic view showing the contact between the peripheral line region on the thin film transistor substrate and the probe in contact therewith in another preferred embodiment of the present invention. Figure 12 is a schematic view of a peripheral line region on a thin film transistor substrate of another preferred embodiment of the present invention. - Figure, the other board of the present invention, the circuit board test solution is not a schematic diagram of the panel.八 [Main component symbol description] Data shorting bar i1, 111, 112, 113, 114, 115, ^ Data line 12, 121, 122, 33 Gate line nv 1353469 14 Gate shorting bar 15, 16, 18 test pad 20 LCD display No panel 21 Color filter substrate 22 Thin film transistor substrate 221 Display area 222 Peripheral line area 23 Liquid crystal layer 24 Stop layer 31 Pixels 34, 34a, 34b, 34c, 50, 60, 70 Test 塾 341, 342, 51 1, 512, 513, 601, 602, 701, 702, 703 Test Pad group 35 Shorting bar 36 Short circuit test pad 40 Flexible circuit board 41 Thin material 421, 422, 423, 424, 425, 426 Conductor 431, 432, 433, 434, 435, 436 Sensing pad 51, 61, 71 First test pad 52, 62, 72 Second test pad 90 Circuit board 91 Signal input pad 17