TW200707531A - Pad conditioner for conditioning a CMP pad and method of making the same - Google Patents
Pad conditioner for conditioning a CMP pad and method of making the sameInfo
- Publication number
- TW200707531A TW200707531A TW094126964A TW94126964A TW200707531A TW 200707531 A TW200707531 A TW 200707531A TW 094126964 A TW094126964 A TW 094126964A TW 94126964 A TW94126964 A TW 94126964A TW 200707531 A TW200707531 A TW 200707531A
- Authority
- TW
- Taiwan
- Prior art keywords
- pad
- cavities
- conditioning
- making
- pad conditioner
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B53/00—Devices or means for dressing or conditioning abrasive surfaces
- B24B53/017—Devices or means for dressing, cleaning or otherwise conditioning lapping tools
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D18/00—Manufacture of grinding tools or other grinding devices, e.g. wheels, not otherwise provided for
- B24D18/0027—Manufacture of grinding tools or other grinding devices, e.g. wheels, not otherwise provided for by impregnation
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Grinding-Machine Dressing And Accessory Apparatuses (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Polishing Bodies And Polishing Tools (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Abstract
The invention provides a pad conditioner for conditioning a CMP pad. The pad conditioner comprises a substrate, a plurality of cavities exist thereon, a bonding agent filled in the cavities, and abrasive particles securely placed and fixed in the cavities. The cavities are arranged in a regular manner and each of their sizes can accommodate only one abrasive particle. The cavities may be bowl-shaped or other shaped. A method of making such a pad conditioner is also disclosed.
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW094126964A TWI290337B (en) | 2005-08-09 | 2005-08-09 | Pad conditioner for conditioning a CMP pad and method of making the same |
US11/163,548 US20070037493A1 (en) | 2005-08-09 | 2005-10-21 | Pad conditioner for conditioning a cmp pad and method of making such a pad conditioner |
JP2006038891A JP2007044863A (en) | 2005-08-09 | 2006-02-16 | Conditioner for wafer polishing pad and its manufacturing method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW094126964A TWI290337B (en) | 2005-08-09 | 2005-08-09 | Pad conditioner for conditioning a CMP pad and method of making the same |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200707531A true TW200707531A (en) | 2007-02-16 |
TWI290337B TWI290337B (en) | 2007-11-21 |
Family
ID=37743129
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW094126964A TWI290337B (en) | 2005-08-09 | 2005-08-09 | Pad conditioner for conditioning a CMP pad and method of making the same |
Country Status (3)
Country | Link |
---|---|
US (1) | US20070037493A1 (en) |
JP (1) | JP2007044863A (en) |
TW (1) | TWI290337B (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110091265A (en) * | 2018-01-29 | 2019-08-06 | 谢索尔钻石工业株式会社 | The anti-plating manufacturing method of grinder pad finisher and the grinder pad finisher thus manufactured |
CN116065217A (en) * | 2022-12-26 | 2023-05-05 | 吉姆西半导体科技(无锡)有限公司 | Preparation method of polishing pad finisher for CMP and polishing pad modulator |
Families Citing this family (10)
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US20110073094A1 (en) * | 2009-09-28 | 2011-03-31 | 3M Innovative Properties Company | Abrasive article with solid core and methods of making the same |
WO2012040373A2 (en) * | 2010-09-21 | 2012-03-29 | Ritedia Corporation | Diamond particle mololayer heat spreaders and associated methods |
US9254548B2 (en) * | 2012-04-25 | 2016-02-09 | Taiwan Semiconductor Manufacturing Co., Ltd. | Method of forming diamond conditioners for CMP process |
CN203390712U (en) * | 2013-04-08 | 2014-01-15 | 宋健民 | Chemical mechanical polishing dresser |
EP2835220B1 (en) * | 2013-08-07 | 2019-09-11 | Reishauer AG | Trimming tool, and method for manufacturing the same |
TW201600242A (en) * | 2014-06-18 | 2016-01-01 | Kinik Co | Polishing pad conditioner |
EP3209461A4 (en) * | 2014-10-21 | 2018-08-22 | 3M Innovative Properties Company | Abrasive preforms, method of making an abrasive article, and bonded abrasive article |
JP6453666B2 (en) * | 2015-02-20 | 2019-01-16 | 東芝メモリ株式会社 | Manufacturing method of polishing pad dresser |
EP3774180A4 (en) * | 2018-03-30 | 2021-12-29 | Saint-gobain Abrasives, Inc | Abrasive article including a coating |
JP2020199598A (en) * | 2019-06-11 | 2020-12-17 | 島根県 | Manufacturing method for tool for cutting or grinding |
Family Cites Families (38)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS56139875A (en) * | 1980-03-31 | 1981-10-31 | Toshiba Corp | Manufacturing method of diamond wheel |
US4925457B1 (en) * | 1989-01-30 | 1995-09-26 | Ultimate Abrasive Syst Inc | Method for making an abrasive tool |
ZA9410384B (en) * | 1994-04-08 | 1996-02-01 | Ultimate Abrasive Syst Inc | Method for making powder preform and abrasive articles made therefrom |
US5511718A (en) * | 1994-11-04 | 1996-04-30 | Abrasive Technology, Inc. | Process for making monolayer superabrasive tools |
JP2896657B2 (en) * | 1996-06-28 | 1999-05-31 | 旭ダイヤモンド工業株式会社 | Dresser and manufacturing method thereof |
US6190240B1 (en) * | 1996-10-15 | 2001-02-20 | Nippon Steel Corporation | Method for producing pad conditioner for semiconductor substrates |
US6368198B1 (en) * | 1999-11-22 | 2002-04-09 | Kinik Company | Diamond grid CMP pad dresser |
US6039641A (en) * | 1997-04-04 | 2000-03-21 | Sung; Chien-Min | Brazed diamond tools by infiltration |
US6286498B1 (en) * | 1997-04-04 | 2001-09-11 | Chien-Min Sung | Metal bond diamond tools that contain uniform or patterned distribution of diamond grits and method of manufacture thereof |
US6679243B2 (en) * | 1997-04-04 | 2004-01-20 | Chien-Min Sung | Brazed diamond tools and methods for making |
JP3052896B2 (en) * | 1997-06-13 | 2000-06-19 | 日本電気株式会社 | Dress jig on polishing cloth surface and method of manufacturing the same |
US5921856A (en) * | 1997-07-10 | 1999-07-13 | Sp3, Inc. | CVD diamond coated substrate for polishing pad conditioning head and method for making same |
US6123612A (en) * | 1998-04-15 | 2000-09-26 | 3M Innovative Properties Company | Corrosion resistant abrasive article and method of making |
JP3295888B2 (en) * | 1998-04-22 | 2002-06-24 | 株式会社藤森技術研究所 | Polishing dresser for polishing machine of chemical machine polisher |
KR19990081117A (en) * | 1998-04-25 | 1999-11-15 | 윤종용 | CMP Pad Conditioning Disc and Conditioner, Manufacturing Method, Regeneration Method and Cleaning Method of the Disc |
JP2000106353A (en) * | 1998-07-31 | 2000-04-11 | Nippon Steel Corp | Dresser for polishing cloth for semiconductor substrate |
JP3387858B2 (en) * | 1999-08-25 | 2003-03-17 | 理化学研究所 | Polishing pad conditioner |
US6419574B1 (en) * | 1999-09-01 | 2002-07-16 | Mitsubishi Materials Corporation | Abrasive tool with metal binder phase |
US6281129B1 (en) * | 1999-09-20 | 2001-08-28 | Agere Systems Guardian Corp. | Corrosion-resistant polishing pad conditioner |
TW412461B (en) * | 1999-09-29 | 2000-11-21 | Kinik Co | Diamond disk for trimming wafer polishing pad and method for making the same |
US6439986B1 (en) * | 1999-10-12 | 2002-08-27 | Hunatech Co., Ltd. | Conditioner for polishing pad and method for manufacturing the same |
US6325709B1 (en) * | 1999-11-18 | 2001-12-04 | Chartered Semiconductor Manufacturing Ltd | Rounded surface for the pad conditioner using high temperature brazing |
US7201645B2 (en) * | 1999-11-22 | 2007-04-10 | Chien-Min Sung | Contoured CMP pad dresser and associated methods |
KR100360669B1 (en) * | 2000-02-10 | 2002-11-18 | 이화다이아몬드공업 주식회사 | Abrasive dressing tool and manufac ture method of abrasive dressing tool |
JP2001232570A (en) * | 2000-02-23 | 2001-08-28 | World Metal:Kk | Electrodeposition tool and manufacturing method thereof |
US6517424B2 (en) * | 2000-03-10 | 2003-02-11 | Abrasive Technology, Inc. | Protective coatings for CMP conditioning disk |
WO2001095214A1 (en) * | 2000-06-02 | 2001-12-13 | Quality Metric | Method and system for health assessment and monitoring |
US6500054B1 (en) * | 2000-06-08 | 2002-12-31 | International Business Machines Corporation | Chemical-mechanical polishing pad conditioner |
US6776699B2 (en) * | 2000-08-14 | 2004-08-17 | 3M Innovative Properties Company | Abrasive pad for CMP |
US6551176B1 (en) * | 2000-10-05 | 2003-04-22 | Applied Materials, Inc. | Pad conditioning disk |
US6669745B2 (en) * | 2001-02-21 | 2003-12-30 | 3M Innovative Properties Company | Abrasive article with optimally oriented abrasive particles and method of making the same |
JP4508514B2 (en) * | 2001-03-02 | 2010-07-21 | 旭ダイヤモンド工業株式会社 | CMP conditioner and method of manufacturing the same |
US6632127B1 (en) * | 2001-03-07 | 2003-10-14 | Jerry W. Zimmer | Fixed abrasive planarization pad conditioner incorporating chemical vapor deposited polycrystalline diamond and method for making same |
JP2003080457A (en) * | 2001-09-07 | 2003-03-18 | Ebara Corp | Cutting tool and manufacturing method therefor |
JP3984962B2 (en) * | 2003-02-14 | 2007-10-03 | 株式会社ポータ工業 | Piercing |
JP2004358640A (en) * | 2003-06-09 | 2004-12-24 | Goei Seisakusho:Kk | Method for manufacturing electroplated tool and electroplated tool |
US6951509B1 (en) * | 2004-03-09 | 2005-10-04 | 3M Innovative Properties Company | Undulated pad conditioner and method of using same |
US20050260939A1 (en) * | 2004-05-18 | 2005-11-24 | Saint-Gobain Abrasives, Inc. | Brazed diamond dressing tool |
-
2005
- 2005-08-09 TW TW094126964A patent/TWI290337B/en not_active IP Right Cessation
- 2005-10-21 US US11/163,548 patent/US20070037493A1/en not_active Abandoned
-
2006
- 2006-02-16 JP JP2006038891A patent/JP2007044863A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110091265A (en) * | 2018-01-29 | 2019-08-06 | 谢索尔钻石工业株式会社 | The anti-plating manufacturing method of grinder pad finisher and the grinder pad finisher thus manufactured |
TWI692022B (en) * | 2018-01-29 | 2020-04-21 | 韓商謝索爾鑽石工業股份有限公司 | Manufacturing method of pad conditioner by reverse plating and pad conditioner manufactured thereof |
CN116065217A (en) * | 2022-12-26 | 2023-05-05 | 吉姆西半导体科技(无锡)有限公司 | Preparation method of polishing pad finisher for CMP and polishing pad modulator |
Also Published As
Publication number | Publication date |
---|---|
JP2007044863A (en) | 2007-02-22 |
US20070037493A1 (en) | 2007-02-15 |
TWI290337B (en) | 2007-11-21 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |