TW538257B - Microlithography projection objective - Google Patents
Microlithography projection objective Download PDFInfo
- Publication number
- TW538257B TW538257B TW090118732A TW90118732A TW538257B TW 538257 B TW538257 B TW 538257B TW 090118732 A TW090118732 A TW 090118732A TW 90118732 A TW90118732 A TW 90118732A TW 538257 B TW538257 B TW 538257B
- Authority
- TW
- Taiwan
- Prior art keywords
- mirror
- mirrors
- patent application
- item
- projection objective
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B13/00—Optical objectives specially designed for the purposes specified below
- G02B13/18—Optical objectives specially designed for the purposes specified below with lenses having one or more non-spherical faces, e.g. for reducing geometrical aberration
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/02—Catoptric systems, e.g. image erecting and reversing system
- G02B17/06—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror
- G02B17/0647—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using more than three curved mirrors
- G02B17/0657—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using more than three curved mirrors off-axis or unobscured systems in which all of the mirrors share a common axis of rotational symmetry
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70233—Optical aspects of catoptric systems, i.e. comprising only reflective elements, e.g. extreme ultraviolet [EUV] projection systems
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Lenses (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Optical Elements Other Than Lenses (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10037870A DE10037870A1 (de) | 2000-08-01 | 2000-08-01 | 6-Spiegel-Mikrolithographie-Projektionsobjektiv |
EP01116916A EP1178356B1 (de) | 2000-08-01 | 2001-07-11 | 6-Spiegel-Mikrolithographie-Projektionsobjektiv |
Publications (1)
Publication Number | Publication Date |
---|---|
TW538257B true TW538257B (en) | 2003-06-21 |
Family
ID=26006601
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW090118732A TW538257B (en) | 2000-08-01 | 2001-08-01 | Microlithography projection objective |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP2002107630A (ko) |
KR (1) | KR100787525B1 (ko) |
TW (1) | TW538257B (ko) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3938040B2 (ja) | 2002-12-27 | 2007-06-27 | キヤノン株式会社 | 反射型投影光学系、露光装置及びデバイス製造方法 |
JP2004252358A (ja) * | 2003-02-21 | 2004-09-09 | Canon Inc | 反射型投影光学系及び露光装置 |
KR101052386B1 (ko) * | 2003-09-27 | 2011-07-28 | 칼 짜이스 에스엠테 게엠베하 | 영점 교차 온도 근처에서 열팽창 계수의 온도에 따라, 상이한 기울기 부호를 갖는 재료로 구성된 미러들을 구비한 초단파 자외선 투영 광학계 |
JP2005172988A (ja) * | 2003-12-09 | 2005-06-30 | Nikon Corp | 投影光学系および該投影光学系を備えた露光装置 |
JP2005189247A (ja) | 2003-12-24 | 2005-07-14 | Nikon Corp | 投影光学系および該投影光学系を備えた露光装置 |
WO2006094729A2 (en) | 2005-03-08 | 2006-09-14 | Carl Zeiss Smt Ag | Microlithography projection system with an accessible diaphragm or aperture stop |
CN101171547A (zh) * | 2005-05-03 | 2008-04-30 | 卡尔·蔡司Smt股份公司 | 使用偏振光的微光刻曝光装置及具有凹面主镜和凹面辅镜的微光刻投射*** |
EP1886190B1 (en) | 2005-06-02 | 2012-10-03 | Carl Zeiss SMT GmbH | Microlithography projection objective |
KR101592136B1 (ko) | 2007-10-26 | 2016-02-04 | 칼 짜이스 에스엠티 게엠베하 | 결상 광학 시스템 및 이러한 유형의 결상 광학 시스템을 갖는 마이크로리소그래피용 투영 노광 장치 |
JP5096530B2 (ja) * | 2010-07-26 | 2012-12-12 | カール・ツァイス・エスエムティー・ゲーエムベーハー | ゼロ転移温度周辺の熱膨張係数に応じて温度の上昇に対する傾きの符号が異なる材料で構成されたミラーを備えたeuv投影レンズ |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5686728A (en) * | 1996-05-01 | 1997-11-11 | Lucent Technologies Inc | Projection lithography system and method using all-reflective optical elements |
-
2001
- 2001-07-31 JP JP2001232558A patent/JP2002107630A/ja active Pending
- 2001-07-31 KR KR1020010046237A patent/KR100787525B1/ko not_active IP Right Cessation
- 2001-08-01 TW TW090118732A patent/TW538257B/zh not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
JP2002107630A (ja) | 2002-04-10 |
KR20020011340A (ko) | 2002-02-08 |
KR100787525B1 (ko) | 2007-12-21 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
GD4A | Issue of patent certificate for granted invention patent | ||
MM4A | Annulment or lapse of patent due to non-payment of fees |