TW202212842A

TW202212842A - Modularized testing apparatus and testing equipment using the same

Info

Publication number: TW202212842A
Application number: TW109133721A
Authority: TW
Inventors: 李子瑋; 李思宏
Original assignee: 鴻勁精密股份有限公司
Priority date: 2020-09-28
Filing date: 2020-09-28
Publication date: 2022-04-01
Also published as: TWI741813B

Abstract

The present invention reveals a modularized testing apparatus, including a supporting unit, a testing unit, and a pressing unit. The supporting unit has a supporter for slidably supporting the testing unit. The testing unit has a base plate assembled with plural testers thereon. The testers are adapted for holding and testing electronic components. The pressing unit has a detachable frame disposed on the supporter. Plural pressers are disposed to the detachable frame, aiming the testers for pressing on the electronic components above the testers. Therefore, the modularized testing apparatus can be maintained easily, and the testing unit can be slidden out for batch processing. Equipment capacity and efficiency can be enhanced.

Description

模組化測試裝置及其應用之測試設備Modular test device and test equipment for its application

本發明提供一種模組化而利於修護更換，並提高作業便利性之模組化測試裝置。The present invention provides a modularized test device which is convenient for maintenance and replacement, and improves the convenience of operation.

在現今，電子元件於製作完畢後，必須以測試設備對電子元件執行測試作業，以淘汰出不良品。請參閱圖1，目前測試設備於機台11之前段部配置供料裝置12及收料裝置13，於後段部水平排列配置複數個測試裝置14A、14B 、14C、14D、14E、14F，以測試裝置14A為例，其於機台11固設二電性連接之測試座141A及電路板142A，以供對電子元件執行測試作業，測試裝置14A另於機台11設置機架143A，機架143A裝配壓接器144A，壓接器144A對應於測試座141A，以供下壓測試座141A內之電子元件執行測試作業；測試設備以輸送器15伸入於測試裝置14A，而於測試座141A取出一已測電子元件，以及將一待測電子元件移入測試座141A而接續執行測試作業，依此類推，輸送器15依序於複數個測試裝置14B、14C、14D、14E、14F執行取出已測電子元件及放置待測電子元件之作業；惟，輸送器15必須多次往復出入複數個測試裝置14A、14B、14C 、14D、14E、14F，方可移入或移出單一電子元件，不僅增加作動時序而耗費時間，更降低測試產能。另於更換不同型式之測試座、電路板及壓接器時，必須逐一於各測試裝置14A、14B、14C、14D、14E、14F拆卸測試座、電路板及壓接器，以致更換作業繁瑣耗時。再者，測試裝置14A為供輸送器15可移入於壓接器144A與測試座141A之間，而必須增加機架143A及壓接器144A之架設高度，不僅增加測試裝置14A之體積，更延長壓接器144A之下壓行程而增加作業時間。 Nowadays, after the electronic components are fabricated, the electronic components must be tested with testing equipment to eliminate defective products. Please refer to FIG. 1. Currently, the testing equipment is equipped with a feeding device 12 and a receiving device 13 in the front section of the machine 11, and a plurality of testing devices 14A and 14B are arranged horizontally in the rear section. , 14C, 14D, 14E, 14F, take the test device 14A as an example, two electrically connected test sockets 141A and a circuit board 142A are fixed on the machine 11 for performing test operations on electronic components, and the test device 14A is further The machine table 11 is provided with a frame 143A, the frame 143A is equipped with a crimper 144A, and the crimper 144A corresponds to the test seat 141A for pressing down the electronic components in the test seat 141A to perform the test operation; the test equipment is extended into the conveyor 15 In the test device 14A, a tested electronic component is taken out from the test seat 141A, and an electronic component to be tested is moved into the test seat 141A to perform the test operation continuously, and so on, the conveyor 15 is sequentially connected to the plurality of test devices 14B, 14C, 14D, 14E, and 14F perform the operations of taking out the tested electronic components and placing the electronic components to be tested; however, the conveyor 15 must reciprocate in and out of multiple test devices 14A, 14B, 14C. , 14D, 14E, 14F, can move a single electronic component in or out, which not only increases the action sequence and consumes time, but also reduces the test throughput. In addition, when replacing different types of test sockets, circuit boards and crimpers, it is necessary to disassemble the test sockets, circuit boards and crimpers in each test device 14A, 14B, 14C, 14D, 14E, 14F one by one, so that the replacement operation is cumbersome and time-consuming. Time. Furthermore, for the test device 14A to allow the conveyor 15 to be moved between the crimper 144A and the test seat 141A, it is necessary to increase the erection height of the rack 143A and the crimper 144A, which not only increases the volume of the test device 14A, but also extends the length of the test device 14A. The crimper 144A presses down the stroke to increase the working time.

本發明之目的一，提供一種模組化測試裝置，包含承置單元、測試單元及壓接單元，承置單元之載具承置可滑移之測試單元，測試單元之承板配置複數個測試器，測試器供承置及測試複數個電子元件，壓接單元以可拆式框架裝配於承置單元之載具，框架裝配複數個壓接器，複數個壓接器對位於複數個測試器，藉以模組化測試裝置利於修護更換，並於測試單元滑出載具時而供便利取放一批次複數個電子元件，以及於滑入載具時而供壓接單元壓接複數個電子元件執行測試作業，進而提高使用效能。The first objective of the present invention is to provide a modular testing device, which includes a holding unit, a testing unit and a crimping unit. The tester is used to hold and test a plurality of electronic components. The crimping unit is assembled on the carrier of the holding unit by a detachable frame. , so that the modular test device is convenient for maintenance and replacement, and when the test unit slides out of the carrier, it is convenient to pick up and place a batch of multiple electronic components, and when the test unit slides into the carrier, the crimping unit can crimp multiple electronic components. Electronic components perform testing operations to improve performance.

本發明之目的二，提供一種模組化測試裝置，其測試單元之承板裝配複數個測試器，於承板移出承置單元時，可供輸送器一批次取放複數個電子元件，以縮減取放料作動時序，進而提高生產效能。The second objective of the present invention is to provide a modular testing device, wherein the support plate of the test unit is equipped with a plurality of testers, when the support plate is moved out of the support unit, the conveyor can pick up and place a plurality of electronic components in one batch, so as to Reduce the timing of picking and unloading, thereby improving production efficiency.

本發明之目的三，提供一種模組化測試裝置，其壓接單元以快拆器將框架裝配於承置單元之載具，於變換應用之壓接器數量或型式時，利用快拆器而可迅速拆卸框架，以利卸下一批次複數個壓接器，而縮減更換作業時間，進而提高生產效能。 The third object of the present invention is to provide a modular testing device, in which the crimping unit uses a quick release to assemble the frame to the carrier of the holding unit. Quickly remove the frame to facilitate removal of multiple crimpers in one batch, reducing replacement time , thereby improving production efficiency.

本發明之目的四，提供一種模組化測試裝置，其壓接單元之複數個壓接器分別鎖固於框架，於修護時，可各別獨立更換壓接器，毋需更換整組壓接單元，進而有效節省成本。The fourth object of the present invention is to provide a modular testing device, in which a plurality of crimpers of the crimping unit are respectively locked to the frame. During maintenance, the crimpers can be replaced independently without replacing the entire set of crimpers. Connect the unit, thereby effectively saving costs.

本發明之目的五，提供一種模組化測試裝置，其於承置單元裝配可滑移之測試單元及可快拆之壓接單元，不僅整體微型化，以利應用於空間有限之場所而執行測試作業，並供省力搬運，進而提高使用效能及便利性。The fifth objective of the present invention is to provide a modular testing device, which is equipped with a slidable testing unit and a quick-release crimping unit on the holding unit, which is not only miniaturized as a whole, but also suitable for use in places with limited space. Test operation, and for labor-saving handling, thereby improving the use efficiency and convenience.

本發明之目的六，提供一種模組化測試裝置，其壓接單元之壓接器於第一活動件與第二活動件間設有驅動源，以驅動第一活動件與第二活動件沿作業軸線作反向位移，第一活動件之底部裝配作業件，作業件以供壓接電子元件，壓接器另設有一由第二活動件驅動位移之作動具，作動具裝配至少一限位件，於限位件承擋受限後，而可定位作動具及第二活動件，以防止第一活動件及作業件沿作業軸線退縮位移，使作業件確實壓接電子元件執行預設作業，進而提升作業品質。The sixth object of the present invention is to provide a modular testing device, in which the crimper of the crimping unit is provided with a driving source between the first movable member and the second movable member to drive the first movable member and the second movable member along the edge. The working axis is displaced in the opposite direction, the bottom of the first movable piece is assembled with working piece, the working piece is used for crimping electronic components, the crimper is also provided with an actuating tool which is driven and displaced by the second movable piece, and the actuating tool is equipped with at least one limiter After the stopper is limited, the actuating tool and the second movable piece can be positioned to prevent the first movable piece and the working piece from retreating and displaced along the working axis, so that the working piece can be pressed against the electronic components to perform the preset operation. , thereby improving the quality of work.

本發明之目的七，提供一種模組化測試裝置，其壓接單元之壓接器於第一調整件及第二調整件設有相互配合之第一浮接部及第二浮接部，第二調整件並以連接件連接作動具或第二活動件，利用作動具或第二活動件帶動第二調整件作一浮動位移(如X方向、Y方向或水平角度Θ)而解除卡掣，使第一活動件可帶動作業件作浮動位移，進而微調作業件之位置，使作業件精準壓接電子元件，進而提高使用效能。The seventh object of the present invention is to provide a modular testing device, wherein the crimping device of the crimping unit is provided with a first floating part and a second floating part which cooperate with each other on the first adjusting part and the second adjusting part, and the first floating part and the second floating part are mutually matched. The two adjusting members are connected with the actuating tool or the second movable member by the connecting member, and the second adjusting member is driven by the actuating tool or the second movable member to make a floating displacement (such as the X direction, the Y direction or the horizontal angle Θ) to release the jam, The first movable piece can drive the working piece to float and displace, so as to fine-tune the position of the working piece, so that the working piece can be accurately pressed against the electronic components, thereby improving the use efficiency.

本發明之目的八，提供一種應用模組化測試裝置之測試設備，包含供料裝置、收料裝置、多層式架體、本發明模組化測試裝置、輸送裝置及中央控制裝置；供料裝置配置於機台，並設有至少一容納待作業電子元件之供料承置器；收料裝置配置於機台，並設有至少一容納已作業電子元件之收料承置器；多層式架體配置於機台，並設有複數層，各層設有至少一架置空間；複數個模組化測試裝置配置於多層式架體之複數層架置空間，各模組化測試裝置以供測試一批次電子元件；輸送裝置配置於機台，並設有至少一第一輸送器，以輸送電子元件；中央控制裝置以供控制及整合各裝置作動，以執行自動化作業，達到提升作業效能之實用效益。 The eighth object of the present invention is to provide a testing device using a modular testing device, including a feeding device, a receiving device, a multi-layer frame, the modular testing device of the present invention, a conveying device and a central control device; a feeding device It is arranged on the machine table and is provided with at least one feeder and holder for accommodating the electronic components to be operated; the receiving device is arranged on the machine table and is provided with at least one material holder for accommodating the electronic components that have been processed; a multi-layer rack The body is arranged on the machine, and there are multiple layers, and each layer is provided with at least one mounting space; a plurality of modular test devices are arranged in the multiple layers of the mounting space of the multi-layer frame, and each modular test device is used for testing. A batch of electronic components; the conveying device is arranged on the machine, and is provided with at least one first conveyor for conveying electronic components; the central control device is used to control and integrate the actions of each device to perform automated operations , to achieve the practical benefits of improving operational efficiency.

為使　貴審查委員對本發明作更進一步之瞭解，茲舉一較佳實施例並配合圖式，詳述如後：In order to make your examiners further understand the present invention, hereby give a preferred embodiment and cooperate with the drawings, the details are as follows:

請參閱圖2至5，本發明模組化測試裝置20包含承置單元、測試單元及壓接單元，可視作業需求，更包含一驅動單元，以自動化驅動測試單元移入/移出承置單元。Referring to FIGS. 2 to 5 , the modular testing device 20 of the present invention includes a holding unit, a testing unit and a crimping unit, and depending on operational requirements, further includes a driving unit for automatically driving the testing unit to move in/out of the holding unit.

承置單元設有至少一載具21，載具21可為面板、架體或箱體，其型式可為一平板型或ㄩ型，載具21僅需承置測試單元、壓接單元及驅動單元，不受限於本實施例；於本實施例，載具21包含底板211及二側板212，二側板212呈Z方向固設於底板21，底板211與二側板212間形成一測試區213。The holding unit is provided with at least one carrier 21. The carrier 21 can be a panel, a frame or a box, and its type can be a flat plate type or a U type. The carrier 21 only needs to hold the test unit, the crimping unit and the drive unit. The unit is not limited to this embodiment; in this embodiment, the carrier 21 includes a bottom plate 211 and two side plates 212 , the two side plates 212 are fixed on the bottom plate 21 in the Z direction, and a test area 213 is formed between the bottom plate 211 and the two side plates 212 .

測試單元包含承板22及複數個測試器，承板22可移入/移出於承置單元之載具21，複數個測試器裝配於承板22，以供對電子元件執行測試作業，於修護更換測試單元時，可取出承板22，而一次更換一批次複數個測試器，以提高作業便利性；更進一步，承板22與載具21間設有滑軌組，承板22可供手動式或自動式位移，例如於承板22配置把手，把手可供手動式拉動承板22位移；例如承板22連結一驅動器，驅動器驅動承板22自動式位移。 The test unit includes a support board 22 and a plurality of testers. The support board 22 can be moved into/out of the carrier 21 of the support unit. A plurality of testers are assembled on the support board 22 for performing testing operations on electronic components. , When the test unit is repaired and replaced, the support plate 22 can be taken out, and a batch of multiple testers can be replaced at a time, so as to improve the convenience of operation; The plate 22 can be displaced manually or automatically. For example, a handle is arranged on the support plate 22, and the handle can be used for manually pulling the support plate 22 to displace. ; For example, the carrier plate 22 is connected to a driver, and the driver drives the carrier plate 22 to automatically displace.

於本實施例，承板22位於載具21之測試區213，並設有複數個支撐部件221，支撐部件221可與承板22一體成型或各為獨立元件，於本實施例，承板22開設有複數個容置孔222，各容置孔222裝配一為塊體之支撐部件221。承板22之複數個支撐部件221供裝配複數個測試器，各測試器包含電性連接之電路板231及具探針2321之測試座232，測試座232供承置及測試電子元件，並以栓具鎖固於承板22之支撐部件221，利用支撐部件221輔助支撐測試座232而防止受壓變形。測試座232以頂面作為承擋面2322，並設有為定位孔之第一定位部件2323 。又承板22與載具21間設有複數個呈X方向配置之滑軌組24，各滑軌組24於承板22之底面設置滑軌，以及於載具21之底板211配置複數個可供滑軌滑置之滑座，承板22利用滑軌組24而於載具21上平穩位移。 In this embodiment, the support plate 22 is located in the test area 213 of the carrier 21, and is provided with a plurality of support parts 221. The support parts 221 can be integrally formed with the support plate 22 or each is an independent component. In this embodiment, the support plate 22 A plurality of accommodating holes 222 are opened, and each accommodating hole 222 is assembled with a supporting member 221 as a block. A plurality of supporting parts 221 of the support plate 22 are used for assembling a plurality of testers, and each tester includes an electrically connected circuit board 231 and a test seat 232 with probes 2321 . The bolt is fastened to the support member 221 of the support plate 22 , and the support member 221 is used to assist in supporting the test seat 232 to prevent deformation under pressure. The test seat 232 uses the top surface as the receiving surface 2322 and is provided with a first positioning member 2323 which is a positioning hole . In addition, a plurality of slide rail groups 24 arranged in the X direction are arranged between the support plate 22 and the carrier 21 , each slide rail group 24 is provided with a slide rail on the bottom surface of the support plate 22 , and a plurality of slide rails are arranged on the bottom plate 211 of the carrier 21 . Slider for sliding rails , the support plate 22 is stably displaced on the carrier 21 by the slide rail group 24 .

驅動單元於承板22與載具21間配置至少一驅動器，驅動器可為壓缸或包含馬達及至少一傳動組，不受限於本實施例；於本實施例，驅動器包含馬達251及一為皮帶輪組252之傳動組，馬達251裝配於載具21之側板212，並以轉軸驅動皮帶輪組252，皮帶輪組252連結帶動承板22及複數個測試器作自動式移入/移出載具21之測試區213。The driving unit is configured with at least one driver between the support plate 22 and the carrier 21. The driver can be a cylinder or includes a motor and at least one transmission group, which is not limited to this embodiment; in this embodiment, the driver includes a motor 251 and a The drive set of the pulley set 252, the motor 251 is assembled on the side plate 212 of the carrier 21, and the pulley set 252 is driven by a rotating shaft. District 213.

壓接單元設有至少一框架26及複數個壓接器，框架26裝配於承置單元之載具21，複數個壓接器裝配於框架26，以供壓接測試器之電子元件；更進一步，框架26可作固定式或活動式裝配於載具21，例如框架26以栓具或快拆器組裝於載具21，以供拆卸整組壓接單元；於本實施例，框架26與載具21間設有一為扣具261之快拆器，框架26利用扣具261扣合組裝於載具21，並供修護更換壓接單元時，可開啟扣具261，以利迅速快拆取下框架26及一批次複數個壓接器，進而提高作業便利性。The crimping unit is provided with at least one frame 26 and a plurality of crimpers, the frame 26 is assembled on the carrier 21 of the holding unit, and the plurality of crimpers are assembled on the frame 26 for crimping the electronic components of the tester; further , the frame 26 can be fixedly or movably assembled to the carrier 21, for example, the frame 26 is assembled to the carrier 21 by means of a bolt or a quick release, so as to disassemble the whole set of crimping units; in this embodiment, the frame 26 and the carrier There is a quick release device 261 between the tool 21. The frame 26 is assembled to the carrier 21 by the buckle 261, and when the crimping unit is repaired and replaced, the buckle 261 can be opened to facilitate quick and quick disassembly and removal. The lower frame 26 and a batch of a plurality of crimpers improve the convenience of operation.

壓接器包含第一活動件271、第二活動件272、驅動源、壓接件273、作動具274及限位件275，可視作業需求，壓接器更包含調整結構、復歸結構。The crimper includes a first movable piece 271 , a second movable piece 272 , a driving source, a crimping piece 273 , an actuating tool 274 and a limiting piece 275 . Depending on the operation requirements, the crimper further includes an adjustment structure and a reset structure.

第一活動件271可為一缸本體或面板，而沿作業軸線L位移，並於第一表面2711沿作業軸線L凹設有容置空間2712，及以相對第一表面2711之一面作為裝配面2713，於本實施例，第一活動件271為一缸本體，並於側面設有套合塊2714，套合塊2714開設有導孔2715。The first movable member 271 can be a cylinder body or a panel, and is displaced along the working axis L, and a accommodating space 2712 is recessed on the first surface 2711 along the working axis L, and a surface opposite to the first surface 2711 is used as a mounting surface 2713, in this embodiment, the first movable member 271 is a cylinder body, and a sleeve block 2714 is provided on the side surface, and the sleeve block 2714 is provided with a guide hole 2715.

第二活動件272與第一活動件271沿作業軸線L作相對配置，第二活動件272可沿作業軸線L作反向位移，更進一步，第二活動件272可為面板、活塞或膜片，於本實施例，第二活動件272為一活塞，並可位移地裝配於第一活動件271之容置空間2712，第二活動件272之第二表面2721與容置空間2712之內底面間形成一氣室2716，另第二活動件272以相對第二表面2721之一面作為連接面2722。The second movable member 272 and the first movable member 271 are arranged opposite to each other along the working axis L, the second movable member 272 can be displaced in the opposite direction along the working axis L, and further, the second movable member 272 can be a panel, a piston or a diaphragm In this embodiment, the second movable member 272 is a piston, and can be displaceably assembled in the accommodating space 2712 of the first movable member 271 , the second surface 2721 of the second movable member 272 and the inner bottom surface of the accommodating space 2712 An air chamber 2716 is formed therebetween, and a surface of the second movable member 272 opposite to the second surface 2721 is used as a connecting surface 2722 .

驅動源以供驅動第一活動件271及第二活動件272作反向位移，更進一步，驅動源可為氣囊、壓電元件或包含氣室及通氣道，只要可驅動第一活動件271及第二活動件272作反向位移均可，不受限於本實施例。例如驅動源為氣囊，可直接裝配連結於第一活動件271之第一表面2711與第二活動件272之第二表面2721，於氣囊充氣膨脹時，以驅動第一活動件271及第二活動件272作反向位移，而可省略第一活動件271之容置空間2712及氣室2716。例如驅動源包含氣室及通氣道，氣室設於第一活動件271之容置空間2712內底面與第二活動件272之第二表面2721間，通氣道可設於第一活動件271或第二活動件272，通氣道將氣體輸入於氣室，以驅動第一活動件271及第二活動件272作反向位移。於本實施例，驅動源包含氣室2716及通氣道2717，氣室2716位於第一活動件271之容置空間2712內底面與第二活動件272之第二表面2721間，通氣道2717位於第一活動件271，其一端相通氣室2716，另一端連通供氣設備(圖未示出)及氣壓檢知器，以供輸入氣體至氣室2716。 The driving source is used to drive the first movable member 271 and the second movable member 272 for reverse displacement. Furthermore, the driving source can be an air bag, a piezoelectric element, or an air chamber and an air passage, as long as the first movable member 271 and the second movable member 272 can be driven. The second movable member 272 can be displaced in the reverse direction, and is not limited to this embodiment. For example, the driving source is an air bag, which can be directly assembled and connected to the first surface 2711 of the first movable member 271 and the second surface 2721 of the second movable member 272 to drive the first movable member 271 and the second movable member 271 when the air bag is inflated. The accommodating space 2712 and the air chamber 2716 of the first movable element 271 can be omitted. For example, the driving source includes an air chamber and an air passage. The air chamber is provided between the inner bottom surface of the accommodating space 2712 of the first movable member 271 and the second surface 2721 of the second movable member 272. The air passage can be provided in the first movable member 271 or In the second movable member 272, the air passage inputs gas into the air chamber to drive the first movable member 271 and the second movable member 272 to move in the opposite direction. In this embodiment, the driving source includes an air chamber 2716 and an air passage 2717. The air chamber 2716 is located between the inner bottom surface of the accommodating space 2712 of the first movable member 271 and the second surface 2721 of the second movable member 272, and the air passage 2717 is located in the first movable member 271. A movable member 271, one end of which is connected to the ventilation chamber 2716, and the other end is connected to the air supply equipment (not shown) and the air pressure detector , for the input gas to the gas chamber 2716.

壓接件273裝配於第一活動件271，以供壓接電子元件，更進一步，壓接件273裝配至少一溫控器，溫控器可為加熱件或致冷晶片，以使電子元件位於模擬日後應用場所溫度之測試環境；於本實施例，壓接件273裝配於第一活動件271之裝配面2713，並設有至少一下壓部2731，以對電子元件執行壓接作業。另壓接件273於下壓部2731之周側設有擋面2732及第二定位部件2733，擋面2732之位置高度高於下壓部2731，並於相對應第一定位部件2323之位置凸設有為定位銷之第二定位部件2733。 The crimping piece 273 is assembled on the first movable piece 271 for crimping the electronic components, and further , the crimping member 273 is equipped with at least one thermostat, which can be a heating element or a cooling chip, so that the electronic components are placed in a test environment that simulates the temperature of the application site in the future; in this embodiment, the crimping member 273 is assembled on the first A mounting surface 2713 of the movable piece 271 is provided with at least a lower pressing portion 2731 for performing a crimping operation on electronic components . In addition, the pressing member 273 is provided with a blocking surface 2732 and a second positioning member 2733 on the peripheral side of the pressing portion 2731 . The blocking surface 2732 is positioned higher than the pressing portion 2731 and protrudes from the position corresponding to the first positioning member 2323 . A second positioning member 2733 is provided as a positioning pin.

再者，壓接器可視作業需求，於壓接件273之下壓部2731裝配電性連接之另一電路板(圖未示出)及另複數支探針(圖未示出)，以供測試具雙面接點之電子元件。Furthermore, the crimper may, depending on operational requirements, mount another circuit board (not shown in the figure) and a plurality of probes (not shown in the figure) on the crimping portion 2731 of the crimping member 273 for electrical connection. Test electronic components with double-sided contacts.

作動具274裝配於第二活動件272，以供第二活動件272驅動沿作業軸線L作反向位移；更進一步，作動具274包含至少一第一構件2741，以裝配於第二活動件272，裝配方式可為鎖固或跨置等方式，均可供第二活動件272帶動第一構件2741同步位移；於本實施例，作動具274包含第一構件2741、第二構件2742及第三構件2743，更進一步，第一構件2741、第二構件2742及第三構件2743可為一體成型或各別為獨立構件；於本實施例，作動具274之第一構件2741 、第二構件2742及第三構件2743各別為獨立構件，第一構件2741為一面板，並呈水平配置鎖固於第二活動件272的連接面2722，第二構件2742為呈Z軸向配置之導桿，其一端組裝於第一構件2741，另一端穿伸出第一活動件271之導孔2715 ，以供第一活動件271沿第二構件2742平穩作Z方向位移，第三構件2743為一呈X方向配置之架體，並組裝於第二構件2742之另一端，使得第二活動件272可帶動第一構件2741、第二構件2742及第三構件2743同步反向位移。 The actuating tool 274 is assembled on the second movable member 272 for driving the second movable member 272 to perform reverse displacement along the working axis L; further, the actuating tool 274 includes at least one first member 2741 to be assembled on the second movable member 272 , the assembling method can be locking or straddle, all of which can be used for the second movable member 272 to drive the first member 2741 to displace synchronously; in this embodiment, the actuating tool 274 includes the first member 2741, the second member 2742 and the third member 2741. The member 2743, further, the first member 2741, the second member 2742 and the third member 2743 can be integrally formed or be independent members; in this embodiment, the first member 2741 of the actuating tool 274 The second member 2742 and the third member 2743 are independent members respectively, the first member 2741 is a panel, and is horizontally arranged and locked to the connecting surface 2722 of the second movable member 272, and the second member 2742 is Z-axis. One end of the configured guide rod is assembled to the first member 2741 and the other end protrudes through the guide hole 2715 of the first movable member 271 , so that the first movable member 271 can be smoothly displaced in the Z direction along the second member 2742, and the third member 2743 is a frame arranged in the X direction, and is assembled on the other end of the second member 2742, so that the second movable member 272 The first member 2741 , the second member 2742 and the third member 2743 can be driven to move in opposite directions synchronously.

限位件275設於作動具274，以於限位件275承擋受限時，而可定位第二活動件272，以防止第一活動件271及壓接件273退縮位移；更進一步，限位件275與作動具274可為一體成型或各別為獨立元件，限位件275可呈Y方向或Z方向設於作動具274；例如限位件275可為一面板，並呈Y方向延伸設於作動具274之第三構件2743；例如限位件275可為一L型件，並呈Z方向配置於作動具274之第一構件2741或第三構件2743，當限位件275配置於第一構件2741，作動具274可省略第三構件2743。The limiting member 275 is disposed on the actuating device 274, so that when the limiting member 275 is limited in its bearing, the second movable member 272 can be positioned to prevent the first movable member 271 and the crimping member 273 from retracting and moving; The positioning member 275 and the actuating tool 274 can be integrally formed or are independent components, and the limiting member 275 can be disposed on the actuating tool 274 in the Y direction or the Z direction; for example, the limiting member 275 can be a panel and extend in the Y direction Set on the third member 2743 of the actuator 274; for example, the limiter 275 can be an L-shaped piece, and is arranged on the first member 2741 or the third member 2743 of the actuator 274 in the Z direction. The first member 2741 and the actuator 274 can omit the third member 2743.

調整結構包含第一調整件276、第二調整件277及連接件278，更包含第一彈性件279及蓋板280。第一調整件276設有第一浮接部2761，第二調整件277設有第二浮接部2771，第二浮接部2771與第一浮接部2761作相互配合，更進一步，第一浮接部2761與第一調整件276可一體成型或各別為獨立元件，例如第一調整件276可一體成型一為弧凸塊之第一浮接部2761；例如第一調整件276可裝配一具有為珠體之第一浮接部2761的面板；同樣地，第二浮接部2771與第二調整件277亦可一體成型或各別為獨立元件；另第二浮接部2771與第一浮接部2761可呈相互配合之弧形或V形，其形狀只要於第二調整件277未浮動時，可使第一調整件276及第二調整件277相互配合卡掣。連接件278連接第二調整件277與作動具274或第二活動件272，利用作動具274或第二活動件272帶動第二調整件277作一浮動位移(如X方向、Y方向或水平角度Θ)而解除卡掣，使第一活動件271可帶動壓接件273作浮動位移，進而微調壓接件273之擺置位置或擺置角度，使壓接件273精準壓接電子元件。The adjustment structure includes a first adjustment member 276 , a second adjustment member 277 and a connecting member 278 , and further includes a first elastic member 279 and a cover plate 280 . The first adjusting member 276 is provided with a first floating portion 2761, the second adjusting member 277 is provided with a second floating portion 2771, and the second floating portion 2771 cooperates with the first floating portion 2761. Furthermore, the first The floating portion 2761 and the first adjusting member 276 can be integrally formed or are independent components, for example, the first adjusting member 276 can be integrally formed with a first floating portion 2761 as an arc bump; for example, the first adjusting member 276 can be assembled A panel with a first floating portion 2761 that is a bead; similarly, the second floating portion 2771 and the second adjusting member 277 can also be integrally formed or are independent components respectively; the second floating portion 2771 and the second A floating portion 2761 can be in the shape of an arc or V shape that cooperates with each other, as long as the shape of the floating portion 2761 is not floating, the first adjusting member 276 and the second adjusting member 277 can be mutually engaged and locked. The connecting member 278 connects the second adjusting member 277 with the actuating tool 274 or the second movable member 272, and the second adjusting member 277 is driven by the actuating tool 274 or the second movable member 272 to perform a floating displacement (such as the X direction, the Y direction or the horizontal angle). Θ) to release the latch, so that the first movable member 271 can drive the crimping member 273 to make a floating displacement, thereby fine-tuning the placement position or placement angle of the crimping member 273, so that the crimping member 273 can accurately crimp the electronic components.

於本實施例，第一調整件276為一面板，並鎖固裝配於框架26，於拆卸第一調整件276時，可便利取出整個壓接器；第一調整件276與作動具274之第一構件2741具有適當間距，第一調整件276於相對第二活動件272之位置設有容置槽2762，容置槽2762之底板2763開設有第一通孔2764，以供穿置第二調整件277，第一調整件276於底板2763設有複數個為弧凸塊之第一浮接部2761。第二調整件277為一面板，並位於第一調整件276之容置槽2762，且與容置槽2762間具有適當之移動間距，第二調整件277於相對應第一調整件276之第一浮接部2761的位置設有呈弧槽之第二浮接部2771，於未作動狀態，第二調整件277以本身之自重或第一構件2741或第二活動件272之自重，令第二浮接部2771貼合卡掣於第一調整件276之第一浮接部2761。連接件278為一栓具，並鎖接第二調整件277及第一構件2741，令第一構件2741帶動第二調整件277之第二浮接部2771脫離第一浮接部2761或沿第一浮接部2761作浮動位移而解除卡掣，使第二活動件272帶動第一活動件271及壓接件273作浮動位移(如X-Y方向或水平角度Θ)，進而微調壓接件273之擺置位置或擺置角度。In this embodiment, the first adjustment member 276 is a panel, and is locked and assembled on the frame 26 . When the first adjustment member 276 is disassembled, the entire crimper can be easily taken out; A member 2741 has an appropriate distance. The first adjusting member 276 is provided with an accommodating groove 2762 at a position opposite to the second movable member 272. The bottom plate 2763 of the accommodating groove 2762 has a first through hole 2764 for passing through the second adjusting member. Part 277, the first adjusting part 276 is provided on the bottom plate 2763 with a plurality of first floating parts 2761 which are arc bumps. The second adjusting member 277 is a panel and is located in the accommodating groove 2762 of the first adjusting member 276 and has an appropriate moving distance from the accommodating groove 2762 . The position of a floating portion 2761 is provided with a second floating portion 2771 in the form of an arc groove. In the inactive state, the second adjusting member 277 uses its own weight or the self-weight of the first member 2741 or the second movable member 272 to make the first The two floating parts 2771 are fitted and clamped to the first floating part 2761 of the first adjusting member 276 . The connecting piece 278 is a bolt, and locks the second adjusting piece 277 and the first member 2741, so that the first member 2741 drives the second floating portion 2771 of the second adjusting piece 277 away from the first floating portion 2761 or along the first floating portion 2761. A floating part 2761 moves to a floating position to release the latch, so that the second movable member 272 drives the first movable member 271 and the crimping member 273 to perform a floating displacement (such as the X-Y direction or the horizontal angle Θ), thereby fine-tuning the position of the crimping member 273 Placement position or placement angle.

復歸結構於第一調整件276與作動具274或第二活動件272間配置第一彈性件279，以帶動作動具274復位；於本實施例，第二調整件277開設有第二通孔2772，供穿置第一彈性件279，第一彈性件279之一端頂抵於作動具274之第一構件2741，另一端頂抵一鎖固於第一調整件276之蓋板280，以帶動作動具274復位。In the return structure, a first elastic member 279 is arranged between the first adjusting member 276 and the actuating member 274 or the second movable member 272 to drive the actuating member 274 to reset; in this embodiment, the second adjusting member 277 is provided with a second through hole 2772 , for inserting the first elastic piece 279, one end of the first elastic piece 279 abuts against the first member 2741 of the actuating tool 274, and the other end abuts against a cover plate 280 locked on the first adjusting piece 276 to drive the movement With 274 reset.

復歸結構另於作動具274與第一活動件271間配置至少一第二彈性件281，以帶動第一活動件271復位；於本實施例，復歸結構於第一活動件271之二相對套合塊2714間設有延伸部2718，延伸部2718設有呈凹槽之讓位部2719，復歸結構於作動具274之第三構件2743相對應讓位部2719之位置設有立柱282，立柱282穿套第二彈性件281及卡抵塊283，卡抵塊283之一面頂抵於第一活動件271之延伸部2718，以頂撐第一活動件271，卡抵塊283之另一面頂抵於第二彈性件281。In the return structure, at least one second elastic piece 281 is disposed between the actuating tool 274 and the first movable piece 271 to drive the first movable piece 271 to reset; in this embodiment, the return structure is relatively sleeved on two of the first movable pieces 271 An extension portion 2718 is provided between the blocks 2714. The extension portion 2718 is provided with a recessed portion 2719. The return structure is provided with a post 282 at a position corresponding to the recess portion 2719 on the third member 2743 of the actuating tool 274. The post 282 passes through it. The second elastic member 281 and the blocking block 283 are covered. One surface of the blocking block 283 abuts against the extending portion 2718 of the first movable member 271 to support the first movable member 271, and the other surface of the blocking block 283 abuts against The second elastic member 281 .

然測試時序，壓接機構之限位件275於承擋受限後，可限位第二活動件272及第一活動件271，至於擋掣限位件275之設計可視作業需求，而於測試座232、承板22或框架26上，且相對於限位件275之位置設有至少一擋掣部件；例如限位件275呈Y方向配置時，可於測試座232或承板22相對應限位件275之位置設有一為擋片之擋掣部件；例如限位件275呈Z方向配置時，可於框架26相對應限位件275之位置設有一為擋槽之擋掣部件，前述舉例設計均可擋掣限位件275，不受限於本實施例。於本實施例，測試座232於相對限位件275之位置設有一呈Y方向延伸且為擋片之擋掣部件2324，擋掣部件2324與測試座232可為一體成型或各別為獨立元件，作動具274於未作動狀態，可使限位件275與擋掣部件2324具有適當間距。 However, in the test sequence, the limiting member 275 of the crimping mechanism can limit the second movable member 272 and the first movable member 271 after the bearing is limited. At least one stopper member is arranged on the seat 232 , the support plate 22 or the frame 26 relative to the position limiter 275 For example, when the limiter 275 is arranged in the Y direction, a stopper member can be provided at the position of the test seat 232 or the support plate 22 corresponding to the limiter 275; for example, when the limiter 275 is arranged in the Z direction, A stopper member serving as a stopper groove may be provided at the position of the frame 26 corresponding to the stopper 275 , and the above-mentioned example designs can all stop the stopper 275 and are not limited to this embodiment. In this embodiment, the test seat 232 is provided with a blocking member 2324 extending in the Y direction and being a blocking piece at a position opposite to the limiting member 275 . , when the actuating tool 274 is not actuated, the limiting member 275 and the blocking member 2324 can have a proper distance.

請參閱圖4、6、7，本發明之模組化測試裝置20輕便且易搬運，可便利擺置於一承載物(如實驗室的實驗台桌或小型工作桌)，模組化測試裝置20之載具21亦可以定位用元件(如栓具或定位銷)而定位於承載物；於本實施例中，模組化測試裝置20鎖固於小型工作桌30之桌板。於測試時，驅動單元以馬達251經皮帶輪組252帶動測試單元之承板22作X方向位移移出載具21之測試區213，由於壓接器之限位件275未貼接測試座232之擋掣部件2324，使得承板22可載送一批次複數個測試座232同步移出測試區213，而位於載具21之外部，以供輸送器(圖未示出)將一批次複數個待測電子元件移入測試座232；之後，馬達251經皮帶輪組252帶動承板22載送一批次複數個具待測電子元件之測試座232移入測試區213。Please refer to FIGS. 4 , 6 and 7 . The modular testing device 20 of the present invention is light and easy to carry, and can be conveniently placed on a carrier (such as a laboratory table or a small work table). The modular testing device The carrier 21 of 20 can also be positioned on the carrier by positioning elements (such as bolts or positioning pins); in this embodiment, the modular testing device 20 is locked to the table top of the small work table 30 . During the test, the drive unit drives the support plate 22 of the test unit to move out of the test area 213 of the carrier 21 by means of the motor 251 through the pulley set 252 to move out of the test area 213 of the carrier 21. Because the limiter 275 of the crimper is not in contact with the stopper of the test seat 232 The catch member 2324 enables the carrier plate 22 to carry a batch of a plurality of test seats 232 and move out of the test area 213 synchronously, and is located outside the carrier 21 for the conveyor (not shown in the figure) to carry a batch of a plurality of test seats 232 to be The electronic components to be tested are moved into the test seat 232 ; after that, the motor 251 drives the carrier plate 22 to carry a batch of a plurality of test seats 232 with electronic components to be tested into the test area 213 through the pulley set 252 .

請參閱圖8、9，由於測試座232相對於壓接器，並令擋掣部件2324位於壓接器之限位件275的上方，於壓測時，壓接器之通氣道2717輸入氣體至第一活動件271之氣室2716，氣室2716內之氣體分別推動第一活動件271及第二活動件272沿作業軸線L作反向位移，第一活動件271即帶動壓接件273同步作Z方向向下位移，若壓接件273之第二定位部件2733與測試座232之第一定位部件2323具有微小位差，壓接件273之第二定位部件2733會頂抵於測試座232之承擋面2322；由於氣室2716內之氣體無法推動壓接件273繼續向下位移，在氣室2716內持續輸入氣體之狀態下，氣體會推動第二活動件272沿作業軸線L作Z方向反向向上位移，第二活動件272再頂推作動具274及第二調整件277作Z方向向上浮動，第二活動件272即利用第二調整件277之第二浮接部2771沿第一調整件276之第一浮接部2761作Y方向浮動位移，而帶動第一活動件271及壓接件273作Y方向位移，以微調壓接件273之位置，使壓接件273之第二定位部件2733對位測試座232之第一定位部件2323。Please refer to FIGS. 8 and 9 , since the test seat 232 is opposite to the crimper, and the blocking member 2324 is located above the limiter 275 of the crimper, during the crimping test, the air passage 2717 of the crimper inputs gas to The air chamber 2716 of the first movable member 271, the gas in the air chamber 2716 pushes the first movable member 271 and the second movable member 272 to reversely displace along the operation axis L, and the first movable member 271 drives the crimping member 273 to synchronize Move downward in the Z direction, if the second positioning member 2733 of the crimping member 273 and the first positioning member 2323 of the test seat 232 have a slight difference in position, the second positioning member 2733 of the crimping member 273 will abut against the test seat 232 Because the gas in the air chamber 2716 cannot push the crimping member 273 to continue to move downward, in the state of continuous input of gas in the air chamber 2716, the gas will push the second movable member 272 to move Z along the working axis L. The direction is reversed and displaced upward, and the second movable member 272 pushes the actuator 274 and the second adjustment member 277 to float upward in the Z direction. The second movable member 272 uses the second floating portion 2771 of the second adjustment member 277 to move along The first floating portion 2761 of an adjusting member 276 floats and displaces in the Y direction, and drives the first movable member 271 and the crimping member 273 to move in the Y direction, so as to fine-tune the position of the crimping member 273 and make the first movable member 273 move in the Y direction. The two positioning members 2733 are aligned with the first positioning member 2323 of the test seat 232 .

然，作動具274作Z方向向上位移時，並以第三構件2743帶動限位件275同步位移，令限位件275抵頂於測試座232之擋掣部件2324，以限位作動具274，由於作動具274連接第二活動件272，亦同步限位第二活動件272，在氣室2716保持一定預設氣壓的要件下，氣室2716的氣體即頂推第一活動件271帶動壓接件273沿作業軸線L作Z方向向下位移，使壓接件273之第二定位部件2733***於測試座232之第一定位部件2323，並使第一活動件271承受氣室2716之氣體向下推力，而有效防止第一活動件271及壓接件273沿作業軸線L反向位移，不僅可使壓接件273之下壓部2731順利壓接電子元件，更可使壓接件273確實以預設下壓力壓接電子元件，進而提高測試品質。However, when the actuator 274 moves upward in the Z direction, the third member 2743 drives the limiter 275 to displace synchronously, so that the limiter 275 abuts against the stopper part 2324 of the test seat 232 to limit the actuator 274. Since the actuating tool 274 is connected to the second movable member 272 and also limits the second movable member 272 synchronously, under the condition that the air chamber 2716 maintains a certain preset air pressure, the gas in the air chamber 2716 pushes the first movable member 271 to drive the crimping The member 273 is displaced downward in the Z direction along the working axis L, so that the second positioning member 2733 of the crimping member 273 is inserted into the first positioning member 2323 of the test seat 232, and the first movable member 271 is subjected to the gas direction of the air chamber 2716. The downward thrust can effectively prevent the reverse displacement of the first movable member 271 and the crimping member 273 along the working axis L, which not only enables the lower pressing portion 2731 of the crimping member 273 to smoothly crimp the electronic components, but also makes the crimping member 273 reliable Improve test quality by crimping electronic components with a preset down force.

請參閱圖2~5、10，本發明模組化測試裝置20應用於測試設備，測試設備包含機台40、供料裝置50、收料裝置60、多層式架體70、本發明模組化測試裝置20、輸送裝置80及中央控制裝置(圖未示出)；供料裝置50配置於機台40，並設有至少一容納待作業電子元件之供料承置器51；收料裝置60配置於機台40，並設有至少一容納已作業電子元件之收料承置器61；多層式架體70配置於機台40，並設有複數層，各層設有至少一架置空間71；複數個模組化測試裝置20配置於多層式架體70之複數層架置空間71，各模組化測試裝置20以供測試一批次電子元件，於本實施例中，架體70各層之架置空間71供裝配模組化測試裝置20之載具21，而可迅速將載具21承載整組之測試單元、壓接單元及驅動單元裝配於架體70上，以利修護更換；輸送裝置80配置於機台40，並設有至少一第一輸送器，以輸送電子元件；更進一步，第一輸送器可為移料器或搬盤器，輸送裝置80依作業需求而增設至少一第二輸送器，第二輸送器可為載台，第二輸送器可配置於機台40，或與一第三輸送器同步作Z方向位移至架體70之各層架置空間71前方，又第二輸送器配置於機台40可採定點固設，或於機台40上作至少一方向位移；再者，第二輸送器可設有複數個承槽，以供容置待測電子元件及已測電子元件，而第一輸送器則為移料器，以供移載電子元件；第二輸送器可承載一供料承置器51及一收料承置器61，以迅速供應整盤具待測電子元件之供料承置器51，以及利用收料承置器61收置整盤已測電子元件，而第一輸送器則為搬盤器，以供搬移供料承置器51。於本實施例，輸送裝置80包含第一輸送器81、第二輸送器82、第三輸送器83及第四輸送器84，第一輸送器81為一搬盤器，以將供料裝置50之具整盤待測電子元件之供料承置器51搬移至一為載台之第二輸送器82，第二輸送器82並設有一空的收料承置器61，於模組化測試裝置20之驅動單元驅動測試單元之承板22載送複數個測試座232由測試區213移出至換料區41，第二輸送器82與第三輸送器83同步作Z方向位移至承板22之一方，第三輸送器83之複數個吸嘴可作變距調整位置，以一次於複數個測試座232取出複數個已測之電子元件，並移載至第二輸送器82之收料承置器61收置，第三輸送器83再於第二輸送器82之供料承置器51取出複數個待測電子元件，並移載至承板22之複數個測試座232，測試裝置20之驅動單元驅動承板22載送複數個具待測電子元件之測試座232由換料區41移入至測試區213而執行測試作業；第四輸送器84為一搬盤器，以將第二輸送器82之收料承置器61依測試結果，而搬移至收料裝置60收置；中央控制裝置以供控制及整合各裝置作動，以執行自動化作業，達到提升作業效能之實用效益。 Please refer to FIGS. 2 to 5 and 10. The modular testing device 20 of the present invention is applied to testing equipment. The testing equipment includes a machine 40, a feeding device 50, a receiving device 60, a multi-layer frame 70, and the modular testing device of the present invention. The testing device 20, the conveying device 80 and the central control device (not shown); the feeding device 50 is arranged on the machine table 40, and is provided with at least one feeding holder 51 for accommodating the electronic components to be operated; the receiving device 60 It is arranged on the machine table 40 and is provided with at least one receiver 61 for accommodating the electronic components that have been processed; the multi-layer frame body 70 is arranged on the machine table 40 and has a plurality of layers, and each layer is provided with at least one mounting space 71 A plurality of modular testing devices 20 are arranged in the mounting spaces 71 of the multiple layers of the multi-layer frame body 70, and each modular testing device 20 is used for testing a batch of electronic components. In this embodiment, each layer of the frame body 70 The mounting space 71 is used for assembling the carrier 21 of the modular testing device 20, and the carrier 21 can quickly carry the entire set of test units, crimping units and driving units to be assembled on the frame body 70 to facilitate maintenance and replacement ; The conveying device 80 is arranged on the machine 40, and is provided with at least one first conveyor to convey electronic components; further, the first conveyor can be a material mover or a tray mover , the conveying device 80 is added with at least one second conveyor according to the operation requirements, the second conveyor can be a carrier, the second conveyor can be arranged on the machine table 40, or synchronized with a third conveyor to move in the Z direction to the rack In front of the mounting space 71 of each layer of the body 70, the second conveyor is arranged on the machine table 40 and can be fixed at a fixed point, or can be displaced in at least one direction on the machine table 40; moreover, the second conveyor can be provided with a plurality of The receiving groove is used for accommodating the electronic components to be tested and the electronic components that have been tested, and the first conveyor is a feeder for transferring electronic components; the second conveyor can carry a feeding holder 51 and a The receiver 61 is used to quickly supply the entire tray with the electronic components to be tested. The tray is used to move the feeding holder 51 . In this embodiment, the conveying device 80 includes a first conveyor 81 , a second conveyor 82 , a third conveyor 83 , and a fourth conveyor 84 , and the first conveyor 81 is a plate carrier for conveying the feeding device 50 . The feeding holder 51 with the whole plate of electronic components to be tested is moved to a second conveyor 82 which is a carrier. The second conveyor 82 is also provided with an empty receiving holder 61 for modular testing. The drive unit of the device 20 drives the support plate 22 of the test unit to carry a plurality of test seats 232 from the test area 213 to the refueling area 41 . The second conveyor 82 and the third conveyor 83 move to the support plate 22 synchronously in the Z direction. On the one hand, the plurality of suction nozzles of the third conveyor 83 can be used to adjust the position of the distance, so that a plurality of tested electronic components can be taken out from the plurality of test seats 232 at one time, and transferred to the receiving support of the second conveyor 82 The setter 61 is placed, and the third conveyor 83 takes out a plurality of electronic components to be tested from the feeder 51 of the second conveyor 82, and transfers them to a plurality of test seats 232 on the support plate 22. The test device 20 The drive unit drives the carrier plate 22 to carry a plurality of test seats 232 with electronic components to be tested and moved from the refueling area 41 to the test area 213 to perform the test operation; the fourth conveyor 84 is a plate carrier to transfer the second The receiving device 61 of the conveyor 82 is moved to the receiving device 60 for receiving according to the test results; the central control device is used to control and integrate the actions of each device to perform automatic operation and achieve the practical benefit of improving the operation efficiency.

[習知] 11:機台 12:供料裝置 13:收料裝置 14A、14B、14C、14D、14E、14F:測試裝置 141A:測試器 142A:電路板 143A:機架 144A:壓接器 15:輸送器 [本發明] 20:測試裝置 21:載具 211:底板 212:側板 213:測試區 22:承板 221:支撐部件 222:容置孔 231:電路板 232:測試座 2321:探針 2322:承擋面 2323:第一定位部件 2324:擋掣部件 24:滑軌組 251:馬達 252:皮帶輪組 26:框架 261:扣具 271:第一活動件 2711:第一表面 2712:容置空間 2713:裝配面 2714:套合塊 2715:導孔 2716:氣室 2717:通氣道 2718:延伸部 2719:讓位部 272:第二活動件 2721:第二表面 2722:連接面 273:壓接件 2731:下壓部 2732:擋面 2733:第二定位部件 274:作動具 2741:第一構件 2742:第二構件 2743:第三構件 275:限位件 276:第一調整件 2761:第一浮接部 2762:容置槽 2763:底板 2764:第一通孔 277:第二調整件 2771:第二浮接部 2772:第二通孔 278:連接件 279:第一彈性件 280:蓋板 281:第二彈性件 282:立柱 283:卡抵塊 L:作業軸線 30:工作桌 40:機台 41:換料區 50:供料裝置 51:供料承置器 60:收料裝置 61:收料承置器 70:架體 71:架置空間 80:輸送裝置 81:第一輸送器 82:第二輸送器 83:第三輸送器 84:第四輸送器 [acquaintance] 11: Machine 12: Feeding device 13: Receiving device 14A, 14B, 14C, 14D, 14E, 14F: Test Sets 141A: Tester 142A: circuit board 143A: Rack 144A: Crimper 15: Conveyor [this invention] 20: Test device 21: Vehicle 211: Bottom plate 212: Side panels 213: Test Area 22: Bearing plate 221: Support parts 222: accommodating hole 231: circuit board 232: Test seat 2321: Probe 2322: bearing surface 2323: The first positioning part 2324: Stopper parts 24: Slide rail group 251: Motor 252: Pulley set 26: Frame 261: Buckle 271: First moving piece 2711: First Surface 2712: accommodating space 2713: Assembly Surface 2714: Nesting block 2715: Pilot Hole 2716: Air Chamber 2717: Airway 2718: Extensions 2719: Give way 272: Second moving piece 2721: Second Surface 2722: Connection Surface 273: Crimp 2731: Press down 2732: blocking face 2733: Second positioning part 274: Actuator 2741: First Member 2742: Second Member 2743: Third member 275: Limiter 276: First adjustment piece 2761: The first floating part 2762: Receptacle slot 2763: Bottom Plate 2764: first through hole 277: Second adjustment piece 2771: Second floating part 2772: Second Via 278: Connector 279: First elastic piece 280: Cover 281: Second elastic piece 282: Column 283: Card block L: Working axis 30: Work Desk 40: Machine 41: Refueling area 50: Feeding device 51: Feed holder 60: Receiving device 61: Receiving holder 70: Frame 71: Mounting space 80: Conveying device 81: First Conveyor 82: Second conveyor 83: Third Conveyor 84: Fourth Conveyor

圖1：習知測試裝置之使用示意圖。圖2：本發明模組化測試裝置之前視圖。圖3：本發明模組化測試裝置之側視圖。圖4：本發明壓接器與測試器之示意圖。圖5：本發明壓接器之側視圖。圖6：本發明模組化測試裝置之使用示意圖(一)。圖7：本發明模組化測試裝置之使用示意圖(二)。圖8：本發明模組化測試裝置之使用示意圖(三)。圖9：本發明模組化測試裝置之使用示意圖(四)。圖10：本發明模組化測試裝置應用於測試設備之配置圖。 Figure 1: A schematic diagram of the use of a conventional test device. Figure 2: Front view of the modular testing device of the present invention. Figure 3: A side view of the modular testing device of the present invention. Figure 4: Schematic diagram of the crimper and the tester of the present invention. Figure 5: Side view of the crimper of the present invention. FIG. 6 is a schematic diagram of the use of the modular testing device of the present invention (1). FIG. 7 is a schematic diagram (2) of the use of the modular testing device of the present invention. FIG. 8 is a schematic diagram of the use of the modular testing device of the present invention (3). FIG. 9 is a schematic diagram (4) of the use of the modular testing device of the present invention. FIG. 10 is a configuration diagram of the application of the modular testing device of the present invention to testing equipment.

20:測試裝置 20: Test device

21:載具 21: Vehicle

211:底板 211: Bottom plate

212:側板 212: Side panels

213:測試區 213: Test Area

22:承板 22: Bearing plate

221:支撐部件 221: Support parts

222:容置孔 222: accommodating hole

232:測試座 232: Test seat

24:滑軌組 24: Slide rail group

251:馬達 251: Motor

252:皮帶輪組 252: Pulley set

26:框架 26: Frame

261:扣具 261: Buckle

273:壓接件 273: Crimp

276:第一調整件 276: First adjustment piece

Claims

一種模組化測試裝置，包含：承置單元：設有一載具；測試單元：包含承板及複數個測試器，該承板可移入/移出於該承置單元之該載具，該複數個測試器裝配於該承板，以供承置及測試該複數個電子元件；壓接單元：包含框架及複數個壓接器，該框架裝配於該承置單元之該載具，該複數個壓接器裝配於該框架，以供壓接該複數個測試器之該複數個電子元件。 A modular test device, comprising: Bearing unit: with a carrier; Test unit: including a carrier plate and a plurality of testers, the carrier plate can be moved into/out of the holder The carrier of the unit, the plurality of testers are assembled on the carrier plate for supporting placing and testing the plurality of electronic components; Crimping unit: including a frame and a plurality of crimpers, the frame is assembled on the holding unit the carrier, the plurality of crimpers are assembled on the frame for crimping the plurality of crimpers the plurality of electronic components of the plurality of testers.

如請求項1所述之模組化測試裝置，更包含一驅動單元，該驅動單元設有至少一驅動器，以驅動該測試單元位移。The modular testing device according to claim 1, further comprising a driving unit, and the driving unit is provided with at least one driver to drive the testing unit to move.

如請求項1所述之模組化測試裝置，其該測試單元之該承板與該承置單元之該載具間設有至少一滑軌組。The modular testing device according to claim 1, wherein at least one slide rail set is arranged between the support plate of the test unit and the carrier of the support unit.

如請求項1所述之模組化測試裝置，其該測試單元之該承板設有複數個支撐部件，該複數個支撐部件供承置支撐該複數個測試器。The modular testing device as claimed in claim 1, wherein the support plate of the test unit is provided with a plurality of supporting parts, and the plurality of supporting parts are used to support the plurality of testers.

如請求項1所述之模組化測試裝置，其該壓接單元於該載具與該框架間設有至少一快拆器。The modular testing device according to claim 1, wherein the crimping unit is provided with at least one quick release between the carrier and the frame.

如請求項1至5中任一項所述之模組化測試裝置，其該壓接單元之該壓接器包含：第一活動件；第二活動件：沿作業軸線而與該第一活動件作相對配置；作業件：裝配於該第一活動件，以供壓接電子元件；驅動源：以供驅動該第一活動件及該第二活動件作反向位移；作動具：裝配於該第二活動件，以供該第二活動件驅動沿該作業軸線作反向位移；限位件：設於該作動具，以於該限位件承擋受限時，而可限位該作業件沿該作業軸線反向位移。 The modular testing device according to any one of claims 1 to 5, wherein the crimper of the crimping unit comprises: the first moving piece; The second movable member: arranged opposite to the first movable member along the working axis; Working piece: assembled on the first movable piece for crimping electronic components; Drive source: for driving the first movable piece and the second movable piece for reverse displacement; Actuator: assembled on the second movable member for the second movable member to drive along the working shaft line for reverse displacement; Limiting piece: set on the actuating tool, so that when the limiting piece is limited, it can limit the action The work piece is displaced in the opposite direction along the working axis.

如請求項6所述之模組化測試裝置，其該壓接器更包含調整結構，以供微調該作業件，該調整結構包含第一調整件及第二調整件，該第一調整件裝配該框架，並設有第一浮接部，該第二調整件以供該作動具驅動位移，並設有第二浮接部，該第二浮接部與該第一浮接部作相互配合。The modular testing device as claimed in claim 6, wherein the crimper further comprises an adjustment structure for fine-tuning the operation part, the adjustment structure comprises a first adjustment part and a second adjustment part, the first adjustment part is assembled The frame is provided with a first floating portion, the second adjusting member is used for the driving and displacement of the actuating tool, and a second floating portion is provided, and the second floating portion cooperates with the first floating portion .

如請求項6所述之模組化測試裝置，其該壓接器更包含至少一擋掣部件，該擋掣部件可設於該測試器、該承板或該框架，以供擋掣該該限位件。The modular testing device as claimed in claim 6, wherein the crimper further comprises at least one stopper part, and the stopper part can be provided on the tester, the support plate or the frame for stopping the Limits.

如請求項6所述之模組化測試裝置，其該壓接器更包含復歸結構，該復歸結構於該第一調整件設有蓋板，該蓋板與該作動具或該第二活動件間配置第一彈性件。The modular testing device as claimed in claim 6, wherein the crimper further comprises a return structure, the return structure is provided with a cover plate on the first adjustment part, the cover plate is connected to the actuating tool or the second movable part A first elastic member is disposed between.

一種應用模組化測試裝置之測試設備，包含：機台；供料裝置：配置於該機台，並設有至少一容納待作業電子元件之供料承置器；收料裝置：配置於該機台，並設有至少一容納已作業電子元件之收料承置器；架體：配置於該機台，並設有複數層架置空間；複數個如請求項1所述之模組化測試裝置：裝配於該架體之該複數層架置空間；輸送裝置：配置於該機台，並設有至少一第一輸送器，以輸送電子元件；中央控制裝置：以供控制及整合各裝置作動。 A test equipment using a modular test device, comprising: Machine; Feeding device: It is arranged on the machine and has at least one supply for accommodating the electronic components to be operated. material holder; Receiving device: It is arranged on the machine and has at least one receiving device for accommodating the electronic components that have been processed. material holder; Frame body: It is arranged on the machine, and there are multiple layers of installation space; A plurality of modular testing devices as described in claim 1: assembled on the plurality of layers of the rack body mounting space; Conveying device: it is arranged on the machine and is provided with at least one first conveyor for conveying electrons element; Central control device: for controlling and integrating the actions of various devices.