TW200605512A - Circuit for applying jitter and test - Google Patents

Circuit for applying jitter and test

Info

Publication number
TW200605512A
TW200605512A TW094122051A TW94122051A TW200605512A TW 200605512 A TW200605512 A TW 200605512A TW 094122051 A TW094122051 A TW 094122051A TW 94122051 A TW94122051 A TW 94122051A TW 200605512 A TW200605512 A TW 200605512A
Authority
TW
Taiwan
Prior art keywords
jitter
circuit
frequency
component
applying
Prior art date
Application number
TW094122051A
Other languages
English (en)
Other versions
TWI353115B (en
Inventor
Yuichi Miyaji
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of TW200605512A publication Critical patent/TW200605512A/zh
Application granted granted Critical
Publication of TWI353115B publication Critical patent/TWI353115B/zh

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/156—Arrangements in which a continuous pulse train is transformed into a train having a desired pattern
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
    • H03L7/00—Automatic control of frequency or phase; Synchronisation
    • H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
    • H03L7/08—Details of the phase-locked loop
    • H03L7/081—Details of the phase-locked loop provided with an additional controlled phase shifter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31727—Clock circuits aspects, e.g. test clock circuit details, timing aspects for signal generation, circuits for testing clocks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
    • H03L7/00—Automatic control of frequency or phase; Synchronisation
    • H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
    • H03L7/16—Indirect frequency synthesis, i.e. generating a desired one of a number of predetermined frequencies using a frequency- or phase-locked loop
    • H03L7/18—Indirect frequency synthesis, i.e. generating a desired one of a number of predetermined frequencies using a frequency- or phase-locked loop using a frequency divider or counter in the loop

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
  • Manipulation Of Pulses (AREA)
  • Tests Of Electronic Circuits (AREA)
TW094122051A 2004-07-22 2005-06-30 Circuit for applying jitter and test device TWI353115B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004214888A JP4425735B2 (ja) 2004-07-22 2004-07-22 ジッタ印加回路、及び試験装置

Publications (2)

Publication Number Publication Date
TW200605512A true TW200605512A (en) 2006-02-01
TWI353115B TWI353115B (en) 2011-11-21

Family

ID=35785031

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094122051A TWI353115B (en) 2004-07-22 2005-06-30 Circuit for applying jitter and test device

Country Status (6)

Country Link
US (1) US7287200B2 (zh)
JP (1) JP4425735B2 (zh)
KR (1) KR20070043843A (zh)
DE (1) DE112005001762T5 (zh)
TW (1) TWI353115B (zh)
WO (1) WO2006008908A1 (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI401444B (zh) * 2006-04-20 2013-07-11 Advantest Corp 測試裝置、測試方法、抖動濾波電路以及抖動濾波方法

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI277748B (en) * 2005-08-29 2007-04-01 Via Tech Inc Time jitter injection testing circuit and related testing method
JP4508072B2 (ja) * 2005-10-18 2010-07-21 株式会社デンソー シリアル通信回路及びａ／ｄ変換システム
US8327204B2 (en) * 2005-10-27 2012-12-04 Dft Microsystems, Inc. High-speed transceiver tester incorporating jitter injection
US7813297B2 (en) * 2006-07-14 2010-10-12 Dft Microsystems, Inc. High-speed signal testing system having oscilloscope functionality
US7681091B2 (en) * 2006-07-14 2010-03-16 Dft Microsystems, Inc. Signal integrity measurement systems and methods using a predominantly digital time-base generator
US7835479B2 (en) 2006-10-16 2010-11-16 Advantest Corporation Jitter injection apparatus, jitter injection method, testing apparatus, and communication chip
JP2010518760A (ja) * 2007-02-09 2010-05-27 ディー・エフ・ティー・マイクロシステムズ・インコーポレーテッド ハイスピード・シリアル・リンクのミッション環境における、該ハイスピード・シリアル・リンクの物理層テスティングのためのシステム及び方法
JPWO2008133238A1 (ja) * 2007-04-24 2010-07-29 株式会社アドバンテスト 試験装置および試験方法
US20090158100A1 (en) * 2007-12-13 2009-06-18 Advantest Corporation Jitter applying circuit and test apparatus
US7808252B2 (en) 2007-12-13 2010-10-05 Advantest Corporation Measurement apparatus and measurement method
KR100960118B1 (ko) * 2007-12-17 2010-05-27 한국전자통신연구원 클럭 지터 발생 장치 및 이를 포함하는 시험 장치
US7917319B2 (en) * 2008-02-06 2011-03-29 Dft Microsystems Inc. Systems and methods for testing and diagnosing delay faults and for parametric testing in digital circuits
US8207765B2 (en) 2009-07-20 2012-06-26 Advantest Corporation Signal generation apparatus and test apparatus
US8850259B2 (en) 2011-01-07 2014-09-30 Anue Systems, Inc. Systems and methods for precise generation of phase variation in digital signals
US8533518B2 (en) 2011-01-07 2013-09-10 Anue Systems, Inc. Systems and methods for precise timing measurements using high-speed deserializers
US8788867B2 (en) 2011-01-07 2014-07-22 Anue Systems, Inc. Systems and methods for playback of detected timing events
US8683254B2 (en) 2011-01-07 2014-03-25 Anue Systems, Inc. Systems and methods for precise event timing measurements
TWI444636B (zh) * 2011-02-18 2014-07-11 Realtek Semiconductor Corp 內建抖動測試功能之時脈與資料回復電路及其方法
DE102020102773B4 (de) 2019-02-04 2023-11-02 Tektronix, Inc. Jitter-einfügungssystem zur wellenformerzeugung

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02252316A (ja) * 1989-03-27 1990-10-11 Nec Corp ジッタシミュレーション機能付きｐｌｌ回路
JPH06104708A (ja) * 1992-09-21 1994-04-15 Advantest Corp ジッタ発生装置
JPH06112785A (ja) * 1992-09-28 1994-04-22 Advantest Corp ジッタ発生装置
US6686879B2 (en) * 1998-02-12 2004-02-03 Genghiscomm, Llc Method and apparatus for transmitting and receiving signals having a carrier interferometry architecture
JP4445114B2 (ja) * 2000-01-31 2010-04-07 株式会社アドバンテスト ジッタ測定装置及びその方法
JP2002124873A (ja) * 2000-10-18 2002-04-26 Mitsubishi Electric Corp 半導体装置
JP3830020B2 (ja) * 2000-10-30 2006-10-04 株式会社日立製作所 半導体集積回路装置
US6993107B2 (en) * 2001-01-16 2006-01-31 International Business Machines Corporation Analog unidirectional serial link architecture
US20030231707A1 (en) * 2002-06-05 2003-12-18 French John Sargent Method and apparatus for jitter creation and testing

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI401444B (zh) * 2006-04-20 2013-07-11 Advantest Corp 測試裝置、測試方法、抖動濾波電路以及抖動濾波方法

Also Published As

Publication number Publication date
US20060041797A1 (en) 2006-02-23
TWI353115B (en) 2011-11-21
DE112005001762T5 (de) 2007-06-21
US7287200B2 (en) 2007-10-23
WO2006008908A1 (ja) 2006-01-26
KR20070043843A (ko) 2007-04-25
JP2006041640A (ja) 2006-02-09
JP4425735B2 (ja) 2010-03-03

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