TW200719350A - Semiconductor storage device - Google Patents

Semiconductor storage device

Info

Publication number
TW200719350A
TW200719350A TW095127818A TW95127818A TW200719350A TW 200719350 A TW200719350 A TW 200719350A TW 095127818 A TW095127818 A TW 095127818A TW 95127818 A TW95127818 A TW 95127818A TW 200719350 A TW200719350 A TW 200719350A
Authority
TW
Taiwan
Prior art keywords
memory array
ecc
error
storage device
saa
Prior art date
Application number
TW095127818A
Other languages
English (en)
Inventor
Tomonori Sekiguchi
Riichiro Takemura
Satoru Akiyama
Satoru Hanzawa
Kazuhiko Kajigaya
Original Assignee
Hitachi Ltd
Elpida Memory Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd, Elpida Memory Inc filed Critical Hitachi Ltd
Publication of TW200719350A publication Critical patent/TW200719350A/zh

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1044—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices with specific ECC/EDC distribution
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C2029/0409—Online test

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Dram (AREA)
  • Memory System (AREA)
TW095127818A 2005-08-01 2006-07-28 Semiconductor storage device TW200719350A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005223012A JP4547313B2 (ja) 2005-08-01 2005-08-01 半導体記憶装置

Publications (1)

Publication Number Publication Date
TW200719350A true TW200719350A (en) 2007-05-16

Family

ID=37697512

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095127818A TW200719350A (en) 2005-08-01 2006-07-28 Semiconductor storage device

Country Status (5)

Country Link
US (1) US7603592B2 (zh)
JP (1) JP4547313B2 (zh)
CN (1) CN1909114A (zh)
DE (1) DE102006035815A1 (zh)
TW (1) TW200719350A (zh)

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Also Published As

Publication number Publication date
US7603592B2 (en) 2009-10-13
JP2007042176A (ja) 2007-02-15
JP4547313B2 (ja) 2010-09-22
CN1909114A (zh) 2007-02-07
US20070038919A1 (en) 2007-02-15
DE102006035815A1 (de) 2007-02-22

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