TW200611303A - Semiconductor manufacturing equipment and semiconductor manufacturing method - Google Patents
Semiconductor manufacturing equipment and semiconductor manufacturing methodInfo
- Publication number
- TW200611303A TW200611303A TW093136870A TW93136870A TW200611303A TW 200611303 A TW200611303 A TW 200611303A TW 093136870 A TW093136870 A TW 093136870A TW 93136870 A TW93136870 A TW 93136870A TW 200611303 A TW200611303 A TW 200611303A
- Authority
- TW
- Taiwan
- Prior art keywords
- semiconductor manufacturing
- semiconductor substrate
- semiconductor
- cassette
- manufacturing apparatus
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title abstract 8
- 238000004519 manufacturing process Methods 0.000 title abstract 5
- 239000000758 substrate Substances 0.000 abstract 3
- 238000000034 method Methods 0.000 abstract 1
- 230000032258 transport Effects 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/673—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
- H01L21/67303—Vertical boat type carrier whereby the substrates are horizontally supported, e.g. comprising rod-shaped elements
- H01L21/67309—Vertical boat type carrier whereby the substrates are horizontally supported, e.g. comprising rod-shaped elements characterized by the substrate support
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/673—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
- H01L21/67346—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders characterized by being specially adapted for supporting a single substrate or by comprising a stack of such individual supports
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67778—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading involving loading and unloading of wafers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/22—Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions; Interactions between two or more impurities; Redistribution of impurities
- H01L21/223—Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions; Interactions between two or more impurities; Redistribution of impurities using diffusion into or out of a solid from or into a gaseous phase
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Weting (AREA)
Abstract
The present invention relates to a semiconductor manufacturing apparatus and a semiconductor manufacturing method, and has for its object to process a wafer easily and stably irrespective of thickness. To achieve the above object, a semiconductor manufacturing apparatus includes: an open-topped cassette (100) that encases a semiconductor substrate (300); a plurality of processing means for performing a predetermined processing of the semiconductor substrate (300); and transporting means that transports the cassette (100) encasing the semiconductor substrate (300) between the plurality of processing means.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2004/014092 WO2006035484A1 (en) | 2004-09-27 | 2004-09-27 | Semiconductor manufacturing equipment and semiconductor manufacturing method |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200611303A true TW200611303A (en) | 2006-04-01 |
TWI272645B TWI272645B (en) | 2007-02-01 |
Family
ID=36118636
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW093136870A TWI272645B (en) | 2004-09-27 | 2004-11-30 | Semiconductor manufacturing equipment and semiconductor manufacturing method |
Country Status (6)
Country | Link |
---|---|
US (1) | US7994067B2 (en) |
EP (1) | EP1691406B1 (en) |
JP (1) | JP4597137B2 (en) |
CN (1) | CN100405569C (en) |
TW (1) | TWI272645B (en) |
WO (1) | WO2006035484A1 (en) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6058360B2 (en) * | 2012-11-15 | 2017-01-11 | 東京エレクトロン株式会社 | Substrate delivery mechanism, substrate transport apparatus, and substrate delivery method |
JP6054213B2 (en) * | 2013-03-11 | 2016-12-27 | 東京エレクトロン株式会社 | Support member and semiconductor manufacturing apparatus |
JP2017022343A (en) * | 2015-07-15 | 2017-01-26 | ルネサスエレクトロニクス株式会社 | Method of manufacturing semiconductor device, semiconductor manufacturing device, and wafer lift pin hole cleaning jig |
CN107121892B (en) * | 2017-04-26 | 2018-12-28 | 武汉华星光电技术有限公司 | A kind of substrate exposure edge equipment |
CN111477563B (en) * | 2019-01-24 | 2022-04-22 | 中国电子科技集团公司第二十四研究所 | Alignment tool for fusing and sealing semiconductor device |
JP7374591B2 (en) * | 2019-02-13 | 2023-11-07 | 株式会社東京精密 | Wafer presence detection device |
KR20220115676A (en) * | 2021-02-09 | 2022-08-18 | 삼성디스플레이 주식회사 | Jig for fabricating window and fabricating method of window using the same |
Family Cites Families (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0736418B2 (en) * | 1986-05-19 | 1995-04-19 | 富士通株式会社 | Wafer carrier |
JPH01262639A (en) | 1988-04-13 | 1989-10-19 | Mitsubishi Electric Corp | Jig for semiconductor wafer |
US4901011A (en) * | 1988-11-04 | 1990-02-13 | Tokyo Electron Limited | Carrier for transferring plate-like objects one by one, a handling apparatus for loading or unloading the carrier, and a wafer probing machine fitted with the handling apparatus for the wafer carrier |
JPH0727628Y2 (en) * | 1989-11-20 | 1995-06-21 | 日本電信電話株式会社 | Wafer holding jig |
JPH04113611A (en) * | 1990-09-03 | 1992-04-15 | Fujitsu Ltd | Method and apparatus for dissolving thin film |
JP2657342B2 (en) * | 1992-02-07 | 1997-09-24 | 株式会社荏原製作所 | Semiconductor wafer sealing jig |
JP2970183B2 (en) | 1992-03-03 | 1999-11-02 | 松下電器産業株式会社 | Wafer transfer and storage method and wafer carrier |
JPH05343378A (en) * | 1992-06-12 | 1993-12-24 | Mitsubishi Electric Corp | Wafer carrying holder |
JPH07201948A (en) * | 1993-12-29 | 1995-08-04 | Dainippon Screen Mfg Co Ltd | Substrate transferring jig |
JPH07335616A (en) * | 1994-06-06 | 1995-12-22 | Hitachi Ltd | Wafer treatment device |
JP3099183B2 (en) * | 1997-05-14 | 2000-10-16 | 株式会社東京精密 | Wafer probing machine |
JP4044191B2 (en) | 1997-12-26 | 2008-02-06 | 株式会社荏原製作所 | Wafer plating equipment |
KR20000005870A (en) * | 1998-06-11 | 2000-01-25 | 히로시 오우라 | Method of fabricating deflection aperture array for electron beam exposure apparatus, wet etching method and apparatus for fabricating the aperture array, and electron beam exposure apparatus having the aperture array |
WO2001018856A1 (en) * | 1999-09-03 | 2001-03-15 | Mitsubishi Materials Silicon Corporation | Wafer holder |
JP2001176808A (en) * | 1999-12-21 | 2001-06-29 | Toshiba Ceramics Co Ltd | Method for wafer conveyance of vapor-phase thin-film growth device and wafer support member used therefor |
JP2001185528A (en) * | 1999-12-27 | 2001-07-06 | Minolta Co Ltd | Jig for etching, and apparatus and method for etching |
US7204887B2 (en) * | 2000-10-16 | 2007-04-17 | Nippon Steel Corporation | Wafer holding, wafer support member, wafer boat and heat treatment furnace |
JP2002237516A (en) | 2001-02-07 | 2002-08-23 | Seiko Epson Corp | Wafer protective case |
JP2002237517A (en) * | 2001-02-07 | 2002-08-23 | Seiko Epson Corp | Wafer holder |
JP2001326189A (en) | 2001-03-29 | 2001-11-22 | Hitachi Kokusai Electric Inc | Apparatus for producing semiconductor |
US7189647B2 (en) * | 2001-04-05 | 2007-03-13 | Novellus Systems, Inc. | Sequential station tool for wet processing of semiconductor wafers |
JP2003031647A (en) * | 2001-07-19 | 2003-01-31 | Hitachi Kokusai Electric Inc | Substrate processor and method for manufacturing semiconductor device |
JP4096636B2 (en) * | 2002-06-12 | 2008-06-04 | トヨタ自動車株式会社 | Wafer support jig and semiconductor element manufacturing method using the same |
US6964928B2 (en) * | 2002-08-29 | 2005-11-15 | Chentsau Ying | Method for removing residue from a magneto-resistive random access memory (MRAM) film stack using a dual mask |
JP4270434B2 (en) * | 2002-11-29 | 2009-06-03 | シャープ株式会社 | Substrate transfer device, substrate removal method, and substrate storage method |
-
2004
- 2004-09-27 US US10/578,883 patent/US7994067B2/en active Active
- 2004-09-27 JP JP2006537578A patent/JP4597137B2/en active Active
- 2004-09-27 WO PCT/JP2004/014092 patent/WO2006035484A1/en active Application Filing
- 2004-09-27 EP EP04788188.3A patent/EP1691406B1/en active Active
- 2004-09-27 CN CNB200480035360XA patent/CN100405569C/en active Active
- 2004-11-30 TW TW093136870A patent/TWI272645B/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
JP4597137B2 (en) | 2010-12-15 |
EP1691406B1 (en) | 2013-11-13 |
EP1691406A4 (en) | 2007-12-26 |
US7994067B2 (en) | 2011-08-09 |
WO2006035484A1 (en) | 2006-04-06 |
CN1886830A (en) | 2006-12-27 |
JPWO2006035484A1 (en) | 2008-05-15 |
EP1691406A1 (en) | 2006-08-16 |
TWI272645B (en) | 2007-02-01 |
CN100405569C (en) | 2008-07-23 |
US20070041812A1 (en) | 2007-02-22 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |