SG152116A1 - Test probe apparatus for detecting circuit board - Google Patents

Test probe apparatus for detecting circuit board

Info

Publication number
SG152116A1
SG152116A1 SG200805389-4A SG2008053894A SG152116A1 SG 152116 A1 SG152116 A1 SG 152116A1 SG 2008053894 A SG2008053894 A SG 2008053894A SG 152116 A1 SG152116 A1 SG 152116A1
Authority
SG
Singapore
Prior art keywords
test
holes
circuit board
lead wire
probe
Prior art date
Application number
SG200805389-4A
Inventor
Caroline Yeh
Original Assignee
Caroline Yeh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Caroline Yeh filed Critical Caroline Yeh
Publication of SG152116A1 publication Critical patent/SG152116A1/en

Links

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)

Abstract

This invention relates to a test probe apparatus for detecting circuit board, the test probe apparatus is composed of a plurality of test probes, lead wires and compression springs, a base locating plate, a test probe seat, an elastic cloth and at least one locating plate. On the base plate, the test probe seat, the elastic cloth and the fixing plate have respectively a plurality of lead wire holes, probe holes and locating holes arranged according to the position of test points on the circuit board. The test probes and the compression springs are installed respectively in the probe holes. Once the circuit board is put on test probe apparatus, the test probes extending out form the probe holes and the locating holes can contact the test points on the circuit board. The lead wire holes on the base plate are full of glue, one end of the lead wire being connected to the test equipment and the peeled end being inserted into the lead wire hole on the base plate. The top of the peeled end of the lead wire is grinded to form a flat face with the base plate surface, such that, the top of the lead wire can touch firmly the bottom of the compression spring so as to improve the test accuracy. Figure I
SG200805389-4A 2007-10-22 2008-07-21 Test probe apparatus for detecting circuit board SG152116A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2020070017031U KR200445059Y1 (en) 2007-03-15 2007-10-22 Test Probe Apparatus for Detecting Circuit Board

Publications (1)

Publication Number Publication Date
SG152116A1 true SG152116A1 (en) 2009-05-29

Family

ID=40677401

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200805389-4A SG152116A1 (en) 2007-10-22 2008-07-21 Test probe apparatus for detecting circuit board

Country Status (3)

Country Link
JP (1) JP3145882U (en)
KR (1) KR200445059Y1 (en)
SG (1) SG152116A1 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5530124B2 (en) * 2009-07-03 2014-06-25 株式会社日本マイクロニクス Integrated circuit testing equipment
KR101306049B1 (en) * 2011-10-14 2013-09-09 (주)다솔이엔지 Four point probe
KR102016427B1 (en) * 2013-09-10 2019-09-02 삼성전자주식회사 Pogo pin and probe card including the same
CN110231724B (en) * 2019-04-29 2024-05-24 苏州日和科技有限公司 Probe seat jacking device for liquid crystal display lighting test

Also Published As

Publication number Publication date
JP3145882U (en) 2008-10-23
KR200445059Y1 (en) 2009-06-26
KR20080004025U (en) 2008-09-19

Similar Documents

Publication Publication Date Title
MY155882A (en) Electrically conductive pins for microcircuit tester
TW201129814A (en) Electrical connecting apparatus and testing system using the same
WO2012033802A3 (en) Electrically conductive pins for microcircuit tester
TW200706888A (en) Apparatus and method for managing thermally induced motion of a probe card assembly
SG168518A1 (en) Probe card assembly
CN105093000B (en) Test device
TW200642027A (en) Probe assembly, method of producing it and electrical connecting apparatus
SG139640A1 (en) Probe card
SG170718A1 (en) Probe card
TW200801526A (en) Multi-layered probes
TW200801527A (en) Probe, testing head having a plurality of probes, and circuit board tester having the testing head
TW200704935A (en) Inspection device for display panel and interface used therein
CN104914374A (en) Device for detecting electrical performance of chips
TW200639411A (en) Resilient probes for electrical testing
SG152116A1 (en) Test probe apparatus for detecting circuit board
SG195107A1 (en) An electrical interconnect assembly
CN201867426U (en) Electrical testing device
KR20120136109A (en) Probe device for testing ic chip
TW200801530A (en) Air bridge structures and method of making and using air bridge structures
CN202916303U (en) Precision positioning electronic clamp
CN202093054U (en) Universal testing device
TW200728727A (en) Integrated circuit probe card (3)
CN203798975U (en) PCB testing device
TW200502556A (en) Wafer test method
TW200642175A (en) Method of testing ball grid array packed device in real system and test socket assembly therefor