TW201144843A - Inspecting apparatus, inspecting method and inspecting program for photovoltaic devices - Google Patents

Inspecting apparatus, inspecting method and inspecting program for photovoltaic devices

Info

Publication number
TW201144843A
TW201144843A TW099145369A TW99145369A TW201144843A TW 201144843 A TW201144843 A TW 201144843A TW 099145369 A TW099145369 A TW 099145369A TW 99145369 A TW99145369 A TW 99145369A TW 201144843 A TW201144843 A TW 201144843A
Authority
TW
Taiwan
Prior art keywords
inspecting
area
photovoltaic devices
program
search window
Prior art date
Application number
TW099145369A
Other languages
Chinese (zh)
Inventor
Yoshinari Morio
Makoto Ishikawa
Junichi Takahashi
Masahiro Goto
Original Assignee
Nisshinbo Mechatronics Inc
Univ Mie
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nisshinbo Mechatronics Inc, Univ Mie filed Critical Nisshinbo Mechatronics Inc
Publication of TW201144843A publication Critical patent/TW201144843A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9501—Semiconductor wafers
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
    • H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
    • H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy

Landscapes

  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Photovoltaic Devices (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

The present invention provides an inspecting apparatus for photovoltaic devices, which is able to identify a zonal defect position in a photovoltaic cell. The inspecting apparatus for photovoltaic devices of the present invention includes an identifying means of the position of the zonal defect with applying a suitable search window (43) to an image representing a photovoltaic cell in an electrified state. The search window (43) includes a first area (40a) and a second area (40b) separated into two parts by the first area (40a). The identifying means of the zonal defect position identifies the zonal defect extending toward the same direction with the first area based on the brightness within the first area (40a) and the second area (40b) while the search window (43) is applied to the photovoltaic cell.
TW099145369A 2009-12-22 2010-12-22 Inspecting apparatus, inspecting method and inspecting program for photovoltaic devices TW201144843A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2009290557A JP2011134764A (en) 2009-12-22 2009-12-22 Solar cell inspection apparatus, and solar cell inspection method, and program

Publications (1)

Publication Number Publication Date
TW201144843A true TW201144843A (en) 2011-12-16

Family

ID=44196225

Family Applications (1)

Application Number Title Priority Date Filing Date
TW099145369A TW201144843A (en) 2009-12-22 2010-12-22 Inspecting apparatus, inspecting method and inspecting program for photovoltaic devices

Country Status (3)

Country Link
JP (1) JP2011134764A (en)
TW (1) TW201144843A (en)
WO (1) WO2011078374A2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI494580B (en) * 2013-02-27 2015-08-01 Inventec Solar Energy Corp Solar cell detection method and device thereof
TWI564577B (en) * 2015-09-11 2017-01-01 英穩達科技股份有限公司 Method for detecting a solar cell with defects

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6880699B2 (en) * 2016-12-16 2021-06-02 東京電力ホールディングス株式会社 Inspection equipment, inspection method and inspection program
WO2021182061A1 (en) * 2020-03-13 2021-09-16 アートビーム有限会社 Solar cell, and production method and measurement device for solar cell
KR102592029B1 (en) * 2021-06-25 2023-10-23 경북대학교 산학협력단 Method and apparatus for extracting feature of photovoltaic module using thermal imaging technique

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005114671A (en) * 2003-10-10 2005-04-28 Lion Engineering Co Ltd Defect-inspecting method
JP5243785B2 (en) * 2007-12-28 2013-07-24 日清紡ホールディングス株式会社 Solar cell inspection apparatus and solar cell defect determination method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI494580B (en) * 2013-02-27 2015-08-01 Inventec Solar Energy Corp Solar cell detection method and device thereof
TWI564577B (en) * 2015-09-11 2017-01-01 英穩達科技股份有限公司 Method for detecting a solar cell with defects

Also Published As

Publication number Publication date
WO2011078374A3 (en) 2011-09-15
WO2011078374A2 (en) 2011-06-30
JP2011134764A (en) 2011-07-07

Similar Documents

Publication Publication Date Title
WO2020123305A3 (en) Generating capture probes for spatial analysis
WO2007079344A3 (en) Methods and systems for binning defects detected on a specimen
WO2019018693A3 (en) Methods of analyzing microscopy images using machine learning
IL281367B (en) Method and system for correlating optical images with scanning electron microscopy images
TW201144843A (en) Inspecting apparatus, inspecting method and inspecting program for photovoltaic devices
WO2009120623A3 (en) Method and apparatus for detecting defects using structured light
WO2014186407A3 (en) Machine learning method and apparatus for inspecting reticles
MX362545B (en) Image analysis and measurement of biological samples.
EP3904866A4 (en) Defect inspecting device, defect inspecting method, and program for same
WO2013003679A3 (en) Method and system for webpage regression testing
EP3889590A3 (en) Apparatus for inspecting a substrate for a foreign substance
BR112016007106A2 (en) improved pregnancy test device and method
WO2011137731A3 (en) Method for controlling light-emitting device in terminal equipment, apparatus thereof and terminal equipment
WO2012020929A3 (en) Apparatus and method for displaying a point of interest
WO2009126910A3 (en) Laser scribe inspection methods and systems
GB201117905D0 (en) Method for processing an image and an image photographing apparatus applying the same
EP3825957A4 (en) Construction method, inspection method, and program for image data with label, and construction device and inspection device for image data with label
GB2473363A (en) Assessing biometric sample quality using wavelets and a boosted classifier
WO2018087338A3 (en) Inspection method and inspection system for inspecting a vehicle in the operating state
WO2010088120A3 (en) Methods and apparatus for detection and classification of solar cell defects using bright field and electroluminescence imaging
EP2706523A3 (en) Device and method for repairing display device
SG179436A1 (en) Illumination device
MX2022000529A (en) Break analysis apparatus and method.
MY165130A (en) Surface defect inspecting device and method for hot-dip coated steel sheets
EP3940386A4 (en) Analyte collecting device, and analyte collecting method and analyte inspection system using same