TWI232952B - Test base for a pin - Google Patents

Abstract

There is provided a test base for a pin, which is a base for testing the yield rate of conductivity for a pin. The base includes a seat, a stage configured on the seat, a guiding mechanism configured on two sides of the stage, a test device configured in the guiding mechanism for being connected and driven by a driving mechanism, and plural conductive terminals configured on one side of the test device. As such, the to-be-tested object with a pin is placed on the stage, and the driving mechanism is operated to move the test device toward the pin of the to-be-tested object, so as to form a one-to-one complete and precise contact between the conductive terminal and the pin, thereby testing the yield rate of the pin, reducing the erroneous determination rate and preventing the pin from deformation due to external force.

Description

12329521232952

五、發明說明（1) 【發明所屬之技術領域】 —^發明係有關一種夾接腳（PIN)專用測試機座尤 機，透過手動操作使導電端與接腳（PIN)精確接觸 機座，以避免因接觸不良造成無法導通而難以測試之缺失 【先前技術】 ^腳（p I N )係一種細長針狀物。常見於從連接器突 曰：接觸點’纟它接腳的形式則像蜘蛛的腳一樣，連接於 曰，曰士，長相像腳的金屬附屬可以安插在電路板的插槽上 訊疋直接安裝於電路板上；其功能在於接收外界的電流 =2，然後經過内部處理，再將結果以電流訊號傳送出去 2作單純的電源供應，因此連接器組裝於 必需經過測試證實可完全導通才能使用，因為二連： ς p質良筹不僅影響電流與訊號傳輸的可靠度， 整個電子機器的運作品質。 ，已知，傳統用以測試夾接腳（P IN)待測物之測試裝置 ’莫過於如以下專利公報所陣述之構造： 『1 、中華民國專利公報公告編號第3 7 9 3 β 5號之 =針測試方法及探針裝置』（如附件一）揭露—種透u過 台向著探針端子上昇，而使被檢查體接觸於探針端子 t以測試該被檢查體良率之裝置。 『& 2、中華民國專利公報公告編號第3 5 7 2 6 5號之 探針測試卡及其形成方法』（如附件二）揭露由一種探 领試卡，包括一基板、一絕緣膜，係可撓而伸延於基板 1232952V. Description of the invention (1) [Technical field to which the invention belongs] — The invention relates to a special test stand for pin clamp (PIN), especially a machine. The conductive end and pin (PIN) are brought into precise contact with the base through manual operation. To avoid the lack of continuity and difficulty in testing due to poor contact [prior art] ^ The foot (p IN) is an elongated needle. It is commonly seen from the connector: the contact point '纟 Its pin form is like a spider's foot. It is connected to the Japanese and Japanese, and the metal attachment that looks like a foot can be inserted in the slot of the circuit board. On the circuit board; its function is to receive the external current = 2, and then process it internally, and then send the result as a current signal 2 as a simple power supply. Therefore, the connector must be tested and proved to be fully conductive before it can be used. Because Erlian: p good quality not only affects the reliability of the current and signal transmission, but also the operating quality of the entire electronic machine. It is known that the traditional testing device for testing the pin-in-pin (P IN) test object is better than the structure described in the following patent gazette: "1. Republic of China Patent Gazette Bulletin No. 3 7 9 3 β 5 No. = Needle test method and probe device "(such as Annex I) revealed-a device that passes through the platform and rises toward the probe terminal, and makes the test object contact the probe terminal t to test the test object's yield. . "&Amp; 2. Probe Test Card of the Republic of China Patent Gazette No. 3 5 7 2 6 5 and its forming method" (such as Annex II) discloses that a probe test card includes a substrate, an insulating film, Flexible and extended to the substrate 1232952

具有一链 . 五、發明說明（2) 之第一表面上，該絕緣膜 表面接觸以形成一空間區 該絕緣膜之第一表面之間 •，以及一探針圖型，伸延 形成圖型，俾藉透過利用 3 、中華民 『橫桿式探針測 ，該裝置包括有 針，藉由該橫桿 的傳達，讓該治 否裝設錯誤。 4 、中華民 『浮動彈力探針 試裝置，包括一 上平行於探針板 下面，俾使伸展 針保留片，用以 呈直線對準者。 5 、中華民 『複合式治具探 及探針套筒所組 種不同直徑大小 ，此插接部係可 弟一表面與該基板的第一 ， 界疋於該基板之第一表面與 使"卩份該絕緣膜可進入該空間 /絕緣膜之第二表面上，俾探針 、邑緣膜上凸起之探針形成測試卡 報公告編號第4 9 7 7 1 8號之 -第-探針如：：三）所揭露之測試裝置 ^ 乐二探針、一橫桿及二探 °亥連接器而由該第二探針的導線 斷出待測電路板所設之連接器是 報公告編號第3 6 8 6 0 2號之 裝置』（如附件四）所揭露之測 有 固疋之探針板、一頂板大致 及一探針保留片定置於探針板之 針板之測試探針亦伸展通過此探 針與印刷電路板上測試下之電路 報公告編號第3 7 8 7 5 6號之 良』’該探針構造係包含由探針 徵係在於：該探針頭端係設為多 尾、r則皆設為單一規格之插接部 針套请裡；而探針套筒裡部係設 國專利公 試裝置』 是否觸及 具得知判 國專利公 無線測試 裝置底座 而定置以 通過此探 讓測試探 國專利公 針構造改 成，其特 之規格， 插置入探There is a chain. V. Description of Invention (2) On the first surface of the insulating film, the surface of the insulating film contacts to form a space between the first surface of the insulating film and a probe pattern, which is extended to form a pattern,俾 By using 3, Chinese people's "cross-bar probe probe, the device includes a needle, through the transmission of the cross-bar, let the wrong installation. 4. Chinese people's "Floating elastic probe test device, including a top parallel to the bottom of the probe board, the extension needle retention piece, for straight alignment. 5. Chinese people's "composite jig probe and probe sleeves of different diameters and sizes, this plug-in part can be the first surface of the substrate and the first surface of the substrate and the" This part of the insulating film can enter the second surface of the space / insulating film. The probes and raised probes on the edge film form a test card. Announcement No. 4 9 7 7 1 8-of- Probes such as: 3) The test device disclosed ^ Le Er probe, a cross bar and two probe connectors, and the connector set on the circuit board under test is broken by the wire of the second probe. Announcement No. 3 6 8 6 0 No. 2 Device ”(as shown in Annex 4), test probes with fixed probe plate, a top plate and a probe retaining plate set on the probe plate. The needle also stretched through this probe and printed circuit board test under the bulletin No. 3 7 8 7 5 6 "The structure of the probe consists of a probe that consists of the following: If the multi-tail and r are set to a single specification, the needle sleeve of the plug-in part should be inside; and the inner part of the probe sleeve is equipped with a national patent trial installation Whether the "hit with well known arbitration Patent wireless testing apparatus to the base may be set by this test probe allows the probe needles Patent configured to change as well, which the Japanese specification, the probe is inserted into

第7頁 1»^ 1232952 五、發明說明（3) 彈簧尾端係直接與電線頭端連接導通，探針 為鋼棒’該等銅棒可直接插置入電路測試機: )的導雖通然Λ述之/則試裝置，可以測1式待測物上之接腳⑻Ν (間與接腳⑴Ν)對位上之不準確分m板 (pm跑位，讓作t者電料如㈣^/ =^接腳 :電路板⑽)與接腳(PIN)接觸之動作，此方法再增加複，電 ;ϊ=腳(pin)容易不慎被"變形而使產品成本增 加進而影響產能。 又因近來車載類產品越來越多，其出pin型式全為 夾PIN類型，然而，夾接腳（piN)類產品其piN腳長度不二 ，其功能測試以廠内一般型式電測有程度上的因難X，因 印刷電路板（PCB)與接腳（PIN)不易完全接觸或接腳（piN)、、、 與印刷電路板（PCB)的載板（PAD)接觸不到，故常造成接觸 不良’而導致測試不易之作業方式。爰是， 【發明内容】 本發明之主要目的，在於解決上述之缺失，避免缺失 的存在，本發明利用可為探針之導電端與接腳（piN)直接 接觸，因探針有其伸縮量，且有多種類供選擇故其對位容 易，接觸上無接觸不到之疑慮。 ^ 本發明之另一目的，在於該機座以手動操作簡單方便 ’可快速對位，又可避免重複之動作而增加作業時間影響Page 7 1 »^ 1232952 V. Description of the invention (3) The end of the spring is directly connected to the end of the wire, and the probe is a steel rod. These copper rods can be directly inserted into the circuit tester:) However, the test device described in Λ can test the inaccurate sub-board (pm running position) of the pin ⑻N (intermediate and pin ⑴) on the type 1 object to be tested. ^ / = ^ Pin: the action of contacting the circuit board ⑽) with the pin (PIN). This method adds more power and electricity; ϊ = pin (pin) is easy to be accidentally " deformed, which increases the cost of the product and affects the production capacity. . Recently, due to the increasing number of automotive products, the pin types are all pin PIN types. However, the pin length of the pin (piN) products is not the same. The functional test is based on the general electrical test in the factory. Due to difficulty X, because the printed circuit board (PCB) and the pin (PIN) are not easy to completely contact or the pin (piN), and the printed circuit board (PCB) carrier board (PAD) can not contact, so often caused Poor contact 'makes the test difficult.爰 Yes, [Contents of the invention] The main purpose of the present invention is to solve the above-mentioned deficiencies and avoid the existence of the deficiencies. The present invention utilizes the direct contact between the conductive end of the probe and the pin (piN), because the probe has its telescopic amount. , And there are many types to choose from, so it is easy to align, and there is no doubt that it cannot be touched. ^ Another object of the present invention is that the machine base is easy and convenient for manual operation. ′ It can be quickly aligned, and it can avoid repetitive actions and increase the impact of operation time.

1232952 五、發明說明（4) 產能。 本發明之又一目的，在於其功能上可推展於連接器（c ONNECTOR)接續（即產品出PIN端與CONNECTOR接人之:丨） 及BUBBER全導通等作業，使用上可解決多種功能二$ 3接 續問題。 為達上述之目的，本發明之夾接腳（p丨N )專用測試機 座，用以測試接腳（PIN)導通良率之機座，其包括有二座 體，一設於座體上之平台，一設於平台兩側之導引機構， 一套設於前述導引機構内以一驅動機構連接驅動之測試元 件，並於測試元件一側設有與導線連接之複數導電端，俾 藉，具接腳（PIN)之待測試物置設於平台上，操作驅動機 構使測試元件往待測試物之接腳（P丨N )方向推進，讓導電 端與接腳（PI N)之間形成一對一完全及精確的接觸，以測 试4接腳（PIN)之良率，降低誤判率並可避免接腳（pm)受 力過度而變形。 【實施方式】 有關本發明之詳細說明及技術内容，現就配合圖式說 明如下： 、 清參閱第1 、2、3 — 1圖，係本發明之立體外觀、 分解及連續作動示意圖，如圖所示：本發明之夾接腳（PI N)專用測試機座，用以測試接腳（p IN)導通良率之機座， 該機座主要由一座體1 、一平台2、一導引機構3、一測 試兀件4及一驅動機構5所構成； δ亥座體1係以電木板為母材；1232952 V. Description of invention (4) Production capacity. Another object of the present invention is that its functions can be extended to the connector (c ONNECTOR) connection (that is, the PIN end of the product and the CONNECTOR access: 丨) and full conduction of BUBBER, etc., can solve a variety of functions. 3 continued problems. In order to achieve the above-mentioned purpose, the special test stand for the pin (p 丨 N) of the present invention is used to test the lead (PIN) conduction yield of the stand, which includes two bases, one on the base A platform, a guide mechanism provided on both sides of the platform, a set of test elements connected to the drive by a driving mechanism provided in the aforementioned guide mechanism, and a plurality of conductive ends connected to the wires on one side of the test element, The test object with a pin (PIN) is placed on the platform, and the driving mechanism is operated to advance the test element toward the pin (P 丨 N) of the test object, so that the conductive end and the pin (PI N) Form a one-to-one complete and precise contact to test the yield of the 4-pin (PIN), reduce the rate of false positives, and avoid excessive deformation of the pin (pm). [Embodiment] The detailed description and technical contents of the present invention are described below with reference to the drawings: 1. Refer to Figures 1, 2, 3 and 1 for a schematic view of the three-dimensional appearance, disassembly and continuous operation of the present invention, as shown in the figure. Shown: A dedicated test stand for the pin (PI N) of the present invention is used to test the lead (p IN) conduction yield of the stand, which is mainly guided by a body 1, a platform 2, a guide The mechanism 3, a test element 4 and a driving mechanism 5 are formed; δHai body 1 is made of bakelite as the base material;

1232952 五、發明說明（5) 該平台2係以電木板為母材，並透過複數之鎖固件2 4鎖固於上述座體1上，於平台2上凸設有複數之定位塊 2 1及至少一固定柱2 2 ，並於平台2對應測試元件4之 導電端4 1位置處凹設有一供待測試物6之接腳6 1 ( PI N)置放之凹槽23 ; 該導弓丨機構3係配置於上述平台2周圍處，其包括有 兩組前行配置於平台2兩側並鎖固於座體1上之定位件3 1及一分別配置於該定位件3 1上之導執3 2，其中該定 位件3可以電木板為母材，該導執3 2可為圓柱狀之金屬 材質； 該 機構3 之位置 順暢， 設有複 另端皆 該 有一定 ’再於 位片5 測試元 俾上，扳 測試物1232952 V. Description of the invention (5) The platform 2 is made of bakelite as the base material and is fixed to the above-mentioned base 1 through a plurality of locking members 24. A plurality of positioning blocks 21 and 1 are protruded on the platform 2. At least one fixing post 2 2 and a recess 23 for placing the pin 6 1 (PI N) of the object 6 to be tested at a position corresponding to the conductive end 41 of the test element 4 on the platform 2; the guide bow 丨The mechanism 3 is arranged around the above-mentioned platform 2 and includes two sets of positioning members 31 arranged forward on both sides of the platform 2 and locked on the base 1 and a guide respectively arranged on the positioning member 31. Holder 32, where the positioning member 3 can be the base material of the bakelite, and the guide holder 3 2 can be a cylindrical metal material; the position of the mechanism 3 is smooth, and the other end should have a certain 're-position piece' 5 On the test element, pull the test object

測試元件43 2 軸承 元件 之導執 處設有 於測試 數可為 連接有 驅動機 位片5 扳動件 2内之 件4上 藉，具 動驅動 6之接 探針 一導 構5 5 3 驅動 以帶 接腳 機構 腳6 係以電木板為母材’係套設於上述導弓 内，並透過測試元件4與導執3 2套j 4 1 ，讓測試元件4在導執3 2上滑賃 4 一側前應上述平台2之凹槽2 3處ί 之導電端4 2 ，並於每一導電端4 23 線4 3以供導電及互換訊號之用； 包括有一底座5 1 ，於底座5 1上鎖Ε 並於定位片5 2上鎖固有一扳動件5〔 一端透過一曲臂5 5連接有一套置於交 車由5 4，該驅動軸5 4係鎖固於上述^ 動其進退之往復作動； 6 1 ( ΡIΝ )之待測試物6置設於平台2 5之扳動件5 3以帶動測試元件4往羊 1 (ρ I Ν)方向推進，讓測試元件4之導Test element 43 2 The bearing of the bearing element is provided on the test number, which can be borrowed for the piece 4 inside the trigger piece 2 and the trigger piece 2, and the probe 6 with the drive piece 6 and a guide structure 5 5 3 drive. The pin 6 with the pin mechanism is based on the bakelite as the base material and is set inside the guide bow, and the test element 4 slides on the guide 32 through the test element 4 and the guide 3 2 sets of j 4 1. In front of one side, the conductive end 4 2 of the above-mentioned groove 2 of the platform 2 should be 4 and each conductive end 4 23 wire 4 3 for conducting and interchange signals; including a base 5 1 at the base 5 1Lock Ε and lock the positioning piece 5 2 A locking element 5 [One end is connected through a crank arm 5 5 A set is placed in the delivery vehicle 5 4 The drive shaft 5 4 is locked to the above movement The reciprocating action of its advance and retreat; 6 1 (ΡΝΝ) to be tested 6 is set on the platform 2 5 the trigger 5 3 to drive the test element 4 in the direction of sheep 1 (ρ I Ν), let the test element 4 guide

第10頁 1232952Page 10 1232952

電端4 2與待 全及精確的接 接腳6 1之良 請參閱第 意圖，如圖所 )之待測試物 内，該待測試 一側之凹槽2 驅動軸5 4之 有效地推動驅 導執3 2内滑 試物6之接腳 使之可以準確 電測時如無訊 因其重複作業 產品成本增加 =試物6之接腳6 1(PIN)間形成一對一完 然後透過可為探針之導電端4 2測試JL 率，以降低誤判率。 /、 3 3 — 2圖 係本發明之連續作動示 不：本發明使用時，先將具接腳6丄（/in 6卡掣於平台2之定位塊2丄及固定柱2 2 物6之接腳6 χ (PIN)可以排置於平台2 3處，然後使驅動機構5上之扳動件5 3往 方向扳動，該扳動件5 3透過曲臂5 5便可 動軸5 4並帶動測試元件4在導引機構3之 動，且讓測試TL件4上之導電端4 2與待測 6 1 ( PIN )以一對一方式完全對位接觸， 为辨那一根接腳（PIN)跑位，以避免作業者 號顯示則一再重複測試作業之費時工序，或 令接腳6 1 (P IN)容易不慎被壓彎變形而使 進而影響產能之缺失。For the goodness of the electrical terminal 4 2 and the pin 6 1 to be completed and accurate, please refer to the intent, as shown in the figure. In the test object, the groove 2 on the side to be tested effectively drives the drive shaft 5 4. Guide 3 2 The pin of the inner test specimen 6 makes it possible to make accurate electrical measurements. If there is no message due to repeated operation, the cost of the product increases = one of the pins 6 of the test specimen 6 1 (PIN) is formed and then passed. Test the JL rate for the conductive end 4 2 of the probe to reduce the false positive rate. /, 3 3 — 2 is a continuous action of the present invention: when the present invention is used, firstly, the pin 6 丄 (/ in 6 is locked on the positioning block 2 丄 of the platform 2 and the fixing post 2 2 of the object 6). Pin 6 χ (PIN) can be arranged on the platform 2 3, and then the trigger 5 3 on the driving mechanism 5 is pulled in the direction, and the trigger 5 3 can move the shaft 5 4 through the crank arm 5 5 and Drive the test element 4 in the guide mechanism 3, and let the conductive end 4 2 on the test TL 4 and the test 6 1 (PIN) be fully aligned in a one-to-one manner to identify which pin ( PIN) running position, to avoid the operator's number display and repeat the time-consuming process of testing, or to make pin 6 1 (P IN) easily deformed by bending, which will affect the lack of productivity.

進一步，該待測試物6可為液晶顯示器（LCD )，且 本發明之功能上又可推展於連接器（c〇nnect〇r)接續（即產 品出PIN端與CONNECTOR接合之電測）及BuBBER全導通等作 業’使用上可解決多種功能測試之接續問題。 又進一步，可為探針之導電端4 2，因探針有豆伸縮 量，且有多種類供選擇故其對位容易，接觸上無接觸不到 之疑慮。Further, the test object 6 may be a liquid crystal display (LCD), and the function of the present invention may be extended to the connector (connector) connection (that is, the electrical test of the PIN end of the product and the CONNECTOR) and BuBBER. Operation such as full continuity can solve the continuity problems of various functional tests. Furthermore, it can be the conductive end 42 of the probe. Because the probe has a bean expansion amount and there are many types to choose from, it is easy to align and there is no doubt that it cannot be touched.

再進一步，本發明以手動操作簡單方便，可快速對位Furthermore, the present invention is simple and convenient with manual operation and can be quickly aligned.

1232952 五、發明說明（7) ，又可避免重複之動作而增加作業時間影響產能。 惟以上所述者，僅為本發明之較佳實施例而已，當不 能以之限定本發明實施之範圍，即大凡依本發明申請專利 範圍所作之均等變化與修飾，皆應仍屬本發明專利涵蓋之 範圍内。1232952 V. Description of the invention (7), which can avoid repetitive actions and increase operation time to affect production capacity. However, the above are only the preferred embodiments of the present invention. When the scope of implementation of the present invention cannot be limited, that is, all equal changes and modifications made in accordance with the scope of the patent application of the present invention shall still belong to the patent of the present invention Covered.

第12頁 1232952 圖式簡單說明 【圖式簡單說明】 第1圖，係本發明之立體外觀示意圖。 第2圖，係本發明之立體分解示意圖。 第3 — 1〜3 — 3圖，係本發明之連續作動示意圖。 【圖式符號說明】 Μ ^.....................1 ^ ^.....................2 定位塊...................21 固定柱...................22Page 12 1232952 Brief description of the drawings [Simplified description of the drawings] Figure 1 is a schematic diagram of the three-dimensional appearance of the present invention. FIG. 2 is a three-dimensional exploded view of the present invention. Figures 3-1 to 3-3 are schematic diagrams of continuous operation of the present invention. [Illustration of Symbols] Μ ^ ........................ 1 ^ ^ ........ ... 2 Positioning block ... 21 Fixing post ... 22

凹槽....................23 鎖固件...................24 導引機構...................3 定位件...................31 導軌....................3 2 測試元件............. 4 車由承....................4 1 導電端...................42 導線....................4 3 驅動機構...................5 底座....................51 定位片...................52 扳動件...................53 驅動軸...................54 曲臂....................55Groove ... 23 Locking ... 24 Guide mechanism ... ....... 3 Positioning Parts ... 31 Guides ... ..... 3 2 test elements ........ 4 car by .............. ..4 1 Conductive terminal ... 42 Wire ... 4 3 Drive Mechanism ... 5 Base ... 51 Positioning piece ... .............. 52 Trigger ... 53 Drive shaft ... ......... 54 Crank Arm ......... 55

第13頁 1232952 圖式簡單說明 待測試物...................6 接腳（PIN)................6 1 ·· IHHil 第14頁Page 121232952 Schematic description of the test object ......... 6 Pin (PIN) .............. .. 6 1 ·· IHHil p. 14

Claims (1)

12329521232952 用以測試接腳 1 、 一種夾接腳（PIN)專用測試機座 (PIN)導通良率之機座，該機座包括有： 一座體；· 一設於座體上之平台； 一設於平台周圍導引機構；及 袢：ΐ設於前述導引機構内以一驅動機構驅動之測試元 值=測试儿件一側設有與導線連接之複數導電端； 驅動L1:具接腳(ΡΙΝ)之待測試物置設於平台上，驅動 讓導電^ ϊ I 件往待測試物之接腳（ριν)方向推進， m ?腳(ριν)之間形成一對-完全及精確的接觸 降低决判率並避免接腳（PIN)受力過度而變形。 2如申味專利範圍第1項所述之夾接腳（p I n )專用 測試機座，其巾，該座體係以電木板為母：腳(PIN)專用 、ΈΙ # 2广如申睛專利範圍第1項所述之夾接腳（P 1 N )專用 上’其中’該平台係以電木板為母材。 別^ ί如申請專利範圍第1項所述之夾接腳（Ρ I Ν )專用 ' 座其中’該平台上凸設有複數之定位塊及至少一 固定柱。 如申睛專利範圍第1項所述之夾接腳（ρ IΝ)專用 =座，其中，該平台對應導電端位置處凹設有一專供待 測5式物之接腳（PIN)置放之凹槽。 > 6 如申請專利範圍第1項所述之夾接腳（ρ I ν )專用 測Λ機座’其中’該導引機構包括有兩組前行配置並鎖固 、’肢上之疋位件及一分別配置於該定位件組上之導軌。A base for testing pin 1 and a pin-on-pin (PIN) special test base (PIN) conduction yield. The base includes: a base; · a platform on the base; Guide mechanism around the platform; and 袢: test element value set in the aforementioned guide mechanism and driven by a drive mechanism = a plurality of conductive ends connected to the lead wire on one side of the test piece; drive L1: with pin ( The test object of PIN) is placed on the platform and driven to move the conductive ^ ϊ I piece toward the pin (ριν) of the test object, forming a pair between m? Feet (ριν)-complete and accurate contact reduction decision Judgment rate and avoid excessive deformation of the pin (PIN). 2As described in item 1 of Shenwei's patent scope, the special test stand for p In (p I n), the towel, the seat system uses bakelite as the mother: dedicated for pin (PIN), ΈΙ # 2 The clamping pin (P 1 N) described in item 1 of the patent scope is exclusively provided with 'where' the platform is based on bakelite wood. Do not ^ As described in item 1 of the scope of the patent application, the pin holder (P IN) is dedicated to a pedestal. The platform is provided with a plurality of positioning blocks and at least one fixing post. As described in item 1 of Shenyan's patent scope, the clip pin (ρ IN) is dedicated to a socket, wherein a corresponding pin (PIN) on the platform corresponding to the position of the conductive end is recessed for placement of the pin 5 to be tested. Groove. > 6 As described in the scope of the patent application No. 1 special clamp pin (ρ I ν) special measurement Λ frame 'where' the guide mechanism includes two sets of forward configuration and locking, 'limb position Piece and a guide rail respectively arranged on the positioning piece group. 第15頁Page 15