TW200707531A - Pad conditioner for conditioning a CMP pad and method of making the same - Google Patents

Pad conditioner for conditioning a CMP pad and method of making the same

Info

Publication number
TW200707531A
TW200707531A TW094126964A TW94126964A TW200707531A TW 200707531 A TW200707531 A TW 200707531A TW 094126964 A TW094126964 A TW 094126964A TW 94126964 A TW94126964 A TW 94126964A TW 200707531 A TW200707531 A TW 200707531A
Authority
TW
Taiwan
Prior art keywords
pad
cavities
conditioning
making
pad conditioner
Prior art date
Application number
TW094126964A
Other languages
Chinese (zh)
Other versions
TWI290337B (en
Inventor
Ying-Che Shih
Original Assignee
Princo Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Princo Corp filed Critical Princo Corp
Priority to TW094126964A priority Critical patent/TWI290337B/en
Priority to US11/163,548 priority patent/US20070037493A1/en
Priority to JP2006038891A priority patent/JP2007044863A/en
Publication of TW200707531A publication Critical patent/TW200707531A/en
Application granted granted Critical
Publication of TWI290337B publication Critical patent/TWI290337B/en

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B53/00Devices or means for dressing or conditioning abrasive surfaces
    • B24B53/017Devices or means for dressing, cleaning or otherwise conditioning lapping tools
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24DTOOLS FOR GRINDING, BUFFING OR SHARPENING
    • B24D18/00Manufacture of grinding tools or other grinding devices, e.g. wheels, not otherwise provided for
    • B24D18/0027Manufacture of grinding tools or other grinding devices, e.g. wheels, not otherwise provided for by impregnation

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Grinding-Machine Dressing And Accessory Apparatuses (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Polishing Bodies And Polishing Tools (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)

Abstract

The invention provides a pad conditioner for conditioning a CMP pad. The pad conditioner comprises a substrate, a plurality of cavities exist thereon, a bonding agent filled in the cavities, and abrasive particles securely placed and fixed in the cavities. The cavities are arranged in a regular manner and each of their sizes can accommodate only one abrasive particle. The cavities may be bowl-shaped or other shaped. A method of making such a pad conditioner is also disclosed.
TW094126964A 2005-08-09 2005-08-09 Pad conditioner for conditioning a CMP pad and method of making the same TWI290337B (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
TW094126964A TWI290337B (en) 2005-08-09 2005-08-09 Pad conditioner for conditioning a CMP pad and method of making the same
US11/163,548 US20070037493A1 (en) 2005-08-09 2005-10-21 Pad conditioner for conditioning a cmp pad and method of making such a pad conditioner
JP2006038891A JP2007044863A (en) 2005-08-09 2006-02-16 Conditioner for wafer polishing pad and its manufacturing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW094126964A TWI290337B (en) 2005-08-09 2005-08-09 Pad conditioner for conditioning a CMP pad and method of making the same

Publications (2)

Publication Number Publication Date
TW200707531A true TW200707531A (en) 2007-02-16
TWI290337B TWI290337B (en) 2007-11-21

Family

ID=37743129

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094126964A TWI290337B (en) 2005-08-09 2005-08-09 Pad conditioner for conditioning a CMP pad and method of making the same

Country Status (3)

Country Link
US (1) US20070037493A1 (en)
JP (1) JP2007044863A (en)
TW (1) TWI290337B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110091265A (en) * 2018-01-29 2019-08-06 谢索尔钻石工业株式会社 The anti-plating manufacturing method of grinder pad finisher and the grinder pad finisher thus manufactured
CN116065217A (en) * 2022-12-26 2023-05-05 吉姆西半导体科技(无锡)有限公司 Preparation method of polishing pad finisher for CMP and polishing pad modulator

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20110073094A1 (en) * 2009-09-28 2011-03-31 3M Innovative Properties Company Abrasive article with solid core and methods of making the same
WO2012040373A2 (en) * 2010-09-21 2012-03-29 Ritedia Corporation Diamond particle mololayer heat spreaders and associated methods
US9254548B2 (en) * 2012-04-25 2016-02-09 Taiwan Semiconductor Manufacturing Co., Ltd. Method of forming diamond conditioners for CMP process
CN203390712U (en) * 2013-04-08 2014-01-15 宋健民 Chemical mechanical polishing dresser
EP2835220B1 (en) * 2013-08-07 2019-09-11 Reishauer AG Trimming tool, and method for manufacturing the same
TW201600242A (en) * 2014-06-18 2016-01-01 Kinik Co Polishing pad conditioner
EP3209461A4 (en) * 2014-10-21 2018-08-22 3M Innovative Properties Company Abrasive preforms, method of making an abrasive article, and bonded abrasive article
JP6453666B2 (en) * 2015-02-20 2019-01-16 東芝メモリ株式会社 Manufacturing method of polishing pad dresser
EP3774180A4 (en) * 2018-03-30 2021-12-29 Saint-gobain Abrasives, Inc Abrasive article including a coating
JP2020199598A (en) * 2019-06-11 2020-12-17 島根県 Manufacturing method for tool for cutting or grinding

Family Cites Families (38)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56139875A (en) * 1980-03-31 1981-10-31 Toshiba Corp Manufacturing method of diamond wheel
US4925457B1 (en) * 1989-01-30 1995-09-26 Ultimate Abrasive Syst Inc Method for making an abrasive tool
ZA9410384B (en) * 1994-04-08 1996-02-01 Ultimate Abrasive Syst Inc Method for making powder preform and abrasive articles made therefrom
US5511718A (en) * 1994-11-04 1996-04-30 Abrasive Technology, Inc. Process for making monolayer superabrasive tools
JP2896657B2 (en) * 1996-06-28 1999-05-31 旭ダイヤモンド工業株式会社 Dresser and manufacturing method thereof
US6190240B1 (en) * 1996-10-15 2001-02-20 Nippon Steel Corporation Method for producing pad conditioner for semiconductor substrates
US6368198B1 (en) * 1999-11-22 2002-04-09 Kinik Company Diamond grid CMP pad dresser
US6039641A (en) * 1997-04-04 2000-03-21 Sung; Chien-Min Brazed diamond tools by infiltration
US6286498B1 (en) * 1997-04-04 2001-09-11 Chien-Min Sung Metal bond diamond tools that contain uniform or patterned distribution of diamond grits and method of manufacture thereof
US6679243B2 (en) * 1997-04-04 2004-01-20 Chien-Min Sung Brazed diamond tools and methods for making
JP3052896B2 (en) * 1997-06-13 2000-06-19 日本電気株式会社 Dress jig on polishing cloth surface and method of manufacturing the same
US5921856A (en) * 1997-07-10 1999-07-13 Sp3, Inc. CVD diamond coated substrate for polishing pad conditioning head and method for making same
US6123612A (en) * 1998-04-15 2000-09-26 3M Innovative Properties Company Corrosion resistant abrasive article and method of making
JP3295888B2 (en) * 1998-04-22 2002-06-24 株式会社藤森技術研究所 Polishing dresser for polishing machine of chemical machine polisher
KR19990081117A (en) * 1998-04-25 1999-11-15 윤종용 CMP Pad Conditioning Disc and Conditioner, Manufacturing Method, Regeneration Method and Cleaning Method of the Disc
JP2000106353A (en) * 1998-07-31 2000-04-11 Nippon Steel Corp Dresser for polishing cloth for semiconductor substrate
JP3387858B2 (en) * 1999-08-25 2003-03-17 理化学研究所 Polishing pad conditioner
US6419574B1 (en) * 1999-09-01 2002-07-16 Mitsubishi Materials Corporation Abrasive tool with metal binder phase
US6281129B1 (en) * 1999-09-20 2001-08-28 Agere Systems Guardian Corp. Corrosion-resistant polishing pad conditioner
TW412461B (en) * 1999-09-29 2000-11-21 Kinik Co Diamond disk for trimming wafer polishing pad and method for making the same
US6439986B1 (en) * 1999-10-12 2002-08-27 Hunatech Co., Ltd. Conditioner for polishing pad and method for manufacturing the same
US6325709B1 (en) * 1999-11-18 2001-12-04 Chartered Semiconductor Manufacturing Ltd Rounded surface for the pad conditioner using high temperature brazing
US7201645B2 (en) * 1999-11-22 2007-04-10 Chien-Min Sung Contoured CMP pad dresser and associated methods
KR100360669B1 (en) * 2000-02-10 2002-11-18 이화다이아몬드공업 주식회사 Abrasive dressing tool and manufac ture method of abrasive dressing tool
JP2001232570A (en) * 2000-02-23 2001-08-28 World Metal:Kk Electrodeposition tool and manufacturing method thereof
US6517424B2 (en) * 2000-03-10 2003-02-11 Abrasive Technology, Inc. Protective coatings for CMP conditioning disk
WO2001095214A1 (en) * 2000-06-02 2001-12-13 Quality Metric Method and system for health assessment and monitoring
US6500054B1 (en) * 2000-06-08 2002-12-31 International Business Machines Corporation Chemical-mechanical polishing pad conditioner
US6776699B2 (en) * 2000-08-14 2004-08-17 3M Innovative Properties Company Abrasive pad for CMP
US6551176B1 (en) * 2000-10-05 2003-04-22 Applied Materials, Inc. Pad conditioning disk
US6669745B2 (en) * 2001-02-21 2003-12-30 3M Innovative Properties Company Abrasive article with optimally oriented abrasive particles and method of making the same
JP4508514B2 (en) * 2001-03-02 2010-07-21 旭ダイヤモンド工業株式会社 CMP conditioner and method of manufacturing the same
US6632127B1 (en) * 2001-03-07 2003-10-14 Jerry W. Zimmer Fixed abrasive planarization pad conditioner incorporating chemical vapor deposited polycrystalline diamond and method for making same
JP2003080457A (en) * 2001-09-07 2003-03-18 Ebara Corp Cutting tool and manufacturing method therefor
JP3984962B2 (en) * 2003-02-14 2007-10-03 株式会社ポータ工業 Piercing
JP2004358640A (en) * 2003-06-09 2004-12-24 Goei Seisakusho:Kk Method for manufacturing electroplated tool and electroplated tool
US6951509B1 (en) * 2004-03-09 2005-10-04 3M Innovative Properties Company Undulated pad conditioner and method of using same
US20050260939A1 (en) * 2004-05-18 2005-11-24 Saint-Gobain Abrasives, Inc. Brazed diamond dressing tool

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110091265A (en) * 2018-01-29 2019-08-06 谢索尔钻石工业株式会社 The anti-plating manufacturing method of grinder pad finisher and the grinder pad finisher thus manufactured
TWI692022B (en) * 2018-01-29 2020-04-21 韓商謝索爾鑽石工業股份有限公司 Manufacturing method of pad conditioner by reverse plating and pad conditioner manufactured thereof
CN116065217A (en) * 2022-12-26 2023-05-05 吉姆西半导体科技(无锡)有限公司 Preparation method of polishing pad finisher for CMP and polishing pad modulator

Also Published As

Publication number Publication date
JP2007044863A (en) 2007-02-22
US20070037493A1 (en) 2007-02-15
TWI290337B (en) 2007-11-21

Similar Documents

Publication Publication Date Title
TW200707531A (en) Pad conditioner for conditioning a CMP pad and method of making the same
EP1954445A4 (en) Agglomerate abrasive grains and methods of making the same
TWI370496B (en) Bonding pad on ic substrate and method for making the same
EP1796152A4 (en) Cmp polishing agent and method for polishing substrate
TWI350219B (en) Copper fine particles and method for preparing the same
GB2405410B (en) Porous abrasive articles with agglomerated abrasives and method for making the agglomerated abrasives
PL1660606T3 (en) Abrasive particles for chemical mechanical polishing
WO2010141464A3 (en) Corrosion-resistant cmp conditioning tools and methods for making and using same
EP1715979A4 (en) Multi-step, in-situ pad conditioning system and method for chemical mechanical planarization
WO2004092298A3 (en) Polishing compositions and method of use
TW200626300A (en) Chemical mechanical polishing pad dresser
EP1909312A4 (en) Abrasive and process for producing semiconductor integrated-circuit unit
IL187704A0 (en) Polishing pad comprising magnetically sensitive particles and method for the use thereof
AU2003236328A1 (en) Polishing pad and semiconductor substrate manufacturing method using the polishing pad
TW200718511A (en) Abrasive tools having a permeable structure
EP1994112A4 (en) Cmp slurry and method for polishing semiconductor wafer using the same
EP1927605A4 (en) Polymer material, foam obtained from same, and polishing pad using those
MY149975A (en) Polishing composition and method utilizing abrasive particles treated with an aminosilane
TW200710978A (en) Methods and compositions for electro-chemical-mechanical polishing
SG122919A1 (en) Abrasive-free chemical mechanical polishing compositions and methods relating thereto
MY145113A (en) Polishing pad conditioner
AU2003254825A1 (en) Cmp abrasive and substrate polishing method
TWI365791B (en) Abrasive cleaning agent, method for manufacturing the same, and method for polishing using abrasive cleaning agent
EP1837901A4 (en) Process for producing abrasive material, abrasive material produced by the same, and process for producing silicon wafer
EP1715980A4 (en) Base pad polishing pad and multi-layer pad comprising the same

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees