TW200802530A - Substrate-processing apparatus, substrate-processing method, substrate-processing program, and computer-readable recording medium recorded with such program - Google Patents
Substrate-processing apparatus, substrate-processing method, substrate-processing program, and computer-readable recording medium recorded with such programInfo
- Publication number
- TW200802530A TW200802530A TW095133882A TW95133882A TW200802530A TW 200802530 A TW200802530 A TW 200802530A TW 095133882 A TW095133882 A TW 095133882A TW 95133882 A TW95133882 A TW 95133882A TW 200802530 A TW200802530 A TW 200802530A
- Authority
- TW
- Taiwan
- Prior art keywords
- substrate
- program
- processing
- computer
- side wall
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/40—Treatment after imagewise removal, e.g. baking
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/30—Imagewise removal using liquid means
- G03F7/3042—Imagewise removal using liquid means from printing plates transported horizontally through the processing stations
- G03F7/3071—Process control means, e.g. for replenishing
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/38—Treatment before imagewise removal, e.g. prebaking
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
- G03F7/70605—Workpiece metrology
- G03F7/70616—Monitoring the printed patterns
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67207—Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process
- H01L21/67225—Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process comprising at least one lithography chamber
Landscapes
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Automation & Control Theory (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005265191 | 2005-09-13 | ||
JP2006179725A JP4636555B2 (ja) | 2005-09-13 | 2006-06-29 | 基板処理装置、基板処理方法、基板処理プログラム及びそのプログラムを記録したコンピュータ読み取り可能な記録媒体 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200802530A true TW200802530A (en) | 2008-01-01 |
TWI305934B TWI305934B (zh) | 2009-02-01 |
Family
ID=37864961
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW095133882A TW200802530A (en) | 2005-09-13 | 2006-09-13 | Substrate-processing apparatus, substrate-processing method, substrate-processing program, and computer-readable recording medium recorded with such program |
Country Status (5)
Country | Link |
---|---|
US (1) | US7867674B2 (zh) |
JP (1) | JP4636555B2 (zh) |
KR (1) | KR101074441B1 (zh) |
TW (1) | TW200802530A (zh) |
WO (1) | WO2007032369A1 (zh) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4891139B2 (ja) | 2007-04-20 | 2012-03-07 | 東京エレクトロン株式会社 | 熱処理板の温度設定方法、熱処理板の温度設定装置及びコンピュータ読み取り可能な記憶媒体 |
JP4969304B2 (ja) | 2007-04-20 | 2012-07-04 | 東京エレクトロン株式会社 | 熱処理板の温度設定方法、熱処理板の温度設定装置及びコンピュータ読み取り可能な記憶媒体 |
JP5258082B2 (ja) | 2007-07-12 | 2013-08-07 | 東京エレクトロン株式会社 | 基板処理装置及び基板処理方法 |
JP2014063908A (ja) * | 2012-09-21 | 2014-04-10 | Tokyo Electron Ltd | 基板処理システム |
JP5995881B2 (ja) * | 2014-01-09 | 2016-09-21 | 東京エレクトロン株式会社 | 基板洗浄方法、基板洗浄装置、及びコンピュータ読み取り可能な記録媒体 |
KR101985751B1 (ko) * | 2016-12-30 | 2019-06-05 | 세메스 주식회사 | 기판 지지 장치 및 이를 가지는 기판 처리 설비, 그리고 기판 처리 방법 |
CN106597758B (zh) * | 2017-01-03 | 2019-09-24 | 京东方科技集团股份有限公司 | 用于处理光阻部件的方法和装置 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07211630A (ja) * | 1994-01-26 | 1995-08-11 | Sony Corp | パターン形成方法及びその装置 |
US6402509B1 (en) * | 1999-09-03 | 2002-06-11 | Tokyo Electron, Limited | Substrate processing apparatus and substrate processing method |
JP2001143850A (ja) * | 1999-09-03 | 2001-05-25 | Tokyo Electron Ltd | 基板の加熱処理装置,基板の加熱処理方法,基板処理装置及び基板処理方法 |
KR100811964B1 (ko) * | 2000-09-28 | 2008-03-10 | 동경 엘렉트론 주식회사 | 레지스트 패턴 형성장치 및 그 방법 |
EP1273973A1 (en) * | 2001-07-03 | 2003-01-08 | Infineon Technologies SC300 GmbH & Co. KG | Method for adjusting a temperature in a resist process |
JP4127664B2 (ja) * | 2003-06-30 | 2008-07-30 | 株式会社東芝 | 現像処理装置の調整方法 |
-
2006
- 2006-06-29 JP JP2006179725A patent/JP4636555B2/ja not_active Expired - Fee Related
- 2006-09-13 KR KR1020087003967A patent/KR101074441B1/ko active IP Right Grant
- 2006-09-13 WO PCT/JP2006/318126 patent/WO2007032369A1/ja active Application Filing
- 2006-09-13 US US12/065,829 patent/US7867674B2/en not_active Expired - Fee Related
- 2006-09-13 TW TW095133882A patent/TW200802530A/zh unknown
Also Published As
Publication number | Publication date |
---|---|
KR101074441B1 (ko) | 2011-10-17 |
WO2007032369A1 (ja) | 2007-03-22 |
TWI305934B (zh) | 2009-02-01 |
US7867674B2 (en) | 2011-01-11 |
KR20080049016A (ko) | 2008-06-03 |
JP2007110078A (ja) | 2007-04-26 |
JP4636555B2 (ja) | 2011-02-23 |
US20090104548A1 (en) | 2009-04-23 |
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