TW448587B - Advanced semiconductor devices fabricated with passivated high aluminum content III-V materials - Google Patents
Advanced semiconductor devices fabricated with passivated high aluminum content III-V materialsInfo
- Publication number
- TW448587B TW448587B TW088113055A TW88113055A TW448587B TW 448587 B TW448587 B TW 448587B TW 088113055 A TW088113055 A TW 088113055A TW 88113055 A TW88113055 A TW 88113055A TW 448587 B TW448587 B TW 448587B
- Authority
- TW
- Taiwan
- Prior art keywords
- materials
- semiconductor devices
- content
- aluminum content
- devices fabricated
- Prior art date
Links
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 title 1
- 229910052782 aluminium Inorganic materials 0.000 title 1
- 239000000463 material Substances 0.000 title 1
- 239000004065 semiconductor Substances 0.000 title 1
- 229910000980 Aluminium gallium arsenide Inorganic materials 0.000 abstract 2
- 230000015572 biosynthetic process Effects 0.000 abstract 1
- 230000007797 corrosion Effects 0.000 abstract 1
- 238000005260 corrosion Methods 0.000 abstract 1
- 238000002347 injection Methods 0.000 abstract 1
- 239000007924 injection Substances 0.000 abstract 1
- 239000000203 mixture Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/005—Processes
- H01L33/0095—Post-treatment of devices, e.g. annealing, recrystallisation or short-circuit elimination
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/005—Processes
- H01L33/0062—Processes for devices with an active region comprising only III-V compounds
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/26—Materials of the light emitting region
- H01L33/30—Materials of the light emitting region containing only elements of Group III and Group V of the Periodic Table
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/44—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the coatings, e.g. passivation layer or anti-reflective coating
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S2301/00—Functional characteristics
- H01S2301/17—Semiconductor lasers comprising special layers
- H01S2301/176—Specific passivation layers on surfaces other than the emission facet
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/18—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities
- H01S5/183—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL]
- H01S5/18308—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL] having a special structure for lateral current or light confinement
- H01S5/18311—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL] having a special structure for lateral current or light confinement using selective oxidation
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Led Devices (AREA)
- Semiconductor Lasers (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/231,411 US6201264B1 (en) | 1999-01-14 | 1999-01-14 | Advanced semiconductor devices fabricated with passivated high aluminum content III-V materials |
Publications (1)
Publication Number | Publication Date |
---|---|
TW448587B true TW448587B (en) | 2001-08-01 |
Family
ID=22869138
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW088113055A TW448587B (en) | 1999-01-14 | 1999-07-30 | Advanced semiconductor devices fabricated with passivated high aluminum content III-V materials |
Country Status (6)
Country | Link |
---|---|
US (2) | US6201264B1 (zh) |
JP (1) | JP2000208811A (zh) |
KR (1) | KR20000053477A (zh) |
DE (1) | DE19944020A1 (zh) |
GB (1) | GB2345792A (zh) |
TW (1) | TW448587B (zh) |
Families Citing this family (32)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6314118B1 (en) * | 1998-11-05 | 2001-11-06 | Gore Enterprise Holdings, Inc. | Semiconductor device with aligned oxide apertures and contact to an intervening layer |
TW502458B (en) * | 1999-06-09 | 2002-09-11 | Toshiba Corp | Bonding type semiconductor substrate, semiconductor light emission element and manufacturing method thereof |
US6614056B1 (en) * | 1999-12-01 | 2003-09-02 | Cree Lighting Company | Scalable led with improved current spreading structures |
US6674777B1 (en) * | 2000-08-31 | 2004-01-06 | Honeywell International Inc. | Protective side wall passivation for VCSEL chips |
US6525335B1 (en) * | 2000-11-06 | 2003-02-25 | Lumileds Lighting, U.S., Llc | Light emitting semiconductor devices including wafer bonded heterostructures |
DE10056476B4 (de) * | 2000-11-15 | 2012-05-03 | Osram Opto Semiconductors Gmbh | Strahlungsemittierender Halbleiterkörper und Verfahren zu dessen Herstellung |
US6791119B2 (en) | 2001-02-01 | 2004-09-14 | Cree, Inc. | Light emitting diodes including modifications for light extraction |
US6794684B2 (en) | 2001-02-01 | 2004-09-21 | Cree, Inc. | Reflective ohmic contacts for silicon carbide including a layer consisting essentially of nickel, methods of fabricating same, and light emitting devices including the same |
US6740906B2 (en) * | 2001-07-23 | 2004-05-25 | Cree, Inc. | Light emitting diodes including modifications for submount bonding |
US7211833B2 (en) * | 2001-07-23 | 2007-05-01 | Cree, Inc. | Light emitting diodes including barrier layers/sublayers |
US6891202B2 (en) * | 2001-12-14 | 2005-05-10 | Infinera Corporation | Oxygen-doped Al-containing current blocking layers in active semiconductor devices |
US7858403B2 (en) | 2001-10-31 | 2010-12-28 | Cree, Inc. | Methods and systems for fabricating broad spectrum light emitting devices |
US20030090103A1 (en) * | 2001-11-09 | 2003-05-15 | Thomas Becker | Direct mailing device |
US6995032B2 (en) * | 2002-07-19 | 2006-02-07 | Cree, Inc. | Trench cut light emitting diodes and methods of fabricating same |
US7112830B2 (en) * | 2002-11-25 | 2006-09-26 | Apa Enterprises, Inc. | Super lattice modification of overlying transistor |
CN1729600B (zh) * | 2002-12-20 | 2010-05-26 | 克里公司 | 具有自对准半导体平台和接触层的半导体器件和相关器件的制造方法 |
TWI266435B (en) * | 2004-07-08 | 2006-11-11 | Sharp Kk | Nitride-based compound semiconductor light emitting device and fabricating method thereof |
JP4371956B2 (ja) * | 2004-09-02 | 2009-11-25 | シャープ株式会社 | 窒化物系化合物半導体発光素子およびその製造方法 |
JP4767035B2 (ja) * | 2005-04-12 | 2011-09-07 | シャープ株式会社 | 窒化物系半導体発光素子およびその製造方法 |
JP4892940B2 (ja) | 2005-11-29 | 2012-03-07 | 富士ゼロックス株式会社 | 面発光型半導体レーザ装置およびその製造方法 |
JP4945167B2 (ja) * | 2006-05-12 | 2012-06-06 | スタンレー電気株式会社 | 半導体発光素子の製造方法及び該製造方法により製造された半導体発光素子の実装方法 |
JP2008091862A (ja) * | 2006-09-08 | 2008-04-17 | Sharp Corp | 窒化物半導体発光素子および窒化物半導体発光素子の製造方法 |
JP2008117824A (ja) * | 2006-11-01 | 2008-05-22 | Sharp Corp | 窒化物系半導体素子の製造方法 |
US7955875B2 (en) * | 2008-09-26 | 2011-06-07 | Cree, Inc. | Forming light emitting devices including custom wavelength conversion structures |
JP5754624B2 (ja) | 2010-05-25 | 2015-07-29 | 株式会社リコー | 面発光レーザ素子、面発光レーザアレイ、光走査装置、画像形成装置及び面発光レーザ素子の製造方法 |
JP5721055B2 (ja) * | 2010-06-11 | 2015-05-20 | 株式会社リコー | 面発光レーザ素子、面発光レーザアレイ、光走査装置、画像形成装置及び面発光レーザ素子の製造方法 |
DE102010026518A1 (de) | 2010-07-08 | 2012-01-12 | Osram Opto Semiconductors Gmbh | Leuchtdiodenchip und Verfahren zur Herstellung eines Leuchtdiodenchips |
JP5612407B2 (ja) * | 2010-09-13 | 2014-10-22 | 浜松ホトニクス株式会社 | 半導体受光素子及び半導体受光素子の製造方法 |
RU2560804C1 (ru) * | 2014-06-26 | 2015-08-20 | Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования "Сибирский государственный аэрокосмический университет имени академика М.Ф. Решетнева" (СибГАУ) | Способ изготовления волноводов миллиметрового диапазона |
US10749070B2 (en) * | 2016-05-20 | 2020-08-18 | Lumileds Llc | Method of forming a P-type layer for a light emitting device |
KR102125313B1 (ko) * | 2018-12-20 | 2020-06-22 | 한국광기술원 | 산화막이 형성된 마이크로 led 및 그의 제조방법 |
KR20220107309A (ko) * | 2021-07-27 | 2022-08-02 | 충칭 콘카 포토일렉트릭 테크놀로지 리서치 인스티튜트 컴퍼니 리미티드 | Led 에피택셜 구조 및 이의 제조 방법, led 장치 |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01268174A (ja) * | 1988-04-20 | 1989-10-25 | Hitachi Cable Ltd | 発光素子の製造方法 |
JP2559536B2 (ja) * | 1990-12-17 | 1996-12-04 | 信越半導体株式会社 | 発光素子の製造方法 |
US5262360A (en) | 1990-12-31 | 1993-11-16 | The Board Of Trustees Of The University Of Illinois | AlGaAs native oxide |
JP3152474B2 (ja) * | 1991-01-29 | 2001-04-03 | 三洋電機株式会社 | 発光ダイオ−ド |
US5214306A (en) | 1991-01-29 | 1993-05-25 | Sanyo Electric Co., Ltd. | Light emitting diode |
US5327448A (en) * | 1992-03-30 | 1994-07-05 | The Board Of Trustees Of The University Of Illinois | Semiconductor devices and techniques for controlled optical confinement |
JP2817590B2 (ja) * | 1993-09-24 | 1998-10-30 | 信越半導体株式会社 | 発光素子の製造方法 |
US5400354A (en) * | 1994-02-08 | 1995-03-21 | Ludowise; Michael | Laminated upper cladding structure for a light-emitting device |
US5550081A (en) * | 1994-04-08 | 1996-08-27 | Board Of Trustees Of The University Of Illinois | Method of fabricating a semiconductor device by oxidizing aluminum-bearing 1H-V semiconductor in water vapor environment |
US5517039A (en) | 1994-11-14 | 1996-05-14 | Hewlett-Packard Company | Semiconductor devices fabricated with passivated high aluminum-content III-V material |
US5798537A (en) * | 1995-08-31 | 1998-08-25 | Kabushiki Kaisha Toshiba | Blue light-emitting device |
JP3182346B2 (ja) * | 1995-08-31 | 2001-07-03 | 株式会社東芝 | 青色発光素子及びその製造方法 |
JPH0983061A (ja) * | 1995-09-08 | 1997-03-28 | Sharp Corp | 半導体レーザ素子の製造方法および半導体レーザ素子製造装置 |
US5888370A (en) * | 1996-02-23 | 1999-03-30 | Board Of Regents, The University Of Texas System | Method and apparatus for fractionation using generalized dielectrophoresis and field flow fractionation |
JP3207773B2 (ja) * | 1996-12-09 | 2001-09-10 | 株式会社東芝 | 化合物半導体発光素子及びその製造方法 |
JP3710573B2 (ja) * | 1996-09-30 | 2005-10-26 | シャープ株式会社 | 窒化ガリウム系化合物半導体発光素子の電極構造 |
JP2967743B2 (ja) * | 1997-01-14 | 1999-10-25 | 日本電気株式会社 | n型窒化ガリウム系半導体のコンタクト電極及びその形成方法 |
JPH10242507A (ja) * | 1997-02-21 | 1998-09-11 | Oki Electric Ind Co Ltd | 発光ダイオードおよびその製造方法 |
US5886370A (en) * | 1997-05-29 | 1999-03-23 | Xerox Corporation | Edge-emitting semiconductor lasers |
-
1999
- 1999-01-14 US US09/231,411 patent/US6201264B1/en not_active Expired - Lifetime
- 1999-04-16 US US09/293,277 patent/US6048748A/en not_active Expired - Lifetime
- 1999-07-30 TW TW088113055A patent/TW448587B/zh not_active IP Right Cessation
- 1999-09-14 DE DE19944020A patent/DE19944020A1/de not_active Withdrawn
-
2000
- 2000-01-05 GB GB0000106A patent/GB2345792A/en not_active Withdrawn
- 2000-01-12 JP JP2000003509A patent/JP2000208811A/ja active Pending
- 2000-01-13 KR KR1020000001494A patent/KR20000053477A/ko not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
GB2345792A (en) | 2000-07-19 |
US6048748A (en) | 2000-04-11 |
US6201264B1 (en) | 2001-03-13 |
GB0000106D0 (en) | 2000-02-23 |
JP2000208811A (ja) | 2000-07-28 |
KR20000053477A (ko) | 2000-08-25 |
DE19944020A1 (de) | 2000-07-27 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
GD4A | Issue of patent certificate for granted invention patent | ||
MK4A | Expiration of patent term of an invention patent |