200821795 九、發明說明： 【發明所屬之技術領域】 -種判斷灰塵堆積量之系統與方法’特別是指—種將穿過灰 塵之光源轉換為清潔度數值以判斷灰塵堆積量之系統與方法。 【先前技術】 在電腦主機中，通常灰塵會隨著主機内部的氣流方向飄游而 在特定的位置上堆積，由於決定電腦主機中的氣流方向的風扇可 能會被放置在主機機殼上，也可能會被放置在各電路板上的晶片 (Chip)上’因此堆積的位置會因為風扇放置的位置不同使得灰 塵堆積的位置不同，㈣在的個人f腦為例，主機板上的中央處 理器「al Processing Unit;CPU)上都會有一顆風扇幫助中 央處理器散熱，於是，-般被放置在中央處理器旁邊的記憶體會 擔住風扇造成的氣流，因此空氣中的灰塵往往會被記憶體播下: 加速了記憶體背對風扇的那—涵灰塵的堆積。於是，電腦主機 在經過-段時_個之後，域的機糾會有大量的灰塵在固 定的幾個地方堆積，而這麵積的灰齡往都是造成電腦不穩定 甚至主機中的各個電路板短路或燒毀的原因之一。 雖然灰塵堆積在主機機殼内是不好的情況，但在目前的電腦 主機架構下卻無法避免灰塵堆積關題，而這_題對於使用兩 腦主機的使用者而言，反而最容易被忽略掉，主要的原因不外乎 看不到主機機殼内堆積了多少的灰塵，所以往往要等到電腦 發生問題才會將主機機殼打開，而也是制了這辦候才會知道 200821795 主機機殼崎積了相當多的灰塵轉清理，但是，若電腦主機發 生問題的真的是因為堆積的灰塵所造成的，最理想的狀況^ L於在⑨腦主機發生問題前就將堆積的灰塵清理乾淨，然而，對 於使用者而言，並不可能騎將主機機殼㈣來檢錢有灰塵 堆積’因此，如何能提供—種檢測灰塵堆積量的魏 待 決的問題。 行鲆 【發明内容】 馨於以上的問題，本發明的主要目的在於提供一種運用光源 強度判斷灰鱗·之純與紐，雜灰塵堆積量的不同，穿 過灰塵的光源強度也會不同，使得可以由光源強度的不同產生出 ^同的清潔度數值，由清潔度數值變可以騎出灰塵堆積量的多 券’在灰塵補量衫時提示制者，如此可以制灰塵堆積量， 藉以解決先前技術所提到之之問題。 為達上述目的，本發明可以藉由系統與方法兩方面達成，本 發明所揭露之系統，包括有··發光模組、感光模組、判斷模組。 本發明所賊之方法，包括有下列步驟：發錢組發出光源、感 光核組依據光源穿過灰塵後之強度產生相對應之清潔度數值、判 斷杈組判斷該清潔度數值達到預定值時，產生提示訊號。 有關本發明之詳細特徵與實作，茲配合圖示在實施方式中詳 細說明如下，其内容足以使任何熟習相關技藝者了解本發明之技 術内容並據以實施，且根據本說明書所揭露之内容及圖式，任何 熟習相關技藝者可輕易地理解本發明相關之目的及優點。 【實施方式】 200821795 以下先以「第1圖」本發明所提之運用感光模組判斷灰塵堆 積量之系統架構圖來說明本發明的系統運作。如圖所示，本發明 之系統含有發光模組210、感光模組220、判斷模組230。其中 發光模組210負責發出光源300至感光模組22〇 ;感光模組22〇 負責接收發光模組210發出之光源，並將接收到光源3〇〇的 強度轉換為相對應的清潔度數值；判斷模組23〇負責接收感光模 組220轉換產生的清潔度數值，並判斷感光模組22〇產生的清潔 度數值是翻定值，當感光模組22Q產生的清潔度數值到達 預定值時，產生提示訊號。上述之光源3〇〇在被發光模組21〇發 出之後，會穿過堆積在發光模組21〇與感光模組22〇間之灰塵， 最後抵達感光模組220，由於發紐組2彳〇與感絲組22〇間有 灰塵堆積，因此光源300會有部份受到堆積的灰塵的阻隔，使得 到達感光她220的強度會比由發光模組21〇剛發出時的強度來 的小，可以想見的，當堆積的灰塵越多，光源3〇〇被灰塵擋下的 機率也越高，所以到達感光模組22Q的強度也就越小。 實際上，本發明所提之感光模組220更可以包含有感光元件 221以及轉換電路222。其中感光元件221，如「第2圖」所示， 在感光元件221兩端的電極加上電壓，當光源3〇〇照射到感光元 件221上，由光照到光電導體2211上產生的光生載子會在外加 電智的作用下沿-定方向運動，於是便會產生電流，由於光生載 子的多寡蚊電流大小，而光生載子的錄又由光源大小決定， 所以感光tl件221產生的電流會隨著光源·強度大小的變化而 改變；轉換電路222負責將感光元件221產生的電流大小轉換為 200821795 清潔度數值。 、接著以—個實施例來解說本發明的運作系統與方法，本實施 例以在主=板上執彳了本發明為例，但本發日不限於使用在主機 =上’本貫施例中所提之發光模組21〇以發光二極管⑴狎 mitti叩Diode; LED)為例’但本發明之發光模組a〇並不以發 f二極管為限，其他可發出光源的稀均可為本發騎提之發光 桓組210 ;本實施例中之感光元件221以光敏電阻為例，但本發 ^提之感光7!：件221亚不以光敏電阻為限，其他可將光源強度 :換為電流之元件均可為本發名所提之感光元件221。此外，請 —併參照「第3圖」本發明之運用感光模_斷灰塵堆積量 ^方法流程圖。當使用本發明時，首先要在主機板上設置發光模 、、且210以及具有感光元件221與轉換電路222的感光模組挪， 2此在主機板被安裝到主機機殼中時，本發明即可制堆積在主 機機殼中的灰塵。 …田主機被開機時，發光二極管會發出光源3〇〇 (步驟⑽）， 2 300牙雜積的灰塵之後，會鱗光敏餘，光敏電阻會依 源·的強度產生電流，例如為5 mA，接著轉換電路222 =測量出通過光敏電阻的電流值為5mA，並以測量後的電流值 、、支仃轉換而成為對應的清潔度數值（步驟320)，但本發明所提 ’眚潔度數值並不限於電流值。 在^換電路222產生清潔度數值後，B|〇s中的判斷模組咖 會由輪出/入埠⑽_)接收由轉換電路222產生的清潔度 值，並判斷接收的清潔度數值是否達到預定值的1〇 mA (步ς 200821795 _，由於清潔度數值達到預定值，因此判斷模組23〇會產生提 不訊號（步驟34〇)，使得基本輸出/入系統（Basic 0utput sy輕· B丨〇S)控制在主機機殼上與主機板相連接的啦燈亮 起田使用者看到LED亮起時便會知道主機機殼内雄積了 度的灰塵量，需要清理顯殼。如此，使財發明便可以不將 ==___灰她如驗先前技術所 另外’由於上述的方法是在職時由B|〇s 判斷清潔敍值衫__值，若域長時财職，例如= 値為’則猎由開機時才判斷是否有堆積的灰塵稍嫌不 因此可以由運作在主機上的常駐程式執行判斷廳230，也就是 說，當綱路222產生_數值（步驟 = 在作業婦已產雜方喊（步驟34Q)，例如， U 麵方摘轉縣中告知使用者· 要 >月理主機機殼_錢，但告知朗者的方式並靴 = f 1由於判斷模組23Q是由常駐程式執行，因此每隔—段時= 斷杈組230就會被執行一次，如此便1 主機機殼内有多少灰塵堆積。 而要寻到開叫才會知道 熱敏電阻 〇h_ys_ive「esistance)‘^^ 200821795 μ度十分破感之電阻體，此種電子元件在溫度改變時内部電阻值 會產生大幅變化，使得通過熱敏電阻的電流跟著產生相對應的變 化，溫度控制晶片便會將不同的電流大小對應產生不同的數值， 因此可以將溫度感應晶片上連接熱敏電阻的接腳改以光敏電阻連 接，由於光敏電阻會依據外在環境的亮度變化產生的電流大小， 因此判斷模組23G只需要讀取溫度控制晶#將電雜換後儲存於 暫存器中的數值即為清潔度數值。 此外，而由於光線是直線前進的特性，同時為了要讓感光元 件221獲得更多的光源3〇〇，因此發光模組21〇與感光元件⑵ 會有-個夾角’如「第4圖」所示，在發光模組21Q下方、感光 元件211的旁邊多設置一個底座4〇〇，使得發光模組21〇與感光 兀件221處於不同的水平面上，因為發光麵21Q為立體的元 件，因此發光模組210與感光元件221之間自然產生炎角。而為 了要更精確的判斷灰塵堆積的狀況，感光元件221要面對灰塵來 襲的方向’灰塵來襲的方向可以經由中央處理器上的風扇造成的 氣流來判斷’但判斷灰塵之方向並非本發明之特徵，因此不再描 除此之外，因關斷模組23Q並非—直在讀取清潔度數值， 所以本發日収可以包含—個控麵組·，負責控制發光模包 210、感光元件221與轉換電路222的電源，以減少耗電量 如當判斷模組230要讀取清潔度數值前，判斷模組23〇可 230，28〇 、、且21〇、感光元件221與轉換電路222，使得發光模組21〇發出 10 200821795 光源300、感光元件221㊣夠接收光源變化電阻值、以及轉換電 路222產生清潔度數值給判斷模組23〇讀取。 若使用者希望改變清理堆積的灰塵的辭，本發明更可以由 額外包含的設定模組290來提供使用者改變產生提示訊號的值， 也就是上述實施例中的預定值1〇 mA，若使用者將預定值改為3 mA ’ _為當時判斷模組23()讀取到的清潔度數值為$ _，因 此不會產生提示訊號，直到堆積更多的灰塵使得感光元件22[變 ，後的電阻值更大，以至於電流值小於3 _後，才會再次產生 提不訊號來提示使用者需要清理堆積的灰塵。 再者，本發明之運用感光模組判斷灰塵堆積量之方法 電腦系統切針方式實現或以不同元件㈣於若干 系統的分散料實現。 雖然本發明以前述之較佳實施例揭 定本發明，任刪峨化在侧侧 内，所為之更動與潤飾，均屬本發明之專利保護範圍’因 =之專利保魏_視本制書所附之申請專利範_界定麵 【圖式簡單說明】 架構圖第。1 _本發鴨提之運収源強度靖錢堆積量之系統 第2圖係習知之光敏電阻運作原理示音圖。 流程圖第3 _轉明所提之辆缝觸灰錄積量之方法 11 200821795 第4圖係本發明所提之感光元件與發光模組夾角示意圖。 【主要元件符號說明】 210 發光模組 220 感光模組 221 感光元件 2211 光電導體 222 轉換電路 230 判斷模組 280 控制模組 290 設定模組 300 光源 400 底座 步驟310發出光源 步驟320依據光源之強度產生清潔度數值 步驟330清潔度數值是否達到預定值 步驟340產生提示訊號 12200821795 IX. INSTRUCTIONS: [Technical field to which the invention pertains] - A system and method for judging dust accumulation amount 'Specially refers to a system and method for converting a light source passing through a dust into a cleanliness value to determine a dust accumulation amount. [Prior Art] In a computer mainframe, dust usually accumulates in a specific position along with the airflow direction inside the main unit. Since the fan that determines the direction of the airflow in the main unit may be placed on the main unit casing, It may be placed on the chip on each board. 'Therefore, the position of the stack will be different due to the position where the fan is placed. (4) In the case of the personal f brain, the central processor on the motherboard There will be a fan on the "al Processing Unit; CPU" to help the central processor to dissipate heat. Therefore, the memory placed next to the central processor will hold the airflow caused by the fan, so the dust in the air will often be broadcast by the memory. Bottom: Accelerate the accumulation of dust on the back of the memory against the fan. Therefore, after the computer host passes through the segment, the machine will accumulate a large amount of dust in a fixed number of places. The accumulation of gray age is one of the causes of computer instability or even short circuit or burnout of various boards in the mainframe. Although dust is accumulated in the mainframe casing, it is not In the case, but under the current computer host architecture, it is impossible to avoid dust accumulation problems, and this problem is most easily overlooked for users who use two brain hosts. The main reason is nothing to see. How much dust is accumulated in the mainframe casing, so it is often necessary to wait until the computer has a problem, the mainframe casing will be opened, and it will be known that the 200821795 mainframe casing will accumulate a considerable amount of dust to be cleaned, but If the problem occurs with the host computer, it is really caused by the accumulated dust. The ideal situation is to clean the accumulated dust before the problem occurs in the 9 brain host. However, for the user, it is not It is possible to ride the main unit casing (4) to check the money for dust accumulation. Therefore, how to provide a kind of problem to detect the amount of dust accumulation is required. [Summary of the invention] The main purpose of the present invention is to solve the above problems. Providing a method for judging the purity of the gray scale by using the intensity of the light source, and the difference in the amount of dust accumulated, the intensity of the light source passing through the dust is also different, so that the light source can be made The difference in degree produces the same cleanliness value, and the number of cleansing values can be multiplied by the amount of dust accumulated in the dust-replenishing shirt, so that the dust accumulation amount can be solved, thereby solving the prior art The present invention can be achieved by both the system and the method. The system disclosed in the present invention includes a light-emitting module, a photosensitive module, and a judging module. The method comprises the following steps: the sending group emits a light source, and the photosensitive core group generates a corresponding cleanliness value according to the intensity of the light source passing through the dust, and determines that the cleaning group determines that the cleanliness value reaches a predetermined value, and generates a prompt signal. The detailed description and implementation of the present invention are set forth in the accompanying drawings in detail in the accompanying drawings. The related objects and advantages of the present invention will be readily understood by those skilled in the art. [Embodiment] 200821795 The system operation of the present invention will be described below with reference to a system architecture diagram for determining the amount of dust accumulated by the photosensitive module according to the present invention. As shown, the system of the present invention includes a light module 210, a photosensitive module 220, and a determination module 230. The light-emitting module 210 is responsible for emitting the light source 300 to the photosensitive module 22〇; the photosensitive module 22〇 is responsible for receiving the light source emitted by the light-emitting module 210, and converting the intensity of the received light source 3〇〇 into a corresponding cleanliness value; The determining module 23 is responsible for receiving the cleanliness value generated by the conversion of the photosensitive module 220, and determining that the cleanliness value generated by the photosensitive module 22 is a set value, and when the cleanliness value generated by the photosensitive module 22Q reaches a predetermined value, Generate a prompt signal. After being emitted by the light-emitting module 21, the light source 3〇〇 passes through the dust accumulated between the light-emitting module 21〇 and the photosensitive module 22, and finally reaches the photosensitive module 220, because the button group 2彳〇 There is dust accumulation between the filament group 22 and the light source 300, so that the light source 300 is partially blocked by the accumulated dust, so that the intensity of reaching the photo-sensing 220 is smaller than the intensity of the light-emitting module 21 when it is just emitted. I would like to see that the more dust that accumulates, the higher the probability that the light source 3 is blocked by dust, so the intensity of reaching the photosensitive module 22Q is smaller. In fact, the photosensitive module 220 of the present invention may further include a photosensitive element 221 and a conversion circuit 222. In the photosensitive element 221, as shown in FIG. 2, a voltage is applied to the electrodes at both ends of the photosensitive element 221, and when the light source 3 is irradiated onto the photosensitive element 221, the photo-generated carrier generated by the light to the photoconductor 2211 is Under the action of external wisdom, it will move in the direction of the direction, so that current will be generated. Because of the current of the mosquitoes of the photo-generated carriers, the recording of the photo-generated carriers is determined by the size of the light source, so the current generated by the photosensitive element 221 will The change in the magnitude of the light source and intensity varies; the conversion circuit 222 is responsible for converting the magnitude of the current generated by the photosensitive element 221 to the 200821795 cleanliness value. Then, the operating system and method of the present invention are explained by using an embodiment. This embodiment takes the invention as an example on the main board, but the present day is not limited to the use of the host=upper embodiment. The light-emitting module 21 中 〇 狎 狎 狎 狎 LED LED LED LED LED LED ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' The illuminating 桓 group 210 of the present invention; the photosensitive element 221 in this embodiment takes a photoresistor as an example, but the photosensitive sensitizer of the present invention is not limited by the photoresistor, and other light source strengths are: The component that is replaced by current can be the photosensitive element 221 of the name given. In addition, please refer to the "Fig. 3" flow chart of the method of using the photosensitive mold_breaking dust accumulation amount according to the present invention. When the present invention is used, firstly, a light-emitting mode, and 210, and a photosensitive module having the photosensitive element 221 and the conversion circuit 222 are disposed on the motherboard, 2 when the motherboard is mounted in the mainframe, the present invention The dust accumulated in the main unit casing can be made. When the field host is turned on, the LED will emit light source 3〇〇 (step (10)). After 2,300 teeth of dust, the scale will be photosensitive. The photoresistor will generate current according to the intensity of the source, for example, 5 mA. Then, the conversion circuit 222=measures that the current value passing through the photoresistor is 5 mA, and converts the measured current value and the support to the corresponding cleanliness value (step 320), but the 'cleanness value' of the present invention It is not limited to the current value. After the cleaning circuit 222 generates the cleanliness value, the judging module in B|〇s receives the cleanliness value generated by the converting circuit 222 from the turn-in/in/out (10)_), and determines whether the received cleanliness value is reached. The predetermined value of 1 mA (step ς 200821795 _, since the cleanliness value reaches a predetermined value, the judgment module 23 〇 will generate a no signal (step 34 〇), so that the basic output / entry system (Basic 0 utput sy light · B丨〇S) Control the light connected to the motherboard on the main unit casing. When the user sees that the LED is lit, he will know the amount of dust in the main unit casing and need to clean the display case. The invention of the invention can not be ==___ Gray as she has tested the previous technology. 'Because the above method is in the time of service, B|〇s judges the value of the cleaning __ value, if the domain is long, the fortune, for example = The trick is to judge whether there is any accumulated dust when booting. Therefore, it can be executed by the resident program running on the host computer. That is, when the road 222 generates a value of _ (step = in the work The miscellaneous party has shouted (step 34Q), for example, the U-face is turned around. Inform the user that the user wants to "money, but tells the owner of the machine _ money, but the way to tell the singer and the shoe = f 1 because the judgment module 23Q is executed by the resident program, so every other time = the break group 230 It will be executed once, so that there is a lot of dust accumulation in the mainframe casing. However, it is necessary to find the open circuit to know the thermistor 〇h_ys_ive"esistance"'^^ 200821795 μ degree very squeezing resistor, this kind of electron When the temperature changes, the internal resistance value of the component changes greatly, so that the current through the thermistor changes accordingly. The temperature control chip will generate different values corresponding to different current magnitudes, so the temperature can be sensed on the wafer. The pin connected to the thermistor is connected by a photoresistor. Since the photo resistor will vary according to the brightness of the external environment, the judging module 23G only needs to read the temperature control crystal. The value in the memory is the cleanliness value. In addition, since the light is linearly advanced, and in order to allow the photosensitive element 221 to obtain more light sources, The light-emitting module 21 and the photosensitive element (2) have an angle "as shown in FIG. 4", and a base 4 is disposed under the light-emitting module 21Q and next to the photosensitive element 211, so that the light-emitting module 21 is provided. The 〇 is different from the photosensitive member 221, because the illuminating surface 21Q is a three-dimensional element, so that an inflammatory angle is naturally generated between the illuminating module 210 and the photosensitive element 221, and in order to more accurately judge the condition of dust accumulation, sensitization The element 221 is faced with the direction in which the dust strikes. The direction in which the dust strikes can be judged by the airflow caused by the fan on the central processing unit. However, judging the direction of the dust is not a feature of the present invention, and therefore, it is not described. Since the shutdown module 23Q does not directly read the cleanliness value, the daily collection may include a control panel, which is responsible for controlling the power of the light-emitting mold 210, the photosensitive element 221, and the conversion circuit 222 to reduce power consumption. For example, when the determining module 230 is to read the cleanliness value, the determining module 23 can be 230, 28, 21, 21, the photosensitive element 221 and the conversion circuit 222, so that the light emitting module 21 emits 10 200821795 The light source 300, the photosensitive element 221 is just enough to receive the light source change resistance value, and the conversion circuit 222 generates a cleanliness value for the determination module 23 to read. If the user wishes to change the words of the dust accumulated, the present invention can further provide the value of the user to change the generated prompt signal by the additionally included setting module 290, that is, the predetermined value in the above embodiment is 1 mA, if used. The predetermined value is changed to 3 mA ' _ for the judgment module 23 () to read the cleanliness value is $ _, so no prompt signal will be generated until more dust is accumulated to cause the photosensitive element 22 [change, after The resistance value is so large that the current value is less than 3 _, and then the signal is generated again to prompt the user to clean the accumulated dust. Furthermore, the method for determining the amount of dust accumulation by the photosensitive module of the present invention is realized by a computer system needle cutting method or by a different component (4) in a plurality of system dispersion materials. Although the present invention has been described in the foregoing preferred embodiments, the invention is in the side of the side, and the modification and retouching are all in the patent protection scope of the present invention. Attached to the patent application model _ definition surface [simple description of the schema] architecture diagram. 1 _ The system of the strength of the source of the money from the hair of the duck. The second picture is the sound diagram of the operating principle of the photosensitive resistor. Flowchart 3 _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ [Main component symbol description] 210 Light-emitting module 220 Photosensitive module 221 Photosensitive element 2211 Photoconductor 222 Conversion circuit 230 Judgment module 280 Control module 290 Setting module 300 Light source 400 Base step 310 Light source step 320 is generated according to the intensity of the light source The cleanliness value step 330 determines whether the cleanliness value reaches a predetermined value. Step 340 generates a prompt signal 12