SG125053A1 - Semiconductor integrated circuit apparatus - Google Patents
Semiconductor integrated circuit apparatusInfo
- Publication number
- SG125053A1 SG125053A1 SG200104041A SG200104041A SG125053A1 SG 125053 A1 SG125053 A1 SG 125053A1 SG 200104041 A SG200104041 A SG 200104041A SG 200104041 A SG200104041 A SG 200104041A SG 125053 A1 SG125053 A1 SG 125053A1
- Authority
- SG
- Singapore
- Prior art keywords
- integrated circuit
- semiconductor integrated
- circuit apparatus
- semiconductor
- integrated
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/0008—Arrangements for reducing power consumption
- H03K19/0016—Arrangements for reducing power consumption by using a control or a clock signal, e.g. in order to apply power supply
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
- B41F—PRINTING MACHINES OR PRESSES
- B41F15/00—Screen printers
- B41F15/08—Machines
- B41F15/0881—Machines for printing on polyhedral articles
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/133308—Support structures for LCD panels, e.g. frames or bezels
- G02F1/133331—Cover glasses
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Mathematical Physics (AREA)
- Computer Hardware Design (AREA)
- Nonlinear Science (AREA)
- General Engineering & Computer Science (AREA)
- Computing Systems (AREA)
- Crystallography & Structural Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- Optics & Photonics (AREA)
- General Physics & Mathematics (AREA)
- Mechanical Engineering (AREA)
- Semiconductor Integrated Circuits (AREA)
- Dram (AREA)
- Control Of Electrical Variables (AREA)
- Logic Circuits (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP25484498 | 1998-09-09 | ||
JP10891699 | 1999-04-16 |
Publications (1)
Publication Number | Publication Date |
---|---|
SG125053A1 true SG125053A1 (en) | 2006-09-29 |
Family
ID=26448739
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG200104041A SG125053A1 (en) | 1998-09-09 | 1999-09-08 | Semiconductor integrated circuit apparatus |
SG9904392A SG87829A1 (en) | 1998-09-09 | 1999-09-08 | Semiconductor integrated circuit apparatus |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG9904392A SG87829A1 (en) | 1998-09-09 | 1999-09-08 | Semiconductor integrated circuit apparatus |
Country Status (8)
Country | Link |
---|---|
US (3) | US6380798B1 (zh) |
EP (1) | EP0986177B1 (zh) |
KR (2) | KR100679548B1 (zh) |
CN (2) | CN100508153C (zh) |
DE (1) | DE69943120D1 (zh) |
MY (1) | MY130260A (zh) |
SG (2) | SG125053A1 (zh) |
TW (1) | TW453032B (zh) |
Families Citing this family (69)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4109340B2 (ja) * | 1997-12-26 | 2008-07-02 | 株式会社ルネサステクノロジ | 半導体集積回路装置 |
TW453032B (en) * | 1998-09-09 | 2001-09-01 | Hitachi Ltd | Semiconductor integrated circuit apparatus |
US6611918B1 (en) * | 1999-12-21 | 2003-08-26 | Intel Corporation | Method and apparatus for changing bias levels to reduce CMOS leakage of a real time clock when switching to a battery mode of operation |
JP3609003B2 (ja) | 2000-05-02 | 2005-01-12 | シャープ株式会社 | Cmos半導体集積回路 |
US7247932B1 (en) * | 2000-05-19 | 2007-07-24 | Megica Corporation | Chip package with capacitor |
JP2002064150A (ja) | 2000-06-05 | 2002-02-28 | Mitsubishi Electric Corp | 半導体装置 |
US6967522B2 (en) * | 2001-04-17 | 2005-11-22 | Massachusetts Institute Of Technology | Adaptive power supply and substrate control for ultra low power digital processors using triple well control |
US6518826B2 (en) | 2001-06-28 | 2003-02-11 | Intel Corporation | Method and apparatus for dynamic leakage control |
US6483375B1 (en) | 2001-06-28 | 2002-11-19 | Intel Corporation | Low power operation mechanism and method |
JP2003031681A (ja) * | 2001-07-16 | 2003-01-31 | Matsushita Electric Ind Co Ltd | 半導体集積回路 |
US6552596B2 (en) * | 2001-08-10 | 2003-04-22 | Micron Technology, Inc. | Current saving mode for input buffers |
US6982500B2 (en) * | 2002-03-11 | 2006-01-03 | Intel Corporation | Power-down scheme for an on-die voltage differentiator design |
JP4401621B2 (ja) * | 2002-05-07 | 2010-01-20 | 株式会社日立製作所 | 半導体集積回路装置 |
US6753719B2 (en) * | 2002-08-26 | 2004-06-22 | Motorola, Inc. | System and circuit for controlling well biasing and method thereof |
JP2004227710A (ja) * | 2003-01-24 | 2004-08-12 | Renesas Technology Corp | 半導体記憶装置 |
US6812758B2 (en) * | 2003-02-12 | 2004-11-02 | Sun Microsystems, Inc. | Negative bias temperature instability correction technique for delay locked loop and phase locked loop bias generators |
US7219324B1 (en) * | 2003-06-02 | 2007-05-15 | Virage Logic Corporation | Various methods and apparatuses to route multiple power rails to a cell |
US7250807B1 (en) * | 2003-06-05 | 2007-07-31 | National Semiconductor Corporation | Threshold scaling circuit that minimizes leakage current |
JP4321678B2 (ja) * | 2003-08-20 | 2009-08-26 | パナソニック株式会社 | 半導体集積回路 |
JP2005166698A (ja) * | 2003-11-28 | 2005-06-23 | Matsushita Electric Ind Co Ltd | 半導体集積回路 |
JP4744807B2 (ja) * | 2004-01-06 | 2011-08-10 | パナソニック株式会社 | 半導体集積回路装置 |
US20050225376A1 (en) * | 2004-04-08 | 2005-10-13 | Ati Technologies, Inc. | Adaptive supply voltage body bias apparatus and method thereof |
US7279926B2 (en) * | 2004-05-27 | 2007-10-09 | Qualcomm Incoporated | Headswitch and footswitch circuitry for power management |
WO2005125012A1 (en) * | 2004-06-15 | 2005-12-29 | Koninklijke Philips Electronics N.V. | Adaptive control of power supply for integrated circuits |
DE102004058612A1 (de) * | 2004-12-04 | 2006-06-08 | Infineon Technologies Ag | Spannungsversorgungsschaltung, insbesondere für eine DRAM-Speicherschaltung sowie ein Verfahren zum Steuern einer Versorgungsquelle |
US20060132218A1 (en) * | 2004-12-20 | 2006-06-22 | Tschanz James W | Body biasing methods and circuits |
JP2006217540A (ja) * | 2005-02-07 | 2006-08-17 | Fujitsu Ltd | 半導体集積回路および半導体集積回路の制御方法 |
US7345524B2 (en) * | 2005-03-01 | 2008-03-18 | Taiwan Semiconductor Manufacturing Company | Integrated circuit with low power consumption and high operation speed |
US7011980B1 (en) * | 2005-05-09 | 2006-03-14 | International Business Machines Corporation | Method and structures for measuring gate tunneling leakage parameters of field effect transistors |
US7141998B1 (en) * | 2005-05-19 | 2006-11-28 | International Business Machines Corporation | Method and apparatus for burn-in optimization |
JP4764086B2 (ja) * | 2005-07-27 | 2011-08-31 | パナソニック株式会社 | 半導体集積回路装置 |
CN101238641B (zh) * | 2005-08-02 | 2010-09-08 | 松下电器产业株式会社 | 半导体集成电路 |
US7397072B2 (en) * | 2005-12-01 | 2008-07-08 | Board Of Regents, The University Of Texas System | Structure for and method of using a four terminal hybrid silicon/organic field effect sensor device |
US20070139098A1 (en) * | 2005-12-15 | 2007-06-21 | P.A. Semi, Inc. | Wearout compensation mechanism using back bias technique |
KR100735756B1 (ko) | 2006-01-02 | 2007-07-06 | 삼성전자주식회사 | 반도체 집적 회로 |
US7366036B2 (en) * | 2006-01-13 | 2008-04-29 | International Business Machines Corporation | Memory device with control circuit for regulating power supply voltage |
JP4762754B2 (ja) * | 2006-02-17 | 2011-08-31 | 富士通セミコンダクター株式会社 | 半導体装置および電子装置 |
KR100744131B1 (ko) * | 2006-02-21 | 2007-08-01 | 삼성전자주식회사 | 냉온에서 동작 속도가 향상되는 메모리 집적회로 장치 |
US7355437B2 (en) * | 2006-03-06 | 2008-04-08 | Altera Corporation | Latch-up prevention circuitry for integrated circuits with transistor body biasing |
US7330049B2 (en) * | 2006-03-06 | 2008-02-12 | Altera Corporation | Adjustable transistor body bias generation circuitry with latch-up prevention |
TWI318344B (en) * | 2006-05-10 | 2009-12-11 | Realtek Semiconductor Corp | Substrate biasing apparatus |
US7429870B2 (en) * | 2006-06-21 | 2008-09-30 | Element Cxi, Llc | Resilient integrated circuit architecture |
US7408830B2 (en) * | 2006-11-07 | 2008-08-05 | Taiwan Semiconductor Manufacturing Co. | Dynamic power supplies for semiconductor devices |
US7989849B2 (en) * | 2006-11-15 | 2011-08-02 | Synopsys, Inc. | Apparatuses and methods for efficient power rail structures for cell libraries |
JP4237221B2 (ja) * | 2006-11-20 | 2009-03-11 | エルピーダメモリ株式会社 | 半導体装置 |
US9608604B2 (en) * | 2006-12-14 | 2017-03-28 | Taiwan Semiconductor Manufacturing Co., Ltd. | Voltage level shifter with single well voltage |
US20090033409A1 (en) * | 2007-08-02 | 2009-02-05 | Fsp Technology Inc. | Bias correction device |
US7874298B2 (en) * | 2007-12-13 | 2011-01-25 | Dina Suzanne Malick | Unit and method for decorating nails |
US8013617B2 (en) * | 2008-03-10 | 2011-09-06 | Ngk Spark Plug Co., Ltd. | Test method and apparatus for spark plug ceramic insulator |
US7978001B2 (en) * | 2008-09-25 | 2011-07-12 | Via Technologies, Inc. | Microprocessor with selective substrate biasing for clock-gated functional blocks |
TWI405297B (zh) * | 2008-09-25 | 2013-08-11 | Via Tech Inc | 微處理器、積體電路以及晶片雜訊減少方法 |
US7812662B2 (en) * | 2008-10-07 | 2010-10-12 | Via Technologies, Inc. | System and method for adjusting supply voltage levels to reduce sub-threshold leakage |
JP2012059328A (ja) * | 2010-09-10 | 2012-03-22 | Renesas Electronics Corp | テスト回路及びそれを備えた半導体集積回路 |
US20120206188A1 (en) * | 2011-02-14 | 2012-08-16 | California Institute Of Technology | Systems and methods for dynamic mosfet body biasing for low power, fast response vlsi applications |
US9110643B2 (en) * | 2012-06-11 | 2015-08-18 | Arm Limited | Leakage current reduction in an integrated circuit |
US8787096B1 (en) * | 2013-01-16 | 2014-07-22 | Qualcomm Incorporated | N-well switching circuit |
US9112495B1 (en) * | 2013-03-15 | 2015-08-18 | Mie Fujitsu Semiconductor Limited | Integrated circuit device body bias circuits and methods |
KR102095856B1 (ko) * | 2013-04-15 | 2020-04-01 | 삼성전자주식회사 | 반도체 메모리 장치 및 그것의 바디 바이어스 방법 |
JP2015075623A (ja) * | 2013-10-09 | 2015-04-20 | セイコーエプソン株式会社 | 発光装置、電子機器、及び発光装置の設計方法 |
JP6287025B2 (ja) * | 2013-10-09 | 2018-03-07 | セイコーエプソン株式会社 | 発光装置及び電子機器 |
EP3167443A1 (en) | 2014-07-08 | 2017-05-17 | Chaologix, Inc. | Continuously charged isolated supply network for secure logic applications |
JP2016126359A (ja) * | 2014-12-26 | 2016-07-11 | 日立オートモティブシステムズ株式会社 | 電子装置 |
KR20170044411A (ko) * | 2015-10-15 | 2017-04-25 | 에스케이하이닉스 주식회사 | 반도체장치 |
US10469085B2 (en) * | 2016-04-25 | 2019-11-05 | Microchip Technology Incorporated | Seamless switching control for low power battery backup system |
US10386897B2 (en) * | 2016-07-14 | 2019-08-20 | John V. Rivera, Jr. | Smart device cooling system |
EP3343769B1 (en) * | 2016-12-27 | 2019-02-06 | GN Hearing A/S | Integrated circuit comprising adjustable back biasing of one or more logic circuit regions |
DE102017109264B3 (de) * | 2017-04-28 | 2018-08-23 | Infineon Technologies Ag | Leistungshalbleiterbauelemente und ein Verfahren zum Bilden eines Leistungshalbleiterbauelements |
KR20190054812A (ko) | 2017-11-14 | 2019-05-22 | 삼성전자주식회사 | 메모리 장치의 구동 방법 및 이를 수행하는 메모리 장치 |
CN108776296A (zh) * | 2018-06-26 | 2018-11-09 | 北京中电华大电子设计有限责任公司 | 一种用电流差值来判断iddq测试的方法 |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR920010633A (ko) * | 1990-11-30 | 1992-06-26 | 김광호 | 반도체 메모리 장치의 기준전압 발생회로 |
JP3184265B2 (ja) * | 1991-10-17 | 2001-07-09 | 株式会社日立製作所 | 半導体集積回路装置およびその制御方法 |
JP2939086B2 (ja) * | 1992-03-30 | 1999-08-25 | 三菱電機株式会社 | 半導体装置 |
EP0564204A3 (en) | 1992-03-30 | 1994-09-28 | Mitsubishi Electric Corp | Semiconductor device |
US5461338A (en) * | 1992-04-17 | 1995-10-24 | Nec Corporation | Semiconductor integrated circuit incorporated with substrate bias control circuit |
KR0169157B1 (ko) * | 1993-11-29 | 1999-02-01 | 기다오까 다까시 | 반도체 회로 및 mos-dram |
JPH07254685A (ja) * | 1994-03-16 | 1995-10-03 | Toshiba Corp | 半導体記憶装置 |
JPH0973784A (ja) * | 1995-09-07 | 1997-03-18 | Nec Corp | 半導体装置及びその制御回路 |
US5721495A (en) * | 1995-10-24 | 1998-02-24 | Unisys Corporation | Circuit for measuring quiescent current |
KR970029758A (ko) * | 1995-11-09 | 1997-06-26 | 리 패치 | 저전압 cmos 회로용 누설 전류 제어 시스템 및 그 방법 |
KR100223770B1 (ko) * | 1996-06-29 | 1999-10-15 | 김영환 | 반도체 장치의 문턱전압 제어회로 |
US5742177A (en) * | 1996-09-27 | 1998-04-21 | Intel Corporation | Method for testing a semiconductor device by measuring quiescent currents (IDDQ) at two different temperatures |
CN1190225A (zh) * | 1997-02-05 | 1998-08-12 | 林光泽 | 鉴别纸制钞票的装置和方法 |
JPH10229165A (ja) * | 1997-02-17 | 1998-08-25 | Ricoh Co Ltd | 半導体集積回路装置 |
JP3814385B2 (ja) * | 1997-10-14 | 2006-08-30 | 株式会社ルネサステクノロジ | 半導体集積回路装置 |
JP4109340B2 (ja) * | 1997-12-26 | 2008-07-02 | 株式会社ルネサステクノロジ | 半導体集積回路装置 |
US6239609B1 (en) * | 1998-02-11 | 2001-05-29 | Lsi Logic Corporation | Reduced voltage quiescent current test methodology for integrated circuits |
TW453032B (en) * | 1998-09-09 | 2001-09-01 | Hitachi Ltd | Semiconductor integrated circuit apparatus |
US6664801B1 (en) * | 2001-05-21 | 2003-12-16 | Lsi Logic Corporation | IDDQ test methodology based on the sensitivity of fault current to power supply variations |
-
1999
- 1999-08-18 TW TW088114125A patent/TW453032B/zh not_active IP Right Cessation
- 1999-09-04 KR KR1019990037560A patent/KR100679548B1/ko not_active IP Right Cessation
- 1999-09-06 EP EP99117563A patent/EP0986177B1/en not_active Expired - Lifetime
- 1999-09-06 DE DE69943120T patent/DE69943120D1/de not_active Expired - Lifetime
- 1999-09-07 US US09/390,962 patent/US6380798B1/en not_active Expired - Lifetime
- 1999-09-08 MY MYPI99003881A patent/MY130260A/en unknown
- 1999-09-08 SG SG200104041A patent/SG125053A1/en unknown
- 1999-09-08 SG SG9904392A patent/SG87829A1/en unknown
- 1999-09-09 CN CNB2004100049635A patent/CN100508153C/zh not_active Expired - Fee Related
- 1999-09-09 CN CNB991185773A patent/CN1172373C/zh not_active Expired - Fee Related
-
2001
- 2001-12-21 US US10/024,039 patent/US6630857B2/en not_active Expired - Fee Related
-
2003
- 2003-07-16 US US10/619,601 patent/US6946865B2/en not_active Expired - Fee Related
-
2006
- 2006-02-13 KR KR1020060013437A patent/KR100712091B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
US6380798B1 (en) | 2002-04-30 |
DE69943120D1 (de) | 2011-02-24 |
US6630857B2 (en) | 2003-10-07 |
CN1519906A (zh) | 2004-08-11 |
KR100679548B1 (ko) | 2007-02-07 |
US20020044007A1 (en) | 2002-04-18 |
CN1253379A (zh) | 2000-05-17 |
SG87829A1 (en) | 2002-04-16 |
EP0986177A3 (en) | 2000-09-27 |
US6946865B2 (en) | 2005-09-20 |
KR20060022296A (ko) | 2006-03-09 |
KR20000022921A (ko) | 2000-04-25 |
EP0986177A2 (en) | 2000-03-15 |
TW453032B (en) | 2001-09-01 |
EP0986177B1 (en) | 2011-01-12 |
US20040012397A1 (en) | 2004-01-22 |
KR100712091B1 (ko) | 2007-05-02 |
MY130260A (en) | 2007-06-29 |
CN1172373C (zh) | 2004-10-20 |
CN100508153C (zh) | 2009-07-01 |
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