TW202201608A - Wafer stage device and method for controlling the wafer stage device - Google Patents
Wafer stage device and method for controlling the wafer stage device Download PDFInfo
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- TW202201608A TW202201608A TW109146650A TW109146650A TW202201608A TW 202201608 A TW202201608 A TW 202201608A TW 109146650 A TW109146650 A TW 109146650A TW 109146650 A TW109146650 A TW 109146650A TW 202201608 A TW202201608 A TW 202201608A
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67132—Apparatus for placing on an insulating substrate, e.g. tape
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67259—Position monitoring, e.g. misposition detection or presence detection
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
- H01L21/67721—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations the substrates to be conveyed not being semiconductor wafers or large planar substrates, e.g. chips, lead frames
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Abstract
Description
本發明係有關一種用於半導體晶圓的彈射程序之晶圓承載平台裝置及其控制方法。 The present invention relates to a wafer carrier platform device used for the ejection process of semiconductor wafers and a control method thereof.
通過切割程序,半導體晶圓可分割為多個晶粒,並且,將通過切割程序的半導體晶圓轉移至晶圓承載平台裝置以進行彈射程序。 Through the dicing process, the semiconductor wafer can be divided into a plurality of dies, and the semiconductor wafer that has passed the dicing process is transferred to the wafer carrier platform device for the ejection process.
放置在晶圓承載平台裝置上的半導體晶圓的晶粒係被彈射器裝置上推,並且被上推的晶粒被晶粒拾取裝置拾取,且被運送到下一步驟。 The dies of the semiconductor wafer placed on the wafer carrier platform device are pushed up by the ejector device, and the pushed up dies are picked up by the die pickup device and transported to the next step.
對於彈射程序,有時需要根據半導體晶圓的類型以及分離的晶粒的尺寸和厚度來更換彈射器圓頂罩和彈射器的拾取頭。通常,在這種情況下,係藉由使用與晶圓承載平台設備分開安裝的多軸機械手臂系統來更換彈射器圓頂罩。 For ejection procedures, it is sometimes necessary to replace the ejector dome and ejector pick-up head depending on the type of semiconductor wafer and the size and thickness of the separated dies. Typically, in this case, the ejector dome is replaced by using a multi-axis robotic arm system installed separately from the wafer carrier platform equipment.
韓國專利第10-1791788號公開了一種技術,該技術使用與晶圓承載平台分開安裝的機器人來更換圓頂 罩。 Korean Patent No. 10-1791788 discloses a technique for replacing the dome using a robot installed separately from the wafer carrier cover.
背景技術文獻 Background Art Documents
專利文獻:專利文獻1為韓國專利公開第10-1791788號
Patent document:
根據本發明的一個要點,主要目的是提供一種具有改進的構造和控制方法的晶圓承載平台裝置。 According to one aspect of the present invention, the main object is to provide a wafer carrier platform apparatus with an improved method of construction and control.
根據本發明的一個要點,晶圓承載平台裝置有一機台主體部分;以及安裝在機台主體部分上的晶圓支撐部分,其上放置有半導體晶圓;與一內部空間;以及可位於晶圓支撐部分的內部空間中的彈射器圓頂罩。並且,其上安裝有彈射器圓頂罩的彈射器主體部分;使彈射器主體部分移動的彈射器主體驅動部分;以及至少一個支撐彈射器圓頂罩的卡匣單元,並且,機台主體部分可向其一側移動。因此本發明乃在提供一種晶圓承載平台裝置,其包括:一安裝的卡匣單元;使卡匣單元移動的卡匣驅動部;以及用以控制彈射器主體驅動單元和卡匣驅動單元中的至少一個的控制單元。 According to one aspect of the present invention, a wafer carrier platform device has a machine body portion; and a wafer support portion mounted on the machine body portion on which semiconductor wafers are placed; and an interior space; The catapult dome in the inner space of the support section. Also, a catapult body portion on which the catapult dome is mounted; a catapult body drive portion for moving the catapult body portion; and at least one cassette unit supporting the catapult dome, and the machine body portion can be moved to its side. Therefore, the present invention provides a wafer carrier platform device, which includes: a mounted cassette unit; a cassette drive unit for moving the cassette unit; and a drive unit for controlling the ejector main body and the cassette drive unit at least one control unit.
此處,可以在彈射器圓頂的側面上形成一夾持引導部。 Here, a gripping guide may be formed on the side of the catapult dome.
此處,一第一定位部分可形成在彈射器圓頂罩 的下方,並且與第一定位部分相對應的一第二定位部分可形成在彈射器主體部分的上方。 Here, a first positioning portion may be formed in the ejector dome and a second positioning portion corresponding to the first positioning portion may be formed above the ejector body portion.
此處,用以固定彈射器圓頂罩的下部本體夾持器可以安設在彈射器主體部分上。 Here, a lower body holder for securing the catapult dome may be mounted on the catapult body portion.
此處,一卡式盒可以包括至少一個用以感測彈射器圓頂罩的感測器。 Here, a cartridge may include at least one sensor for sensing the catapult dome.
此處,卡匣移動引導器被安裝在平台架主體中,並且卡匣部分可以沿著卡匣移動引導器移動。 Here, the cassette moving guide is installed in the platform frame body, and the cassette part can move along the cassette moving guide.
此處,卡匣單元可以包括支撐彈射器圓頂的一卡匣夾持器。 Here, the cassette unit may include a cassette holder supporting the catapult dome.
此處,在彼此正交的x軸,y軸和z軸上,卡匣部可在x軸方向上移動,並且彈射器主體部分可以在y軸和z軸方向上移動。 Here, on the x-axis, y-axis, and z-axis orthogonal to each other, the cassette part is movable in the x-axis direction, and the ejector main body part is movable in the y-axis and z-axis directions.
另外,根據本發明的另一要點提供了一種控制晶圓承載平台裝置的方法,其移動卡匣單元以將空卡匣單元在卡匣單元之間移動到替換位置;並將附接於彈射器主體的彈射器圓頂罩裝設到空置卡匣單元。且,藉由控制彈射器主體的主體夾持器,將彈射器圓頂與彈射器主體分開;並且,移動卡匣單元以將具有要更換的彈射器圓頂的卡匣單元在卡匣單元之間移動到更換位置。並且,使在替換位置中安裝在卡匣單元上的彈射器圓頂罩與彈射器主體部接觸;並且,藉由控制主體夾持器,將彈射器圓頂罩裝 設到彈射器主體部。 In addition, according to another gist of the present invention, there is provided a method of controlling a wafer carrier platform apparatus that moves a cassette unit to move an empty cassette unit between the cassette units to a replacement position; and attaches to an ejector The catapult dome of the main body is attached to the empty cassette unit. And, by controlling the body gripper of the catapult body, the catapult dome is separated from the catapult body; and the cassette unit is moved to place the cassette unit with the catapult dome to be replaced between the cassette units move to the replacement position. And, the ejector dome mounted on the cassette unit in the replacement position is brought into contact with the ejector main body; and, by controlling the main body holder, the ejector dome is mounted Set to the main body of the catapult.
根據本發明的一個要旨的晶圓承載平台裝置,在承載平台主體的一側安裝有卡式盒部,並且由該卡式盒部的卡式盒單元支撐著彈射圓頂罩。因此,簡化了用於更換彈射器圓頂罩的整體操作和控制,並且減小了安裝空間,從而使設備小型化並實現了設備操作的效率。 In the wafer stage apparatus according to one gist of the present invention, a cassette part is mounted on one side of the stage main body, and the ejection dome is supported by the cassette unit of the cassette part. Therefore, the overall operation and control for replacing the catapult dome is simplified, and the installation space is reduced, thereby miniaturizing the device and realizing the efficiency of the device operation.
W:半導體晶圓 W: semiconductor wafer
100:晶圓承載平台裝置 100: Wafer carrier platform device
110:機台主體 110: The main body of the machine
120:晶圓支撐部 120: Wafer support
121:內部空間 121: Interior Space
130:晶圓支撐部驅動單元 130: Wafer support drive unit
140、140_1、140_2、140_3、140_4:彈射器圓頂罩 140, 140_1, 140_2, 140_3, 140_4: catapult domes
140a:安裝凸緣 140a: Mounting flange
141:夾持器引導部 141: Gripper guide
142:定位孔 142: Positioning hole
L:彈射器圓頂罩140的標籤
L: Label for catapult
150:彈射器本體部 150: Catapult body part
152:主體夾持器 152: Body holder
152a:夾持部 152a: clamping part
152b:夾持部驅動部 152b: Clamping part driving part
160:彈射器本體驅動部 160: Catapult body drive part
170:卡匣部 170: Cassette Department
170a:卡匣移動引導部 170a: Cassette moving guide
171、171_1、171_2、171_3、171_4:卡匣單元 171, 171_1, 171_2, 171_3, 171_4: cassette unit
171a:卡匣夾持器 171a: Cassette Holder
171a_1、171a_2:手部 171a_1, 171a_2: Hands
171b:拉伸彈簧 171b: Extension spring
172:感測器單元 172: Sensor unit
R:夾持輥 R: pinch roller
180:卡匣驅動單元 180: Cartridge drive unit
190:控制單元 190: Control Unit
第1圖是根據本發明實施例的晶圓承載平台設備的示意性透視圖。 FIG. 1 is a schematic perspective view of a wafer carrier platform apparatus according to an embodiment of the present invention.
第2圖是第1圖中所示除半導體晶圓及晶圓支撐構件外的晶圓承載平台裝置之示意性透視圖,。 FIG. 2 is a schematic perspective view of the wafer carrier platform apparatus shown in FIG. 1, excluding the semiconductor wafer and wafer support members.
第3圖是根據本發明實施例在彈射器主體上安裝彈射器圓頂罩的狀態示意圖。 FIG. 3 is a schematic diagram of a state in which a catapult dome is installed on the catapult body according to an embodiment of the present invention.
第4圖是根據本發明實施例彈射器圓頂罩的示意性側視圖。 Figure 4 is a schematic side view of a catapult dome in accordance with an embodiment of the present invention.
第5圖是顯示出第4圖所示彈射器圓頂罩的下表面之示意圖。 FIG. 5 is a schematic view showing the lower surface of the catapult dome shown in FIG. 4. FIG.
第6圖是顯示出根據本發明實施例在彈射器主體上安裝彈射器圓頂罩的狀態的示意圖。 FIG. 6 is a schematic diagram showing a state in which the ejector dome is mounted on the ejector main body according to the embodiment of the present invention.
第7圖是顯示出根據本發明實施例的晶圓承載平台裝置之卡匣部分的示意性透視圖。 FIG. 7 is a schematic perspective view showing a cassette portion of a wafer stage apparatus according to an embodiment of the present invention.
第8圖是顯示出根據本發明實施例中卡匣單元的示意性透視圖。 Fig. 8 is a schematic perspective view showing a cassette unit according to an embodiment of the present invention.
第9圖是顯示出根據本發明實施例的彈射器主體部分和卡匣部分移動以替換晶圓承載平台裝置的彈射器圓頂罩方向的示意圖。 FIG. 9 is a schematic diagram showing the orientation of the ejector body portion and cassette portion moving to replace the ejector dome of the wafer carrier platform apparatus according to an embodiment of the present invention.
第10圖是顯示出根據本發明實施例更換彈射器圓頂罩的過程示意圖,並顯示出其中處於彈射位置的彈射器主體朝向卡匣移動以將現有彈射器圓頂罩安裝在空卡匣上的狀態。 Figure 10 is a schematic diagram showing the process of replacing the catapult dome in accordance with an embodiment of the present invention and showing where the catapult body in the ejection position is moved toward the cassette to install the existing catapult dome on the empty cassette status.
第11圖是顯示出根據本發明一實施例的更換彈射器圓頂罩的過程之示意圖,並顯示出在將現有的彈射器圓頂罩安裝到卡匣部之後彈射器主體部向下移動的狀態。 FIG. 11 is a schematic diagram showing a process of replacing the ejector dome according to an embodiment of the present invention, and showing the downward movement of the ejector body portion after the existing ejector dome is installed to the cassette portion. state.
第12圖是顯示出根據本發明一實施例作為更換彈射器圓頂罩過程的彈射器主體部分向上移動以安裝一新的彈射器圓頂罩之狀態示意圖。 FIG. 12 is a schematic diagram showing a state in which the catapult body portion is moved upward to install a new catapult dome as a process of replacing the catapult dome according to an embodiment of the present invention.
第13圖是顯示出根據本發明一實施例的更換彈射器圓頂罩的過程之示意圖,顯示了其中配備有新的彈射器圓頂罩的彈射器主體部移動到彈射位置的狀態。 13 is a schematic diagram showing a process of replacing the ejector dome according to an embodiment of the present invention, showing a state in which the ejector main body portion equipped with the new ejector dome is moved to the ejection position.
在下文中,將參考附圖詳細描述根據較佳實施例的本發明。在本說明書和附圖中,藉由對具有基本上相同的構造的元件,係使用相同的附圖標記來省略多餘的描述。 Hereinafter, the present invention according to preferred embodiments will be described in detail with reference to the accompanying drawings. In this specification and the drawings, redundant descriptions are omitted by using the same reference numerals for elements having substantially the same configuration.
第1圖是根據本發明實施例的晶圓承載平台設備的示意性透視圖,第2圖顯示出第1圖所示晶圓承載平台設備中的半導體晶圓和晶圓支撐部的示意性透視圖。 FIG. 1 is a schematic perspective view of a wafer carrier platform apparatus according to an embodiment of the present invention, and FIG. 2 shows a schematic perspective view of a semiconductor wafer and a wafer support in the wafer carrier platform apparatus shown in FIG. 1 picture.
根據本發明實施例的晶圓承載平台裝置100可以應用於半導體製造和半導體組裝製程,例如,晶粒鍵合機,晶片貼片機,晶片鍵合機裝置等。
The wafer
晶圓承載平台裝置100包括一機台主體110,一晶圓支撐部120,一晶圓支撐部驅動單元130,一彈射器圓頂罩140,一彈射器本體部150,一彈射器本體驅動部160,一卡匣部170,一卡匣驅動單元180,並且包括一控制單元190。
The wafer
機台主體110是一包括晶圓承載平台裝置100的框架、各種驅動裝置、感應器以及諸如電纜之各種裝置的主體。
The machine
晶圓支撐部120被安裝在機台主體110的上方,而且,半導體晶圓W被放置在晶圓支撐部120的上表面上。
The
晶圓支撐部120為環形,並且在晶圓支撐部120中存在著內部空間121。
The
晶圓支撐部120可以安裝在機台主體110上,使得能夠在x-y平面中移動以進行彈射程序。
The
晶圓支撐部驅動單元130可使得晶片支撐部120在x-y平面上移動,因此,晶圓支撐部驅動單元130包括多個馬達,並且包括能夠在x-y平面上移動的各種機構機件。
The wafer supporting
依照本實施方式的晶圓承載平台裝置100的安設係使得晶圓支撐部120能夠在x-y平面上移動,並且晶圓支撐部驅動單元130被配置為使晶圓支撐部120移動,但是本發明不限於此。亦即,可以用固定晶圓支撐部的方式安設本發明的晶圓承載平台裝置,在這種情況下,可以不包括晶圓支撐部驅動單元。
The
同時,彈射器圓頂罩140可以位於晶圓支撐部120的內部空間121中。如第3圖所示,彈射器圓頂罩140推動半導體晶圓W的晶粒。其有兩個引腳(P)。
Meanwhile, the
第3圖是顯示根據本發明實施例的在彈射器主體上安裝有彈射器圓頂罩的狀態之示意圖,第4圖是根據本發明實施例的彈射器圓頂罩的示意性側視圖。第5圖顯示第4圖所示彈射器圓頂罩下表面的示意圖。第6圖顯示根據本發明實施例的在彈射器主體上安裝彈射器圓頂罩 的狀態之示意圖。 FIG. 3 is a schematic view showing a state in which the ejector dome is mounted on the ejector body according to the embodiment of the present invention, and FIG. 4 is a schematic side view of the catapult dome according to the embodiment of the present invention. Figure 5 shows a schematic view of the lower surface of the catapult dome shown in Figure 4. Figure 6 shows the installation of the catapult dome on the catapult body according to an embodiment of the present invention Schematic diagram of the state.
參照第3圖和第4圖,一對夾持器引導部141形成在彈射器圓頂罩140的側面上,而彼此面對,並且,夾持器引導部141是為卡匣部170的卡匣夾持器所形成,以便於卡匣夾持器171進行夾持動作(170、171示於後圖)。
Referring to FIGS. 3 and 4 , a pair of clamper guides 141 are formed on the side surfaces of the
雖然根據本實施例,夾持器引導部141形成在彈射器圓頂罩140的側面上,但是本發明不限於此。即,根據本發明的夾持器引導部可以不形成在彈射器圓頂的側面上。
Although the
一安裝凸緣140a乃形成在彈射器圓頂罩140的下方,並且,安裝凸緣140a是由主體夾持器152的三個夾持部152a夾持並固定的部分。
A mounting
另外,如第5圖所示,在彈射器圓頂罩140的下表面上形成有定位孔142作為第一定位部。如第6圖所示,定位孔142可被裝設成與定位突起151套合的狀態,是定位突起151乃形成在彈射器本體部150上表面的第二定位部分,從而彈射器圓頂罩140被***到彈射器本體部150上。當安裝在該彈射器本體部150上時,即確定了方便安裝的位置。
In addition, as shown in FIG. 5 , a
在該實施例中,定位孔142形成為彈射器圓頂罩140的下表面上的第一定位部分,定位突起151形成為彈射器本體部150上的第二定位部分。雖然此可確定位置,但
是本發明不限於此;亦即,根據本發明,與上述情況相反,可在彈射器圓頂罩140的下表面上形成定位突起作為第一定位部,並且在彈射器本體部150的上表面上形成定位孔作為第二定位部。藉由此形成,也可以確定位置。另外,在安裝凸緣140a或彈射器本體部150的形體中,除了孔或突出部以外,可具有預定的變形部,由於在安裝凸緣140a或彈射器本體部150中存在與該變形部相對應的部分,因此可以引導彈射器圓頂罩140物理上準確地將彈射器本體部150定位在預定位置。
In this embodiment, the
由於存在著各種類型的半導體晶圓W,所以彈射器圓頂罩140也具有與半導體晶圓W的類型相對應的適合於每個半導體晶圓W的類型。因此,在彈射過程中,根據半導體晶圓W的類型使用合適類型的彈射器圓頂罩140。彈射器圓頂罩140的類型可以在彈射器圓頂罩140的標籤L上指示。亦即,在標籤L上顯示包括彈射器圓頂罩140的類型和規格的信息,並且該信息的規格可以包括字樣,符號和條碼等。
Since there are various types of semiconductor wafers W, the
使用感應器部172讀取彈射器圓頂罩140的標籤L。而控制單元190基於從感應器部172讀取的結果,識別卡匣部170的卡匣單元171所支撐的彈射器圓頂罩140的類型,其後,彈射器圓頂罩140即將在更換的情況下使用。
The tag L of the catapult
同時,彈射器圓頂罩140安裝在彈射器本體部
150上。
At the same time, the catapult
如上所述,定位突起151係形成在彈射器本體部150的上表面上,並且定位突起151***形成在彈射器圓頂罩140下方的定位孔142中,以允許彈射器圓頂罩140的位置得以確定。
As described above, the positioning
另外,在彈射器本體部150上,形成有固定彈射器圓頂罩140下部的主體夾持器152。
In addition, on the ejector
如第3圖所示,主體夾持器152具有對稱配置的三個夾持部152a。三個夾持部152a具有能夠在徑向上相互分離或接近的結構,其移動由夾持部驅動部152b所驅動。
As shown in FIG. 3, the
另外,在夾持部152a的端部,裝設有作為軸承的夾持輥R,通過該夾持輥R,能夠容易地夾持彈射器圓頂罩140的安裝凸緣140a。
In addition, at the end of the
同時,第1圖所示之彈射器本體驅動部160移動彈射器本體部150。即,彈射器本體驅動部160升高/降低彈射器本體部150或向卡匣部170移動,以更換彈射器圓頂罩140。為此,彈射器本體驅動部160可以包括至少一個馬達,並且還可以包括各種傳送機構,例如能夠進行傳送的螺桿傳送裝置等。
At the same time, the ejector
具體地,彈射器本體驅動部160被構造為在y-z平面中移動彈射器本體部150。亦即,通過彈射器本體驅動部160,使彈射器本體部150在y軸方向和z軸方向上移
動,稍後將對其詳細的運動進行描述。
Specifically, the ejector
第7圖是示出根據本發明實施例的晶圓承載平台設備的卡匣單元的示意性透視圖,第8圖是示出根據本發明實施例卡匣單元的示意性透視圖。 FIG. 7 is a schematic perspective view showing a cassette unit of a wafer carrier platform apparatus according to an embodiment of the present invention, and FIG. 8 is a schematic perspective view showing a cassette unit according to an embodiment of the present invention.
參照第1圖和第2圖,卡匣部170係被安裝為可在機台主體110的一側上移動。為此,卡匣部170乃被安裝為可沿著卡匣移動引導部170a滑動者。
Referring to FIGS. 1 and 2 , the
卡匣移動引導部170a安裝在機台主體110的一側,並且,卡匣部170可以沿著卡匣移動引導部170a移動。
The cassette moving
卡匣部170包括四個卡匣單元171。每個卡匣單元171保持並支撐彈射器圓頂罩140。每個卡匣單元171包括用以支撐彈射器圓頂罩140的卡匣夾持器171a。
The
根據本實施例,卡匣部170包括四個卡匣單元171,但是本發明不限於此。亦即,根據本發明的卡匣部僅需要包括至少一個卡匣單元,並且對數量沒有特別限制。例如,包括在根據本發明的卡匣部中的卡匣單元的數量可以是1、2、3、5、6等。另外,如果要更換的彈射器圓頂罩140的數量較大,則卡匣單元171的佈置和佈置可被配置成多行,但是卡匣單元171的佈置和佈置以左右佈置和豎直佈置來佈置。在這種情況下,可以進一步設置單獨的驅動單元,使得包括卡匣單元171的整個殼體可以上下旋轉或移動。
According to the present embodiment, the
卡匣夾持器171a包括兩個手部171a_1和171a_2,並且,兩個手部171a_1和171a_2被構造成使得它們之間的距離係被彈性地加寬或變窄。亦即,拉伸彈簧171b裝設在手部171a_1和171a_2中,從而可以彈性地保持它們之間的距離。另外,被安裝為軸承的夾持輥R被裝設在手部171a_1和171a_2中的每一個的端部,從而容易地夾緊彈射器圓頂罩140的側表面。
The
另外,卡匣部170可以包括至少一個感測彈射器圓頂罩140的感測器單元172。
Additionally, the
感測器單元172裝置在每個卡匣部171中,並且可以識別由每個卡匣部171支撐的彈射器圓頂罩140的標籤L,並且還可以識別卡匣部171所識別出彈射器圓頂罩140是被夾持還是被支撐著,或者處於不被支撐的空置狀態,如果是,則檢測支撐是否得到了良好的維護,並向控制單元195發送信號。
The
感測器單元172可安裝在多個卡匣部171中的每一個上,並且可以使用能夠讀取彈射器圓頂罩140的標籤L之裝置。例如,可以將CCD元件,CMOS元件,照相機等用作感測器單元172,並且,控制單元190從感測器單元172和彈射器圓頂罩140接收並讀取關於標籤L的信息,識別類型並將其用於控制。
The
雖然在本實施例中使用的感測器單元172具有
讀取標籤L的功能,但是本發明不限於此。亦即,根據本發明,即使感測器單元不具有讀取標籤L的功能,也可以應用僅能夠檢測彈射器圓頂140的夾持狀態的感測器。即,當彈射器圓頂罩140的類型受到限制時,僅需要掌握彈射器圓頂罩140的夾持狀態,並且在這種情況下,可以使用光感測器,磁感測器,霍爾(Hall)感測器,照相機等。
Although the
另外,在本實施例的情況下,彈射器圓頂罩140的類型可由讀取標籤L和標籤L的感測器單元172識別,但是本發明不限於此。亦即,在本發明的情況下,對藉由檢測彈射器圓頂罩來識別彈射器圓頂罩的類型的方法沒有特別限制。例如,諸如RFID的無線識別標籤,無線傳輸裝置等可以被裝設在彈射器圓頂罩140上,並且感測器部分可包括用以識別這種無線信號的接收器。在這種情況下,可以使用各種無線通信,例如Wi-Fi,藍牙,NFC,Zigbee和Z-Wave等。
In addition, in the case of the present embodiment, the type of the
同時,卡匣驅動單元180移動卡匣部170。亦即,卡匣驅動單元180移動卡匣部170,以使彈射器圓頂罩140在所選位置被卡匣單元171替換。為此,卡匣驅動單元180可包括至少一個驅動馬達,並且還可以包括各種輸送機構,例如能夠移動的螺桿輸送裝置。
At the same time, the
特別地,卡匣驅動單元180在x軸方向上移動卡匣部170,稍後亦將對其詳細的移動進行描述。
In particular, the
同時,控制單元190控制晶圓片支撐部驅動單元130,彈射器本體驅動部160和卡匣驅動單元180。亦即,控制單元190從卡匣部170的感測器單元172接收信號,並且根據預設程序,執行各種控制動作。為此,控制單元190可以包括能夠識別和處理能夠識別和處理圖像和圖像數據的硬體,軟體,固件,例如電路板和集成電路晶片,以及用戶或控制算法。其是在控制下驅動的。
Meanwhile, the
控制單元190可以被專門配置用於晶圓承載平台裝置100,但是若在應用晶圓承載平台裝置100的半導體製造過程中的裝置之整個控制單元時,即晶粒鍵合機,晶片貼片機,晶片鍵合機等;也可以集體和配置。
The
以下,將參照第9圖至第13圖,描述根據本實施例的晶圓承載平台裝置100的操作和控制方法。
Hereinafter, the operation and control method of the
第9圖是顯示為了更換本發明的一個實施方式的晶圓承載平台裝置之彈射器圓頂罩而使彈射器主體部和卡匣部移動的方向示意圖。第10圖是顯示出根據本發明的實施例之更換彈射器圓頂罩的過程之示意圖,顯示出如下狀態:其中處於彈出位置的彈射器主體部分朝著卡匣部移動以將現有的彈射器圓頂罩部分安裝到空卡匣部分。另外,第11圖是顯示出根據本發明的實施例之在將現有的彈射器圓頂罩部分安裝在卡匣部分中之後,作為更換彈射器圓頂罩部分的過程,使彈射器圓頂罩部分向下移動之狀態 的示意圖,第12圖是顯示出根據本發明實施例之更換頂蓋的過程,該圖是顯示出了使頂蓋主體向上移動,以安裝新頂蓋的狀態的示意圖,第13圖是根據本發明實施例的頂蓋,表示圓頂罩的更換工序的示意圖,其中,具有新的彈射器圓頂罩的彈射器主體部移動到彈出位置的狀態。 FIG. 9 is a schematic diagram showing the direction in which the ejector main body and the cassette are moved in order to replace the ejector dome of the wafer stage apparatus according to the embodiment of the present invention. FIG. 10 is a schematic diagram showing the process of replacing the ejector dome according to an embodiment of the present invention, showing a state in which the ejector body portion in the ejected position is moved toward the cassette portion to replace the existing ejector The dome portion is mounted to the empty cassette portion. In addition, FIG. 11 is a diagram showing the ejector dome as a procedure for replacing the ejector dome portion after the existing ejector dome portion is installed in the cassette portion in accordance with an embodiment of the present invention. Partially moving down Fig. 12 is a schematic diagram showing the process of replacing the top cover according to an embodiment of the present invention, and Fig. 13 is a schematic diagram showing the state of moving the top cover body upward to install a new top cover The top cover of the embodiment of the invention is a schematic diagram showing the replacement process of the dome cover, in which the ejector main body with the new ejector dome is moved to the ejected position.
在第9圖中,卡匣單元171_1、171_2、171_3和171_4按順序佈置。卡匣單元171_1配備有彈射器圓頂罩140_1,卡匣單元171_3配備有彈射器圓頂140_3,並且,卡匣單元171_4配備有彈射器圓頂140_4,但是卡匣單元171_2則顯示為空無的情形。另外,顯示出了彈射器圓頂罩140_2係安裝在彈射器本體部150上的狀態。第9圖中所示的箭頭顯示出了彈射器本體部150和卡匣部170的移動方向,並且在彼此垂直的x軸,y軸和z軸上,彈射器本體部150是在y軸。它可以在x軸和z軸的兩個方向上移動,並且,卡匣部170可以在x軸的方向上移動。
In Fig. 9, the cassette units 171_1, 171_2, 171_3 and 171_4 are arranged in order. Cassette unit 171_1 is equipped with catapult dome 140_1, cassette unit 171_3 is equipped with catapult dome 140_3, and cassette unit 171_4 is equipped with catapult dome 140_4, but cassette unit 171_2 is shown empty situation. In addition, a state in which the ejector dome 140_2 is attached to the
在下文中,將依序描述彈射器圓頂罩140之更換過程的示例。不言而喻,以下替換過程僅是示例,並且也可以應用其他各種替換過程。
Hereinafter, an example of the replacement process of the
首先,當將半導體晶圓W傳送到晶圓承載平台裝置100以進行彈射程序時,有關半導體晶圓W的類型數據即被傳送到控制單元190。
First, when the semiconductor wafer W is transferred to the
控制單元190根據傳送到晶圓承載平台裝置
100的半導體晶圓W的類型,確定當前安裝在彈射器本體部150上的彈射器圓頂140_2是否適合於彈出處理,如果確定半導體晶圓W被放置在晶片支撐單元120上,則驅動當前安裝的彈射器圓頂罩140以執行排出處理。
The
如果控制器190確定當前安裝在彈射器本體部150上的彈射器圓頂140_2不適合彈射過程,則安裝在卡匣部170上的彈射器圓頂罩140_1。如果確定需要更換140_3和140_4中的彈射器圓頂罩140_3,則執行以下作業。
If the
控制單元190首先驅動卡匣驅動單元180以移動卡匣部170,從而在卡匣單元171_1、171_2、171_3和171_4中更換空的卡匣單元171_2。另外,控制單元190驅動彈射器本體驅動部160以使彈射器本體部150沿①的箭頭方向(z軸的負方向)和②的箭頭方向(如第10圖所示)順序地移動。在負y軸方向和箭頭方向③(z軸正方向)上移動,然後將安裝在彈射器本體部150上的彈射器圓頂140_2移動到卡匣單元171_2而嵌合之。
The
然後,控制單元190控制彈射器本體部150的主體夾持器152,以使彈射器圓頂單元140_2與彈射器本體部150分離,從而可以移動彈射器本體部150。如第11圖所示,藉由驅動彈射器本體驅動部160之動作,彈射器本體部150乃下降。
Then, the
然後,控制單元190驅動卡匣驅動單元180以移
動卡匣部170,從而將卡匣單元171_1、171_2、171_3和171_4中的卡匣單元171_3移動到替換位置。為了移動,將要更換的彈射器圓頂罩140_3乃裝設在卡匣單元171_3上。
Then, the
然後,如第12圖所示,控制單元190驅動彈射器本體驅動部160以使彈射器本體部150升高,使得彈射部器本體部150的上表面和彈射器圓頂單元140_3之安裝凸緣140a接觸。隨後,通過控制彈射器本體部150的主體夾具152,將彈射器圓頂罩140_3安裝在彈射器本體部150上。在這樣的安裝過程中,彈射器圓頂罩140_3的定位孔142和彈射器本體部150的定位突起151使得能夠精確且容易地安裝。
Then, as shown in FIG. 12, the
然後,如第13圖所示,控制單元190使彈射器本體部150沿y軸方向移動以使其與卡匣部170分離,然後沿z軸方向使其升高,從而使彈射器圓頂罩140_3通過將機台放置在足以進行彈出過程的高度來完成更換過程。在排出過程中,將半導體晶圓W放置在晶圓支撐部120上,並且驅動替換的彈射器圓頂罩140_3以執行彈射程序。
Then, as shown in FIG. 13, the
如上所述,根據本實施例的晶圓承載平台裝置100,卡匣部170安裝在機台主體110的一側,並且卡匣部170的卡匣單元171是彈射器圓頂罩。其具有支撐的結構(140)。在那種情況下,與晶圓承載平台裝置分開裝設以運送彈射器圓頂罩之機械手臂結構的傳統技術相比,可以
減小整體安裝空間。然後,可以實現設備的小型化和裝設空間的優化。
As described above, according to the
另外,根據本實施例的晶圓承載平台裝置100,為了更換彈射器圓頂罩140,彈射器本體部150可以在y軸和z軸這兩個方向上移動,並且,由於卡匣部170僅需要在x軸方向上移動,因此可以最小化更換彈射器圓頂罩140所需的驅動部件和傳送機構,從而降低了製造成本和維護成本。另外,由於可以使移動路徑最小化,所以可以使更換彈射器圓頂罩140所需的工作空間最小化。
In addition, according to the
另外,根據本實施例的晶圓承載平台裝置100,多個卡匣單元171中的每一個均包括感應測器單元172,從而可以識別被支撐的彈射器圓頂罩140的類型和支撐狀態。因此,可以根據半導體晶圓W的類型快速確定合適的彈射器圓頂罩140,並且如果需要,可以更換彈射器圓頂罩140以進行彈射處理。
In addition, according to the
另外,根據本實施例的晶圓承載平台裝置100,在彈射器圓頂罩140的下表面上形成定位孔142,並且在彈射器本體部150的上表面上形成定位突起151。由於其形成可快速且準確地確定安裝位置,因此當將彈射器圓頂罩140安裝在彈射器本體部150上時,實現了快速且穩定的安裝。
In addition, according to the
上述說明已參考附圖中示出的實施例就本發 明的一個要點進行描述,惟所述僅為例示性,並且本領域普通技術人員可以進行各種修改和其他等效實施例。因此,本發明的真正保護範圍應僅由所附申請專利範圍來確定。 The foregoing description has been made of the present invention with reference to the embodiments shown in the accompanying drawings. In order to describe an important point, the description is only exemplary, and various modifications and other equivalent embodiments may be made by those of ordinary skill in the art. Therefore, the true scope of protection of the present invention should be determined only by the scope of the appended claims.
〔產業利用性〕 [Industrial Availability]
根據本發明的一個要點,以上所述可以用於與晶圓承載平台裝置有關的產業中。 According to one aspect of the present invention, the above can be used in industry related to wafer carrier platform apparatus.
W:半導體晶圓 W: semiconductor wafer
100:晶圓承載平台裝置 100: Wafer carrier platform device
110:機台主體 110: The main body of the machine
120:晶圓支撐部 120: Wafer support
121:內部空間 121: Interior Space
130:晶圓支撐部驅動單元 130: Wafer support drive unit
140:彈射器圓頂罩 140: Catapult Dome
150:彈射器本體部 150: Catapult body part
160:彈射器本體驅動部 160: Catapult body drive part
170:卡匣部 170: Cassette Department
170a:卡匣移動引導部 170a: Cassette moving guide
180:卡匣驅動單元 180: Cartridge drive unit
190:控制單元 190: Control Unit
Claims (9)
Applications Claiming Priority (2)
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KR1020200078043A KR102405424B1 (en) | 2020-06-25 | 2020-06-25 | Wafer stage device |
KR10-2020-0078043 | 2020-06-25 |
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TW202201608A true TW202201608A (en) | 2022-01-01 |
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TW109146650A TW202201608A (en) | 2020-06-25 | 2020-12-29 | Wafer stage device and method for controlling the wafer stage device |
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KR100960598B1 (en) * | 2008-01-29 | 2010-06-07 | 주식회사 탑 엔지니어링 | Apparatus for supplying wefer in bonding machine |
KR101304030B1 (en) * | 2011-12-08 | 2013-09-04 | 리드텍(주) | The ejection apparatus for pick up semiconductor chip |
KR101593801B1 (en) * | 2014-05-29 | 2016-02-12 | 세메스 주식회사 | Apparatus for ejecting dies |
KR102503284B1 (en) * | 2016-09-29 | 2023-02-23 | 세메스 주식회사 | Apparatus for exchanging a collet and a hood |
JP7102305B2 (en) * | 2018-09-19 | 2022-07-19 | ファスフォードテクノロジ株式会社 | Manufacturing method of die bonding equipment and semiconductor equipment |
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- 2020-06-25 KR KR1020200078043A patent/KR102405424B1/en active IP Right Grant
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KR102405424B1 (en) | 2022-06-07 |
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