TW301013B - The method and apparatus for cleaning & drying semiconductor - Google Patents

The method and apparatus for cleaning & drying semiconductor Download PDF

Info

Publication number
TW301013B
TW301013B TW85102118A TW85102118A TW301013B TW 301013 B TW301013 B TW 301013B TW 85102118 A TW85102118 A TW 85102118A TW 85102118 A TW85102118 A TW 85102118A TW 301013 B TW301013 B TW 301013B
Authority
TW
Taiwan
Prior art keywords
water
organic solvent
layer
supply
washing
Prior art date
Application number
TW85102118A
Other languages
English (en)
Chinese (zh)
Inventor
Kanichi Kadotani
Makio Tsubota
Original Assignee
Komatsu Mfg Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Komatsu Mfg Co Ltd filed Critical Komatsu Mfg Co Ltd
Application granted granted Critical
Publication of TW301013B publication Critical patent/TW301013B/zh

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02041Cleaning
    • H01L21/02043Cleaning before device manufacture, i.e. Begin-Of-Line process
    • H01L21/02052Wet cleaning only
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B3/00Cleaning by methods involving the use or presence of liquid or steam
    • B08B3/04Cleaning involving contact with liquid
    • B08B3/08Cleaning involving contact with liquid the liquid having chemical or dissolving effect
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F26DRYING
    • F26BDRYING SOLID MATERIALS OR OBJECTS BY REMOVING LIQUID THEREFROM
    • F26B21/00Arrangements or duct systems, e.g. in combination with pallet boxes, for supplying and controlling air or gases for drying solid materials or objects
    • F26B21/14Arrangements or duct systems, e.g. in combination with pallet boxes, for supplying and controlling air or gases for drying solid materials or objects using gases or vapours other than air or steam, e.g. inert gases
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F26DRYING
    • F26BDRYING SOLID MATERIALS OR OBJECTS BY REMOVING LIQUID THEREFROM
    • F26B5/00Drying solid materials or objects by processes not involving the application of heat
    • F26B5/005Drying solid materials or objects by processes not involving the application of heat by dipping them into or mixing them with a chemical liquid, e.g. organic; chemical, e.g. organic, dewatering aids
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • H01L21/67028Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Mechanical Engineering (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Molecular Biology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
TW85102118A 1995-09-27 1996-02-23 The method and apparatus for cleaning & drying semiconductor TW301013B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24969895 1995-09-27

Publications (1)

Publication Number Publication Date
TW301013B true TW301013B (en) 1997-03-21

Family

ID=17196879

Family Applications (1)

Application Number Title Priority Date Filing Date
TW85102118A TW301013B (en) 1995-09-27 1996-02-23 The method and apparatus for cleaning & drying semiconductor

Country Status (2)

Country Link
TW (1) TW301013B (fr)
WO (1) WO1997012392A1 (fr)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3036478B2 (ja) * 1997-08-08 2000-04-24 日本電気株式会社 ウェハの洗浄及び乾燥方法
US5954888A (en) * 1998-02-09 1999-09-21 Speedfam Corporation Post-CMP wet-HF cleaning station
CN102446702B (zh) * 2010-10-15 2014-03-19 中芯国际集成电路制造(北京)有限公司 湿法处理方法及回蚀方法
TW202205409A (zh) * 2020-04-07 2022-02-01 日商東京威力科創股份有限公司 基板處理方法及基板處理裝置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03104225A (ja) * 1989-09-19 1991-05-01 Taiyo Sanso Co Ltd 固体表面の洗浄・乾燥方法
JPH03218014A (ja) * 1990-01-23 1991-09-25 Matsushita Electron Corp 半導体装置の製造方法

Also Published As

Publication number Publication date
WO1997012392A1 (fr) 1997-04-03

Similar Documents

Publication Publication Date Title
US6383304B1 (en) Method of rinsing and drying semiconductor wafers in a chamber with a movable side wall
TW418452B (en) Coating process
TWI377453B (en) Process sequence for photoresist stripping and/or cleaning of photomasks for integrated circuit manufacturing
KR100372094B1 (ko) 건조장치 및 건조방법
WO2000030164A1 (fr) Procede d'elimination d'un film de photoresine
TW501196B (en) Cleaning device, cleaning system, treating device and cleaning method
TWI253098B (en) Substrate processing apparatus, substrate processing method and developing apparatus
JP2002543976A (ja) 超希薄洗浄液を使用して、ミクロ電子基材を洗浄する方法
TW201003336A (en) Developing processing method and developing processing apparatus
CN104698746B (zh) 抗蚀剂图案的形成方法
JP5416075B2 (ja) 処理装置、処理方法、プログラム及びコンピュータ記憶媒体
TW301013B (en) The method and apparatus for cleaning & drying semiconductor
JP2002110611A (ja) 半導体ウェハの洗浄方法及び装置
JPH11176798A (ja) 基板洗浄・乾燥装置及び方法
TW504739B (en) Developing processing apparatus and developing processing method
JP2005183709A (ja) 現像装置及び現像方法
JP2001271188A (ja) 基板処理装置
JP3237386B2 (ja) 洗浄・乾燥方法と洗浄装置
TW594841B (en) Apparatus and method for preventing contamination of substrate from condensate liquid
JPH09153475A (ja) 半導体洗浄乾燥方法および半導体洗浄乾燥装置
JP3641707B2 (ja) 現像処理装置および現像処理方法
JP2011071172A (ja) 基板処理装置及び基板処理方法
JP2008103769A (ja) 基板処理装置および基板処理方法
TW457518B (en) Image processing apparatus
KR19980015080A (ko) 웨이퍼 세정 장치 및 세정액 공급 방법과 이를 이용한 웨이퍼 세정 방법